CN220671580U

CN220671580U - Test platform, jig and system for server board card

Info

Publication number: CN220671580U
Application number: CN202322170297.3U
Authority: CN
Inventors: 高晓阳; 何刚
Original assignee: Guangdong Dongqin Technology Co ltd
Current assignee: Guangdong Dongqin Technology Co ltd
Priority date: 2023-08-11
Filing date: 2023-08-11
Publication date: 2024-03-26
Anticipated expiration: 2033-08-11

Abstract

The application provides a server board card test platform, a jig and a system, which can be used in the technical field of printed circuit board test. The platform comprises: BSI host, pilot lamp test circuit, IIC test circuit, GPIO test circuit and multiple first interfaces; the BSI host is respectively in communication connection with the indicator lamp test circuit, the I2C test circuit and the GPIO test circuit; the BSI host, the indicator lamp test circuit, the I2C test circuit and the GPIO test circuit are respectively in communication connection with a second interface corresponding to the jig through a corresponding first interface, and a target board card is arranged on the jig; the indicator lamp test circuit is used for testing the indicator lamp in the target board card; the BSI host is used for testing whether the interface of the target board card can normally detect signals; the IIC test circuit is used for testing the components connected with the bus in the target board card; the GPIO test circuit is used for testing whether the interface of the target board card can normally transmit data.

Description

Test platform, jig and system for server board card

Technical Field

The application relates to the technical field of printed circuit board testing, in particular to a server board card testing platform, a jig and a system.

Background

With the continuous development of the printed circuit board manufacturing industry, the printed circuit board testing technology is widely applied to performance tests of various printed circuit board products.

As a popular printed circuit board product, a system environment test technology is generally adopted to test the server board, and a tester can test the server board in a system environment by constructing a system environment for testing and deploying the server board to be tested in the system environment.

However, when testing the server board card in the system environment, each interface to be tested of the server board card needs to be manually connected with each test interface in the system environment, and then the system environment is started for testing, so that the connection is complex, the test time is consumed, the test efficiency is lower, and when the server board card fails, only the failure of the server board card can be known, and the failed component or function cannot be obtained.

Disclosure of Invention

The application provides a server board card test platform, tool and system for it is complicated to test the part connection among the prior art, consumes test time, and then leads to the efficiency of software testing lower, and when breaking down, only can learn that the server board card breaks down, and can't obtain the technical problem of the part or the function of breaking down.

In a first aspect, the present application provides a server board card test platform, including: the system comprises a serial interface BSI host, an indicator lamp test circuit, an integrated circuit bus IIC test circuit, a general purpose input/output GPIO test circuit and a plurality of first interfaces;

the BSI host is respectively in communication connection with the indicator lamp test circuit, the IIC test circuit and the GPIO test circuit;

the BSI host, the indicator lamp test circuit, the IIC test circuit and the GPIO test circuit are respectively in communication connection with a second interface corresponding to a jig through a corresponding first interface, and a target board card is arranged on the jig;

the indicator lamp test circuit is used for testing the indicator lamp in the target board card;

the BSI host is used for testing whether the interface of the target board card can normally detect signals;

the IIC test circuit is used for testing the components connected with the bus in the target board card;

and the GPIO test circuit is used for testing whether the interface of the target board card can normally transmit data.

In one possible design, the server board card test platform further includes a USB hub; the BSI host is in communication connection with the USB hub through a USB data line; the USB hub is respectively connected with the IIC test circuit and the GPIO test circuit in a communication mode.

In one possible design, the platform further comprises: a power module; the power module is in communication connection with the BSI host through the USB hub and the USB data line; the power module is in communication connection with a second interface corresponding to the jig through a corresponding first interface; the power supply module is used for supplying power to the jig; the BSI host is used for testing whether the interface of the target board card can normally detect signals after the power module supplies power to the jig.

In one possible design, the platform further comprises: an input/output device; the input and output device is in communication connection with the BSI host through a network cable; the input and output device is in communication connection with a second interface corresponding to the jig through a corresponding first interface; the input-output device is used for receiving a test instruction triggered by a user and sending the test instruction to the BSI host, so that the BSI host sends a test control instruction to a corresponding test circuit based on a test identifier in the test instruction, and the test control instruction is used for controlling the test circuit to perform corresponding test on the target board card; the input and output device is also used for receiving and displaying the test result sent by at least one test circuit.

In one possible design, the indicator light test circuit is located in an indicator light test box, the IIC test circuit is disposed in an IIC test card, and the GPIO test circuit is disposed in a GPIO test card.

In a second aspect, the present application provides a server board card test fixture, including: the board card fixing device and the plurality of second interfaces are in communication connection with the corresponding first interfaces, and the first interfaces are interfaces respectively corresponding to the BSI host and the plurality of test circuits in the server board card test platform;

the target board card is detachably arranged on the board card fixing device and is in communication connection with the server board card testing platform through the plurality of second interfaces.

In one possible design, the jig further comprises: JTAG flat cable; the target board card is connected with the BSI host in a communication way through the JTAG flat cable and a second interface connected with a first interface corresponding to the BSI host in sequence.

In one possible design, the jig further comprises: a test tool; the test tool is connected with the internal interface of the target board card; the testing tool is used for conducting the power module in the server board card testing platform with the target board card after supplying power to the jig, so that the power module supplies power to the target board card, and assisting the BSI host in the server board card testing platform to test whether the interface of the target board card can normally detect signals.

