CN209406886U - A kind of IC chip test, printing, sorting unit - Google Patents
A kind of IC chip test, printing, sorting unit Download PDFInfo
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- CN209406886U CN209406886U CN201821966255.3U CN201821966255U CN209406886U CN 209406886 U CN209406886 U CN 209406886U CN 201821966255 U CN201821966255 U CN 201821966255U CN 209406886 U CN209406886 U CN 209406886U
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- 238000012360 testing method Methods 0.000 title claims abstract description 64
- 238000007639 printing Methods 0.000 title claims abstract description 18
- 238000001514 detection method Methods 0.000 claims abstract description 44
- 238000012937 correction Methods 0.000 claims abstract description 12
- 230000007246 mechanism Effects 0.000 claims description 25
- 238000010521 absorption reaction Methods 0.000 claims description 4
- 230000007306 turnover Effects 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 230000002950 deficient Effects 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 4
- 238000004806 packaging method and process Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000009434 installation Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000011056 performance test Methods 0.000 description 3
- 238000013459 approach Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000007648 laser printing Methods 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 230000026683 transduction Effects 0.000 description 1
- 238000010361 transduction Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Abstract
The utility model discloses a kind of IC chip test, printing, sorting units, including sorting test platform and turret system, the turret system is set to the central part of sorting test platform, including turntable and fixed station, around fixed station, circumferentially direction is successively arranged automatical feeding system, angle detecting system, correction for direction system, test macro, print system, Mark detection system, positioning system, 3D detection system, braid system, discharge system and flash system on the sorting test platform.The present apparatus can complete full-automatic carrying, power test, printing, braid and the sorting of IC chip, and the apparatus structure is simple, and manufacturing cost is low, and testing efficiency is high.
Description
Technical field
The utility model relates to IC chip test technical fields, and in particular to a kind of IC chip test,
Printing, sorting unit.
Background technique
Testing, sorting technology is always the hot technology in the field IC, it is that IC test encapsulation field is indispensable together
Process.And the testing, sorting technology of new packaging form integrated circuit even more wherein walks the key technology in Environment Science.Entirely certainly
The tower test macro of turn is mainly used for the testing, sorting of the new packaging forms circuit such as QFN, CSP, SOIC, screening installation tool
There are automatic charging, transmission, the accurately functions such as rotation and positioning, the image detection of appearance, braid and automatic blanking.It is existing it is complete from
The tower test system structure of turn is complicated, and testing efficiency is low.
Present applicant proposes a kind of IC chip test sorting unit (number of patent application
201811186829.X), full-automatic carrying, power test, braid and the sorting of IC chip, the device knot can be completed
Structure is simple, and manufacturing cost is low, and testing efficiency is high.But the device is not provided with print system, in practical applications, has client to need
Number is printed on circuit chip or alphabetic flag, the device cannot achieve this function.
Utility model content
The utility model provides a kind of IC chip test, printing, sorting unit, can complete IC chip
Full-automatic carrying test, printing and sorting.
For this purpose, the technical solution adopted in the utility model is:
A kind of IC chip test, printing, sorting unit, including sorting test platform and turret system, described turn
Tower System is set to the central part of sorting test platform, including turntable and fixed station, surrounds fixed station on the sorting test platform
Circumferentially direction be successively arranged automatical feeding system, angle detecting system, correction for direction system, test macro, print system,
Mark detection system, positioning system, 3D detection system, braid system, discharge system and flash system, in circle on the fixed station
Circumferential direction is evenly distributed with several independent press mechanisms, the independent press mechanism respectively with automatical feeding system, angle detecting
System, correction for direction system, test macro, print system, Mark detection system, positioning system, 3D detection system, braid system
System, discharge system and flash system correspond；The turntable is set to the top of fixed station, is turned by the driving of directly-drive servo main motor
Dynamic, turntable is equipped with and the independent one-to-one vacuum WAND of press mechanism；Directly-drive servo main motor drives every turn of turntable
A dynamic lattice, turntable drive independent press mechanism to turn to the top of another system above a system, independently descend press
Structure drives vacuum WAND to push absorption chip.
