CN206601468U - Contact power supply testing device - Google Patents
Contact power supply testing device Download PDFInfo
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- CN206601468U CN206601468U CN201621251744.1U CN201621251744U CN206601468U CN 206601468 U CN206601468 U CN 206601468U CN 201621251744 U CN201621251744 U CN 201621251744U CN 206601468 U CN206601468 U CN 206601468U
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- 238000012360 testing method Methods 0.000 title claims abstract description 242
- 230000002093 peripheral effect Effects 0.000 claims description 3
- 239000000523 sample Substances 0.000 description 9
- 229910000679 solder Inorganic materials 0.000 description 4
- 238000003780 insertion Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000003032 molecular docking Methods 0.000 description 1
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Abstract
The utility model relates to the field of electronic instrument testing, and provides a contact power supply testing device, which comprises a base, a portal frame erected on the base, a board card testing component and a pressing component arranged at the top of the portal frame and used for pressing a board card; the base is provided with a guide rail and a first driving mechanism, the board card testing assembly is arranged on the guide rail, and the first driving mechanism drives the board card testing assembly to move along the guide rail; a test pin receiving port is arranged at the lower end of the portal frame, and a test pin input port corresponding to the test pin receiving port is arranged on the side part, opposite to the test pin receiving port, of the board card test assembly; when the first driving mechanism drives the board card testing assembly to move into the portal frame, the testing pin input port and the testing pin receiving port are correspondingly plugged. The utility model discloses a contact power supply testing arrangement, the during operation wire can not be along with the test box motion to the phenomenon of avoiding the wire to be dragged by the test box takes place.
Description
Technical field
The utility model is related to electronic instrument testing field, more particularly to a kind of contact power supply testing device.
Background technology
When the function to board is tested, it is usually that board is fixed in the board fixed plate of testing cassete, makes plate
Solder joint on card is contacted with the probe of testing cassete, and then probe conducts the electric signal of solder joint to test device, with to board
Electrical property is tested;In order that the solder joint of board is effectively contacted, it is necessary to which testing cassete is navigated into frock with the probe of testing cassete
On fixture, promote thimble to move downward by cylinder and board is compressed to solder joint and probe reliable contacts so that board.
And for the ease of automation mechanized operation, by testing cassete there is provided feeding/unloading station and test station, and driven by cylinder
Dynamic testing cassete is moved back and forth between the two stations, and still, the probe of existing testing cassete is by wire and test device
Connection, when testing cassete is moved back and forth between that two stations, wire can also be pullled by testing cassete and moved therewith,
Wire, which is pullled, can frequently make the junction fatigue of wire and probe cause loose contact, influence testing result;Meanwhile, wire also can
Easily it is torn and frequently changes, influences the testing efficiency of board.
Utility model content
The purpose of this utility model is to provide the contact power supply testing device that a kind of wire will not be moved with testing cassete, with
Wire is avoided to be tested the phenomenon generation that box is pullled, to improve the stability that the probe of testing cassete is connected with test device, and together
It is the testing efficiency for improving board.
To achieve these goals, the utility model provides a kind of contact power supply testing device, including base, is erected at
Portal frame, board test suite on the base and it is arranged at the top of the portal frame, the compression for compressing board
Component;The base is provided with guide rail and the first drive mechanism, and the board test suite is arranged on the guide rail, and described the
One drive mechanism drives the board test suite to be moved along the guide rail;The lower end of the portal frame is received provided with test pin
Port, is provided with and the test pin on the board test suite on the sidepiece opposite with the test pin receiving port
The corresponding test pin input port of receiving port;When first drive mechanism drives the board test suite shift-in institute
When stating portal frame, test pin input port grafting corresponding with the test pin receiving port.
Preferably, the lower end of the portal frame is provided with transverse slat, and the two ends of the transverse slat are connected across the dragon respectively
On two relative columns of door frame;The test pin receiving port includes pin integrated package and multiple first pins, described
Pin integrated package is fixed on the middle part of the transverse slat, and multiple first pin arrangements are and described on the pin integrated package
The two ends of first pin are passed from the pin integrated package.
Preferably, the test pin input port includes multiple second pins, multiple second pin rows
Be listed on the sidepiece, and one end of the second pin is extend into the board test suite, the second pin it is another
Expose the board test suite in one end;When first drive mechanism drives the board test to be moved into the portal frame,
The first pin connection corresponding with the second pin.
