CN217157724U - Clamping and fixing device for testing flash memory chip - Google Patents
Clamping and fixing device for testing flash memory chip Download PDFInfo
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- CN217157724U CN217157724U CN202220951032.XU CN202220951032U CN217157724U CN 217157724 U CN217157724 U CN 217157724U CN 202220951032 U CN202220951032 U CN 202220951032U CN 217157724 U CN217157724 U CN 217157724U
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Abstract
The utility model discloses a press from both sides tight fixing device for flash memory chip test relates to flash memory chip test technical field. The utility model discloses a testing arrangement body and a plurality of extrusion mechanism, the testing arrangement body is including the layer board support, the layer board support is including placing the notch, smooth notch and interior notch have all been seted up to both sides wall and bottom in the standing groove, install down the stripper plate in the standing groove, limiting plate and side stripper plate, the limiting plate, side stripper plate one end all includes the contact site, the extrusion mechanism is including the stripper rod, the sliding plate, extrusion spring and a set of dead lever, the mounting groove has been seted up on a sliding plate surface, sliding plate opposite surface and stripper rod fixed mounting, the sliding plate both ends suit with a set of dead lever size, sliding plate and a set of dead lever sliding connection, lower stripper plate, limiting plate and side stripper plate and a plurality of extrusion mechanism fixed mounting. The utility model discloses rock the displacement when avoiding the flash memory chip to place, and lead to can not keeping the question of good contact and subsequent encapsulation qualification rate of influence.
Description
Technical Field
The utility model belongs to the technical field of the test of flash memory chip, especially, relate to a press from both sides tight fixing device for test of flash memory chip.
Background
The flash memories are also of different types, which are mainly divided into two types, namely NOR type and NAND type, and the NAND flash memory bare chip detection needs to be electrified one by one to simulate the environment after packaging, test whether the performance of the NAND flash memory bare chip meets the packaging requirements, meet the required good products, and pick out the NAND flash memory bare chip for next packaging, so that the manufacturing cost is avoided being wasted. During testing, on a computer provided with testing software, the pin card is connected through a USB cable and supplies power to the pin card, after the pin card which is used as a main body and is provided with a PCB (printed circuit board) of a main control chip is electrified, a working environment which only lacks a NAND flash memory is simulated, at the moment, a probe which is as thin as hair on the pin card is used to be in contact with each pad on a wafer, a complete data storage system is formed, the pin card acts on the main control through the software, signals can be input and output to the connected wafer, whether the functions and the performance of the chip meet the requirements of design specifications or not is judged, and the wafer is judged to be good or defective through the software output result. Some chip testing devices that have now are not convenient for fix the flash memory chip, when placing the flash memory chip, can lead to the flash memory chip to rock the displacement if the standing groove mouth is too big, thereby lead to not keeping good contact, thereby influence subsequent encapsulation qualification rate, consequently, propose a tight fixing device of clamp for flash memory chip test, solve above-mentioned problem.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a press from both sides tight fixing device for flash memory chip test solves some current chip testing arrangement and is not convenient for fix the flash memory chip, leads to the flash memory chip to rock the displacement if the standing groove mouth is too big, thereby leads to not keeping good contact, thereby influences the problem of subsequent encapsulation qualification rate.
In order to solve the technical problem, the utility model discloses a realize through following technical scheme:
the utility model discloses a press from both sides tight fixing device for test of flash memory chip, including testing arrangement body and a plurality of extrusion mechanism, the testing arrangement body is including the pallet frame, the pallet frame is including placing the notch, smooth notch and interior notch have all been seted up to the inside wall of placing the notch and bottom, install stripper plate, limiting plate and side stripper plate down in the placing the notch, limiting plate, side stripper plate one end all include the contact site.
The extrusion rod is located the spout mouth, the extrusion rod suits with spout mouth size, extrusion rod and spout mouth sliding connection.
The extrusion mechanism comprises an extrusion rod, a sliding plate, an extrusion spring and a group of fixed rods, wherein one surface of the sliding plate is provided with a mounting groove, the other surface of the sliding plate is fixedly mounted with the extrusion rod, and the extrusion spring is mounted in the mounting groove.
The fixed rods are located in the inner groove, the two ends of the sliding plate are matched with the fixed rods in size, and the sliding plate is connected with the fixed rods in a sliding mode.
Lower stripper plate, limiting plate and side stripper plate and a plurality of extrusion mechanism fixed mounting, limiting plate, side stripper plate are located the intraoral both sides wall of standing groove, the stripper plate is located the notch infrabasal portion of placing down, cooperates through limiting plate and lower stripper plate through extrusion mechanism for flash memory chip carries out spacing fixed from top to bottom when being located the standing groove intraorally, and through the cooperation of side stripper plate and extrusion mechanism, it is fixed to make flash memory chip carry out the level when being located the standing groove intraorally, avoids flash memory chip displacement can influence the problem of normal test.
The utility model discloses following beneficial effect has:
the utility model discloses a set up extrusion mechanism, lower stripper plate, side stripper plate and limiting plate, cooperate through extrusion mechanism through limiting plate and lower stripper plate for the flash memory chip is spacing fixed about lieing in the standing groove intraoral time, through side stripper plate and the cooperation of extrusion mechanism, makes the flash memory chip carry out the level when lieing in the standing groove intraoral time and fix, thereby rocks the displacement when avoiding the flash memory chip to place, and leads to can not keep good contact and the problem of influencing subsequent encapsulation qualification rate.
Of course, it is not necessary for any particular product to achieve all of the above-described advantages at the same time.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a general schematic view of a clamping fixture for testing a flash memory chip according to the present invention;
FIG. 2 is a schematic side view of the clamping fixture for testing flash memory chips of the present invention;
FIG. 3 is a schematic sectional view taken along line A-A of FIG. 2;
FIG. 4 is an enlarged view of a portion A of FIG. 1;
FIG. 5 is a partial enlarged view of portion B of FIG. 3;
fig. 6 is a partially enlarged view of a portion C of fig. 5.
In the drawings, the components represented by the respective reference numerals are listed below:
1. a testing device body; 2. a pallet frame; 3. placing the notch; 4. a lower stripper plate; 5. a limiting plate; 6. a side stripper plate; 7. a contact portion; 8. an extrusion mechanism; 9. a chute opening; 10. an inner notch; 11. an extrusion stem; 12. a sliding plate; 13. mounting grooves; 14. a compression spring; 15. and (5) fixing the rod.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art without creative efforts belong to the protection scope of the present invention.
In the description of the present invention, it should be understood that the terms "upper", "middle", "outer", "inner", and the like indicate orientation or positional relationship only for convenience of description and simplicity of description, but do not indicate or imply that the components or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the invention.
Please refer to fig. 1-6, the utility model relates to a press from both sides tight fixing device for test of flash memory chip, including testing arrangement body 1 and a plurality of extrusion mechanism 8, testing arrangement body 1 is including holding in the palm grillage 2, and holding in the palm grillage 2 is including placing notch 3, and place notch 3 interior both sides wall and bottom and all seted up spout opening 9 and interior notch 10, places and install stripper plate 4, limiting plate 5 and side stripper plate 6 down in the notch 3, and limiting plate 5, side stripper plate 6 one end all include contact site 7.
The extrusion mechanism 8 comprises an extrusion rod 11, a sliding plate 12, an extrusion spring 14 and a group of fixing rods 15, wherein a mounting groove 13 is formed in one surface of the sliding plate 12, the other surface of the sliding plate 12 is fixedly mounted with the extrusion rod 11, the two ends of the sliding plate 12 are matched with the size of the group of fixing rods 15, the sliding plate 12 is slidably connected with the group of fixing rods 15, the group of fixing rods 15 are located in the inner groove opening 10, and the extrusion spring 14 is located in the mounting groove 13 for mounting.
The extrusion rod 11 is positioned in the chute opening 9, the extrusion rod 11 is matched with the chute opening 9 in size, and the extrusion rod 11 is connected with the chute opening 9 in a sliding mode.
As shown in fig. 1 to 6, the present embodiment is a method for using a clamping fixture for testing a flash memory chip: before the test, place the flash memory chip that will need the test on limiting plate 5 and side stripper plate 6, then through extruding flash memory chip and contact site 7, make limiting plate 5 and side stripper plate 6 all inside movement, and place the flash memory chip in place on the lower stripper plate 4 in notch 3, continue to press down the flash memory chip, make stripper plate 4 extrusion down, place back in limiting plate 5 when the flash memory chip, limiting plate 5 breaks away from the extrusion simultaneously, thereby carry out spacing fixed to the flash memory chip, stripper plate 4 resets simultaneously and presss from both sides the fastening and fixes to the flash memory chip.
In the description herein, references to the description of "one embodiment," "an example," "a specific example," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
The preferred embodiments of the present invention disclosed above are intended only to help illustrate the present invention. The preferred embodiments are not intended to be exhaustive or to limit the invention to the precise embodiments disclosed. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and its practical applications, to thereby enable others skilled in the art to best understand the invention for and utilize the invention. The present invention is limited only by the claims and their full scope and equivalents.
Claims (7)
1. A press from both sides tight fixing device for flash memory chip test, including testing arrangement body (1) and a plurality of extrusion mechanism (8), its characterized in that: testing arrangement body (1) is including holding in the palm grillage (2), holding in the palm grillage (2) is including placing notch (3), place notch (3) interior both sides wall and bottom and all seted up spout opening (9) and interior notch (10), place and install stripper plate (4) down, limiting plate (5) and side stripper plate (6) in notch (3), limiting plate (5), side stripper plate (6) one end all include contact site (7).
2. The clamping and fixing device for testing the flash memory chip according to claim 1, wherein the pressing mechanism (8) comprises a pressing rod (11), a sliding plate (12), a pressing spring (14) and a set of fixing rods (15), one surface of the sliding plate (12) is provided with a mounting groove (13), and the other surface of the sliding plate (12) and the pressing rod (11) are fixedly mounted.
3. The clamping fixture for testing flash memory chips as defined in claim 2, wherein said sliding plate (12) has two ends adapted to a set of fixing bars (15), said sliding plate (12) being slidably connected to said set of fixing bars (15).
4. The clamping and fixing device for testing the flash memory chip according to claim 2, wherein the lower extrusion plate (4), the limiting plate (5), the side extrusion plate (6) and the plurality of extrusion mechanisms (8) are fixedly installed, the limiting plate (5) and the side extrusion plate (6) are located on two inner side walls of the placing notch (3), and the lower extrusion plate (4) is located on the bottom of the placing notch (3).
5. The clamping fixture for testing flash memory chips as recited in claim 2, wherein said pressing rod (11) is located in said chute opening (9), said pressing rod (11) and said chute opening (9) are sized, and said pressing rod (11) and said chute opening (9) are slidably connected.
6. The clamping fixture for testing flash memory chips as defined in claim 2, wherein said set of said fastening bars (15) are each located within an inner notch (10).
7. The clamping fixture for testing flash memory chips as defined in claim 2, wherein said compression spring (14) is mounted in a mounting groove (13).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN202220951032.XU CN217157724U (en) | 2022-04-24 | 2022-04-24 | Clamping and fixing device for testing flash memory chip |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN202220951032.XU CN217157724U (en) | 2022-04-24 | 2022-04-24 | Clamping and fixing device for testing flash memory chip |
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CN217157724U true CN217157724U (en) | 2022-08-09 |
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CN202220951032.XU Active CN217157724U (en) | 2022-04-24 | 2022-04-24 | Clamping and fixing device for testing flash memory chip |
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- 2022-04-24 CN CN202220951032.XU patent/CN217157724U/en active Active
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