CN209878944U - FCT and ICT two-in-one test fixture for real insertion test - Google Patents
FCT and ICT two-in-one test fixture for real insertion test Download PDFInfo
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- CN209878944U CN209878944U CN201920071064.9U CN201920071064U CN209878944U CN 209878944 U CN209878944 U CN 209878944U CN 201920071064 U CN201920071064 U CN 201920071064U CN 209878944 U CN209878944 U CN 209878944U
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- microscope carrier
- test box
- ict
- fct
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- 238000012360 testing method Methods 0.000 title claims abstract description 67
- 238000003780 insertion Methods 0.000 title description 4
- 230000037431 insertion Effects 0.000 title description 4
- RVCKCEDKBVEEHL-UHFFFAOYSA-N 2,3,4,5,6-pentachlorobenzyl alcohol Chemical compound OCC1=C(Cl)C(Cl)=C(Cl)C(Cl)=C1Cl RVCKCEDKBVEEHL-UHFFFAOYSA-N 0.000 claims abstract description 23
- 230000003028 elevating effect Effects 0.000 claims abstract description 9
- 239000000523 sample Substances 0.000 claims abstract description 6
- 230000007306 turnover Effects 0.000 claims abstract description 3
- 230000001737 promoting effect Effects 0.000 claims abstract 2
- 238000013522 software testing Methods 0.000 abstract description 3
- 238000012546 transfer Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The utility model discloses a two unification test fixture of FCT and ICT of test of actually inserting, the on-line screen storage device comprises a base, be provided with the test box of side push clamp and built-in singlechip on the base, be provided with the microscope carrier between side push clamp and the test box, it is connected to slide between microscope carrier and the base, be provided with elevating system in the microscope carrier, elevating system's top is provided with the chamber of placing of the PCBA that awaits measuring, place the top in chamber and the equal opening in one side of test box of orientation, it is provided with the pinhole that supplies the faller probe business turn over to place the chamber bottom, the microscope carrier is connected to the flexible end of side push clamp, be used for promoting the microscope carrier orientation/dorsad test box to remove, be provided with down clamp keysets and side keysets on the test box lateral wall relative with the microscope carrier, the flexible end connection keysets of clamp down, the keysets. The utility model discloses with FCT and ICT two unifications, improved efficiency of software testing greatly.
Description
Technical Field
The utility model relates to a insert two unification test fixture of FCT and ICT of test in fact belongs to the detection tool field.
Background
ICT is an online test, which mainly detects whether circuit board elements are inserted wrongly and whether original price parameters are normal; the FCT is an online function test and mainly detects whether the circuit board functions normally or not. When the FCT and the ICT of the circuit board are carried out, two different stations are often arranged, and the efficiency is lower through the test of two different test jigs.
SUMMERY OF THE UTILITY MODEL
The utility model provides a actually insert two unification test fixture of FCT and ICT of test has solved the problem that two traditional tool efficiency of software testing are low.
In order to solve the technical problem, the utility model discloses the technical scheme who adopts is:
an FCT and ICT two-in-one test fixture for a real insertion test comprises a base, a side push clamp and a test box with a built-in single chip microcomputer are arranged on the base, a carrying platform is arranged between the side push clamp and the test box, the carrying platform is connected with the base in a sliding manner, a lifting mechanism is arranged in the carrying platform, a needle plate matched with PCBA to be tested is arranged at the top end of the lifting mechanism, a placing cavity for the PCBA to be tested is arranged on the top surface of the carrying platform, the top of the placing cavity and one side facing the test box are both open, a needle hole for a needle plate probe to enter and exit is arranged at the bottom of the placing cavity, and a telescopic end of the side push clamp, the side wall of the test box opposite to the carrying platform is provided with a downward pressing clamp and a side adapter plate matched with the PCBA to be tested, the telescopic end of the downward pressing clamp is connected with the downward pressing adapter plate matched with the PCBA to be tested, and the downward pressing adapter plate, the side adapter plate and the needle plate are all connected with the single chip microcomputer.
The side wall of the test box is provided with a horn protection plate, the horn protection plate is provided with a line connector, and the lower pressing adapter plate, the side adapter plate and the needle plate are all connected with the single chip microcomputer through the line connector.
And an indicating component connected with the single chip microcomputer is arranged on the side wall of the test box.
