CN111323730A - Automatic optical sensor testing equipment - Google Patents
Automatic optical sensor testing equipment Download PDFInfo
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- CN111323730A CN111323730A CN202010227868.0A CN202010227868A CN111323730A CN 111323730 A CN111323730 A CN 111323730A CN 202010227868 A CN202010227868 A CN 202010227868A CN 111323730 A CN111323730 A CN 111323730A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
- G06K7/10—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
- G06K7/14—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation using light without selection of wavelength, e.g. sensing reflected white light
- G06K7/1404—Methods for optical code recognition
- G06K7/1408—Methods for optical code recognition the method being specifically adapted for the type of code
- G06K7/1417—2D bar codes
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- General Health & Medical Sciences (AREA)
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- Health & Medical Sciences (AREA)
- Artificial Intelligence (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention relates to the technical field of test equipment, in particular to automatic optical sensor test equipment which comprises a rack and a workbench, wherein the workbench is provided with a carrier module, a probe module, a pressing power mechanism, a test module, a scanning module and a scanning power mechanism; the invention has high automation degree in the whole testing process, not only can reduce the labor cost, but also can improve the testing efficiency and the testing stability.
Description
The technical field is as follows:
the invention relates to the technical field of test equipment, in particular to automatic optical sensor test equipment.
Background art:
due to the popularization of intelligent devices such as smart phones, smart watches and tablet computers, market competition is particularly intense, and the requirement on shipment timeliness is particularly strong. Meanwhile, the quality requirements of users on electronic consumer products are gradually increased. These two factors make the production enterprises have higher requirements on the shipment speed and the assembly yield of the electronic consumer products. Therefore, it is required to improve the yield of electronic products and shorten the shipment time. And further has new requirements for automatic detection equipment.
When the optical sensor is subjected to incoming material testing, the micro needle module is required to be connected and conducted with a connector of a tested device to test open circuit, short circuit and capacitance values, the performance of the optical sensor in the tested device is tested through the black card and the white card, most of the optical sensor is tested manually at present, and the operation is troublesome and the efficiency is low.
The invention content is as follows:
the invention aims to provide automatic optical sensor testing equipment aiming at the defects in the prior art, which not only can reduce the labor cost, but also can improve the testing efficiency and the testing stability.
In order to achieve the purpose, the invention adopts the technical scheme that: the automatic optical sensor testing equipment comprises a rack and a workbench arranged on the rack, wherein the workbench is provided with a carrier module for placing and fixing a tested device, a probe module for connecting a connector of the tested device and leading out a signal, a compressing module for inserting the tested device on the probe module, a compressing power mechanism for driving the compressing module to move to the upper part of the tested device and press down, a testing module for testing the tested device, a scanning module for scanning two-dimensional code information of the tested device and a scanning power mechanism for driving the scanning module to move to the upper part of the tested device, the probe module is positioned in the carrier module, the compressing power mechanism is driven and connected with the compressing module, the testing module is positioned at the bottom of the carrier module, and the scanning power mechanism is driven and connected with the scanning module.
The carrier module comprises a carrier base arranged on the workbench and an adsorption device arranged at the bottom of the carrier base, wherein the top of the carrier base is provided with a clamping groove matched with a tested device and a positioning hole used for assisting the pressing module to press downwards, the bottom surface of the clamping groove is provided with a suction hole used for adsorbing and fixing the tested device, and the suction hole is communicated with the adsorption device through an air pipe.
The further improvement to the above scheme is that the compressing module comprises a compressing bottom plate arranged on the workbench, two compressing support plates respectively arranged at two sides of the compressing bottom plate, two groups of compressing slide rails respectively arranged on the two compressing support plates, two sliding plates respectively connected on the two groups of compressing slide rails in a sliding manner, and a pressing plate assembly, wherein the two compressing support plates are respectively provided with a guide groove, the two sliding plates are respectively provided with an inclined hole along the inclined direction, guide shafts are respectively connected between the two sliding plates and the compressing support plate at one corresponding side, one end of each guide shaft is rolled in the guide groove, the other end of each guide shaft penetrates through the inclined hole and is inserted in the pressing plate assembly, and the two sliding plates are all connected with the output end of the.
The scheme is further improved in that the guide groove is of an L-shaped structure.
The improved structure of the needle pressing plate comprises a pressing plate assembly, a pressing needle plate and a pressing plate, wherein the pressing plate assembly sequentially comprises a cover plate, the pressing needle plate and the pressing plate from top to bottom, two sides of the cover plate are respectively connected with a guide shaft on one corresponding side, probes are arranged on the pressing needle plate, and a buffer spring is arranged between the pressing needle plate and the cover plate.
The further improvement of the scheme is that the bottom surface of the pressure plate is provided with a positioning pin.
The further improvement of the scheme is that the scanning module comprises a scanning slide rail arranged on the workbench, a scanning slide seat connected on the scanning slide rail in a sliding manner, a scanning support plate vertically arranged on the scanning slide seat, a height adjusting block arranged on the scanning support plate, a scanning fixed block and a scanning module, the scanning support plate is connected with the output end of a scanning power mechanism, and the scanning module is connected with the height adjusting block through the scanning fixed block.
The further improvement to above-mentioned scheme does, pass through screwed connection between scanning backup pad and the altitude mixture control piece, the scanning backup pad has seted up the altitude mixture control mounting hole along vertical, the altitude mixture control mounting hole is waist shape hole, altitude mixture control piece mounting hole and altitude mixture control piece threaded connection are passed to screw threaded one end, pass through screwed connection between scanning fixed block and the altitude mixture control piece, the scanning fixed block is U-shaped structure and its opening direction towards one side of scanning the backup pad, the angle modulation hole has all been seted up at both ends around the scanning fixed block, the angle modulation hole is the arc hole, screw threaded one end is passed angle modulation hole and altitude mixture control piece threaded connection, pass through screwed connection between scanning module and the scanning fixed block, scanning module mounting hole has been seted up to the scanning fixed block, the scanning module mounting hole is waist shape hole, scanning module mounting hole and scanning module threaded connection are passed to screw threaded one end.
The test module comprises a black card fixing plate arranged at the bottom of the carrier module, a black card arranged on the black card fixing plate, a white card fixing plate connected to the workbench in a sliding manner, a white card arranged on the white card fixing plate, and a test power mechanism driving the white card fixing plate to move to the position below the tested device and above the black card, wherein the black card is positioned below the tested device.
The further improvement to above-mentioned scheme does, the probe module is from top to bottom including the faller that floats, going up the faller, keysets, line ball board down in proper order, goes up the faller and is equipped with the probe down between the faller, and the line ball board sets up in the inside of carrier base.
The invention has the beneficial effects that: the invention provides automatic optical sensor test equipment, which comprises a rack and a workbench arranged on the rack, wherein the workbench is provided with a carrier module for placing and fixing a tested device, a probe module for connecting a connector of the tested device and leading out a signal, a pressing module for inserting the tested device on the probe module, a pressing power mechanism for driving the pressing module to move to the upper part of the tested device and press downwards, a test module for testing the tested device, a scanning module for scanning two-dimensional code information of the tested device, and a scanning power mechanism for driving the scanning module to move to the upper part of the tested device; according to the invention, the compaction power mechanism drives the compaction module to plug the connector of the tested device on the probe module, the tested device is tested in a black card and white card mode through the testing module, and the scanning power mechanism drives the scanning assembly to scan the two-dimensional code information of the tested device, so that the automation degree of the whole testing process is high, the labor cost can be reduced, the testing efficiency can be improved, and the testing stability can be improved; in addition, the height of the scanning module can be adjusted by adjusting the mounting position of the height adjusting block on the scanning support plate and the mounting position of the scanning module on the scanning fixing block, and the angle of the scanning module can be adjusted by adjusting the mounting positions of the scanning fixing block and the height adjusting block, so that the scanning effect can be ensured, and the scanning device can be suitable for various use occasions; in addition, the probe module has small occupation ratio and high test precision.
Description of the drawings:
FIG. 1 is a schematic structural diagram of the present invention.
Fig. 2 is a schematic structural diagram of a carrier module according to the present invention.
FIG. 3 is a schematic structural diagram of a probe module according to the present invention.
Fig. 4 is a schematic structural diagram of the pressing module according to the present invention.
FIG. 5 is a schematic diagram of a test module according to the present invention.
FIG. 6 is a schematic view of a scan module according to the present invention.
Description of reference numerals: the device comprises a frame 1, a workbench 2, a carrier module 3, a carrier base 31, a card installing groove 32, a positioning hole 33, a suction hole 34, an air pipe 35, a positioning copper sleeve 36, a probe module 4, a floating needle plate 41, an upper needle plate 42, a lower needle plate 43, an adapter plate 44, a wire pressing plate 45, a pressing module 5, a pressing bottom plate 51, a pressing support plate 52, a guide groove 521, a pressing slide rail 53, a slide plate 54, an inclined hole 541, a pressing plate assembly 55, a cover plate 551, a pressing needle plate 552, a pressing plate 553, a probe 554, a positioning pin 555, a guide shaft 56, a bearing 57, a pressing power mechanism 6, a test module 7, a black card fixing plate 71, a black card 72, a white card fixing plate 73, a white card 74, a test power mechanism 75, a scanning module 8, a scanning slide rail 81, a scanning slide seat 82, a scanning support plate 83, a height adjusting installing hole 831, a height adjusting block 84, a, Scanning module 86, protective shell 87, and scanning power mechanism 9.
The specific implementation mode is as follows:
the invention will be further described with reference to the accompanying drawings, as shown in fig. 1 to 6, the invention includes a frame 1, a worktable 2 disposed on the frame 1, the worktable 2 is provided with a carrier module 3 for placing and fixing a device under test, a probe module 4 for connecting a connector of the device under test and guiding out a signal, a pressing module 5 for inserting the device under test on the probe module 4, a pressing power mechanism 6 for driving the pressing module 5 to move to above the device under test and press down, a test module 7 for testing the device under test, a scanning module 8 for scanning two-dimensional code information of the device under test, a scanning power mechanism 9 for driving the scanning module 8 to move to above the device under test, the probe module 4 is disposed inside the carrier module 3, the pressing power mechanism 6 is in driving connection with the pressing module 5, the test module 7 is disposed at the bottom of the carrier module 3, the scanning power mechanism 9 is connected with the scanning module 8 in a driving way.
The carrier module 3 comprises a carrier base 31 arranged on the workbench 2 and an adsorption device arranged at the bottom of the carrier base 31, wherein the top of the carrier base 31 is provided with a clamping groove 32 matched with a tested part and a positioning hole 33 used for assisting the pressing of the pressing module 5, the positioning hole 33 is inserted with a positioning copper sleeve 36, the bottom surface of the clamping groove 32 is provided with a suction hole 34 used for adsorbing and fixing the tested part, and the suction hole 34 is communicated with the adsorption device through an air pipe 35.
The pressing module 5 comprises a pressing bottom plate 51 arranged on the workbench 2, two pressing support plates 52 respectively arranged at two sides of the pressing bottom plate 51, two groups of pressing slide rails 53 respectively arranged on the two pressing support plates 52, two sliding plates 54 respectively connected to the two groups of pressing slide rails 53 in a sliding manner, and a pressing plate assembly 55, wherein the two pressing support plates 52 are respectively provided with a guide groove 521, the guide grooves 521 are in an L-shaped structure, the pressing power mechanism 6 drives the pressing plate assembly 55 to move forwards to the upper part of a tested device and then press downwards, the two sliding plates 54 are respectively provided with an inclined hole 541 along the inclined direction, guide shafts 56 are respectively connected between the two sliding plates 54 and the pressing support plate 52 at the corresponding side, one end of each guide shaft 56 is rolled in the guide groove 521, the other end of each guide shaft 56 passes through the inclined hole 541 to be inserted in the pressing plate assembly 55, and each guide shaft 56 is sleeved, one bearing 57 rolls in the guide groove 521, the other bearing 57 rolls in the inclined hole 541, and both the two sliding plates 54 are connected with the output end of the compaction power mechanism 6.
The pressing plate assembly 55 sequentially comprises a cover plate 551, a pressing needle plate 552 and a pressing plate 553 from top to bottom, the two sides of the cover plate 551 are respectively connected with the guide shafts 56 on the corresponding sides, the pressing needle plate 552 is provided with a probe 554, a buffer spring is arranged between the pressing needle plate 552 and the cover plate 551, the buffering effect can be achieved in the pressing process, the probe 554 on the pressing needle plate can be protected, the bottom surface of the pressing plate 553 is provided with a positioning pin 555, in the pressing process, the positioning pin 555 is inserted into the positioning copper sleeve 36, the pressing precision can be guaranteed, and the precision of inserting the connector of a tested device into the probe module 4 can be guaranteed.
The scanning support plate 83 is connected with the height adjusting block 84 through screws, the scanning support plate 83 is vertically provided with a height adjusting mounting hole 831, the height adjusting mounting hole 831 is a waist-shaped hole, one end of a screw thread penetrates through the mounting hole of the height adjusting block 84 to be in threaded connection with the height adjusting block 84, the scanning fixed block 85 is connected with the height adjusting block 84 through screws, the scanning fixed block 85 is of a U-shaped structure, the opening direction of the scanning fixed block faces one side of the scanning support plate 83, the front end and the rear end of the scanning fixed block 85 are both provided with angle adjusting holes 851, the angle adjusting holes 851 are arc-shaped holes, one end of the screw thread penetrates through the angle adjusting holes 851 to be in threaded connection with the height adjusting block 84, the scanning module 86 is connected with the scanning fixed block 85 through screws, the scanning module mounting hole 852 is formed in the scanning fixed block 85, the scanning module mounting hole 852 is a waist-shaped hole, one end of, the height of the scanning module 86 can be adjusted by adjusting the mounting position of the height adjusting block 84 on the scanning support plate 83 and the mounting position of the scanning module 86 on the scanning fixing block 85, and the angle of the scanning module 86 can be adjusted by adjusting the mounting positions of the scanning fixing block 85 and the height adjusting block 84, so that the scanning effect can be ensured, and the scanning device can be suitable for various use occasions.
The scanning module 86 is covered with a protective shell 87, the front end and the rear end of the protective shell 87 are respectively connected with the front end and the rear end of the scanning fixed block 85, the scanning module 86 can be prevented from being damaged, and therefore the normal work of the scanning module 86 can be guaranteed.
The testing module 7 comprises a black card fixing plate 71 arranged at the bottom of the carrier module 3, a black card 72 arranged on the black card fixing plate 71, a white card fixing plate 73 slidably connected to the workbench 2, a white card 74 arranged on the white card fixing plate 73, and a testing power mechanism 75 driving the white card fixing plate 73 to move to the lower part of the tested device and the upper part of the black card 72, wherein the black card 72 is positioned below the tested device, and the performance of an optical sensor in the tested device can be tested quickly and accurately.
The probe module 4 comprises a floating needle plate 41, an upper needle plate 42, a lower needle plate 43, an adapter plate 44 and a line pressing plate 45 from top to bottom in sequence, a probe 554 is arranged between the upper needle plate 42 and the lower needle plate 43, and the line pressing plate 45 is arranged inside the carrier base 31.
The pressing power mechanism 6, the scanning power mechanism 9, the testing power mechanism 75 and the adsorption device are all cylinders.
The working principle is as follows:
placing the tested device on the clamping groove 32 of the carrier module 3, and adsorbing and fixing the tested device on the clamping groove 32 through an adsorption device; the scanning module 8 is moved to the position above the tested device through the scanning power mechanism 9, the scanning module 86 is adjusted to the height suitable for scanning the two-dimensional code information of the tested device by adjusting the height position between the height adjusting block 84 and the scanning supporting plate 83 on the scanning module 8 and the height position between the scanning module 86 and the scanning fixing block 85, the scanning module 86 is adjusted to the angle suitable for scanning the two-dimensional code information of the tested device by adjusting the angle between the scanning fixing block 85 and the height adjusting block 84, and the two-dimensional code information of the tested device is scanned; after the scanning is finished, the scanning power mechanism 9 drives the scanning module 8 to return; the pressing power mechanism 6 drives the pressing plate assembly 55 to move to the upper part of the tested device and press down, when pressing down, the positioning pin 555 on the pressing plate 553 inserts into the positioning copper sleeve 36 on the carrier module 3 to complete the positioning, the probe 554 on the pressing plate assembly 55 contacts with the wiring point on the tested device, and the connector of the tested device contacts with the probe 554 of the probe module 4; when the white card 74 is tested, the testing power mechanism 75 drives the white card fixing plate 73 to move to the position below the tested device, after the white card 74 is tested, the testing power mechanism 75 pulls back the white card 74 mounting plate, and the black card 72 is positioned below the tested device to test the black card 72; after the test is finished, the adsorption device is cut off, and the tested device is placed back to the material tray to finish the whole test process; the whole testing process of the invention has high automation degree, not only can reduce the labor cost, but also can improve the testing efficiency and the testing stability.
It is understood that the above description is only a preferred embodiment of the present invention, and all equivalent changes or modifications of the structure, features and principles described in the present invention are included in the scope of the present invention.
Claims (10)
1. Automatic change optical sensor test equipment which characterized in that: comprises a frame (1), a workbench (2) arranged on the frame (1), wherein the workbench (2) is provided with a carrier module (3) for placing and fixing a tested device, a probe module (4) for connecting a connector of the tested device and leading out a signal, a pressing module (5) for inserting the tested device on the probe module (4), a pressing power mechanism (6) for driving the pressing module (5) to move to the upper part of the tested device and press down, a testing module (7) for testing the tested device, a scanning module (8) for scanning two-dimensional code information of the tested device, and a scanning power mechanism (9) for driving the scanning module (8) to move to the upper part of the tested device, the probe module (4) is positioned in the carrier module (3), the pressing power mechanism (6) is in driving connection with the pressing module (5), the testing module (7) is positioned at the bottom of the carrier module (3), the scanning power mechanism (9) is connected with the scanning module (8) in a driving way.
2. The automated optical sensor testing apparatus of claim 1, wherein: carrier module (3) including setting up carrier base (31) on workstation (2), set up in the adsorption equipment of carrier base (31) bottom, carrier base (31) the top seted up with the device assorted dress draw-in groove (32) that is surveyed, be used for assisting compress tightly locating hole (33) that module (5) pushed down, the hole (34) of inhaling that are used for adsorbing, fixed device under survey is seted up to the bottom surface of dress draw-in groove (32), inhale hole (34) and be linked together through trachea (35) and adsorption equipment.
3. The automated optical sensor testing apparatus of claim 1, wherein: the pressing module (5) comprises a pressing bottom plate (51) arranged on the workbench (2), two pressing support plates (52) respectively arranged at two sides of the pressing bottom plate (51), two groups of pressing slide rails (53) respectively arranged on the two pressing support plates (52), two slide plates (54) respectively connected with the two groups of pressing slide rails (53) in a sliding manner, and a pressing plate assembly (55), wherein the two pressing support plates (52) are respectively provided with a guide groove (521), the two slide plates (54) are respectively provided with inclined holes (541) along the inclined direction, guide shafts (56) are respectively connected between the two slide plates (54) and the pressing support plates (52) at the corresponding side, one end of each guide shaft (56) is rolled in the guide groove (521), the other end of each guide shaft (56) passes through the inclined hole (541) and is inserted into the pressure plate component (55), the two sliding plates (54) are connected with the output end of the compaction power mechanism (6).
4. The automated optical sensor testing apparatus of claim 3, wherein: the guide groove (521) is of an L-shaped structure.
5. The automated optical sensor testing apparatus of claim 3, wherein: the pressing plate assembly (55) sequentially comprises a cover plate (551), a pressing needle plate (552) and a pressing plate (553) from top to bottom, two sides of the cover plate (551) are respectively connected with the guide shafts (56) on the corresponding sides, a probe (554) is arranged on the pressing needle plate (552), and a buffer spring is arranged between the pressing needle plate (552) and the cover plate (551).
6. The automated optical sensor testing apparatus of claim 5, wherein: and a positioning pin (555) is arranged on the bottom surface of the pressure plate (553).
7. The automated optical sensor testing apparatus of claim 1, wherein: scanning module (8) are including setting up scanning slide rail (81) on workstation (2), scanning slide (82) on scanning slide rail (81), set up scanning backup pad (83) on scanning slide (82) along vertical, set up altitude mixture control piece (84) on scanning backup pad (83), scanning fixed block (85), scanning module (86), scanning backup pad (83) are connected with the output of scanning power unit (9), scanning module (86) are connected with altitude mixture control piece (84) through scanning fixed block (85).
8. The automated optical sensor testing apparatus of claim 7, wherein: the scanning device is characterized in that the scanning support plate (83) is connected with the height adjusting block (84) through screws, a height adjusting mounting hole (831) is vertically formed in the scanning support plate (83), the height adjusting mounting hole (831) is a waist-shaped hole, one end of a screw thread penetrates through the height adjusting block (84) mounting hole and is in threaded connection with the height adjusting block (84), the scanning fixed block (85) is connected with the height adjusting block (84) through screws, the scanning fixed block (85) is of a U-shaped structure, the opening direction of the scanning fixed block faces one side of the scanning support plate (83), angle adjusting holes (851) are formed in the front end and the rear end of the scanning fixed block (85), the angle adjusting holes (851) are arc-shaped holes, one end of the screw thread penetrates through the angle adjusting holes (851) and is in threaded connection with the height adjusting block (84), and the scanning module (86) is in threaded connection with, scanning module mounting hole (852) have been seted up in scanning fixed block (85), and scanning module mounting hole (852) are waist shape hole, and scanning module mounting hole (852) and scanning module (86) threaded connection are passed to screw threaded one end.
9. The automated optical sensor testing apparatus of claim 1, wherein: the testing module (7) comprises a black card fixing plate (71) arranged at the bottom of the carrier module (3), a black card (72) arranged on the black card fixing plate (71), a white card fixing plate (73) connected to the workbench (2) in a sliding manner, a white card (74) arranged on the white card fixing plate (73), and a testing power mechanism (75) driving the white card fixing plate (73) to move to the lower part of the tested device and the upper part of the black card (72), wherein the black card (72) is positioned below the tested device.
10. The automated optical sensor testing apparatus of claim 1, wherein: the probe module (4) comprises a floating needle plate (41), an upper needle plate (42), a lower needle plate (43), an adapter plate (44) and a line pressing plate (45) from top to bottom in sequence, a probe (554) is arranged between the upper needle plate (42) and the lower needle plate (43), and the line pressing plate (45) is arranged inside a carrier base (31).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010227868.0A CN111323730A (en) | 2020-03-27 | 2020-03-27 | Automatic optical sensor testing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010227868.0A CN111323730A (en) | 2020-03-27 | 2020-03-27 | Automatic optical sensor testing equipment |
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| CN111323730A true CN111323730A (en) | 2020-06-23 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202010227868.0A Pending CN111323730A (en) | 2020-03-27 | 2020-03-27 | Automatic optical sensor testing equipment |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113820592A (en) * | 2021-11-22 | 2021-12-21 | 西安奇芯光电科技有限公司 | Carrier for BAR strip test |
-
2020
- 2020-03-27 CN CN202010227868.0A patent/CN111323730A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113820592A (en) * | 2021-11-22 | 2021-12-21 | 西安奇芯光电科技有限公司 | Carrier for BAR strip test |
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