CN216669796U - Transmission electron microscope sample array microscope carrier and auxiliary component for scanning electron microscope - Google Patents
Transmission electron microscope sample array microscope carrier and auxiliary component for scanning electron microscope Download PDFInfo
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- CN216669796U CN216669796U CN202123106645.8U CN202123106645U CN216669796U CN 216669796 U CN216669796 U CN 216669796U CN 202123106645 U CN202123106645 U CN 202123106645U CN 216669796 U CN216669796 U CN 216669796U
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Abstract
The utility model discloses a transmission electron microscope sample array carrying platform and an auxiliary component for a scanning electron microscope, which comprise a carrying platform and a sample carrying disc, wherein the middle part of the top end of the carrying platform is provided with a screw hole A, the surface of the carrying platform outside the screw hole A is annularly distributed with a carrying hole, a positioning column is protruded on the surface of the carrying platform outside the carrying hole, the sample carrying disc is embedded in the carrying hole, a separation frame and a buckle cover are sequentially arranged above the carrying platform, and a positioning groove is formed in the separation frame above the positioning column; the tweezers are convenient to take and place, the sample is not easy to clamp, and the risk of damaging the sample is reduced; a plurality of samples can be put in simultaneously, the samples are switched simply and conveniently, and the data acquisition efficiency is improved; the mark is clear, and the sample is not easy to be confused.
Description
Technical Field
The utility model relates to the technical field of electron microscope carriers, in particular to a transmission electron microscope sample array carrier and an auxiliary component for a scanning electron microscope.
Background
The development of electron microscopes, abbreviated as electron microscopes, has become an indispensable important tool in modern science and technology over fifty years. The electron microscope is composed of a lens cone, a vacuum device and a power supply cabinet. The application of electron microscopy is based on optical microscopy, which has a resolution of 0.2 μm and transmission electron microscopy at a resolution of 0.2nm, i.e. transmission electron microscopy at a magnification of 1000 times on an optical microscope basis.
Patent No. CN202021277258.3 is a powder sample multi-sample carrying platform for scanning electron microscope, which comprises a base platform, the upper portion of the base platform is provided with a region separating cover plate, the middle part of the region separating cover plate is provided with a plurality of sample placing holes, the two side surfaces of the region separating cover plate are provided with a plurality of through holes, the top two side surfaces of the base platform are provided with positioning holes, positioning mechanisms are arranged in the positioning holes, the top surface of the base platform is close to the through holes and provided with threaded holes, and the region separating cover plate is provided with bolts. This a powder sample many samples sample specimen microscope carrier for scanning electron microscope can once only place a plurality of samples, can practice thrift the experimental time, can separate between a plurality of samples to effectively prevent cross contamination, and can keep a plurality of powder samples to place stably, can separate the apron with the region after using and pull down, be convenient for wash the operation.
Prepared TEM sheet samples are sometimes required to be subjected to morphology characterization, data acquisition or batch TEM pre-screening. For biological scanning electron microscopes, a dedicated sample array stage with a large number of carrier holes is usually provided, which is expensive. If the sample is a block material, only an additional single fixture is typically used as in TKD. Such a stage: the efficiency is low, the number of holes of a part of carrying platforms is small, the replacement times are high when batch samples are processed, and a large amount of time is wasted for sample replacement operation and vacuumizing; the risk of taking and placing the sample is high, the fasteners of part of the carrying platform are difficult to remove, or the trap structure is unreasonable, unnecessary force can be applied to the sample in the loading and unloading process, and the thin area of the transmission sample is damaged. A part of the carrier is not provided with a limiting structure, so that samples are easy to be mixed in the loading and unloading process, and therefore, the transmission electron microscope sample array carrier and the auxiliary component for the scanning electron microscope are provided.
SUMMERY OF THE UTILITY MODEL
The utility model mainly aims to provide a transmission electron microscope sample array carrying platform and an auxiliary component for a scanning electron microscope, which can effectively solve the problems in the background technology.
In order to achieve the purpose, the utility model adopts the technical scheme that:
the utility model provides a transmission electron microscope sample array microscope carrier and auxiliary component for scanning electron microscope, includes the microscope carrier and carries the sample dish, screw A has been seted up at the top middle part of microscope carrier, and the microscope carrier surface ring distribution in the screw A outside has the hole of carrying, carry the protruding reference column that has in microscope carrier surface in the hole outside, and carry the inside embedding of hole to carry and carry the sample dish, the top of microscope carrier has set gradually and has divided frame and buckle closure, the spacing frame department of reference column top has seted up the constant head tank, and the buckle closure department of constant head tank top has seted up the locating hole, the spacing frame department of carrying the hole top has seted up the separation groove, and carries the hole and has seted up the through-hole with the buckle closure surface of separation groove top, the top middle part screw thread of buckle closure has connect the bolt soon.
Furthermore, the size of the threaded bolt body of the bolt is matched with the size of the threaded inner holes of the screw hole A and the screw hole B; the size-adaptive bolt can be in adaptive threaded connection with the screw hole A and the screw hole B.
Furthermore, three groups of positioning columns are arranged on the surface of the carrying platform, three groups of positioning grooves are arranged at the separation frame, and three groups of positioning holes are arranged on the surface of the buckle cover; the positioning columns of the three groups are embedded with the positioning grooves of the three groups at the distributing frame and the positioning holes of the three groups at the buckling cover in a three-point positioning manner.
Furthermore, the column body size of the positioning column is matched with the sizes of the positioning groove and the slotted hole of the positioning hole; the positioning column can be smoothly embedded with the positioning groove and the positioning hole which are matched with each other in size.
Furthermore, the diameter of the plate body of the sample carrying plate is smaller than that of the hole body of the sample carrying hole, and a notch is formed in the position of the plate body of the sample carrying plate; a gap is reserved between the smaller sample carrying disc and the hole wall after the sample carrying disc is embedded into the sample carrying hole, the notch on one side of the sample carrying disc facilitates clamping samples by tweezers to be placed in the sample carrying disc or take up the samples from the disc, and more sample carrying holes can be used for placing more samples at the same time.
Compared with the prior art, the utility model has the following beneficial effects:
according to the utility model, the plurality of carrying holes are annularly formed in the surface of the carrying platform, the sample is clamped by tweezers and is placed in the sample carrying plate, the sample carrying plate is placed in the carrying holes, the separating frame is pressed on the surface of the carrying platform, the cover is covered on the surface of the separating frame, the positioning groove of the separating frame is embedded with the positioning column of the carrying platform, the positioning hole of the cover is embedded and positioned with the positioning column through liquid, and the bolt at the cover is screwed through the screw hole B of the separating frame and then screwed into the screw hole A of the carrying platform for screwing and fixing. The buckle cover can be conveniently marked with sample numbers by using a marker pen to prevent confusion, the three positioning columns adopt asymmetric design and strictly correspond to the positions of the separating frame and the sample carrying disc, and the chance of a user for confusing samples or sample carrying discs is also reduced; the tweezers are convenient to take and place, the sample is not easy to clamp, and the risk of damaging the sample is reduced; a plurality of samples can be put in simultaneously, the switching of the samples is simple and convenient, and the data acquisition efficiency is improved; the mark is clear, and the sample is not easy to be confused.
Drawings
FIG. 1 is an exploded view of a transmission electron microscope sample array stage and auxiliary members according to the present invention.
Fig. 2 is a schematic diagram of the assembly of the separating frame and the stage of the transmission electron microscope sample array stage and the auxiliary member for a scanning electron microscope according to the present invention.
In the figure: 1. a stage; 2. a screw hole A; 3. a carrier hole; 4. a positioning column; 5. a spacer; 6. a screw hole B; 7. positioning a groove; 8. covering; 9. a through hole; 10. positioning holes; 11. a bolt; 12. and a sample carrying disc.
Detailed Description
In order to make the technical means, the creation characteristics, the achievement purposes and the effects of the utility model easy to understand, the utility model is further described with the specific embodiments.
