CN212410820U - Automatic optical sensor testing equipment - Google Patents
Automatic optical sensor testing equipment Download PDFInfo
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- CN212410820U CN212410820U CN202020415298.3U CN202020415298U CN212410820U CN 212410820 U CN212410820 U CN 212410820U CN 202020415298 U CN202020415298 U CN 202020415298U CN 212410820 U CN212410820 U CN 212410820U
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Abstract
本实用新型涉及测试设备技术领域，尤其涉及一种自动化光学传感器测试设备，包括机架、工作台，所述工作台设有载具模组、探针模组、压紧模组、压紧动力机构、测试模组、扫描模组、扫描动力机构，探针模组位于载具模组的内部，压紧动力机构驱动连接压紧模组，测试模组位于载具模组的底部，扫描动力机构驱动连接扫描模组；本实用新型整个测试过程自动化程度高，不仅能够降低人工成本，而且能够提高测试的效率、提升测试的稳定性。
The utility model relates to the technical field of testing equipment, in particular to an automated optical sensor testing equipment, comprising a frame and a workbench, wherein the workbench is provided with a carrier module, a probe module, a pressing module, a pressing power Mechanism, test module, scanning module, scanning power mechanism, the probe module is located inside the carrier module, the pressing power mechanism drives and connects the pressing module, the test module is located at the bottom of the carrier module, and the scanning power The mechanism drives and connects the scanning module; the whole testing process of the utility model has a high degree of automation, which can not only reduce labor costs, but also improve testing efficiency and improve testing stability.
Description
The technical field is as follows:
the utility model relates to a test equipment technical field especially relates to an automatic change optical sensor test equipment.
Background art:
due to the popularization of intelligent devices such as smart phones, smart watches and tablet computers, market competition is particularly intense, and the requirement on shipment timeliness is particularly strong. Meanwhile, the quality requirements of users on electronic consumer products are gradually increased. These two factors make the production enterprises have higher requirements on the shipment speed and the assembly yield of the electronic consumer products. Therefore, it is required to improve the yield of electronic products and shorten the shipment time. And further has new requirements for automatic detection equipment.
When the optical sensor is subjected to incoming material testing, the micro needle module is required to be connected and conducted with a connector of a tested device to test open circuit, short circuit and capacitance values, the performance of the optical sensor in the tested device is tested through the black card and the white card, most of the optical sensor is tested manually at present, and the operation is troublesome and the efficiency is low.
The utility model has the following contents:
the utility model aims at providing an automatic change optical sensor test equipment to what prior art exists not only can reduce the cost of labor, can improve the efficiency of test moreover, promote the stability of test.
In order to realize the purpose, the utility model discloses a technical scheme is: the automatic optical sensor testing equipment comprises a rack and a workbench arranged on the rack, wherein the workbench is provided with a carrier module for placing and fixing a tested device, a probe module for connecting a connector of the tested device and leading out a signal, a compressing module for inserting the tested device on the probe module, a compressing power mechanism for driving the compressing module to move to the upper part of the tested device and press down, a testing module for testing the tested device, a scanning module for scanning two-dimensional code information of the tested device and a scanning power mechanism for driving the scanning module to move to the upper part of the tested device, the probe module is positioned in the carrier module, the compressing power mechanism is driven and connected with the compressing module, the testing module is positioned at the bottom of the carrier module, and the scanning power mechanism is driven and connected with the scanning module.
The carrier module comprises a carrier base arranged on the workbench and an adsorption device arranged at the bottom of the carrier base, wherein the top of the carrier base is provided with a clamping groove matched with a tested device and a positioning hole used for assisting the pressing module to press downwards, the bottom surface of the clamping groove is provided with a suction hole used for adsorbing and fixing the tested device, and the suction hole is communicated with the adsorption device through an air pipe.
