CN220543062U - Ageing test backup pad and ageing test equipment - Google Patents
Ageing test backup pad and ageing test equipment Download PDFInfo
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- CN220543062U CN220543062U CN202321758561.9U CN202321758561U CN220543062U CN 220543062 U CN220543062 U CN 220543062U CN 202321758561 U CN202321758561 U CN 202321758561U CN 220543062 U CN220543062 U CN 220543062U
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- 238000012360 testing method Methods 0.000 title claims abstract description 100
- 230000032683 aging Effects 0.000 title claims abstract description 40
- 230000003014 reinforcing effect Effects 0.000 claims abstract description 23
- 239000000758 substrate Substances 0.000 claims abstract description 20
- 238000003825 pressing Methods 0.000 claims abstract description 8
- 238000000034 method Methods 0.000 claims description 5
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 238000003780 insertion Methods 0.000 claims description 2
- 230000037431 insertion Effects 0.000 claims description 2
- 230000017525 heat dissipation Effects 0.000 abstract description 11
- 230000002035 prolonged effect Effects 0.000 abstract description 3
- 230000000694 effects Effects 0.000 description 3
- 238000004806 packaging method and process Methods 0.000 description 3
- 229910000838 Al alloy Inorganic materials 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 230000035882 stress Effects 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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Abstract
The utility model discloses a burn-in test support plate and burn-in test equipment, the burn-in test support plate comprises: the base plate is used for supporting the aging test board, the supporting surface of the base plate is provided with a plurality of concave cavities which are mutually spaced, reinforcing ribs are arranged in each concave cavity, the reinforcing ribs are connected with the cavity walls of the concave cavities, the other surface of the base plate, which is away from the supporting surface, is provided with a plurality of radiating holes, and each radiating hole penetrates through the supporting surface and is communicated with at least one concave cavity. According to the aging test supporting plate, the plurality of concave cavities which are spaced from each other are formed in the supporting surface of the substrate, and the reinforcing ribs are arranged in each concave cavity, so that the strength and the rigidity of the aging test supporting plate can be enhanced, the supporting strength of the aging test plate is further enhanced, the mechanical deformation of the aging test plate caused by the pressing of the manipulator is reduced, and the service life of the aging test plate is prolonged; and a plurality of heat dissipation holes are formed in the other surface, deviating from the supporting surface, of the substrate, and each heat dissipation hole is communicated with at least one concave cavity, so that the heat dissipation capacity of the aging test board is improved.
Description
Technical Field
The utility model relates to the field of chip testing, in particular to an aging test supporting plate and aging test equipment.
Background
Along with the popularization of intelligence and the continuous growth of the semiconductor market, the chip has been widely applied to electronic products such as intelligent wearing, mobile phones, vehicle-mounted electronics, desktop computers and the like. In addition, the miniaturization of electronic products has led to the trend of higher integration of chips along with moore's law, and smaller packaging area ratio is pursued in chip packaging, i.e. more chips can be placed in unit area.
However, the closely connected chips generate larger heat power consumption under high-density packaging, so that the temperature of the electronic product is rapidly increased, and the reliability of the electronic components is greatly reduced due to high temperature, thereby causing the failure of the electronic product.
In order to ensure the reliability of the chip, the chip is usually required to be subjected to burn-in test by using a burn-in board in the process from design to production so as to ensure the reliability of the chip. Currently, in the burn-in process of chips, a support plate is generally used to support a burn-in board for burn-in. When the burn-in test is performed, the burn-in test board is subjected to high-frequency mechanical arm pressing, however, the long-time pressing can lead to deformation of the burn-in test board to shorten the service life of the burn-in test board due to insufficient supporting strength of the supporting board; in addition, a large amount of heat generated by the chip and the burn-in board cannot be timely dissipated and is accumulated continuously, so that the burn-in board is overheated and damaged.
Disclosure of Invention
The utility model mainly aims to provide an aging test supporting plate, which aims to solve the technical problems that the prior aging test plate is short in service life and poor in heat dissipation effect and is easy to damage.
To achieve the above object, the present utility model provides a burn-in test support plate, comprising:
the base plate is used for supporting the aging test board, the supporting surface of the base plate is provided with a plurality of cavities which are mutually spaced, each cavity is internally provided with a reinforcing rib, the reinforcing ribs are connected with the cavity wall of the cavity, the other surface of the base plate, which is away from the supporting surface of the base plate, is provided with a plurality of radiating holes, and each radiating hole penetrates through the supporting surface and is at least communicated with one cavity.
In some embodiments, the support surface of the substrate is configured with a plurality of first support bars and a plurality of second support bars, the first support bars are arranged in parallel at intervals, the extending direction of the first support bars is different from that of the second support bars, and the first support bars and the second support bars are mutually intersected to form a plurality of concave cavities.
