CN113253102B

CN113253102B - Large capacity aging testing case

Info

Publication number: CN113253102B
Application number: CN202110688453.8A
Authority: CN
Inventors: 曹佶; 赵宝忠; 林向前
Original assignee: Zhejiang Hangke Instrument Co ltd
Current assignee: Zhejiang Hangke Instrument Co ltd
Priority date: 2021-06-22
Filing date: 2021-06-22
Publication date: 2021-09-28
Anticipated expiration: 2041-06-22
Also published as: CN113253102A

Abstract

The invention discloses a high-capacity aging test box which comprises a box body, a power supply assembly, a control unit, a plurality of driving plate assemblies and aging plate assemblies arranged opposite to the driving plate assemblies, wherein the power supply assembly, the control unit, the driving plate assemblies and the aging plate assemblies are all arranged in the box body; the aging board assembly comprises an aging board frame, a driving board and a plurality of first fans, wherein the first fans are respectively arranged on two sides of the aging board to form a first air duct; the drive plate assembly comprises a drive frame, a plurality of conductive heat pipes, a plurality of second fans and a plurality of drive plates electrically connected with the aging plate one by one, the plurality of drive plates are arranged on the drive frame in parallel, and the plurality of second fans are arranged on two sides of the drive plates respectively and form second air channels with the drive frame. It can test a large number of chips at one time and has a small volume.

Description

Large capacity aging testing case

Technical Field

The invention relates to the technical field of semiconductor testing, in particular to a high-capacity aging testing box.

Background

As integrated circuits are developed, the demand of chips is increasing, and automatic burn-in testing is usually required to meet the demand of high quality and high yield of chips.

And to the automatic aging testing device of chip in the market, because radiating reason, what general test box can hold is by the chip not many (the more of the chip of test, the heat dissipation requirement is higher), and can't satisfy the demand of high yield (large capacity).

Even if a few test devices can meet the high throughput requirements, the test devices are bulky.

Disclosure of Invention

In order to overcome the defects of the prior art, the invention aims to provide a large-capacity aging test box which can test a large number of chips at one time and has small volume.

The purpose of the invention is realized by adopting the following technical scheme:

a large-capacity aging test box is characterized by comprising a box body, a power supply assembly, a control unit, a plurality of driving plate assemblies and an aging plate assembly arranged opposite to the driving plate assemblies, wherein the power supply assembly, the control unit, the driving plate assemblies and the aging plate assembly are all arranged in the box body, the control unit, the driving plate assemblies and the aging plate assembly are respectively and electrically connected with the power supply assembly, and the driving plate assemblies and the aging plate assembly are respectively and electrically connected with the control unit through signals;

the aging board assembly comprises an aging board frame, a plurality of aging boards and a plurality of first fans, the aging boards are arranged on the aging board frame in parallel, and the first fans are respectively arranged on two sides of the aging boards to form a first air channel with the aging board frame; the drive plate assembly comprises a drive frame, a plurality of conductive heat pipes, a plurality of second fans and a plurality of drive plates electrically connected with the aging plate one by one, the plurality of drive plates are arranged on the drive frame in parallel, the plurality of second fans are arranged on two sides of the drive plates respectively and form second air channels with the drive frame, the plurality of conductive heat pipes are arranged on the drive plates in parallel, the conductive heat pipes are arranged in the second air channels, and the first fans and the drive plates are electrically connected with the power supply assembly through the conductive heat pipes.

Preferably, the upper end of box is provided with third fan, fourth fan and fifth fan, the third fan with the fourth fan forms the third wind channel, the third wind channel with first wind channel communicates with each other, drive plate subassembly still includes the link, and is adjacent the drive grillage passes through the link is connected, the upper end of link is provided with the air intake, the setting of fifth fan is in the top of air intake.

Preferably, the box includes interconnect's the first cabinet body, the second cabinet body and the third cabinet body, the first cabinet body with the second cabinet body all is located the upper end of the third cabinet body, drive plate subassembly sets up the second cabinet is internal, ageing panel subassembly sets up first cabinet is internal, power supply module sets up the third cabinet is internal.

Preferably, the control unit comprises a host, a display screen and a keyboard, the display screen is arranged on the first cabinet body, the host and the keyboard are arranged in the third cabinet body, and the driving board assembly, the display screen and the keyboard are in signal connection with the host.

Preferably, the third fan and the fourth fan are both arranged above the aging plate assembly, the third fan is an air inlet fan, and the fourth fan is an exhaust fan.