The further improvement to the above scheme is that the compressing module comprises a compressing bottom plate arranged on the workbench, two compressing support plates respectively arranged at two sides of the compressing bottom plate, two groups of compressing slide rails respectively arranged on the two compressing support plates, two sliding plates respectively connected on the two groups of compressing slide rails in a sliding manner, and a pressing plate assembly, wherein the two compressing support plates are respectively provided with a guide groove, the two sliding plates are respectively provided with an inclined hole along the inclined direction, guide shafts are respectively connected between the two sliding plates and the compressing support plate at one corresponding side, one end of each guide shaft is rolled in the guide groove, the other end of each guide shaft penetrates through the inclined hole and is inserted in the pressing plate assembly, and the two sliding plates are all connected with the output end of the.
The scheme is further improved in that the guide groove is of an L-shaped structure.
The improved structure of the needle pressing plate comprises a pressing plate assembly, a pressing needle plate and a pressing plate, wherein the pressing plate assembly sequentially comprises a cover plate, the pressing needle plate and the pressing plate from top to bottom, two sides of the cover plate are respectively connected with a guide shaft on one corresponding side, probes are arranged on the pressing needle plate, and a buffer spring is arranged between the pressing needle plate and the cover plate.
The further improvement of the scheme is that the bottom surface of the pressure plate is provided with a positioning pin.
The further improvement of the scheme is that the scanning module comprises a scanning slide rail arranged on the workbench, a scanning slide seat connected on the scanning slide rail in a sliding manner, a scanning support plate vertically arranged on the scanning slide seat, a height adjusting block arranged on the scanning support plate, a scanning fixed block and a scanning module, the scanning support plate is connected with the output end of a scanning power mechanism, and the scanning module is connected with the height adjusting block through the scanning fixed block.
The further improvement to above-mentioned scheme does, pass through screwed connection between scanning backup pad and the altitude mixture control piece, the scanning backup pad has seted up the altitude mixture control mounting hole along vertical, the altitude mixture control mounting hole is waist shape hole, altitude mixture control piece mounting hole and altitude mixture control piece threaded connection are passed to screw threaded one end, pass through screwed connection between scanning fixed block and the altitude mixture control piece, the scanning fixed block is U-shaped structure and its opening direction towards one side of scanning the backup pad, the angle modulation hole has all been seted up at both ends around the scanning fixed block, the angle modulation hole is the arc hole, screw threaded one end is passed angle modulation hole and altitude mixture control piece threaded connection, pass through screwed connection between scanning module and the scanning fixed block, scanning module mounting hole has been seted up to the scanning fixed block, the scanning module mounting hole is waist shape hole, scanning module mounting hole and scanning module threaded connection are passed to screw threaded one end.
The test module comprises a black card fixing plate arranged at the bottom of the carrier module, a black card arranged on the black card fixing plate, a white card fixing plate connected to the workbench in a sliding manner, a white card arranged on the white card fixing plate, and a test power mechanism driving the white card fixing plate to move to the position below the tested device and above the black card, wherein the black card is positioned below the tested device.
The further improvement to above-mentioned scheme does, the probe module is from top to bottom including the faller that floats, going up the faller, keysets, line ball board down in proper order, goes up the faller and is equipped with the probe down between the faller, and the line ball board sets up in the inside of carrier base.