In one possible design, the test tool is: a Dummy card; the Dummy card is adapted to the target board card; the Dummy card includes: a plurality of golden fingers; the target board card includes: an electronic connector; the electronic connector is correspondingly connected with the internal interface of the target board card; the Dummy card is correspondingly connected with the electronic connector through the plurality of golden fingers; the Dummy card is used for assisting the BSI host to test signals included in the electronic connector so as to test whether the interface of the target board card can normally detect signals.

In a third aspect, the present application provides a server board test system, including a server board test platform according to the first aspect and a server board test fixture according to the second aspect;

the server board card test platform comprises a plurality of first interfaces, and the server board card test fixture comprises a plurality of second interfaces; the server board card testing platform realizes communication connection with the server board card testing jig through the plurality of first interfaces and the corresponding second interfaces.

The application provides a server board card test platform, a jig and a system, wherein a BSI host, an indicator lamp test circuit, an IIC test circuit, a GPIO test circuit and a plurality of first interfaces are arranged in the server board card test platform in advance, and a board card fixing device and a plurality of second interfaces are arranged in the server board card test jig in advance. When in testing, the server board card can be tested according to the test requirement by fixing the server board card on the board card fixing device and connecting a first interface corresponding to each component in the server board card test platform with a second interface corresponding to the server board card test fixture. And through changing the server integrated circuit board who fixes on integrated circuit board fixing device, just can realize testing a plurality of server integrated circuit boards to shorten the time of changing the server integrated circuit board, simplified the connected mode, and then improved test efficiency. And when testing, each testing circuit or BSI host in the platform is connected with one second interface in the jig through one corresponding first interface, so that each part or function of the server board card can be independently tested, and when testing that the service board card fails, the parts or functions of the server board card failed can be obtained by identifying the first interface and the second interface corresponding to the failure in the server board card testing platform.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the application and together with the description, serve to explain the principles of the application.

Fig. 1 is a schematic structural diagram of a test platform for a server board card according to an embodiment of the present application;

fig. 2 is a schematic structural diagram of a test platform for a server board card according to another embodiment of the present application;

FIG. 3 is a schematic structural diagram of a test fixture for a server board card according to an embodiment of the present disclosure;

fig. 4 is a schematic structural diagram of a test fixture for a server board card according to another embodiment of the present application;

fig. 5 is a schematic structural diagram of a test system for a server board card according to an embodiment of the present application.

Specific embodiments thereof have been shown by way of example in the drawings and will herein be described in more detail. These drawings and the written description are not intended to limit the scope of the inventive concepts in any way, but to illustrate the concepts of the present application to those skilled in the art by reference to specific embodiments.

Reference numerals

1-a server board card test platform; 10-a first interface; 11-BSI host; 12-an indicator lamp test circuit; 13-IIC test circuitry; 14-GPIO test circuit; 15-USB hub; a 16-power module; 17-input-output means; 2-a server board card test fixture; 20-a second interface; 21-a board card fixing device; 22-JTAG flat cable; 23-test tool.

Detailed Description

Reference will now be made in detail to exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numbers in different drawings refer to the same or similar elements, unless otherwise indicated. The implementations described in the following exemplary examples are not representative of all implementations consistent with the present application. Rather, they are merely examples of apparatus and methods consistent with some aspects of the present application as detailed in the accompanying claims.

For a clear understanding of the technical solutions of the present application, the prior art solutions will be described in detail first.

Currently, when testing a server board card, a tester generally creates a system environment for testing, and then deploys the server board card in the system environment, so as to test the server board card in the system environment. Specifically, a main board, a central processing unit, a memory, a mechanical hard disk, a complete machine server and other test accessories are configured in the test fixture or any server case in advance to form a system environment of the test server board card. And then the server board card is arranged at a preset position of the system environment, and each internal interface to be tested of the server board card is manually connected with a test fixture or a test interface corresponding to each test accessory in any server case according to the test requirement, so that the system environment is started, and the test of the server board card is realized.

And according to the test requirements of the plurality of server boards, the originally installed server boards are required to be taken out, the system environment is reconfigured according to the test requirements of the plurality of server boards, and each internal interface to be tested of the plurality of server boards is manually connected with the test fixture or the test interface corresponding to each test accessory in any server case again, so that the system environment is started again, and the test of the plurality of server boards is realized. The connection process is complex, testing time is consumed, and when faults occur, only the fault of the server board card can be known, and the failed components or functions cannot be obtained.

Therefore, when the technical problems in the prior art are faced, in order to simplify the connection process and reduce the test time, the configuration system environment is canceled, a server board card test platform and a server board card test jig are built, test circuits and other test devices corresponding to the test requirements are arranged in the server board card test platform according to the test requirements, and the server board card is fixed in the server board card test jig according to the test requirements. And then the server board card test platform is connected with the server board card test jig, so that the server board card can be tested according to the test requirement. And when testing a plurality of server boards, through changing the fixed server board in the server board test tool, just can test a plurality of server boards according to the test demand of a plurality of server boards to connect complicated problem among the solution prior art, improve test efficiency. In order to effectively identify the failed component or function when the server board card fails, when the platform is connected with the jig, each test circuit or BSI host in the platform is connected with one interface in the jig through one corresponding interface, so that independent test of each component or function of the server board card can be completed, and when the failure occurs, the failed component or function of the server board card can be known through identifying the first interface and the second interface corresponding to the failure in the server board card test platform.

The following describes the technical solutions of the present application and how the technical solutions of the present application solve the above technical problems in detail with specific embodiments. The following embodiments may be combined with each other, and the same or similar concepts or processes may not be described in detail in some embodiments. Embodiments of the present application will be described below with reference to the accompanying drawings.