Preferably, the sidepiece of the board test suite is provided with relative with the pin integrated package position
The interface answered;When first drive mechanism drives the board test to be moved into the portal frame, the pin integrated package
Correspondence is plugged in the interface.
Preferably, the board test suite includes testing cassete and the upper opening surrounded by bottom plate and side wall
Testing cassete set casing;The bottom of the testing cassete set casing is connected on the guide rail, the testing cassete set casing with it is described
The opposite side wall of test pin receiving port is provided with the pin integrated package correspondence grafting for the test pin receiving port
Interface;The inner side of the side wall of the testing cassete set casing is provided with and held down assembly, and at least the one of the compact heap held down assembly
Part can be stretched out and retract from the inner side of the side wall of the testing cassete set casing;When testing cassete opening from the testing cassete set casing
When mouth inserts the testing cassete set casing, the compact heap is resisted against on the side wall of the testing cassete.
Preferably, it is described to hold down assembly including the first elastic component, the compact heap and fixed block, first bullet
Property part one end be connected on the inner side of side wall of the housing, the other end of first elastic component connects the compact heap;
The middle part of the fixed block is provided with via, and the inside sidewalls of the testing cassete set casing are provided with accepting groove;The fixed block is fixed
In the accepting groove, outside contouring and the via inside portion contour shape of the compact heap coordinate, and the compression
Block can along the through hole axial movement.
Preferably, the end face of the side wall of the compact heap stretching testing cassete set casing, which is provided with from described, surveys
Guide part and be undertaken on the guide part end that the opening of examination box set casing is set to the testing cassete set casing bottom angled
The compressed part at end.
Preferably, the testing cassete includes the opening that the housing of upper end open, Outside Dimensions are more than the housing
Outside Dimensions upper lid and board fixed plate, upper cover be removably attached to the upper end of the housing, and it is described on
The side-wall outer side that the housing is stretched out close to its peripheral region of lid, the board fixed plate can floating ground be located at the upper lid
Upper surface;The board fixed plate is provided with multiple first through hole corresponding with the bump position of board, the upper lid
The position corresponding with the first through hole is provided with the 3rd pin, and lower end and the test pin of the 3rd pin are inputted
The pin electrical connection of port, the upper surface of the upper lid is stretched out and relative with the first through hole in the upper end of the 3rd pin
Should.
Preferably, the upper end of the side wall of the testing cassete set casing is provided with alignment pin, the stretching institute of the upper lid
Provided with the positioning hole matched with the alignment pin in the region for the side-wall outer side for stating testing cassete set casing;When the testing cassete is inserted
When being connected in the testing cassete set casing, the positioning hole correspondence is socketed on the alignment pin.
Preferably, the upper lid is provided with multiple flexible positioning pieces, and the flexible positioning piece includes sleeve, positioning
Bar and the 3rd elastic component, are provided with the second through hole, institute at the board fixed plate position corresponding with the flexible positioning piece
State sleeve to be vertically fixed on the upper lid, the 3rd elastic component is in the sleeve, and one end of the locating rod can
Slidably it is socketed in the sleeve, the other end of the locating rod is provided with taper location division, and the taper location division passes institute
State the second through hole.
Contact power supply testing device of the present utility model, is provided with test pin receiving port, in plate in the lower end of portal frame
Draw on card test suite with the sidepiece that test pin receiving port is opposite provided with the test corresponding with test pin receiving terminal
Pin input port;When the first drive mechanism Driver Card test suite is moved into portal frame (i.e. testing cassete is located at test station),
The grafting corresponding with test pin receiving port of test pin input port, can be achieved testing cassete and is well electrically connected with test device,
And test is drawn when the first drive mechanism Driver Card test suite removes portal frame (i.e. testing cassete is located at feeding/unloading station)
Pin input port disconnects with test pin receiving port, now, because board need not be tested, and test pin input port is with surveying
Examination pin receiving port, which disconnects, does not influence test process, therefore, there is no need to wire and is connected testing cassete with test device, so as to
To avoid wire from being tested the phenomenon generation that box is pullled, to improve the stability that the probe of testing cassete is connected with test device, and
The testing efficiency of board is improved simultaneously.
Brief description of the drawings
Fig. 1 is the overall structure sketch of the contact power supply testing device of the utility model preferred embodiment;
Fig. 2 is the contact power supply testing device test pin input port and test pin of the utility model preferred embodiment
The attachment structure schematic diagram of receiving port;
Fig. 3 is the overall structure sketch of the testing cassete set casing of the utility model preferred embodiment;
Fig. 4 is the overall structure sketch of the testing cassete of the utility model preferred embodiment.
