CN206274329U - Test accessory part and test accessory plate - Google Patents
Test accessory part and test accessory plate Download PDFInfo
- Publication number
- CN206274329U CN206274329U CN201621183176.6U CN201621183176U CN206274329U CN 206274329 U CN206274329 U CN 206274329U CN 201621183176 U CN201621183176 U CN 201621183176U CN 206274329 U CN206274329 U CN 206274329U
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- Prior art keywords
- test
- interface
- plate
- accessory plate
- auxiliary line
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Abstract
The utility model discloses one kind test accessory part and test accessory plate.The test accessory part includes at least one auxiliary line, and auxiliary line includes at least one first interface, multiple test points, and first interface is electrically connected with multiple test points, pin spacing of the spacing between test point more than the connector of circuit-under-test plate；FPC, it is respectively arranged at the two ends with second interface, the 3rd interface, and second interface is electrically connected with the 3rd interface, and second interface is used to be patched with first interface, and the 3rd interface is used to be connected with the connector of circuit-under-test plate.Through the above way, the utility model can improve testing efficiency in the case where not causing to damage to former mainboard.
Description
Technical field
The utility model is related to technical field of measurement and test, more particularly to a kind of to test accessory part and test accessory plate.
Background technology
At present, using the BTB with more Pin pin number, (Board-to-board Connectors, plate is to plate more than mainboard
Connector) and ZIF (Zero Insertion Force, zero resistance connector) connector.If mainboard goes wrong, then tie up
The resistance of each Pin pin and voltage need to be measured when repairing, but because Pin pin are overstocked and pin number is more, often occur and miscount pin position
From the beginning phenomenon, often need repeated measurement again, and analysis efficiency is very low.
In traditional measuring method, the spent time of 60Pin pin is measured in 120S or so with universal meter, 40Pin pin
Spent time is in 80S or so, that is, time needed for often measuring a Pin pin is in 2S or so, and on condition that is not miscounting pin
In the case of position.At the same time, when universal meter nib is measured on mainboard, recessive quality problems can be produced to mainboard pad, such as
The problems such as scratching the circuit on mainboard button bit and touch off button bit Pin pin and cause mainboard to be scrapped.
Utility model content
The utility model is mainly solving the technical problems that provide a kind of test accessory part and test accessory plate, Neng Gou
In the case of not causing to damage to former mainboard, testing efficiency is improved.
In order to solve the above technical problems, the technical scheme that the utility model is used is：A kind of test assisted group is provided
Part, the test accessory part includes：Test accessory plate, is provided with least one auxiliary line, and the auxiliary line includes at least one
Individual first interface, multiple test points, the first interface are electrically connected with the multiple test point, the spacing between the test point
More than the pin spacing of the connector of circuit-under-test plate；FPC (Flexible Printed Circuit Board,
It is exactly FPC), it is respectively arranged at the two ends with second interface, the 3rd interface, and the second interface is electrically connected with the 3rd interface, described
Second interface is used to be patched with the first interface, and the 3rd interface is used to be connected with the connector of circuit-under-test plate.
Wherein, the test accessory plate is provided with multiple diverse auxiliary lines.
Wherein, the auxiliary line includes multiple pads, the pin of the first interface and the corresponding pad solder,
And then the first interface is fixed on the test accessory plate.
Wherein, the spacing between the test point is more than three millimeters.
Wherein, the test accessory plate is provided with different marks adjacent to the position of the different test points.
In order to solve the above technical problems, another technical scheme that the utility model is used is：A kind of test auxiliary is provided
Plate, the test accessory plate includes：It is provided with least one auxiliary line, the auxiliary line includes at least one first interface, many
Individual test point, the first interface is electrically connected with the multiple test point, and the spacing between the test point is more than circuit-under-test
The pin spacing of the connector of plate.
Wherein, multiple diverse auxiliary lines are provided with.
Wherein, the auxiliary line includes multiple pads, the pin of the first interface and the corresponding pad solder,
And then the first interface is fixed on the test accessory plate.
Wherein, the spacing between the test point is more than three millimeters.
Wherein, the test accessory plate is provided with different marks adjacent to the position of the different test points.
Above scheme, the test accessory part includes at least one auxiliary line, and auxiliary line includes at least one first
Interface, multiple test points, first interface are electrically connected with the multiple test point, and the spacing between test point is more than circuit-under-test plate
Connector pin spacing；FPC, it is respectively arranged at the two ends with second interface, the 3rd interface, and second interface connects with the 3rd
Mouth electrical connection, second interface is used to be patched with first interface, and the 3rd interface is used to be connected with the connector of circuit-under-test plate, realizes
In the case where not causing to damage to former mainboard, testing efficiency is improved.
Brief description of the drawings
Fig. 1 is the structural representation that the utility model tests the implementation method of accessory part one；
Fig. 2 is the structural representation that the utility model tests the application scenarios of accessory part one；
Fig. 3 is the structural representation that the utility model tests the implementation method of accessory plate one.
Specific embodiment
The utility model is described in detail with implementation method below in conjunction with the accompanying drawings.
Fig. 1 is referred to, Fig. 1 is the structural representation that the utility model tests the implementation method of accessory part one.It should be appreciated that
Specific embodiment described herein is only used to explain the utility model, is not used to limit the utility model.
In present embodiment, the test accessory part 10 includes test accessory plate 11 and FPC 16.
Test accessory plate 11 at least includes an auxiliary line 12, and auxiliary line 12 includes first interface 13 and test point
15.Wherein, first interface 13 is electrically connected with test point 15, and connector of the spacing more than circuit-under-test plate between test point 15
Pin spacing.
The two ends of FPC 16 are provided with the interface 18 of second interface 17 and the 3rd, second interface 17 and the electricity of the 3rd interface 18
Connection, second interface 17 is used to be patched with first interface 13, and the 3rd interface 18 is used to be connected with the connector of circuit-under-test plate.
Alternatively, test accessory plate 11 can be provided with multiple diverse auxiliary lines 12, that is, refer to various
The auxiliary line of varying number test point, such as with 24 test points, 35 test points, 39 test points, 40 tests
Point, the auxiliary line of 60 test points are welded on test accessory plate.It is corresponding soft that each auxiliary line corresponds to a specification
Property wiring board.
Alternatively, auxiliary line 12 is welded on test accessory plate 11.Auxiliary line 12 has multiple pads 14, pad
14 with the pin and corresponding pad solder of first interface 13, and then first interface 13 is fixed on test accessory plate 11.
Alternatively, the spacing between test point 15 is at least above 3mm.
Alternatively, test accessory plate 11 is provided with different marks adjacent to the position of different test points, as shown in figure 1,
Numeral 1,2,3,4 etc. is put in unification near different test points, can be used for the different test point of identification, is unlikely in test
When mix up and confuse.
Wherein, FPC 16 is the printed circuit that the flexible insulating substrate of apparatus is made, can be with free bend, volume
Around, fold, millions of time dynamic bendings can be born without damaging wire, can according to space layout any arrangement of requirement, and
Arbitrarily moved and flexible in three dimensions, FPC also has good thermal diffusivity and solderability.The base of FPC
Material is more based on polyimide copper clad lamination, and has the cover layer of mechanical protection and good electrical insulating properties concurrently by compacting
Into polyimide copper clad lamination has heat resistance and good dimensional stability high.Two-sided, multi-layer flexible circuit board top layer and
Inner conductor realizes the electrical connection of ectonexine circuit by metallization.The function of FPC can divide into four kinds, respectively
It is lead (Lead Line), printed circuit (Printed Circuit), connector (Connector) and Multifunctional integration
System (Integration of Function).In the present embodiment, what is utilized is exactly the connector work(of FPC
Energy.
Wherein in an application scenarios, as shown in Fig. 2 circuit-under-test plate includes the be connected with FPC the 4th
Interface, and the circuit-under-test plate electrically connected with the 4th interface mainboard.Two interfaces of FPC, second interface and test
The first interface of an auxiliary line in accessory plate is patched, and the 3rd interface is connected with the connector of circuit-under-test plate.Using ten thousand
Circuit-under-test plate is tested with table, that is to say the resistance of each pin of detection circuit-under-test plate, wherein one of universal meter
Test pencil connects the mainboard of circuit-under-test plate, the test point of another test pencil connecting test accessory plate, thus to test accessory plate
Test point is tested one by one, and due to the 4th interface on test point and the circuit-under-test plate of testing accessory plate pin one by one
Correspondence, therefore test rate can be improved.Voltage if necessary to test circuit-under-test plate, then with power supply to circuit-under-test plate
Main board power supply is started shooting.Further, since the resistance very little of FPC, can ignore during test resistance, it is flexible
The resistance of wiring board, and during test voltage, the partial pressure problem of FPC.
In the present embodiment, the test accessory part includes at least one auxiliary line, and auxiliary line includes at least one
Individual first interface, multiple test points, first interface are electrically connected with the multiple test point, and the spacing between test point is more than tested
The pin spacing of the connector of circuit board；FPC, it is respectively arranged at the two ends with second interface, the 3rd interface, second interface with
3rd interface is electrically connected, and second interface is used to be patched with first interface, and the 3rd interface is used to connect with the connector of circuit-under-test plate
Connect, realize in the case where not causing to damage to former mainboard, improve testing efficiency.
Fig. 3 is referred to, Fig. 3 is the structural representation that the utility model tests the implementation method of accessory plate one.Present embodiment
Described test accessory plate 30 includes at least one auxiliary line 31, and auxiliary line 31 includes at least one first interface 32 and surveys
Pilot 34.Wherein, first interface 32 is electrically connected with test point 34, and spacing between test point 34 is more than circuit-under-test plate
The pin spacing of connector.
Alternatively, test accessory plate 30 can be provided with multiple diverse auxiliary lines 31, that is, refer to various
The auxiliary line of varying number test point.The corresponding FPC of the corresponding specification of each auxiliary line.
Alternatively, auxiliary line 31 is welded on test accessory plate 30.Auxiliary line 31 has multiple pads 33, pad
33 with the pin and corresponding pad solder of first interface 32, and then first interface 32 is fixed on test accessory plate 30.