Fig. 1 is a schematic structural diagram of a server board card testing platform according to an embodiment of the present application, as shown in fig. 1, where the server board card testing platform in the embodiment of the present application includes: a serial interface BSI host 11, an indicator light test circuit 12, an integrated circuit bus IIC test circuit 13, a general purpose input output GPIO test circuit 14, and a plurality of first interfaces 10.

In this embodiment, the BSI host 11 is communicatively connected to the indicator light test circuit 12, the IIC test circuit 13, and the GPIO test circuit 14, respectively.

The BSI host is a device for testing an interface in a target board card to be tested. The indicator lamp test circuit is a circuit for testing the indicator lamp in the target board card. The IIC test circuit is a device for testing components on an IIC bus in the target board card. The GPIO test circuit is a test device for the input and output functions of the target board card.

Specifically, an indicator lamp test circuit, an IIC test circuit and a GPIO test circuit are configured in the server board card test platform in advance, and data lines for transmitting data can be arranged between the BSI host and the indicator lamp test circuit, between the indicator lamp test circuit and the GPIO test circuit, and the BSI host and the indicator lamp test circuit are connected with the IIC test circuit and the GPIO test circuit according to data line connectors for transmitting data.

Illustratively, the data line for transmitting data may be a USB data line or may be another data line, which is not limited by the comparison of the present embodiment.

In this embodiment, the BSI host 11, the indicator light test circuit 12, the IIC test circuit 13, and the GPIO test circuit 14 are respectively connected with a second interface corresponding to a fixture through a corresponding first interface 10, and a target board card is disposed on the fixture.

The target board card is a server board card to be tested. Such as a server chiplet. The jig is a tool for fixing the target board card and performing test actions. The first interface is an interface corresponding to each test circuit or device in the server board card test platform. The second interface is an interface in the jig, which is correspondingly connected with the first interface.

It can be understood that if the number of the first interfaces is four, correspondingly, the number of the second interfaces is also four, and the first interfaces and the second interfaces are in one-to-one correspondence.

Specifically, a target board card is fixed in the jig in advance, and a first interface corresponding to the BSI host, the indicator light test circuit, the IIC test circuit and the GPIO test circuit is inserted into a second interface corresponding to the jig, so that the BSI host, the indicator light test circuit, the IIC test circuit and the GPIO test circuit are connected with the jig.

It can be understood that the number of the first interfaces simultaneously inserted into the second interfaces corresponding to the jig may be different, and may be specifically determined according to the test requirement of the target board. For example, if the test requirement is to test the indicator lamp, the BSI host and the first interface corresponding to the indicator lamp test circuit are selected to be connected with the second interface corresponding to the fixture. If the test requirement is to detect the indicator lamp and the input and output functions, a first interface corresponding to the BSI host, the indicator lamp test circuit and the GPIO test circuit is selected to be connected with a second interface corresponding to the jig.

In this embodiment, the indicator lamp testing circuit 12 is used for testing the indicator lamp in the target board card. The BSI host 11 is used for testing whether the interface of the target board card can normally detect signals. And the IIC test circuit 13 is used for testing the components connected with the bus in the target board card. The GPIO test circuit 14 is configured to test whether the interface of the target board card can normally transmit data.

When each test circuit and the BSI host carry out corresponding test on the target board card, the target board card can be tested through the connection path between the first interface corresponding to each test circuit and the BSI host and the second interface corresponding to the jig.

The first interface and the second interface corresponding to the indicator light test circuit may be optical fiber interfaces, and when the first interface corresponding to the indicator light test circuit is connected to the second interface corresponding to the jig, the measurement pigtail of the first interface may be coupled or connected with the measured optical fiber of the second interface in other forms. The first interface and the second interface corresponding to the BSI host may be USB interfaces, and when the first interface corresponding to the BSI host is connected to the second interface corresponding to the jig, the first interface and the second interface may be specifically coupled. The first interface and the second interface corresponding to the IIC test circuit may be IIC interfaces, and when the first interface corresponding to the IIC test circuit is connected with the second interface corresponding to the jig, the data line for transmitting the IIC signal may be specifically coupled with the corresponding second interface, so as to test the IIC bus in the target board card. The first interface and the second interface corresponding to the GPIO test circuit may be GPIO interfaces, and when the first interface corresponding to the GPIO test circuit is connected with the second interface corresponding to the jig, a cable for testing the GPIO interface may be specifically coupled with the corresponding second interface, so as to test the GPIO pin in the target board card.

It can be understood that, for the first interfaces of different types, the corresponding second interfaces are all connected with the jig, and the specific connection mode is not limited in this embodiment.

It will be appreciated that the platform may further comprise: a network switch. The network switch is equipment for completing information interaction functions between equipment and components in the service board card test platform.

For example, if the BS I host interface is not sufficient, the network switch may implement a communication connection between the BS I host and each test circuit or other device via the network cable. Specifically, the network switch is configured in the server board test platform in advance. And setting a network cable between the network switch and the test circuit or other devices to be connected with the BS I host, and connecting the network switch with the test circuit or other devices to be connected according to the network cable connector. And setting a network cable between the network switch and the BS I host, and connecting the network switch and the BS I host according to a network cable connector so as to realize information interaction between the BSI host and a test circuit or other devices to be connected.

It will be appreciated that the interface deficiency mentioned in the above example may also be an interface deficiency of other devices, and the embodiment of the device with an interface deficiency is not limited.

