CN203012062U - Electronic component testing device - Google Patents
Electronic component testing device Download PDFInfo
- Publication number
- CN203012062U CN203012062U CN 201220611254 CN201220611254U CN203012062U CN 203012062 U CN203012062 U CN 203012062U CN 201220611254 CN201220611254 CN 201220611254 CN 201220611254 U CN201220611254 U CN 201220611254U CN 203012062 U CN203012062 U CN 203012062U
- Authority
- CN
- China
- Prior art keywords
- electronic component
- test
- component package
- test chamber
- inspecting electronic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The utility model relates to an electronic component testing device, which is characterized by comprising a test and control box body, a test chamber, a device control panel and a temperature control device, wherein the test and control box body is used for accommodating test instruments and a host computer, and the host computer is connected with the test instruments and used for collecting data of the test instruments; the test chamber is used for accommodating electronic components to be tested; the device control panel is used for powering on or off the electronic component testing device; and the temperature control device is used for heating or refrigerating the test chamber. The side wall of the test chamber is provided with a plurality of slots, a plurality of plug boards on which different types of electronic components are installed are inserted into the plurality of the slots correspondingly, and the electronic components are connected with corresponding test instruments and a power supply through electrical interfaces of the slots. Different types of electronic components can be tested simultaneously under special environment by adopting the electronic component testing device provided by the utility model. Therefore, the electronic component testing device has the advantages of simple and convenient operation, and good compatibility.
Description
Technical field
The utility model relates to field tests, relates more specifically to a kind of device for inspecting electronic component package.
Background technology
The instrument that uses in the oil exploration ﹠ development industry often comprises a large amount of different types of electronic devices and components, and the environment that faces due to oil exploration ﹠ development, and these electronic devices and components often need to experience the particular surroundingss such as high temperature, low temperature.Need to carry out the height temperature detector to the various types of electronic devices and components (such as resistor, capacitor etc.) that use before the assembling instrument surveys, screens for this reason.Device for inspecting electronic component package in the market is all single similar components and parts is detected, and when testing the components and parts of other kind, needs the repeated test step.This exists poor compatibility, and the problem of complex operation especially when component number is many, need to expend a large amount of manpowers and time.In addition, device for inspecting electronic component package in the market is all the detection under normal temperature environment basically, having (high temperature, low temperature environment) under particular surroundings, can not complete normal detection.
Consider above-mentioned reason, existence can realize the demand of the testing apparatus of under particular surroundings, different types of electronic devices and components being tested.
The utility model content
The utility model relates to a kind of device for inspecting electronic component package, it is characterized in that comprising: test and control casing, be used for holding test instrumentation and principal computer, and principal computer is connected with test instrumentation, is used for the data of collecting test instrument; Test chamber is used for holding electronic devices and components to be measured; Device control panel is used for this device for inspecting electronic component package is powered up or cuts off the power supply; And attemperating unit, be used for test chamber is heated or freezes; Wherein the sidewall of this test chamber is provided with a plurality of slots, be separately installed with a plurality of inserting boards of different types of electronic devices and components in these a plurality of slots of correspondence, by the electrical interface of slot, these electronic devices and components be electrically connected to corresponding test instrumentation and power supply.
Preferably, these electronic devices and components comprise resistor, capacitor, inductor, three terminal regulator, diode, Industrial Frequency Transformer, high-frequency transformer and network transformer.
Preferably, the number of these a plurality of slots is 8, corresponds respectively to the plate that resistor, capacitor, inductor, three terminal regulator, diode, Industrial Frequency Transformer, high-frequency transformer and network transformer are installed.
Preferably, the number of these a plurality of slots is 8 * N, N is the positive integer more than or equal to 2, this number is that the slot of 8 * N is divided into the N group, and every group comprises the slot that corresponds respectively to the plate that resistor, capacitor, inductor, three terminal regulator, diode, Industrial Frequency Transformer, high-frequency transformer and network transformer are installed.
Preferably, separated by dividing plate between this N group slot, on this dividing plate, attemperating unit is installed.
Preferably, attemperating unit is arranged on the roof and diapire of test chamber.
Preferably, this attemperating unit is metal tube, and heating wire is arranged on wherein.
Preferably, this device for inspecting electronic component package also comprises secondary computer, and it is arranged on test and controls in casing, is used for controlling attemperating unit.
Preferably, this device for inspecting electronic component package also comprises the first liquid crystal display, is used for showing the operation of principal computer.
Preferably, this device for inspecting electronic component package also comprises the second liquid crystal display, is used for showing the temperature of test chamber.
The utlity model has following benefit: it can realize in particular surroundings, and for example high temperature, low temperature are even tested different types of electronic devices and components in the situation of alternating temperature simultaneously.Thereby, have advantage easy and simple to handle, compatible good.
Description of drawings
In order to understand better the utility model and to illustrate, it is come into force, will come with reference to accompanying drawing, wherein by example now:
Fig. 1 shows the schematic diagram of each functional module that is included in the related testing apparatus of the utility model; And
Fig. 2 illustrates the in-built schematic diagram of test chamber.
Embodiment
Below, one or more aspects of embodiment of the present utility model are described with reference to the drawings, wherein generally refer to identical element with identical reference marker in whole accompanying drawing.In the following description, for the purpose of explaining, many specific details have been set forth so that the thorough understanding to one or more aspects of the utility model embodiment to be provided.Yet, it is evident that for a person skilled in the art, can utilize these specific detail of less degree to carry out one or more aspects of the utility model embodiment.
In addition, although come special characteristic or the aspect of disclosed embodiment with regard to the only embodiment in some embodiments, such feature or aspect can be in conjunction with may be one or more further features or the aspect of other embodiment expectation and favourable for any given or application-specific.
Fig. 1 shows the schematic diagram of each functional module that is included in the related testing apparatus of the utility model 10.This testing apparatus comprises the test that is positioned at the bottom and controls casing 100, is used for holding test instrumentation 101,102 and principal computer 103.Casing 100 can pivotable or push-pull fashion open, to place or to remove instrument wherein.Principal computer is communicated by letter with test instrumentation, is used for the data of collecting test instrument, and it is controlled.Need to prove, although only show in the drawings two test instrumentations 101,102, can comprise a plurality of instruments of measuring different electronic devices and components.As in one embodiment, the electronic devices and components of measuring comprise resistor (for example paster or straight cutting), capacitor (for example paster or punching), inductor (for example paster), three terminal regulator (for example paster or straight cutting), diode (for example 3 pin straight cuttings), Industrial Frequency Transformer, high-frequency transformer and network transformer, described measurement instrument is the instrument of measuring resistance, measures instrument of electric capacity etc.
Preferably, also be reserved with expansion interface 104 in casing 100, be used for increasing in the future other measurement instruments.
Testing apparatus also comprises test chamber 105, is used for holding electronic devices and components to be measured.Be provided with attemperating unit 125 in test chamber, be used for test chamber 105 is heated or freezes.Preferably, attemperating unit 125 is arranged on the roof and diapire of test chamber 105.As shown in cross spider in Fig. 2.This attemperating unit 125 comprises the metal tube that heating wire wherein is installed, and when the needs hot environment is tested, heats; This attemperating unit can also comprise semiconductor chilling plate, when the needs low temperature environment is tested, is used for freezing.This attemperating unit is preferably arranged in a crossed manner as shown in Figure, to play better temperature control effect.The heating of attemperating unit or refrigeration are controlled by the secondary computer 130 that is arranged on test and control in casing 100.
Preferably, testing apparatus 10 can also comprise for the first liquid crystal display 110 of the operation that conveniently shows principal computer and the second liquid crystal display 115 that is used for the temperature of demonstration test chamber 105.It is in the right side of test chamber 105 in the drawings, the top of casing 100.
