CN212328972U

CN212328972U - Chip test assembly line

Info

Publication number: CN212328972U
Application number: CN202020584392.1U
Authority: CN
Inventors: 黄辉
Original assignee: Shenzhen Chip Testing Technology Co ltd
Current assignee: Shenzhen Chip Testing Technology Co ltd
Priority date: 2020-04-17
Filing date: 2020-04-17
Publication date: 2021-01-12
Anticipated expiration: 2030-04-17

Abstract

The utility model discloses a chip testing assembly line, which comprises a working platform, wherein the working platform is provided with a conveying mechanism and a driving mechanism, the driving mechanism is used for grabbing the test fixture which is conveyed by the conveying mechanism and used for bearing the chip, a good product discharging mechanism and a defective product discharging mechanism are arranged on two sides of the conveying mechanism, the working platform is provided with two discharging holes, the good product discharging mechanism and the defective product discharging mechanism are respectively arranged below the two discharging holes, when the product is tested to be good, the driving mechanism can place the test jig on the good product blanking mechanism through one of the blanking holes, and the good product blanking mechanism is used for blanking the product, when the test is the defective products, actuating mechanism can place test fixture on defective products unloading mechanism through another unloading hole, carries out the unloading to the defective products.

Description

Chip test assembly line

Technical Field

The utility model relates to a chip test equipment field especially relates to a chip test assembly line.

Background

With the progress of science and technology and the rapid popularization of intellectualization, chips have become essential high-tech products in modern industry. After the chip is processed or before the chip is shipped, the chip generally needs to be tested to determine whether the chip meets the use requirements. Current chip test equipment generally need artifical yields or the defective products according to the chip to sort after accomplishing the chip test, and degree of automation is lower, and work efficiency is not high.

SUMMERY OF THE UTILITY MODEL

In view of this, the utility model discloses a chip test assembly line can convey respectively to the test fixture who loads the chip according to the testing result.

The utility model discloses a chip test assembly line, including work platform, last transport mechanism and the actuating mechanism of being provided with of work platform, actuating mechanism sets up transport mechanism conveys terminal top, work platform's both sides are provided with yields unloading mechanism and defective products unloading mechanism respectively, work platform's both sides are provided with the unloading hole respectively, yields unloading mechanism with defective products unloading mechanism sets up two respectively the below in unloading hole, actuating mechanism can with the last test fixture that loads of transport mechanism has the chip passes through one of them the unloading hole is placed in the yields unloading mechanism, perhaps through another the unloading hole is placed in the defective products unloading mechanism.

Further, transport mechanism includes a plurality of transfer roller, a plurality of the transfer roller is in along the rotatable setting in proper order of array work platform is last.

Furthermore, the conveying tail end of the conveying mechanism is provided with a stop plate, and the stop plate is fixedly connected with the working platform and used for preventing the test fixture loaded with the chip from continuously moving along the original direction.

Further, fixedly connected with positioning mechanism on the work platform, positioning mechanism includes first bidirectional clamping cylinder, first bidirectional clamping cylinder passes through the mount setting and is in work platform's below, be connected with first splint on the output shaft at first bidirectional clamping cylinder's both ends respectively, the top of first splint is passed through the bar hole work platform, first bidirectional clamping cylinder can drive two first splint are followed the bar hole removes, two first splint are located actuating mechanism is under.

Further, actuating mechanism includes driving motor, lead screw, horizontal slip table, first lift cylinder and the two-way die clamping cylinder of second, driving motor passes through the support to be fixed work platform's top, and pass through the lead screw drives horizontal slip table removes along X axle direction, horizontal slip table can drive first lift cylinder removes along Y axle direction, the output shaft of first lift cylinder with the two-way die clamping cylinder fixed connection of second, and can drive the two-way die clamping cylinder of second removes along Z axle direction, be provided with the second splint on the output shaft of the both ends of the two-way die clamping flag pole of second respectively, and pass through the second splint carry out the centre gripping to test fixture.