The embodiment provides a server board card test platform, includes: the system comprises a serial interface BSI host, an indicator lamp test circuit, an integrated circuit bus IIC test circuit, a general purpose input/output GPIO test circuit and a plurality of first interfaces; the BSI host is respectively in communication connection with the indicator lamp test circuit, the IIC test circuit and the GPIO test circuit; the BSI host, the indicator lamp test circuit, the IIC test circuit and the GPIO test circuit are respectively in communication connection with a second interface corresponding to the jig through a corresponding first interface, and a target board card is arranged on the jig; the indicator lamp test circuit is used for testing the indicator lamp in the target board card; the BSI host is used for testing whether the interface of the target board card can normally detect signals; the IIC test circuit is used for testing the components connected with the bus in the target board card; and the GPIO test circuit is used for testing whether the interface of the target board card can normally transmit data. Because the BSI host, the indicator light test circuit, the IIC test circuit, the GPIO test circuit and the first interfaces are arranged in the server board card test platform in advance, and the board card fixing device and the second interfaces are arranged in the server board card test fixture in advance. When in testing, the server board card can be tested according to the test requirement by fixing the server board card on the board card fixing device and connecting a first interface corresponding to each component in the server board card test platform with a second interface corresponding to the server board card test fixture. And through changing the server integrated circuit board who fixes on integrated circuit board fixing device, just can realize testing a plurality of server integrated circuit boards to shorten the time of changing the server integrated circuit board, simplified the connected mode, and then improved test efficiency. And when testing, each testing circuit or BSI host in the platform is connected with one second interface in the jig through one corresponding first interface, so that each part or function of the server board card can be independently tested, and when testing that the service board card fails, the parts or functions of the server board card failed can be obtained by identifying the first interface and the second interface corresponding to the failure in the server board card testing platform.

Fig. 2 is a schematic structural diagram of a server board card testing platform according to another embodiment of the present application, as shown in fig. 2, where the embodiment further includes: a USB hub 15.

In this embodiment, BSI host 11 is communicatively coupled to USB hub 15 via a USB data line. The USB hubs 15 are respectively connected in communication with the IIC test circuit 13 and the GPIO test circuit 14.

Wherein, the USB hub is a device for expanding the USB data line interface.

Specifically, a USB hub is arranged in the server board card test platform in advance, a USB data line is arranged between the BSI host and the USB hub, and the BSI host is connected with the USB hub according to a USB data line connector. And a USB data line can be arranged between the USB hub and the IIC test circuit in advance, and a USB data line is arranged between the USB hub and the GPIO test circuit, and the USB hub, the IIC test circuit and the GPIO test circuit are respectively connected according to USB data line connectors.

The embodiment provides a server board card test platform, which further comprises a USB hub; the BSI host is in communication connection with the USB hub through a USB data line; the USB hub is respectively connected with the IIC test circuit and the GPIO test circuit in a communication way. Because the USB data line is arranged between the BSI host and the USB hub, and the USB hub is connected with the IIC test circuit and the GPIO test circuit, the BSI host can be connected to the USB hub through the USB data line and further connected to the IIC test circuit and the GPIO test circuit, so that the IIC test circuit and the GPIO test circuit can smoothly carry out corresponding test on the server board card under the control of the BSI host, and the BSI host is respectively in communication connection with the IIC test circuit and the GPIO test circuit through the USB hub, so that the connection mode can be simplified, and the connection efficiency can be improved.

As an alternative embodiment, based on the above embodiment, the platform further includes: a power module 16.

In this embodiment, the power module 16 is communicatively connected to the BSI host 11 through a USB hub and a USB data line.

Specifically, a power module is arranged in the server board card test platform in advance, and a USB data line is arranged between the USB hub and the power module. The BSI-based host is connected with the USB hub through a USB data line, and the USB hub is connected with the power module according to a USB data line connector, so that the power module is connected with the BSI-based host.

In this embodiment, the power module 16 is communicatively connected to the second interface corresponding to the jig through the corresponding first interface.

It can be understood that the test target board card needs to be electrified to complete the test, so that the electric quantity is required to be provided for the jig. The power module is provided with a first interface corresponding to the power module, the jig is provided with a second interface corresponding to the power module, and the first interface corresponding to the power module is inserted into the second interface corresponding to the jig, so that the power module is connected with the jig.

The first interface corresponding to the power module may be an ATX power interface or may be another type of interface, which is not limited in this embodiment. Moreover, the connection mode of the second interface corresponding to the jig may be a butt-joint or other connection modes, which is not limited in this embodiment.

In this embodiment, the power module 16 is configured to supply power to the fixture.

Specifically, after the power module is determined to be connected with the jig, the power module can supply power to the jig so as to test the target board card.

In this embodiment, the BSI host is configured to test whether the interface of the target board card can normally detect a signal after the power module supplies power to the fixture.

The BSI host is a device for storing BSI detection standards and logic.

After the power module supplies power to the jig, when testing whether the interface of the target board card can normally detect signals, the power module specifically can be: after the first interface corresponding to the power module is connected with the second interface corresponding to the jig, the BSI host accesses all buses deployed on the target board card according to BSI detection standards, judges whether the interfaces of the target board card can normally detect signals, if so, indicates that the target board card is normal, and if not, indicates that the target board card is abnormal.

The embodiment provides a server board card test platform, and equipment further includes: a power module; the power module is in communication connection with the BSI host through a USB hub and a USB data line; the power module is in communication connection with a second interface corresponding to the jig through a corresponding first interface; the power module is used for supplying power to the jig; the BSI host is used for testing whether the interface of the target board card can normally detect signals after the power module supplies power to the jig. Because the testing process of the server board card is needed to be completed on the basis of electricity, the power supply module is connected with the BSI host, and the power supply for the jig can be realized by connecting the first interface corresponding to the power supply module with the second interface corresponding to the jig, so that the normal running of the test is ensured. After the jig is electrified, the BSI host can smoothly complete the test of whether the interface of the target board card can normally detect signals through the transmission of the electric signals.