Wherein, 1, base;11st, guide rail;12nd, the first drive mechanism;2nd, portal frame;3rd, board test suite;31st, testing cassete
Set casing;310th, interface;311st, testing cassete fixes shell side wall;312nd, compact heap;313rd, the first elastic component;314th, accepting groove;
315th, fixed block;316th, via;317th, guide part;318th, compressed part;319th, alignment pin;32nd, testing cassete;320th, housing, 321,
Testing cassete side wall;322nd, upper lid;323rd, board fixed plate;324th, first through hole;325th, elastic supporting member for supporting optical member;3251st, guide cylinder;
3252nd, support bar;326th, the 3rd pin;327th, positioning hole;328th, flexible positioning piece;3281st, sleeve;3282nd, locating rod;
3283rd, taper location division;329th, the second through hole;4th, hold down assembly;41st, the second drive mechanism;42nd, lower platen;5th, transverse slat;50、
Pin passes through hole;6th, test pin receiving port;61st, pin integrated package;62nd, the first pin;7th, test pin input port;
70th, second pin.
Embodiment
With reference to the accompanying drawings and examples, embodiment of the present utility model is described in further detail.Below
Embodiment is used to illustrate the utility model, but is not limited to scope of the present utility model.
With reference to shown in Fig. 1 and Fig. 4, the contact power supply testing device of the utility model embodiment is schematically showed, its
Including base 1, the portal frame being erected on base 12, board test suite 3 and the top of portal frame 2 is arranged on, for pressing
Tight board holds down assembly 4;The drive mechanism 12 of guide rail 11 and first is provided with base 1, the board test suite 3, which is arranged on, leads
On rail 11, the Driver Card test suite 3 of the first drive mechanism 12 is moved along guide rail 11;Draw in the lower end of portal frame 2 provided with test
Pin receiving port 6, is provided with the sidepiece opposite with test pin receiving port 6 on board test suite 3 and is connect with test pin
6 corresponding test pin input ports 7 of receiving end mouthful.
When the Driver Card test suite 3 of the first drive mechanism 12 is moved into portal frame 2, test pin input port 7 is with surveying
The corresponding grafting of pin receiving port 6 is tried, testing cassete can be achieved and is well electrically connected with test device, and when the first drive mechanism 12 is driven
When dynamic board test suite 3 removes portal frame 2 (i.e. testing cassete is located at feeding/unloading station), test pin input port 7 is with surveying
Examination pin receiving port 6 disconnects, now, because board need not be tested, test pin input port 7 and test pin receiving terminal
The disconnection of mouth 6 does not influence test process, therefore, there is no need to wire and is connected testing cassete with test device, so as to avoid leading
Line is tested the phenomenon generation that box is pullled, and to improve the stability that the probe of testing cassete is connected with test device, and improves simultaneously
The testing efficiency of board.
Incorporated by reference to shown in Fig. 1 and Fig. 2, transverse slat 5 can be set in the lower end of portal frame 2, the two ends of the transverse slat 5 are bridged respectively
On two relative columns of portal frame 2;Test pin receiving port 6 can draw including pin integrated package 61 and multiple first
Pin 62, the pin integrated package 61 is fixed on the middle part of transverse slat 5, and multiple first pins 62 are arranged on pin integrated package 61, and the
The two ends of one pin 62 are passed from pin integrated package 61;One end of first pin 62 can be connected by wire and test device point
Connect, the other end of the first pin 62 is used for docking corresponding with test pin input port 7;It can set and draw at the middle part of transverse slat 5
Via 50 is worn, so that the first pin 62 is passed through, it is to avoid the wire being connected with the first pin 62 needs to bypass transverse slat 5, causes to connect
Touch bad.
Incorporated by reference to shown in Fig. 2 and Fig. 4, test pin input port 7 includes multiple second pins 70, multiple second pins 70
It is arranged on the sidepiece corresponding with test pin receiving port 6 of board test suite 3, and one end of second pin 70 is extend into
In board test suite 3, the other end of second pin 70 exposes board test suite 3;In the test pin of board test suite 3
The corresponding sidepiece of receiving port 6 is provided with the interface 310 corresponding with the position of pin integrated package 61;When the first drive mechanism
When 12 Driver Card test suites 3 are moved into portal frame 2, the pin integrated package 61 correspondence is plugged in interface 310.
Incorporated by reference to shown in Fig. 1 to Fig. 4, board test suite 3 include testing cassete 32 and by bottom plate and side wall surround it is upper
The testing cassete set casing 31 of portion's opening;The bottom of testing cassete set casing 31 is connected on guide rail 11, and interface 310 is arranged on test
Box set casing 31 and the opposite side wall of test pin receiving port 6, i.e. testing cassete are fixed on shell side wall 311;Testing cassete set casing
The inner side of 31 side wall is provided with holding down assembly, and at least a portion of the compact heap 312 held down assembly can be from testing cassete set casing
The inner side of 31 side wall is stretched out and retracted;When testing cassete 32 is from the insertion of the opening of testing cassete set casing 31, compact heap 312 against
On the side wall of testing cassete 32.
Preferably, hold down assembly including compact heap 312, the first elastic component 313 and fixed block 315, the first elasticity
One end of part 313 is connected on the inner side of side wall of testing cassete set casing 31, the other end connection compact heap of the first elastic component 313
312;The middle part of fixed block 315 is provided with via 316, and the inside sidewalls of testing cassete set casing 31 are provided with accepting groove 314;Fixed block
315 are fixed in accepting groove 314, and outside contouring and the inside portion contour shape of via 316 of compact heap 312 coordinate, and compress
Block 312 can along via 316 axial movement.
When testing cassete 32 inserts testing cassete set casing 31 from opening, the side wall of testing cassete 32 can pushing tow compact heap 312
Retract, and compact heap 312 can be then resisted against on the side wall of testing cassete 32 all the time due to the reaction force of the first elastic component 313, from
And to carry out reliable location to testing cassete 32, prevent testing cassete is freeed from rocking;And due to the compressible of the first elastic component 313 and return
The performance of bullet so that compact heap 312 can stretch out and retract a trip, so as to allow with various sizes of testing cassete
It is fixed in insertion testing cassete set casing 310, the versatility of testing cassete fixing device is improved with this, and operate also extremely
It is convenient, the testing efficiency of board can be improved.
Self-test box set casing 31 is set on the end face for the side wall that testing cassete set casing 31 can be stretched out in compact heap 312
Be open to the bottom angled of testing cassete set casing 31 guide part 317 and be undertaken on the compressed part 318 of the end of guide part 317;Lead
There is guide effect to testing cassete 32 to portion 317, in favor of the insertion of testing cassete 32, and by compressed part 318 by testing cassete 32
It is fixed.
Incorporated by reference to shown in Fig. 1 to Fig. 4, testing cassete 32 includes the housing 320 of upper end open, Outside Dimensions and is more than housing 320
Opening Outside Dimensions upper lid 322 and board fixed plate 323, upper lid 322 is removably attached to the upper of housing 320
End, and the side-wall outer side that housing 320 is stretched out close to its peripheral region of upper lid 322, board fixed plate 323 can floating ground be located at
The upper surface of upper lid 322;Board fixed plate 323 is provided with multiple first through hole 324 corresponding with the bump position of board,
Upper lid 322 position corresponding with first through hole 423 is provided with the 3rd pin 326, the lower end of the 3rd pin 326 and test pin
The second pin 70 of input port 7 is electrically connected, and upper surface and and the first through hole of upper lid 322 are stretched out in the upper end of the 3rd pin 326
324 is corresponding.
Multiple elastic supporting member for supporting optical member 325 are provided with upper lid 322, the elastic supporting member for supporting optical member 325 includes guide cylinder 3251, support bar
3252 and second elastic component (not shown), guide cylinder 3251 is vertically fixed on lid 322 and extend into housing 320, and
Two elastic components in the guide cylinder 3251, one end of support bar 3252 be slideably socketed in guide cylinder 3251 and its end face with
First elastic component is abutted, and the other end fixed connecting plate of support bar 3252 fixes the lower surface of fixed board 323;When testing jig (is not schemed
Show) push rod from top to bottom push plate fix fixed board 323 when, the second elastic component is compressed, and board fixed plate 323 is moved downward,
When 4 the second drive mechanism 41 of holding down assembly drives 42 lifting of lower platen, the second elastic component is replied so as to by support bar 3252
It is extrapolated to guide cylinder 3251 so that board fixed plate 323 is moved upwards.
