KR101390019B1 - Test device examinating a circuit and drive method of the same - Google Patents

Abstract

The present invention relates to control and measurement techniques. According to an embodiment of the present invention, a test device for testing a circuit and a drive method thereof can inspect and check an abnormality of particularly through, short, and open test of circuit connection of the question given on a process test of the national technical qualifications examination, a lamp (pilot lamp) integrity test, and a rectifier circuit integrity test without mains power (220V) supply. Therefore, an examinee who applied for the national technical qualifications examination can check anytime even in the middle of a practical test depending on an abnormality of the test circuit for the examinee. [Reference numerals] (100) Clock generating unit; (110) AC voltage boosting unit; (120) Operation status check unit; (130) Voltage adjusting unit; (140) Testing circuit metering unit; (150) Wiring status check unit; (AA) Lamp integrity test; (BB) Rectifier circuit integrity test; (CC) Continuity test; (DD) Short-circuit test; (EE) Development test

Description

Test device examinating a circuit and drive method of the same}

The present invention relates to a control measurement technology, in particular, the presence or absence of abnormality in the conduction, short-circuit and open test, lamp (pilot lamp) integrity test, rectifier circuit integrity test of the circuit connection in question given in the working test of the national technical qualification test. The present invention relates to a test apparatus for circuit inspection and a method of driving the same that are sufficiently inspected and checked without supply of commercial power 220V.

In recent years, due to the rapid development of electronic and semiconductor technology, electronic components such as resistors, capacitors, coils, diodes, transistors, and IC circuits have become miniaturized and integrated, and thus, on a single board called a motherboard or main board. Each electronic component that can operate electronics is connected by bus structure and embedded in the electronics.

As the technology of electronic components and board manufacturing develops, the corresponding electronic products are also becoming smaller and more integrated.In accordance with the trend of miniaturization and integration of electronic products, the parts structure on the main board is becoming more and more complicated. If there is a problem, there is a lot of trouble in the workplace because it is impossible to detect where the failure occurred in the general measuring equipment or tester.

In order to detect such errors on the board, we supply a foreign board ATE or BTS Combinational Board Test System or a domestic In_Circuit Tester or MDA board test system to check and repair the board where the error occurred. However, the existing board test system developed by domestic and foreign companies has the following problems.

First, the main controller is configured to be mounted outside of the testhead, so that the testhead and the system card are divided into their own separate processes, and communication is performed using a LAN or another communication protocol, which makes the mutual interface complicated. In addition, the performance of the system decreases, and a separate control device is required for the test head, thereby increasing the price of the system, making the program complicated, and integrating a user interface and a special instrument, making it difficult to operate. .

Second, because the fixture size of the existing board test system is too thick and large, it is not easy to manage and store, and this increases the manufacturing cost of the fixture, and also uses the wrapping wire method that the fixture is dependent on manual labor. Due to the possibility of mistakes due to the error, the fixation of the fixture frequently occurs when debugging the program, and the timely loss is large because the fixture has to be disassembled basically, and the relay matrix of the Mux (Multiplex) method is increased. In the case of using the structure, it is inconvenient to fix the fixture even if only a part of the program is modified, and there is a problem that the stability of the functional test is reduced due to the occurrence of signal noise due to the wrapping wire method.

Third, existing measurement cards, that is, HPIO (Hybrid Pattern Input / Output) Master Card, DMM (Digital Multimeter) Card, AWG (Arbitrary Waveform Generator) Card, Scope Card, DIO (Digital Input / Output) Card, User Measurement cards such as interface cards are separately fastened to the PC back plane by a slot method, so that each card has a separate process, and the mutual interface becomes complicated, and the overall speed of the system is reduced.

Fourth, the existing domestic in-circuit test system does not use the CAD file, and most of the work is done by manual work, which requires a lot of work time, and the operator's mistakes are concerned. Graphical User Interface Because the configuration of the method is difficult, it does not consider the user's convenience due to the use of the text editor method, which causes a lot of inconvenience.

Fifth, due to the short-term delivery period of products, it is difficult to respond with imported products as equipment review / delivery period, program and fixture preparation period are getting shorter.

Subsequently, circuit testers have been used to measure voltage, current, and power consumption in electric power stations such as homes and factories.