As shown in fig. 1-2, a transmission electron microscope sample array carrier and an auxiliary component for a scanning electron microscope include a carrier 1 and a sample carrying disc 12, a screw hole a2 is formed in the middle of the top end of the carrier 1, and the carrier 1 outside the screw hole a2 has a plurality of carrier holes 3 annularly distributed on the surface of the carrier 1, a positioning post 4 protrudes from the surface of the carrier 1 outside the carrier hole 3, the sample carrying disc 12 is embedded inside the carrier hole 3, a separation frame 5 and a buckle cover 8 are sequentially arranged above the carrier 1, a positioning groove 7 is formed in the separation frame 5 above the positioning post 4, a positioning hole 10 is formed in the buckle cover 8 above the positioning groove 7, a separation groove is formed in the separation frame 5 above the carrier hole 3, a through hole 9 is formed in the surfaces of the carrier hole 3 and the buckle cover 8 above the separation groove, and a bolt 11 is screwed in the middle of the top end of the buckle cover 8.
The size of the threaded bolt body of the bolt 11 is matched with the size of the threaded inner holes of the screw hole A2 and the screw hole B6; the size-adapted bolt 11 may be adapted to be threadably engaged with threaded bore a2 and threaded bore B6.
Three groups of positioning columns 4 are arranged on the surface of the carrier 1, three groups of positioning grooves 7 are arranged on the separating frame 5, and three groups of positioning holes 10 are arranged on the surface of the buckle cover 8; the positioning columns 4 of the three groups are embedded with the positioning grooves 7 of the three groups at the distributing frame 5 and the positioning holes 10 of the three groups at the buckle cover 8 in a three-point positioning way.
The size of the positioning column 4 is matched with the size of the positioning groove 7 and the size of the slotted hole of the positioning hole 10; the positioning column 4 can be smoothly embedded with the positioning groove 7 and the positioning hole 10 which are matched in size.
The diameter of the sample carrying disc 12 is smaller than that of the hole body of the sample carrying hole 3, and a notch is formed in the disc body of the sample carrying disc 12; a gap is reserved between the smaller sample carrying disc 12 embedded in the sample carrying hole 3 and the hole wall, a notch on one side of the sample carrying disc 12 facilitates clamping samples by tweezers and placing the samples in the sample carrying disc 12 or taking samples from the disc, and more samples can be placed in more sample carrying holes 3 at the same time.
The utility model is a transmission electron microscope sample array stage and auxiliary component for a scanning electron microscope, wherein a plurality of loading holes 3 are annularly formed on the surface of a stage 1, a sample is clamped by tweezers and placed in a sample loading disc 12, the sample loading disc 12 is placed in the loading holes 3, at this time, a separation frame 5 is used for pressing on the surface of the stage 1, a buckle cover 8 is used for covering the surface of the separation frame 5, so that a positioning groove 7 of the separation frame 5 is embedded with a positioning column 4 of the stage 1, a positioning hole 10 of the buckle cover 8 is embedded and positioned with the positioning column 4, at this time, a bolt 11 at the buckle cover 8 is screwed through a screw hole B6 of the separation frame 5 and then screwed into a screw hole A2 of the stage 1 for fixation, and the stage 1 can improve sample loading quantity at each time and reduce vacuum pumping time consumption. The buckle cover 8 can be conveniently marked with sample numbers by using a marker pen to prevent confusion, the three positioning columns 4 adopt asymmetric design and strictly correspond to the positions of the separating frame 5 and the sample carrying disc 12, and the chance of confusing samples or sample carrying discs 12 by a user is also reduced. The tweezers are convenient to take and place, the sample is not easy to clamp, and the risk of damaging the sample is reduced; a plurality of samples can be put in simultaneously, the switching of the samples is simple and convenient, and the data acquisition efficiency is improved; the mark is clear, the sample is not easy to be confused, and the sample carrying disc 12 can be observed downwards by an electron microscope at the through hole 9.