In some embodiments, the reinforcing ribs are a plurality;
wherein a plurality of the reinforcing ribs are arranged in a crossing way; alternatively, a plurality of the reinforcing ribs are arranged in parallel.
In some embodiments, further comprising:
the two limiting parts are respectively located at two opposite sides of the base plate and detachably connected with the base plate, and extend along the length direction of the base plate respectively and are used for limiting the burn-in test board.
In some embodiments, a plurality of clamping grooves are formed in each of the two limiting members, one end of each of the plurality of first supporting bars is in one-to-one correspondence with one of the plurality of clamping grooves of one of the limiting members, and the other end of each of the plurality of first supporting bars is in one-to-one correspondence with one of the plurality of clamping grooves of the other one of the limiting members.
In some embodiments, the two limiting members are respectively provided with a slot extending along the length direction of the limiting members, and the slots are used for correspondingly inserting two sides of the burn-in board.
In some embodiments, the substrate is a heat dissipating metal plate.
In some embodiments, a pull handle is also provided on the base plate.
The utility model also provides an aging test device, comprising:
the burn-in test board is provided with a plurality of chip test seats, and the chip test seats are used for installing chips to be tested; the method comprises the steps of,
the burn-in test support plate as described above, wherein the burn-in test plate is placed on the burn-in test support plate.
In some embodiments, the burn-in test apparatus further comprises:
and the manipulator is used for pressing the chip test seat.
According to the aging test supporting plate, the plurality of concave cavities which are mutually spaced are arranged on the supporting surface of the substrate, and the reinforcing ribs are arranged in each concave cavity, so that the strength and the rigidity of the aging test supporting plate can be enhanced, the supporting strength of the aging test plate is further enhanced, the mechanical deformation of the aging test plate caused by the pressing of a mechanical arm is reduced, and the service life of the aging test plate is prolonged; and set up a plurality of louvres at the another side that the base plate deviates from its holding surface, every louvre communicates with a cavity at least, makes the air of test incubator get into ageing test backup pad through the louvre, and then fully contacts with ageing test board bottom, strengthens ageing test board's convection heat dissipation to take away the heat on the ageing test board, thereby improves ageing test board's heat dispersion.
Drawings
FIG. 1 is a schematic view of a burn-in support plate according to an embodiment of the present utility model;
FIG. 2 is a schematic view of the burn-in support plate of the embodiment of FIG. 1 from another perspective;
FIG. 3 is a schematic diagram of a burn-in apparatus according to an embodiment of the utility model.
Detailed Description
The following description of the embodiments of the present utility model will be made more clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the utility model. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
It should be noted that all directional indicators (such as up, down, left, right, front, and rear … …) in the embodiments of the present utility model are merely used to explain the relative positional relationship, movement, etc. between the components in a particular posture (as shown in the drawings), and if the particular posture is changed, the directional indicator is changed accordingly.
It will also be understood that when an element is referred to as being "mounted" or "disposed" on another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present.
Furthermore, the description of "first," "second," etc. in this disclosure is for descriptive purposes only and is not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions of the embodiments may be combined with each other, but it is necessary to base that the technical solutions can be realized by those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should be considered to be absent and not within the scope of protection claimed in the present utility model.
The present utility model proposes a burn-in test support plate 100, referring to fig. 1 to 3, comprising:
the substrate 110 is used for supporting the burn-in board 200, the supporting surface of the substrate 110 is provided with a plurality of cavities 111 which are spaced from each other, each cavity 111 is internally provided with a reinforcing rib 111a, the reinforcing ribs 111a are connected with the cavity walls of the cavities 111, the other surface of the substrate 110, which is away from the supporting surface, is provided with a plurality of heat dissipation holes 112, and each heat dissipation hole 112 penetrates through the supporting surface and is communicated with at least one cavity 111.
In this embodiment, the supporting surface of the substrate 110 is used for contacting with the burn-in board 200, the cavity wall of the cavity 111 includes a cavity side wall and a cavity bottom wall, both of which are connected with the reinforcing ribs 111a, so as to reduce deformation caused by stress on the edge of the cavity 111, alternatively, the shape of the cavity 111 may be rectangular or square, and may be set according to practical situations. Each concave cavity 111 corresponds to the vertical stress direction area of the test seat of the burn-in board 200, and each heat dissipation hole 112 is at least communicated with one concave cavity 111, so that air of the test incubator is fully contacted with the bottom of the burn-in board 200 through the heat dissipation holes 112, and the heat convection performance of the burn-in board 200 is improved.
