CN210376668U

CN210376668U - Radar high-low temperature testing device

Info

Publication number: CN210376668U
Application number: CN201921129091.3U
Authority: CN
Inventors: 魏新朋; 石常鑫
Original assignee: Beijing Dao Ruida Technology Co ltd
Current assignee: Beijing Dao Ruida Technology Co ltd
Priority date: 2019-07-17
Filing date: 2019-07-17
Publication date: 2020-04-21
Anticipated expiration: 2029-07-17

Abstract

The utility model relates to a temperature test technical field discloses a radar high low temperature testing arrangement. The radar high-low temperature testing device comprises a testing frame and at least one testing board arranged on the testing frame, wherein a plurality of interfaces are arranged on each testing board, the interfaces are used for being connected with a socket of a radar, and the inserting direction of the interfaces and the socket is perpendicular to the testing board. Interface on the radar test station is pegged graft along the direction of perpendicular to test panel with the socket of radar, and easy to assemble and dismantlement radar, and because the gravity of radar and hard when installing the radar are in same direction, connect the reliability height, do not need other appurtenance also can install the radar fast, saved the occupation space of radar test station, improved radar high low temperature testing arrangement's space utilization.

Description

Radar high-low temperature testing device

Technical Field

The utility model relates to a temperature test technical field especially relates to a radar high low temperature testing arrangement.

Background

Present high low temperature test frock when carrying out high low temperature test to radar complete machine product, places the test jig in the high low temperature chamber, and the test jig is the structure that the multilayer was arranged, has the space that supplies the radar to place on every layer of test jig, and the space of placing the radar is inside to have the interface, and the space that corresponds every radar on the test jig is equipped with the quick clamp. When installing the radar on the test jig, place the radar in the space earlier, through operation quick clamp, make quick clamp exert the power towards the interface to the radar, push the socket of radar to the interface and with interface connection.

The radar high-low temperature testing device in the prior art has the following defects: 1. only one row of radars can be placed on each layer of test frame, and the space cannot be fully utilized; 2. the structure is complex, the number of devices such as quick clamps is large, and the manufacturing cost is high; 3. the operation is complicated, when the installation radar, earlier need place the radar in the radar space, and the clamp force that recycles quick clamp makes the socket and the interface connection of radar, when collecting the radar, need move away the quick clamp earlier, then extracts the radar from the interface with strength.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a high low temperature testing arrangement of radar, easy to assemble and dismantlement radar have improved testing arrangement's space utilization.

To achieve the purpose, the utility model adopts the following technical proposal:

the utility model provides a high low temperature testing arrangement of radar, includes the test jig and installs at least one deck on the test jig is surveyed the board, every layer be equipped with a plurality of interfaces on the survey board, the interface is used for being connected with the socket of radar, just the interface with the grafting direction perpendicular to of socket survey the board.

Preferably, a positioning component is provided on the test plate for positioning the radar on the test plate in a direction perpendicular to the test plate.

Preferably, the positioning assembly comprises two positioning holes formed in the test board, and an ear plate on the radar is inserted into the positioning holes.

Preferably, the positioning component comprises a boss arranged on the test board, and the boss is matched and connected with a groove on the radar.

Preferably, the test plate is in sliding connection with the test rack.

Preferably, the test rack is provided with a limiting member, and the limiting member is used for limiting the length of the test board pulled out to 1/3 of the length of the test board along the pulled-out direction.

Preferably, the plurality of interfaces disposed on each layer of the test board are arranged in a row.

Preferably, two adjacent interfaces in the same row are arranged so that the distance between two adjacent radars respectively connected to the interfaces is not less than 20 mm.

Preferably, the bottom of the test board is provided with a wire groove, and a data line and a power line connected with the interface are placed in the wire groove.

Preferably, the interface includes an insertion block, the insertion block is embedded in the test board, a plurality of probes are detachably connected to the insertion block, one ends of the probes extend to the outer side of the insertion block and are connected with the data line and the power line, and the other ends of the probes are flush with the surface of the insertion block; the probe is a concave probe.

The utility model has the advantages that: the utility model provides a high low temperature testing arrangement of radar can set up the multilayer and survey test panel, every layer is surveyed and is set up a plurality of interfaces on the test panel, the socket of interface and radar is pegged graft along the direction that the perpendicular to surveyed the test panel, easy to assemble with dismantle the radar, and because the gravity of radar with install hard when the radar in same direction, it is high to connect the reliability, do not need other appurtenance also can install the radar fast, saved the shared space of radar installation, the space utilization of high low temperature testing arrangement of radar has been improved.

Drawings

Fig. 1 is a schematic structural diagram of a radar high and low temperature testing device provided by an embodiment of the present invention;

FIG. 2 is an enlarged schematic view at A in FIG. 1;

fig. 3 is a distribution schematic diagram of the radar test station provided by the embodiment of the present invention.

In the figure:

1. a test board; 2. a radar test station; 21. an interface; 211. an insertion block; 212. a probe; 22. positioning holes; 3. a test jig; 4. a slide rail; 5. a wire guide groove; 6. a radar; 61. a socket; 62. an ear plate.

Detailed Description

In order to make the technical problem solved by the present invention, the technical solutions adopted by the present invention and the technical effects achieved by the present invention clearer, the following will be described in further detail with reference to the accompanying drawings, and obviously, the described embodiments are only some embodiments of the present invention, but not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by the skilled in the art without creative work belong to the protection scope of the present invention.

In the description of the present invention, unless expressly stated or limited otherwise, the terms "connected," "connected," and "fixed" are to be construed broadly, e.g., as meaning permanently connected, detachably connected, or integral to one another; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

In the present disclosure, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise direct contact between the first and second features, or may comprise contact between the first and second features not directly. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.

The radar high and low temperature testing device provided by the embodiment of the invention is described in detail below with reference to fig. 1 to 3.

As shown in fig. 1 and fig. 3, the radar high and low temperature testing device includes a testing jig 3, at least one testing board 1 is installed on the testing jig 3, a plurality of interfaces 21 are provided on the testing board 1, each interface 21 is correspondingly provided with a positioning component, the interface 21 is used for being connected with a socket 61 of a radar 6, and the positioning component positions the radar 6 on the testing board 1. Each interface 21 and its corresponding positioning assembly form a radar test station 2.

Specifically, the test board 1 is slidably mounted on the test rack 3, so that the test board 1 can be pulled out, and the radar 6 is convenient to mount. In this embodiment, the testing jig 3 can be provided with a sliding rail 4, the testing board 1 is provided with a pulley, and the pulley is embedded into the sliding rail 4, so that the sliding connection between the testing board 1 and the testing jig 3 is realized. In other embodiments, the test board 1 can be slidably connected to the test rack 3 by other structures, which are not limited herein.

In order to ensure that test board 1 can withstand the force when radar 6 is mounted, the length by which test board 1 is pulled out is set to 1/3 which is the length of test board 1 in the direction in which it is pulled out. The test rack 3 is provided with a limiting part for limiting the length of the test board 1 pulled out. The limiting members may be a baffle plate disposed on the testing jig 3 and a stopper disposed on the testing board 1, and the stopper is stopped by the baffle plate during the process of pulling out the testing board 1, so as to ensure that the testing board 1 is pulled out by a specified length. In addition, the limiting element may have other structures, and is not limited herein.

Referring to fig. 2 and fig. 3, the test board 1 is provided with a plurality of interfaces 21, the interfaces 21 are embedded in the test board 1, and the insertion direction of the interfaces 21 and the sockets 61 is perpendicular to the test board 1. This grafting mode is easy to assemble and dismantles radar 6, and because the gravity of radar 6 and the hard when installing radar 6 are in same direction, connect the reliability height, do not need other appurtenance also can install radar 6 fast, saved the shared space of radar 6 installation, improved radar high low temperature testing arrangement's space utilization.

Specifically, the interface 21 includes the insertion block 211, the insertion block 211 is embedded in the test board 1, the surface of the insertion block 211 is lower than the surface of the test board 1, the interface 21 does not occupy the installation space of the radar 6, and the connection stability is good. A plurality of probes 212 are detachably connected to the plug block 211, one end of each probe 212 extends to the outer side of the plug block 211, and the other end of each probe 212 is flush with the surface of the plug block 211 and is used for being connected with the socket 61 of the radar 6. The interface 21 is embedded in the test board 1, occupies no space, and has good stability in connection with the socket 61.

In this embodiment, the probe 212 is a concave probe, the concave probe includes a sleeve, a probe head and a bonding wire end, the probe head and the bonding wire end are disposed at two ends of the sleeve, a spring is disposed in the sleeve, one end of the probe head is disposed in the sleeve, an end of the probe head abuts against the spring, and a groove is disposed at an end of the other end of the probe head. The contact type connection mode of the socket 61 and the interface 21 is realized without accurate positioning, the socket 61 can be conveniently plugged and unplugged, plugging and unplugging are labor-saving, and the interface 21 and the socket 61 cannot be damaged in the plugging and unplugging process. The probes 212 are provided with springs to ensure the stability of the contact connection of the socket 61 with the interface 21 during the test.

The bottom of the test board 1 is provided with a wire groove 5, a data line and a power line are arranged in the wire groove 5, and one end of the welding wire end, which is arranged outside the sleeve, is connected with the data line and the power line. The data line and the power line are placed in the wire groove 5, so that the data line and the power line are protected from being damaged, and the attractiveness of the testing device is improved.

In order to further improve the stability of the connection between the radar 6 and the interface 21, the test board 1 is provided with a positioning component, and in order to save the space occupied by the installation of the radar 6, the positioning component positions the radar 6 on the test board 1 in the direction perpendicular to the test board 1.

Specifically, as shown in fig. 3, the positioning assembly includes two positioning holes 22 formed in the test board 1, four ear plates 62 on the radar 6 are respectively disposed at four corners of the radar 6, and the two ear plates 62 disposed on the same side as the socket 61 are inserted into the positioning holes 22, so that the reliability of the connection between the socket 61 of the radar 6 and the interface 21 is improved. When installing radar 6, when interface 21 was pegged graft to socket 61, in the locating hole 22 was pegged graft to otic placode 62, convenient connection, and can also effectively avoid radar 6 socket 61 and interface 21 to be connected the mistake. The direction of the lug plate 62 inserted into the positioning hole 22 is the same as the direction of the gravity of the radar 6, so that the connection stability of the lug plate 62 and the positioning hole 22 is improved.

The positioning assembly may further comprise a boss provided on the test board 1, the boss being in mating connection with a groove on the radar 6. In order to prevent the radar 6 socket 61 from being connected with the interface 21 wrongly, a plurality of grooves which are irregularly distributed on the radar 6 can be selected, and bosses corresponding to the grooves are arranged on the test board 1, so that the installation efficiency of the radar 6 can be improved, and the installation error rate is reduced.

Each layer of test board 1 is provided with at least one row of interfaces 21, and each row comprises a plurality of interfaces 21. In order to match the length of test board 1 pulled out of test rack 3 to 1/3 the length of test board 1 in the direction of pull-out and to place as many radars 6 as possible, each layer of test board 1 may be provided with 3 rows of interfaces 21. In order to facilitate the insertion and removal of the radars 6, the adjacent two interfaces 21 in the same row are arranged so that the distance between the adjacent two radars 6 connected thereto is not less than 20 mm. The maximum distance between two adjacent interfaces 21 is not limited, but the distance between two interfaces 21 cannot be increased without limitation in order to place more radars 6.

Because the socket 61 of the radar 6 is directly connected with the interface 21, a quick clamping part in the prior art is saved, so that the occupied space when the radar 6 is installed is reduced. At 1m³In the space, can place three rows of radars 6 on every layer of test jig 3, ten radars 6 can be placed to every row, have improved testing arrangement's space utilization greatly.

It is obvious that the above embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.

Claims

1. The utility model provides a high low temperature testing arrangement of radar, characterized in that, includes test jig (3) and installs at least one deck test panel (1) on test jig (3), every layer be equipped with a plurality of interfaces (21) on test panel (1), interface (21) are used for being connected with socket (61) of radar (6), just interface (21) with the grafting direction perpendicular to of socket (61) test panel (1).

2. The radar high and low temperature testing device according to claim 1, characterized in that a positioning component is provided on the test board (1) for positioning the radar (6) on the test board (1) in a direction perpendicular to the test board (1).

3. The radar high and low temperature test device according to claim 2, wherein the positioning assembly comprises two positioning holes (22) formed on the test board (1), and the ear plate (62) on the radar (6) is inserted into the positioning holes (22).

4. The radar high and low temperature testing device according to claim 2, wherein the positioning component comprises a boss arranged on the test board (1), and the boss is matched and connected with a groove on the radar (6).

5. The radar high and low temperature test device according to claim 1, wherein the test board (1) is slidably connected with the test frame (3).

6. The radar high and low temperature test device according to claim 5, wherein said test frame (3) is provided with a stopper for limiting the length of said test board (1) pulled out to 1/3 of the length of said test board (1) in the direction of being pulled out.

7. The radar high and low temperature test apparatus according to claim 1, wherein a plurality of the interfaces (21) provided on each layer of the test board (1) are arranged in a row.

8. The radar high and low temperature test apparatus according to claim 7, wherein two adjacent interfaces (21) in the same row are arranged so that a pitch between two adjacent radars (6) respectively connected thereto is not less than 20 mm.

9. The radar high and low temperature test device according to claim 1, wherein a wire groove (5) is formed in the bottom of the test board (1), and a data line and a power line connected to the interface (21) are disposed in the wire groove (5).

10. The radar high and low temperature test device according to claim 9, wherein the interface (21) comprises a plug block (211), the plug block (211) is embedded in the test board (1), a plurality of probes (212) are detachably connected to the plug block (211), one ends of the probes (212) extend to the outer side of the plug block (211) and are connected with the data line and the power line, and the other ends of the probes (212) are flush with the surface of the plug block (211); the probe (212) is a female probe.