CN209964058U - High and low temperature tracking error testing device for optical device - Google Patents
High and low temperature tracking error testing device for optical device Download PDFInfo
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- CN209964058U CN209964058U CN201921260110.6U CN201921260110U CN209964058U CN 209964058 U CN209964058 U CN 209964058U CN 201921260110 U CN201921260110 U CN 201921260110U CN 209964058 U CN209964058 U CN 209964058U
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- tracking error
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Abstract
The utility model belongs to the technical field of optical communication equipment, a high low temperature tracking error testing arrangement of optical device is related to, including the platform base plate, platform base plate upper surface sets up control circuit board, sets up optical device power supply port on the control circuit board, still is provided with the guide rail on the platform base plate, high-low temperature box with guide rail sliding fit connects, and the tip position department that corresponds to the guide rail on the platform base plate sets up optical device anchor clamps, and high-low temperature incasement portion sets gradually water tank, semiconductor cooler, fin, fan from last down, and this testing arrangement can accomplish the high low temperature change of-40 ℃ ~ +85 ℃ in the short time to can test optical device tracking error's miniaturized optical device high low temperature performance testing arrangement in batches, thereby improve optical device performance test's efficiency, reduction in production cost.
Description
Technical Field
The utility model belongs to the technical field of optical communication equipment, a high low temperature tracking error testing arrangement of optical device is related to.
Background
The operating temperature of the industrial-grade optical communication module is in the range of-40 ℃ ~ +85 ℃, and the performance of the optical chip is not constant in the wide temperature range, so an index is needed to determine whether the performance of the optical device meets the requirements of the optical communication module.
Te (tracking error), which is defined as the ratio of the fiber output power at two different temperature conditions, is a parameter for measuring the stability of the coupling efficiency of the device, and has a unit of dB. Tracking error is an important index affecting the stability of the output optical power of the module. The module output optical power changes at high and low temperatures, typically due to tracking errors (if the laser is not saturated prematurely at high temperatures).
The value of TE reflects the stability of the device at high and low temperatures. The temperature is in the range of-40 ℃ to +85 ℃, the stability of the light path structure, the stability of the light-emitting oblique efficiency of the LD chip, the stability of MPD photoelectric conversion and the stability of the ratio of front light to back light of the LD chip are included.
Therefore, the TE value of the optical device is one of the indexes that optical module manufacturers must test, and most of the TE tests commonly used at present pass the high-low temperature oven test, which has the disadvantages that the temperature rising and lowering process is slow, usually 30-45 minutes is required for one cycle, and 1 hour is required for one test. Some manufacturers can rapidly raise and lower the temperature in a small closed space by using the heat flow meter, and can test the TE value of the optical device in a short time, but the price of the heat flow meter is higher, so that the high and low temperature tracking error testing device for the optical communication device, which has high testing efficiency and low price, is needed.
Disclosure of Invention
The utility model provides a to above-mentioned problem, a high low temperature tracking error testing arrangement of optical device is provided, this testing arrangement can accomplish the high low temperature change of-40 ℃ ~ +85 ℃ in the short time to can test optical device tracking error's miniaturized optical device high low temperature capability test device in batches, thereby improve optical device capability test's efficiency, reduction in production cost.
According to the technical scheme of the utility model: the utility model provides an optical device high low temperature tracking error testing arrangement which characterized in that: the device comprises a platform substrate, wherein a control circuit board is arranged on the upper surface of the platform substrate, and an optical device power supply port is arranged on the control circuit board; the platform substrate is also provided with a guide rail, the high-low temperature box is connected with the guide rail in a sliding fit manner, and the platform substrate is provided with an optical device clamp at the position corresponding to the end part of the guide rail; the high-low temperature box is internally provided with a water tank, a semiconductor refrigerator, a radiating fin and a fan from top to bottom in sequence, and the semiconductor refrigerator is electrically connected with a power supply port of the optical device; when the high-low temperature box slides to a high-low temperature working position along the guide rail, the optical device clamp is matched with the lower opening position of the high-low temperature box to form a closed box body; the water tank is communicated with the water-cooling circulating water tank through a water pipe.
