CN219658114U

CN219658114U - Testing arrangement suitable for multi-functional mainboard

Info

Publication number: CN219658114U
Application number: CN202320117942.2U
Authority: CN
Inventors: 管建鹏; 刘金胜
Original assignee: Qingdao Wintec System Co ltd
Current assignee: Qingdao Wintec System Co ltd
Priority date: 2023-01-16
Filing date: 2023-01-16
Publication date: 2023-09-08
Anticipated expiration: 2033-01-16

Abstract

The utility model discloses a testing device suitable for a multifunctional main board, which comprises: the serial port test unit and the USB port test unit control the LED indicator lamp to work according to the voltage signal output by the main board end during test, so as to correspondingly feed back the voltage signal test result of the main board end, and after the serial port test unit and/or the USB port test unit output test data to the main board end, the serial port test unit and/or the USB port test unit control the LED indicator lamp to work according to the reply data output by the main board end, so as to correspondingly feed back the data signal test result of the main board end.

Description

Testing arrangement suitable for multi-functional mainboard

Technical Field

The present utility model relates to the field of motherboard testing technologies, and in particular, to a testing apparatus for a multifunctional motherboard of an electronic product.

Background

Under the large environment of continuous development of modern science and technology, more and more electronic products gradually permeate into various fields of people's life, and the quality level and the functional performance of the electronic products can directly influence the use experience of people. The electronic product mainly comprises a plurality of structural components (plastic components, sheet metal components, standard components and the like) and electrical components (liquid crystal screens, touch screens, connecting wires, electronic components, printed circuit boards and the like), and the integral quality and functions of the electronic product can be affected when any position is in a problem, but a main board for controlling the corresponding functions is certainly the most important unit.

To ensure quality yield of the motherboard during the production process, the following inspection/detection methods are generally adopted for quality control:

after the Surface Mounting (SMT) of the Printed Circuit Board (PCB) is finished, detecting whether each electronic component is mounted on the printed circuit board by an automatic optical detection instrument (AOI) or not or whether a welding defect exists;

after the printed circuit board is finished with plug-in components (DIP) or manually welded, the electrical performance and the electrical connection of the components on the printed circuit board are tested by an automatic on-line tester (ICT) to check the open circuit and short circuit conditions of each component and each circuit;

by setting up an operation environment (tool or equipment), the real service condition (excitation and load) of the main board is simulated, and the main board is subjected to functional test (FCT).

But due to:

1. an automatic on-line tester (ICT) mainly detects open circuit and short circuit of a circuit and welding conditions of all parts by testing a test point reserved on a probe contact Printed Circuit Board (PCB), if fault positioning is accurate and test is stable, the test point has a great relation with circuit and Printed Circuit Board (PCB) design, and after the circuit design is isolated from the state of each component, the circuit design can not be influenced by each other and has higher requirements on designers;

2. an automatic on-line tester (ICT) is used for manufacturing special needle bed clamps (if the circuit board is changed in the design/verification process, the corresponding needle bed clamps are required to be adjusted together), so that the clamp manufacturing and program development period is long, and the quick response market demand is difficult to meet;

3. although the automatic on-line tester (ICT) and the needle bed clamp have accurate fault positioning (no need of more professional knowledge for fault maintenance), the operation is simple, the test is quick (the test time of a single board is generally from a few seconds to tens of seconds), but the manufacturing cost is high, and the automatic on-line tester is not suitable for small-batch, personalized and customized products;

4. the complete functional test (FCT) tool is generally built according to the actual use condition of the motherboard, and if the motherboard needs to be connected with more external devices when in actual use, the functional test tool is necessarily complicated to build, inconvenient to operate and high in cost.

Therefore, automatic on-line tester (ICT) and complete function test (FCT) tools are generally used in mass and scale production of circuit boards, which can greatly improve the production efficiency and reduce the production cost, but are difficult to adapt to the market demand with faster and faster changes and to compete strongly, so that development of a testing device for a multifunctional motherboard of an electronic product, which overcomes the defects, is needed.

