CN210546478U - Triaxial testing arrangement that slice electron spare was used - Google Patents

Triaxial testing arrangement that slice electron spare was used Download PDF

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Publication number
CN210546478U
CN210546478U CN201921411350.1U CN201921411350U CN210546478U CN 210546478 U CN210546478 U CN 210546478U CN 201921411350 U CN201921411350 U CN 201921411350U CN 210546478 U CN210546478 U CN 210546478U
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China
Prior art keywords
cylinder
base station
telescopic arm
portal frame
sliding block
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Active
Application number
CN201921411350.1U
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Chinese (zh)
Inventor
张福
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Yangqi Electronic Industry Co Ltd
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Suzhou Yangqi Electronic Industry Co Ltd
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Priority to CN201921411350.1U priority Critical patent/CN210546478U/en
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Abstract

The utility model relates to a triaxial testing arrangement that slice electron spare was used, include: a base station; the linear sliding table is arranged in the middle of the base station and arranged along the length direction of the base station; the lower part of the jig plate is fixedly provided with a sliding block, and the sliding block is in sliding fit with the linear sliding table; the portal frame is arranged across the width direction of the base station; the linear motor is horizontally arranged along the top of the portal frame; the first cylinder is fixedly connected with a sliding block of the linear motor, is vertically arranged and is used for translating along the portal frame under the driving of the linear motor, and a test probe connected with an external test device is fixed on a telescopic arm of the first cylinder; the second cylinder is fixed on the outer side of the first cylinder and is arranged in parallel with the telescopic arm of the second cylinder and the telescopic arm of the first cylinder; and the dispensing device is connected with the telescopic arm of the second cylinder. The utility model discloses the realization is to the quick accurate detection of electron spare, accomplishes the sign of defective products automatically simultaneously in the testing process.

Description

Triaxial testing arrangement that slice electron spare was used
Technical Field
The utility model relates to an electron spare processing equipment technical field especially relates to a triaxial testing arrangement that slice electron spare was used.
Background
After electronic components processing accomplished, according to the production requirement, need detect its performance parameter, carry out artifical the detection to electronic components through the manual work at present mostly, because the product is bulky, in order to practice thrift check-out time, adopt the selective examination usually, this defective products that will lead to wherein increase, undoubtedly can cause the decline of yields. However, if the detection is performed one by one, the labor cost is greatly increased.
How to detect electronic parts efficiently and quickly is a technical problem which needs to be solved urgently at present.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a triaxial testing arrangement that slice electron spare was used realizes the quick accurate detection to the electron spare, accomplishes the sign of defective products automatically simultaneously in the testing process.
In order to achieve the above purpose, the utility model adopts the technical scheme that:
the utility model provides a triaxial testing arrangement that slice electron spare was used, include:
a base station;
the linear sliding table is arranged in the middle of the base station and arranged along the length direction of the base station;
the lower part of the jig plate is fixedly provided with a sliding block, and the sliding block is in sliding fit with the linear sliding table;
the portal frame is arranged across the width direction of the base station;
the linear motor is horizontally arranged along the top of the portal frame;
the first cylinder is fixedly connected with a sliding block of the linear motor, is vertically arranged and is used for translating along the portal frame under the driving of the linear motor, and a test probe connected with an external test device is fixed on a telescopic arm of the first cylinder;
the second cylinder is fixed on the outer side of the first cylinder and is arranged in parallel with the telescopic arm of the second cylinder and the telescopic arm of the first cylinder;
and the dispensing device is connected with the telescopic arm of the second cylinder.
Preferably, the dispensing device is a pneumatic dispensing hose, and a control solenoid valve of the pneumatic dispensing hose is connected with an output end of the external testing device.
Preferably, the jig plate comprises a positioning plate and a plastic-absorbing box buckled on the positioning plate, the surface of the plastic-absorbing box is provided with a plurality of uniformly arranged limiting grooves, and the electronic part to be detected is placed in the limiting grooves.
Because of the application of the technical scheme, compared with the prior art, the utility model has the following advantages:
the utility model discloses a triaxial testing arrangement uses current point gum machine, carries out the institutional advancement to it, utilizes current testing arrangement's defective products detected signal as control signal simultaneously, realizes directly carrying out the sign through the point gum machine after detecting out the defective products to the quick high-speed detection of electron piece, has realized automatic detection, and equipment transformation is with low costs, but the input that nevertheless can greatly reduced cost of labor can improve production efficiency more than 50% simultaneously.
Drawings
Some specific embodiments of the present invention will be described in detail hereinafter, by way of illustration and not by way of limitation, with reference to the accompanying drawings. The same reference numbers in the drawings identify the same or similar elements or components. Those skilled in the art will appreciate that the drawings are not necessarily drawn to scale. In the drawings:
fig. 1 is a schematic structural diagram of a triaxial test apparatus according to the present invention.
Wherein the reference numerals are as follows:
1. a base station; 2. a linear sliding table; 3. the jig comprises a jig plate 31, a positioning plate 32, a plastic suction box 33 and a limiting groove; 4. a slider; 5. a gantry; 6. a linear motor; 7. a first cylinder; 8. a second cylinder; 9. a dispensing device; 10. and (6) testing the probe.
Detailed Description
The technical solution of the present invention will be described clearly and completely with reference to the accompanying drawings, and obviously, the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
Furthermore, the technical features mentioned in the different embodiments of the invention described below can be combined with each other as long as they do not conflict with each other.
The present embodiment describes a triaxial test apparatus for a chip electronic component, which may generally include, as shown in fig. 1:
a base station 1, namely a common detection workbench;
the linear sliding table 2 is arranged in the middle of the base table 1 and arranged along the length direction of the base table 1;
the lower part of the jig plate 3 is fixedly provided with a sliding block 4, and the sliding block 4 is in sliding fit with the linear sliding table 2, so that the product can be translated in the front and back directions;
a gantry 5 arranged across the width direction of the base 1;
the linear motor 6 is horizontally arranged along the top of the portal frame 5;
the first air cylinder 7 is fixedly connected with a sliding block of the linear motor 6 and is vertically arranged, the linear motor 6 is driven to move horizontally along the portal frame 5, and a test probe 10 connected with an external test device is fixed on a telescopic arm of the first air cylinder 7. Correspondingly, the product can translate in the left and right directions, and the test probe 10 can automatically align and plug in the vertical direction, so that the electronic part and an external test device can be connected for detection, and translation butt joint in the three axial directions can be realized;
the second air cylinder 8 is fixed on the outer side of the first air cylinder 7 and is arranged in parallel with the telescopic arm of the second air cylinder 8 and the telescopic arm of the first air cylinder 7;
the glue dispensing device 9 is connected with the telescopic arm of the second air cylinder 8, and when the electronic part is detected, a glue outlet of the glue dispensing device 9 and the test probe 10 are positioned above the same electronic part, so that glue is directly dispensed onto the electronic part which is detected correspondingly when the glue is needed.
In another preferred embodiment, the dispensing device 9 is a pneumatic dispensing hose, and a control solenoid valve of the pneumatic dispensing hose is connected to an output end of the external testing device, that is, the external testing device directly sends a trigger signal to the control solenoid valve after detecting a defective product, and the pneumatic dispensing hose dispenses a dispensing, leaving a mark on the surface of the corresponding defective product. Therefore, defective product detection signals of the existing testing device can be used as control signals, rapid and high-speed detection of electronic parts is achieved, and identification is directly carried out through the glue dispenser after defective products are detected
Preferably, the jig plate 3 includes a positioning plate 31 and a plastic-suction box 32 fastened on the positioning plate 31, the surface of the plastic-suction box 32 has a plurality of spacing grooves 33 arranged uniformly, and the electronic component to be detected is placed in the spacing grooves 33. The plastic uptake box 32 has low manufacturing cost, and the plastic uptake box 32 can be quickly replaced to adapt to the detection of various electronic parts with different types, so that the detection applicability of the testing device is improved.
The utility model discloses a triaxial testing arrangement uses current point gum machine, carries out the institutional advancement to it, utilizes current testing arrangement's defective products detected signal as control signal simultaneously, has realized automatic detection, and equipment transformation is with low costs, but nevertheless can greatly reduced cost of labor's input, can improve production efficiency more than 50% simultaneously.
The above embodiments are only for illustrating the technical concept and features of the present invention, and the purpose thereof is to enable those skilled in the art to understand the contents of the present invention and to implement the present invention, so as not to limit the protection scope of the present invention, and all equivalent changes or modifications made according to the spirit of the present invention should be covered by the protection scope of the present invention.

