CN211858575U - Sample platform for scanning electron microscope convenient to place and carry appearance net - Google Patents
Sample platform for scanning electron microscope convenient to place and carry appearance net Download PDFInfo
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- CN211858575U CN211858575U CN202020703335.0U CN202020703335U CN211858575U CN 211858575 U CN211858575 U CN 211858575U CN 202020703335 U CN202020703335 U CN 202020703335U CN 211858575 U CN211858575 U CN 211858575U
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Abstract
The utility model belongs to the technical field of sample platform for the scanning electron microscope, specifically be a sample platform for the scanning electron microscope convenient to place and carry appearance net, including the round platform, carry appearance net fixed slot, instrument level business turn over groove and the vertical business turn over groove of instrument. The sample carrying net fixing grooves are uniformly distributed on the upper portion of the circular truncated cone along the circumference, tool horizontal in-out grooves are formed in the positions, close to the edge of the circular truncated cone, of the sample carrying net fixing grooves, and the two tool vertical in-out grooves are formed in the outer portion of the circumference of the sample carrying net fixing grooves and are symmetrically distributed about the circle center of the sample carrying net fixing grooves. The utility model discloses can guarantee to carry the appearance net and can not follow the sample bench after placing and drop the loss, carry the position arrangement of appearance net in order moreover, need not use conductive adhesive tape, the instrument business turn over is convenient smooth when ann carries the appearance net, has reduced the operation degree of difficulty, has improved scientific research personnel's work efficiency. The utility model discloses think about novelty, the structure is ingenious, convenient operation, and work efficiency is high, is the innovation in the aspect of the sample platform for the scanning electron microscope.
Description
Technical Field
The utility model belongs to the technical field of sample platform for the scanning electron microscope, especially a sample platform for the scanning electron microscope convenient to place year appearance net.
Background
The scanning electron microscope is an important instrument in modern material analysis, has the characteristics of wide adjustable range of magnification, high imaging resolution, large depth of field and the like, is widely applied to the fields of metallurgy, materials science, biology, medicine and the like, and promotes the rapid development of various related subjects. An important feature of a scanning electron microscope is that the depth of field is large, and the depth of focus of a scanning electron microscope is tens of times greater than that of a transmission electron microscope and hundreds of times greater than that of an optical microscope. Because the depth of field of the image is large, the obtained scanning electronic image has stereoscopic impression and three-dimensional form, can provide more information than other microscopes, and has great use value. The appearance of a sample displayed by a scanning electron microscope plays an irreplaceable role in teaching, scientific research and production of other electron microscopes.
The sample stage is one of the key parts of the scanning electron microscope, and is used for bearing a sample and characterizing the characteristics of the sample through electronic system imaging. Due to the structural characteristics of the scanning electron microscope, a sample to be observed needs to be stably arranged on the sample table, and the observed surface needs to be perpendicular to the incident direction of the electron beam.
In the research and production process, the following problems are commonly encountered by technicians: when the surface appearance of a micro-powder sample is observed, particularly micron-sized, submicron-sized and nano-sized powder particles, if the powder is directly fixed on a conductive adhesive tape for observation, the powder is seriously agglomerated, and the surface appearance of the sample cannot be clearly observed.
A method for researching the shape of the surface of a sample is carried out by researchers from long-term working experience, namely, a sample carrying net which is usually suitable for observing transmission imaging is utilized to prepare a suspension liquid from a powder sample and a solvent (generally absolute ethyl alcohol) which does not react, then ultrasonic oscillation dispersion is carried out, a disposable dropper is used to drop the suspension liquid on the sample carrying net, the suspension liquid is moved to a sample table after being dried, the suspension liquid is fixed with the sample table by a conductive adhesive tape, then the sample table is subjected to gold plating or carbon spraying treatment and then enters a sample bin, and then the surface shape of the sample is scanned and observed, so that a good effect is achieved. If the sample carrying net is made of copper, the sample carrying net is called a copper net, and if the sample carrying net is made of nickel, molybdenum, gold or nylon, the sample carrying net is correspondingly called a nickel net, a molybdenum net, a gold net, a nylon net and the like. The sample carrying net used independently is also called a bare net, and only the bare net is needed to be used when the sample carrying net is used for observing the surface appearance of a sample, and a supporting film is not needed. Such an approach has the following disadvantages: the sample carrying net has small volume, the common standard is that the diameter is 3.05mm, the thickness is 18 mu m, the sample carrying net is easy to fall off and lose from a sample table, the sample carrying net is difficult to be orderly arranged, and the position is easy to be wrongly recorded during observation; secondly, when the sample carrying net is placed on the sample table, a conductive adhesive tape is needed, so that the scientific research cost is increased; the utility model provides a when carrying a kind net with instrument (usually for the tip is taken a photograph) centre gripping and removing, placing, no matter the instrument with carry a kind net parallel or perpendicular, the operation degree of difficulty all is great, the convenience degree is very poor, still cause easily that preparation has the sample to carry a kind net upset inefficacy, or to carrying a kind net formation pollution of placing, scientific research inefficiency.
How to solve the above problems is a matter of urgency for those skilled in the art to work.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a sample platform for scanning electron microscope convenient to place year appearance net solves following technical problem: firstly, the sample carrying net is easy to fall off and lose from the sample table and is arranged disorderly; secondly, a conductive adhesive tape is needed, so that the scientific research cost is high; and thirdly, when the sample carrying net is clamped by using an instrument (usually a tip camera), no matter the instrument is parallel or perpendicular to the sample carrying net, the operation difficulty is large, the convenience degree is poor, and the scientific research efficiency is low.
The utility model adopts the following technical scheme:
a sample platform for a scanning electron microscope convenient for placing a sample carrying net comprises a circular truncated cone, a sample carrying net fixing groove, a tool horizontal in-out groove and a tool vertical in-out groove.
The round platform be cylindrically, have a kind of net fixed slot of carrying along circumference evenly distributed on round platform upper portion, a kind of net fixed slot of carrying be circular, carry the position that kind of net fixed slot is close to the round platform edge and be equipped with instrument level business turn over groove, instrument level business turn over groove is a rectangle recess, the centre of a circle of the directional net fixed slot of carrying a kind of central line in groove of instrument level business turn over, instrument level business turn over groove one end is at the round platform border, the other end is in carrying kind of net fixed slot, the degree of depth that instrument level business turn over groove is greater than the degree of depth that carries kind of net fixed slot.
The vertical groove of business turn over of instrument is established outside the circumference of year appearance net fixed slot, has two vertical groove of business turn over of instrument and about the centre of a circle symmetric distribution of year appearance net fixed slot on every year appearance net fixed slot, and the line of the vertical groove central line of business turn over of instrument is perpendicular with the central line that the groove was gone into to the instrument level, and the degree of depth in the vertical groove of business turn over of instrument is the same with the degree of depth of year appearance net fixed slot.
The diameter of the sample-loading net fixing groove is 3.4mm-3.6mm, and the depth is 0.3mm-0.5 mm.
The length of the horizontal tool entering and exiting groove in the sample-carrying net fixing groove is 1.0mm-1.2 mm.
The depth of the tool horizontally entering and exiting the groove is 1.5mm-2.0 mm.
The distance between the end faces of the two top ends of the two vertical tool in-out grooves on the sample-carrying net fixing groove is 5.6mm-6.0 mm.
The utility model discloses following beneficial technological effect has:
1. the diameter of the sample carrying net fixing groove is slightly larger than that of the sample carrying net, the sample carrying net cannot fall off from the sample table after being placed, and the sample carrying net is orderly arranged in position, so that observation and testing are facilitated.
2. When the sample carrying net is placed on the sample table, a conductive adhesive tape is not needed, and scientific research cost is saved.
3. Utilize instrument (usually for the tip take the son) level clamp to carry a kind net edge (take the son promptly and carry a kind net plane parallel), will carry a kind net and put into and carry a kind net fixed slot, then withdraw the instrument from instrument level business turn over groove, carry a kind net and place convenient smoothly, reduced the operation degree of difficulty, improved scientific research personnel's work efficiency.
4. Utilize instrument (usually for the tip take the son) vertical clamp to carry appearance net both sides (take the son promptly and carry appearance net plane perpendicular), will carry the appearance net and put into and carry appearance net fixed slot, the instrument gets into the vertical business turn over groove of instrument this moment, then withdraws the instrument from the vertical business turn over groove of instrument, carries the appearance net to place convenient smoothly, has reduced the operation degree of difficulty, has improved scientific research personnel's work efficiency.
Drawings
FIG. 1 is a front view of a sample stage for a scanning electron microscope for conveniently placing a sample carrying net according to the present invention;
3 FIG. 3 2 3 is 3 a 3 cross 3- 3 sectional 3 view 3 taken 3 along 3 the 3 line 3 A 3- 3 A 3 in 3 FIG. 3 1 3; 3
FIG. 3 is a cross-sectional view taken along line B-B of FIG. 1;
fig. 4 is a view in the direction C of fig. 1.
Description of reference numerals: 1. a circular truncated cone; 2. a sample-carrying net fixing groove; 3. the tool horizontally enters and exits the groove; 4. the tool is vertically moved into and out of the slot.
Detailed Description
The technical solution of the present invention is described in further detail below with reference to the accompanying drawings, but the scope of the present invention is not limited to the following description.
As shown in fig. 1 to 4, a sample stage for a scanning electron microscope, on which a sample loading mesh is conveniently placed, includes a circular table 1, a sample loading mesh fixing groove 2, a tool horizontal in-out groove 3, and a tool vertical in-out groove 4.
The vertical business turn over groove 4 of instrument is established outside the circumference of carrying appearance net fixed slot 2, every carries to have two vertical business turn over grooves 4 of instrument and about carrying the centre of a circle symmetric distribution of appearance net fixed slot 2 on the net fixed slot 2 of appearance, and the line of the vertical business turn over groove 4 central line of instrument is perpendicular with the central line that the groove 3 was gone into to the instrument level, and the degree of depth that the vertical business turn over groove 4 of instrument is the same with the degree of depth that carries appearance net fixed slot 2. The diameter of the sample-loading net fixing groove 2 is 3.4mm-3.6mm, and the depth is 0.3mm-0.5 mm. The diameter of a common standard sample carrying net is 3.05mm, the thickness of the common standard sample carrying net is 0.18 mu m, a certain gap is formed when the common standard sample carrying net is placed in the sample carrying net fixing groove 2, excessive displacement is avoided, the sample carrying net cannot fall off from a sample table and be lost after being placed, and the sample carrying net is orderly arranged in position, so that observation and testing are facilitated.