Disclosure of Invention

The present utility model provides a testing device suitable for a multifunctional motherboard, aiming at the technical problems, wherein the testing device comprises: the serial port test unit and the USB port test unit control the LED indicator lamp to work according to the voltage signal output by the main board end during test, so as to correspondingly feed back the voltage signal test result of the main board end, and after the serial port test unit and/or the USB port test unit output test data to the main board end, the serial port test unit and/or the USB port test unit control the LED indicator lamp to work according to the reply data output by the main board end, so as to correspondingly feed back the data signal test result of the main board end.

The test device, wherein, the serial port test unit includes:

a first housing;

the test board serial port is arranged on the first shell and is correspondingly electrically connected with the serial port of the main board end;

the serial port test board is arranged in the first shell and is electrically connected to the main board end through a serial port of the test board, the serial port test board controls the LED indicator lamp to work according to a voltage signal output by the main board end, and the serial port test board controls the LED indicator lamp to work after outputting test data to the main board end and according to reply data output by the main board end.

The test device, wherein, the serial port test board includes:

each serial port test circuit is correspondingly electrically connected to a serial port of the main board end through a serial port of the test board, and the serial port test circuits send the test data and receive the reply data;

the DCDC voltage conversion circuit is electrically connected with the serial port test circuit;

the first microcontroller is electrically connected with the serial port test circuit and the DCDC voltage conversion circuit;

the first LED power supply indicator lamp is electrically connected to the DCDC voltage conversion circuit, and after the serial port testing circuit is electrically connected to the main board end, if the DCDC voltage conversion circuit receives a voltage signal output by the main board end and then supplies power to the first LED power supply indicator lamp so as to turn on the first LED power supply indicator lamp, the serial port power supply output representing the main board end is normal;

the first micro controller is electrically connected with the first micro controller, and the first micro controller controls the first LED test status indicator and the first LED test result indicator to be turned on or turned off according to the reply data so as to feed back a data signal test result of the serial port of the main board end.

In the above test device, if the first LED test status indicator lights flash and the first LED test result indicator lights go out, the test is performed; if the first LED test state indicator is normally on and the first LED test result indicator is off, the test failure is indicated; and if the first LED test state indicator is extinguished and the first LED test result indicator is normally on, the test is passed.

The above test device, wherein each serial port test circuit includes:

the serial port conversion chip can be selectively and electrically connected with the serial port conversion chip, and the serial port conversion chip is electrically connected with the first microcontroller;

the test board serial port can be selectively and electrically connected to the jump selection resistor, and the jump selection resistor is electrically connected to the first microcontroller;

when the input of the serial port of the test board is RS232 level, the serial port of the test board is connected with the serial port conversion chip, and an RS232 signal is converted into TTL level through the serial port conversion chip and is input to the first microcontroller; when the input of the test board serial port is TTL level, the test board serial port is connected with the jump resistor so as to directly input the TTL level to the first microcontroller through the jump resistor.

The above test device, wherein each serial port test circuit further includes:

and one end of the isolation device is electrically connected with the serial port of the test board, and the other end of the isolation device is electrically connected with the first microcontroller.

The above-mentioned testing arrangement, wherein, USB mouth test element includes:

the second housing is provided with a second opening,

the test board USB port is arranged on the second shell and is electrically connected with the USB port at the main board end;

the USB port test board is arranged in the second shell and is electrically connected to the USB port of the main board end through the USB port of the test board, the USB port test board controls the LED indicator lamp to work according to the voltage signal output by the main board end, and the USB port test board controls the LED indicator lamp to work according to the reply data output by the main board end after outputting test data to the main board end.

The above-mentioned testing arrangement, wherein, USB mouth test board includes:

the voltage stabilizer is electrically connected with the USB port of the test board;

the second microcontroller is electrically connected with the USB port of the test board and the voltage stabilizer;

the second LED power supply indicator lamp is electrically connected with the voltage stabilizer and the second microcontroller, and after the USB port of the test board is electrically connected with the main board end, if the second LED power supply indicator lamp is started, the USB port of the main board end is powered and output normally;

the second LED test state indicator lamp is electrically connected with the voltage stabilizer and the second microcontroller;

the second LED test result indicator lamp is electrically connected with the voltage stabilizer and the second microcontroller;

and the second microcontroller controls the second LED test state indicator lamp and the second LED test result indicator lamp to be turned on or turned off according to the reply data so as to feed back the data signal test result of the USB port of the main board end.

