CN102567167A - Testing card and testing system for mSATA (serial advanced technology attachment) interface - Google Patents
Testing card and testing system for mSATA (serial advanced technology attachment) interface Download PDFInfo
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- CN102567167A CN102567167A CN2010105810986A CN201010581098A CN102567167A CN 102567167 A CN102567167 A CN 102567167A CN 2010105810986 A CN2010105810986 A CN 2010105810986A CN 201010581098 A CN201010581098 A CN 201010581098A CN 102567167 A CN102567167 A CN 102567167A
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- golden finger
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Abstract
A testing card for an mSATA (serial advanced technology attachment) interface comprises a golden finger and a group of signal testing pins, the golden finger comprises a pair of signal connecting pins, the signal connecting pins are connected with corresponding signal transmission pins in an mSATA slot respectively when the golden finger is inserted into the mSATA slot, signal testing pins are connected with corresponding signal connecting pins on the golden finger electrically and used for being connected with an oscilloscope so as to display data output by the mSATA slot through the oscilloscope. An mSATA signal testing system is simple and convenient in operation and capable of effectively avoiding possible damages of a main board due to welding lines and testing cost is saved.
Description
Technical field
The present invention relates to a kind of mSATA interface test card and test macro.
Background technology
Since the SSD solid state hard disc have start fast, read that writing speed is fast, little in light weight, the advantage such as heating is low of noiselessness, volume, so this SSD solid state hard disc has been widely used in a plurality of fields such as notebook, all-in-one.Micro-SATA (mSATA) is widely used as a kind of interface of SSD solid state hard disc.But,, also do not have special-purpose measurement jig at present for the mSATA interface of test SSD solid state hard disc protocol compliant standard whether.
Summary of the invention
In view of above content, be necessary to provide a kind of mSATA interface test system, so that whether the protocol compliant standard is tested to the mSATA interface.
The present invention also provides a kind of mSATA interface test card.
A kind of test macro; Whether the mSATA interface that is used to test the hard disk that links to each other with a mSATA slot protocol compliant regulation; One group of signal transmission pin is set in the said mSATA slot; Said test macro comprises a mSATA interface test card and an oscillograph, and said oscillograph links to each other with said signal testing pin to show the data of said mSATA slot output through said oscillograph.
A kind of mSATA interface test card; Comprise a golden finger and one group of signal testing pin; Said golden finger comprises that a pair of signal connects pin; In said golden finger is plugged in a mSATA slot, said signal connect pin respectively with said mSATA slot in corresponding signal transmission pin link to each other, said signal testing pin respectively with said golden finger on corresponding signal be connected the pin electrical connection; Said signal testing pin is used to connect an oscillograph, has shown the data of said mSATA slot output through oscillograph.
Above-mentioned test macro is through being provided with said mSATA interface test card; At test mSATA interface whether during the protocol compliant regulation; Only need said mSATA interface test card is plugged on the said mSATA slot, whether protocol compliant is stipulated just can directly to record said mSATA interface.Said mSATA signal test system is simple to operation, and can effectively avoid mainboard because of the damage that bonding wire possibly cause, and has practiced thrift the cost of test.
Description of drawings
Fig. 1 has the block diagram of the test macro preferred embodiments of mSATA interface test card for the present invention.
Fig. 2 is the synoptic diagram of the mSATA interface test card of Fig. 1.
The main element symbol description
MSATA interface test card 11
MSATA slot 200
MSATA interface 300
Signal testing pin D+, D-
Signal transmission pin TX+, TX-
Signal connects pin RX+, RX-
Embodiment
Below in conjunction with accompanying drawing and preferred embodiments the present invention is described in further detail:
Please with reference to Fig. 1 and Fig. 2, a kind of test macro 100 of the present invention be used to test one with a mainboard (figure does not show) on the mSATA interface 300 protocol compliant standard whether of the hard disk that is connected of mSATA slot 200.The preferred embodiments of said test macro 100 comprises a mSATA interface test card 11, a connection piece 12 and a testing apparatus 13.Said mSATA interface test card 11 can be plugged in the said mSATA slot 200.In this embodiment, said web member 12 is a wireless aerial interface (Sub-Miniature-A is hereinafter to be referred as a SMA) type connector, and said testing apparatus 13 is an oscillograph.Said web member 12 is used to connect said mSATA interface test card 11 and said testing apparatus 13.
A pair of signal transmission pin TX+ and TX-are set in the said mSATA slot 200, and wherein said signal transmission pin TX+ and TX-are used to transmit the mSATA signal.Said mSATA interface test card 11 comprises a circuit board 111, a golden finger 112 and one group of signal testing pin D+ and D-.Said golden finger 112 is arranged at a side of circuit board 111; Comprise that one group of signal connects pin RX+ and RX-; Said mSATA slot 200 is used to peg graft; And with said mSATA slot 200 in corresponding signals transmission pin TX+ and TX-is electrically connected, with the transmission mSATA signal of test, thereby judge said mSATA interface 300 whether stipulate by protocol compliant from mSATA slot 200.
Said signal testing pin D+ and D-are arranged on the circuit board 111, and are oppositely arranged with golden finger 112.The end of said signal testing pin D+ and D-respectively with said golden finger 112 on signal connect pin RX+ and RX-is corresponding continuous; The shape and the structure of the other end of said signal testing pin D+ and D-are corresponding with said web member 12, can be connected into to testing apparatus 13 through said web member 12.