The utility model relates to a transmission electron microscope sample array carrier and an auxiliary component for a scanning electron microscope, which comprise a carrier 1 and a carrier; 2. a screw hole A; 3. a carrier hole; 4. a positioning column; 5. a spacer; 6. a screw hole B; 7. positioning a groove; 8. covering; 9. a through hole; 10. positioning holes; 11. a bolt; 12. the sample carrier, the components are all standard parts or parts known to the person skilled in the art, the structure and the principle of which are known to the person skilled in the art by means of technical manuals or by means of routine experimentation.
The foregoing shows and describes the general principles and broad features of the present invention and advantages thereof. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the utility model as claimed. The scope of the utility model is defined by the appended claims and equivalents thereof.
Claims (5)
1. The utility model provides a transmission electron microscope sample array microscope carrier and auxiliary component for scanning electron microscope, includes microscope carrier (1) and carries sample tray (12), its characterized in that: screw A (2) is arranged in the middle of the top end of the carrier platform (1), the surface of the carrier platform (1) on the outer side of the screw A (2) is annularly provided with load holes (3), positioning columns (4) are arranged on the surface of the carrier platform (1) on the outer side of the load holes (3) in a protruding mode, a sample carrying disc (12) is embedded into the load holes (3), a separation frame (5) and a buckle cover (8) are sequentially arranged above the carrier platform (1), positioning grooves (7) are formed in the separation frame (5) above the positioning columns (4), positioning holes (10) are formed in the buckle cover (8) above the positioning grooves (7), separation grooves are formed in the separation frame (5) above the load holes (3), through holes (9) are formed in the surfaces of the load holes (3) and the buckle cover (8) above the separation grooves, and bolts (11) are screwed in the threads in the middle of the top end of the buckle cover (8).
2. The transmission electron microscope sample array stage and the auxiliary member according to claim 1, wherein: the size of the threaded bolt body of the bolt (11) is matched with the size of the threaded inner hole of the screw hole A (2) and the screw hole B (6).
3. The transmission electron microscope sample array stage and the auxiliary member according to claim 1, wherein: three groups of positioning columns (4) are arranged on the surface of the carrying platform (1), three groups of positioning grooves (7) are arranged on the separation frame (5), and three groups of positioning holes (10) are arranged on the surface of the buckle cover (8).
4. The transmission electron microscope sample array stage and the auxiliary member according to claim 1, wherein: the size of the column body of the positioning column (4) is matched with the size of the slotted hole of the positioning groove (7) and the positioning hole (10).
5. The transmission electron microscope sample array stage and the auxiliary member according to claim 1, wherein: the diameter of the plate body of the sample carrying plate (12) is smaller than that of the hole body of the sample carrying hole (3), and a notch is formed in the position of the plate body of the sample carrying plate (12).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123106645.8U CN216669796U (en) | 2021-12-13 | 2021-12-13 | Transmission electron microscope sample array microscope carrier and auxiliary component for scanning electron microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123106645.8U CN216669796U (en) | 2021-12-13 | 2021-12-13 | Transmission electron microscope sample array microscope carrier and auxiliary component for scanning electron microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216669796U true CN216669796U (en) | 2022-06-03 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202123106645.8U Active CN216669796U (en) | 2021-12-13 | 2021-12-13 | Transmission electron microscope sample array microscope carrier and auxiliary component for scanning electron microscope |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN216669796U (en) |
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2021
- 2021-12-13 CN CN202123106645.8U patent/CN216669796U/en active Active
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Address after: Room 106, Room 101, Building B9, No. 11 Kaiyuan Avenue, Huangpu District, Guangzhou City, Guangdong Province, 510700 Patentee after: Sinoma New Materials Research Institute (Guangzhou) Co.,Ltd. Address before: 511436 shop 219-222, building 2, No. 26, Xinghua Road, Xinzao Town, Panyu District, Guangzhou City, Guangdong Province Patentee before: Sinoma New Materials Research Institute (Guangzhou) Co.,Ltd. |