As a further improvement of the utility model, the control circuit board passes through hexagonal screw post fastening connection on the platform base plate.
As a further improvement of the utility model, the optical device anchor clamps include optical device anchor clamps support, a plurality of optical module shells of optical device anchor clamps shelf location, and the optical fiber jumper wire is all connected to the one end of every optical module shell, and the one end of optical device is all connected to the optical module shell other end, and the other end of optical device passes through the pin locator and connects the power supply cable, the power supply cable is connected with optical device power supply port.
As a further improvement, the control circuit board is provided with a host computer control circuit board reading optical power meter.
As a further improvement of the utility model, the water pipe comprises a water inlet pipe and a water return pipe.
As a further improvement, the high-low temperature box sets up the optical device anchor clamps and imports and exports towards the lower part of optical device anchor clamps one side, and the optical device anchor clamps are imported and exported and are formed the closed box after cooperating with the optical device anchor clamps.
As a further improvement of the utility model, a handle is arranged on the high-low temperature box.
The technical effects of the utility model reside in that: the device utilizes anti-static heat insulation materials to manufacture a miniaturized heat insulation box, adopts a semiconductor refrigerator and a water cooling circulation system to rapidly cool, and rapidly heats through a heating rod to complete high-low temperature circulation in a short time; the heating element is a resistance wire, the refrigerating element is a semiconductor refrigerator, and the high-low temperature box body is made of synthetic stone or other anti-static heat insulation materials, so that the manufacturing cost is low; the optical device fixing clamp ensures that the optical device and the optical fiber are in a butt joint state with pretightening force by using a preset optical module shell, namely the optical device is in a real use state, so that the connection reliability is ensured; the operation is simple, the optical device is arranged on the fixing clamp, the high-low temperature box body is pulled to be in place, and the test is started.
Drawings
Fig. 1 is a schematic structural diagram of the utility model at normal temperature.
Fig. 2 is the structural schematic diagram of the high and low temperature test state of the present invention.
Fig. 3 is a schematic structural view of the optical device holder.
Fig. 4 is a front view of the high and low temperature compartment.
Fig. 5 is a left side view of the high and low temperature compartment.
Fig. 6 is a perspective view of the high and low temperature compartment.
Detailed Description
The following description will further describe embodiments of the present invention with reference to the accompanying drawings.
Fig. 1 ~ 6 includes a platform substrate 1, a control circuit board 2, an optical device fixture 3, a fixed support assembly 31, an optical module housing 32, an optical device 33, an optical fiber jumper 34, a power supply cable 35, a pin positioner 36, a high-low temperature box 4, a guide rail 5, a water-cooling circulation water tank 6, an optical device power supply port 7, a water pipe 8, an upper computer control circuit board reading optical power meter 9, and the like.
As shown in fig. 1 ~ 6, the utility model relates to an optical device high and low temperature tracking error testing device, including platform substrate 1, platform substrate 1 upper surface sets up control circuit board 2, control circuit board 2 is last to set up optical device power supply port 7, still be provided with guide rail 5 on platform substrate 1, guide rail 5 is installed on platform substrate 1 through the screw, high and low temperature case 4 is connected with guide rail 5 sliding fit, the position department sets up optical device anchor clamps 3 corresponding to the tip of guide rail 5 on platform substrate 1, high and low temperature case 4 is inside from last to down sets up water tank 41, semiconductor refrigerator 42, fin 44, fan 43 in proper order, wherein the hot side of semiconductor refrigerator 42 contacts with water tank 41, the cold side of semiconductor refrigerator 42 contacts with fin 44, all be provided with heat conduction material (heat conduction silicone grease or heat conduction silicone rubber etc.) between these two contact surfaces to reduce the air thermal resistance, heating rod 45 contacts with fin 44, fan 43 passes through the fix with screw to fin 44, guarantee high and low temperature case 4 air convection circulation, the heat is even.