For IC chip after automatical feeding system vibration discharging, the vacuum WAND above automatical feeding system will
Chip takes out, and directly-drive servo main motor rotates a lattice, and vacuum WAND absorption chip is moved to above angle detecting system, under independence
Chip is pressed to detection camera picture taking interval by press mechanism, completes chip angle detecting.After the completion of detection, directly-drive servo main motor
A lattice are rotated, chip approach axis corrects system and chip is rotated to specified angle；After the completion of correction for direction, the main electricity of directly-drive servo
Machine rotates a lattice, and chip enters test macro and completes chip electric performance test；After the completion of test, directly-drive servo main motor rotation one
Lattice, chip enter print system and complete chip surface character print；After the completion of printing, directly-drive servo main motor rotates a lattice, core
Piece enters Mark detection system and completes chip surface Mark detection；After the completion of Mark detection, directly-drive servo main motor rotates a lattice,
Chip is moved to above positioning system, and positioning system is by chip positioning in the center of vacuum WAND；It is straight to drive after the completion of positioning
Servo main motor rotates a lattice, and chip enters the pin Defect Detection that 3D detection system completes device；It is straight to drive after the completion of 3D detection
Servo main motor rotates a lattice, when testing integrated circuit is non-defective unit, completes integrated circuit packaging into braid system, works as test
When integrated circuit is defective products, directly-drive servo main motor rotates a lattice, and bad chip enters discharge system, completes ic core
The collection in bulk of piece.
Further, the print system includes guided mode rack, overturning guided mode, cam link mechanism, servo motor and swashs
Optical printer, the overturning guided mode may be reversed by cam link mechanism set on one end of guided mode rack, and servo motor is set to and leads
The other end of mould rack, servo motor drive cam link mechanism movement, and connecting rod drives overturning guided mode overturning；Laser printer is set
In the side of guided mode rack, laser head is corresponding with overturning guided mode.
Further, the overturning guided mode is equipped with vacuum warehouse, and the vacuum warehouse is connected with vacuum system, for adsorbing
The chip being located on overturning guided mode.
The utility model has the beneficial effects that the present apparatus can complete the full-automatic carrying of IC chip, power test,
Printing, braid and sorting, the apparatus structure is simple, and manufacturing cost is low, and testing efficiency is high.
Detailed description of the invention
Fig. 1 be the IC chip test of the utility model, printing, sorting unit embodiment 1 structural schematic diagram.
Fig. 2 is the IC chip test of the embodiments of the present invention 1, printing, sorting unit embodiment 1
The structural schematic diagram of turret system.
Fig. 3 is the IC chip test of the embodiments of the present invention 1, printing, sorting unit embodiment 1
Print system structural schematic diagram.
Specific embodiment
It is preferred below in conjunction with attached drawing and one kind to keep the purpose of this utility model, technical solution and advantage clearer
Embodiment the technical solution of the utility model is clearly and completely described.
Embodiment 1
Refering to fig. 1 to Fig. 3, IC chip test, printing, sorting unit include testing, sorting platform, in platform
The heart is equipped with turret system 12, and around turret system 12, circumferentially direction is successively arranged automatical feeding system 1, direction to the outer rim of platform
Detection system 2, correction for direction system 3, first and second test macro 4, print system 5, Mark detection system 6, positioning system
7,3D detection system 8, braid system 9, discharge system 10 and flash system 11.
For testing, sorting platform by the aerial setting of the supporting leg for being located at four angles of mesa base, Platform center portion offers capstan head
System installation through-hole.
Turret system 12 is mounted in the installation through-hole, including fixed station and turntable, and turntable is by directly-drive servo main motor
360 degree of rotations are done in 10.1 drivings in the horizontal plane.Directly-drive servo main motor 10.1 is fixedly mounted on testing, sorting by pedestal and puts down
The central part of platform, output end extends straight up to be connect with turntable, and turntable is equipped with several vacuum WANDs 10.2.In this implementation
In example, it is equipped with 11 vacuum WANDs altogether, vacuum WAND is circumferentially uniformly distributed along turntable, and distribution is examined with automatical feeding system 1, direction
Examining system 2, correction for direction system 3, first and second test macro 4, print system 5, Mark detection system 6, positioning system 7,
3D detection system 8, braid system 9, discharge system 10 and flash system 11 correspond.Directly-drive servo main motor 10.1 is with turn
Platform rotates in the horizontal plane, and one lattice of every rotation, vacuum WAND reaches another system from a system.Fixed station by bracket with
Directly-drive servo main motor 10.1 is fixedly connected, and fixed station is equipped with several independent press mechanisms 10.3.In the present embodiment, it sets altogether
Have 10 independent press mechanisms, respectively with automatical feeding system 1, angle detecting system 2, correction for direction system 3, first and second
Test macro 4, print system 5, Mark detection system 6, positioning system 7,3D detection system 8, braid system 9 correspond.Very
Hole capital after selling all securities 10.5 is set between turntable and fixed station, and vacuum warehouse is connected to vacuum WAND, provides vacuum force for vacuum WAND.Under
Pressure servo motor 10.4 drives independent press mechanism to act, and independent press mechanism drives vacuum WAND 10.2 to push.Vacuum WAND
10.2 and independent press mechanism be equipped with reset spring.Independent press mechanism 10.3 is equipped with reset detection sensor, for examining
It surveys and pushes the reset of servo motor 10.4.