Claims (3)

1. A triaxial test apparatus for a chip electronic component, comprising:
a base station;
the linear sliding table is arranged in the middle of the base station and arranged along the length direction of the base station;
the lower part of the jig plate is fixedly provided with a sliding block, and the sliding block is in sliding fit with the linear sliding table;
the portal frame is arranged across the width direction of the base station;
the linear motor is horizontally arranged along the top of the portal frame;
the first cylinder is fixedly connected with a sliding block of the linear motor, is vertically arranged and is used for translating along the portal frame under the driving of the linear motor, and a test probe connected with an external test device is fixed on a telescopic arm of the first cylinder;
the second cylinder is fixed on the outer side of the first cylinder and is arranged in parallel with the telescopic arm of the second cylinder and the telescopic arm of the first cylinder;
and the dispensing device is connected with the telescopic arm of the second cylinder.
2. The triaxial test device of claim 1, wherein the dispensing device is a pneumatically controlled dispensing tube, and a control solenoid valve of the pneumatically controlled dispensing tube is connected with an output end of the external test device.
3. The triaxial test device of claim 1, wherein the jig plate comprises a positioning plate and a plastic-suction box fastened on the positioning plate, the surface of the plastic-suction box is provided with a plurality of spacing grooves which are uniformly arranged, and the electronic component to be tested is placed in the spacing grooves.
CN201921411350.1U 2019-08-28 2019-08-28 Triaxial testing arrangement that slice electron spare was used Active CN210546478U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201921411350.1U CN210546478U (en) 2019-08-28 2019-08-28 Triaxial testing arrangement that slice electron spare was used

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201921411350.1U CN210546478U (en) 2019-08-28 2019-08-28 Triaxial testing arrangement that slice electron spare was used

Publications (1)

Publication Number Publication Date
CN210546478U true CN210546478U (en) 2020-05-19

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201921411350.1U Active CN210546478U (en) 2019-08-28 2019-08-28 Triaxial testing arrangement that slice electron spare was used

Country Status (1)

Country Link
CN (1) CN210546478U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112833799A (en) * 2021-01-07 2021-05-25 甬矽电子(宁波)股份有限公司 Soldering flux glue climbing height detection device and detection method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112833799A (en) * 2021-01-07 2021-05-25 甬矽电子(宁波)股份有限公司 Soldering flux glue climbing height detection device and detection method
CN112833799B (en) * 2021-01-07 2022-07-08 甬矽电子(宁波)股份有限公司 Soldering flux glue climbing height detection device and detection method

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