The semiconductor refrigerator 42 is electrically connected with the optical device power supply port 7; when the high-low temperature box 4 slides to a high-low temperature working position along the guide rail 5, the optical device clamp 3 is matched with the lower opening position of the high-low temperature box 4 to form a closed box body; the water tank 41 is communicated with the water-cooling circulating water tank 6 through a water pipe 8.
The optical device clamp 3 comprises an optical device clamp bracket, a plurality of optical module shells 32 are mounted on the optical device clamp bracket, one end of each optical module shell 32 is connected with an optical fiber jumper 34, the other end of each optical module shell 32 is connected with one end of an optical device 33, the other end of each optical device 33 is connected with a power supply cable 35 through a pin locator 36, and the power supply cable 35 is connected with an optical device power supply port 7. The optical module shell 32 is used as a clamp for connecting the optical device 33 and the optical fiber jumper 34, so that the connection pretightening force of the optical device 33 and the optical fiber jumper 34 is guaranteed, and the connection is reliable.
The control circuit board 2 is provided with a host computer control circuit board reading optical power meter 9.
The water pipe 8 includes a water inlet pipe and a water return pipe, which are connected to a water inlet and a water outlet provided on the water tank 41, respectively.
The lower part of one side of the high-low temperature box 4 facing the optical device clamp 3 is provided with an optical device clamp inlet and outlet, and the optical device clamp inlet and outlet are matched with the optical device clamp 3 to form a closed box body; and an avoiding opening of the optical fiber jumper 34 is formed in the other side of the optical fiber jumper 34, so that the optical fiber jumper 34 is conveniently connected with the outside. In order to make the high-low temperature box 4 have a good heat preservation effect, the box body material of the high-low temperature box 4 adopts synthetic stone or other anti-static heat preservation materials.
The high-low temperature box 4 is provided with a handle, and the high-low temperature box 4 can be moved back and forth by pulling the handle, so that the optical device 33 is positioned in the high-low temperature box 4 or separated from the high-low temperature box 4.
The utility model discloses the product is in the course of the work, during high temperature test, and semiconductor cooler 42 is out of work, and heating rod 45 generates heat, and heat transfer to fin 44, fan 43 blow high low-temperature box 4 interior air current for temperature rises fast in the box.
During the low temperature test, heating rod 45 is out of work, and semiconductor cooler 42 works, with heat transfer to the hot side, the contact of hot side and water tank 41 takes away the heat through the circulating water in water tank 41 for semiconductor cooler 42 cold side temperature descends fast, and fan 43 blows the air flow in high-low temperature box 4, makes the temperature reduce fast in the high-low temperature box 4.
In practical applications, the heating rod 45 can be eliminated, and the semiconductor refrigerator 42 can be used for cooling and heating.
Use the utility model discloses the concrete test flow of product is as follows: 1. a plurality of optical devices 33 are connected with pin locators 36 of the test board and then assembled to the optical module housing 32 on the optical device clamp 3;
2. the test optical fiber is inserted into an optical interface of the optical module shell and is connected with an optical device;
3. pulling the high-low temperature box 4 to wrap the optical device 33 in the high-low temperature box 4;
4. the upper computer controls to start testing;
5. the control circuit board 2 controls the semiconductor refrigerator 42 to refrigerate, the temperature reaches the test point, and the upper computer automatically records the performance data of the optical device;
6. the control circuit board 2 controls the semiconductor refrigerator 42 to stop refrigerating, the heating rod 45 heats, the temperature reaches the test point, and the upper computer automatically records the performance data of the optical device;
7. the upper computer displays the optical performance data, automatically calculates the tracking error value, and judges whether the optical device 33 is qualified.
Claims (7)
1. The utility model provides an optical device high low temperature tracking error testing arrangement which characterized in that: the device comprises a platform substrate (1), wherein a control circuit board (2) is arranged on the upper surface of the platform substrate (1), and an optical device power supply port (7) is arranged on the control circuit board (2); the platform substrate (1) is also provided with a guide rail (5), the high-low temperature box (4) is connected with the guide rail (5) in a sliding fit manner, and the end part of the platform substrate (1) corresponding to the guide rail (5) is provided with an optical device clamp (3); a water tank (41), a semiconductor refrigerator (42), a radiating fin (44) and a fan (43) are sequentially arranged in the high-low temperature box (4) from top to bottom, and the semiconductor refrigerator (42) is electrically connected with the optical device power supply port (7); when the high-low temperature box (4) slides to a high-low temperature working position along the guide rail (5), the optical device clamp (3) is matched with the lower opening position of the high-low temperature box (4) to form a closed box body; the water tank (41) is communicated with the water-cooling circulating water tank (6) through a water pipe (8).
2. The optical device high and low temperature tracking error testing apparatus according to claim 1, wherein: and the control circuit board (2) is fixedly connected to the platform substrate (1) through a hexagonal threaded column.
3. The optical device high and low temperature tracking error testing apparatus according to claim 1, wherein: the optical device clamp (3) comprises an optical device clamp support, a plurality of optical module shells (32) are mounted on the optical device clamp support, one end of each optical module shell (32) is connected with an optical fiber jumper (34), the other end of each optical module shell (32) is connected with one end of an optical device (33), the other end of each optical device (33) is connected with a power supply cable (35) through a pin positioner (36), and the power supply cable (35) is connected with an optical device power supply port (7).
4. The optical device high and low temperature tracking error testing apparatus according to claim 1, wherein: and an upper computer control circuit board reading optical power meter (9) is arranged on the control circuit board (2).
5. The optical device high and low temperature tracking error testing apparatus according to claim 1, wherein: the water pipe (8) comprises a water inlet pipe and a water return pipe.
6. The optical device high and low temperature tracking error testing apparatus according to claim 1, wherein: the lower part of one side of the high-low temperature box (4) facing the optical device clamp (3) is provided with an optical device clamp inlet and outlet, and the optical device clamp inlet and outlet are matched with the optical device clamp (3) to form a closed box body.
7. The optical device high and low temperature tracking error testing apparatus according to claim 1, wherein: and a handle is arranged on the high-low temperature box (4).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921260110.6U CN209964058U (en) | 2019-08-06 | 2019-08-06 | High and low temperature tracking error testing device for optical device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921260110.6U CN209964058U (en) | 2019-08-06 | 2019-08-06 | High and low temperature tracking error testing device for optical device |
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| CN209964058U true CN209964058U (en) | 2020-01-17 |
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| CN201921260110.6U Active CN209964058U (en) | 2019-08-06 | 2019-08-06 | High and low temperature tracking error testing device for optical device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115333619A (en) * | 2022-10-14 | 2022-11-11 | 武汉普赛斯电子技术有限公司 | Temperature testing device of optical module |
| CN115326358A (en) * | 2022-10-12 | 2022-11-11 | 武汉普赛斯电子技术有限公司 | High and low temperature tracking error testing device and method for optical device and computer storage medium |
-
2019
- 2019-08-06 CN CN201921260110.6U patent/CN209964058U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115326358A (en) * | 2022-10-12 | 2022-11-11 | 武汉普赛斯电子技术有限公司 | High and low temperature tracking error testing device and method for optical device and computer storage medium |
| CN115333619A (en) * | 2022-10-14 | 2022-11-11 | 武汉普赛斯电子技术有限公司 | Temperature testing device of optical module |
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Address after: 214028 plot 93-c, science and Technology Industrial Park, Xinwu District, Wuxi City, Jiangsu Province Patentee after: Wuxi dekeli Optoelectronic Technology Co.,Ltd. Address before: 214028 plot 93-c, science and Technology Industrial Park, Xinwu District, Wuxi City, Jiangsu Province Patentee before: WUXI TACLINK OPTOELECTRONICS TECHNOLOGY Co.,Ltd. |