As shown in Figure 2, the sidewall of this test chamber is provided with a plurality of slots 106, and each slot has the electrical interface of a plurality of parallel connections.A plurality of plates 108 that are separately installed with different types of electronic devices and components are inserted in these corresponding a plurality of slots (only illustrating one in figure).Each plate is only installed a kind of electronic devices and components (not shown), and different plates is installed different types of electronic devices and components.Components and parts on each plate are connected in parallel.Electrical interface by slot and connect electrical interface and the bus of each test instrumentation and power supply and with electronic devices and components and corresponding test instrumentation and corresponding power supply electrical connection.The shape of slot is designed to be complementary with the corresponding plate that the specific electron components and parts are installed.In one embodiment, plate is printed circuit board (PCB), wire on it is made with PCB layout technique, the wire that connects the electrode of components and parts forms the link of " golden finger " form of similar computer memory bank in the part of inserting slot, at this moment slot has accordingly and is similar to the electrical interface that is used for admitting this link on computer motherboard.Due to the advantage of PCB layout, this can adapt to measures more components and parts.Plate and be that those skilled in the art easily expect with the structure of the slot of its cooperation is as long as can realize by controlling that power supply in casing powers up to each components and parts to be measured in test chamber and by each test instrumentation of correspondence, components and parts to be measured being detected.In the embodiment that comprises 8 kinds of elements such as resistor, inductor in the above, these a plurality of slots can be only 2-8, corresponding to 2 kinds in above-mentioned 8 kinds of electronic devices and components, and 3 kinds ... 8 kinds.Replacedly, the number of these a plurality of slots can be 8 * N, N is the positive integer more than or equal to 2, this number is that the slot of 8 * N is divided into the N group, and every group comprises the slot that corresponds respectively to the plate that resistor, capacitor, inductor, three terminal regulator, diode, Industrial Frequency Transformer, high-frequency transformer and network transformer are installed.Preferably, separated by dividing plate 122 between this N group slot, attemperating unit 125 also is installed on this dividing plate, purpose is the more uniform temperature that stands for the electronic devices and components that make on each plate.
Although we have only described the utility model with the position relationship shown in Fig. 1 and 2; but those skilled in the art can easily understand by reading instructions; as long as can realize various piece function in this equipment; the position of the various piece in testing apparatus is changed; for example; test chamber is located at the bottom and test and control casing to be located at the top be all easy, all is in the utility model scope required for protection.Therefore, in the situation that do not break away from the utility model technical side ratio juris and claims institutes protection domain of enclosing, can make various modifications, variation to the utility model.
Claims (10)
1. a device for inspecting electronic component package (10) is characterized in that comprising:
Test and control casing (100) are used for holding test instrumentation and principal computer, and principal computer is connected with test instrumentation, is used for the data of collecting test instrument;
Test chamber (105) is used for holding electronic devices and components to be measured;
Device control panel (120) is used for this device for inspecting electronic component package (10) is powered up or cuts off the power supply; And
Attemperating unit (125) is used for test chamber (105) is heated or freezes;
Wherein the sidewall of this test chamber is provided with a plurality of slots, be separately installed with a plurality of inserting boards of different types of electronic devices and components in these a plurality of slots of correspondence, by the electrical interface of slot, these electronic devices and components be electrically connected to corresponding test instrumentation and power supply.
2. device for inspecting electronic component package as claimed in claim 1 (10), is characterized in that these electronic devices and components comprise resistor, capacitor, inductor, three terminal regulator, diode, Industrial Frequency Transformer, high-frequency transformer and network transformer.
3. device for inspecting electronic component package as claimed in claim 2 (10), the number that it is characterized in that these a plurality of slots is 8, corresponds respectively to the plate that resistor, capacitor, inductor, three terminal regulator, diode, Industrial Frequency Transformer, high-frequency transformer and network transformer are installed.
4. device for inspecting electronic component package as claimed in claim 2 (10), the number that it is characterized in that these a plurality of slots is 8 * N, N is the positive integer more than or equal to 2, this number is that the slot of 8 * N is divided into the N group, and every group comprises the slot that corresponds respectively to the plate that resistor, capacitor, inductor, three terminal regulator, diode, Industrial Frequency Transformer, high-frequency transformer and network transformer are installed.
5. device for inspecting electronic component package as claimed in claim 4 (10), is characterized in that being separated by dividing plate between this N group slot, and attemperating unit (125) is installed on this dividing plate.
6. device for inspecting electronic component package as claimed in claim 1 (10), is characterized in that attemperating unit (125) is arranged on the roof and diapire of test chamber (105).
7. as claim 1,5, one of 6 described device for inspecting electronic component package (10), it is characterized in that this attemperating unit (125) comprises that metal tube, heating wire are arranged on wherein, be used for heating; This attemperating unit also comprises semiconductor chilling plate, is used for freezing.
8. device for inspecting electronic component package as claimed in claim 1 (10), it is characterized in that this device for inspecting electronic component package (10) also comprises secondary computer (130), it is arranged on test and controls in casing (100), is used for controlling attemperating unit (125).
9. device for inspecting electronic component package as claimed in claim 1 (10), characterized by further comprising the first liquid crystal display (110), is used for showing the operation of principal computer.
