CN216670187U

CN216670187U - Integrated circuit test support plate

Info

Publication number: CN216670187U
Application number: CN202123013193.9U
Authority: CN
Inventors: 郑�和
Original assignee: Shenzhen Jingyao Microelectronics Technology Co ltd
Current assignee: Shenzhen Jingyao Microelectronics Technology Co ltd
Priority date: 2021-12-03
Filing date: 2021-12-03
Publication date: 2022-06-03
Anticipated expiration: 2031-12-03

Abstract

The utility model discloses an integrated circuit test carrier plate, which comprises a test carrier plate, an aluminum oxide plate, a slide rail, a heat dissipation fin, a pull plate and a press plate, wherein the aluminum oxide plate is embedded in the top of the test carrier plate, the slide rail is respectively installed on two sides of the top of the test carrier plate through bolts, the slide rail is connected with the slide block in a sliding manner, a slot is formed in the top of the slide block in a penetrating manner, the pull plate is inserted in the slot, the press plate is arranged at the bottom of one end of the pull plate, and the heat dissipation fin is welded and connected to the bottom of the test carrier plate. The whole integrated circuit test carrier plate is flexible and convenient to use, can help personnel to fix and limit the integrated circuit boards to be tested with various specifications, is provided with a good heat dissipation assembly, can better test and process the integrated circuit boards by the personnel, better knows the performance of the integrated circuit boards and the component modules thereon, and has higher practicability.

Description

Integrated circuit test carrier plate

Technical Field

The utility model relates to the technical field of integrated circuits, in particular to an integrated circuit test carrier plate.

Background

An integrated circuit is a miniature electronic device or component, and is made up through such technological steps as interconnection of transistors, resistors, capacitors, processor module and inductors with wires on a circuit board, and testing by tester to know its performance.

The traditional integrated circuit test carrier plate is lack of components which can help personnel to radiate the integrated circuit board in high-power-consumption test to a placement platform for the integrated circuit board, so that the integrated circuit board cannot exert the maximum performance in the test, and the test is unstable. To this end, we propose an integrated circuit test carrier.

SUMMERY OF THE UTILITY MODEL

The present invention is directed to an integrated circuit test carrier, which can effectively solve the problems of the background art.

In order to achieve the purpose, the utility model adopts the technical scheme that:

the utility model provides an integrated circuit test support plate, includes test support plate, alumina plate and slide rail, still includes radiating fin, pull board and clamp plate, test support plate top inlays and is equipped with alumina plate, the slide rail is installed through the bolt respectively to test support plate top both sides, sliding connection has the slider on the slide rail, the slot has been seted up in the top runs through in the slider, the slot interpolation is equipped with the pull board, pull board one end bottom is equipped with the clamp plate, bottom welded connection has radiating fin in the test support plate.

Furthermore, the bottom of one side of the test carrier plate is connected with a vertical plate through a bolt in an installing manner, and an exhaust fan is arranged in the vertical plate in a penetrating manner through the bolt in a distributing manner.

Furthermore, threaded rods are rotatably installed at the tops of the pressing plates through bearings, and corresponding pulling plates are arranged in a penetrating mode through threads at the tops of the threaded rods and are provided with hand wheels.

Further, the bottom of the alumina plate is attached to the top of the radiating fin, and the corners of the alumina plate are respectively connected with the radiating fin through screws.

Compared with the prior art, the utility model has the following beneficial effects:

1. the personnel realize providing the test that possesses radiator unit for integrated circuit board through the subassembly that test support plate, alumina plate, slide rail, radiating fin, pull board and clamp plate are constituteed, make integrated circuit board can be more stable in high load test, avoid integrated circuit board high temperature and the damage phenomenon that appears in high load test to help personnel can be to the load of the operation of furthest's understanding integrated circuit board or load.

2. The heat on the integrated circuit board under test can be discharged into the radiating fins by utilizing the metal heat exchange characteristic of the aluminum oxide plate, the heat on the surface of the integrated circuit board is reduced by utilizing the radiating fins to realize radiating treatment, and a worker can open the exhaust fan to exhaust the radiating fins, so that air can rapidly pass through the surfaces of the radiating fins to take away the heat on the surfaces of the radiating fins, the heat exchange efficiency of the radiating fins on the integrated circuit board is better, the stability of the integrated circuit board is greatly improved, the tester can better test the performance of the internal circuits of the integrated circuit board and the modules assembled on the integrated circuit board, the whole integrated circuit test support plate is flexible and convenient to use, the worker can fix and limit the integrated circuit boards with various specifications, and is provided with good radiating components, so that the worker can better test the integrated circuit board, the performance of the integrated circuit board and the component modules thereon can be better understood, and the practicability is higher.

Drawings

Fig. 1 is a schematic diagram of an overall structure of an integrated circuit test carrier according to the present invention.

Fig. 2 is a schematic diagram of a test carrier structure of an integrated circuit test carrier according to the present invention.

Fig. 3 is an enlarged schematic view of a point a in fig. 1 of an integrated circuit test carrier according to the present invention.

In the figure: 1. testing the carrier plate; 2. an alumina plate; 3. a slide rail; 4. a slider; 5. a slot; 6. a drawing plate; 7. pressing a plate; 8. a bearing; 9. a threaded rod; 10. a hand wheel; 11. a guide rod; 12. a heat dissipating fin; 13. a vertical plate; 14. an exhaust fan; 15. a screw.

Detailed Description

In order to make the technical means, the creation characteristics, the achievement purposes and the effects of the utility model easy to understand, the utility model is further described with the specific embodiments.