Preferably, the power supply assembly includes a weak power supply, a strong power supply, a filter and an ac contactor, the control unit is electrically connected to the weak power supply, the strong power supply is electrically connected to the filter, and the third fan and the fourth fan are both electrically connected to the strong power supply through the ac contactor.

Preferably, the conductive heat conduction pipe is a hollow copper pipe, and the diameter of the hollow copper pipe is 5mm-15 mm. Preferably, air outlet windows are arranged on two sides of the box body, and the first air channel and the second air channel are communicated with the air outlet windows.

Preferably, the drive plate assembly further comprises a radiator and a water-cooled tube, the radiator is arranged on the drive plate, the water-cooled tube is arranged at the lower end of the drive plate and is fixedly connected with the drive frame, and the water-cooled tube and the radiator are arranged in the first air duct.

Preferably, the box still includes coupling assembling, the drive plate with ageing board homogeneous one passes through coupling assembling signal connection, coupling assembling includes connecting piece and connecting plate, the connecting plate passes the connecting piece, the drive plate passes through the connecting piece with ageing board signal connection, still be provided with on the connecting piece with the parallel window of connecting plate.

Compared with the prior art, the invention has the beneficial effects that:

the high-capacity aging test box comprises a first air duct formed by a plurality of first fans and a second air duct formed by a plurality of second fans, wherein the first air duct and the second air duct can well radiate heat for the driving board assembly and the aging board assembly, the heat conducting and conducting tubes can distribute most of the ground current, the driving board is not easily damaged due to the fact that the driving board bears overlarge current, the heat conducting and conducting tubes can also play a role in radiating, the heat radiating capacity of the aging test box can be greatly improved, and therefore chips can be tested at one time in a large quantity.

Because this large capacity aging testing case, one set of power supply module and the control unit of its a plurality of drive plate subassemblies and a plurality of ageing board subassembly sharing, and all be located same box, and reduced the volume.

Drawings

FIG. 1 is a schematic perspective view of a high capacity burn-in test chamber according to the present invention;

FIG. 2 is a schematic plan view of the high capacity burn-in test chamber of the present invention;

FIG. 3 is a cross-sectional view taken at A-A of FIG. 2;

FIG. 4 is a schematic perspective view of a drive plate assembly and a burn-in plate assembly of the present invention;

FIG. 5 is a schematic perspective view of another perspective of the drive plate assembly and burn-in plate assembly of the present invention;

FIG. 6 is a schematic plan view of the drive plate assembly and burn-in plate assembly of the present invention;

FIG. 7 is a schematic perspective view of a connection assembly of the present invention;

fig. 8 is a perspective view of another view of the connecting assembly of the present invention.

In the figure: 100. a large-capacity aging test box; 10. a box body; 11. a first cabinet; 111. a first cabinet door; 12. a second cabinet; 13. a third cabinet body; 131. a third cabinet door; 14. an air outlet window; 15. an alarm lamp; 16. a top plate; 17. a universal wheel; 20. an aging plate assembly; 21. aging the plate frame; 211. a first fan; 212. a first back plate; 22. aging the board; 23. a third fan; 24. a fourth fan; 30. a drive plate assembly; 31. a driving frame; 311. a second fan; 312. a second back plate; 32. a drive plate; 321. a heat sink; 322. a conductive heat pipe; 33. a fifth fan; 34. a connecting frame; 351. an air inlet; 40. a power supply component; 41. a filter; 42. an AC contactor; 50. a control unit; 51. a display screen; 52. a host; 53. a keyboard; 54. a switch; 60. a connecting assembly; 61. a connecting member; 62. a notch; 63. inserting plates; 631. and (4) inserting the socket.

Detailed Description

So that the manner in which the features and advantages of the invention are attained and can be understood in detail, a more particular description of the invention, briefly summarized above, may be had by reference to the embodiments thereof which are illustrated in the appended drawings.

In the description of the present invention, it should be noted that the terms "upper", "lower", "left", "right", "lateral", "longitudinal", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings or orientations or positional relationships that the products of the present invention are conventionally placed in use, and are used for convenience of description and simplicity of description only, and do not indicate or imply that the devices or elements indicated must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.

