CN218767005U

CN218767005U - Transformer inductance gauge height low temperature screening test device

Info

Publication number: CN218767005U
Application number: CN202220994945.XU
Authority: CN
Inventors: 毕浩晨; 王廷东; 李学凯; 李豪; 罗钰
Original assignee: State Run Factory 4326 of China Zhenhua Group Xinyun Electronic Comp and Dev Co Ltd
Current assignee: State Run Factory 4326 of China Zhenhua Group Xinyun Electronic Comp and Dev Co Ltd
Priority date: 2022-04-27
Filing date: 2022-04-27
Publication date: 2023-03-28
Anticipated expiration: 2032-04-27

Abstract

The utility model provides a transformer inductance gauge high-low temperature screening test device, which comprises a test box, a circuit board and a test seat; the testing device comprises a testing box, a circuit board, a testing seat, a jack, lead assemblies and a testing seat, wherein the circuit board is installed in the testing box, the testing seat is installed on the circuit board, the jack is processed on the testing seat and is in butt joint with contact pins of a transformer, the circuit board is provided with the lead assemblies, and the lead assemblies are connected with the testing seat to lead the contact pins of the transformer out of the testing box one by one through leads. The utility model discloses a test seat that the setting corresponds with the transformer contact pin to use the circuit board to be connected with the test seat, the installation lead wire on the circuit board, the test seat can install the transformer that awaits measuring fast, then draws the contact pin of transformer one by one through the lead wire, only needs to install the transformer on the test seat when making the test, has improved efficiency of software testing greatly.

Description

Transformer inductance gauge height low temperature screening test device

Technical Field

The utility model relates to a transformer inductance gauge height low temperature screening test device.

Background

As the application environment of the switching power supply is more and more severe, the switching power supply needs to be applied in a high-temperature environment and a low-temperature environment; the transformer for the switching power supply is also required to keep various electrical parameters stable and unchanged when being applied in a high-temperature environment and a low-temperature environment; therefore, in the production of the transformer, a process for testing the inductance in a high-temperature and low-temperature environment needs to be added.

Because the high and low temperature environment is realized in the closed box body, the product is required to be connected to an external instrument from the box body for testing, so that the contact pins of the transformer are required to be connected one by using the lead wires when the test is carried out at each time, time and labor are wasted, and the wiring stability of each contact pin cannot be ensured.

SUMMERY OF THE UTILITY MODEL

In order to solve the technical problem, the utility model provides a transformer inductance gauge height low temperature screening test device.

The utility model discloses a following technical scheme can realize.

The utility model provides a transformer inductance gauge high-low temperature screening test device, which comprises a test box, a circuit board and a test seat; the testing device comprises a testing box, a circuit board, a testing seat, a jack, a lead component and a transformer, wherein the circuit board is installed in the testing box, the testing seat is installed on the circuit board, the jack is processed on the testing seat and is in butt joint with a contact pin of the transformer, the circuit board is provided with the lead component, and the lead component is connected with the testing seat to lead out the contact pins of the transformer out of the testing box through leads one by one.

The testing box is characterized in that openings are formed in the upper end and one side face of the testing box, the openings in the side face of the testing box are sealed through side plates, threading holes are formed in the middle of the side plates, fixing grooves with the same height are formed in two inner walls, connected with the openings in the side faces, of the testing box, and the circuit board is installed in the fixing grooves.

Lead wire subassembly on the circuit board includes a plurality of groups of test holes, and the parallel length direction processing with the circuit board of every group test hole and perpendicular, every group test hole includes a circuit board shielding line hole and a n mounting hole and a n wiring hole, a n mounting hole divide into two rows of parallel, a n wiring hole sets up to two rows between two rows of mounting holes, and the wiring hole staggered arrangement in every row, mounting hole and wiring hole one-to-one just connect through a connecting wire respectively, are parallel to each other between a plurality of connecting wires, the mounting hole is used for the installation test seat.