The test device, wherein if the second LED test status indicator lights flash and the second LED test result indicator lights go out, the test is in progress; if the second LED test state indicator is normally on and the second LED test result indicator is off, the test failure is indicated; and if the second LED test state indicator is extinguished and the second LED test result indicator is normally on, the test is passed.

The testing device, wherein the isolation device is a diode.

Compared with the prior art, the testing device based on the utility model has certain superiority compared with the traditional main board function test (automatic on-line test and function test), and particularly has the advantages and positive effects that:

1. when the printed circuit board is designed, the reservation of related test points required by automatic online test is eliminated, and the capability requirement of a designer is reduced (the requirement that the test points required by the automatic online test of the printed circuit board are isolated according to the states of all components and parts and are not affected by each other);

2. the automatic online tester with higher purchase price is not needed, so that the expenditure of the cost is reduced;

3. the special needle bed clamp and the development of a corresponding program required by automatic online test are not required to be manufactured, so that the cost is saved, the development and verification period of a product is greatly reduced, the market demand can be responded quickly, and the market customization and individuation demands are met;

4. the input of internal and external connection equipment required by the original function test is reduced, and the cost expenditure is reduced, for example, when a multifunctional main board is actually used, more external equipment needs to be connected, if all the external equipment is connected to perform the function test, the cost of purchasing the external equipment is higher, and the placement space is larger;

5. the testing device can be applied to various multifunctional mainboards, even can be applied to multifunctional mainboards of different platforms, such as an X86 platform and an android embedded platform, and has certain universality; if the original main board function testing device is used, when the main board circuit is changed, a special needle bed clamp and program development are required to be manufactured again to meet the requirement of automatic online testing; however, after the existing testing device is used, the basic function testing requirement of the main board can be met by only adjusting corresponding fixed connection equipment or manufacturing a new corresponding interface testing board according to the change of the types of the internal interface and the external interface.

Drawings

FIG. 1 is a schematic diagram of a test apparatus;

FIG. 2 is a schematic diagram showing connection between a motherboard and a testing device;

FIG. 3 is a schematic structural diagram of a serial port test board;

fig. 4 is a schematic structural diagram of a USB port test plate.

Detailed Description

The present utility model will be specifically described below by way of exemplary embodiments. It is to be understood that elements, structures, and features of one embodiment may be beneficially incorporated in other embodiments without further recitation.

In the description of the present utility model, it should be noted that the positional or positional relationship indicated by the terms such as "inner", "outer", "upper", "lower", "front", "rear", etc. are based on the positional relationship shown in the drawings, are merely for convenience of describing the present utility model and simplifying the description, and do not indicate or imply that the apparatus or element in question must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present utility model. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

The general computer multifunctional motherboard is described herein simply, and the general computer multifunctional motherboard is usually connected with a liquid crystal screen connected by EDP (Embedded Display Port, i.e. an embedded transmission interface) or LVDS (Low Voltage Differential Signaling, i.e. a low voltage differential signal) interface, a high performance pass-through bus (Inter Integrated Circuit, an abbreviation of Universal Serial Bus) or USB (Universal Serial Bus, an abbreviation of DB25/DB50/DB37/DB9, etc. required by a multi-host system, and a technical specification of an input/output interface) interface, and other modules/external devices are usually connected with a USB port or serial port (serial port is a generic name, i.e. a universal asynchronous transceiver), a serial communication port { D-SUB interface of D-SUB shape on COM [ some electronic devices, a serial communication protocol of TTL [ Transistor Transistor Logic ], a serial port of RS [ Transistor Transistor Logic ], a universal serial port of RS (universal asynchronous receiver/Transmitter), and a common protocol of RS (VGA) are all connected in a manner similar to the conventional manner. When testing the main board, the main board can be tested for basic functions by connecting the liquid crystal display, the touch screen and other fixed modules and connecting the internal and external USB ports or serial ports to an interface test board for testing the USB ports or the serial ports through corresponding connecting wires or adapter wires.

Referring to fig. 1-2, fig. 1 is a schematic structural diagram of a testing device; fig. 2 is a schematic connection diagram of a motherboard and a testing device. As shown in fig. 1-2, the testing device for a multifunctional motherboard of the present utility model is characterized by comprising: during testing, the serial port test unit 1 and the USB port test unit 2 control the LED indicator lamp to work according to the voltage signal output by the main board end 3 so as to correspondingly feed back the voltage signal test result of the main board end 3, and after the serial port test unit 1 and/or the USB port test unit 2 output test data to the main board end, the serial port test unit 1 and/or the USB port test unit 2 control the LED indicator lamp to work according to the reply data output by the main board end 3 so as to correspondingly feed back the data signal test result of the main board end.