The aging test supporting plate 100 is used for supporting the aging test plate 200, and by arranging a plurality of cavities 111 which are mutually spaced on the supporting surface of the substrate 110, and arranging the reinforcing ribs 111a in each cavity 111, the strength and rigidity of the aging test supporting plate 100 can be enhanced, and the supporting strength of the aging test plate 200 can be further enhanced, so that the mechanical deformation of the aging test plate 200 caused by the pressing of a mechanical arm can be reduced, and the service life of the aging test plate 200 can be prolonged; and, set up a plurality of louvres 112 at the another side that base plate 110 deviates from its holding surface, every louvre 112 communicates with a cavity 111 at least, makes the air of test incubator get into ageing test backup pad 100 through louvre 112, and then fully contacts with ageing test board 200 bottom, strengthens ageing test board 200's convection heat dissipation to take away the heat on the ageing test board 200, thereby improves ageing test board 200's heat dispersion.
In some embodiments, referring to fig. 1, a plurality of first support bars 113 and a plurality of second support bars 114 are configured on a support surface of the base plate 110, the first support bars 113 and the second support bars 114 are arranged in parallel at intervals, an extending direction of the first support bars 113 is different from an extending direction of the second support bars 114, and the plurality of first support bars 113 and the plurality of second support bars 114 cross each other to form a plurality of cavities 111.
In this embodiment, the first supporting strips 113 and the second supporting strips 114 are configured on the supporting surface of the substrate 110, which plays a role in supporting the burn-in board 200, and the plurality of first supporting strips 113 and the plurality of second supporting strips 114 intersect each other to form a plurality of cavities 111.
In some embodiments, the reinforcing ribs 111a are a plurality;
wherein, a plurality of reinforcing ribs 111a are arranged crosswise; alternatively, a plurality of reinforcing ribs 111a are arranged in parallel.
In this embodiment, the plurality of reinforcing ribs 111a are connected to each other or are parallel to each other, so that the structural strength of the burn-in test support plate 100 is further enhanced, the overall compressive strength of the burn-in test support plate 100 is improved, the deformation of the burn-in test support plate 100 is reduced, and the efficient use of the burn-in test support plate 100 is ensured. Alternatively, the extending direction of the reinforcing ribs 111a may be a lateral direction, a longitudinal direction, or an oblique direction, and may be set according to practical situations.
In some embodiments, referring to fig. 1 and 2, further comprising:
the two limiting pieces 120 are respectively located at two opposite sides of the substrate 110 and detachably connected with the substrate 110, and the two limiting pieces 120 are respectively arranged along the length direction of the substrate 110 in an extending manner and are used for limiting the burn-in board 200.
In this embodiment, the two limiting members 120 are provided to limit and fix the burn-in board 200, so as to prevent the burn-in board 200 from being offset or swaying during use and affecting the normal use thereof. Alternatively, the two limiting members 120 may be connected to the base plate 110 by a threaded connection, a snap connection, or the like, which is not limited in this embodiment and is set according to practical situations.
In some embodiments, a plurality of slots (not shown) are disposed on each of the two limiting members 120, one end of the plurality of first supporting bars 113 is in one-to-one correspondence with the plurality of slots of one of the limiting members 120, and the other end of the plurality of first supporting bars 113 is in one-to-one correspondence with the plurality of slots of the other limiting member 120.
In this embodiment, the number of the clamping slots is multiple, one end of the first supporting strips 113 is inserted into the clamping slots of one of the limiting members 120 in a one-to-one correspondence manner, and the other end of the first supporting strips 113 is inserted into the clamping slots of the other limiting member 120 in a one-to-one correspondence manner, so that the limiting members 120 are stably connected with the substrate 110, wherein the shape of the clamping slots can be set according to practical situations, and the limitation is not made herein.
In some embodiments, each of the two limiting members 120 has a slot (not shown) extending along a length direction thereof for corresponding insertion of two sides of the burn-in board 200.
In this embodiment, one end of the slot is a closed end, the other end is an open end into which the burn-in board 200 can be inserted or withdrawn, and when the burn-in board 200 is mounted, the burn-in board 200 is inserted from the open end of the slot until one end of the burn-in board 200 abuts against the closed end of the slot, so as to complete the mounting, and limit the burn-in board 200 in the vertical direction; when the burn-in board 200 needs to be removed, the burn-in board 200 is withdrawn from the open end of the insert to complete the removal.
In some embodiments, the substrate 110 is a heat dissipating metal plate.
In this embodiment, during the burn-in test, the heat of the burn-in board 200 is transferred to the substrate 110, and the heat is dissipated from the substrate 110. Preferably, the material of bottom plate is aluminum alloy, and aluminum alloy has good heat conductivity, helps realizing quick heat dissipation, promotes the radiating effect.
In some embodiments, referring to fig. 1 and 2, a handle 115 is provided on the base plate 110.
In this embodiment, when performing the burn-in test, the burn-in test board 200 is placed on the burn-in test support board 100, the burn-in test support board 100 is pushed into the test incubator by the handle 115, and after the test is completed, the burn-in test support board 100 is pulled out of the test incubator by the handle 115, so that the user can push and pull the burn-in test support board 100 conveniently.
The utility model also proposes an aging test apparatus, referring to fig. 3, comprising:
the burn-in board 200, the burn-in board 200 is provided with a plurality of chip test sockets 210, and the chip test sockets 210 are used for mounting chips to be tested; the method comprises the steps of,
as in the burn-in support plate 100 described above, the burn-in board 200 is placed on the burn-in support plate 100.
In this embodiment, the specific structure of the burn-in test support plate 100 refers to the above embodiment, and since the present burn-in test apparatus adopts all the technical solutions of all the above embodiments, at least all the technical effects brought by the technical solutions of the above embodiments are provided, and will not be described in detail herein.
Specifically, the burn-in apparatus includes the burn-in board 200 and the burn-in support board 100 as described above, wherein the burn-in test is a die to be burn-in test soldered or connected to a dedicated wiring board for burn-in test including high temperature and high humidity, double 85 test, and the like.
In some embodiments, the burn-in test apparatus further comprises:
a manipulator (not shown) for pressing the chip test socket 210.
In this embodiment, when performing burn-in test, the chip to be tested is placed on the chip test seat 210 of the burn-in board 200, then the burn-in board 200 is placed on the burn-in supporting board 100, and then the test incubator is pushed by the handle 115, and the chip test seat 210 is pressed by the manipulator in the incubator to start the test of the chip to be tested.
The above description of the preferred embodiments of the present utility model should not be taken as limiting the scope of the utility model, but rather should be understood to cover all modifications, variations and adaptations of the present utility model using its general principles and the following detailed description and the accompanying drawings, or the direct/indirect application of the present utility model to other relevant arts and technologies.
Claims (10)
1. A burn-in test support plate, comprising:
the base plate is used for supporting the aging test board, the supporting surface of the base plate is provided with a plurality of cavities which are mutually spaced, each cavity is internally provided with a reinforcing rib, the reinforcing ribs are connected with the cavity wall of the cavity, the other surface of the base plate, which is away from the supporting surface of the base plate, is provided with a plurality of radiating holes, and each radiating hole penetrates through the supporting surface and is at least communicated with one cavity.
2. The burn-in support plate of claim 1 wherein a plurality of first support bars and a plurality of second support bars are configured on the support surface of the substrate in parallel and spaced apart, the first support bars extending in a different direction than the second support bars, the plurality of first support bars intersecting the plurality of second support bars to define a plurality of the cavities.
3. The burn-in support plate of claim 1 or 2, wherein the reinforcing ribs are plural;
wherein a plurality of the reinforcing ribs are arranged in a crossing way; alternatively, a plurality of the reinforcing ribs are arranged in parallel.
4. The burn-in support plate of claim 2, further comprising:
the two limiting parts are respectively located at two opposite sides of the base plate and detachably connected with the base plate, and extend along the length direction of the base plate respectively and are used for limiting the burn-in test board.
5. The burn-in support plate of claim 4, wherein a plurality of clamping grooves are formed in each of the two limiting members, one end of each of the plurality of first support bars is in one-to-one correspondence with the plurality of clamping grooves of one of the limiting members, and the other end of each of the plurality of first support bars is in one-to-one correspondence with the plurality of clamping grooves of the other of the limiting members.
6. The burn-in board of claim 4, wherein each of said stoppers has a slot extending along a length thereof for receiving a corresponding insertion of each of two sides of the burn-in board.
7. The burn-in support plate of claim 1 wherein the substrate is a heat-dissipating metal plate.
8. The burn-in support plate of claim 1 wherein the base plate is provided with a pull handle.
9. A burn-in apparatus, comprising:
the burn-in test board is provided with a plurality of chip test seats, and the chip test seats are used for installing chips to be tested; the method comprises the steps of,
the burn-in support plate of any one of claims 1-8, said burn-in test plate being placed on said burn-in support plate.
10. The burn-in apparatus of claim 9, further comprising:
and the manipulator is used for pressing the chip test seat.
Priority Applications (1)
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CN202321758561.9U CN220543062U (en) | 2023-07-05 | 2023-07-05 | Ageing test backup pad and ageing test equipment |
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Application Number | Priority Date | Filing Date | Title |
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CN202321758561.9U CN220543062U (en) | 2023-07-05 | 2023-07-05 | Ageing test backup pad and ageing test equipment |
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CN220543062U true CN220543062U (en) | 2024-02-27 |
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CN202321758561.9U Active CN220543062U (en) | 2023-07-05 | 2023-07-05 | Ageing test backup pad and ageing test equipment |
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- 2023-07-05 CN CN202321758561.9U patent/CN220543062U/en active Active
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