The length of the tool horizontal in-out groove 3 in the sample-carrying net fixing groove 2 is 1.0mm-1.2mm, the depth of the tool horizontal in-out groove 3 is 1.5mm-2.0mm, and the distance between the two top end faces of the two tool vertical in-out grooves 4 on the sample-carrying net fixing groove 2 is 5.6mm-6.0mm, so that the tool for clamping the sample-carrying net can conveniently and quickly enter and exit.
After the test is accomplished, can get into the instrument level with the son and go into and go out groove 3 or the instrument is vertical goes into and goes out groove 4, presss from both sides tight year appearance net, removes the sample platform, and is swift convenient, and work efficiency is high.
The utility model discloses the design is novel, and the structure is ingenious, and convenient operation has both practiced thrift conductive adhesive tape, arranges the firm reliable that will carry appearance net to place in an orderly manner again, and is swift convenient, and work efficiency is high. The utility model discloses an innovation in the aspect of the sample platform for the scanning electron microscope.
The above embodiments are preferred embodiments of the present invention, but the embodiments of the present invention are not limited to the above embodiments, and any other changes, modifications, substitutions, combinations, and simplifications which do not depart from the spirit and principle of the present invention are all included in the scope of the present invention.
Claims (5)
1. The utility model provides a sample platform for scanning electron microscope convenient to place year appearance net which characterized in that: comprises a circular table (1), a sample-carrying net fixing groove (2), a tool horizontal in-out groove (3) and a tool vertical in-out groove (4);
the sample carrying net fixing groove structure is characterized in that the circular truncated cone (1) is cylindrical, sample carrying net fixing grooves (2) are uniformly distributed on the upper portion of the circular truncated cone (1) along the circumference, the sample carrying net fixing grooves (2) are circular, a tool horizontal inlet and outlet groove (3) is formed in the position, close to the edge of the circular truncated cone (1), of each sample carrying net fixing groove (2), each tool horizontal inlet and outlet groove (3) is a rectangular groove, the central line of each tool horizontal inlet and outlet groove (3) points to the circle center of each sample carrying net fixing groove (2), one end of each tool horizontal inlet and outlet groove (3) is located on the edge of the circular truncated cone (1), the other end of each tool horizontal inlet and outlet groove (3) is located in each sample carrying net fixing groove (2), and the depth of each;
the vertical groove (4) of business turn over of instrument is established outside the circumference of carrying appearance net fixed slot (2), has two vertical groove (4) of business turn over of instrument and about the centre of a circle symmetric distribution that carries appearance net fixed slot (2) on every year appearance net fixed slot (2), and the line of the vertical groove (4) central line of business turn over of instrument is perpendicular with the central line that carries appearance net fixed slot (3) of business turn over of instrument level, and the degree of depth that the vertical groove (4) of business turn over of instrument is the same with the degree of depth that carries appearance net fixed slot (2).
2. The sample stage for a scanning electron microscope convenient for placing a sample loading net according to claim 1, characterized in that: the diameter of the sample-loading net fixing groove (2) is 3.4mm-3.6mm, and the depth is 0.3mm-0.5 mm.
3. The sample stage for a scanning electron microscope convenient for placing a sample loading net according to claim 1, characterized in that: the length of the tool horizontal in-out groove (3) in the sample-carrying net fixing groove (2) is 1.0mm-1.2 mm.
4. The sample stage for a scanning electron microscope convenient for placing a sample loading net according to claim 1, characterized in that: the depth of the tool horizontally entering and exiting the groove (3) is 1.5mm-2.0 mm.
5. The sample stage for a scanning electron microscope convenient for placing a sample loading net according to claim 1, characterized in that: the distance between the end faces of the two top ends of the two vertical in-out grooves (4) of the two tools on the sample-carrying net fixing groove (2) is 5.6mm-6.0 mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020703335.0U CN211858575U (en) | 2020-04-30 | 2020-04-30 | Sample platform for scanning electron microscope convenient to place and carry appearance net |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020703335.0U CN211858575U (en) | 2020-04-30 | 2020-04-30 | Sample platform for scanning electron microscope convenient to place and carry appearance net |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211858575U true CN211858575U (en) | 2020-11-03 |
Family
ID=73178173
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202020703335.0U Expired - Fee Related CN211858575U (en) | 2020-04-30 | 2020-04-30 | Sample platform for scanning electron microscope convenient to place and carry appearance net |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211858575U (en) |
-
2020
- 2020-04-30 CN CN202020703335.0U patent/CN211858575U/en not_active Expired - Fee Related
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20201103 Termination date: 20210430 |
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| CF01 | Termination of patent right due to non-payment of annual fee |