In view of the above two defects or shortcomings of automatic on-line tester (ICT) and functional test (FCT), the present utility model performs an analog functional test on a motherboard, and it is known that the motherboard functions in an electronic product by controlling each corresponding module to implement each corresponding function, and the control of each module is implemented by connecting each corresponding internal and external interface with each module, namely: the main board outputs corresponding signals through the corresponding internal and external interfaces to complete the control of the modules. The testing device of the utility model is as follows: the traditional main board function test method (automatic online test and function test) is canceled, and the function test of a plurality of multifunctional main boards is realized by connecting each fixed module/external device with the main board and testing the output signals of each corresponding internal and external interface of the main board.

Referring to fig. 3, fig. 3 is a schematic structural diagram of a serial port test board. As shown in fig. 3, the serial port test unit 1 includes: the test board comprises a first shell S1, a test board serial port 11 and a serial port test board 12, wherein the test board serial port 11 is arranged on the first shell and is correspondingly electrically connected with a serial port 31 of the main board end 3; the serial port test board 12 is disposed in the first housing and is electrically connected to the main board end 3 through the serial port 11 of the test board, the serial port test board 12 controls the LED indicator to operate according to the voltage signal output by the main board end 3, and the serial port test board 12 controls the LED indicator to operate according to the reply data output by the main board end 3 after outputting test data to the main board end 3.

Wherein, the serial port test board 12 includes: a plurality of parallel serial port TEST circuits, a DCDC voltage conversion circuit 122, a first Microcontroller (MCU) 123, a first LED power supply indicator LED1, a plurality of first LED TEST status indicator led_com1/2/3, and a plurality of first LED TEST result indicator led_test1/2/3, wherein each serial port TEST circuit 122 is electrically connected to a serial port 31 of the motherboard end 3 through a serial port 11 of the TEST board, and the serial port TEST circuit 122 sends the TEST data and receives the reply data; the DCDC voltage conversion circuit 122 is electrically connected to the serial port test circuit; the first microcontroller 123 is electrically connected to the serial port test circuit and the DCDC voltage conversion circuit 122; the first LED power supply indicator LED1 is electrically connected to the DCDC voltage conversion circuit 122, and after the serial port test circuit is electrically connected to the motherboard end 3, if the DCDC voltage conversion circuit 122 receives the voltage signal output by the motherboard end and then supplies power to the first LED power supply indicator LED1, so as to turn on the first LED power supply indicator LED1, the serial port 31 representing the motherboard end 3 is powered and output normally; the plurality of first LED TEST status indicators led_comp1/2/3 and the plurality of first LED TEST result indicators led_test1/2/3 are electrically connected to the first microcontroller 123, and the first microcontroller 123 controls the on or off of one of the first LED TEST status indicators led_comp1/2/3 and one of the first LED TEST result indicators led_test1/2/3 according to the reply data so as to feed back the data signal TEST result of one of the serial ports 31 of the motherboard end 3; specifically, if the first LED TEST status indicator led_com1/2/3 blinks and the first LED TEST result indicator led_test1/2/3 is turned off, the TEST is in progress; if the first LED TEST status indicator lamp LED_COM1/2/3 is normally on and the first LED TEST result indicator lamp LED_TEST1/2/3 is off, the TEST is failed; and if the first LED TEST status indicator lamp LED_COM1/2/3 is turned off and the first LED TEST result indicator lamp LED_TEST1/2/3 is normally on, the TEST is passed.

Further, each serial port test circuit includes: the serial port conversion chip 1211, the skip resistor 1212 and the isolation device 1213, the test board serial port 11 may be selectively and electrically connected to the serial port conversion chip 1211 or the skip resistor 1212, and the serial port conversion chip 1211 and the skip resistor 1212 are electrically connected to the first microcontroller 123, wherein in this embodiment, the serial port conversion chip 1211 is preferably SP 3232; when the input of the serial port 11 of the test board is RS232 level, the serial port 11 of the test board is connected to the serial port conversion chip 1211, and the RS232 signal is converted into TTL level by the serial port conversion chip 1211 and is input to the first microcontroller 123; when the input of the test board serial port 11 is a TTL level, the test board serial port 11 is connected to the skip resistor 1212, so as to directly input the TTL level to the first microcontroller 123 through the skip resistor 1212; one end of the isolation device 1213 is electrically connected to the serial port 11 of the test board, and the other end is electrically connected to the first microcontroller 123.

