CN214953920U - Clamp for chip testing and chip testing device - Google Patents

Abstract

An embodiment of the utility model provides an anchor clamps and chip testing arrangement for chip testing belongs to chip testing analysis field. The jig includes: a first plate and a second plate; the surface of the first plate is provided with a contact for contacting with a pin of a chip; a plurality of pressing members are telescopically connected to the second plate. The utility model provides an anchor clamps for chip test is applicable to being connected of BGA encapsulation chip of different pin quantity and test machine, can make the chip of being surveyed stabilize the contact in the test procedure, and the installation and the dismantlement of chip are convenient.

Description

Clamp for chip testing and chip testing device

Technical Field

The utility model relates to a chip test analysis field specifically relates to an anchor clamps and chip testing arrangement for chip testing.

Background

With the progress of the integration technology, the chip integration level is continuously improved, the requirements on the integrated circuit packaging are more strict, the number of I/O pins is increased rapidly, and the power consumption is increased. To meet the development demand, bga (ball Grid Array package) packages (as shown in fig. 1) are increasingly used. The BGA package type can be classified into various types in view of pitch value, inter-ball grid pitch size, number of ball grids, and the like. When testing the BGA packaged chip, the chip needs to be placed on a test fixture, so that a connection path from a chip packaging pin to a test machine is realized, and the test is completed.

In the process of testing and debugging a chip, a chip clamp is installed on a testing machine, the clamp adopts a flip-open rotary type manual tightening test cover to provide pressure to ensure the connectivity of the chip and the testing machine, the traditional test clamp is complex in structure, workers need to loosen or tighten bolts to fix the chip, chips with different BGA packaging sizes need to be connected with the testing machine by using test clamps with the number of matched ball grids, namely, corresponding test clamps are prepared for each type of packaging, and the design, manufacture and management of the test clamps increase the complexity of the whole test.

SUMMERY OF THE UTILITY MODEL

The present invention is directed to at least partially solve the above problems of the prior art, and to provide a jig for chip testing and a chip testing apparatus.

In order to achieve the above object, an embodiment of the present invention provides a clamp for chip testing, the clamp includes: a first plate and a second plate; the surface of the first plate is provided with a contact for contacting with a pin of a chip; a plurality of pressing members are telescopically connected to the second plate.

Optionally, in use, the surface of the first plate having the contacts is opposite to the surface of the second plate to which the pressing member is attached, and the chip is located between the first and second plates.

Optionally, the pressing member is connected to the second plate by a spring.

Optionally, the pressing pieces are small plates, and the small plates are arranged in an array.

Optionally, the area of a single pressing piece is smaller than or equal to the area of the chip.

Optionally, the plurality of pressing pieces are the same size.

Optionally, the layout of the contacts of the first plate matches the pitch value of the pins of the chip.

Optionally, the contact is a metal contact.

Optionally, the fixture further includes a PCB circuit board, and the PCB circuit board is used for connecting a tester port with the first board.

Correspondingly, the utility model provides a chip testing device, include the utility model discloses an anchor clamps for chip testing.

The utility model provides a chip test fixture, during the use, the chip is located between second board and the first board, through a plurality of pressing pieces of telescopic on the second board, makes the contact on chip and the first board stably be connected, can not the slippage, simultaneously, the utility model provides an anchor clamps for chip test can be applicable to the BGA encapsulation chip of different pin quantities and the being connected of test machine, and the installation and the dismantlement of chip are convenient.

Other features and advantages of embodiments of the present invention will be described in detail in the detailed description which follows.

Drawings

The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the embodiments of the invention, but do not constitute a limitation of the embodiments of the invention. In the drawings:

fig. 1 is a diagram of a bga (ball Grid Array package) packaged chip according to an embodiment of the present invention;

fig. 2 is a schematic structural diagram of a fixture for chip testing according to an embodiment of the present invention;

fig. 3 is a schematic structural diagram of a first plate of a fixture for chip testing according to an embodiment of the present invention;

fig. 4 is a schematic structural diagram of a second plate of the fixture for chip testing provided by the embodiment of the present invention;

fig. 5 is a plan view of a second plate of the fixture for chip testing provided by the embodiment of the present invention;

fig. 6 is a diagram illustrating a positional relationship between a second board and a chip to be tested (20 pins) according to an embodiment of the present invention;

fig. 7 is a diagram illustrating a positional relationship between the second board and the chip to be tested (50 pins) according to an embodiment of the present invention.

Description of the reference numerals

1 second plate 2 extension

3 pressing piece 4 chip

5 contact 6 first plate

7PCB circuit board

Detailed Description

The following describes in detail embodiments of the present invention with reference to the accompanying drawings. It is to be understood that the description herein is only intended to illustrate and explain embodiments of the present invention, and is not intended to limit embodiments of the present invention.

The utility model discloses an embodiment of a anchor clamps for chip test, refer to fig. 2, the anchor clamps include: when the testing device is used, the surface of the first plate 6 with the contact 5 is opposite to the surface of the second plate 1 connected with the pressing piece 3 through the telescopic piece 2, the chip 4 is positioned between the first plate 6 and the second plate 1, pins of the chip 4 are tightly connected with the contact of the first plate 6 under the pressing action of part of the pressing piece 3, the chip 4 is kept stable under the wrapping of part of the pressing piece 3, the chip 4 keeps stably contacting the contact in the testing process due to the downward force of the second plate 1 on the chip 4, and cannot slip off, and the PCB 7 is connected with the first plate 6 and is used for being connected with a port of a testing machine.