The flexible end of clamp pushes down passes through the deflector and connects the keysets that pushes down, and the both sides of deflector are provided with the guiding hole, and the guiding post has worn in the guiding hole, and the both ends of guiding post all are connected with the test box lateral wall.
The deflector includes the multilayer plate body that down sets gradually from the top, connects through the spliced pole between the adjacent plate body.
The bottom surface of deflector is provided with the dead post of fool-proof card, is provided with the jack that matches with the dead post of fool-proof card on the microscope carrier top surface.
The utility model discloses the beneficial effect who reaches: the utility model discloses the faller carries out the ICT of PCBA that awaits measuring, and side keysets, push down keysets and singlechip carry out the FCT of PCBA that awaits measuring, with FCT and ICT two unifications, can accomplish the test at a station, have improved efficiency of software testing greatly.
Drawings
FIG. 1 is a perspective view of the present invention;
FIG. 2 is a side view of the present invention;
fig. 3 is a front view of the present invention.
Detailed Description
The present invention will be further described with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and the protection scope of the present invention is not limited thereby.
As shown in fig. 1, 2 and 3, an FCT and ICT two-in-one test fixture for a real insertion test includes a base 1, a side push clamp 2, a test box 4, a carrier 3, a lower clamp 5, a needle plate 14, a side adapter plate 12 and a lower adapter plate 7.
Side pushes away clamp 2 and is the common quick clamp of transversely placing on the market, side pushes away clamp 2 and passes through the support to be fixed on base 1, microscope carrier 3 is connected to the flexible end of side pushes away clamp 2, test box 4 embeds there is the singlechip, fix on base 1, the singlechip generally sets up on the control panel, the built-in software of singlechip, can read measured data, the simulation function test, microscope carrier 3 slides through slide rail 11 and sets up on base 1 between side pushes away clamp 2 and test box 4, microscope carrier 3 moves towards/dorsad test box 4 under the effect of side pushes away clamp 2.
Microscope carrier 3 includes the loading face at carriage and carriage top, be provided with elevating system 13 in the microscope carrier 3 (specifically for in the carriage), elevating system 13 can adopt common cylinder, elevating system 13's top be provided with the PCBA complex faller 14 that awaits measuring, microscope carrier 3 top surface (specifically for the loading face) is provided with the PCBA's that awaits measuring chamber 6 of placing, the top of placing chamber 6 and the equal opening in one side towards test box 4, it is provided with the pinhole that supplies the 14 probe business turn over of faller to place 6 bottoms of chamber, the 14 probe of faller is under elevating system 13's effect, stretch into/withdraw from through the pinhole and place chamber 6.
A lower pressing clamp 5 and a side transfer plate 12 matched with the PCBA to be tested are arranged on the side wall of the test box 4 opposite to the carrier 3, the side transfer plate 12 is opposite to the carrier 3, the lower pressing clamp 5 is a common quick clamp vertically placed on the market, the telescopic end of the lower pressing clamp 5 is connected with a lower pressing transfer plate 7 matched with the PCBA to be tested through a guide plate 9, guide holes are arranged at two sides of the guide plate 9, guide posts 10 penetrate through the guide holes, and two ends of each guide post 10 are connected with the side wall of the test box 4,
the deflector 9 includes from the top down sets gradually the multilayer plate body, and specific number of piles can be given according to actual conditions and decide, sets up two-layerly here, connects through the spliced pole between the adjacent plate body. The guide plate 9 with the multilayer structure can guide and simultaneously ensure that the guide plate 9 is not easy to deform in the pressing process.
The bottom surface of deflector 9 is provided with vertical fool-proof card post 15 of dying, is provided with the jack 16 that matches with fool-proof card post 15 on the microscope carrier 3 top surface. After the test is finished, the pressing adapter plate 7 needs to be withdrawn firstly, namely the pressing clamp 5 is lifted firstly, and under the action of the foolproof clamping structure, when the pressing clamp 5 is not lifted, the side-push clamp 2 cannot be operated, so that the pressing adapter plate 7 can be effectively prevented from being damaged by misoperation.
Be provided with ox horn protection shield 8 on the test box 4 lateral wall, be provided with the line connector on the ox horn protection shield 8, push down keysets 7, side keysets 12 and faller 14 and all connect the singlechip through the line connector, the operating personnel interconnecting link of being convenient for is provided with the indicating component 17 of connecting the singlechip on the test box 4 lateral wall, such as display for show the test result.