In this embodiment, the isolation device 1213 is a diode, but the utility model is not limited thereto.

The working principle of the serial port test unit 1 is specifically described in a specific embodiment with reference to fig. 2 and 3, as shown in fig. 2 and 3, serial port test boards are connected with serial ports of a motherboard through cables, and a single serial port test board can be connected with at most 3 serial ports of the motherboard to perform testing (for example, the serial port test board is connected with one serial port of the motherboard, and can also perform testing on serial ports of the motherboard), and multiple serial ports of the motherboard can be tested in a parallel multipath manner; the serial port of the main board shown in the figure can provide power supply for the serial port test board besides outputting serial port signals, namely, the serial port signals and the power supply are output from corresponding serial ports of the main board together, after the power supply is input through serial port (1) (2) (3) interfaces of the serial port test board, three circuit supply voltages VCC1, VCC2 and VCC3 are respectively provided, the three circuit supply voltages can be any voltage between 5 and 12V and can be different, and the three circuit supply voltages are isolated by diodes (1) (2) (3) to prevent mutual influence; the DCDC shown in the figure is a voltage conversion circuit, the main chip model is MP1653, and is used for converting 5-12V voltage input by a serial port into 3.3V voltage and supplying power to a MCU, LED, SP3232 serial port conversion chip and other circuits on a serial port test board; the SP3232 and the jump resistors (1) (2) (3) are shown in the figure and are used for being compatible with TTL and RS232 (a serial communication interface standard) levels of a serial port, when the serial port input is the RS232 level, the corresponding jump resistor is not connected, and an RS232 signal is converted into the TTL level through an SP3232 circuit and is input to a corresponding pin of the MCU; when the serial port input is TTL level, the serial port input is directly connected with the skip resistor without an SP3232 circuit and is input to the corresponding pin of the MCU; the MCU shown in the figure is of the type AT32F413CBT7, can simultaneously support 3 paths of TTL level serial port signal input, and the internal firmware of the MCU sends test data to a serial port of a main board end in a serial port communication mode and judges reply data; the LED1 shown in the figure uses a light emitting diode as a power indicator lamp, and after the serial ports are connected, the indicator lamp is on to indicate that the serial port test board is normal in power supply and output, and the corresponding serial port of the main board is indicated to be normal in power supply and output; the LEDs (COM 1/2/3) and the LEDs (TEST1/2/3) are all light emitting diodes and are controlled by the GPIO of the MCU to indicate the test state and the test result; wherein led_com1 and led_test1 correspond to serial port (1), and so on;

when the serial ports are connected, after the initialization of the firmware in the MCU is completed, data are sent to the main board through the serial ports (1), (2) and (3) alternately, and the main board reply is judged, at the moment, the LED_COM flashes and the LED_TEST goes out, and the TEST is in progress; when the TEST time of a certain serial port exceeds the preset time and the return data of the main board end is not received or the return data of the main board end is wrong, the LED_COM corresponding to the serial port is normally on, the LED_TEST is off, the TEST is failed, and the fact that the serial port corresponding to the main board end has faults is indicated; if the serial port TEST board receives correct reply data of the main board end from a certain serial port within a preset time, the LED_COM corresponding to the serial port is extinguished, and the LED_TEST is always on, so that the corresponding serial port TEST is passed.

Referring to fig. 4, fig. 4 is a schematic structural diagram of a USB port test board. As shown in fig. 4, the USB port test unit 2 includes: the second shell S2, a test board USB port 21 and a USB port test board 22, wherein the test board USB port 21 is arranged on the second shell and is electrically connected with the USB port 32 of the main board end 3; the USB port test board 22 is disposed in the second housing and electrically connected to the USB port 32 of the main board end 3 through the USB port 21 of the test board, the USB port test board 22 controls the LED indicator lamp to operate according to the voltage signal output by the main board end 3, and the USB port test board 22 controls the LED indicator lamp to operate according to the reply data output by the main board end after outputting the test data to the main board end.