The utility model has the advantages that: the utility model provides an automatic optical sensor test equipment, which comprises a frame, the workstation of setting in the frame, the workstation is equipped with the carrier module that is used for placing and fixing the device under test, a probe module that is used for connecting the device under test connector and deriving the signal, a compress tightly the module that is used for pegging graft the device under test on the probe module, the drive compresses tightly the module and removes to the device under test top and the compressing power unit who pushes down, a test module that is used for testing the device under test, a scanning module that is used for scanning the device under test two-dimensional code information, the scanning power unit that the drive scanning module removed to the device under test top, the probe module is located the inside of carrier module, compressing power unit drive connection compresses tightly the module, the test module is located the bottom of carrier module, scanning power unit drive connection scanning module; the utility model discloses a compress tightly power unit drive and compress tightly the module and peg graft the device connector under test on the probe module, carry out black card, white card test to the device under test through the testing module, scan the component and scan the device two-dimensional code information under test through the drive of scanning power unit, whole test process automation degree is high, not only can reduce the cost of labor, but also can improve the efficiency of test, promote the stability of test; in addition, the utility model can adjust the height of the scanning module by adjusting the installation position of the height adjusting block on the scanning support plate and the installation position of the scanning module on the scanning fixed block, and can adjust the angle of the scanning module by adjusting the installation positions of the scanning fixed block and the height adjusting block, thereby ensuring the scanning effect and being suitable for various use occasions; additionally, the utility model discloses the probe module not only accounts for than little, and the measuring accuracy is high moreover.
Description of the drawings:
fig. 1 is a schematic structural diagram of the present invention.
Fig. 2 is a schematic structural view of the carrier module of the present invention.
Fig. 3 is a schematic structural diagram of the probe module of the present invention.
Fig. 4 is a schematic structural diagram of the compressing module of the present invention.
Fig. 5 is a schematic structural diagram of the test module of the present invention.
Fig. 6 is a schematic structural diagram of the scanning module of the present invention.
Description of reference numerals: the device comprises a frame 1, a workbench 2, a carrier module 3, a carrier base 31, a card installing groove 32, a positioning hole 33, a suction hole 34, an air pipe 35, a positioning copper sleeve 36, a probe module 4, a floating needle plate 41, an upper needle plate 42, a lower needle plate 43, an adapter plate 44, a wire pressing plate 45, a pressing module 5, a pressing bottom plate 51, a pressing support plate 52, a guide groove 521, a pressing slide rail 53, a slide plate 54, an inclined hole 541, a pressing plate assembly 55, a cover plate 551, a pressing needle plate 552, a pressing plate 553, a probe 554, a positioning pin 555, a guide shaft 56, a bearing 57, a pressing power mechanism 6, a test module 7, a black card fixing plate 71, a black card 72, a white card fixing plate 73, a white card 74, a test power mechanism 75, a scanning module 8, a scanning slide rail 81, a scanning slide seat 82, a scanning support plate 83, a height adjusting installing hole 831, a height adjusting block 84, a, Scanning module 86, protective shell 87, and scanning power mechanism 9.
The specific implementation mode is as follows:
the present invention will be further described with reference to the accompanying drawings, as shown in fig. 1-6, the present invention comprises a frame 1, a worktable 2 disposed on the frame 1, the worktable 2 is provided with a carrier module 3 for placing and fixing a device under test, a probe module 4 for connecting a connector of the device under test and guiding out a signal, a pressing module 5 for inserting the device under test on the probe module 4, a pressing power mechanism 6 for driving the pressing module 5 to move to the upper side of the device under test and press down, a testing module 7 for testing the device under test, a scanning module 8 for scanning two-dimensional code information of the device under test, a scanning power mechanism 9 for driving the scanning module 8 to move to the upper side of the device under test, the probe module 4 is disposed inside the carrier module 3, the pressing power mechanism 6 is in driving connection with the pressing module 5, the testing module 7 is disposed at the bottom of the carrier module 3, the scanning power mechanism 9 is connected with the scanning module 8 in a driving way.
The carrier module 3 comprises a carrier base 31 arranged on the workbench 2 and an adsorption device arranged at the bottom of the carrier base 31, wherein the top of the carrier base 31 is provided with a clamping groove 32 matched with a tested part and a positioning hole 33 used for assisting the pressing of the pressing module 5, the positioning hole 33 is inserted with a positioning copper sleeve 36, the bottom surface of the clamping groove 32 is provided with a suction hole 34 used for adsorbing and fixing the tested part, and the suction hole 34 is communicated with the adsorption device through an air pipe 35.
The pressing module 5 comprises a pressing bottom plate 51 arranged on the workbench 2, two pressing support plates 52 respectively arranged at two sides of the pressing bottom plate 51, two groups of pressing slide rails 53 respectively arranged on the two pressing support plates 52, two sliding plates 54 respectively connected to the two groups of pressing slide rails 53 in a sliding manner, and a pressing plate assembly 55, wherein the two pressing support plates 52 are respectively provided with a guide groove 521, the guide grooves 521 are in an L-shaped structure, the pressing power mechanism 6 drives the pressing plate assembly 55 to move forwards to the upper part of a tested device and then press downwards, the two sliding plates 54 are respectively provided with an inclined hole 541 along the inclined direction, guide shafts 56 are respectively connected between the two sliding plates 54 and the pressing support plate 52 at the corresponding side, one end of each guide shaft 56 is rolled in the guide groove 521, the other end of each guide shaft 56 passes through the inclined hole 541 to be inserted in the pressing plate assembly 55, and each guide shaft 56 is sleeved, one bearing 57 rolls in the guide groove 521, the other bearing 57 rolls in the inclined hole 541, and both the two sliding plates 54 are connected with the output end of the compaction power mechanism 6.
The pressing plate assembly 55 sequentially comprises a cover plate 551, a pressing needle plate 552 and a pressing plate 553 from top to bottom, the two sides of the cover plate 551 are respectively connected with the guide shafts 56 on the corresponding sides, the pressing needle plate 552 is provided with a probe 554, a buffer spring is arranged between the pressing needle plate 552 and the cover plate 551, the buffering effect can be achieved in the pressing process, the probe 554 on the pressing needle plate can be protected, the bottom surface of the pressing plate 553 is provided with a positioning pin 555, in the pressing process, the positioning pin 555 is inserted into the positioning copper sleeve 36, the pressing precision can be guaranteed, and the precision of inserting the connector of a tested device into the probe module 4 can be guaranteed.
The scanning support plate 83 is connected with the height adjusting block 84 through screws, the scanning support plate 83 is vertically provided with a height adjusting mounting hole 831, the height adjusting mounting hole 831 is a waist-shaped hole, one end of a screw thread penetrates through the mounting hole of the height adjusting block 84 to be in threaded connection with the height adjusting block 84, the scanning fixed block 85 is connected with the height adjusting block 84 through screws, the scanning fixed block 85 is of a U-shaped structure, the opening direction of the scanning fixed block faces one side of the scanning support plate 83, the front end and the rear end of the scanning fixed block 85 are both provided with angle adjusting holes 851, the angle adjusting holes 851 are arc-shaped holes, one end of the screw thread penetrates through the angle adjusting holes 851 to be in threaded connection with the height adjusting block 84, the scanning module 86 is connected with the scanning fixed block 85 through screws, the scanning module mounting hole 852 is formed in the scanning fixed block 85, the scanning module mounting hole 852 is a waist-shaped hole, one end of, the height of the scanning module 86 can be adjusted by adjusting the mounting position of the height adjusting block 84 on the scanning support plate 83 and the mounting position of the scanning module 86 on the scanning fixing block 85, and the angle of the scanning module 86 can be adjusted by adjusting the mounting positions of the scanning fixing block 85 and the height adjusting block 84, so that the scanning effect can be ensured, and the scanning device can be suitable for various use occasions.
The scanning module 86 is covered with a protective shell 87, the front end and the rear end of the protective shell 87 are respectively connected with the front end and the rear end of the scanning fixed block 85, the scanning module 86 can be prevented from being damaged, and therefore the normal work of the scanning module 86 can be guaranteed.
The testing module 7 comprises a black card fixing plate 71 arranged at the bottom of the carrier module 3, a black card 72 arranged on the black card fixing plate 71, a white card fixing plate 73 slidably connected to the workbench 2, a white card 74 arranged on the white card fixing plate 73, and a testing power mechanism 75 driving the white card fixing plate 73 to move to the lower part of the tested device and the upper part of the black card 72, wherein the black card 72 is positioned below the tested device, and the performance of an optical sensor in the tested device can be tested quickly and accurately.
The pressing power mechanism 6, the scanning power mechanism 9, the testing power mechanism 75 and the adsorption device are all cylinders.
The working principle is as follows:
placing the tested device on the clamping groove 32 of the carrier module 3, and adsorbing and fixing the tested device on the clamping groove 32 through an adsorption device; the scanning module 8 is moved to the position above the tested device through the scanning power mechanism 9, the scanning module 86 is adjusted to the height suitable for scanning the two-dimensional code information of the tested device by adjusting the height position between the height adjusting block 84 and the scanning supporting plate 83 on the scanning module 8 and the height position between the scanning module 86 and the scanning fixing block 85, the scanning module 86 is adjusted to the angle suitable for scanning the two-dimensional code information of the tested device by adjusting the angle between the scanning fixing block 85 and the height adjusting block 84, and the two-dimensional code information of the tested device is scanned; after the scanning is finished, the scanning power mechanism 9 drives the scanning module 8 to return; the pressing power mechanism 6 drives the pressing plate assembly 55 to move to the upper part of the tested device and press down, when pressing down, the positioning pin 555 on the pressing plate 553 inserts into the positioning copper sleeve 36 on the carrier module 3 to complete the positioning, the probe 554 on the pressing plate assembly 55 contacts with the wiring point on the tested device, and the connector of the tested device contacts with the probe 554 of the probe module 4; when the white card 74 is tested, the testing power mechanism 75 drives the white card fixing plate 73 to move to the position below the tested device, after the white card 74 is tested, the testing power mechanism 75 pulls back the white card 74 mounting plate, and the black card 72 is positioned below the tested device to test the black card 72; after the test is finished, the adsorption device is cut off, and the tested device is placed back to the material tray to finish the whole test process; the utility model discloses a whole test process automation degree is high, not only can reduce the cost of labor, can improve the efficiency of test moreover, promote the stability of test.
Of course, the above description is only the preferred embodiment of the present invention, so all the equivalent changes or modifications made by the structure, features and principles in accordance with the claims of the present invention are included in the claims of the present invention.
Claims (10)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020415298.3U CN212410820U (en) | 2020-03-27 | 2020-03-27 | Automatic optical sensor testing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020415298.3U CN212410820U (en) | 2020-03-27 | 2020-03-27 | Automatic optical sensor testing equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN212410820U true CN212410820U (en) | 2021-01-26 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202020415298.3U Expired - Fee Related CN212410820U (en) | 2020-03-27 | 2020-03-27 | Automatic optical sensor testing equipment |
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| Country | Link |
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| CN (1) | CN212410820U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111323730A (en) * | 2020-03-27 | 2020-06-23 | 深圳市微特自动化设备有限公司 | Automatic optical sensor testing equipment |
-
2020
- 2020-03-27 CN CN202020415298.3U patent/CN212410820U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111323730A (en) * | 2020-03-27 | 2020-06-23 | 深圳市微特自动化设备有限公司 | Automatic optical sensor testing equipment |
| CN111323730B (en) * | 2020-03-27 | 2024-09-10 | 深圳市微特自动化设备有限公司 | Automated optical sensor test equipment |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: 518000 floor 1, No.2, Dongtang Industrial Zone, Chuangxin Road, Shatou community, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Weite Precision Technology Co.,Ltd. Country or region after: China Address before: 518000 1st floor, building 21, Zone C, Liantang Industrial City, Shangcun, Gongming street, Guangming New District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN MICROTEST AUTOMATION Co.,Ltd. Country or region before: China |
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| CP03 | Change of name, title or address | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20210126 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |