CN214279902U - Sample pedestal with positioning and clamping functions for scanning electron microscope - Google Patents
Sample pedestal with positioning and clamping functions for scanning electron microscope Download PDFInfo
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- CN214279902U CN214279902U CN202120164577.1U CN202120164577U CN214279902U CN 214279902 U CN214279902 U CN 214279902U CN 202120164577 U CN202120164577 U CN 202120164577U CN 214279902 U CN214279902 U CN 214279902U
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Abstract
The utility model provides a sample pedestal with positioning and clamping functions for a scanning electron microscope, which is characterized by comprising a sample pedestal body, a clamping plate, a slide bar, a slide block, a protective layer and a reset spring, the utility model adds the clamping plate, the slide block, the slide bar and the reset spring on the prior sample pedestal body, thereby leading the prior sample pedestal body to have good clamping function, namely, when a sample is placed on the sample stand body, the sample can be positioned and clamped on the sample stand body by the clamping plate, therefore, even if the scanning electron microscope shakes due to the collision of the operator operation errors during the detection process of the sample to be detected, the sample pedestal body indirectly shakes, the phenomenon of the position offset of the sample to be detected can not occur, and the phenomenon that the sample pedestal body falls can not occur, so that the accuracy of the detection result of the sample to be detected can not be influenced.
Description
Technical Field
The utility model relates to a scanning electron microscope technical field especially relates to a scanning electron microscope is with sample pedestal that has positioning and clamping function.
Background
The scanning electron microscope is a novel electronic optical instrument, has the characteristics of simple sample preparation, wide adjustable range of magnification, high image resolution, large depth of field and the like, and has been widely applied to the fields of biology, medicine, metallurgy and other subjects for decades, thereby promoting the development of various related subjects; the scanning electron microscope modulates and images various physical signals excited by a fine focusing electron beam when the surface of a sample is scanned, the sample needs to be correspondingly processed before the scanning electron microscope is observed, and the preparation of the scanning electron microscope sample mainly requires that: the surface structure of the sample is well preserved as far as possible, the sample is free from deformation and pollution, is dry and has good conductivity, in addition, the size of the sample is required to be ensured not to exceed the radius range of the sample table, so that the detection efficiency of the sample can be effectively ensured, the sample to be detected can be placed on the sample table and detected after the steps are operated, but the sample table is very easy to shake due to the shaking of the scanning electron microscope caused by improper collision of working personnel in the detection process because the existing sample table for the scanning electron microscope generally lacks the clamping function, namely, the sample to be detected cannot be effectively fixed on the sample table, so that the sample to be detected is very easy to shift on the position of the sample to be detected on the sample table, the sample table is easy to drop under serious conditions, and the accuracy of the detection result of the sample to be detected is easy to influence, although the sample can be prepared again by the experimenter and placed on the sample table for detection again, the process of preparing the sample again is complicated, the output of manpower and material resources is easy to increase, and the process of the final experimental detection result is very easy to delay, so that a sample table seat with a positioning and clamping function for a scanning electron microscope is urgently needed.
Disclosure of Invention
According to the technical problem, the utility model provides a sample pedestal with positioning and clamping functions for scanning electron microscope, which is characterized in that the sample pedestal comprises a sample pedestal body, a clamping plate, a slide bar, a slide block, a protective layer and a reset spring, wherein the sample pedestal body is provided with two slide grooves, the insides of the two slide grooves are respectively connected with the slide bar in a threaded manner, the slide bar is respectively sleeved with the slide block and the reset spring, the clamping plate is welded at the upper end of the slide block, one end of the reset spring is welded on the side wall of the slide block, and the other end of the reset spring is welded inside the slide groove; the clamping plate is respectively connected with the sample pedestal in a sliding manner through a sliding block and a sliding rod; the section of the clamping plate is of an arc-shaped structure; the clamping plate is provided with a protective layer on one side close to the center of the sample pedestal, and the protective layer is made of rubber.
The utility model has the advantages that:
the utility model adds the clamping plate, the slide block, the slide bar and the reset spring on the prior sample pedestal body, thereby leading the prior sample pedestal body to have good clamping function, namely, when a sample is arranged on the sample pedestal body, the sample can be positioned and clamped on the sample pedestal body under the action of the clamping plate, thus leading the sample to be detected to directly shake the sample pedestal body even if a scanning electron microscope shakes due to the misoperation and collision of workers in the detection process, avoiding the phenomenon of the position deviation of the sample to be detected and the phenomenon of falling off the sample pedestal body, further avoiding influencing the accuracy of the detection result of the sample to be detected, further avoiding the need of preparing the sample again by the experimenter and arranging the sample on the sample pedestal body for detection again, and effectively reducing the output of manpower and material resources to a certain extent, the process of the final experiment detection result is not delayed;
the utility model discloses a set up to the inoxidizing coating of rubber material on one side that the pinch-off blades are close to sample pedestal center, the sample can not receive the damage when receiving the pinch-off blades clamp tightly in the setting of this inoxidizing coating, has guaranteed the integrality of sample promptly to can further effectively ensure experiment testing result's accuracy.
Drawings
FIG. 1 is a schematic view of the overall structure of the present invention;
fig. 2 is a side sectional view of the overall structure of the present invention.
As shown in the figure: 1-sample pedestal body, 11-chute, 2-clamping plate, 21-protective layer, 22-slide block, 3-slide rod and 31-reset spring.
Detailed Description
Example 1
The utility model provides a scanning electron microscope is with sample pedestal that has location clamping function, its characterized in that includes sample pedestal body 1, clamp plate 2, slide bar 3, slider 22, inoxidizing coating 21, reset spring 31, sample pedestal body 1 is last to have seted up two spouts 11, the inside threaded connection has slide bar 3 respectively of two spouts 11, slider 22, reset spring 31 are overlapped respectively on slide bar 3, the upper end welding of slider 22 has clamp plate 2, the welding has the one end of reset spring 31 on the lateral wall of slider 22, the other end of reset spring 31 welds inside spout 11; the clamping plate 2 is respectively connected with the sample pedestal in a sliding way through a sliding block 22 and a sliding rod 3; the section of the clamping plate 2 is of an arc structure; a protective layer 21 is arranged on one side of the clamping plate 2 close to the center of the sample pedestal, and the protective layer 21 is made of rubber.
Example 2
When the utility model is used, firstly, an experimenter wears the experiment protective gloves, then two clamping plates 2 are respectively shifted to the left and the right sides of a sample pedestal body 1, in the shifting process, the clamping plates 2 will move along the two ends of a slide bar 3 under the drive of a slide block 22 and extrude a reset spring 31 until the sample can be accommodated on the sample pedestal body 1, then, the sample to be detected is arranged on the sample pedestal body 1, then the experimenter slowly loosens the clamping plates 2 with limited two sides, at the moment, the clamping plates 2 on the two sides will gradually draw close to the center of the sample pedestal body 1 under the action force of the reset spring 31 restoring elastic deformation, and the sample to be detected realizes the positioning and clamping effect, thus the prior sample pedestal body 1 can have good clamping function, namely, when the sample is arranged on the sample pedestal body 1, the sample to be detected can be positioned and clamped on the sample pedestal body 1 under the action of the clamping plate 2, so that even if a scanning electron microscope shakes due to misoperation and collision of workers during detection, the sample pedestal body 1 indirectly shakes, the phenomenon of position offset of the sample to be detected does not occur, the phenomenon of falling from the sample pedestal body 1 does not occur, and the accuracy of a detection result of the sample to be detected is not influenced, so that an experimenter does not need to prepare the sample again and place the sample on the sample pedestal body 1 for detection again, the output of manpower and material resources can be effectively reduced to a certain extent, and the progress of a final experimental detection result is not delayed, wherein the rubber protective layer 21 is arranged on one side of the clamping plate 2 close to the center of the sample pedestal, and the protective layer 21 can ensure that the sample is clamped by the clamping plate 2, the integrity of the sample is ensured without being damaged, so that the accuracy of the test result can be further effectively ensured.
The basic principles and the main features of the invention and the advantages of the invention have been shown and described above. The utility model discloses each part that mentions is the common technique in prior art, and the technical personnel of this trade should understand, the utility model discloses do not receive the restriction of above-mentioned embodiment, the description only is the explanation in above-mentioned embodiment and the description the principle of the utility model, under the prerequisite that does not deviate from the spirit and the scope of the utility model, the utility model discloses still can have various changes and improvement, these changes and improvement all fall into the protection of claim the utility model is within the scope. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (3)
1. A sample pedestal with a positioning and clamping function for a scanning electron microscope is characterized by comprising a sample pedestal body, a clamping plate, a sliding rod, a sliding block, a protective layer and a reset spring, wherein two sliding grooves are formed in the sample pedestal body, the sliding rods are respectively in threaded connection in the two sliding grooves, the sliding block and the reset spring are respectively sleeved on the sliding rod, the clamping plate is welded at the upper end of the sliding block, one end of the reset spring is welded on the side wall of the sliding block, and the other end of the reset spring is welded in the sliding grooves; the clamping plate is respectively connected with the sample pedestal in a sliding manner through a sliding block and a sliding rod; and a protective layer is arranged on one side of the clamping plate close to the center of the sample pedestal.
2. A specimen stage with positioning and clamping function for a scanning electron microscope according to claim 1, wherein the cross section of the clamping plate has an arc-shaped configuration.
3. The sample holder with positioning and clamping function for a scanning electron microscope according to claim 1, wherein the protective layer is made of rubber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120164577.1U CN214279902U (en) | 2021-01-21 | 2021-01-21 | Sample pedestal with positioning and clamping functions for scanning electron microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120164577.1U CN214279902U (en) | 2021-01-21 | 2021-01-21 | Sample pedestal with positioning and clamping functions for scanning electron microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214279902U true CN214279902U (en) | 2021-09-24 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202120164577.1U Active CN214279902U (en) | 2021-01-21 | 2021-01-21 | Sample pedestal with positioning and clamping functions for scanning electron microscope |
Country Status (1)
| Country | Link |
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| CN (1) | CN214279902U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP4318543A1 (en) * | 2022-08-02 | 2024-02-07 | Leica Mikrosysteme GmbH | Sample holder for holding a sample carrier, handling tool and corresponding methods |
-
2021
- 2021-01-21 CN CN202120164577.1U patent/CN214279902U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP4318543A1 (en) * | 2022-08-02 | 2024-02-07 | Leica Mikrosysteme GmbH | Sample holder for holding a sample carrier, handling tool and corresponding methods |
| WO2024028223A1 (en) * | 2022-08-02 | 2024-02-08 | Leica Mikrosysteme Gmbh | Sample holder for holding a sample carrier, handling tool and corresponding methods |
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