As an alternative embodiment, as shown in fig. 2, on the basis of any one of the above embodiments, the platform further includes: and an input/output device 17.

In this embodiment, the input/output device 17 is communicatively connected to the BSI host via a network cable.

Wherein the input-output device provides input and output functions for the test process.

Specifically, a network cable is set between the input/output device and the BSI host or between the network switches connected with the BSI host in advance, and the input/output device is connected with the BSI host or the network switches connected with the BSI host according to a network cable connector, so that communication connection with the BSI host is realized.

In this embodiment, the input/output device 17 is communicatively connected to the second interface corresponding to the jig through the corresponding first interface.

It will be appreciated that the start and end of the test target board card are based on data transfer, so that a path for data transfer is provided for the jig. The input/output device is provided with a first interface corresponding to the input/output device, the jig is provided with a second interface corresponding to the input/output device, the first interface corresponding to the input/output device is inserted into the second interface corresponding to the jig, and the input/output device is determined to be connected with the jig.

In this embodiment, the input/output device 17 is configured to receive a test instruction triggered by a user, and send the test instruction to the BSI host, so that the BSI host sends a test control instruction to a corresponding test circuit based on a test identifier in the test instruction, where the test control instruction is used to control the test circuit to perform a corresponding test on a target board card.

The test instruction is an instruction for testing the target board card. In the test instruction, a test identifier is stored, where the test identifier is an identifier characterizing the test content, and may be, for example, an identifier of a test circuit or BSI host included in the service board test platform.

When the method is used for receiving the test instruction triggered by the user, the method specifically comprises the following steps: the method comprises the steps that a trigger component and an input frame or a selection frame corresponding to a test instruction are preset on a display interface of an input/output device, and after a user clicks the trigger component through a test identifier input in the input frame or the selection frame, the user determines that the test instruction triggered by the user is received.

When a test control instruction is sent to a corresponding test circuit based on a test identifier in the test instruction, the method specifically may be: after receiving the test instruction, the BSI host responds to the connection of a first interface corresponding to at least one test circuit of the test requirement by a user and a second interface corresponding to the jig, obtains a test identifier in the test instruction, and sends a test control instruction to the at least one test circuit of the test requirement according to the test identifier.

When the test control command controls the test circuit to perform corresponding test on the target board card, the method specifically can be as follows: after the at least one test circuit receives the test control instruction, the BSI host controls the at least one test circuit to correspondingly test the target board card through connection with the jig.

In this embodiment, the input/output device 17 is further configured to receive and display a test result sent by at least one test circuit.

Specifically, in response to the at least one test circuit ending the test on the target board card, a test result of the at least one test circuit is obtained. After the test result of at least one test circuit is received, the control unit displays the test result related test identifier on a display interface corresponding to the input/output device.

As an alternative implementation manner, after the test result is obtained, the test result is determined to be normal or abnormal, and if the test result is abnormal, the test identifier and the corresponding test result are controlled to be displayed on the display interface corresponding to the input/output device. If the result is normal, the result may not be displayed.

The embodiment provides a server board card test platform, still includes: an input/output device; the input and output device is in communication connection with the BSI host through a network cable; the input and output device is in communication connection with a second interface corresponding to the jig through a corresponding first interface; the input-output device is used for receiving a test instruction triggered by a user and sending the test instruction to the BSI host so that the BSI host sends a test control instruction to a corresponding test circuit based on a test identifier in the test instruction, and the test control instruction is used for controlling the test circuit to perform corresponding test on the target board card; and the input and output device is also used for receiving and displaying the test result sent by the at least one test circuit. Because the input and output device is arranged, the input and output device is connected with the jig, a test instruction triggered by a user can be received, and the test instruction can be sent to the BSI host through the input and output device, so that the BSI host inputs a test control instruction corresponding to at least one test circuit into at least one test circuit, and the control test circuit can perform corresponding test on the target board card according to the test control instruction. After the test is finished, the test result sent by at least one test circuit is obtained through the input and output device, and the test result is displayed on a display interface of the input and output device, so that the corresponding component or function of the failed server board card can be known, and better test experience can be provided for a user.

As an alternative embodiment, the indicator light test circuit 12 is located in the indicator light test box, the IIC test circuit 13 is disposed in the IIC test card, and the GPIO test circuit 14 is disposed in the GPIO test card on the basis of any of the above embodiments.

The indicator lamp test box is used for storing the test indicator lamp standard and executing the test box for detecting the indicator lamp. The IIC test card is used for converting the USB signal into an IIC test signal and executing the test card for detecting the IIC bus component. The GPIO test card is a test card for executing whether the interface of the target board card can normally transmit data.

When the target board card is tested through the pilot lamp test circuit according to the pilot lamp test box, the method specifically comprises the following steps: and responding to the test of the indicator light part in the target board card, inputting high/low level to the indicator light part, if the indicator light part is perceived to be on by the indicator light test box when the high level is input, and if the indicator light part is perceived to be not on by the indicator light test box when the low level is input, indicating that the indicator light part of the target board card is normal, otherwise, the indicator light part is abnormal.