Multiple flexible positioning pieces 328 can be provided with upper lid 322, the flexible positioning piece 328 includes sleeve 3281, positioning
The elastic component (not shown) of bar 3282 and the 3rd, provided with the at the position corresponding with flexible positioning piece 323 of board fixed plate 323
Two through holes 329, sleeve 3281 is vertically fixed on lid 322, and the 3rd elastic component is located in sleeve 3281, locating rod 3282
One end is slideably socketed in sleeve 3281, and the other end of locating rod 3282 is provided with taper location division 3283, and the taper is fixed
Position portion 3283 passes the second through hole 329;Flexible positioning piece 328 (can not scheme to the board being put into board fixed plate 323
Show) it is accurately positioned, when being positioned to board, the datum hole on board is socketed on taper location division 3283, taper
Location division 3283 can adaptively be adjusted to the position of board, with the accuracy for the positioning for improving board.
Alignment pin 319 can be provided with the upper end of the side wall of testing cassete set casing 31, be stretched in the upper lid 323 of testing cassete 32
Provided with the positioning hole 327 matched with alignment pin 319 in the region for the side-wall outer side for going out housing 320;When testing cassete 32 is plugged in
When in testing cassete set casing 31, the correspondence of positioning hole 327 is socketed on alignment pin 319;Using this positioning method, it will can test
Box 32 is navigated on testing cassete set casing 31 exactly, and the influence of its positioning accuracy not size of tested person box 32.
Described above is only preferred embodiment of the present utility model, it is noted that for the common skill of the art
For art personnel, on the premise of the utility model technical principle is not departed from, some improvement and replacement can also be made, these change
Enter and replace and also should be regarded as protection domain of the present utility model.
Claims (10)
1. one kind contact power supply testing device, it is characterised in that including base, the portal frame being erected on the base, board
Test suite and it is arranged at the top of the portal frame, for compressing holding down assembly for board;The base is provided with guide rail
And first drive mechanism, the board test suite is arranged on the guide rail, and first drive mechanism drives the board
Test suite is moved along the guide rail;The lower end of the portal frame is provided with test pin receiving port, in the board test group
On part the test corresponding with the test pin receiving port is provided with the sidepiece that the test pin receiving port is opposite
Pin input end mouthful;When first drive mechanism drives the board test suite to be moved into the portal frame, the test
Pin input end mouthful grafting corresponding with the test pin receiving port.
2. contact power supply testing device according to claim 1, it is characterised in that the lower end of the portal frame is provided with horizontal stroke
Plate, the two ends of the transverse slat are connected across on two relative columns of the portal frame respectively;The test pin receiving port
Including pin integrated package and multiple first pins, the pin integrated package is fixed on the middle part of the transverse slat, multiple described first
Pin arrangements are on the pin integrated package, and the two ends of first pin are passed from the pin integrated package.
3. contact power supply testing device according to claim 2, it is characterised in that the test pin input port includes
Multiple second pins, multiple second pins are arranged on the sidepiece, and the second pin one end extend into it is described
In board test suite, the other end of the second pin exposes the board test suite;When first drive mechanism is driven
When the dynamic board test is moved into the portal frame, the first pin connection corresponding with the second pin.
4. the contact power supply testing device according to Claims 2 or 3, it is characterised in that the institute of the board test suite
Sidepiece is stated provided with the interface corresponding with the pin integrated package position;When first drive mechanism drives the board
When test is moved into the portal frame, the pin integrated package correspondence is plugged in the interface.
5. contact power supply testing device according to claim 1, it is characterised in that the board test suite includes test
The testing cassete set casing of box and the upper opening surrounded by bottom plate and side wall;The bottom of the testing cassete set casing is connected to institute
State on guide rail, the testing cassete set casing is provided with the opposite side wall of the test pin receiving port and supplies the test pin
The interface of the pin integrated package correspondence grafting of receiving port;
The inner side of the side wall of the testing cassete set casing is provided with and held down assembly, at least a portion of the compact heap held down assembly
It can stretch out and retract from the inner side of the side wall of the testing cassete set casing;When testing cassete is inserted from the opening of the testing cassete set casing
When entering the testing cassete set casing, the compact heap is resisted against on the side wall of the testing cassete.
6. contact power supply testing device according to claim 5, it is characterised in that described to hold down assembly including the first elasticity
Part, the compact heap and fixed block, one end of first elastic component are connected to the inner side of the side wall of the testing cassete set casing
On, the other end of first elastic component connects the compact heap;The middle part of the fixed block is provided with via, and the testing cassete is consolidated
The inside sidewalls for determining shell are provided with accepting groove;The fixed block is fixed in the accepting groove, the outside contouring of the compact heap
With via inside portion contour shape coordinate, and the compact heap can along the via axial movement.
7. the contact power supply testing device according to claim 5 or 6, it is characterised in that the compact heap stretches out described survey
The end face of the side wall of examination box set casing is provided with from the opening of the testing cassete set casing to incline to the testing cassete set casing bottom
The guide part that tiltedly sets and the compressed part for being undertaken on the guide part end.
8. contact power supply testing device according to claim 5, it is characterised in that the testing cassete includes upper end open
Housing, Outside Dimensions are more than the upper lid and board fixed plate of the Outside Dimensions of the opening of the housing, and the upper lid is detachable
Ground is fixed on the upper end of the housing, and the side-wall outer side that the housing is stretched out close to its peripheral region of the upper lid, institute
State board fixed plate can floating ground be located at the upper lid upper surface;
The board fixed plate be provided with multiple first through hole corresponding with the bump position of board, it is described it is upper cover with it is described
The corresponding position of first through hole is provided with the 3rd pin, lower end and the test pin input port of the 3rd pin
Pin is electrically connected, and the upper surface of the upper lid is stretched out and corresponding with the first through hole in the upper end of the 3rd pin.
9. contact power supply testing device according to claim 8, it is characterised in that the side wall of the testing cassete set casing
Upper end is provided with alignment pin, the region of the side-wall outer side of the stretching testing cassete set casing of the upper lid and is provided with and the positioning
Sell the positioning hole matched;When the testing cassete is plugged in the testing cassete set casing, the positioning hole correspondence is socketed on
On the alignment pin.
10. contact power supply testing device according to claim 8, it is characterised in that the upper lid is provided with multiple elasticity
Keeper, the flexible positioning piece includes sleeve, locating rod and the 3rd elastic component, fixed in the board fixed plate and the elasticity
Position part is provided with the second through hole at corresponding position, and the sleeve is vertically fixed on the upper lid, the 3rd elastic component
In the sleeve, one end of the locating rod is slideably socketed in the sleeve, and the other end of the locating rod is set
There is taper location division, and the taper location division passes second through hole.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201621251744.1U CN206601468U (en) | 2016-11-15 | 2016-11-15 | Contact power supply testing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201621251744.1U CN206601468U (en) | 2016-11-15 | 2016-11-15 | Contact power supply testing device |
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Publication Number | Publication Date |
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CN206601468U true CN206601468U (en) | 2017-10-31 |
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ID=60148988
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CN201621251744.1U Active CN206601468U (en) | 2016-11-15 | 2016-11-15 | Contact power supply testing device |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108398615A (en) * | 2018-03-23 | 2018-08-14 | 东风柳州汽车有限公司 | Electric vehicle controller signal converting test device |
CN109738675A (en) * | 2019-02-26 | 2019-05-10 | 佛山市国星光电股份有限公司 | A kind of test equipment |
CN111653921A (en) * | 2020-05-11 | 2020-09-11 | 西安子国微科技有限公司 | Standard board card debugging tool |
CN112623686A (en) * | 2020-12-02 | 2021-04-09 | 保定飞凌嵌入式技术有限公司 | Embedded core plate device capable of preventing water immersion |
-
2016
- 2016-11-15 CN CN201621251744.1U patent/CN206601468U/en active Active
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108398615A (en) * | 2018-03-23 | 2018-08-14 | 东风柳州汽车有限公司 | Electric vehicle controller signal converting test device |
CN109738675A (en) * | 2019-02-26 | 2019-05-10 | 佛山市国星光电股份有限公司 | A kind of test equipment |
CN109738675B (en) * | 2019-02-26 | 2024-05-14 | 佛山市国星光电股份有限公司 | Test equipment |
CN111653921A (en) * | 2020-05-11 | 2020-09-11 | 西安子国微科技有限公司 | Standard board card debugging tool |
CN111653921B (en) * | 2020-05-11 | 2021-12-03 | 西安子国微科技有限公司 | CPCI board card debugging tool |
CN112623686A (en) * | 2020-12-02 | 2021-04-09 | 保定飞凌嵌入式技术有限公司 | Embedded core plate device capable of preventing water immersion |
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