Fig. 3 is a schematic structural diagram of a first plate of a fixture for chip testing according to an embodiment of the present invention, and a surface of the first plate 6 has contacts for contacting pins of a chip. The contact 5 may be made of various metal materials, preferably one or more of platinum, silver cadmium and copper. The layout of contact 5 on first board 6 with the pitch value cooperation of chip pin, pitch value refers to the distance between two pins on the chip, because the distance between two pins of different chips is different, the distance that the contact was gone up to corresponding requirement first board matches with it, in a specific embodiment, the pitch value of test chip is 0.4mm, then the distance between the contact 5 on the first board of the anchor clamps for chip test is 0.4 mm. Preferably, the number of the contacts on the first board 6 can be any number, and by this preferred embodiment, the clamp provided by the embodiment of the present invention can be used for testing chips with any number of pins, and in a specific embodiment, the clamp can be used for testing chips with 20 pins.

Fig. 4 is a schematic structural diagram of a second plate of the fixture for testing chips according to an embodiment of the present invention, and fig. 5 is a plan view of the second plate, wherein a plurality of pressing members 3 are telescopically connected to the second plate 1. The pressing member 3 may be connected to the second plate 1 through various kinds of expansion members 2, and in a preferred embodiment, the pressing member 3 is connected to the second plate 1 through a spring, which may be a cylindrical coil spring, a conical coil spring, a belleville spring, a ring spring, a coil spring, a plate spring, or the like. The pressing pieces 3 can be small pieces, the small pieces can be arranged in an array, preferably, the area of a single pressing piece is smaller than or equal to that of the chip, the pressing pieces are the same in size, according to the preferred embodiment, the chip to be tested can be guaranteed to be wrapped between the pressing pieces, so that the connection between the chip and the contact has high stability, in one specific implementation, as shown in fig. 6, the chip 4 is provided with 20 pins, the spring is compressed, the chip is fixed by the pressing pieces under the action of gravity, meanwhile, the spring and the pressing pieces are in a normal state at the position without the chip, the chip is wrapped around, so that the chip cannot move left and right, the pins of the chip are guaranteed to be stably contacted with the contact on the first board, and the stability of the test is improved. In another embodiment, as shown in fig. 7, the chip 4 has 50 pins, the spring is compressed, and due to the different sizes of the chips, the chips are pressed by the pressing members with different numbers, and the chip is wrapped by the spring and the pressing member at the position without the chip.

When the PCB testing machine is used, the surface of the first board with the contacts is opposite to the surface of the second board connected with the pressing piece, the chip is located between the first board and the second board, and the PCB is used for connecting a testing machine port with the first board. In a specific embodiment, the chip that awaits measuring is the chip of BGA encapsulation, pin quantity is 40, pitch value is 30mm, be connected PCB circuit board and test machine, according to the size of the chip pitch value that awaits measuring, select the first board that the contact distance is 30mm, connect first board on the PCB circuit board, the chip that will await measuring is placed on first board, make the pin of the chip that awaits measuring and the contact on the first board contact, place the second board in the top of the chip that awaits measuring, the spring is compressed, under the action of gravity, the chip is fixed by the pressing part, and simultaneously, in the position that does not have the chip, spring and pressing part present normal condition, wrap up the chip all around, make the chip can not take place the removal about, thereby guarantee the pin of chip and the stable contact of contact on the first board.

The utility model provides an anchor clamps for chip testing, during the use, the chip is located between second board and the first board, through a plurality of pressing pieces of telescopic on the second board, makes the contact on chip and the first board stably be connected, can not the slippage, simultaneously, the utility model provides an anchor clamps for chip testing can be applicable to the BGA encapsulation chip of different pin quantities and be connected with the test machine, and the installation and the dismantlement of chip are convenient.

The above describes in detail optional implementation manners of embodiments of the present invention with reference to the accompanying drawings, however, the embodiments of the present invention are not limited to the details in the above implementation manners, and in the technical concept scope of the embodiments of the present invention, it is possible to perform various simple modifications on the technical solutions of the embodiments of the present invention, and these simple modifications all belong to the protection scope of the embodiments of the present invention. It should be noted that the various features described in the above embodiments may be combined in any suitable manner without departing from the scope of the invention. In order to avoid unnecessary repetition, the embodiments of the present invention do not separately describe various possible combinations. The embodiments of the present invention are not limited to the above-described embodiments, and may be modified within the scope of the present invention.

Claims (10)

1. A fixture for chip testing, the fixture comprising: a first plate and a second plate;

the surface of the first plate is provided with a contact for contacting with a pin of a chip;

a plurality of pressing members are telescopically connected to the second plate.

2. A jig according to claim 1, wherein, in use, the surface of the first plate having the contacts is opposite the surface of the second plate to which the pressing members are connected, the chip being located between the first and second plates.

3. A clamp according to claim 1, wherein the pressing member is connected to the second plate by a spring.

4. The fixture of claim 1, wherein the plurality of press elements are a plurality of small plates arranged in an array.

5. A fixture according to claim 1 or 4, wherein the area of a single said pressing element is smaller than or equal to the area of said chip.

6. A fixture according to claim 5, wherein said plurality of pressing elements are of the same size.

7. The fixture of claim 1, wherein the layout of the contacts of the first plate matches the pitch values of the pins of the chip.

8. The clip of claim 7, wherein the contact is a metal contact.

9. The clip of claim 1, further comprising a PCB board for connection of a tester port to the first board.

10. A chip testing apparatus comprising the jig for chip testing as claimed in any one of claims 1 to 9.

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