As shown in fig. 1-3, an integrated circuit test carrier plate comprises a test carrier plate 1, an alumina plate 2, a slide rail 3, a heat dissipation fin 12, a pull plate 6 and a press plate 7, wherein the alumina plate 2 is embedded in the top of the test carrier plate 1, the slide rail 3 is respectively installed on two sides of the top of the test carrier plate 1 through bolts, the slide rail 3 is slidably connected with a slider 4, a slot 5 is formed in the slider 4 in a penetrating manner at the top, the pull plate 6 is inserted into the slot 5, the press plate 7 is arranged at the bottom of one end of the pull plate 6, and the heat dissipation fin 12 is welded on the bottom of the test carrier plate 1.

The bottom of one side of the test carrier plate 1 is connected with a vertical plate 13 through a bolt in an installing manner, and an extraction fan 14 is arranged in the vertical plate 13 through a bolt in a penetrating manner; the exhaust fan 14 is started to perform air exhaust treatment on the radiating fins 12, so that air can rapidly pass through the surfaces of the radiating fins 12 to take away heat on the surfaces of the radiating fins 12, and the heat exchange efficiency of the radiating fins 12 on the integrated circuit board is better.

The top of each pressing plate 7 is rotatably provided with a threaded rod 9 through a bearing 8, threads on the top of each threaded rod 9 penetrate through the corresponding pull plate 6 and are provided with a hand wheel 10, guide rods 11 are respectively welded and connected to the top of each pressing plate 7 and two sides of each threaded rod 9, the top of each guide rod 11 is inserted into and connected with the corresponding pull plate 6, an outer shaft sleeve of each bearing 8 is in bolt installation connection with the corresponding pull plate 6, and an inner shaft sleeve of each bearing 8 is in bolt installation connection with the corresponding threaded rod 9; the guide bar 11 is used to guide the raising and lowering direction of the platen 7.

The bottom of the alumina plate 2 is attached to the top of the radiating fin 12, the corners of the alumina plate 2 are respectively connected with the radiating fin 12 through screws 15, and the screws 15 are made of alumina materials; the alumina plate 2 contributes to a good heat exchange process between the integrated circuit board placed thereon and the heat radiating fins 12, and the alumina plate 2 can provide an insulating effect between the integrated circuit board and the heat radiating fins 12.

It should be noted that, the utility model is an integrated circuit testing carrier plate, when in use, an integrated circuit board to be tested is placed on an alumina plate 2, and a pressing plate 7 is utilized to carry out compression treatment on the integrated circuit board placed on the alumina plate 2, so as to ensure that the circuit board does not have displacement phenomenon when external electrical interfaces and other connecting or point contact mechanisms contact the integrated circuit board, so as to ensure the stability of various testing operations of the integrated circuit board, when in use, personnel adjust the use position of a pull-out plate 6 through the sliding connection of a sliding block 4 and a sliding rail 3, adjust the transverse position of the pull-out plate 6 through the pull adjustment of a slot 5 of the pull-out plate 6 and the sliding block 4, then rotate a threaded rod 9 on the pull-out plate 6 to enable the threaded rod 9 to move up and down on the pull-out plate 6, and realize the adjustment of the pressing height of the pressing plate 7, thereby satisfy and carry out the location processing to the integrated circuit board of multiple examination of awaiting measuring, in the test, utilize aluminum oxide plate 2's metal heat transfer characteristic, can make the heat on the integrated circuit board in the test arrange into to radiating fin 12, utilize radiating fin 12 to reduce the heat on integrated circuit board surface, realize the heat dissipation processing, and personnel can open exhaust fan 14 and carry out the convulsions processing to radiating fin 12 department, make the air can be fast through radiating fin 12 surface, take away the heat on radiating fin 12 surface, make radiating fin 12 better to the heat exchange efficiency of integrated circuit board, greatly increased the stability that the integrated circuit board used, help the better performance of the module of testing the internal circuit of integrated circuit board and assembling on the integrated circuit board of testing personnel.

The foregoing shows and describes the general principles and features of the present invention, together with the advantages thereof. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the utility model as claimed. The scope of the utility model is defined by the appended claims and equivalents thereof.

Claims

1. The utility model provides an integrated circuit test support plate, includes test support plate (1), alumina plate (2) and slide rail (3), its characterized in that still includes radiating fin (12), pull board (6) and clamp plate (7), test support plate (1) top is inlayed and is equipped with alumina plate (2), slide rail (3) are installed through the bolt respectively to test support plate (1) top both sides, sliding connection has slider (4) on slide rail (3), slot (5) have been seted up in slider (4) top run through, slot (5) interpolation is equipped with pull board (6), pull board (6) one end bottom is equipped with clamp plate (7), bottom welded connection has radiating fin (12) in test support plate (1).

2. The integrated circuit test carrier of claim 1, wherein: the bottom of one side of the test carrier plate (1) is connected with a vertical plate (13) through a bolt, and an exhaust fan (14) is arranged in the vertical plate (13) in a penetrating mode through the bolt.

3. The integrated circuit test carrier of claim 1, wherein: the top of the pressing plate (7) is rotatably provided with a threaded rod (9) through a bearing (8), and the top thread of the threaded rod (9) penetrates through the corresponding drawing plate (6) to be provided with a hand wheel (10).

4. The integrated circuit test carrier of claim 1, wherein: the bottom of the aluminum oxide plate (2) is attached to the top of the radiating fin (12), and the corners of the aluminum oxide plate (2) are respectively connected with the radiating fin (12) through screws (15).