As shown in fig. 1-6, the present invention discloses a high capacity aging test box 100, which includes a box body 10, a power supply module 40, a control unit 50, a plurality of driving board modules 30, and an aging board module 20 disposed opposite to the driving board modules 30, wherein the power supply module 40, the control unit 50, the driving board modules 30, and the aging board module 20 are disposed in the box body 10, the control unit 50, the driving board modules 30, and the aging board module 20 are electrically connected to the power supply module 40, respectively, and the driving board modules 30 and the aging board module 20 are signal-connected to the control unit 50, respectively;

the aging plate assembly 20 includes an aging plate frame 21, a plurality of aging plates 22, and a plurality of first fans 211, the aging plates 22 are arranged in parallel on the aging plate frame 21, and the first fans 211 are respectively arranged on both sides of the aging plates 22 to form a first air duct (not shown) with the aging plate frame 21; the driving board assembly 30 includes a driving frame 32, a plurality of conductive heat pipes 322, a plurality of second fans 321, and a plurality of driving boards 32 electrically connected to the burn-in board 22 one by one, the plurality of driving boards 32 are disposed on the driving frame 31 in parallel, the plurality of second fans 311 are disposed on two sides of the driving board 32 respectively to form a second air duct (not shown) with the driving frame 31, the plurality of conductive heat pipes 322 are mounted on the driving board 32 in parallel, the conductive heat pipes 322 are disposed in the second air duct, and both the first fan 211 and the driving board 32 are electrically connected to the power supply assembly 40 through the conductive heat pipes 322.

In the above embodiment, the high-capacity weathering test chamber 100 includes the first air duct formed by the plurality of first fans 211, the second air duct formed by the plurality of second fans 311, the first air duct being capable of laterally dissipating heat from the weathering plate assembly 20, and the second air duct being capable of laterally dissipating heat from the driving plate assembly 30. The plurality of first fans 211, the plurality of second fans 311, and the plurality of driving boards 32 require a large current, the heat and electricity conductive pipes 322 can share most of the ground current, the driving boards 32 are not easily damaged due to the excessive current, and the plurality of heat and electricity conductive pipes 322 can also play a role in heat dissipation, so that the heat dissipation capability of the aging test box 100 can be greatly improved, the aging boards 20 are electrically connected with the driving boards 32 one by one, and each aging board 22 can simultaneously receive the test signals sent by the driving boards 32, thereby being capable of testing a large number of chips at one time.

The power supply assembly 40 is configured to supply power to the driving board assembly 30, the burn-in board assembly 20, and the control unit 50, the control unit 50 can send a primary test signal to the driving board assembly 30, the driving board assembly 30 converts the primary test signal into a test signal to the burn-in board 20, and then tests a chip under test on the burn-in board 20, and the burn-in board 20 can also transmit a tested feedback signal back to the control unit 50 through the driving board 32 for storage and analysis. Preferably, the conductive heat conduction pipe is a hollow copper pipe, the diameter of the hollow copper pipe is 5mm-15mm, the hollow copper pipe is beneficial to heat conduction, and the resistance is small.

In addition, because a plurality of drive plate assemblies 30 and a plurality of aging plate assemblies 20 share a set of power supply assembly 40 and control unit 50, and these components are all located in the same housing 10, the volume is reduced.

As shown in fig. 1 to 3, the box 10 includes a first cabinet 11, a second cabinet 12, and a third cabinet 13 connected to each other, the first cabinet 11 and the second cabinet 12 are both located at an upper end of the third cabinet 13, the aging board assembly 20 is disposed in the first cabinet 11, the driving board assembly 20 is disposed in the second cabinet 12, and the power supply assembly 40 is disposed in the third cabinet 13. Air outlet windows 14 are arranged on two sides of the box body 10, and the first air channel and the second air channel are communicated with the air outlet windows 14. When testing the chip to be tested, in the box 10, the burn-in board assembly may be burned out by introducing high temperature gas or heating the burn-in board assembly with a heater (temperature range 0-150 degrees) to burn out the power module 40 and the control unit 50 having slightly lower heat resistance, and the burn-in board assembly may be disposed in the first cabinet 11, and the power module 40 and most of the control unit 50 may be disposed in the third cabinet 13, thereby reducing the risk of burning out. And the first cabinet body 11 is arranged at the upper end of the third cabinet body 13, and the hot air in the first cabinet body 11 is diffused upwards, so that the power supply assembly 40 and most of the control unit 50 are further prevented from being burnt out by the hot air. The first air duct and the second air duct can ventilate with the outside through the air outlet window, so that the temperature of the first cabinet body 11 and the second cabinet body 12 is reduced. In order to prevent the hot air channeling of the first cabinet body 11 from entering the second cabinet body 12, the air outlet window 14 can also be divided into a first air outlet window and a second air outlet window, the first air channel is communicated with the first air outlet window, and the second air channel is communicated with the second air outlet window.