Wherein, the USB port test board 22 includes: the voltage stabilizer 221, a second Microcontroller (MCU) 222, a second LED power indicator LED21, a second LED test status indicator LED22, and a second LED test result indicator LED23, where the voltage stabilizer 221 is electrically connected to the test board USB port 21; the second microcontroller 222 is electrically connected to the test board USB port 21 and the voltage stabilizer 221; a second LED power supply indicator LED21 is electrically connected to the voltage stabilizer 221 and the second microcontroller 222, and when the test board USB port 21 is electrically connected to the motherboard end 3, if the second LED power supply indicator LED21 is turned on, it represents that the power supply output of the USB port 32 of the motherboard end 3 is normal; the second LED test status indicator LED22 and the second LED test result indicator LED23 are electrically connected to the voltage stabilizer 221 and the second microcontroller 222, and the second microcontroller 222 controls the second LED test status indicator LED22 and the second LED test result indicator LED23 to be turned on or off according to the reply data so as to feed back the data signal test result of the USB port 32 of the motherboard end 3, wherein if the second LED test status indicator LED22 blinks and the second LED test result indicator LED23 is turned off, the test is in progress; if the second LED test status indicator light LED22 is normally on and the second LED test result indicator light LED23 is off, the test is failed; if the second LED test status indicator LED22 is turned off and the second LED test result indicator LED23 is normally on, the test is passed.

In the present embodiment, the voltage regulator 221 is a low dropout linear regulator (LDO, low Dropout Regulator).

The working principle of the USB port test unit 2 is specifically described in an embodiment with reference to fig. 2 and 4, and as shown in fig. 2 and 4, the main board USB interface 32 is connected to the USB input interface of the USB port test board 22, i.e. the test board USB port 21, through a cable, and performs USB communication with the USB port test board 22, and provides 5V power for the USB port test board 22; the single USB port test board 22 can test1 main board USB interface, and can test a plurality of USB interfaces of the main board in a parallel multipath mode; the voltage stabilizer 221 is SPX3819, and is configured to convert the 5V power provided by the USB into 3.3V voltage, and provide power for the second microcontroller 222 (i.e. Micro-controller Unit, i.e. chip) and the LED21 (i.e. Light-emitting Diode) indicator lamp; the second microcontroller 222 is AT32F413CBT7, USB signals of the USB input interface are connected to corresponding pins of the USB of the MCU, and the MCU internal firmware can simulate the MCU into USB equipment and communicate with software of the main board end; the LED21 uses a light emitting diode as a power indicator lamp, and after the USB is connected, the indicator lamp is on to indicate that the USB port test board is normal in power supply and output, and the USB port of the main board is normal in power supply and output; the LED22 and the LED23 are controlled by GPIO (i.e. General Purpose Input/Output, general purpose input/Output port) of the second microcontroller 222 by using the LED as a test indicator, after the USB connection, after the initialization of the firmware in the second microcontroller 222 is completed, data is sent to the main board through USB communication, and the reply data of the main board end is judged, at the moment, the LED22 flashes, the LED23 is extinguished, and the test is in progress; when the test time exceeds the preset time and the main board end reply data is not received or the main board end reply data error is judged, the LEDs 22 are always on, the LEDs 23 are off, the test is failed, and the main board end corresponding USB interface is indicated to have a fault; if the USB port test board receives correct reply data of the main board end within the preset time, the LEDs 22 are turned off, and the LEDs 23 are always on, so that the corresponding USB port test of the main board is passed.

The test application of the X86 platform motherboard is described below with reference to fig. 1-4:

1. checking the types of the internal and external interfaces of the main board, judging which fixed modules/external devices are used, judging which internal and external interfaces are USB ports and which internal and external interfaces are serial ports so as to determine the number of required USB ports and serial port test boards, as shown in figure 1;

2. loading the memory bar and the solid state disk into corresponding positions of the main board, and sequentially inserting a power line, a liquid crystal screen connecting line, a touch screen connecting line, corresponding connecting lines of each fixed module/external equipment, connecting lines/switching lines of each serial port test board and connecting lines/switching lines of each USB port test board into corresponding sockets of the main board;