Alternatively, the indicator light on the target board may be an LED light. Correspondingly, when the target board card is tested through the pilot lamp test circuit according to the pilot lamp test box, the method specifically can be as follows: the high/low level is input to the LED lamp on the target board card, after the LED lamp on the target board card receives the high/low level, the MOS tube of the LED lamp is automatically turned on/off, the LED lamp is further turned on/off, and then the light emitted by the LED lamp is introduced into the LED lamp test box through the second interface for detection, so that the purpose of testing is achieved.

When the IIC test circuit is used for testing the target board card according to the IIC test card, the method specifically comprises the following steps: and in response to testing the components connected with the IIC bus in the target board card, the IIC test card converts signals transmitted during testing into testing operation on the IIC bus, and tests the components on the IIC bus in the target board card according to the testing operation.

Optionally, the IIC test card includes a USB-IIC module, and accordingly, when the IIC test card is used to test the target board card through the IIC test circuit, the method specifically may be: the USB-IIC module converts test control instructions transmitted via the USB data lines into test operations on the IIC bus, illustratively addressing the IIC bus components, writing register addresses, writing data, reading data, and the like.

When the target board card is tested through the GPIO test circuit according to the GPIO test card, the method specifically comprises the following steps: and responding to the test of the data transmission function of the target board card, inputting a high level to the target board card, and if the GPIO test card detects that the target board card returns to the input high level, determining that the target board card can normally transmit data. If the GPIO test card detects that the target board card does not return to the input high level, the target board card is determined to be abnormal, and data cannot be normally transmitted.

The embodiment provides a server board card test platform, pilot lamp test circuit is located pilot lamp test box, IIC test circuit setting in IIC test card, GPIO test circuit setting in GPIO test card. Because corresponding test circuits are arranged in the indicator lamp test box, the IIC test card and the GPIO test card in advance, the target board card can be smoothly tested according to the indicator lamp test box, the IIC test card and the GPIO test card by connecting the test circuits with the jig, and the test circuits can be more independent.

Fig. 3 is a schematic structural diagram of a test fixture for a server board according to an embodiment of the present application, as shown in fig. 3, where the test fixture for a server board in an embodiment of the present application includes: the board fixing device 21 and the plurality of second interfaces 20 are in communication connection with the corresponding first interfaces, and the first interfaces are interfaces respectively corresponding to the BS I host 11 and the plurality of test circuits in the server board test platform.

In this embodiment, the target board card is detachably disposed on the board card fixing device 21, and the target board card is communicatively connected to the server board card testing platform through a plurality of second interfaces.

The target board card and the board card fixing device can be in a clamping or other detachable connection mode.

Specifically, a board fixing device is provided in the jig in advance, and a target board is manually fixed on the board fixing device. And then according to the test requirement of the target board card, connecting a first interface corresponding to at least one test circuit included in the test requirement with at least one second interface corresponding to the jig, thereby determining that the target board card is connected with the server board card test platform.

Optionally, if another board card needs to be tested, the target board card is manually detached from the board card fixing device, and then the other board card is fixed on the board card fixing device. And similarly, according to the test requirement of another board card, connecting a first interface corresponding to at least one test circuit included in the test requirement with at least one second interface corresponding to the jig.

It can be understood that the power module, the input/output module, and the BSI host serve as necessary test modules or devices, and the corresponding first interface is required to be connected with the corresponding second interface of the jig all the time.

The embodiment provides a server board card test fixture, includes: the board card fixing device and the plurality of second interfaces are in communication connection with the corresponding first interfaces, and the first interfaces are interfaces respectively corresponding to the BSI host and the plurality of test circuits in the server board card test platform; the target board card is detachably arranged on the board card fixing device and is in communication connection with the server board card testing platform through a plurality of second interfaces. Because the board fixing device is arranged in the server board testing jig in advance, the server board can be tested according to the test requirement by fixing the server board on the server board testing jig and connecting the first interface of the server board testing platform with the second interface of the server board testing jig. And when another server board card needs to be tested, the server board card can be quickly replaced by fixing the other server board card in the board card fixing device of the server board card testing jig, so that the testing efficiency is further improved. And because the BSI host and the first interfaces corresponding to the test circuits in the server board card test platform are connected with the second interfaces corresponding to the jig, when the failure occurs, the components or functions of the server board card failure can be known by identifying the first interfaces and the second interfaces corresponding to the failure in the server board card test platform.

Fig. 4 is a schematic structural diagram of a test fixture for a server board according to another embodiment of the present application, as shown in fig. 4, where the test fixture further includes, based on the embodiment shown in fig. 3: the workgroup JTAG flat cable 22 is jointly tested.

In this embodiment, the target board is connected to the BS I host 11 through the JTAG flat cable 22 and the second interface connected to the first interface corresponding to the BS I host in sequence.

Wherein the JTAG flat cable is a cable providing a plurality of test joints. The JTAG connectors are test connectors included in the JTAG flat cable.

Specifically, when the target board card is connected with the BSI host, a JTAG flat cable is arranged between the target board card and the BSI host in advance, a first interface corresponding to the BSI host is connected with a second interface corresponding to the BSI host, and the second interface is connected with the JTAG flat cable through a network cable adapter, so that the JTAG flat cable is connected with the target board card, and the connection between the target board card and the BSI host is realized.

The embodiment provides a server board card test fixture, still includes: JTAG flat cable connector; the target board card is connected with the BSI host in a communication way through a JTAG flat cable and a second interface connected with a first interface corresponding to the BSI host. Because the first interfaces corresponding to the BSI host are possibly a plurality of USB data lines, a JTAG flat cable is required to be preset, the JTAG flat cable is connected with the target board card, and the JTAG flat cable is connected with the second interfaces corresponding to the first interfaces of the BSI host through the network cable adapter, so that the plurality of USB data lines can be connected with the target board card, and the BSI host can smoothly test the target board card through the corresponding first interfaces.

