CN206470360U - A kind of round sexual act mechanism for testing - Google Patents
A kind of round sexual act mechanism for testing Download PDFInfo
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- CN206470360U CN206470360U CN201621308392.9U CN201621308392U CN206470360U CN 206470360 U CN206470360 U CN 206470360U CN 201621308392 U CN201621308392 U CN 201621308392U CN 206470360 U CN206470360 U CN 206470360U
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Abstract
A kind of round sexual act mechanism for testing, including base, the base is provided with mutually perpendicular X-axis driver element and Y-axis driver element, Z axis driver element above X-axis driver element and Y-axis driver element is arranged on by connecting plate, and the probe in detecting component driven by Z axis driver element, the Z axis driver element is perpendicular to X-axis driver element and Y-axis driver element, the probe in detecting component includes probe fixture, several probes, and for the slide rail of probe fixture movement, the lower surface of several probes matches in same level and with the copper foil point on sample to be tested；During the Z axis driver element work, probe is driven to be moved along slide rail so as to contact or away from sample to be tested.Therefore, the utility model has the advantages that to be suitable for that the LED core built-in testing of minute materials, measuring accuracy are higher, run and more stablize.
Description
Technical field
The utility model is related to LED light splitting machines field, especially a kind of round sexual act mechanism for testing.
Background technology
LED light splitting machines clamp the copper foil of LED chip by mechanism for testing, LED chip are tested, so as to realize LED
The color separation and light splitting of chip, are used for example, Chinese patent literature CN102360062A discloses a kind of SMD LED pasters light splitting machine
Chip detection device, its concrete structure is：Include supporting plate, the side of the supporting plate is provided with driving source, the branch
The opposite side of fagging is provided with spring probe assemblies and synchronous drive mechanism, one end of the synchronous drive mechanism and the driving
Source is connected, and the other end of the synchronous drive mechanism is connected with the spring probe assemblies, and the driving source driving is described
Synchronous drive mechanism, the probe assembly can be contacted or away from core to be tested simultaneously in the presence of the synchronous drive mechanism
Piece；But, above-mentioned this SMD LED pasters light splitting machine is two fixtures by level with chip detection device respectively from two
The copper foil of the both sides of individual side clamping LED chip, so that realize the test of LED chip, this detection device may be only available for
Volume is larger, copper foil the LED chip of two sides test, for the LED chip of small volume, measuring accuracy not enough, and fortune
Row is unstable, and the fault rate of test is higher, the LED chip of minute materials especially now on the market, there is five light-emitting areas, and
Copper foil is existed only on a face, and existing detection device can not be tested it at all, and then people just attempt to develop
It is suitable for the detection device of the LED core built-in testing of minute materials, but is due to the defect of technology, is adapted to this minute materials
The detection device of LED chip is still immature, on the market the detection device of still no more perfect suitable minute materials.
Utility model content
In order to overcome above mentioned problem, the utility model provides a kind of LED core built-in testing for being suitable for minute materials to society
, measuring accuracy is higher, operation more stable round sexual act mechanism for testing.
The technical solution of the utility model is：There is provided on a kind of round sexual act mechanism for testing, including base, the base
X-axis driver element is arranged on provided with mutually perpendicular X-axis driver element and Y-axis driver element, by connecting plate and Y-axis driving is single
Z axis driver element above member, and the probe in detecting component driven by Z axis driver element, the Z axis driver element perpendicular to
X-axis driver element and Y-axis driver element, the probe in detecting component include probe fixture, several probes, and consolidate for probe
Determine the slide rail of part movement, the lower surfaces of several probes in same level and with the copper foil point kissing on sample to be tested
Close；During the Z axis driver element work, probe is driven to be moved along slide rail so as to contact or away from sample to be tested.
Improved as to of the present utility model, in addition to the Millesimal fine adjustment chi being located on the base, the Millesimal fine adjustment
Chi is used for the position for adjusting probe.
Improved as to of the present utility model, the Z axis driver element includes servomotor and the output with servomotor
The cam structure of axle connection, the cam structure drives probe to be moved along slide rail under the driving of servomotor.
As to improvement of the present utility model, in addition to probe guide holder, the probe guide holder is arranged in probe
Bottom.
Improved as to of the present utility model, in addition to be respectively used to sense limit on the left, the right side of the stroke of Z axis driver element
The first sensor of the limit and the second photoelectric sensor.
