CN219258527U

CN219258527U - Intermittent blanking mechanism for semiconductor chip test

Info

Publication number: CN219258527U
Application number: CN202320821766.0U
Authority: CN
Inventors: 杨良春; 赵永峰
Original assignee: Beijing Sinodynetest Science & Technology Co ltd
Current assignee: Beijing Sinodynetest Science & Technology Co ltd
Priority date: 2023-04-14
Filing date: 2023-04-14
Publication date: 2023-06-27
Anticipated expiration: 2033-04-14

Abstract

The utility model discloses an intermittent blanking mechanism for semiconductor chip testing, which belongs to the field of chip testing, and comprises a horizontal moving bracket, wherein a storage box is arranged on the horizontal moving bracket, the horizontal moving bracket is used for driving the storage box to linearly move, a plurality of semiconductor chip pieces which are sequentially overlapped from top to bottom are assembled in the storage box, the lower parts of the two sides of the storage box are provided with discharge holes, the lower side of the storage box is provided with a horizontal discharge unit, the horizontal discharge unit comprises a small bracket fixedly connected to the lower side of the storage box, a first rotating wheel is rotatably connected to the small bracket, and an extension groove is formed in the lower side of the storage box, so that the intermittent blanking mechanism can be used for rapidly placing a plurality of semiconductor chip pieces in batches on a working platform for detecting the semiconductor chip pieces at equal intervals, and is convenient for detection by detection staff.

Description

Intermittent blanking mechanism for semiconductor chip test

Technical Field

The utility model relates to the field of chip testing, in particular to an intermittent blanking mechanism for semiconductor chip testing.

Background

In the production process of semiconductor chips, the semiconductor chips need to be tested, and due to higher cost of automatic test equipment, a part of factories still use a manual test method;

the specific test process is that a batch of semiconductor chips are uniformly placed on a working platform used for detecting semiconductor chip pieces, a detection personnel is allowed to test, after the batch of semiconductor chips are tested, the semiconductor chips of the next batch are uniformly placed on the working platform again, and the steps are repeated repeatedly;

in the detection process, the process of placing the semiconductor chip on the working platform needs to be manually carried out by a detection personnel, and inconvenience is brought to the detection of the detection personnel.

Disclosure of Invention

1. Technical problem to be solved

Aiming at the problems in the prior art, the utility model aims to provide an intermittent blanking mechanism for semiconductor chip testing, which can be used for rapidly placing a plurality of semiconductor chip pieces in batches at equal intervals on a working platform for detecting the semiconductor chip pieces, so as to facilitate detection by detection staff.

2. Technical proposal

In order to solve the problems, the utility model adopts the following technical scheme.

The utility model provides a semiconductor chip test is with intermittent type feed mechanism, includes the horizontal migration support, install the storage box on the horizontal migration support, the horizontal migration support is used for driving the storage box and carries out linear motion, the inside of storage box is equipped with from last a plurality of semiconductor chip spare that overlap in proper order and place down, the discharge gate has all been seted up to the lower part of storage box both sides, the downside of storage box is equipped with horizontal discharge unit.

Further, the horizontal discharging unit comprises a small bracket fixedly connected to the lower side of the storage box, a first rotating wheel is rotatably connected to the small bracket, an extension groove is formed in the lower side of the storage box, and the upper edge position of the first rotating wheel extends to the inside of the storage box through the extension groove and is abutted to a semiconductor chip piece located on the lower side.

Further, the horizontal discharging unit comprises two side frames fixedly connected to the lower side of the storage box, the two side frames are respectively connected with a rotating shaft in a rotating mode, the outer sides of the two rotating shafts are provided with conveying belt bodies, the upper portions of the conveying belt bodies extend to the inner portion of the storage box through discharging holes, and the lower portions of the conveying belt bodies are located on the lower side of the storage box.

Further, two ends of the two rotating shafts are fixedly connected with second rotating wheels.

Further, the horizontal moving support comprises a main support, the upper end of the main support is fixedly connected with a transverse guide rail, and a moving trolley connected with the storage box is arranged on the transverse guide rail.

Further, the mobile trolley can be provided with an electric push rod which is vertically arranged, the output end of the electric push rod is fixedly connected with a connecting piece, and the connecting piece is fixedly connected with the storage box.

3. Advantageous effects

Compared with the prior art, the utility model has the advantages that:

according to the scheme, the intermittent uniform discharging is carried out on the semiconductor chip parts through the movable storage box, so that a plurality of semiconductor chip parts can be rapidly placed on a working platform for detecting the semiconductor chip parts at equal intervals in batches, and detection personnel can conveniently detect the semiconductor chip parts.

Drawings

FIG. 1 is a schematic structural diagram of embodiment 1 of the present utility model;

FIG. 2 is a schematic diagram of a horizontal discharging unit in embodiment 2 of the present utility model;

FIG. 3 is a schematic view of a horizontal discharging unit in embodiment 3 of the present utility model;

fig. 4 is a schematic diagram of a horizontal discharging unit in embodiment 4 of the present utility model.

The reference numerals in the figures illustrate:

1. a main support; 2. a transverse guide rail; 3. a moving trolley; 4. an electric push rod; 5. a connecting piece; 6. a storage box; 7. a discharge port; 8. a semiconductor chip member; 9. a horizontal discharging unit; 10. a small bracket; 11. a first wheel; 12. an extension groove; 13. a side frame; 14. a rotating shaft; 15. a transmission belt body; 16. a second wheel.

Detailed Description

The technical solutions in the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present utility model; it is apparent that the described embodiments are only some embodiments of the present utility model, not all embodiments, and that all other embodiments obtained by persons of ordinary skill in the art without making creative efforts based on the embodiments in the present utility model are within the protection scope of the present utility model.

Example 1:

referring to fig. 1-4, an intermittent discharging mechanism for testing semiconductor chips includes a horizontal moving support and a storage box 6 mounted on the horizontal moving support, wherein the horizontal moving support is used for driving the storage box 6 to move linearly, so that the storage box 6 can move along a straight line, a plurality of semiconductor chip pieces 8 are assembled in the storage box 6, the semiconductor chip pieces 8 are sequentially overlapped from top to bottom, a discharging hole 7 is formed in the lower part of two sides of the storage box 6, the semiconductor chip piece 8 at the lowest side can be discharged from the inside of the storage box 6 through the discharging hole 7, and a horizontal discharging unit 9 is assembled at the lower side of the storage box 6 for driving the semiconductor chip piece 8 at the lowest side to move horizontally;

at this time, when the semiconductor chip 8 is detected, the storage box 6 is driven to horizontally move by the horizontal moving support, the semiconductor chip 8 in the storage box 6 is discharged by the horizontal discharging unit 9 when the storage box 6 horizontally moves, a batch of semiconductor chip 8 is discharged after the storage box 6 moves for one section, the batch of semiconductor chip 8 is uniformly distributed along the linear direction, the detection personnel detects, and after the detection is finished, the storage box 6 is driven to horizontally move by the horizontal moving support again to discharge the next batch of semiconductor chip 8, so that a plurality of semiconductor chip 8 are discharged in a plurality of gaps respectively, and the detection personnel can conveniently detect the semiconductor chip;

in summary, in this embodiment, the semiconductor chip 8 is intermittently discharged at a constant speed through the movable storage box 6, so that a plurality of semiconductor chip 8 can be rapidly placed on a working platform used for detecting the semiconductor chip 8 at equal intervals in batches, so as to facilitate detection by a detector.

Example 2:

referring to fig. 1-2, the present embodiment discloses a horizontal discharging unit 9 based on embodiment 1, specifically, the horizontal discharging unit 9 includes a small bracket 10 fixedly connected to the lower side of the storage box 6, a first rotating wheel 11 is rotatably connected to the small bracket 10, an extension groove 12 is formed on the lower side of the storage box 6, the upper edge position of the first rotating wheel 11 extends to the inside of the storage box 6 through the extension groove 12 and abuts against the semiconductor chip 8 located on the lower side, at this time, when the storage box 6 moves horizontally, the first rotating wheel 11 is driven to move, and because the lower part of the first rotating wheel 11 abuts against the working platform, the first rotating wheel 11 rotates when moving horizontally, the first rotating wheel 11 pushes the semiconductor chip 8 when rotating, so that the semiconductor chip 8 discharges;

in the technical scheme, the first rotating wheel 11 is used as the horizontal discharging unit 9, the semiconductor chip piece 8 can be driven to rotate by the kinetic energy brought by the horizontal movement of the storage box 6, the running kinetic energy is reduced, and the structure is simpler and the generation cost is lower.

Example 3:

referring to fig. 1-3, the difference between the present embodiment and embodiment 2 is that the horizontal discharging unit 9 includes two side frames 13 fixedly connected to the lower side of the storage box 6, the two side frames 13 are rotatably connected with rotating shafts 14, the outer sides of the two rotating shafts 14 are equipped with a conveying belt body 15, the upper part of the conveying belt body 15 extends to the inside of the storage box 6 through the discharging hole 7, the lower part of the conveying belt body 15 is located at the lower side of the storage box 6, at this time, when the storage box 6 moves horizontally, the lower part of the conveying belt body 15 abuts against the working platform, and when it moves horizontally, the conveying belt body 15 moves at the outer sides of the two rotating shafts 14, so that the upper part of the conveying belt body 15 pushes the semiconductor chip 8, thereby completing the discharging of the semiconductor chip 8;

in this embodiment, the transmission belt body 15 with a larger contact area with the semiconductor chip 8 is selected to replace the first rotating wheel 11, so that the semiconductor chip 8 can be driven to move more stably, and the running stability of the semiconductor chip is improved.

Example 4:

referring to fig. 3-4, the difference between the present embodiment and embodiment 3 is that the two ends of the two rotating shafts 14 are fixedly connected with the second rotating wheels 16, at this time, the rotating shafts 14 can be driven to rotate by the rotation of the second rotating wheels 16, and the direct contact between the conveying belt body 15 and the working platform can be isolated by the arrangement of the second rotating wheels 16, so that the dust on the working platform attached to the conveying belt body 15 is avoided, and then the dust is attached to the semiconductor chip 8 again.

Example 5:

referring to fig. 1, the present embodiment discloses a structure of a horizontal moving support in detail based on the above embodiment, specifically, the horizontal moving support includes a main support 1, a transverse rail 2 is fixedly connected to an upper end of the main support 1, a moving trolley 3 connected to a storage box 6 is mounted on the transverse rail 2, and when the moving trolley 3 moves horizontally on the transverse rail 2, the storage box 6 can be driven to move horizontally, and a position of the storage box 6 is adjusted.

And, can be equipped with the electric putter 4 of vertical setting on the travelling car 3, the output fixedly connected with connecting piece 5 of electric putter 4, connecting piece 5 and the height of storing box 6 is stored to the setting adjustable through electric putter 4, when not needing the ejection of compact, directly rise and store box 6, let horizontal ejection of compact unit 9 no longer with work platform contact can.

The above description is only of the preferred embodiments of the present utility model; the scope of the utility model is not limited in this respect. Any person skilled in the art, within the technical scope of the present disclosure, may apply to the present utility model, and the technical solution and the improvement thereof are all covered by the protection scope of the present utility model.

Claims

1. The utility model provides a semiconductor chip test is with intermittent type feed mechanism, includes horizontal migration support, its characterized in that: install on the horizontal migration support and store box (6), the horizontal migration support is used for driving and stores box (6) and carry out linear movement, the inside of storing box (6) is equipped with a plurality of semiconductor chip spare (8) that overlap in proper order from last to lower, discharge gate (7) have all been seted up to the lower part of storing box (6) both sides, the downside of storing box (6) is equipped with horizontal ejection of compact unit (9).

2. The intermittent blanking mechanism for semiconductor chip testing as claimed in claim 1, wherein: the horizontal discharging unit (9) comprises a small support (10) fixedly connected to the lower side of the storage box (6), a first rotating wheel (11) is rotatably connected to the small support (10), an extension groove (12) is formed in the lower side of the storage box (6), and the upper edge position of the first rotating wheel (11) extends to the inside of the storage box (6) through the extension groove (12) and is abutted to a semiconductor chip piece (8) located on the lower side.

3. The intermittent blanking mechanism for semiconductor chip testing as claimed in claim 1, wherein: the horizontal discharging unit (9) comprises two side frames (13) fixedly connected to the lower side of the storage box (6), two rotating shafts (14) are respectively connected to the two side frames (13) in a rotating mode, a conveying belt body (15) is arranged on the outer side of each rotating shaft (14), the upper portion of each conveying belt body (15) extends to the inner portion of the storage box (6) through a discharging hole (7), and the lower portion of each conveying belt body (15) is located on the lower side of the storage box (6).

4. The intermittent blanking mechanism for semiconductor chip testing as claimed in claim 3, wherein: two ends of each rotating shaft (14) are fixedly connected with second rotating wheels (16).

5. An intermittent blanking mechanism for semiconductor chip testing according to any of claims 2-4, wherein: the horizontal moving support comprises a main support (1), the upper end of the main support (1) is fixedly connected with a transverse guide rail (2), and a moving trolley (3) connected with a storage box (6) is arranged on the transverse guide rail (2).

6. The intermittent blanking mechanism for semiconductor chip testing as claimed in claim 5, wherein: the movable trolley (3) is provided with an electric push rod (4) which is vertically arranged, the output end of the electric push rod (4) is fixedly connected with a connecting piece (5), and the connecting piece (5) is fixedly connected with a storage box (6).