The working process of the jig comprises the following steps: put into the PCBA that awaits measuring and place chamber 6, the PCBA one end that awaits measuring that is connected with side fishplate bar 12 stretches out the opening towards test box 4, promote the side forward and push away clamp 2, to await measuring PCBA and side fishplate bar 12 peg graft, push down clamp 5, peg graft with the PCBA that awaits measuring keysets 7, start elevating system 13, jack-up faller 14, the probe of faller 14 passes the pinhole and contacts with the corresponding contact of the PCBA that awaits measuring, carry out FCT and ICT through the singlechip, the measuring result passes through the instruction part 17 and instructs, after the measurement, faller 14 descends, push down clamp 5, promote the side backward and push away clamp 2, take out the PCBA after the detection at last.
The needle plate 14 of the jig carries out ICT of the PCBA to be tested, the side adapter plate 12, the pressing adapter plate 7 and the single chip microcomputer carry out FCT of the PCBA to be tested, the FCT and the ICT are combined into a whole, testing can be completed on one station, and testing efficiency is greatly improved.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, a plurality of modifications and variations can be made without departing from the technical principle of the present invention, and these modifications and variations should also be considered as the protection scope of the present invention.
Claims (6)
1. The utility model provides a two unification test fixture of FCT and ICT of test are inserted in reality which characterized in that: the test box comprises a base, be provided with the test box of side push clamp and built-in singlechip on the base, be provided with the microscope carrier between side push clamp and the test box, it is connected to slide between microscope carrier and the base, be provided with elevating system in the microscope carrier, elevating system's top is provided with the PCBA complex faller that awaits measuring, the microscope carrier top surface is provided with the PCBA's that awaits measuring chamber of placing, place the top in chamber and the equal opening in one side towards the test box, it is provided with the pinhole that supplies the faller probe business turn over to place the chamber bottom, the microscope carrier is connected to the flexible end of side push clamp, be used for promoting the microscope carrier orientation/dorsad test box removal, be provided with down clamp on the test box lateral wall relative with the microscope carrier and with the PCBA complex side keysets that awaits measuring, the PCBA complex keysets that awaits is.
2. The FCT and ICT two-in-one test fixture for plug-in test of claim 1, wherein: the side wall of the test box is provided with a horn protection plate, the horn protection plate is provided with a line connector, and the lower pressing adapter plate, the side adapter plate and the needle plate are all connected with the single chip microcomputer through the line connector.
3. The FCT and ICT two-in-one test fixture for plug-in test of claim 1, wherein: and an indicating component connected with the single chip microcomputer is arranged on the side wall of the test box.
4. The FCT and ICT two-in-one test fixture for plug-in test of claim 1, wherein: the flexible end of clamp pushes down passes through the deflector and connects the keysets that pushes down, and the both sides of deflector are provided with the guiding hole, and the guiding post has worn in the guiding hole, and the both ends of guiding post all are connected with the test box lateral wall.
5. The FCT and ICT two-in-one test fixture for plug-in test of claim 4, wherein: the deflector includes the multilayer plate body that down sets gradually from the top, connects through the spliced pole between the adjacent plate body.
6. The FCT and ICT two-in-one test fixture for plug-in test of claim 4, wherein: the bottom surface of deflector is provided with the dead post of fool-proof card, is provided with the jack that matches with the dead post of fool-proof card on the microscope carrier top surface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920071064.9U CN209878944U (en) | 2019-01-16 | 2019-01-16 | FCT and ICT two-in-one test fixture for real insertion test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920071064.9U CN209878944U (en) | 2019-01-16 | 2019-01-16 | FCT and ICT two-in-one test fixture for real insertion test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209878944U true CN209878944U (en) | 2019-12-31 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920071064.9U Expired - Fee Related CN209878944U (en) | 2019-01-16 | 2019-01-16 | FCT and ICT two-in-one test fixture for real insertion test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209878944U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115166319A (en) * | 2022-09-08 | 2022-10-11 | 苏州尚实豪精密机械科技有限公司 | Insert test fixture in fact |
-
2019
- 2019-01-16 CN CN201920071064.9U patent/CN209878944U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115166319A (en) * | 2022-09-08 | 2022-10-11 | 苏州尚实豪精密机械科技有限公司 | Insert test fixture in fact |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20191231 |