Improved as to of the present utility model, the X-axis driver element is motor-driven by first.
Improved as to of the present utility model, the Y-axis driver element is motor-driven by second.
The utility model is because the base is provided with mutually perpendicular X-axis driver element and Y-axis driver element, by even
Fishplate bar is arranged on the Z axis driver element above X-axis driver element and Y-axis driver element, and the spy driven by Z axis driver element
Pin detection components, the Z axis driver element includes perpendicular to X-axis driver element and Y-axis driver element, the probe in detecting component
Probe fixture, several probes, and for the slide rail of probe fixture movement, the lower surface of several probes is in same level
Matched on face and with the copper foil point on sample to be tested；During Z axis driver element work, drive probe along slide rail move from
And contact or remote sample to be tested.Therefore, the utility model has LED core built-in testing, the survey for being suitable for minute materials
The advantage that examination precision is higher, operation is more stablized.
Brief description of the drawings
Fig. 1 is a kind of dimensional structure diagram of embodiment of the present utility model.
Fig. 2 is the dimensional structure diagram at Fig. 1 another visual angle.
Embodiment
In description of the present utility model, it is to be understood that " " center ", " on " in term, " under ", "front", "rear",
The orientation or position relationship of the instructions such as "left", "right" are, based on orientation shown in the drawings or position relationship, to be for only for ease of and retouch
State the utility model and simplify and describe, rather than indicate or imply signified device or element must have specific orientation, with
Specific azimuth configuration and operation, therefore it is not intended that to limitation of the present utility model.In addition, term " first ", " second "
It is only used for describing purpose, and it is not intended that indicating or implying relative importance.
, it is necessary to which explanation, unless otherwise clearly defined and limited, term " are pacified in description of the present utility model
Dress ", " connection ", " connected " should be interpreted broadly, for example, it may be being fixedly connected with or dismantling connection, or integratedly be connected
Connect；Can be mechanical connection or electrical connection；Can be joined directly together or be indirectly connected to by intermediary,
It can be the connection of two element internals.For the ordinary skill in the art, above-mentioned art can be understood with concrete condition
Language is in concrete meaning of the present utility model.In addition, in description of the present utility model, unless otherwise indicated, " multiple ", " some "
It is meant that two or more.
Referring first to Fig. 1 to Fig. 2, what Fig. 1 and Fig. 2 were disclosed is a kind of a kind of embodiment of round sexual act mechanism for testing,
A kind of round sexual act mechanism for testing, including base 100, the base 100 are provided with mutually perpendicular X-axis driver element and Y
Axle driver element（The concrete structure of X-axis driver element and Y-axis driver element is not drawn into the present embodiment, X-axis driving is depicted single
The slide unit 2 of member and Y-axis driver element）, the Z axis that is arranged on by connecting plate 5 above X-axis driver element and Y-axis driver element drives
Moving cell 3, and the probe in detecting component 4 driven by Z axis driver element 3, are in the slide unit 2 in the present embodiment specifically
Upper setting connecting plate 5, the Z axis driver element 3 and probe in detecting component 4 are arranged on the connecting plate 5, drive the X-axis
Driver element or Y-axis driver element, the connecting plate 5, Z axis driver element 3 and probe in detecting component 4 are with X-axis driver element
Or Y-axis driver element movement and move, the Z axis driver element 3 is perpendicular to X-axis driver element and Y-axis driver element, this reality
In new, the probe in detecting component 4 includes probe fixture 42, several probes 41, and is moved for probe fixture 42
Slide rail 43, in the present embodiment, specifically, probe base 421 that the probe fixture 42 includes being used for fixing probe 41, be used for
The probe base locating piece 422 fixed probe base 421 and played the role of positioning, the probe base guide plate 423, the probe base that play the guiding role
Bottom plate 424 and slide 425, the probe base locating piece 422 are fixed on the probe base guide plate 423, and the probe base is led
It is fixed on to plate 423 by probe base bottom plate 424 on the slide 425, the bottom of slide 425 is provided with kiss corresponding with slide rail 43
The chute of conjunction（It is invisible in figure）, the slide 425 can be moved by chute on the slide rail 43；In the utility model, number
The lower surface of probe 41 described in root matches in same level and with the copper foil point on sample to be tested, the utility model
In, the Z axis driver element 3 includes servomotor 31 and the cam structure 32 being connected with the output shaft of servomotor 31（Cam
Structure belongs to prior art, no longer repeats one by one herein）, when the Z axis driver element 3 works, the cam structure 32 is being watched
Take drive probe 41 under the driving of motor 31 to move along slide rail 43, so that probe 41 is contacted or away from sample to be tested；
In the utility model, be accurately positioned by three driver elements and several probes 41 lower surface in same level
And matched with the copper foil point on sample to be tested, therefore the utility model can be suitable for the smaller LED chip of volume, especially
The LED chip of the minute materials of five light-emitting areas is suitable for, corresponding with the copper foil point of the LED chip of minute materials can be coincide
So as to complete test, without damaging other five light-emitting areas；The utility model uses X-axis, the drive in three directions of Y-axis and Z axis
Dynamic so that the positioning before test is more accurate, so as to improve measuring accuracy, operation is more stablized.
In the utility model, it is preferred that also including the Millesimal fine adjustment chi 8 being located on the base 100, the Millesimal fine adjustment
Chi 8 is used for adjusting base 100, adjusts the Millesimal fine adjustment chi 8, i.e., connecting plate 5 simultaneously on energy adjusting base 100, X-axis are driven
Moving cell, Y-axis driver element, Z axis driver element 3, and probe in detecting component 4 position, the regulation of the Millesimal fine adjustment chi 8
It is fine adjustments, because the LED chip volume of minute materials is very small, therefore the regulation of Millesimal fine adjustment chi 8 can be to probe 41
Position more accurately adjusted, substantially increase the accuracy of regulation, improve the efficiency of work.
In the utility model, it is preferred that also including probe guide holder 44, the probe guide holder 44 is arranged on probe 41
Middle and lower part；In the utility model, the lower end of several probes 41 passes through the pilot hole 440 of the probe guide holder 44, described
Probe guide holder 44 cause several probes 41 lower surface be maintained at the same horizontal plane, and can one by one respectively with minute materials
The copper foil point correspondence of LED chip coincide, play a part of fixed and be oriented to.
Specific work process of the present utility model is：When needing to be tested, first start X-axis driver element or Y-axis is driven
Moving cell carries out the debugging of position to probe 41 so that probe 41 is located at the surface of sample to be tested, then starts the Z axis
Driver element 3 so that probe 41 is moved down close to sample to be tested, if the lower surface of several probes 41 is not along slide rail 43
When being matched with the position of the copper foil point on sample to be tested, the Millesimal fine adjustment chi 8 is further adjusted, until the probe 41
The position kissing of lower surface and the copper foil point on sample to be tested merge and contact, just can be tested.
In the utility model, it is preferred that the also limit on the left including the stroke that is respectively used to sense Z axis driver element 3, right pole
The photoelectric sensor 62 of first sensor 61 and second of limit.
In the utility model, it is preferred that the X-axis driver element is by the first motor（It is not drawn into figure）Driving；Institute
It is by the second motor to state Y-axis driver element（It is not drawn into figure）Driving.
Claims (7)
1. a kind of round sexual act mechanism for testing, including base（100）, it is characterised in that the base（100）Provided with mutual
Vertical X-axis driver element and Y-axis driver element, pass through connecting plate（5）It is arranged on X-axis driver element and Y-axis driver element
The Z axis driver element of side（3）, and by Z axis driver element（3）The probe in detecting component of driving（4）, the Z axis driver element
（3）Perpendicular to X-axis driver element and Y-axis driver element, the probe in detecting component（4）Including probe fixture（42）, it is several
Probe（41）, and supply probe fixture（42）Mobile slide rail（43）, several probes（41）Lower surface in same water
Matched in plane and with the copper foil point on sample to be tested；The Z axis driver element（3）During work, probe is driven（41）Edge
Slide rail（43）Movement is so as to contact or away from sample to be tested.
2. round sexual act mechanism for testing according to claim 1, it is characterised in that：Also include being located at the base
（100）On Millesimal fine adjustment chi（8）, the Millesimal fine adjustment chi（8）For adjusting probe（41）Position.
3. round sexual act mechanism for testing according to claim 1 or 2, it is characterised in that：The Z axis driver element（3）
Including servomotor（31）With with servomotor（31）Output shaft connection cam structure（32）, the cam structure（32）
Servomotor（31）Driving under drive probe（41）Along slide rail（43）It is mobile.
4. round sexual act mechanism for testing according to claim 1 or 2, it is characterised in that：Also include probe guide holder
（44）, the probe guide holder（44）It is arranged on probe（41）Middle and lower part.
5. round sexual act mechanism for testing according to claim 1 or 2, it is characterised in that：Also include being respectively used to sense Z
Axle driver element（3）The limit on the left of stroke, the first sensor of limit on the right-right-hand limit（61）With the second photoelectric sensor（62）.
6. round sexual act mechanism for testing according to claim 1 or 2, it is characterised in that：The X-axis driver element be by
First is motor-driven.
7. round sexual act mechanism for testing according to claim 1 or 2, it is characterised in that：The Y-axis driver element be by
Second is motor-driven.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621308392.9U CN206470360U (en) | 2016-12-01 | 2016-12-01 | A kind of round sexual act mechanism for testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621308392.9U CN206470360U (en) | 2016-12-01 | 2016-12-01 | A kind of round sexual act mechanism for testing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206470360U true CN206470360U (en) | 2017-09-05 |
Family
ID=59710608
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621308392.9U Active CN206470360U (en) | 2016-12-01 | 2016-12-01 | A kind of round sexual act mechanism for testing |
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| Country | Link |
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| CN (1) | CN206470360U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109814018A (en) * | 2017-11-21 | 2019-05-28 | 深圳市炫硕智造技术有限公司 | Light splitting machine and its bottom test device |
| CN110320464A (en) * | 2019-07-26 | 2019-10-11 | 深圳捷多邦科技有限公司 | A kind of PCB circuit board tooling and detection method |
| CN114486180A (en) * | 2020-10-27 | 2022-05-13 | 山东华光光电子股份有限公司 | COS wavelength testing device and testing method for semiconductor laser |
| CN114859213A (en) * | 2022-07-05 | 2022-08-05 | 深圳市标谱半导体科技有限公司 | Test needle adjusting part and chip test equipment |
-
2016
- 2016-12-01 CN CN201621308392.9U patent/CN206470360U/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109814018A (en) * | 2017-11-21 | 2019-05-28 | 深圳市炫硕智造技术有限公司 | Light splitting machine and its bottom test device |
| CN109814018B (en) * | 2017-11-21 | 2021-09-14 | 深圳市炫硕智造技术有限公司 | Light splitting machine and bottom testing device thereof |
| CN110320464A (en) * | 2019-07-26 | 2019-10-11 | 深圳捷多邦科技有限公司 | A kind of PCB circuit board tooling and detection method |
| CN114486180A (en) * | 2020-10-27 | 2022-05-13 | 山东华光光电子股份有限公司 | COS wavelength testing device and testing method for semiconductor laser |
| CN114859213A (en) * | 2022-07-05 | 2022-08-05 | 深圳市标谱半导体科技有限公司 | Test needle adjusting part and chip test equipment |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of utility model: A test mechanism of round trip action Effective date of registration: 20210201 Granted publication date: 20170905 Pledgee: Bank of Beijing Limited by Share Ltd. Shenzhen branch Pledgor: SHENZHEN BIAOPU SEMICONDUCTOR TECHNOLOGY Co.,Ltd. Registration number: Y2021980000887 |
|
| PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
| PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20220614 Granted publication date: 20170905 Pledgee: Bank of Beijing Limited by Share Ltd. Shenzhen branch Pledgor: SHENZHEN BIAOPU SEMICONDUCTOR TECHNOLOGY Co.,Ltd. Registration number: Y2021980000887 |
|
| PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
| CP03 | Change of name, title or address |
Address after: 1st-3rd, 5th-8th Floor, Building A, Tea Tree, Tongfuyu Industrial Park, Inner Ring Road, Sanwei Community, Hangcheng Street, Baoan District, Shenzhen, Guangdong, China Patentee after: Shenzhen Biaopu Semiconductor Co.,Ltd. Address before: Floor 9 and 10, Zone B, Chaxi Sanwei Second Industrial Zone, Xixiang Street, Bao'an District, Shenzhen, Guangdong 518000 Patentee before: SHENZHEN BIAOPU SEMICONDUCTOR TECHNOLOGY Co.,Ltd. |
|
| CP03 | Change of name, title or address |