As shown in fig. 1 to 3, in a preferred embodiment, the control unit 50 includes a display screen 51, a host 52, a keyboard 53, a switch 54 and an upper computer (not shown), the display screen 51 is disposed on the first cabinet 11, the host 52 and the keyboard 53 are disposed in the third cabinet 13, and the driving board assembly 30, the display screen 51 and the keyboard 53 are all in signal connection with the host 52. The host 52 is in signal connection with the upper computer through the switch 54. Power supply module 40 includes weak power, strong power, wave filter 41 and ac contactor 42, the control unit 50 with weak power electric connection, strong power the wave filter 41 with ac contactor 42 electric connection in proper order, the third fan with the fourth fan all passes through ac contactor 42 with strong power electric connection.

In the above embodiment, the host computer 52 can control the drive board assembly 30 and burn-in board assembly 20 and can store data and analyze test information. The display screen 51 can display test data, the keyboard 53 is convenient for operating the host computer 52, and the keyboard 53 is arranged in a small drawer of the box body 10, and the small drawer is arranged between the first cabinet body 11 and the third cabinet body 13. When the host computer 52 is set up, the host computer 52 becomes a lower computer, the upper computer can send a test command to the host computer 52, the host computer 52 converts the test command into a primary test signal to be sent to the drive board 32, and the plurality of host computers 52 can be remotely controlled, so that the plurality of high-capacity aging test boxes 100 can be controlled. The weak power supply realizes the output of 0V-50V voltage, the strong power supply realizes the output of voltage more than 50V, the filter 41 realizes the effect of filtering, the ac contactor 42 can realize the functions of switch and protection circuit, the strong power supply can be charged by the commercial power or the commercial power is converted into the required current, the weak power supply can convert the voltage output by the commercial power or the strong power into the required voltage, and the high-capacity aging test box 100 is supplied with power.

As shown in fig. 3 to 5, in a preferred embodiment, a third fan 23, a fourth fan 24 and a fifth fan 33 are disposed at an upper end of the casing 10, the third fan 23 and the fourth fan 24 form a third air duct (not shown), and the third air duct is communicated with the first air duct to allow hot air to be discharged in all directions. The driving plate assembly 30 further includes a connecting frame 34, the adjacent driving frames 31 are connected by the connecting frame 34, an air inlet 351 is formed at the upper end of the connecting frame 34, and the fifth fan 33 is disposed above the air inlet 351. The third fan 23 and the fourth fan 24 are both arranged above the aging board assembly 20, the third fan 23 is an air inlet fan, and the fourth fan 24 is an exhaust fan. The drive plate assembly 30 further includes a heat sink 321 and a water cooling pipe (not shown), the heat sink 321 is disposed on the drive plate 32, the water cooling pipe is disposed at the lower end of the drive plate 32 and is fixedly connected to the drive frame 31, and the water cooling pipe and the heat sink 321 are disposed in the second air duct.

In this embodiment, in the driving plate assembly 30, the fifth fan 33 can draw the hot air in the second cabinet 12 to dissipate the heat of the driving plate assembly 30. The third fan 23, the fourth fan 24 and the fifth fan 33 are all disposed on the top plate 16 of the box 10, the third fan 23 can draw outside cold air or high-temperature nitrogen into the second cabinet 12, and the fourth fan 24 can draw out hot air in the first cabinet 11. The second air duct passes through the connecting frame 34, and the fifth fan 33 is communicated with the second air duct. The third air duct can longitudinally radiate heat to the aging plate assembly 20, so that the heat can be radiated to the aging plate assembly 20 in all aspects; the fourth fan 24 and the fifth fan 33 may be communicated together to facilitate the discharge of the hot air. Because the heat resistance of the driving plate 32 (with many electronic components thereon) in the driving plate assembly is poor relative to the aging plate 22, a heat sink and a water cooling pipe are arranged on the driving plate 32, the water cooling pipe can be a copper pipe or a glass pipe, the water cooling pipe is arranged at the lower end of the driving plate 32, so that heat can be dissipated, and the driving plate 32 can be supported by the water cooling pipe, and the heat sink comprises a plurality of cooling fins arranged at intervals. The aging plate 22 may be heated by heating wires or hot air. In addition, as shown in fig. 1, the lower end of the box body 10 is further provided with a universal wheel 17, the first cabinet body 11 is further provided with a first cabinet door 111, the third cabinet body 13 is further provided with a third cabinet door 131, the box body 10 is further provided with an alarm lamp 15, and the alarm lamp 15 is in signal connection with the host 52.

As shown in fig. 5 to 7, the case 10 further includes a connecting assembly 60, the driving board 32 and the aging board 22 are in signal connection through the connecting assembly 60, the connecting assembly 60 includes a connecting member 61 and a connecting board (an integrated circuit board), the connecting board passes through the connecting member 61, the driving board 32 is in signal connection with the aging board 22 through the connecting board, and a window 62 parallel to the connecting board is further disposed on the connecting member.