Further, the yields unloading mechanism with the defective products unloading mechanism all includes backup pad and second lift cylinder, the second lift cylinder pass through the guide rail with the backup pad is connected, and can follow the guide rail slides, the output shaft of second lift cylinder is provided with places the board, the second lift cylinder can drive place the board and remove in vertical direction, and can drive place the board and remove unloading hole department.

Furthermore, a first positioning block is arranged on the upper surface of the placing plate, a positioning hole corresponding to the first positioning block is arranged on the lower surface of the test fixture, and a second positioning block corresponding to the positioning hole is arranged on the upper surface of the test fixture.

The technical scheme of the utility model, compared with the prior art, beneficial effect is:

after the chip test to test fixture is accomplished, actuating mechanism can sort test fixture respectively according to the testing result, when the test is the yields, actuating mechanism can place test fixture through one of them unloading hole on the yields unloading mechanism, through yields unloading mechanism carries out the unloading to the product, when the test is the defective products, actuating mechanism can place test fixture on defective products unloading mechanism through another unloading hole, carries out the unloading to the defective products.

Drawings

FIG. 1 is a schematic diagram of a chip test pipeline;

FIG. 2 is a front view of a chip test pipeline;

FIG. 3 is a schematic structural view of a second lifting cylinder and a test fixture;

FIG. 4 is a schematic structural diagram of a test fixture;

description of the figures

100. A chip test pipeline; 10. a working platform; 11. a support; 12. a blanking hole; 20. a transport mechanism; 21. a conveying roller; 22. a stop plate; 30. a drive mechanism; 31. a drive motor; 32. a screw rod; 321. A ball nut; 33. a transverse sliding table; 34. a first lifting cylinder; 35. a second bi-directional clamping cylinder; 351. A second splint; 40. a good product blanking mechanism; 41. a support plate; 42. a guide rail; 43. a second lifting cylinder; 44. placing the plate; 441. a first positioning block; 50. a defective product discharging mechanism; 60. a positioning mechanism; 61. a fixed mount; 62. a first bi-directional clamping cylinder; 621. a first splint; 70. testing the jig; 71. positioning holes; 72. And a second positioning block.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it should be noted that when one component is considered to be "connected" to another component, it may be directly connected to the other component or intervening components may exist. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. It should also be noted that, unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly and can include, for example, fixed connections, removable connections, or integral connections; either mechanically or electrically, and may be internal to both elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.

It should be further noted that in the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, which is only for the convenience of describing the present invention and simplifying the description, but does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

As shown in fig. 1 and 2, the utility model discloses a chip test assembly line 100, can carry out the unloading respectively to the chip according to the testing result of chip. Chip test assembly line 100 includes work platform 10, transport mechanism 20, actuating mechanism 30, yields unloading mechanism 40 and defective products unloading mechanism 50, transport mechanism 20 sets up work platform 10 is last for conveying the test fixture 70 of placing the chip, actuating mechanism 30 is fixed work platform 10's top, and is located transport mechanism 20's conveying is terminal, yields unloading mechanism 40 is used for unloading the chip that detects for the yields, defective products unloading mechanism 50 is used for unloading for the chip that detects for the defective products.

Conveying mechanism 20 includes a plurality of transfer roller 21, a plurality of transfer roller 21 is in along the rotatable setting in proper order of linear array direction work platform 10 is last, and a plurality of same direction rotation can be followed to transfer roller 21. After the chip testing is completed, the chip is placed on the conveying roller 21 through the testing jig 70 and conveyed through the conveying roller 21.

The conveying end of the conveying mechanism 20 is provided with a stop plate 22, and the stop plate 22 is fixedly connected with the working platform 10, and is used for preventing the test fixture 70 loaded with the chip from continuously moving along the original direction, and positioning the test fixture 70 at a corresponding position.

Fixedly connected with positioning mechanism 60 on work platform 10, positioning mechanism 60 includes first bidirectional clamping cylinder 62, first bidirectional clamping cylinder 62 passes through mount 61 and sets up work platform 10's below, be connected with first splint 621 on the output shaft at first bidirectional clamping cylinder 62's both ends respectively, the top of first splint 621 passes through the bar hole work platform 10, first bidirectional clamping cylinder 62 can drive two first splint 621 follows the bar hole removes, first splint 621 follows the moving direction in bar hole with transport mechanism 20 drives the direction mutually perpendicular that test fixture 70 removed. The conveying mechanism 20 can drive the test fixture 70 to move to a corresponding position, the stop plate 22 prevents the test fixture 70 from moving continuously, and at this time, the test fixture 70 is located between the two first clamping plates 621, the first bidirectional clamping cylinder 62 drives the two first clamping plates 621 to move, so as to clamp the test fixture 70, adjust the relative position of the test fixture 70 in the horizontal direction, and the two first clamping plates 621 are located under the driving mechanism 30, so that the driving mechanism 30 can conveniently clamp the test fixture 70.

Actuating mechanism 30 passes through support 11 and sets up work platform 10's top, the mutual symmetry in both sides of work platform 10 is provided with two unloading holes 12, non-defective products unloading mechanism 40 with defective products unloading mechanism 50 sets up two respectively the below in unloading hole 12, actuating mechanism 30 can with the test fixture 70 that the loading that has the chip on transport mechanism 20 passes through one of them unloading hole 12 is placed on the non-defective products unloading mechanism 40, perhaps through another unloading hole 12 is placed on the defective products unloading mechanism 50.

The driving mechanism 30 comprises a driving motor 31, a screw rod 32, a transverse sliding table 33, a first lifting cylinder 34 and a second bidirectional clamping cylinder 35, the driving motor 31 is fixed above the working platform 10 through a bracket 11, the screw rod 32 is horizontally arranged, a ball nut 321 is in threaded connection with the screw rod 32, the top surface of the ball nut 321 is connected with a sliding rail, the bottom surface of the ball nut 321 is connected with the transverse sliding table 33, the driving motor 31 drives the transverse sliding table 33 to move along the X-axis direction through the screw rod 32, the transverse sliding table 33 can drive the lifting cylinder 34 to move along the Y-axis direction, the output shaft of the lifting cylinder 34 is fixedly connected with the second bidirectional clamping cylinder 35 and can drive the second bidirectional clamping cylinder 35 to move along the Z-axis direction, and second clamping plates 351 are respectively arranged on output shafts at two ends of the second bidirectional clamping cylinder 35, and the test fixture 70 is clamped by the second clamping plate 351. After the positioning mechanism 60 positions the test fixture 70 to a certain position, the positioning mechanism 60 returns to the original position, and the driving mechanism 30 drives the second bi-directional clamping cylinder 35 to move to a corresponding position, and the test fixture 70 is clamped by the two second clamping plates 351. When the test is the yields, actuating mechanism 30 can place test fixture 70 through one of them unloading hole 12 on yields unloading mechanism 40, through yields unloading mechanism 40 carries out the unloading to test fixture 70, when the test is the defective products, actuating mechanism 30 can place test fixture 70 on defective products unloading mechanism 50 through another unloading hole 12, carries out the unloading to the defective products.

Non-defective products unloading mechanism 40 with defective products unloading mechanism 50 all includes backup pad 41 and second lift cylinder 43, second lift cylinder 43 pass through guide rail 42 with backup pad 41 is connected, and can follow guide rail 42 slides, the output shaft of second lift cylinder 43 is provided with places board 44, second lift cylinder 43 can drive place board 44 and remove in vertical direction, and can drive place board 44 removes unloading hole 12 department. The driving mechanism 30 places the test fixture 70 loaded with chips on the placing board 44, and the second lifting cylinder 43 drives the test board 44 to descend for a certain distance, so that the test fixture can be continuously stacked on the placing board 44. After a certain number of test fixtures 70 are placed, the second lifting cylinder 43 may drive the test fixtures 70 to descend for a certain distance through the placing plate 44, and slide along the guide rail 42 to discharge the test fixtures 70 loaded with chips.

