CN212111536U

CN212111536U - Guiding device for testing connector

Info

Publication number: CN212111536U
Application number: CN202020690043.8U
Authority: CN
Inventors: 王利华
Original assignee: Nanjing Ailong Automation Equipment Co ltd
Current assignee: Nanjing Ailong Automation Equipment Co ltd
Priority date: 2020-04-29
Filing date: 2020-04-29
Publication date: 2020-12-08
Anticipated expiration: 2030-04-29

Abstract

The utility model discloses a guiding device of test connector, including PCB board and probe subassembly, PCB board top edge department establishes and has vertically seted up many slots towards the PCB board around inserting the connector and, passes slot connection and evenly is equipped with a plurality of through-holes to inserting connector and top, inserts to inserting the connector outside and is equipped with the fixed plate, is connected with the clamp plate on the fixed plate, and the probe subassembly passes clamp plate, fixed plate and inserts the connector to inserting and be connected with the machine, the utility model discloses compact structure, accurate direction reduces probe deformation space, reduces the probe spoilage, reduces the mismeasurement and is bad, reduces the testing cost.

Description

Guiding device for testing connector

Technical Field

The utility model relates to a connector technical field, concretely relates to test connector's guider.

Background

The PCB can replace complex wiring, simplify the assembly and welding work of electronic products, has the functions of high density, high reliability, designability, producibility, testability, assemblability, maintainability and the like, and can detect the connectivity of the PCB products through various testing equipment and instruments and the like for the qualification rate test of the PCB.

With the development of chip technology, the density of electrodes on a PCB is high, a traditional instrument is not suitable for testing the PCB, and a probe jig is adopted for detection nowadays.

Disclosure of Invention

In order to solve the problems, the utility model aims at providing a guiding device of test connector, through machine plug connector and to inserting the accurate of connector to add fixed plate and clamp plate in the probe outside, the protection probe avoids exposing the probe outside and causes bending deformation because of reasons such as colliding with, and the defective rate when reducing PCB trigger plug-in components test reduces use cost.

The utility model adopts the technical proposal that:

the utility model provides a guider of test connector, includes PCB board and probe subassembly, and one side edge department establishes the connector of inserting and has seted up many slots along vertical orientation PCB board all around on the PCB board, passes slot connection has evenly to be equipped with a plurality of through-holes at connector and top of inserting, inserts and is equipped with the fixed plate to inserting the connector outside, is connected with the clamp plate on the fixed plate, and the probe subassembly passes clamp plate, fixed plate and is connected with the connector of inserting to inserting.

Preferably, the fixing plate and the pressing plate are coaxially and oppositely provided with through grooves and mounting holes which are the same in size, the fixing of the fixing plate and the pressing plate is enhanced, the through grooves are formed in a stacking mode, the inner portion of the through grooves is convenient to insert, and the inserting region of the probe determined by the inserting connector is guided.

Preferentially, the through groove one side on the pressing plate is provided with a groove, the side face of the plug-in connector is matched with the groove, the through groove and the slot, a plurality of strip-shaped blocks are arranged on the through groove, the through groove and the slot, the plug-in connector, the fixing plate and the plug-in connector are connected in an alternating mode through the groove, the through groove and the slot, a guide protection shell of the probe is formed, and accurate guide connection of the probe and the connector is guaranteed.

Preferably, the probe assembly comprises a fixed block and a plurality of probes equidistantly inserted into the fixed block, a connecting sleeve is arranged at the lower end of each probe, and the probes are matched with the through holes in the longitudinal direction.

Preferentially, evenly be equipped with a plurality of vertical ascending connectors in the machine inserting connector, the adapter sleeve diameter is greater than the connector diameter, the probe pass through the adapter sleeve with the connector interlude is connected.

Preferably, the number of the probes, the number of the through holes and the number of the connectors are equal.

Preferably, the length of the probe at the lower end of the fixing block is greater than the sum of the thickness of the pressing plate, the thickness of the fixing plate and the thickness of the opposite plug connector.

Preferentially, the area of the top of the plug connector is smaller than that of the through groove, the diameter of the connecting sleeve is smaller than that of the through hole, the deformable space of the probe is reduced, the damage rate of the probe is reduced, and the test cost is reduced.

The utility model has the advantages that:

1. the probe assembly and the PCB are provided with the pressing plate and the fixing plate, and the inserting connector and the machine inserting connector are connected in an inserting mode and assembled to form a protection mechanism of the probe, so that the probe is prevented from being completely deformed due to overlarge inserting force when the probe is in direct contact with the connector, the probe and the connector in the machine inserting connector are damaged, and the testing cost is increased;

2. the through holes are uniformly formed in the inserting connector, the matched connector and the probes are relatively provided with the through grooves, the inserting connector is inserted into the through grooves in an inserting mode, the deformation range of the probes in the through holes is narrowed, the deformation damage rate of the probes is reduced, the test qualification rate of the PCB is effectively improved, and the test cost is reduced.

Drawings

The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention, and together with the description serve to explain the invention and not to limit the invention. In the drawings:

FIG. 1 is an overall view of the structure of the present invention;

fig. 2 is an exploded view of the installation of the present invention.

Labeled as: the PCB comprises a PCB (printed circuit board), a machine-inserting connector 2, a slot 21, a connector 22, a butt-inserting connector 3, a through hole 31, a strip-shaped block 32, a fixing plate 4, a through groove 41, a groove 411, a mounting hole 42, a pressing plate 5, a probe assembly 6, a fixing block 61, a probe 62, a probe 621 and a connecting sleeve.

Detailed Description

As shown in fig. 1-2, a guiding device for a test connector comprises a PCB board 1 and a probe assembly 6, wherein an inserting connector 2 is disposed at an upper edge of the PCB board 1, a plurality of slots 21 are disposed around the inserting connector 2 and facing the PCB board 1 along a longitudinal direction, and a plurality of vertically upward connectors 22 are uniformly disposed in the inserting connector 2.

As shown in fig. 2, the insertion slot 21 is connected with the opposite insertion connector 3, the top of the opposite insertion connector 3 is uniformly provided with a plurality of through holes 31, the area of the top of the opposite insertion connector 3 is smaller than that of the through groove 41, the deformable space of the probe 62 is reduced, the damage rate of the probe 62 is reduced, the test cost is reduced, the fixing plate 4 is inserted outside the opposite insertion connector 3, the pressing plate 5 is connected onto the fixing plate 4, and the probe assembly 6 penetrates through the pressing plate 5, the fixing plate 4 and the opposite insertion connector 3 to be connected with the opposite insertion connector 2.

As shown in fig. 2, through grooves 41 and mounting holes 42 with the same size are respectively formed at the coaxial opposite positions of the fixing plate 4 and the pressing plate 5, so as to strengthen the fixing of the fixing plate 4 and the pressing plate 5, and the fixing plates are stacked to form a longer through groove 41 and facilitate the internal plugging to guide the plugging area of the probe 62 determined by the plug connector 3.

As shown in fig. 2, a groove 411 is formed on one side of the through groove 41 on the pressing plate 5, a plurality of bar-shaped blocks 32 are arranged on the side surface of the mating connector 3 matching the groove 411, the through groove 41 and the insertion groove 21 and penetrate through the groove 411, the through groove 41 and the insertion groove 21 to enable the mating connector 3, the fixing plate 4 and the mating connector 2 to be inserted and connected, so that a guiding protection shell of the probe 62 is formed, and accurate guiding connection between the probe 62 and the connecting head 22 is ensured.

As shown in fig. 1-2, the probe assembly 6 includes a fixed block 61 and a plurality of probes 62 equidistantly inserted into the fixed block 61, a connection sleeve 621 is disposed at a lower end of each probe 62, a diameter of the connection sleeve 621 is smaller than a diameter of the through hole 31, the probes 62 are longitudinally matched with the through hole 31, a length of the probe 62 at the lower end of the fixed block 61 is greater than a thickness of the pressing plate 5, a sum of the thickness of the fixed plate 4 and a thickness of the opposite insertion connector 3, the diameter of the connection sleeve 621 is greater than a diameter of the connector 22, the probes 62 are inserted into and connected with the connector 22 through the connection sleeve 621.

The utility model has the advantages that: compact structure, accurate direction reduces probe deformation space, reduces the probe spoilage, reduces misdetection and bad, reduces the test cost.

Although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments described in the foregoing embodiments, or equivalents may be substituted for elements thereof. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A kind of guiding device which tests the interface unit, including PCB board and probe assembly, characterized by that: the PCB board upper side edge department establishes the plug connector and has vertically all around seted up many slots towards the PCB board, passes slot connection has plug connector and top and evenly is equipped with a plurality of through-holes, and plug connector outside is inserted and is equipped with the fixed plate, is connected with the clamp plate on the fixed plate, and the probe subassembly passes clamp plate, fixed plate and plug connector and be connected.

2. The guide for a test connector of claim 1, wherein: the coaxial opposite positions of the fixed plate and the pressure plate are respectively provided with a through groove and a mounting hole with the same size.

3. The guide for a test connector of claim 2, wherein: a groove is formed in one side of the through groove in the pressing plate, a plurality of strip-shaped blocks are arranged on the side face of the opposite-insertion connector in a matched mode with the groove, the through groove and the inserting groove, and penetrate through the groove, the through groove and the inserting groove to enable the opposite-insertion connector, the fixing plate and the machine-insertion connector to be connected in an inserting mode.

4. The guide for a test connector of claim 1, wherein: the probe subassembly includes fixed block and a plurality of probes of equidistance interlude in the fixed block, and the probe lower extreme is equipped with the adapter sleeve, and probe and through-hole are vertical phase-match.

5. The guide for a test connector of claim 4, wherein: evenly be equipped with a plurality of perpendicular ascending connectors in the machine inserts the connector, the adapter sleeve diameter is greater than the connector diameter, the probe pass through the adapter sleeve with the connector interlude is connected.

6. The guide for a test connector of claim 5, wherein: the number of the probes, the number of the through holes and the number of the connectors are equal.

7. The guide for a test connector of claim 4, wherein: the length of the probe at the lower end of the fixing block is larger than the sum of the thickness of the pressing plate, the thickness of the fixing plate and the thickness of the opposite plug connector.

8. The guide for a test connector of claim 2, wherein: the area of the top of the opposite plug connector is smaller than that of the through groove, and the diameter of the connecting sleeve is smaller than that of the through hole.