In this connection assembly, the window 62 facilitates heat dissipation from the connection plate, which facilitates information transfer between the driver board 32 and the burn-in board 22. In order to facilitate the installation and the stability between the driving board 32 and the aging board 22, the driving board 32 and the aging board 22 should be kept flush, one end of the connecting assembly 60 is perpendicular to the first back board 212 on the aging board assembly, and the other end of the connecting assembly 60 is perpendicular to the second back board 312 on the driving board assembly. Both ends of connecting piece 61 still are provided with picture peg 63, be provided with socket 631 on the picture peg 63, the socket 631 at connecting piece 61 both ends corresponds each other, the connecting plate passes the socket 631 at connecting piece 61 both ends.

In summary, the high-capacity burn-in test box 100 can radiate heat to the driving board assembly 30 and the burn-in board assembly 20 through the first air duct, the second air duct and the third air duct in all directions, and the heat conductive pipe 322 can also radiate heat, so that the heat radiation capability can be greatly improved, and thus, chips can be tested in batch at one time. And the plurality of aging plate assemblies 20 and the plurality of driving plate assemblies 30 are located in the same case 10, thereby reducing the volume.

The foregoing illustrates and describes the principles, general features, and advantages of the present invention. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are given by way of illustration of the principles of the present invention, and that various changes and modifications may be made without departing from the spirit and scope of the invention as defined by the appended claims. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims

1. A large-capacity aging test box is characterized by comprising a box body, a power supply assembly, a control unit, a plurality of driving plate assemblies and an aging plate assembly arranged opposite to the driving plate assemblies, wherein the power supply assembly, the control unit, the driving plate assemblies and the aging plate assembly are all arranged in the box body, the control unit, the driving plate assemblies and the aging plate assembly are respectively and electrically connected with the power supply assembly, and the driving plate assemblies and the aging plate assembly are respectively and electrically connected with the control unit through signals;

2. The high-capacity aging test box according to claim 1, wherein a third fan, a fourth fan and a fifth fan are arranged at the upper end of the box body, the third fan and the fourth fan form a third air duct, the third air duct is communicated with the first air duct, the driving plate assembly further comprises a connecting frame, the adjacent driving plate frames are connected through the connecting frame, an air inlet is arranged at the upper end of the connecting frame, and the fifth fan is arranged above the air inlet.

3. The high-capacity aging testing box according to claim 2, wherein the box body comprises a first cabinet body, a second cabinet body and a third cabinet body which are connected with each other, the first cabinet body and the second cabinet body are both positioned at the upper end of the third cabinet body, the driving board assembly is arranged in the second cabinet body, the aging board assembly is arranged in the first cabinet body, and the power supply assembly is arranged in the third cabinet body.

4. The high-capacity aging test box according to claim 3, wherein the control unit comprises a host, a display screen and a keyboard, the display screen is arranged on the first cabinet, the host and the keyboard are arranged in the third cabinet, and the driving board assembly, the display screen and the keyboard are in signal connection with the host.

5. The high-capacity aging test box according to claim 4, wherein the third fan and the fourth fan are both disposed above the aging board assembly, the third fan is an air inlet fan, and the fourth fan is an exhaust fan.

6. The burn-in test kit of claim 5, wherein the power supply assembly comprises a weak power supply, a strong power supply, a filter and an ac contactor, the control unit is electrically connected to the weak power supply, the strong power supply is electrically connected to the filter, and the third fan and the fourth fan are electrically connected to the strong power supply through the ac contactor.

7. The high-capacity aging test box according to claim 1, wherein the conductive heat pipe is a hollow copper pipe, and the diameter of the hollow copper pipe is 5mm-15 mm.

8. The high-capacity aging test box according to claim 1, wherein air outlet windows are provided on both sides of the box body, and the first air duct and the second air duct are both communicated with the air outlet windows.

9. The high capacity weathering test chamber of claim 1, wherein the drive plate assembly further includes a heat sink disposed on the drive plate and a water-cooled tube disposed at a lower end of the drive plate and fixedly connected to the drive frame, the water-cooled tube and the heat sink being disposed in the first air duct.

10. The high capacity weathering test box of claim 1, wherein the box further includes a connection assembly, the driving board is in signal connection with the weathering board through the connection assembly, the connection assembly includes a connection member and a connection plate, the connection plate passes through the connection member, the driving board is in signal connection with the weathering board through the connection member, and the connection member is further provided with a window parallel to the connection plate.