10. device for inspecting electronic component package as claimed in claim 1 (10), characterized by further comprising the second liquid crystal display (115), is used for showing the temperature of test chamber (105).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220611254 CN203012062U (en) | 2012-11-19 | 2012-11-19 | Electronic component testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220611254 CN203012062U (en) | 2012-11-19 | 2012-11-19 | Electronic component testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203012062U true CN203012062U (en) | 2013-06-19 |
Family
ID=48603644
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220611254 Expired - Fee Related CN203012062U (en) | 2012-11-19 | 2012-11-19 | Electronic component testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203012062U (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106824833A (en) * | 2017-02-28 | 2017-06-13 | 中国振华集团云科电子有限公司 | Resistor screening technology method |
| CN107491111A (en) * | 2017-08-16 | 2017-12-19 | 中国船舶工业系统工程研究院 | A kind of temperature control equipment and method based on TEC |
| CN107688140A (en) * | 2017-10-10 | 2018-02-13 | 铜陵市华科光电科技有限公司 | A kind of capacitor repeats overvoltage experimental rig |
| CN107907741A (en) * | 2017-11-14 | 2018-04-13 | 杭州可靠性仪器厂 | Capacitor high temperature high resistant test device |
| CN113917272A (en) * | 2021-12-13 | 2022-01-11 | 海拓仪器(江苏)有限公司 | Electrified aging test device for electronic components |
| CN113917273A (en) * | 2021-12-14 | 2022-01-11 | 海拓仪器(江苏)有限公司 | Electrified reliability test system for electronic component |
-
2012
- 2012-11-19 CN CN 201220611254 patent/CN203012062U/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106824833A (en) * | 2017-02-28 | 2017-06-13 | 中国振华集团云科电子有限公司 | Resistor screening technology method |
| CN107491111A (en) * | 2017-08-16 | 2017-12-19 | 中国船舶工业系统工程研究院 | A kind of temperature control equipment and method based on TEC |
| CN107491111B (en) * | 2017-08-16 | 2019-10-11 | 中国船舶工业系统工程研究院 | A kind of temprature control method based on TEC |
| CN107688140A (en) * | 2017-10-10 | 2018-02-13 | 铜陵市华科光电科技有限公司 | A kind of capacitor repeats overvoltage experimental rig |
| CN107907741A (en) * | 2017-11-14 | 2018-04-13 | 杭州可靠性仪器厂 | Capacitor high temperature high resistant test device |
| CN113917272A (en) * | 2021-12-13 | 2022-01-11 | 海拓仪器(江苏)有限公司 | Electrified aging test device for electronic components |
| CN113917273A (en) * | 2021-12-14 | 2022-01-11 | 海拓仪器(江苏)有限公司 | Electrified reliability test system for electronic component |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN203012062U (en) | Electronic component testing device | |
| CN102317802B (en) | Integrated unit for electrical/reliability testing with improved thermal control | |
| KR101111482B1 (en) | Burn-in test system | |
| CN101907689B (en) | Generation method and device of test circuit and power supply testing system | |
| CN202362409U (en) | Device for automatically testing cables of aircraft engine | |
| CN104297536B (en) | probe module with feedback test function | |
| CN201392373Y (en) | Chip electronic element aging test device | |
| CN103207366A (en) | Test system and test method of printed circuit board assembly | |
| US8441273B2 (en) | Testing card and testing system for USB port | |
| CN102236031A (en) | Test fixture for printed circuit board | |
| CN206274329U (en) | Test accessory part and test accessory plate | |
| CN101122620A (en) | Power supply line | |
| US20100246633A1 (en) | Testing apparatus for computer motherboard design | |
| CN115902310A (en) | Multi-package LCR (liquid crystal storage controller) quick adaptation testing device and operation method thereof | |
| CN103048611A (en) | Universal COB module testing mode | |
| CN101162254A (en) | CPU slot testing device | |
| CN101738505B (en) | Test pallet | |
| CN105319476A (en) | Printed circuit board inspection apparatus and method | |
| CN212693990U (en) | Power supply test cabinet | |
| US20120242362A1 (en) | Test apparatus | |
| CN203178382U (en) | Full-automatic mutual inductor calibration control system | |
| CN103472346A (en) | Test device | |
| CN201421706Y (en) | LCM test instrument | |
| CN221200764U (en) | Test equipment | |
| CN219372433U (en) | UWB module detection device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130619 Termination date: 20141119 |
|
| EXPY | Termination of patent right or utility model |