During test; Golden finger in the said mSATA interface test card 11 112 is aimed at said mSATA slot 200; So that said mSATA interface test card 11 is plugged on the said mSATA slot 200 to be measured, and make the signal of said mSATA interface test card 11 connect pin RX+ and RX-links to each other with the corresponding signal transmission pin TX+ and the TX-of said mSATA slot 200 respectively.Then the end with said web member 12 is connected on the testing apparatus 13, and the other end is connected to said transmission signals test pin D+ and D-successively, to connect said mSATA interface test card 11 and testing apparatus 13.Electrifying startup is mounted with the computer main board of said mSATA slot 200.At this moment; When mSATA slot 200 output signals; The waveform of signal testing pin D+ and D-output when the user can observe computer main boards work through testing apparatus 13 is to analyze and to judge that the parameter of the mSATA signal of said testing apparatus 13 outputs can confirm with the relevant parameter in the protocol specification said mSATA interface whether stipulate by protocol compliant.
Claims (5)
1. mSATA interface test card; Comprise a golden finger and one group of signal testing pin; Said golden finger comprises that a pair of signal connects pin; In said golden finger is plugged in a mSATA slot, said signal connect pin respectively with said mSATA slot in corresponding signal transmission pin link to each other, said signal testing pin respectively with said golden finger on corresponding signal be connected the pin electrical connection; Said signal testing pin is used to connect an oscillograph, to show the data of said mSATA slot output through oscillograph.
2. mSATA interface test card as claimed in claim 1 is characterized in that: said mSATA interface test card comprises a circuit board, and said golden finger and signal testing pin are arranged on the said circuit board.
3. test macro; Whether the mSATA interface that is used to test the hard disk that links to each other with a mSATA slot protocol compliant regulation; One group of signal transmission pin is set in the said mSATA slot; It is characterized in that: said test macro comprises that like each described mSATA interface test card and an oscillograph among the claim 1-2 said oscillograph links to each other with said signal testing pin to show the data of said mSATA slot output through said oscillograph.
4. test macro as claimed in claim 3; It is characterized in that: said test macro also comprises at least one web member; One end of said web member is fixed on this oscillograph, and the other end is connected to corresponding signal testing pin, to connect said oscillograph and mSATA interface test card.
5. test macro as claimed in claim 4 is characterized in that: this web member is a SMA type connector.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010105810986A CN102567167A (en) | 2010-12-09 | 2010-12-09 | Testing card and testing system for mSATA (serial advanced technology attachment) interface |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010105810986A CN102567167A (en) | 2010-12-09 | 2010-12-09 | Testing card and testing system for mSATA (serial advanced technology attachment) interface |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102567167A true CN102567167A (en) | 2012-07-11 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010105810986A Pending CN102567167A (en) | 2010-12-09 | 2010-12-09 | Testing card and testing system for mSATA (serial advanced technology attachment) interface |
Country Status (1)
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| CN (1) | CN102567167A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104050062A (en) * | 2013-03-11 | 2014-09-17 | 鸿富锦精密工业（深圳）有限公司 | Memory cell test system and lead pin external connecting unit applied to memory cell test system |
| CN106502812A (en) * | 2016-10-14 | 2017-03-15 | 郑州云海信息技术有限公司 | A kind of pcb board of fast monitored storage hard disk groove position failure and its method |
| CN109901002A (en) * | 2017-12-08 | 2019-06-18 | 英业达科技有限公司 | The pin connecting test system and method for connector |
| CN113268390A (en) * | 2021-06-10 | 2021-08-17 | 浪潮电子信息产业股份有限公司 | Testing jig, system and method for mSATA interface |
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| CN1712980A (en) * | 2004-06-22 | 2005-12-28 | 大唐移动通信设备有限公司 | Inserted card tester |
| CN101042667A (en) * | 2006-03-20 | 2007-09-26 | 佛山市顺德区顺达电脑厂有限公司 | Testing card |
| CN201392383Y (en) * | 2009-03-25 | 2010-01-27 | 英业达科技有限公司 | Test device |
| CN201413379Y (en) * | 2009-03-24 | 2010-02-24 | 纬创资通股份有限公司 | Test board |
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2010
- 2010-12-09 CN CN2010105810986A patent/CN102567167A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1712980A (en) * | 2004-06-22 | 2005-12-28 | 大唐移动通信设备有限公司 | Inserted card tester |
| CN101042667A (en) * | 2006-03-20 | 2007-09-26 | 佛山市顺德区顺达电脑厂有限公司 | Testing card |
| CN201413379Y (en) * | 2009-03-24 | 2010-02-24 | 纬创资通股份有限公司 | Test board |
| CN201392383Y (en) * | 2009-03-25 | 2010-01-27 | 英业达科技有限公司 | Test device |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104050062A (en) * | 2013-03-11 | 2014-09-17 | 鸿富锦精密工业（深圳）有限公司 | Memory cell test system and lead pin external connecting unit applied to memory cell test system |
| CN106502812A (en) * | 2016-10-14 | 2017-03-15 | 郑州云海信息技术有限公司 | A kind of pcb board of fast monitored storage hard disk groove position failure and its method |
| CN109901002A (en) * | 2017-12-08 | 2019-06-18 | 英业达科技有限公司 | The pin connecting test system and method for connector |
| CN113268390A (en) * | 2021-06-10 | 2021-08-17 | 浪潮电子信息产业股份有限公司 | Testing jig, system and method for mSATA interface |
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| C06 | Publication | ||
| PB01 | Publication | ||
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| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20120711 |