This circuit tester is an electrical instrument with a unit that can measure resistance, voltage and current. It is assembled in one body. It is used to check the resistance (OHMS) and DC voltage (DC V) of storage batteries or batteries, light bulbs, receptacles, and diodes. ), AC voltage (AC V) and DC current (DC mA).

In the conventional circuit tester, there is a problem in that the candidate cannot input the commercial power, and thus, the application of the commercial power (110 to 220 V) is prohibited, and there is a problem in that the final judgment of the integrity of the circuit connection is made only by the examiner.

Korean Patent Publication Number: 10-2002-0060893 Korean Patent Publication Number: 10-2005-0017162 Korean Patent Publication Number: 10-2004-0013283 Korean Patent Publication Number: 10-2011-0036192

The test device and the driving method for the circuit inspection of the present invention was devised to solve the problems of the prior art, the first object of the present invention is a national technical qualification test (electric functional reality machine, electrical functional machine, elevator functional reality machine In case of work type test of elevator, industrial machine and air-conditioning refrigeration machine, etc., conduction, short-circuit and open test, lamp (pilot lamp) integrity test, rectifier circuit integrity test, etc. 220V) to inspect and check without supply.

In addition, the second object of the present invention is ① conduction, short circuit and open test of the circuit connection, ② lamp (pilot lamp) integrity test, ③ rectification for the tester testing circuit worked through the practical test conducted in the national technical qualification test This is to enable circuit testing under the same environment as that of commercial power (110 to 220V) even if the abnormality of the circuit integrity test is checked.

In addition, the third object of the present invention can directly check the tester testing circuit connected by the tester who took the national technical qualification test using the test device for circuit inspection, so that the wrong wiring state can be checked even during the practical test. It is to be able to correct or revise properly so that reasonable rules can be provided to each investigator equally, and through this, good talents who can contribute to fair test system development and industrial development are provided.

The present invention for achieving the above object includes the following configuration.

That is, in the circuit inspection test apparatus according to the embodiment of the present invention, after generating a plurality of clock square waves, switching the plurality of clock square waves to the first and second switching transistors so that the externally connected first and second switching transistors are not turned on at the same time. A clock generator for alternately applying the transistors; The first and second switching transistors are configured to induce electromotive force to a link voltage applied to a transformer according to switching control of the plurality of clock square waves input to the first and second switching transistors, and then the link voltage to the electromotive force. An AC voltage boosting unit for boosting the voltage to generate an AC voltage; An operating state checking unit which checks a lighting state of the first light emitting display device that is instrumented with an external voltage applied from the outside when the first switch is turned on, and determines whether the operating state is normal when the first light emitting display device is turned on; A voltage adjusting unit configured to receive the external voltage and level down to a predetermined reference value to generate a constant voltage having a low low voltage level; A test circuit meter for conducting a conduction test, a short circuit test, and an open test for the tester test circuit by probing the first and second probe means receiving the constant voltage to any selected end of a plurality of contacts wired to the tester testing circuit. part; And when the tester testing circuit is in a conducting state, the buzzer is turned on to inform the outside that the tester testing circuit is in a good connection state, and when the tester testing circuit is in a short state, the second light emitting display device is turned on so that the tester testing circuit is in poor connection state. And a wiring state checking unit which notifies the outside that the tester testing circuit is in a different wiring state by turning on the second light emitting display device when the tester testing circuit is in an open state. A second switch is turned on to probe the tester testing circuit with the alternating voltage applied to the first and second metering means instead of the constant voltage, and the lamp integrity test is performed according to light emission of a plurality of lamps pre-connected to the tester testing circuit. Determine whether there is an operation state related to the third light emitting display element An on-off operation according to characterized in that it is determined whether or not assembled in place on the at least one rectifier circuit integrity test of testing the circuit tester.

