CN201392373Y - Chip electronic element aging test device - Google Patents
Chip electronic element aging test device Download PDFInfo
- Publication number
- CN201392373Y CN201392373Y CN200920125368U CN200920125368U CN201392373Y CN 201392373 Y CN201392373 Y CN 201392373Y CN 200920125368 U CN200920125368 U CN 200920125368U CN 200920125368 U CN200920125368 U CN 200920125368U CN 201392373 Y CN201392373 Y CN 201392373Y
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- insulation
- power supply
- detection
- aging test
- box
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Abstract
The utility model discloses a chip electronic element aging test device, belongs to aging test devices, and aims to provide an aging test device which has high detection efficiency and convenient operation, and can carry out the online precise measurement for chip electronic elements. The chip electronic element aging test device comprises a cabinet and an insulation can, wherein the upper half portion of the cabinet (1) is used as the insulation can (13) and a control housing (17), and the lower half portion thereof is used as a power supply box (14), a detection box (5) is arranged on the back sides of the insulation can (13) and the control housing (17), and an electric heating device (7), a fan (12), a slot (9) and a power supply plug socket (8) are arranged in the insulation can (13), an aging board (10) is inserted in the slot (9), and a thermo-regulator, an over-temperature protection device and a main control device are arranged in the control housing (17), a detection board (6) which is electrically connected with the power supply plug socket (8) is arranged in the detection box (5), and a detection power supply (15) which is electrically connected with the power supply plug socket (8) is arranged in the power supply box (14).
Description
Technical field:
The utility model relates to a kind of testing apparatus, relates in particular to a kind of electronic component aging testing apparatus.
Background technology:
Electronic component aging tests such as resistance, electric capacity, inductance are necessary important performance tests before the product export, because SMD electronic component volume is little and do not have lead-in wire, traditional aging testing apparatus exist troublesome poeration, detection efficiency low, to defectives such as damaged products are serious, can not satisfy the needs of SMD electronic component large-scale production, therefore be badly in need of a kind of equipment that can be suitable for SMD electronic component ageing properties test.
Summary of the invention:
At the above-mentioned defective that exists in the prior art, the utility model aims to provide a kind of detection efficiency height, easy to operate, can carry out the SMD electronic component aging testing apparatus of online accurate measurement.
To achieve these goals, the utility model by the following technical solutions: it comprises rack and insulation can; The first half of rack is insulation can and control box, and the back side of insulation can and control box is detection case, and the Lower Half of rack is a power supply box; Be provided with in the insulation can that many burn-in board that is electrically connected with the connector mouth is inserted in the slot to slot and a plurality of connector mouth, the Si Jiaochu in insulation can is provided with electric calorifie installation, and the sidewall of insulation can is provided with fan; Be provided with temperature controller, overtemperature protection device and main control unit in the control box, be provided with the check-out console that polylith is electrically connected with the connector mouth separately in the detection case, be provided with a plurality of detection power supplys that are electrically connected with the connector mouth separately in the power supply box.
Compared with the prior art, the utility model has been owing to adopted technique scheme, has therefore that measurement data is accurate, easy to operate, data presentation is directly perceived, detection efficiency is high, do not damage advantage such as product.
Description of drawings:
Fig. 1 is a structural representation of the present utility model;
Fig. 2 is the A-A cut-open view of Fig. 1;
Fig. 3 is the B-B cut-open view among Fig. 2.
Among the figure: rack 1 insulation chamber door 2 guidance panels 3 power supply chamber doors 4 detection cases 5 check-out consoles 6 electric calorifie installations 7 connector mouths 8 slots 9 burn-in board 10 supports 11 fans 12 insulation cans 13 power supply boxs 14 detect power supply 15 and detect chamber door 16 control boxs 17
Embodiment:
The utility model is described in further detail below in conjunction with accompanying drawing and specific embodiment:
In Fig. 1～3, insulation can 13 and control box 17 are positioned at the first half of rack 1; Be provided with support 11 in the insulation can 13, be fixed with manyly to slot 9 on this support, be inserted with a burn-in board 10 in every pair of slot 9, this burn-in board is provided with some electronic component burn-in test anchor clamps; The rear wall of insulation can 13 is provided with the corresponding connector mouth 8 of quantity and burn-in board 10, respectively be provided with an electric calorifie installation 7 at four angles near insulation can 13 rear walls, the sidewall of insulation can 13 is provided with and makes the uniform fan 12 of temperature, and the front end of each burn-in board 10 inserts in the corresponding connector mouth 8; Insulation can 13 is provided with insulation chamber door 2.Control box 17 is positioned at the right side of insulation can 13, is provided with temperature controller, overtemperature protection device and main control unit in this control box; Control box 17 is provided with control panel 3, and this control panel is provided with LCDs, various control knobs etc.At the back side of insulation can 13 and control box 17 are detection cases 5, are provided with the corresponding check-out console 6 of quantity and connector mouth 8 in this detection case, and each check-out console 6 is electrically connected with corresponding connector mouth 8 separately; For safety, detection case 5 is provided with and detects chamber door 16.The Lower Half of rack 1 is a power supply box 14, is provided with the corresponding detection power supply 15 of quantity and connector mouth 8 in this power supply box, and each detects power supply 15 and is electrically connected with corresponding connector mouth 8 separately; For safety, power supply box 14 is provided with power supply chamber door 4.
