CN203786150U - IC-USB test clamp - Google Patents

IC-USB test clamp Download PDF

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Publication number
CN203786150U
CN203786150U CN201420035377.6U CN201420035377U CN203786150U CN 203786150 U CN203786150 U CN 203786150U CN 201420035377 U CN201420035377 U CN 201420035377U CN 203786150 U CN203786150 U CN 203786150U
Authority
CN
China
Prior art keywords
voltage
impedance matching
matching circuit
usb
sim card
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201420035377.6U
Other languages
Chinese (zh)
Inventor
张进龙
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Huahong Integrated Circuit Co Ltd
Original Assignee
Shanghai Huahong Integrated Circuit Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Huahong Integrated Circuit Co Ltd filed Critical Shanghai Huahong Integrated Circuit Co Ltd
Priority to CN201420035377.6U priority Critical patent/CN203786150U/en
Application granted granted Critical
Publication of CN203786150U publication Critical patent/CN203786150U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The utility model discloses an IC-USB test clamp. The IC-USB test clamp comprises a printed circuit board on which a SIM holder, an impedance matching circuit, a signal detection interface and a 5V-3V voltage domain conversion low voltage linear voltage regulator are arranged. The input end of the 5V-3V voltage domain conversion low voltage linear voltage regulator is connected with a 5V voltage output end of the signal detection interface, and the output end outputs a 3V voltage and is connected with a power supply voltage end of the SIM holder. The SIM holder is connected with the impedance matching circuit, the impedance matching circuit is connected with the signal detection interface, and a test point is arranged in a connection line of the impedance matching circuit and the signal detection interface. The IC-USB test clamp of the utility model enables the test efficiency and the reliability of data measurement to be improved effectively.

Description

IC-USB test fixture
Technical field
The utility model relates to smart card field tests, particularly relates to a kind of IC-USB(chip chamber USB (universal serial bus)) test fixture.
Background technology
Along with scientific and technological development, smart card techniques is more and more applied in people's daily life.Along with the continuous lifting of speed, IC-USB becomes an important indicator of smart card gradually, and the signal quality testing of IC-USB is especially aobvious important
The oscillograph manufacturer having at present does not all also provide corresponding test fixture, so situation is all to use fly line to measure mostly, so not only connecting line is loaded down with trivial details, the more important thing is to introduce and disturbs, causing the inaccurate of signal measurement, is insecure for examination IC-USB Physical layer.
Utility model content
The technical problems to be solved in the utility model is to provide a kind of IC-USB test fixture, can effectively improve the reliability of testing efficiency and measurement data.
For solving the problems of the technologies described above, IC-USB test fixture of the present utility model, comprising:
One printed circuit board (PCB), the SIM(client identification module arranging on this printed circuit board (PCB)) deck, impedance matching circuit, acquisition of signal interface, 5V-3V voltage domain conversion low pressure linear voltage regulator;
The input end of described 5V-3V voltage domain conversion low pressure linear voltage regulator is connected with the 5V voltage output end of acquisition of signal interface, and its output terminal output 3V voltage is also connected with the power voltage terminal of SIM card seat;
Described SIM card seat is connected with impedance matching circuit, and described impedance matching circuit is connected with acquisition of signal interface; On the circuit being connected with acquisition of signal interface at described impedance matching circuit, be provided with test point.
The utility model is considered the authenticity of test signal, can make SIP link and receive main frame, sends specific packet by host computer testing software control SIP card, reaches the object of test signal quality.Not only avoid the connection of a large amount of cables, reduced simultaneously and caused the inaccurate external interference factor of signal measurement, both improved testing efficiency, improved again the reliability of measurement data; Solved at present cannot test I C-USB signal quality problem.
Brief description of the drawings
Below in conjunction with accompanying drawing and embodiment, the utility model is described in further detail:
Accompanying drawing is described IC-USB test fixture structural representation.
Embodiment
By reference to the accompanying drawings, described IC-USB test fixture, in the following embodiments, comprising: a printed circuit board (PCB) is respectively arranged with on this printed circuit board (PCB):
One SIM card seat, making testing apparatus is that SIM card is inserted this SIM card seat.
One impedance matching circuit, what adopt in the present embodiment is source series connection coupling, this impedance matching circuit is the necessary condition that ensures signal integrity transmission
One acquisition of signal interface USB-B, with PC(PC) USB interface of machine is connected, and makes PC and SIM card carry out communication.
One 5V-3V voltage domain conversion low pressure linear voltage regulator LDO, its input end is connected with the VBus power voltage terminal of acquisition of signal interface USB-B, thereby obtain the direct supply of 5V, and convert thereof into 3.0V direct supply, the supply voltage VCC that outputs to described SIM card seat holds for SIM card.Because the operating voltage of SIM card is 3.0V, so need to carry out the conversion of 5V-3V voltage domain.
Described SIM card seat C4 pin (i.e. the 4th pin) is connected with impedance matching circuit respectively with C8 pin (i.e. the 8th pin), and described impedance matching circuit is connected with D-pin with the D+ pin of acquisition of signal interface USB-B; The 4th pin is corresponding with D+ pin, and C8 pin is corresponding with D-pin.On the circuit being connected with acquisition of signal interface USB-B at described impedance matching circuit, be provided with test point.
PC, as host computer, sends specific packet by testing software control SIM card, and oscillograph is by the test point collection signal on test fixture, thereby carries out data analysis.
By embodiment, the utility model is had been described in detail above, but these not form restriction of the present utility model.In the situation that not departing from the utility model principle, those skilled in the art also can make many distortion and improvement, and these also should be considered as protection domain of the present utility model.

Claims (2)

1. an IC-USB test fixture, comprises, a printed circuit board (PCB), is characterized in that:
The SIM card seat arranging on this printed circuit board (PCB), impedance matching circuit, acquisition of signal interface, 5V-3V voltage domain conversion low pressure linear voltage regulator;
The input end of described 5V-3V voltage domain conversion low pressure linear voltage regulator is connected with the 5V voltage output end of acquisition of signal interface, and its output terminal output 3V voltage is also connected with the power voltage terminal of SIM card seat;
Described SIM card seat is connected with impedance matching circuit, and described impedance matching circuit is connected with acquisition of signal interface; On the circuit being connected with acquisition of signal interface at described impedance matching circuit, be provided with test point.
2. IC-USB test fixture as claimed in claim 1, is characterized in that: PC sends specific packet as PC control SIM card, oscillograph is by the test point collection signal on test fixture.
CN201420035377.6U 2014-01-21 2014-01-21 IC-USB test clamp Expired - Fee Related CN203786150U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201420035377.6U CN203786150U (en) 2014-01-21 2014-01-21 IC-USB test clamp

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201420035377.6U CN203786150U (en) 2014-01-21 2014-01-21 IC-USB test clamp

Publications (1)

Publication Number Publication Date
CN203786150U true CN203786150U (en) 2014-08-20

Family

ID=51322324

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201420035377.6U Expired - Fee Related CN203786150U (en) 2014-01-21 2014-01-21 IC-USB test clamp

Country Status (1)

Country Link
CN (1) CN203786150U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108288979A (en) * 2018-01-26 2018-07-17 武汉电信器件有限公司 A kind of high speed signal test system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108288979A (en) * 2018-01-26 2018-07-17 武汉电信器件有限公司 A kind of high speed signal test system

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Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20140820

Termination date: 20170121