3. powering on the main board to start, confirming that the main board buzzer has sound, enabling the LED lamp to be on, and enabling the liquid crystal display to normally start up for display;

4. related test software (the test software is developed according to the type of the main board and the required functions) is operated, and the following information can be sequentially read and checked with the actual information:

BIOS (i.e., basic Input Output System, basic input output System) RTC (i.e., real Time Clock) Time;

operating system type, CPU (namely Central Processing Unit, central processing unit) name and BIOS version;

the memory size and the hard disk capacity;

fourth, ethernet address and speed;

fifthly, WIFI address and signal strength;

sixth, bluetooth address and Bluetooth search;

adjusting backlight of the liquid crystal display;

touch screen scribing test;

other functional tests, etc.;

5. when testing each USB port and serial port:

the USB port test board sends data to the main board, and judges the reply data of the main board end, and whether the corresponding USB interface of the main board is normal or not can be judged according to the condition of an indicator lamp of the USB port test board, and corresponding display is carried out in test software;

the serial port test board sends data to the main board, and judges the reply data of the main board end, so that whether the serial port corresponding to the main board is normal or not can be judged according to the state of the indicator lamp of the serial port test board, and corresponding display is carried out in the test software;

6. after the test is completed, the main board is shut down, each connecting wire/adapter wire is pulled out from each corresponding internal and external interface of the main board, and then the main board is taken down from the test platform and placed into the electrostatic box.

Referring to fig. 1 and fig. 2 again, it should be noted that in this embodiment, the serial port and the USB port of the motherboard end are tested, and if other functions of the motherboard end need to be tested, the testing apparatus may further include: the peripheral cashbox 41, keyboard/mouse 42, printer 43, host box 44, host display 45, liquid crystal panels 46, 47 and touch screen 48 are electrically connected to the motherboard 3.

In summary, the testing device of the utility model can rapidly and accurately test the motherboard and locate faults, and in the development testing process of a multifunctional motherboard with more connected internal and external modules/devices and less demand, the design of each corresponding internal and external interface of the motherboard is standardized and unified as much as possible, so that the interface testing board with fewer development types can be designed as much as possible to replace the corresponding module/device to test each internal and external interface of the motherboard.

The present utility model is not limited to the above-mentioned embodiments, and any equivalent embodiments which can be changed or modified by the technical content disclosed above can be applied to other fields, but any simple modification, equivalent changes and modification made to the above-mentioned embodiments according to the technical substance of the present utility model without departing from the technical content of the present utility model still belong to the protection scope of the technical solution of the present utility model.

Claims

1. A testing arrangement suitable for multi-functional mainboard, characterized in that includes: the serial port test unit and the USB port test unit control the LED indicator lamp to work according to the voltage signal output by the main board end during test, so as to correspondingly feed back the voltage signal test result of the main board end, and after the serial port test unit and/or the USB port test unit output test data to the main board end, the serial port test unit and/or the USB port test unit control the LED indicator lamp to work according to the reply data output by the main board end, so as to correspondingly feed back the data signal test result of the main board end.

2. The test apparatus of claim 1, wherein the serial port test unit comprises:

a first housing;

3. The test apparatus of claim 2, wherein the serial port test board comprises:

4. The test apparatus of claim 3, wherein if the first LED test status indicator lights flash and the first LED test result indicator lights go out, then indicating that a test is in progress; if the first LED test state indicator is normally on and the first LED test result indicator is off, the test failure is indicated; and if the first LED test state indicator is extinguished and the first LED test result indicator is normally on, the test is passed.

5. The test apparatus of claim 3, wherein each of the serial port test circuits comprises:

6. The test apparatus of claim 5, wherein each of the serial port test circuits further comprises:

7. The test apparatus of claim 1, wherein the USB port test unit comprises:

the second housing is provided with a second opening,

8. The test device of claim 7, wherein the USB port test plate comprises:

9. The test device of claim 8, wherein if the second LED test status indicator lights flash and the second LED test result indicator lights go out, then indicating that a test is in progress; if the second LED test state indicator is normally on and the second LED test result indicator is off, the test failure is indicated; and if the second LED test state indicator is extinguished and the second LED test result indicator is normally on, the test is passed.

10. The test apparatus of claim 6, wherein the isolation device is a diode.