As an alternative embodiment, as shown in fig. 4, on the basis of any one of the embodiments corresponding to the jig, the jig further includes: a test tool 23.

In this embodiment, the test tool 23 interfaces with the interior of the target board.

It will be appreciated that the target board has an electrical connector thereon, the electrical connector has a corresponding socket, and the test tool has a corresponding plug of the electrical connector.

Specifically, an electronic connector is provided for the target board in advance, and a socket of the electronic connector is connected with an internal interface of the target board. And then inserting a plug corresponding to the testing tool into a socket corresponding to the electronic connector, thereby determining the internal interface connection of the testing tool and the target board card.

For example, if the electronic connector is an MCIO connector, the test tool may be an MCIO Dummy card. When the test tool is connected with the internal interface of the target board card, the slot on the MCIO Dummy card can be inserted with the MCIO connector on the target board card.

In this embodiment, the testing tool 23 is configured to conduct with the target board after the power module 16 in the server board testing platform supplies power to the fixture, so that the power module supplies power to the target board, and assist the BS I host in the server board testing platform to test whether the interface of the target board can normally detect signals.

When the BS I host in the auxiliary server board card test platform tests whether the interface of the target board card can normally detect signals, the method specifically can be as follows: based on the connection between the test tool and the electronic connector of the target board card, the BS I host detects whether the internal interface of the target board card can normally detect signals or not through the connection between the test tool and the tool, if so, the internal interface is determined to be normal, and if not, the internal interface is determined to be abnormal.

The embodiment provides a server board card test fixture, still includes: a test tool; the testing tool is connected with the internal interface of the target board card; and the testing tool is used for conducting with the target board card after the power module in the server board card testing platform supplies power to the jig so as to enable the power module to supply power to the target board card and assist the BSI host in the server board card testing platform to test whether the interface of the target board card can normally detect signals. Because the internal interface of the target board is small, a test tool is required to assist the target board in signal testing. Therefore, the internal interface of the target board card can be connected with the power module through the testing tool in advance, so that the BSI host can smoothly detect signals of the interface of the target board card.

As an alternative embodiment, the test tool is based on the above embodiment: a Dummy card; the Dummy card is matched with the target board card; the Dummy card includes: a plurality of golden fingers; the target board card includes: an electronic connector.

In this embodiment, the electronic connector is correspondingly connected to the internal interface of the target board card. The Dummy card is correspondingly connected with the electronic connector through a plurality of golden fingers.

The Dummy card is a testing tool which is correspondingly formulated according to the structure of the target board card and is used for assisting the BSI host testing box to test whether the interface of the target board card can normally detect signals. The golden finger is hardware which is included by the Dummy card and used for transmitting signals.

Specifically, the electronic connector is connected with the internal interface of the target board card in advance according to specific test requirements, and the contact pieces of the plurality of golden fingers are inserted with the electronic connector of the target board card, so that the Dummy card is connected with the internal interface of the target board card through the electronic connector.

In this embodiment, the Dummy card is used to assist the BSI host in testing signals included in the electronic connector, so as to test whether the interface of the target board card can normally detect signals.

Specifically, if the electronic connector is an MCIO connector, the test tool is an MCIO Dummy card, and after the MCIO Dummy card is connected to the internal interface of the target board card through the MCIO connector, all signals included in the MCIO connector are tested. If the MCIO connector includes a GND signal, a Sideband signal, and a PCIe signal, then one GND signal is selected as a common ground connection between the MCIO Dummy card and the target board card, and the remaining GND signals are processed by a resistor lifting process on the MCIO Dummy card and output a signal level on the MCIO Dummy card, then the BSI host obtains the signal level through the JTAG flat cable, and determines whether the signal level is a high level, if yes, it indicates that the target board card normally detects a signal, and if not, it indicates that the target board card normally detects a signal abnormality.

And 1149.1 interconnection test is conducted on the boundary scanning device on the target board card through the JTAG flat cable aiming at the Sideband signal, and the test is controlled to be received and transmitted on the interconnection network, so that the function of detecting the signal of each interface in the target board card is realized. And aiming at PCIe signals, directly circulating on the MCIO Dummy card, so that circulating test is carried out through a boundary scanning device on the target board card.

The embodiment provides a server board card test fixture, the test tool that the tool includes is: a Dummy card; the Dummy card includes: a plurality of golden fingers; the target board card includes: an electronic connector; the Dummy card is correspondingly connected with the electronic connector through a plurality of golden fingers; and the Dummy card tests all signals included in the electronic connector so as to test whether the interface of the target board card can normally detect signals. Since the test tool for testing the target board card may be a Dummy card, signal interaction between the Dummy card and the target board card may be achieved by connecting the target board card with an electronic connector included therein and connecting the electronic connector with the Dummy card. Therefore, whether the normal detection signal can be successfully tested on the interface of the target board card by using the Dummy card can be tested by testing the signal included in the electronic connector.

Fig. 5 is a schematic diagram of a server board card testing system according to an embodiment of the present application, as shown in fig. 5, where the server board card testing system in the embodiment of the present application includes: the server board card test platform 1 and the server board card test fixture 2.

In this embodiment, the server board test platform 1 includes a plurality of first interfaces 10, and the server board test fixture 2 includes a plurality of second interfaces 20.

