CN217931920U

CN217931920U - Testing arrangement of chip package

Info

Publication number: CN217931920U
Application number: CN202220746317.XU
Authority: CN
Inventors: 文伟峰; 郭达文; 贾涛; 刘智; 梁世超; 王海文
Original assignee: Jiangxi Redboard Technology Co Ltd
Current assignee: Jiangxi Redboard Technology Co Ltd
Priority date: 2022-04-01
Filing date: 2022-04-01
Publication date: 2022-11-29
Anticipated expiration: 2032-04-01

Abstract

A testing device for chip packaging comprises a workbench, a bearing component, a transmission component, a positioning component and a detection component; the worktable is provided with a transmission groove, the transmission assembly is arranged in the transmission groove, the positioning assembly is arranged at two sides of the notch of the transmission groove, and the detection assembly is erected above the transmission groove; the bearing assembly comprises a bearing table, a plurality of bearing plates, a lifting column and a spring, the bearing table is clamped on the transmission assembly, a plurality of bearing grooves are formed in the upper end of the bearing table, lifting holes are formed in the bottoms of the bearing grooves, the bearing plates are embedded in the bearing grooves, the lifting column is fixed to the lower end of the bearing plates, and the spring and the lifting column are sequentially embedded in the lifting holes. The utility model designs the elastically contractible bearing component, so that the test probe can exert the buffering effect when abutting against the chip, thereby greatly avoiding the problem of probe breakage or chip damage caused by overlarge force applied by the test probe; the utility model discloses the practicality is strong, has stronger popularization meaning.

Description

Testing device for chip packaging

Technical Field

The utility model relates to a semiconductor package field especially relates to a testing arrangement of chip package.

Background

The electronic chip is a miniature electronic device or component, and is made up by adopting a certain technological process, and the components of transistor, resistor, capacitor and inductor, etc. and wiring which are required in a circuit are interconnected together, and made into a small-sized semiconductor chip or medium substrate, then packaged in a tube shell so as to obtain the invented miniature structure with the required circuit function.

The semiconductor chip detection device is mainly applied to the test of semiconductor industry, photoelectric industry, integrated circuits and packaging. The method is widely applied to the research and development of precise electrical measurement of complex and high-speed devices, and aims to ensure the quality and reliability of the devices and reduce the research and development time and the cost of the device manufacturing process. In the chip detection device in the prior art, a chip is placed on an object placing plate in a detection process, and a probe is in contact with the chip and applies a certain acting force to the chip. The test probe is thin, the chip volume is small, the stress is small, the probe is easy to break, the chip can be damaged, the product yield is reduced, and the production cost is high.

SUMMERY OF THE UTILITY MODEL

In view of the foregoing, it is desirable to provide a testing apparatus for chip package.

A testing device for chip packaging comprises a workbench, a bearing assembly, a transmission assembly, a positioning assembly and a detection assembly. The worktable is provided with a transmission groove, the transmission assembly is arranged in the transmission groove, the positioning assembly is arranged on two sides of the notch of the transmission groove, and the detection assembly is arranged above the transmission groove. The bearing assembly comprises a bearing table, a plurality of bearing plates, a lifting column and a spring, the bearing table is clamped on the transmission assembly, a plurality of bearing grooves are formed in the upper end of the bearing table, lifting holes are formed in the bottoms of the bearing grooves, the bearing plates are embedded in the bearing grooves, the lifting column is fixed to the lower end of the bearing plates, and the spring and the lifting column are sequentially embedded in the lifting holes.

Furthermore, the bearing component further comprises a jacking rotating shaft, the jacking rotating shaft comprises a shaft lever, a knob and a plurality of gears, the gears are arranged on the shaft lever in a penetrating mode at intervals, the shaft lever transversely penetrates through the bearing table, one end of the shaft lever extends out of the outer side of the bearing table, and the knob is arranged at one end, extending out of the outer side of the bearing table, of the shaft lever. One side of the lifting column is in a wave-shaped tooth-shaped design, and the gear is meshed with one side of the lifting column.

Furthermore, the lower end of the bearing plate is also provided with a plurality of auxiliary alignment posts, the bottom of the bearing groove is provided with a plurality of alignment holes, and the auxiliary alignment posts are correspondingly embedded in the alignment holes.

Furthermore, the transmission assembly comprises a transmission rod and a transmission platform, the transmission rod is arranged in the transmission groove, and the transmission platform is arranged on the transmission rod and can slide along the direction of the transmission rod. The upper end of the transmission platform is provided with a fixed groove, and the bearing assembly is clamped in the fixed groove. The two sides of the transmission table are also provided with auxiliary sliding blocks, the inner sides of the transmission grooves are correspondingly provided with sliding grooves, and the auxiliary sliding blocks are embedded in the sliding grooves.

Furthermore, the locating component comprises two elastic telescopic devices which are symmetrically designed, and each elastic telescopic device comprises a fixed seat and a telescopic rod. The fixing seat is arranged on two sides of the notch of the transmission groove, and the telescopic rod is arranged on one side of the fixing seat and can elastically stretch out and draw back. The side surface of the bearing table is correspondingly provided with a positioning groove, a plurality of positioning holes are arranged at the bottom of the positioning groove at intervals, and one end of the telescopic rod can be abutted against the positioning groove and can be embedded in the positioning holes.

Further, the detection assembly comprises a support frame, a plurality of telescopic arms and a test probe, the support frame is erected on the workbench, the upper ends of the telescopic arms are fixed on the support frame, and the test probe is fixed at the lower ends of the telescopic arms.

To sum up, the utility model relates to a testing arrangement of chip package's beneficial effect lies in: by designing the elastically contractible bearing component, the test probe exerts a buffering effect when abutting against the chip, and the problem of probe breakage or chip damage caused by overlarge force applied by the test probe is greatly avoided; the jacking rotating shaft on the bearing assembly is convenient for jacking and taking out the chip which is borne and clamped in the bearing groove; the auxiliary alignment column on the bearing plate can keep the bearing plate smooth, the auxiliary sliding block of the transmission table is matched with the sliding groove to keep the transmission table smooth and not inclined, the auxiliary alignment column and the sliding groove jointly ensure that a borne chip keeps smooth and is tested, and the test reliability is enhanced; the positioning assembly is convenient for vertically positioning the chip on the bearing assembly and the test probe, so that the detection positioning efficiency is improved; the utility model discloses the practicality is strong, has stronger popularization meaning.

Drawings

Fig. 1 is a schematic structural diagram of a testing apparatus for chip packaging according to the present invention;

FIG. 2 is a schematic view of the structure of the working table of FIG. 1;

FIG. 3 is an exploded view of the carrier assembly of FIG. 1;

FIG. 4 is a schematic structural view of a jacking spindle in the bearing assembly;

FIG. 5 is an enlarged view of the portion A in FIG. 3;

FIG. 6 is an enlarged schematic view of the portion B in FIG. 3;

FIG. 7 is a schematic view of the transmission assembly of FIG. 1;

FIG. 8 is a schematic view of the structure of the elastic expansion device in the positioning assembly;

fig. 9 is a schematic structural diagram of the detection assembly in fig. 1.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention will be further described in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the invention.

As shown in fig. 1 to 9, the present invention provides a testing apparatus 100 for chip package, which includes a worktable 10, a carrying assembly 20, a transmission assembly 30, a positioning assembly 40, and a detecting assembly 50. The worktable 10 is provided with a transmission groove 11, the transmission assembly 30 is arranged in the transmission groove 11, the positioning assembly 40 is arranged at two sides of a notch of the transmission groove 11, and the detection assembly 50 is arranged above the transmission groove 11.

The bearing assembly 20 includes a bearing table 21, a plurality of bearing plates 22, a lifting column 23 and a spring 24, the bearing table 21 is clamped on the transmission assembly 30, the upper end of the bearing table is provided with a plurality of bearing grooves 211, the bottom of the bearing grooves 211 is provided with a lifting hole 212, the bearing plates 22 are embedded in the bearing grooves 211, the lifting column 23 is fixed at the lower end of the bearing plates 22, and the spring 24 and the lifting column 23 are sequentially embedded in the lifting hole 212. The spring 24 is disposed under the carrier plate 22, and when the detecting assembly 50 applies downward pressure to the chip, the carrier plate 22 will also achieve a buffering effect due to the elastic reduction.

The bearing assembly 20 further includes a jacking shaft 25, the jacking shaft 25 includes a shaft 251, a knob 252 and a plurality of gears 253, the plurality of gears 253 are disposed on the shaft 251 at intervals, the shaft 251 transversely penetrates the bearing table 21 and has one end extending outside the bearing table 21, and the knob 252 is mounted on one end of the shaft 251 extending outside the bearing table 21. One side of the lifting column 23 is designed in a wave-shaped tooth shape, and the gear 253 is meshed with one side of the lifting column 23. When the chip needs to be taken out from the carrying groove 211 after the test is finished, the knob 252 is rotated to drive the lifting column 23 to ascend through the gear 253 linked with the knob, so that the carrying plate 22 and the chip on the carrying plate 22 are both ejected, and the chip can be conveniently taken out from the carrying assembly 20.

The lower end of the bearing plate 22 is further provided with a plurality of auxiliary alignment posts 26, the bottom of the bearing groove 211 is provided with a plurality of alignment holes 213, and the plurality of auxiliary alignment posts 26 are correspondingly embedded in the plurality of alignment holes 213. The auxiliary alignment posts 26 distributed at four corners of the lower end of the bearing plate 22 are limited by the alignment holes 213 and can only vertically lift, and accordingly, the bearing plate 22 is always kept horizontal and not inclined in the lifting process.

The transmission assembly 30 includes a transmission rod 31 and a transmission platform 32, the transmission rod 31 is installed in the transmission groove 11, and the transmission platform 32 is installed on the transmission rod 31 and can slide along the direction of the transmission rod 31. The upper end of the transmission table 32 is provided with a fixing groove 321, and the bearing assembly 20 is clamped in the fixing groove 321. The two sides of the transmission table 32 are further provided with auxiliary sliding blocks 322, the inner side of the transmission groove 11 is correspondingly provided with a sliding groove 12, and the auxiliary sliding blocks 322 are embedded in the sliding groove 12. The auxiliary sliding blocks 322 on both sides of the transmission table 32 are limited by the sliding grooves 12, so that the transmission table 32 is not inclined in the horizontal transmission process.

The positioning assembly 40 includes two elastic telescopic devices 41 designed symmetrically, and the elastic telescopic device 41 includes a fixing base 411 and a telescopic rod 412. The fixing base 411 is installed at both sides of the slot opening of the transmission slot 11, and the extension rod 412 is installed at one side of the fixing base 411 and can elastically extend and retract. The side surface of the bearing table 21 is correspondingly provided with a positioning slot 214, the bottom of the positioning slot 214 is provided with a plurality of positioning holes 215 at intervals, and one end of the telescopic rod 412 can be abutted against the positioning slot 214 and can be embedded in the positioning holes 215. When drive assembly 30 drove plummer 21 horizontal slip, the one end of telescopic link 412 supports and pushes up in constant head tank 214 and slides in constant head tank 214 simultaneously, when accepting the chip of test to be located detection subassembly 50 in bearing groove 211 under, telescopic link 412 slides to locating hole 215 department just, then telescopic link 412 gomphosis carries on spacingly to plummer 21 in locating hole 215, drive assembly 30 stop work simultaneously to realize accurate positioning effect.

The detection assembly 50 comprises a support frame 51, a plurality of telescopic arms 52 and a test probe 53, wherein the support frame 51 stands on the workbench 10, the upper ends of the telescopic arms 52 are fixed on the support frame 51, and the test probe 53 is fixed at the lower ends of the telescopic arms 52. During detection, the telescopic arm 52 extends downwards to drive the test probe 53 to abut against a chip to be tested for testing, and the test probe can automatically rise and reset after the testing is finished.

When the utility model is used, the chip is firstly placed on the bearing plate 22 of the bearing component 20, and the bearing component 20 is embedded on the transmission component 30. Then, the transmission assembly 30 is started to move horizontally to move the chip to be detected to a position right below the detection assembly 50, at this time, the positioning assembly 40 performs limit locking on the bearing table 21, and the transmission assembly 30 stops working. Then the testing probe 53 moves downwards to test the chip, after the test is finished, the detecting component 50 is lifted and reset, the positioning component 40 is also retracted and reset, and the transmission component 30 starts to work again. Finally, after all the chips on the carrier assembly 20 are tested, the carrier assembly 20 is taken out from the transmission table 32, the knob 252 at the side of the carrier table 21 is rotated to raise the carrier plate 22 to eject the chips out of the carrier slots 211, and then all the chips are taken down.

To sum up, the utility model relates to a chip package's testing arrangement 100's beneficial effect lies in: by designing the elastically contractible bearing component 20, the test probe 53 exerts a buffering effect when abutting against the chip, and the problem of probe breakage or chip damage caused by overlarge force applied by the test probe 53 is greatly avoided; the lifting rotating shaft 25 on the bearing assembly 20 is convenient for lifting and taking out the chip carried and clamped in the bearing groove 211; the auxiliary alignment posts 26 on the carrier plate 22 can keep the carrier plate 22 flat, and the auxiliary sliding blocks 322 of the transmission table 32 are matched with the sliding grooves 12 to keep the transmission table 32 flat and not inclined, so that the two ensure that the chip to be carried is kept flat and tested, and the reliability of the test is enhanced; the positioning assembly 40 facilitates the up-and-down positioning of the chip on the bearing assembly 20 and the test probe 53, and improves the detection positioning efficiency; the utility model discloses the practicality is strong, has stronger popularization meaning.

The above-described embodiments only represent one embodiment of the present invention, and the description thereof is more specific and detailed, but not to be construed as limiting the scope of the invention. It should be noted that, for those skilled in the art, without departing from the concept of the present invention, several variations and modifications can be made, which all fall within the scope of the present invention. Therefore, the protection scope of the utility model should be subject to the appended claims.

Claims

1. A testing device for chip packaging is characterized in that: comprises a workbench, a bearing component, a transmission component, a positioning component and a detection component; the worktable is provided with a transmission groove, the transmission assembly is arranged in the transmission groove, the positioning assembly is arranged at two sides of the notch of the transmission groove, and the detection assembly is erected above the transmission groove; the bearing assembly comprises a bearing platform, a plurality of bearing plates, a lifting column and a spring, the bearing platform is clamped on the transmission assembly, a plurality of bearing grooves are formed in the upper end of the bearing platform, lifting holes are formed in the bottoms of the bearing grooves, the bearing plates are embedded in the bearing grooves, the lifting column is fixed to the lower end of the bearing plates, and the spring and the lifting column are sequentially embedded in the lifting holes.

2. The apparatus for testing a chip package according to claim 1, wherein: the bearing assembly further comprises a jacking rotating shaft, the jacking rotating shaft comprises a shaft lever, a knob and a plurality of gears, the gears are arranged on the shaft lever at intervals in a penetrating mode, the shaft lever transversely penetrates through the bearing table, one end of the shaft lever extends out of the outer side of the bearing table, and the knob is arranged at one end, extending out of the outer side of the bearing table, of the shaft lever; one side of the lifting column is in a wave-shaped tooth-shaped design, and the gear is meshed with one side of the lifting column.

3. The apparatus for testing a chip package according to claim 1, wherein: the lower end of the bearing plate is also provided with a plurality of auxiliary alignment posts, the bottom of the bearing groove is provided with a plurality of alignment holes, and the auxiliary alignment posts are correspondingly embedded in the alignment holes.

4. The apparatus for testing a chip package according to claim 1, wherein: the transmission assembly comprises a transmission rod and a transmission platform, the transmission rod is arranged in the transmission groove, and the transmission platform is arranged on the transmission rod and can slide along the direction of the transmission rod; a fixed groove is formed in the upper end of the transmission table, and the bearing assembly is clamped in the fixed groove; the two sides of the transmission table are also provided with auxiliary sliding blocks, the inner sides of the transmission grooves are correspondingly provided with sliding grooves, and the auxiliary sliding blocks are embedded in the sliding grooves.

5. The apparatus for testing a chip package according to claim 1, wherein: the positioning assembly comprises two elastic telescopic devices which are symmetrically designed, and each elastic telescopic device comprises a fixed seat and a telescopic rod; the fixed seat is arranged on two sides of the notch of the transmission groove, and the telescopic rod is arranged on one side of the fixed seat and can elastically stretch; the side surface of the bearing table is correspondingly provided with a positioning groove, a plurality of positioning holes are arranged at the bottom of the positioning groove at intervals, and one end of the telescopic rod can be abutted against the positioning groove and can be embedded in the positioning holes.

6. The apparatus for testing a chip package according to claim 1, wherein: the detection assembly comprises a support frame, a plurality of telescopic arms and a test probe, the support frame is erected on the workbench, the upper ends of the telescopic arms are fixed on the support frame, and the test probe is fixed at the lower ends of the telescopic arms.