Claims (1)
1. a SMD electronic component aging testing apparatus comprises rack and insulation can; It is characterized in that: the first half of rack (1) is insulation can (13) and control box (17), and the back side of insulation can (13) and control box (17) is detection case (5), and the Lower Half of rack (1) is power supply box (14); Be provided with many in the insulation can (13) to slot (9) and a plurality of connector mouth (8), the burn-in board (10) that is electrically connected with connector mouth (8) is inserted in the slot (9), Si Jiaochu in insulation can (13) is provided with electric calorifie installation (7), and the sidewall of insulation can (13) is provided with fan (12); Control box is provided with temperature controller, overtemperature protection device and main control unit in (17); be provided with a plurality of check-out consoles (6) that are electrically connected with connector mouth (8) separately in the detection case (5), be provided with the detection power supply (15) that polylith is electrically connected with connector mouth (8) separately in the power supply box (14).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200920125368U CN201392373Y (en) | 2009-04-30 | 2009-04-30 | Chip electronic element aging test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200920125368U CN201392373Y (en) | 2009-04-30 | 2009-04-30 | Chip electronic element aging test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201392373Y true CN201392373Y (en) | 2010-01-27 |
Family
ID=41599194
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200920125368U Expired - Lifetime CN201392373Y (en) | 2009-04-30 | 2009-04-30 | Chip electronic element aging test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201392373Y (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102313824A (en) * | 2011-07-21 | 2012-01-11 | 广州赛能冷藏科技有限公司 | Cold storage constant temperature experiment case |
| CN102393768A (en) * | 2011-10-13 | 2012-03-28 | 清华大学 | Temperature closed-loop control device and testing method |
| CN102945052A (en) * | 2012-11-13 | 2013-02-27 | 河南中分仪器股份有限公司 | Overtemperature protector detection device |
| CN103116105A (en) * | 2013-02-27 | 2013-05-22 | 苏州热工研究院有限公司 | Fuse protector life test system with overheating protection and warning function |
| CN103293456A (en) * | 2012-02-29 | 2013-09-11 | 韩商联测股份有限公司 | Burn-in tester |
| CN103487689A (en) * | 2013-09-24 | 2014-01-01 | 国家电网公司 | Plug-in unit ageing detection device |
| CN105759193A (en) * | 2016-04-27 | 2016-07-13 | 杭州华扬电子有限公司 | Thermal ageing testing apparatus and using method thereof |
| CN107748581A (en) * | 2017-11-29 | 2018-03-02 | 惠州市智胜新电子技术有限公司 | A kind of capacitance aging equipment of ox horn |
| CN109444618A (en) * | 2018-12-28 | 2019-03-08 | 苏州比雷艾斯电子科技有限公司 | A kind of electronic component Current Voltage ageing tester and method |
| CN109946546A (en) * | 2019-04-10 | 2019-06-28 | 苏州科技大学 | A kind of the degradation system and method for excessive heating protection of photoelectrical coupler |
-
2009
- 2009-04-30 CN CN200920125368U patent/CN201392373Y/en not_active Expired - Lifetime
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102313824A (en) * | 2011-07-21 | 2012-01-11 | 广州赛能冷藏科技有限公司 | Cold storage constant temperature experiment case |
| CN102393768A (en) * | 2011-10-13 | 2012-03-28 | 清华大学 | Temperature closed-loop control device and testing method |
| CN103293456A (en) * | 2012-02-29 | 2013-09-11 | 韩商联测股份有限公司 | Burn-in tester |
| CN103293456B (en) * | 2012-02-29 | 2016-03-09 | 韩商联测股份有限公司 | Aging testing apparatus |
| CN102945052B (en) * | 2012-11-13 | 2015-09-09 | 河南中分仪器股份有限公司 | Overtemperature protector detection device |
| CN102945052A (en) * | 2012-11-13 | 2013-02-27 | 河南中分仪器股份有限公司 | Overtemperature protector detection device |
| CN103116105A (en) * | 2013-02-27 | 2013-05-22 | 苏州热工研究院有限公司 | Fuse protector life test system with overheating protection and warning function |
| CN103487689A (en) * | 2013-09-24 | 2014-01-01 | 国家电网公司 | Plug-in unit ageing detection device |
| CN105759193A (en) * | 2016-04-27 | 2016-07-13 | 杭州华扬电子有限公司 | Thermal ageing testing apparatus and using method thereof |
| CN105759193B (en) * | 2016-04-27 | 2018-10-02 | 杭州华扬电子有限公司 | A kind of thermal ageing test device and its application method |
| CN107748581A (en) * | 2017-11-29 | 2018-03-02 | 惠州市智胜新电子技术有限公司 | A kind of capacitance aging equipment of ox horn |
| CN109444618A (en) * | 2018-12-28 | 2019-03-08 | 苏州比雷艾斯电子科技有限公司 | A kind of electronic component Current Voltage ageing tester and method |
| CN109946546A (en) * | 2019-04-10 | 2019-06-28 | 苏州科技大学 | A kind of the degradation system and method for excessive heating protection of photoelectrical coupler |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20100127 |
|
| CX01 | Expiry of patent term |