CN207924086U - A kind of integrated circuit testing module multi-point sampler tool structure - Google Patents
A kind of integrated circuit testing module multi-point sampler tool structure Download PDFInfo
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- CN207924086U CN207924086U CN201820335344.1U CN201820335344U CN207924086U CN 207924086 U CN207924086 U CN 207924086U CN 201820335344 U CN201820335344 U CN 201820335344U CN 207924086 U CN207924086 U CN 207924086U
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Abstract
The utility model discloses a kind of structure of integrated circuit testing module multi-point sampler tooling, including test bottom plate, measured piece laminating mechanism, measured piece pressing plate, measured piece positioning column, spring probe test pcb；Measured piece positioning column is mounted on the upper surface of test bottom plate；Spring probe is tested pcb and is mounted below test bottom plate；Measured piece laminating mechanism is mounted on the right and left of test bottom plate；The periphery for testing bottom plate is equipped with pillar, and measured piece pressing plate is fixed on test substrate by pillar and measured piece laminating mechanism.Measured piece positioning column is mounted on test bottom plate, spring probe test pcb is fixed by screws in by two or more positioning columns on test bottom plate simultaneously, it is determined that the test point of test probe and measured piece is accurately aimed at by Dual positioning, and all tests are completed after primary measured part is clamping, are improved the efficiency of test installation in this way while being also improved the accuracy rate of test.
Description
Technical field
The utility model is related to the tool structure of multi-point sampler in an IC integrated chip test systems more particularly to a kind of collection
At circuit test module multi-point sampler tool structure.
Background technology
Channel module pcb is during hardware testing in integrated comprehensive circuit test system：It is big to encounter pcb sizes, installs
Fixed inconvenient, test point is more and distribution is irregular, the problem more than test item, and common test method is both inconvenient or very
It is time-consuming, it is easy sniffing and test leakage.
Utility model content
In view of the above problems, the utility model provides a kind of multiple test probe points can be directed at test simultaneously, and efficiently,
Accurate positioning, convenient integrated circuit testing module multi-point sampler tool structure.
In order to solve problem above, the utility model uses following technical solution：A kind of integrated circuit testing module is more
The structure of point test fixture, which is characterized in that including test bottom plate, measured piece laminating mechanism, measured piece pressing plate, measured piece positioning
Column, spring probe test pcb.Measured piece positioning column is mounted on the upper surface of test bottom plate；Spring probe tests pcb and is mounted on test
Below bottom plate；Measured piece laminating mechanism is mounted on the right and left of test bottom plate；The periphery for testing bottom plate is equipped with pillar, quilt
It surveys part pressing plate and test substrate is fixed on by pillar and measured piece laminating mechanism.
The spring probe test pcb is equipped with screw hole I；It tests bottom plate and is equipped with mounting hole I；Then logical using screw
It crosses mounting hole I to connect spring probe test pcb with test bottom plate with screw hole I, determines that the multiple spot on spring probe test pcb is surveyed
The position for souning out needle is accurate.
The test bottom plate and spring probe test pcb are linked after installing with measured piece positioning column, using test
The seam allowance of bottom plate and measured piece positioning column positions, and the lower end of measured piece positioning column is equipped with screw hole II, test bottom plate is equipped with peace
Hole II is filled, then uses screw that measured piece positioning column is fixed on test bottom plate by mounting hole II and screw hole II, it is logical in this way
Cross the position for the test point that Dual positioning ensure that on the position and measured piece of the multi-point sampler probe on spring probe test pcb
Alignment.
Described is last good by the location and installation of measured piece positioning column by measured piece, is tested on pcb with spring probe
Multi-point sampler probe gently contacts, wherein surveying part pressing plate is equipped with positioning column II, the lower end of positioning column II is equipped with location hole II,
Positioning column III is equipped at the top of measured piece positioning column, positioning column III is inserted into location hole II.
The measured piece laminating mechanism is equipped with buckle, and mating snap-gauge is equipped at measured piece platen edge, is passed through
Pressing locking connection between measured piece laminating mechanism and measured piece pressing plate ensure that test point and test the reliable contacts of probe.
It is equipped with positioning column I on spring probe test pcb, location hole I is equipped on test bottom plate；Positioning column I is inserted into fixed
In the hole of position, spring probe test pcb is made further to be bonded with test bottom plate.
The utility model has following advantageous effect compared with the immediate prior art：Measured piece positioning column is mounted on test
On bottom plate, while spring probe test pcb is fixed by screws in by two or more positioning columns on test bottom plate, is passed through
Dual positioning determines that the test point of test probe and measured piece is accurately aimed at, and all tests are filled in primary measured part
It is completed after clipping, improve the efficiency of test installation in this way while also improving the accuracy rate of test.The utility model uses
The tool structure of multi-point sampler fixes channel module pcb, while the test point of the test probe of multiple spot and channel pcb are simultaneously
It is kept in contact, realizes and sequentially test simultaneously, eliminate the test one by one of single test point；Pass through the work of this multi-point sampler
Assembling structure, the problem of saving duplicate measurements and install；Improve testing efficiency and accuracy rate.
Description of the drawings
Fig. 1 is the separate structure schematic diagram of integrated circuit testing module multi-point sampler tool structure.
Fig. 2 is the mounting structure schematic diagram of integrated circuit testing module multi-point sampler tool structure.
Fig. 3 is the vertical view (not including measured piece pressing plate) of integrated circuit testing module multi-point sampler tool structure.
Specific implementation mode
Below in conjunction with the accompanying drawings, the utility model is described in more detail.
As shown in Figures 1 to 3, the utility model provides a kind of structure of integrated circuit testing module multi-point sampler tooling,
Pcb5 is tested including test bottom plate 1, measured piece laminating mechanism 2, measured piece pressing plate 3, measured piece positioning column 4, spring probe；
Measured piece positioning column 4 is mounted on the upper surface of test bottom plate 1；Spring probe tests pcb5 and is mounted on test bottom plate 1
Below；Measured piece laminating mechanism 2 is mounted on the right and left of test bottom plate 1；The periphery for testing bottom plate 1 is equipped with pillar 1-4, quilt
Part pressing plate 3 is surveyed to be fixed on above test bottom plate 1 by pillar 1-4 and measured piece laminating mechanism 2.
The spring probe test pcb5 is equipped with I 5-2 of screw hole；It tests bottom plate 1 and is equipped with I 1-3 of mounting hole；Then it adopts
Spring probe is tested by pcb5 by I 1-3 of mounting hole and I 5-2 of screw hole with screw and test bottom plate 1 connects.
The lower end of the measured piece positioning column 4 is equipped with II 4-2 of screw hole, test bottom plate 1 is equipped with II 1-2 of mounting hole,
Then use screw that measured piece positioning column 4 is fixed on test bottom plate 1 by II 1-2 of mounting hole and II 4-2 of screw hole.
The survey part pressing plate 3 is equipped with II 3-3 of positioning column, and the lower end of II 3-3 of positioning column is equipped with II 3-3- of location hole
1,4 top of measured piece positioning column is equipped with III 4-1 of positioning column, and III 4-1 of positioning column is inserted into II 3-3-1 of location hole.
The measured piece laminating mechanism 2 is equipped with buckle 2-1, and mating snap-gauge is equipped in 3 edge of measured piece pressing plate
3-1。
It is equipped with I 5-1 of positioning column on spring probe test pcb5, I 1-1 of location hole is equipped on test bottom plate 1；Positioning column
I 5-1 is inserted into I 1-1 of location hole.
The structure that utility model is related to is simple, practical, by measured piece clamped one time, realize multiple test points simultaneously completely,
Accurately, reliable contact, improves testing efficiency, accuracy rate, reliability.
The above descriptions are merely preferred embodiments of the present invention, is not restricted to the utility model, for ability
For the technical staff in domain, various modifications and changes may be made to the present invention.It is all the spirit and principles of the utility model it
Interior, any modification, equivalent replacement, improvement and so on should be included within the right of the utility model.
Claims (6)
1. a kind of structure of integrated circuit testing module multi-point sampler tooling, which is characterized in that including test bottom plate, measured piece pressure
It closes mechanism, measured piece pressing plate, measured piece positioning column, spring probe and tests pcb；Measured piece positioning column is mounted on the upper of test bottom plate
Face；Spring probe is tested pcb and is mounted below test bottom plate；Measured piece laminating mechanism is mounted on the left and right two of test bottom plate
Side；The periphery for testing bottom plate is equipped with pillar, and measured piece pressing plate is fixed on test bottom plate by pillar and measured piece laminating mechanism
Above.
2. a kind of structure of integrated circuit testing module multi-point sampler tooling according to claim 1, which is characterized in that institute
The spring probe test pcb stated is equipped with screw hole I；It tests bottom plate and is equipped with mounting hole I；Then mounting hole I is passed through using screw
Spring probe test pcb5 is connected with test bottom plate with screw hole I.
3. a kind of structure of integrated circuit testing module multi-point sampler tooling according to claim 1, which is characterized in that institute
The lower end for the measured piece positioning column stated is equipped with screw hole II, test bottom plate is equipped with mounting hole II, then passes through peace using screw
Measured piece positioning column is fixed on test bottom plate by dress hole II and screw hole II.
4. a kind of structure of integrated circuit testing module multi-point sampler tooling according to claim 1, which is characterized in that institute
The survey part pressing plate stated is equipped with positioning column II, and the lower end of positioning column II is equipped with location hole II, is equipped at the top of measured piece positioning column
Positioning column III, positioning column III are inserted into location hole II.
5. a kind of structure of integrated circuit testing module multi-point sampler tooling according to claim 1, which is characterized in that institute
The measured piece laminating mechanism stated is equipped with buckle, and mating snap-gauge is equipped at measured piece platen edge, is pressed by measured piece
Pressing locking connection between mechanism and measured piece pressing plate ensure that test point and test the reliable contacts of probe.
6. a kind of structure of integrated circuit testing module multi-point sampler tooling according to claim 1, which is characterized in that
Spring probe tests pcb and is equipped with positioning column I, and location hole I is equipped on test bottom plate 1；Positioning column I is inserted into location hole I.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820335344.1U CN207924086U (en) | 2018-03-13 | 2018-03-13 | A kind of integrated circuit testing module multi-point sampler tool structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820335344.1U CN207924086U (en) | 2018-03-13 | 2018-03-13 | A kind of integrated circuit testing module multi-point sampler tool structure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207924086U true CN207924086U (en) | 2018-09-28 |
Family
ID=63599097
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820335344.1U Active CN207924086U (en) | 2018-03-13 | 2018-03-13 | A kind of integrated circuit testing module multi-point sampler tool structure |
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| CN (1) | CN207924086U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110221195A (en) * | 2019-05-06 | 2019-09-10 | 湖北三江航天万峰科技发展有限公司 | A kind of no-welding test macro of number MEMS gyroscope chip |
| CN110221194A (en) * | 2019-05-06 | 2019-09-10 | 湖北三江航天万峰科技发展有限公司 | A kind of no-welding test macro of analog MEMS gyroscope chip |
| CN111896859A (en) * | 2020-06-16 | 2020-11-06 | 北京航天时代光电科技有限公司 | Many varieties of circuit board test fixture of batch |
| CN113125249A (en) * | 2021-04-22 | 2021-07-16 | 珠海市精实测控技术有限公司 | Link mechanism capable of realizing multidirectional movement by manually controlling opening and closing |
-
2018
- 2018-03-13 CN CN201820335344.1U patent/CN207924086U/en active Active
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110221195A (en) * | 2019-05-06 | 2019-09-10 | 湖北三江航天万峰科技发展有限公司 | A kind of no-welding test macro of number MEMS gyroscope chip |
| CN110221194A (en) * | 2019-05-06 | 2019-09-10 | 湖北三江航天万峰科技发展有限公司 | A kind of no-welding test macro of analog MEMS gyroscope chip |
| CN111896859A (en) * | 2020-06-16 | 2020-11-06 | 北京航天时代光电科技有限公司 | Many varieties of circuit board test fixture of batch |
| CN111896859B (en) * | 2020-06-16 | 2023-06-06 | 北京航天时代光电科技有限公司 | Batch multi-variety circuit board test fixture |
| CN113125249A (en) * | 2021-04-22 | 2021-07-16 | 珠海市精实测控技术有限公司 | Link mechanism capable of realizing multidirectional movement by manually controlling opening and closing |
| CN113125249B (en) * | 2021-04-22 | 2023-01-06 | 珠海精实测控技术股份有限公司 | Link mechanism capable of realizing multidirectional movement by manually controlling opening and closing |
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