The test seat is provided with n jacks, the jacks are through holes, connecting columns are installed at the lower ends of the n jacks, and the positions of the connecting columns are opposite to those of the same group of mounting holes and are inserted into the mounting holes.

The number of n is the connecting line.

And heat dissipation holes are processed at the bottom of the test box.

The beneficial effects of the utility model reside in that: through setting up the test socket that corresponds with the transformer contact pin to use the circuit board to be connected with the test socket, install the lead wire on the circuit board, the test socket can install the transformer that awaits measuring fast, then draws forth the contact pin of transformer one by one through the lead wire, only need install the transformer on the test socket during messenger's test, has improved efficiency of software testing greatly.

Drawings

Fig. 1 is a schematic structural diagram of the present invention;

FIG. 2 is a schematic structural diagram of the test box of the present invention;

FIG. 3 is a schematic view of the structure of the test socket of the present invention;

fig. 4 is a schematic diagram of the structure of the circuit board of the present invention;

in the figure: 1-test box, 2-circuit board, 21-mounting hole, 22-wiring hole, 23-shielding line hole, 24-connecting line, 3-test seat, 4-side plate, 5-fixing groove, 6-radiating hole, 7-threading hole, 8-connecting column and 9-jack.

Detailed Description

The technical solutions of the present invention are further described below, but the scope of protection claimed is not limited to the described ones.

The utility model provides a high low temperature screening test device of transformer inductance volume, includes the test circuit board portion and the test box that match each other, and the test circuit board is fixed in the test box, installs a plurality of test socket 3 on the test circuit board, and the test circuit board is connected with a plurality of test wire, inserts the tester through the test wire and accomplishes the product test.

The test circuit board part comprises a test circuit board, a test seat and a plurality of test wires, and the test circuit board 1 is provided with a mounting hole 21, a connecting hole 22, a shielding wire hole 23 and a connecting wire 24.

The bottom of the test box 1 is provided with a heat dissipation hole 6, the side plate 4 is provided with a threading hole 7, and the upper shell is provided with a test circuit board fixing groove 5.

The mounting holes 21 comprise 2 rows of 24 holes, each mounting hole is a through hole and is provided with a pad. 12 test sockets can be arranged on one circuit board.

The connecting hole 22 comprises 2 rows of 24 holes, each mounting hole is a through hole and is provided with a pad. When the testing lines are connected, the corresponding testing line connecting holes are connected according to the corresponding pins to be tested.

The number of the shielding wire holes is 24, and each test seat corresponds to 2 shielding wire holes.

As shown in FIG. 4, the cured sheet and the copper foil were laminated and molded to form a test circuit board 1 having a thickness of 2mm, a width of 140mm and a length of 300mm, and two rows of 12 mounting holes 21 each having a diameter of 1mm were formed by drilling and pad processing techniques, the upper and lower hole diameters being 2.54mm, the left and right sides being 15.24mm, and the pads having an inner diameter of 1mm and an outer diameter of 1mm

2mm; a shielding wire hole 22 with the diameter of 1mm is manufactured, and the inner diameter and the outer diameter of the welding disc are 1mm and 1mm respectively

2mm; manufacturing a connecting hole 23 with the diameter of 1.5mm, wherein the inner diameter of the welding disc is 1.5mm, and the outer diameter of the welding disc is 3mm; the mounting holes and the wiring holes are connected one by printing a connection block 24 of 2 ounce copper thick and 0.8mm wide.

As shown in fig. 3, 24 insertion holes 9 are processed on the test socket, the insertion holes 9 are formed in two rows as the mounting holes 21, the positions of the insertion holes 9 correspond to one another, a connection column 8 is fixed at the lower end of each insertion hole 9, and the connection column 8 is inserted into the mounting hole 21.

