CN103048611A - Universal COB module testing mode - Google Patents
Universal COB module testing mode Download PDFInfo
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- CN103048611A CN103048611A CN2013100232131A CN201310023213A CN103048611A CN 103048611 A CN103048611 A CN 103048611A CN 2013100232131 A CN2013100232131 A CN 2013100232131A CN 201310023213 A CN201310023213 A CN 201310023213A CN 103048611 A CN103048611 A CN 103048611A
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Abstract
The invention discloses a universal COB module testing mode and belongs to the field of manufacturing of touch panels. The universal COB module testing mode comprises the following processes that a COB module to be tested is connected to an adapter board; one end of the adapter board is led to a function board with an integrated circuit (IC) through a wire jumper according to a channel sequence; at the other end of the function board and a data communication end are sequentially connected to a testing board; the testing board is connected to a computer; and the test is performed by utilizing testing software. According to the testing method, even if the terminal mainboard adopts different ICs, the testing method and the testing software are different, the method can integrate different types of COB module tests, a testing tool is not required to be modified, only the wire jumper sequence is required to be changed, and the method is high in testing accuracy, high in timeliness and high in universality.
Description
Technical field
The present invention relates to COB module universal testing mode, COB module (chip On board) is the module that chip is positioned at mainboard, belongs to contact panel and makes the field.
Background technology
At present the test of COB module mostly is that the IC in the buying special project is processed into PCB(Printed Circuit Board printed circuit board in the industry) carry out vacation and tie up rear test, perhaps line is tested after the installation.
False binding mode need to be according to product I C requirement, and first design concept figure, wiring drawing are purchased corresponding IC again and processed pcb board, card extender, if without IC agency's support, layout design, drawing evaluation, a minute position program, method of testing all are difficult to solve.Efficient is low can't to satisfy the shipment of COB sample.Secondly, the mode of line test after the installation, test seriously lags behind especially, character surveillance in the time of can't satisfying volume production; Even buying professional test equipment, the electric property of test contact panel, effect is not directly perceived yet.
Summary of the invention
The invention discloses COB module universal testing mode.Detailed process is: on COB module access card extender to be measured, the other end of card extender is introduced on the feature board with IC of designed, designed with wire jumper according to the passage order, and the I/O communication ends with this feature board accesses on the test board successively again.With data line test board is connected with computer, utilizes testing software to test.The advantage of this method of testing: feature board is compatible strong, even terminal mainboard uses different IC, and method of testing, testing software difference, the method also can be integrated, maximum 28+16 passage, the following COB module of 8 " supported.The COB module test of different cultivars need not be changed testing tool, only needs the change of wire jumper order is got final product, and the card extender that need to use is also general with other testing apparatus, and test accuracy is high, and is ageing strong, has more universality.
The invention provides COB module universal testing mode, comprise the steps:
Step 1: on COB module access card extender to be measured;
Step 2: the other end of card extender is introduced on the feature board with IC with wire jumper according to the passage order;
Step 3: access successively an other end data communication ends of this feature board on the test board;
Step 4: with data line test board is connected with computer, after the configuration of use test software, tests;
By above step, just finish COB module universal testing mode.
Description of drawings
Fig. 1: COB module synoptic diagram;
Fig. 2: card extender synoptic diagram;
Fig. 3: with the feature board synoptic diagram of IC;
Fig. 4: the supporting synoptic diagram of test board and main frame;
Fig. 5: integral installation figure;
The simple symbol explanation:
A:COB module FPC golden finger;
B: the connector corresponding with the golden finger of FPC shown in A place;
C: card extender wire jumper interface;
D: with the wire jumper interface on the feature board of IC, be connected with the card extender wire jumper interface shown in the C;
E: with the IC on the feature board of IC;
F: with the communication interface on the feature board of IC;
G: communication interface on the supporting test board and is connected with communication interface on the feature board of IC;
H: Test Host.
Embodiment
The below further describes with implementation of the present invention:
Step 1: on COB module access card extender to be measured;
Step 2: the other end of card extender is introduced on the feature board with IC with wire jumper according to the passage order;
Step 3: access successively an other end data communication ends of this feature board on the test board;
Step 4: with data line test board is connected with computer, after the configuration of use test software, tests;
By above step, just finish COB module universal testing mode.
Embodiment:
Step 1: such as Fig. 1 with the Circuit of FPC(Flexible Printed shown in the A of COB module flexible printed circuit board) the corresponding connector in FPC golden finger place shown in the B among golden finger access Fig. 2;
Step 2: according to the design drawing requirement, according to sensor passage order with being connected with the use of the wire jumper interface on the feature board of IC wire jumper shown in the D among the card extender wire jumper interface shown in the C among Fig. 2 and Fig. 3;
Step 3: will be connected by communication interface on the supporting test board shown in the G among definition and Fig. 4 with communication interface on the feature board of IC shown in the F among Fig. 3;
Step 4: such as Fig. 5 usage data line supporting test board is connected with Test Host shown in the H, makes it to carry out proper communication.Thereby utilize testing software to import the function that corresponding test configurations realizes detecting COB module quality.
Though the present invention is described by above-mentioned example, but still can change its form and details, make without departing from the spirit of the present invention.Above-mentioned for the most rational using method of the present invention, only for the present invention can implementation one of mode, but not as limit.Those skilled in the art is understood, and can carry out many changes to it in the spirit and scope that claim of the present invention limits, revise, even equivalence, but all will fall within the scope of protection of the present invention.
Claims (5)
1.COB the module universal testing mode, its feature comprises the steps:
Step 1: on COB module access card extender to be measured;
Step 2: the other end of card extender is introduced on the feature board with IC with wire jumper according to the passage order;
Step 3: access successively an other end data communication ends of this feature board on the test board;
Step 4: with data line test board is connected with computer, after the configuration of use test software, tests;
By above step, just finish COB module universal testing mode.
2.COB the module universal testing mode is characterized in that the method for testing of all different IC kinds of terminal finally to be integrated into and uses a kind of method to test, and has reduced the dependence to all kinds of IC method of testings, has improved ageing.
3.COB the module universal testing mode is characterized in that different cultivars COB module used test instrument is basic identical, only needs to change the COB interface socket, realizes the maximum using of material.
4.COB the module universal testing mode is characterized in that adopting jumper, the maximum 28+16 of passage has data stabilization, flexible configuration, and good downward compatibility.
5.COB the module universal testing mode is characterized in that testing apparatus is simple, test is directly perceived, compares Special Equipment, and is with low cost.
Priority Applications (1)
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CN2013100232131A CN103048611A (en) | 2013-01-21 | 2013-01-21 | Universal COB module testing mode |
Applications Claiming Priority (1)
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CN2013100232131A CN103048611A (en) | 2013-01-21 | 2013-01-21 | Universal COB module testing mode |
Publications (1)
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CN103048611A true CN103048611A (en) | 2013-04-17 |
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CN2013100232131A Pending CN103048611A (en) | 2013-01-21 | 2013-01-21 | Universal COB module testing mode |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103760437A (en) * | 2014-01-07 | 2014-04-30 | 上海众人网络安全技术有限公司 | Method for testing display data of electronic cipherer COB circuit board |
CN103884976A (en) * | 2014-02-21 | 2014-06-25 | 上海华力微电子有限公司 | Connection method for final test of semiconductor device |
CN104808133A (en) * | 2014-01-24 | 2015-07-29 | 矽创电子股份有限公司 | Automatic test equipment and integrated circuit test interface for upgrading automatic test equipment |
CN105260074A (en) * | 2015-11-03 | 2016-01-20 | 江西省天翌光电有限公司 | Capacitive touch screen testing bridging plate |
Citations (6)
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CN1858596A (en) * | 2006-04-03 | 2006-11-08 | 华为技术有限公司 | Chip general detector and its structure method |
US20080050982A1 (en) * | 2006-08-25 | 2008-02-28 | Canon Kabushiki Kaisha | Electronic module and method of manufacturing electronic module |
CN201138360Y (en) * | 2007-12-13 | 2008-10-22 | 中芯国际集成电路制造(上海)有限公司 | Aging device |
CN201285422Y (en) * | 2008-10-28 | 2009-08-05 | 中山市达华智能科技有限公司 | COB module fast detection apparatus for non-contact smart card |
CN201773169U (en) * | 2010-06-23 | 2011-03-23 | 天津渤海易安泰电子半导体测试有限公司 | Testing system for integrated circuit chip |
CN102129025A (en) * | 2011-01-04 | 2011-07-20 | 苏州瀚瑞微电子有限公司 | Chip test device and method |
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Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1858596A (en) * | 2006-04-03 | 2006-11-08 | 华为技术有限公司 | Chip general detector and its structure method |
US20080050982A1 (en) * | 2006-08-25 | 2008-02-28 | Canon Kabushiki Kaisha | Electronic module and method of manufacturing electronic module |
CN201138360Y (en) * | 2007-12-13 | 2008-10-22 | 中芯国际集成电路制造(上海)有限公司 | Aging device |
CN201285422Y (en) * | 2008-10-28 | 2009-08-05 | 中山市达华智能科技有限公司 | COB module fast detection apparatus for non-contact smart card |
CN201773169U (en) * | 2010-06-23 | 2011-03-23 | 天津渤海易安泰电子半导体测试有限公司 | Testing system for integrated circuit chip |
CN102129025A (en) * | 2011-01-04 | 2011-07-20 | 苏州瀚瑞微电子有限公司 | Chip test device and method |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103760437A (en) * | 2014-01-07 | 2014-04-30 | 上海众人网络安全技术有限公司 | Method for testing display data of electronic cipherer COB circuit board |
CN103760437B (en) * | 2014-01-07 | 2016-06-22 | 上海众人网络安全技术有限公司 | A kind of video data method of testing of electronic cipher device COB circuit board |
CN104808133A (en) * | 2014-01-24 | 2015-07-29 | 矽创电子股份有限公司 | Automatic test equipment and integrated circuit test interface for upgrading automatic test equipment |
CN103884976A (en) * | 2014-02-21 | 2014-06-25 | 上海华力微电子有限公司 | Connection method for final test of semiconductor device |
CN105260074A (en) * | 2015-11-03 | 2016-01-20 | 江西省天翌光电有限公司 | Capacitive touch screen testing bridging plate |
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Application publication date: 20130417 |