In addition, the driving method of the circuit inspection test apparatus according to an embodiment of the present invention, after the clock generator generates a plurality of clock square waves, the plurality of clock square waves so that the externally connected first and second switching transistors are not turned on at the same time. Alternately applying to the first and second switching transistors; As the AC voltage boosting unit switches and controls the plurality of clock square waves input to the first and second switching transistors, the electromotive force is induced by the link voltage applied to the transformer, and the AC voltage is boosted to increase the link voltage. Generating; Checking a lighting state of a first light emitting display device that is operated by an external voltage applied from the outside when the first switch is turned on, and determining that the operating state is normal when the first light emitting display device is turned on; A voltage adjusting unit applying the external voltage to level down to a predetermined reference value to generate a constant voltage having a low low voltage level; The testing circuit reading unit probes the first and second reading means applied with the constant voltage to any selected end of a plurality of contacts wired to the tester testing circuit to conduct the conduction test, the short circuit test and the open test for the tester testing circuit. Making; In the conduction test, a connection state checking unit turns on a buzzer to inform the outside that the tester testing circuit is in a good connection state; In the short circuit test, the connection state checking unit turns on the second light emitting display device to notify the outside that the tester testing circuit is in a poor connection state; And in the open test, the connection state checking unit turns on the second light emitting display device to notify the outside that the tester testing circuit is in another connection state failure, and wherein the testing circuit reading unit is configured to operate the second switch equipped with the instrument. Turn on to probe the tester testing circuit with the alternating voltage applied to the first and second metering means instead of the constant voltage, and have an operating state for lamp integrity test according to light emission of a plurality of lamps pre-connected to the tester testing circuit And determining whether there is an assembled state regarding at least one rectifier circuit integrity test disposed in the tester testing circuit according to the on-off operation of the third light emitting display device.

The test device for circuit inspection and the driving method thereof according to the present invention provide a circuit of the problem given in the work type test of the national technical qualification test (electric functional reality machine, electric functional machine, elevator functional machine, elevator industrial machine machine and air conditioning refrigeration function machine, etc.). It has a first effect of sufficiently inspecting and checking the connection, short circuit and open test, lamp (pilot lamp) integrity test and rectifier circuit integrity test without any supply of commercial power (220V).

In addition, the present invention is for the tester testing circuit working through the practical test carried out in the national technical qualification test ① in the conduction, short circuit and open test of circuit connection ② lamp (pilot lamp) integrity test, ③ rectifier circuit integrity test Even if the related abnormalities are examined, the second effect is to enable circuit testing under the same environment as the commercial power (110 to 220V) is applied.

In addition, the present invention can directly check whether there is an abnormality in the tester testing circuit connected by the tester who took the national technical qualification test using this test device for circuit inspection, and correct or correct incorrect wiring state even during the practical test. By providing reasonable rules to each investigator fairly, this has the third effect of selecting excellent talents who can contribute to fair test system development and industrial development.

1 is a perspective view showing a circuit test apparatus according to an embodiment of the present invention.
2 is a block diagram illustrating a test apparatus for testing a circuit according to an exemplary embodiment of the present invention.
3 is a detailed view illustrating a circuit test test apparatus according to an exemplary embodiment of the present invention.
4 is a diagram illustrating a tester testing circuit using a test device for inspecting a circuit according to an embodiment of the present invention.
5 is a flowchart illustrating a method of driving a circuit inspection test apparatus according to an exemplary embodiment of the present invention.

[Example]

Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

1 is a diagram illustrating a test device for circuit inspection according to an embodiment of the present invention.

Referring to Figure 1, the test device for circuit inspection 1000 is applied to the conduction, short-circuit and open test, lamp (pilot lamp) integrity test, rectifier circuit integrity test of the circuit connection in question given in the working test of the national technical qualification test. A device that sufficiently inspects and checks whether there is an abnormality without supplying commercial power (220V), and includes a clock generator 100, an AC voltage booster 110, an operation state checker 120, a voltage adjuster 130, and a testing circuit. And a meter reading unit 140 and a connection state checking unit 150.

First, as shown in FIGS. 2 and 3, the clock generator 100 generates a plurality of clock square waves using a TL494C chip, and then externally connected first and second switching transistors 111 and 112 are simultaneously turned on. A plurality of clock square waves are alternately applied to the first and second switching transistors 111 and 112 so as not to change.

In general, the clock generator 100 functions as an internal clock of a computer.

The clock generator 100 generates the time signature required for the computer to operate. The clock generator 100 adjusts the time necessary for the various parts of the computer to work. The clock generator 100 performs a similar task with the quartz clock (QUARTS) to precisely adjust the timing. The crystal oscillator (QUARTS CYSTAL) is used. The crystal's ultra-fast oscillation outputs an electrical clock signal at the interval required by the computer. That is, it receives 14.318MHZ signal of crystal and generates electric clock signal to operate CPU and its surrounding circuit.

The clock generation unit 100 can be found in the vicinity of the CPU or the power supply unit where the base clock is first created and distributed as the basis of the clock on the CPU and PCI-E chips.

The AC voltage boosting unit 110 includes first and second switching transistors 111 and 112, and controls the plurality of clock square waves inputted to the first and second switching transistors 111 and 112 to control the transformer 113. After the electromotive force is induced by the link voltage applied to the voltage, the link voltage is boosted by the electromotive force to generate an AC voltage.

The first and second switching transistors 111 and 112 configured in the AC voltage boosting unit 110 convert the link voltage applied to the center tap of the transformer 113 by switching conversion by a plurality of clock square waves. Induce electromotive force by alternately conducting two taps.

The AC voltage booster 110 boosts the link voltage on the secondary side of the transformer 1130 to generate an AC voltage of 110 to 330V.

When the first switch 124 pre-installed on the power supply unit 160 is turned on, the operation state checking unit 130 checks the lighting state of the first light emitting display device 121 provided with an external voltage applied from the outside, When the first light emitting display device 121 is turned on, the operation state is determined to be normal.

The voltage adjusting unit 130 receives an external voltage to level down to a predetermined reference value to generate a constant low voltage level.

The voltage adjustor 130 generates a constant voltage stabilized to 1 to 9V by leveling down the external voltage using the MC34063A chip.

As shown in FIG. 4, the testing circuit reading unit 140 probes the first and second reading means 141 and 142 to which the constant voltage is applied to any selected end of a plurality of contacts wired to the tester testing circuit 200. Conductivity test, short circuit test and open test for the tester testing circuit 200 are carried out.

The testing circuit reading unit 140 turns on the instrumented second switch 143 to probe the tester testing circuit 200 with an alternating voltage applied to the first and second reading means 141 and 142 instead of the constant voltage. It is determined whether there is an operation state for the lamp integrity test according to whether the plurality of lamps are already connected to the testing circuit 200, and the tester testing circuit 200 is performed according to the on-off operation of the third light emitting display device 144 that is already installed. Determine the assembly status for at least one rectifier circuit integrity test placed within

The testing circuit meter 140 is a detailed apparatus including a first meter reading means 141 made of a crocodile clip or clip type and a second meter reading means 142 made of a rod or rod. The conducting, shorting and open states of the tester testing circuit 200 are detected and inspected one by one by contacting each selected end of the plurality of contacts wired to the tester testing circuit 200 using the means 141 and 142.

In addition, when the plurality of lamps previously connected to the tester testing circuit 200 emit light, the testing circuit reading unit 140 determines that the operation state related to the lamp integrity test is normal, and the third light emitting display device 144 is on. Recognize that the rectifier circuit has a forward voltage, and determine that the assembly state of the rectifier circuit is good.

If the tester testing circuit 200 is in a conducting state, the connection state checking unit 150 turns on the buzzer 151 to inform the outside that the tester testing circuit 200 is in a good connection state, and if the tester testing circuit 200 is in a short state. The second light emitting display device 152 is turned on to inform the outside that the tester testing circuit 200 has a poor connection state, and when the tester testing circuit 200 is open, the second light emitting display device 152 is turned on to test the tester. The circuit 200 notifies the outside that the other wiring state is bad.

5 is a flowchart illustrating a method of driving a circuit inspection test apparatus according to an exemplary embodiment of the present invention.

Referring to Fig. 5, the driving method of the test device for circuit inspection includes conduction, short-circuit and open test, lamp (pilot lamp) integrity test, rectifier circuit integrity test of the circuit connection in question given in the working test of the national technical qualification test. It is a driving method of a device that inspects and checks whether there is an abnormality even without supply of commercial power (220V).

First, after generating a plurality of clock square waves, the clock generator alternately applies a plurality of clock square waves to the first and second switching transistors so that the externally connected first and second switching transistors are not turned on at the same time (S100).

The AC voltage boosting unit induces electromotive force with the link voltage applied to the transformer according to switching control of the plurality of clock square waves input to the first and second switching transistors, and then boosts the link voltage with electromotive force to generate an AC voltage (S110). .

The first and second switching transistors of the AC voltage boosting unit alternately conduct the link voltage applied to the center tap of the transformer by switching conversion by a plurality of clock square waves to induce electromotive force by alternately conducting the link voltage applied to the first and second taps of the transformer. The booster boosts the link voltage on the secondary side of the transformer to generate an alternating voltage of 110 to 330V.

When the first switch is turned on, the operation state checking unit checks the lighting state of the first light emitting display device that is provided with the external voltage applied from the outside, and determines that the operating state is normal when the first light emitting display device is turned on (S120).

The voltage adjusting unit receives the external voltage to level down the predetermined reference value to generate a constant voltage having a low low voltage level (S130).

In other words, the voltage regulator lowers the external voltage to generate a constant voltage stabilized to 1 to 9V.

The testing circuit reading unit performs a conduction test, a short circuit test, and an open test for the tester testing circuit by probing the first and second reading means which are subjected to the constant voltage to either end selected from a plurality of contacts wired to the tester testing circuit. S140).

The testing circuit reading unit turns on the instrument-equipped second switch to probe the tester testing circuit with an alternating voltage applied to the first and second reading means instead of the constant voltage (S150), and the light is emitted from a plurality of lamps pre-connected to the tester testing circuit. In accordance with the operation state of the lamp integrity test in accordance with (S160), according to the on-off operation of the pre-installed third light emitting display device to determine whether the assembly state for the at least one rectifier circuit integrity test disposed in the tester testing circuit. (S170).

During the conduction test, the connection state checking unit turns on the buzzer to inform the outside that the tester testing circuit is in a good connection state, and during the short circuit test, turns on the second light emitting display device to inform the outside that the tester testing circuit is in poor connection state (S180, S190).

In addition, during the open test, the connection state confirming unit turns on the second light emitting display device to notify the outside that the tester testing circuit is another connection state failure (S200).

The driving method of the circuit inspection test apparatus according to the embodiment of the present invention is easy to perform the additional operation as described below.

The testing circuit inspection unit of the test device for circuit inspection detects the conduction state, short circuit state, and open state of the tester testing circuit one by one by contacting each selected end of a plurality of contacts wired to the tester testing circuit using the first and second metering means. And inspect.

When a plurality of lamps emit light, the testing circuit reading unit determines the operation state of the lamp integrity test as normal, and recognizes that the rectifier circuit is subjected to forward voltage when the third light emitting display device is on, so that the assembly state of the rectifying circuit is improved. Determine.

It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the present invention as defined by the following claims. It can be understood that it is possible.

1000: test device for circuit inspection
100: clock generator 110: AC voltage booster
120: operation state check unit 130: voltage adjustment unit
140: testing circuit meter 150: connection status check unit

Claims (10)

A clock generator which generates a plurality of clock square waves and alternately applies the plurality of clock square waves to the first and second switching transistors so that the externally connected first and second switching transistors are not turned on at the same time;
The first and second switching transistors are configured to induce electromotive force to a link voltage applied to a transformer according to switching control of the plurality of clock square waves input to the first and second switching transistors, and then the link voltage to the electromotive force. An AC voltage boosting unit for boosting the voltage to generate an AC voltage;
An operating state checking unit which checks a lighting state of the first light emitting display device that is instrumented with an external voltage applied from the outside when the first switch is turned on, and determines whether the operating state is normal when the first light emitting display device is turned on;
A voltage adjusting unit configured to receive the external voltage and level down to a predetermined reference value to generate a constant voltage having a low low voltage level;
A test circuit meter for conducting a conduction test, a short circuit test, and an open test for the tester test circuit by probing the first and second probe means receiving the constant voltage to any selected end of a plurality of contacts wired to the tester testing circuit. part; And
If the tester testing circuit is in a conductive state, the buzzer is turned on to inform the outside that the tester testing circuit is in a good connection state. If the tester testing circuit is in a short state, the second light emitting display device is turned on so that the tester testing circuit is in a bad connection state. And a connection state checking unit for notifying the outside that the tester testing circuit is in another connection state by turning on the second light emitting display device when the tester testing circuit is in an open state.
Turn on the instrumented second switch to probe the tester testing circuit with the alternating voltage applied to the first and second metering means, instead of the constant voltage, and according to the light emission of the plurality of lamps pre-connected to the tester testing circuit. Determining whether there is an operating state for the integrity test, and determining whether there is an assembled state for at least one rectifier circuit integrity test disposed in the tester testing circuit according to an on-off operation of the third light emitting display device. Test device for circuit inspection.
The method of claim 1, wherein the first and second switching transistors,
And the link voltage applied to the center tap of the transformer is alternately connected to the first and second taps of the transformer by switching conversion by the plurality of clock square waves to induce the electromotive force.
The method of claim 1, wherein the AC voltage boosting unit,
And boosting the link voltage at the secondary side of the transformer to generate the alternating voltage of 110 to 330 volts.
The method of claim 1, wherein the voltage adjusting unit,
And leveling down the external voltage to produce the constant voltage stabilized to 1 to 9 volts.
The method of claim 1, wherein the testing circuit reading unit,
First meter reading means made of a crocodile clip type or tongs type;
A second metering means made of rod or rod,
Detects and inspects the conduction state, short circuit state and open state of the tester testing circuit one by one by contacting each selected end of a plurality of contacts wired to the tester testing circuit using the first and second metering means.
When the plurality of lamps emit light, the operation state of the lamp integrity test is determined to be normal, and when the third light emitting display device is on, it is recognized that a forward voltage is applied to the rectifier circuit. The test apparatus for circuit test characterized by the above-mentioned.
a) after the clock generator generates a plurality of clock square waves, alternately applying the plurality of clock square waves to the first and second switching transistors such that the externally connected first and second switching transistors are not turned on at the same time;
b) The AC voltage boosting unit induces electromotive force with a link voltage applied to a transformer as the switching control of the plurality of clock square waves input on the first and second switching transistors, and then boosts the link voltage with the electromotive force to alternating current. Generating a voltage;
c) when the first switch is turned on, checking an operating state of the first light emitting display device that is provided with the external voltage applied from the outside by the operating state checking unit, and determining that the operating state is normal when the first light emitting display device is lit;
d) a voltage adjusting unit is applied to the external voltage to level down to a predetermined reference value to generate a constant low voltage level;
e) The testing circuit reading unit probes the first and second reading means receiving the constant voltage to any selected end of a plurality of contacts wired to the tester testing circuit, and conduction test, short circuit test and open test for the tester testing circuit. Performing;
f) during the conduction test, connecting a connection state checking unit to turn on a buzzer to inform the outside that the tester testing circuit is in a good connection state;
g) during the short-circuit test, the connection state checking unit turns on the second light emitting display device to notify the outside that the tester testing circuit is in a poor connection state; And
h) during the open test, the connection state checking unit turns on the second light emitting display device to notify the outside that the tester testing circuit is another connection state failure,
i) The testing circuit reading unit,
Turn on the instrumented second switch to probe the tester testing circuit with the alternating voltage applied to the first and second metering means, instead of the constant voltage, and according to the light emission of the plurality of lamps pre-connected to the tester testing circuit. Determining whether there is an operating state for the integrity test, and determining whether there is an assembled state for at least one rectifier circuit integrity test disposed in the tester testing circuit according to an on-off operation of the third light emitting display device. A method of driving a test device for circuit inspection.
The method of claim 6, wherein in step b), the first and second switching transistors,
And inducing the electromotive force by alternately conducting the link voltage applied to the center tap of the transformer by switching conversion by the plurality of clock square waves to the first and second taps of the transformer. Method of driving a test device for inspection.
The method of claim 6, wherein in step b), the AC voltage boosting unit,
And boosting the link voltage at the secondary side of the transformer to generate the alternating voltage of 110 to 330V.
The method of claim 6, wherein in step d), the voltage adjusting unit,
And generating the constant voltage stabilized to 1 to 9V by leveling down the external voltage.
The method of claim 6, wherein the testing circuit reading unit,
In step e), the conduction state, short circuit state and open state of the tester testing circuit are detected and inspected one by one by contacting both ends selected from a plurality of contacts wired to the tester testing circuit using the first and second metering means. Making; And
In step i), when the plurality of lamps emit light, the operation state of the lamp integrity test is determined to be normal, and when the third light emitting display device is on, the rectifier circuit recognizes that a forward voltage is applied to the rectifier circuit. And determining the assembled state of the circuit as good.

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