As shown in fig. 3 and 4, a first positioning block 441 is disposed on an upper surface of the placing plate 44, and a positioning hole 71 corresponding to the first positioning block 441 is disposed on a lower surface of the test fixture 70, wherein when the test fixture 70 is placed on the placing plate 44, the first positioning block 441 extends into the positioning hole 71 to position the test fixture 70 on the placing plate 44. The upper surface of the test fixture 70 is provided with a second positioning block 72 corresponding to the positioning hole 71, and the second positioning block 72 can also extend into the positioning hole 71 of another test fixture 70, so that the test fixtures 70 can be stacked conveniently.

The present invention can be designed in various embodiments and modifications without departing from the spirit and scope of the present invention in its broadest sense, and the above-described embodiments are intended to illustrate the present invention, but not to limit the scope of the present invention.

Claims

1. The utility model provides a chip test assembly line, includes work platform, its characterized in that, last transport mechanism and the actuating mechanism of being provided with of work platform, actuating mechanism sets up the terminal top of transport mechanism conveying, work platform's both sides are provided with yields unloading mechanism and defective products unloading mechanism respectively, work platform's both sides are provided with the unloading hole respectively, yields unloading mechanism with defective products unloading mechanism sets up two respectively the below in unloading hole, actuating mechanism can with the test fixture that the loading that has the chip on the transport mechanism passes through one of them the unloading hole is placed on the yields unloading mechanism, perhaps through another the unloading hole is placed on the defective products unloading mechanism.

2. The chip testing line of claim 1, wherein the conveying mechanism comprises a plurality of conveying rollers, and the plurality of conveying rollers are rotatably disposed on the working platform in sequence along the array.

3. The chip testing assembly line of claim 2, wherein a stop plate is disposed at a conveying end of the conveying mechanism, and the stop plate is fixedly connected to the working platform and is used for preventing the testing jig loaded with the chip from moving continuously in an original direction.

4. The chip testing assembly line of claim 3, wherein a positioning mechanism is fixedly connected to the working platform, the positioning mechanism includes a first bidirectional clamping cylinder, the first bidirectional clamping cylinder is disposed below the working platform through a fixing frame, first clamping plates are respectively connected to output shafts at two ends of the first bidirectional clamping cylinder, a top end of each first clamping plate penetrates through the working platform through a strip-shaped hole, the first bidirectional clamping cylinder can drive the two first clamping plates to move along the strip-shaped holes, and the two first clamping plates are located right below the driving mechanism.

5. The chip testing assembly line of claim 4, wherein the driving mechanism comprises a driving motor, a lead screw, a transverse sliding table, a first lifting cylinder and a second bidirectional clamping cylinder, the driving motor is fixed above the working platform through a bracket, the lead screw drives the transverse sliding table to move along the X-axis direction, the transverse sliding table can drive the first lifting cylinder to move along the Y-axis direction, an output shaft of the first lifting cylinder is fixedly connected with the second bidirectional clamping cylinder and can drive the second bidirectional clamping cylinder to move along the Z-axis direction, second clamping plates are respectively arranged on output shafts at two ends of the second bidirectional clamping flag rod, and the testing fixture is clamped through the second clamping plates.

6. The chip testing assembly line of claim 5, wherein the good product unloading mechanism and the defective product unloading mechanism each comprise a support plate and a second lifting cylinder, the second lifting cylinder is connected with the support plate through a guide rail and can slide along the guide rail, an output shaft of the second lifting cylinder is provided with a placing plate, and the second lifting cylinder can drive the placing plate to move in a vertical direction and can drive the placing plate to move to the unloading hole.

7. The chip testing assembly line of claim 6, wherein a first positioning block is disposed on an upper surface of the placing plate, a positioning hole corresponding to the first positioning block is disposed on a lower surface of the testing jig, and a second positioning block corresponding to the positioning hole is disposed on an upper surface of the testing jig.