Alternatively, the spacing between test point 34 is at least above 3mm.
Alternatively, test accessory plate 30 is provided with different marks adjacent to the position of different test points, as shown in figure 3,
Numeral 1,2,3,4 etc. is put in unification near different test points, can be used for the different test point of identification, is unlikely in test
When mix up and confuse.
In the present embodiment, the test accessory plate is provided with least one auxiliary line, and auxiliary line includes at least one
Individual first interface, multiple test points, first interface are electrically connected with multiple test points, and the spacing between test point is more than circuit-under-test
The pin spacing of the connector of plate, realizes in the case where not causing to damage to former mainboard, improves testing efficiency.
Embodiment of the present utility model is the foregoing is only, the scope of the claims of the present utility model is not thereby limited, it is every
The equivalent structure or equivalent flow conversion made using the utility model specification and accompanying drawing content, or be directly or indirectly used in
Other related technical fields, are similarly included in scope of patent protection of the present utility model.
Claims (10)
1. it is a kind of to test accessory part, it is characterised in that including：
Test accessory plate, is provided with least one auxiliary line, and the auxiliary line includes at least one first interface, multiple tests
Point, the first interface is electrically connected with the multiple test point, company of the spacing between the test point more than circuit-under-test plate
Connect the pin spacing of device；
FPC, it is respectively arranged at the two ends with second interface, the 3rd interface, and the second interface is electrically connected with the 3rd interface
Connect, the second interface is used to be patched with the first interface, the 3rd interface is used to connect with the connector of circuit-under-test plate
Connect.
2. component according to claim 1, it is characterised in that
The test accessory plate is provided with multiple diverse auxiliary lines.
3. component according to claim 1, it is characterised in that
The auxiliary line includes multiple pads, the pin of the first interface and the corresponding pad solder, and then by institute
State first interface and be fixed on the test accessory plate.
4. component according to claim 1, it is characterised in that
Spacing between the test point is more than three millimeters.
5. the component according to any one of Claims 1-4, it is characterised in that
The test accessory plate is provided with different marks adjacent to the position of the different test points.
6. it is a kind of to test accessory plate, it is characterised in that including：
At least one auxiliary line is provided with, the auxiliary line includes at least one first interface, multiple test points, described first
Interface is electrically connected with the multiple test point, between pin of the spacing between the test point more than the connector of circuit-under-test plate
Away from.
7. test accessory plate according to claim 6, it is characterised in that
It is provided with multiple diverse auxiliary lines.
8. test accessory plate according to claim 6, it is characterised in that
The auxiliary line includes multiple pads, the pin of the first interface and the corresponding pad solder, and then by institute
State first interface and be fixed on the test accessory plate.
9. test accessory plate according to claim 6, it is characterised in that
Spacing between the test point is more than three millimeters.
10. the test accessory plate according to any one of claim 6 to 9, it is characterised in that
The test accessory plate is provided with different marks adjacent to the position of the different test points.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621183176.6U CN206274329U (en) | 2016-11-03 | 2016-11-03 | Test accessory part and test accessory plate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621183176.6U CN206274329U (en) | 2016-11-03 | 2016-11-03 | Test accessory part and test accessory plate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206274329U true CN206274329U (en) | 2017-06-23 |
Family
ID=59062226
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621183176.6U Expired - Fee Related CN206274329U (en) | 2016-11-03 | 2016-11-03 | Test accessory part and test accessory plate |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206274329U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108957216A (en) * | 2018-08-03 | 2018-12-07 | 深圳市潜力创新科技有限公司 | FPC connector and its method for on-line measurement FPC interface parameters |
| CN109932622A (en) * | 2017-12-16 | 2019-06-25 | 神讯电脑(昆山)有限公司 | The high pressure resistant test device of Type-c connector |
| CN111162421A (en) * | 2018-11-08 | 2020-05-15 | 神讯电脑(昆山)有限公司 | Signal analysis test adapter |
| CN112345828A (en) * | 2020-09-25 | 2021-02-09 | 华东光电集成器件研究所 | Multi-row direct insertion type metal tube shell insulation resistance testing device |
-
2016
- 2016-11-03 CN CN201621183176.6U patent/CN206274329U/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109932622A (en) * | 2017-12-16 | 2019-06-25 | 神讯电脑(昆山)有限公司 | The high pressure resistant test device of Type-c connector |
| CN108957216A (en) * | 2018-08-03 | 2018-12-07 | 深圳市潜力创新科技有限公司 | FPC connector and its method for on-line measurement FPC interface parameters |
| CN111162421A (en) * | 2018-11-08 | 2020-05-15 | 神讯电脑(昆山)有限公司 | Signal analysis test adapter |
| CN111162421B (en) * | 2018-11-08 | 2021-08-10 | 神讯电脑(昆山)有限公司 | Signal analysis test adapter |
| CN112345828A (en) * | 2020-09-25 | 2021-02-09 | 华东光电集成器件研究所 | Multi-row direct insertion type metal tube shell insulation resistance testing device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170623 Termination date: 20171103 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |