CN216696556U

CN216696556U - Chip testing device convenient to peg graft

Info

Publication number: CN216696556U
Application number: CN202123011603.6U
Authority: CN
Inventors: 黄毅
Original assignee: Suzhou Easy Electronic Technology Co ltd
Current assignee: Suzhou Easy Electronic Technology Co ltd
Priority date: 2021-12-02
Filing date: 2021-12-02
Publication date: 2022-06-07
Anticipated expiration: 2031-12-02

Abstract

The utility model discloses a chip testing device convenient for plugging, which comprises a placing seat and a plugging assembly, wherein side plates are arranged on two sides of the upper end of the placing seat close to the edges, a feeding conveying belt is arranged on the left side of the upper end of the placing seat, a discharging conveying belt is arranged on the right side of the upper end of the placing seat, and a transferring assembly for transferring chips is arranged on the upper portion of the inner side of each side plate. This chip testing arrangement convenient to peg graft has automatic unloading function of going up, do not need the staff manual to go on, when guaranteeing chip grafting precision, guarantee this chip testing arrangement to the efficiency of software testing of chip, can carry out continuity test work to the chip, through the grafting structure of centre gripping formula, make the chip can not take place the displacement in the testing process, guarantee the precision of chip test, can carry out the regulation that corresponds the structure according to the chip specification of actual test, make this chip testing arrangement be applicable to the chip test work of different specifications.

Description

Chip testing device convenient to peg graft

Technical Field

The utility model relates to the technical field of chip testing, in particular to a chip testing device convenient to plug.

Background

Chips, which are a way to miniaturize circuits, including mainly semiconductor devices and also passive components, in electronics, are often manufactured on the surface of a semiconductor wafer, where initial system-on-chip testing is designed. The basis of SoC is a deep submicron process, so a brand new method is needed for testing Soc devices. Because each functional element has its own test requirement, a design engineer must make a test plan at the initial stage of design, and a chip testing device is needed to perform detailed tests on the chip in order to ensure that each performance of the chip reaches an index in the production process of the microprocessor chip.

The chip testing device in the market is not convenient for plugging a chip, cannot ensure the stability of the chip in the testing process, and influences the testing result of the chip.

SUMMERY OF THE UTILITY MODEL

The present invention is directed to a chip testing device convenient for plugging, so as to solve the problems mentioned in the background art.

In order to achieve the purpose, the utility model provides the following technical scheme: a chip testing device convenient for plugging comprises a placing seat and a plugging assembly, wherein two sides of the upper end of the placing seat are provided with side plates close to the edges, the left side of the upper end of the placing seat is provided with a feeding conveying belt, the right side of the upper end of the placing seat is provided with a blanking conveying belt, the upper part of the inner side of each side plate is provided with a transferring assembly for transferring chips, the central position of the inner side of the placing seat is provided with a servo motor, the upper end of the servo motor is connected with a bearing rotary table, the plugging assembly for testing the chips is arranged at the upper end of the bearing rotary table, the plugging assembly comprises a limiting frame, a limiting slide rail, a limiting slide block, a clamping block, a driving cylinder and a rubber layer, two sides of the inner part of the limiting frame are provided with limiting slide rails, the outer sides of the limiting slide rails are connected with the limiting slide blocks, the other sides of the limiting slide blocks are connected with the clamping blocks, and one sides of the clamping blocks are connected with the driving cylinder, the other side of the clamping block is provided with a rubber layer, a chip testing seat is arranged at the center of the bottom of the inner side of the limiting frame, and fastening bolts penetrate through four corners of the chip testing seat.

Preferably, the transfer assembly comprises a guide transverse rail, a first X-axis driving block, a stroke cylinder, a sucker, an infrared sensor and a second X-axis driving block, the left side of the upper end of the guide transverse rail is connected with the first X-axis driving block, the center of the lower end of the first X-axis driving block is connected with the stroke cylinder, the lower end of the stroke cylinder is connected with the sucker, the infrared sensor is arranged on two sides of the outside of the first X-axis driving block, and the right side of the upper end of the guide transverse rail is connected with the second X-axis driving block.

Preferably, first X axle drive block is sliding connection with the horizontal rail of direction, and infrared sensor is provided with two about the central point symmetry of first X axle drive block to the vertical axis of first X axle drive block, stroke cylinder and sucking disc coincides mutually.

Preferably, the second X-axis driving block and the first X-axis driving block are distributed in parallel, and the shape structure of the second X-axis driving block is consistent with the shape structure of the first X-axis driving block.

Preferably, the bearing rotary disc and the placing seat are distributed in parallel, and the bearing rotary disc is in rotary connection with the placing seat through a servo motor.

Preferably, the limiting frames are equidistantly distributed at the upper end of the bearing turntable, and the limiting frames are provided with four limiting frames.

Preferably, the two limiting sliding blocks are symmetrically arranged at the center of the clamping block, and the clamping block is in sliding connection with the limiting frame through the limiting sliding blocks, the limiting sliding rails and the driving cylinders.

Preferably, the outer side of the rubber layer is attached to the inner side of the clamping block, and the rubber layer is connected with the clamping block in an embedded mode.

Preferably, the central point of the chip test seat coincides with the central point of the limiting frame, and the chip test seat is in threaded connection with the limiting frame through a fastening bolt.

The utility model provides a chip testing device convenient for plugging, which has the following beneficial effects: the chip testing device convenient for plugging has an automatic feeding and discharging function, does not need to be manually carried out by workers, ensures the testing efficiency of the chip testing device on the chip while ensuring the plugging precision of the chip, can carry out continuity testing work on the chip, ensures that the chip cannot displace in the testing process through a clamping type plugging structure, thereby ensuring the testing precision of the chip, can carry out adjustment of a corresponding structure according to the specification of the chip to be tested, ensures that the chip testing device is suitable for the chip testing work of different specifications, and improves the actual application range of the chip testing device;

1. according to the utility model, through the transfer assembly arranged at the upper part of the inner side of the side plate, the loading conveyer belt and the unloading conveyer belt which are arranged on the left side and the right side of the upper end of the placing seat are matched, the effect of automatically loading and unloading chips is realized, the infrared sensors arranged at two sides of the outer part of the first X-axis driving block can monitor the position of the chip conveyed at the upper end of the loading conveyer belt, when the chip is detected to be conveyed to the position below the first X-axis driving block, the stroke cylinder drives the sucker to carry out adsorption clamping on the chip, and the chip is matched with the first X-axis driving block to drive the chip to carry out X-axis linear movement along the guide transverse rail, the chip is placed at the upper end of the chip testing seat to wait for testing work, and the second X-axis driving block and the first X-axis driving block which are consistent in shape and structure are convenient for later maintenance work.

2. According to the chip testing device, the accuracy of the positions between the bearing rotary table and the placing seat can be ensured through the bearing rotary table and the placing seat which are distributed in a parallel manner, the rotary bearing rotary table is driven by the servo motor to rotate, and the four inserting components are arranged at the upper end of the bearing rotary table in a matching manner, so that the chip testing device can carry out chip continuity testing work, the actual testing efficiency of the chip testing device is improved, the automation degree of the chip testing device is higher in a matching manner through the arrangement of the transferring components, the manual operation of workers is reduced, and the safety of the chip testing device in the working process is ensured.

3. The chip testing device comprises a clamping block, a driving cylinder, a limiting slide rail, a rubber layer, a chip clamping seat, a chip clamping screw, a clamping bolt, a clamping block, a chip clamping screw, a clamping block and a chip clamping screw, wherein the clamping block is arranged at the two ends of the clamping block, the limiting slide rail is arranged at the two sides in the limiting frame in a matching mode, the clamping block can keep linear movement on the horizontal linear position under the driving of the driving cylinder, so that the clamping block can accurately clamp the chip placed at the clamping position of the chip on the upper end of the chip testing seat and the clamping firmness of the clamping block is guaranteed, the stability in the chip testing process is guaranteed, the accuracy of the chip testing is guaranteed, the rubber layer is arranged on one side of the clamping block, the friction force between the clamping block and the chip is improved, the chip clamping stability of the chip is improved, and the chip testing seat connected with the limiting frame through the fastening bolt is convenient to replace the chip testing seat with the corresponding type according to the size of the chip to be tested actually used, so that the best actual using effect is achieved.

Drawings

FIG. 1 is a schematic diagram of an overall structure of a chip testing device convenient for plugging according to the present invention;

FIG. 2 is a schematic top view of a supporting turntable of a chip testing apparatus convenient for plugging;

FIG. 3 is an enlarged schematic view of the chip testing device convenient for plugging at the point A in FIG. 2;

fig. 4 is a schematic view of a three-dimensional structure of a clamping block of a chip testing device convenient for plugging.

In the figure: 1. placing a seat; 2. a side plate; 3. a feeding conveyer belt; 4. blanking a conveying belt; 5. a transfer assembly; 501. a guide cross rail; 502. a first X-axis drive block; 503. a stroke cylinder; 504. a suction cup; 505. an infrared sensor; 506. a second X-axis drive block; 6. a servo motor; 7. a load bearing turntable; 8. a plug-in assembly; 801. a limiting frame; 802. a limiting slide rail; 803. a limiting slide block; 804. a clamping block; 805. a driving cylinder; 806. a rubber layer; 9. a chip test socket; 10. and fastening the bolt.

Detailed Description

Referring to fig. 1-4, the present invention provides a technical solution: a chip testing device convenient for plugging comprises a placing seat 1 and a plugging component 8, wherein two sides of the upper end of the placing seat 1 are provided with side plates 2 close to the edges, the left side of the upper end of the placing seat 1 is provided with a feeding conveyer belt 3, the right side of the upper end of the placing seat 1 is provided with a blanking conveyer belt 4, the upper part of the inner side of each side plate 2 is provided with a transferring component 5 for transferring chips, the central position of the inner side of the placing seat 1 is provided with a servo motor 6, the upper end of the servo motor 6 is connected with a bearing turntable 7, the plugging component 8 for testing the chips is arranged at the upper end of the bearing turntable 7, the plugging component 8 comprises a limiting frame 801, a limiting slide rail 802, a limiting slide block 803, a clamping block 804, a driving cylinder 805 and a rubber layer 806, two sides of the inner part of the limiting slide rail 801 are provided with limiting slide rails 802, the outer side of the limiting slide rail 802 is connected with a limiting slide block 803, the other side of the limiting slide block 803 is connected with the clamping block 804, a driving cylinder 805 is connected to one side of the clamping block 804, a rubber layer 806 is arranged on the other side of the clamping block 804, a chip test seat 9 is arranged at the center of the bottom of the inner side of the limiting frame 801, and fastening bolts 10 penetrate through four corners of the chip test seat 9;

the chip testing device has the advantages that the accuracy of positions between the bearing rotary table 7 and the placing seat 1 which are distributed in a parallel mode can be guaranteed, the bearing rotary table 7 which is driven to rotate by the servo motor 6 is matched with the four inserting components 8 arranged at the upper end of the bearing rotary table 7, so that the chip testing device can carry out chip continuity testing work, the actual testing efficiency of the chip testing device is improved, the automation degree of the chip testing device is higher due to the matching of the arrangement of the transferring component 5, manual operation of workers is reduced, and the safety of the chip testing device in the working process is guaranteed;

referring to fig. 1, the transfer assembly 5 includes a transverse guide rail 501, a first X-axis driving block 502, a stroke cylinder 503, a suction cup 504, an infrared sensor 505, and a second X-axis driving block 506, the left side of the upper end of the transverse guide rail 501 is connected with the first X-axis driving block 502, the center of the lower end of the first X-axis driving block 502 is connected with the stroke cylinder 503, the lower end of the stroke cylinder 503 is connected with the suction cup 504, the infrared sensor 505 is disposed on two sides of the outer portion of the first X-axis driving block 502, the right side of the upper end of the transverse guide rail 501 is connected with the second X-axis driving block 506, the first X-axis driving block 502 is connected with the transverse guide rail 501 in a sliding manner, the infrared sensors 505 are symmetrically disposed about the center of the first X-axis driving block 502, the vertical central axes of the first X-axis driving block 502, the stroke cylinder 503 and the suction cup 504 are coincident, the second X-axis driving block 506 is distributed in a parallel manner with the first X-axis driving block 502, and the shape structure of the second X-axis driving block 506 is identical to the shape structure of the first X-axis driving block 502;

the automatic chip loading and unloading device is characterized in that the transferring assembly 5 is arranged on the upper portion of the inner side of the side plate 2, the transferring assembly is matched with the loading conveyer belt 3 and the unloading conveyer belt 4 which are arranged on the left side and the right side of the upper end of the placing seat 1, the automatic chip loading and unloading effect is achieved, the infrared sensors 505 arranged on the two sides of the outer portion of the first X-axis driving block 502 can monitor the position of a chip conveyed by the upper end of the loading conveyer belt 3, when the chip conveyed to the position below the first X-axis driving block 502 is detected, the stroke cylinder 503 drives the sucker 504 to adsorb and clamp the chip, the chip is matched with the first X-axis driving block 502 to drive the chip to linearly move along the guide transverse rail 501, the chip is placed on the upper end of the chip testing seat 9 to wait for testing, and the second X-axis driving block 506 and the first X-axis driving block 502 which are consistent in shape and structure are convenient for later maintenance;

referring to fig. 2-4, the bearing rotary table 7 and the placing base 1 are distributed in parallel, the bearing rotary table 7 is rotationally connected with the placing base 1 through the servo motor 6, the limit frames 801 are equidistantly distributed at the upper end of the bearing rotary table 7, four limit frames 801 are arranged, two limit slide blocks 803 are symmetrically arranged about the center position of the clamp block 804, the clamp block 804 is in sliding connection with the limit frame 801 through the limit slide blocks 803, the limit slide rails 802 and the driving cylinders 805, the outer side of the rubber layer 806 is attached to the inner side of the clamp block 804, the rubber layer 806 is connected with the clamp block 804 in an embedded manner, the center point of the chip test base 9 is overlapped with the center point of the limit frame 801, and the chip test base 9 is in threaded connection with the limit frame 801 through the fastening bolts 10;

the operation is as follows, the limiting slide blocks 803 arranged at two ends of the clamping block 804 are provided, the limiting slide rails 802 arranged on two sides inside the limiting frame 801 are matched, so that the clamping block 804 can keep linear movement in the horizontal line position under the driving of the driving cylinder 805, the firmness of the clamping block 804 for accurate core and clamping placed at the chip clamping position at the upper end of the chip testing seat 9 is ensured, the stability in the chip testing process is ensured, the accuracy of chip testing is ensured, the rubber layer 806 arranged on one side of the clamping block 804 is provided, the friction force between the clamping block 804 and the chip is improved, the stability of chip clamping is improved, the chip testing seat 9 connected with the limiting frame 801 through the fastening bolt 10 is improved, the chip testing seat 9 corresponding to the model is convenient to replace according to the size of the actually tested chip, and the best actual use effect is achieved.

In summary, when the chip testing device convenient for plugging is used, firstly, the chip is conveyed by the feeding conveyer belt 3, the infrared sensors 505(HL500B type) arranged at two sides outside the first X-axis driving block 502 can monitor the chip position conveyed at the upper end of the feeding conveyer belt 3, when the chip is detected to be conveyed below the first X-axis driving block 502, the stroke cylinder 503 drives the suction cup 504 to adsorb and clamp the chip, and the chip is driven by the first X-axis driving block 502 to perform X-axis linear movement along the guide cross rail 501, the chip is placed at the upper end of the chip testing seat 9(LGA60 type) to perform testing operation, the limiting sliders 803 arranged at two ends of the clamp block 804 are matched with the limiting slide rails 802 arranged at two sides inside the limiting frame 801, so that the clamp block 804 can keep linear movement at the horizontal linear position under the driving of the driving cylinder 805, thereby ensuring the accuracy of the clamp block 804 on the chip clamping position at the upper end of the chip testing seat 9 and the clamped position of the chip and ensuring the clamped chip The fastness, guarantee the stability among the chip test process, thereby guarantee the accuracy of chip test, the rubber layer 806 of setting in clamp splice 804 one side, promote the frictional force between clamp splice 804 and the chip, advance one and promote the stability of chip centre gripping, accomplish the grafting back of chip, servo motor 6 drives and bears carousel 7 and carries out clockwise rotation, and bear carousel 7 rotation angle at every turn and be 90 degrees, then carry out the grafting work of next chip, the chip of test is accomplished through chip test seat 9, it is rotatory to second X axle drive block 506 left side, transport it to unloading conveyer belt 4 upper end through second X axle drive block 506 and carry.

Claims

1. The utility model provides a chip testing arrangement convenient to peg graft, a serial communication port, including arrangement seat (1) and grafting subassembly (8), the upper end both sides of arrangement seat (1) are close to the edge and are provided with curb plate (2), and the upper end left side of arrangement seat (1) is provided with material loading conveyer belt (3), the upper end right side of arrangement seat (1) is provided with unloading conveyer belt (4), the inboard upper portion of curb plate (2) is provided with transport subassembly (5) that are used for the chip to transport, the inboard central point of arrangement seat (1) puts and settles servo motor (6), and the upper end of servo motor (6) is connected with bears carousel (7), is used for the chip test grafting subassembly (8) set up in the upper end of bearing carousel (7), and grafting subassembly (8) including spacing frame (801), spacing slide rail (802), spacing slider (803), clamp splice (804), Drive actuating cylinder (805) and rubber layer (806), the inside both sides of spacing frame (801) are provided with spacing slide rail (802), and the outside of spacing slide rail (802) is connected with limiting slide block (803), the opposite side of limiting slide block (803) links up and has connect clamp splice (804), and one side of clamp splice (804) is connected with and drives actuating cylinder (805), the opposite side of clamp splice (804) is provided with rubber layer (806), the inboard bottom central point of spacing frame (801) puts and is provided with chip test socket (9), and fastening bolt (10) are worn to be equipped with in the four corners of chip test socket (9).

2. The chip testing device convenient to plug in according to claim 1, wherein the transfer assembly (5) comprises a guide transverse rail (501), a first X-axis driving block (502), a stroke cylinder (503), a suction cup (504), an infrared sensor (505) and a second X-axis driving block (506), the left side of the upper end of the guide transverse rail (501) is connected with the first X-axis driving block (502), the center position of the lower end of the first X-axis driving block (502) is connected with the stroke cylinder (503), the lower end of the stroke cylinder (503) is connected with the suction cup (504), the infrared sensor (505) is arranged on two outer sides of the first X-axis driving block (502), and the right side of the upper end of the guide transverse rail (501) is connected with the second X-axis driving block (506).

3. The chip testing device convenient to plug in according to claim 2, wherein the first X-axis driving block (502) is connected with the guide cross rail (501) in a sliding manner, two infrared sensors (505) are symmetrically arranged about the center of the first X-axis driving block (502), and the vertical central axes of the first X-axis driving block (502), the stroke cylinder (503) and the suction cup (504) are coincident.

4. The chip testing device convenient for plugging according to claim 2, wherein the second X-axis driving block (506) is distributed in parallel with the first X-axis driving block (502), and the shape structure of the second X-axis driving block (506) is consistent with the shape structure of the first X-axis driving block (502).

5. The chip testing device convenient to plug in according to claim 1, wherein the bearing rotary table (7) is distributed in parallel with the placing base (1), and the bearing rotary table (7) is rotationally connected with the placing base (1) through a servo motor (6).

6. The chip testing device convenient to plug in is characterized in that the limiting frames (801) are equidistantly distributed at the upper end of the bearing turntable (7), and four limiting frames (801) are arranged.

7. The chip testing device convenient to plug in according to claim 1, wherein two limiting sliding blocks (803) are symmetrically arranged about the center of the clamping block (804), and the clamping block (804) is in sliding connection with the limiting frame (801) through the limiting sliding blocks (803), the limiting sliding rails (802) and the driving cylinders (805).

8. The chip testing device convenient for plugging according to claim 1, wherein the outer side of the rubber layer (806) is attached to the inner side of the clamping block (804), and the rubber layer (806) is embedded and connected with the clamping block (804).

9. The chip testing device convenient to plug in is characterized in that the central point of the chip testing seat (9) coincides with the central point of the limiting frame (801), and the chip testing seat (9) is in threaded connection with the limiting frame (801) through the fastening bolt (10).