It may be appreciated that the plurality of first interfaces included in the server board card test platform may specifically include: the power supply comprises a first interface corresponding to a BSI host, a first interface corresponding to a power supply module, a first interface corresponding to an input/output device, a first interface corresponding to an indicator lamp test circuit, a first interface corresponding to an IIC test circuit and a first interface corresponding to a GPIO test circuit. The plurality of second interfaces included in the server board card test fixture may specifically include a second interface correspondingly connected to the first interface.

In this embodiment, the server board card test platform 1 realizes communication connection with the server board card test fixture 2 through a plurality of first interfaces and corresponding second interfaces.

Specifically, when testing the target board card, a first interface included in the server board card testing platform is connected with a second interface corresponding to the server board card testing jig in advance, so that the connection between the server board card testing platform and the server board card testing jig is determined.

The server board card test system provided in this embodiment includes: and a server board card test platform 1 and a server board card test fixture 2. The server board card test platform 1 comprises a plurality of first interfaces, and the server board card test fixture 2 comprises a plurality of second interfaces. The server board card testing platform 1 realizes communication connection with the server board card testing jig 2 through a plurality of first interfaces and corresponding second interfaces. Because the server board card test platform comprises the BS I host, the power supply module, the input and output device and the first interfaces corresponding to the test circuits, and the server board card test fixture comprises the second interfaces corresponding to all the first interfaces, the server board card test platform and the server board card test fixture can jointly execute the test on the target board card by connecting the first interfaces with the second interfaces, the connection mode is simplified, and the test efficiency is improved. And through selectively connecting the first interface in the server board card test platform with the second interface in the server board card test jig, the independent test of each component or function of the server board card can be completed according to specific test requirements. And when the fault occurs, the parts or functions of the server board card with the fault can be obtained by identifying the first interface and the second interface corresponding to the fault in the server board card test platform.

Other embodiments of the present application will be apparent to those skilled in the art from consideration of the specification and practice of the utility model disclosed herein. This application is intended to cover any variations, uses, or adaptations of the application following, in general, the principles of the application and including such departures from the present disclosure as come within known or customary practice within the art to which the application pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the application being indicated by the following claims.

It is to be understood that the present application is not limited to the precise arrangements and instrumentalities shown in the drawings, which have been described above, and that various modifications and changes may be effected without departing from the scope thereof. The scope of the application is limited only by the appended claims.

Claims

1. A server board card test platform, comprising: the system comprises a serial interface BSI host, an indicator lamp test circuit, an integrated circuit bus IIC test circuit, a general purpose input/output GPIO test circuit and a plurality of first interfaces;

2. The platform of claim 1, further comprising: a USB hub;

the BSI host is in communication connection with the USB hub through a USB data line;

the USB hub is respectively connected with the IIC test circuit and the GPIO test circuit in a communication mode.

3. The platform of claim 2, further comprising: a power module;

the power module is in communication connection with the BSI host through the USB hub and the USB data line;

The power module is in communication connection with a second interface corresponding to the jig through a corresponding first interface;

the power supply module is used for supplying power to the jig;

the BSI host is used for testing whether the interface of the target board card can normally detect signals after the power module supplies power to the jig.

4. A platform according to any one of claims 1 to 3, further comprising: an input/output device;

the input and output device is in communication connection with the BSI host through a network cable;

the input and output device is in communication connection with a second interface corresponding to the jig through a corresponding first interface;

the input-output device is used for receiving a test instruction triggered by a user and sending the test instruction to the BSI host, so that the BSI host sends a test control instruction to a corresponding test circuit based on a test identifier in the test instruction, and the test control instruction is used for controlling the test circuit to perform corresponding test on the target board card;

the input and output device is also used for receiving and displaying the test result sent by at least one test circuit.

5. A platform according to any one of claims 1 to 3, wherein the indicator light test circuit is located in an indicator light test box, the IIC test circuit is provided in an IIC test card, and the GPIO test circuit is provided in a GPIO test card.

6. A server board card test fixture, its characterized in that includes: the board card fixing device and the plurality of second interfaces are in communication connection with the corresponding first interfaces, and the first interfaces are interfaces respectively corresponding to the BSI host and the plurality of test circuits in the server board card test platform;

7. The jig of claim 6, further comprising: JTAG flat cable;

the target board card is connected with the BSI host in a communication way through the JTAG flat cable and a second interface connected with a first interface corresponding to the BSI host in sequence.

8. The jig according to claim 6 or 7, further comprising: a test tool;

the testing tool is connected with the internal interface of the target board card;

the testing tool is used for conducting the power module in the server board card testing platform with the target board card after supplying power to the jig, so that the power module supplies power to the target board card, and assisting the BSI host in the server board card testing platform to test whether the interface of the target board card can normally detect signals.

9. The jig of claim 8, wherein the test tool is: a Dummy card; the Dummy card is adapted to the target board card; the Dummy card includes: a plurality of golden fingers; the target board card includes: an electronic connector;

the electronic connector is correspondingly connected with the internal interface of the target board card;

the Dummy card is correspondingly connected with the electronic connector through the plurality of golden fingers;

the Dummy card is used for assisting the BSI host to test signals included in the electronic connector so as to test whether the interface of the target board card can normally detect signals.

10. A server board card testing system, comprising the server board card testing platform according to any one of claims 1 to 5 and the server board card testing jig according to any one of claims 6 to 9;

the server board card test platform comprises a plurality of first interfaces, and the server board card test fixture comprises a plurality of second interfaces;

the server board card testing platform realizes communication connection with the server board card testing jig through the plurality of first interfaces and the corresponding second interfaces.