As shown in fig. 2, an aluminum alloy is manufactured into a test box 1 with a height of 27mm, a width of 145mm and a length of 300mm by a drilling and milling technology, a test circuit board fixing groove 5 with a groove width of 2mm is processed on two side walls of the test box, an inner square frame with a width of 125mm and a length of 270mm is manufactured by the drilling and milling technology, the inner square frame is convenient for exposing a test seat, 4 screw holes with a depth of 8M 4 are formed, and the surface treatment is wiredrawing black.

Adopt the drilling and milling technique to make 24 louvres 6 that width is 4mm, length is 25mm at the test box bottom to divide three rows of arrangements equally, 4 screw rod holes that the degree of depth of M4 is 8, and surface treatment is the wire drawing black.

Manufacturing the aluminum alloy into a side plate 4 with the thickness of 2mm, the width of 54mm and the length of 145mm by a drilling and milling technology; and is provided with a connecting wire leading-out hole 7 with the diameter of 25mm, 4 screw holes with the diameter of 4.5mm, and the surface treatment is wire drawing black.

The transformer inductance high and low temperature screening test method comprises the following steps:

(1) Calibrating and resetting the inductance tester, and connecting the ground wire on the inductance tester with the total point of all shielding wires of the device;

(2) Inserting the product to be tested into the corresponding pin position on the test socket 3, and checking that the product on all the test sockets is well contacted with the test sockets;

(3) Then the testing device with the product is placed in a high-low temperature box;

(4) And sequentially inserting the copper sheets on the test wire into the zero-cleared inductance tester clamp according to the number to perform inductance testing.

Claims

1. The utility model provides a high low temperature screening testing arrangement of transformer inductance volume, includes test box (1), circuit board (2), test seat (3), its characterized in that: the testing device is characterized in that the circuit board (2) is installed in the testing box (1), the testing seat (3) is installed on the circuit board (2), the insertion holes (9) and the insertion pins of the transformer are processed on the testing seat (3) in butt joint, the circuit board (2) is provided with the lead assemblies, and the lead assemblies are connected with the testing seat (3) to lead the insertion pins of the transformer out of the testing box (1) through the leads one by one.

2. The transformer inductance high and low temperature screening test device according to claim 1, characterized in that: the utility model discloses a test box, including test box (1), curb plate (4), fixed slot (5), circuit board (2), curb plate (4), fixed slot (5) are all processed to the middle part processing of curb plate (4), test box (1) upper end and a side are provided with the opening, and the opening of its side is sealed through curb plate (4), all process on two inner walls of test box (1) rather than the side opening is connected with the co-altitude, install in fixed slot (5) circuit board (2).

3. The transformer inductance high and low temperature screening test device according to claim 2, characterized in that: lead wire subassembly on circuit board (2) includes a plurality of groups test hole, and the parallel and perpendicular length direction processing with circuit board (2) of every group test hole, every group test hole include circuit board (2) a shielding line hole (23) and a mounting hole (21) and a wiring hole (22) of n, a mounting hole (21) divide into two rows that are parallel, a wiring hole (22) sets up to two rows between two rows of mounting holes (21), and wiring hole (22) staggered arrangement in every row, mounting hole (21) and wiring hole (22) one-to-one just connect through a connecting wire (24) respectively, are parallel to each other between a plurality of connecting wires (24), mounting hole (21) are used for installation test seat (3).

4. The transformer inductance high and low temperature screening test device according to claim 3, characterized in that: processing has n jack (9) on test seat (3), and jack (9) are the through-hole, and spliced pole (8) are all installed to the lower extreme of n jack (9), and the position of spliced pole (8) is relative with the position of installing hole (21) of organizing together and inserts in installing hole (21).

5. The transformer inductance high and low temperature screening test device according to claim 3 or 4, characterized in that: the number of n is 24.

6. The transformer inductance high and low temperature screening test device according to claim 1, characterized in that: and a heat dissipation hole (6) is machined in the bottom of the test box (1).