Automatical feeding system 1 is the prior art, including piezoelectric ceramics ontology, vibrating disk and the track that directly shakes, and directly shake track
Outlet is equipped with first position detection sensor, for whether in place to detect IC chip.
Angle detecting system 2 is the prior art, including positioning guided mode and detection camera, and detection camera is used to give positioning guided mode
Upper chip is taken pictures.
Correction for direction system 3 is the prior art, including rotation guided mode, rotation guided mode are rotatably set to guided mode branch by shaft
In frame, rotation guided mode is rotated at an angle by rotating electric machine driving.
Test macro 4 is the prior art, is set altogether in order to improve testing efficiency there are two test macro, is tested in the present embodiment
System includes test bench and the tester connecting plate being arranged on test bench, passes through the external test instrumentation pair of tester connecting plate
Chip carries out circuit electric performance test.
Print system 5 includes guided mode rack, overturning guided mode 5.1, cam link mechanism, servo motor 5.5 and laser printing
Machine 5.7.Cam link mechanism includes connecting rod 5.3 and cam 5.6.Guided mode rack includes a horizontal base, one end of horizontal base
Equipped with a vertically-mounted seat, the upper end of vertically-mounted seat is equipped with U-shaped groove.Servo motor 5.5 is vertically installed at water by bracket
The other end of flat bed, motor output shaft and cam 5.6 are sequentially connected.Connecting rod 5.3 is L-shaped, by a long side and a short side
It constitutes, connecting rod long side is horizontally disposed, and end is connect by first rotating shaft with driving cam 5.6, and the other end passes through the second shaft
It is installed in rotation in U-shaped groove, reset spring 5.4 is equipped in U-shaped groove, the upper end of reset spring 5.4 is against length of connecting rod
The downside on side, lower end automatically reset against the bottom surface of groove, reset spring 5.4 for connecting rod.The short side of connecting rod 5.3 is overturn
Upwards, end is equipped with overturning guided mode 5.1, and the bottom of overturning guided mode 5.1 is equipped with vacuum warehouse 5.2, vacuum warehouse 5.2 and vacuum suction
System connection, for adsorbing the chip being located on overturning guided mode 5.1.Servo motor 5.5 drives driving cam 5.6 to rotate, and passes
Moving cam 5.6 drives connecting rod 5.3 around the second shaft in vertical rotation in surface by first rotating shaft, to drive overturning guided mode 5.1
Outwardly or inwardly overturn.Horizontal base is mounted on testing, sorting platform, and laser printer 5.7 is mounted on the one of guided mode rack
Side, laser head direction overturning guided mode 5.1.
Mark detection system 6 is the prior art, including overturning guided mode and vision camera, and vision camera is turned over for giving to be located in
Chip on transduction mould is taken pictures.
Positioning system 7 is the prior art, including positioning guided mode and the position-detection sensor being arranged on positioning guided mode.It is fixed
Position guided mode is equipped with locating piece, and locating piece is used for chip positioning, and position-detection sensor is used for the position of detection chip.
3D detection system 8 is the prior art, including 3D detects camera, and 3D detection camera takes pictures for chip and completes 3D inspection
Altimetric image processing.
Braid system 9, discharge system 10 and flash system 11 are the prior art, and braid system 9 is used for good to being detected as
The chip of product carries out braid, and the chip of defective products enters the discharge of discharge system 10, and flash system 11 is used to work as discharge system failure
When collect chip.
The working method of this system is:
Vacuum WAND of the IC chip after the vibration discharging of automatical feeding system 1, above automatical feeding system
Chip is taken out, directly-drive servo main motor rotates a lattice, and vacuum WAND absorption chip is moved to 2 top of angle detecting system, solely
It makes press mechanism driving vacuum WAND and chip is pressed into detection camera picture taking interval, complete chip angle detecting；Detection is completed
Afterwards, directly-drive servo main motor rotates a lattice, and chip is rotated to specified angle by chip approach axis correction system 3；Correction for direction
After the completion, directly-drive servo main motor rotates a lattice, and chip enters test macro 4 and completes chip electric performance test；After the completion of test,
Directly-drive servo main motor 10.1 rotates a lattice, and chip enters print system 5 and completes chip surface character print；After the completion of printing,
Directly-drive servo main motor 10.1 rotates a lattice, and chip enters Mark detection system 6 and completes chip surface Mark detection；Mark detection
After the completion, directly-drive servo main motor rotates a lattice, and chip is moved to 7 top of positioning system, and positioning system is by chip positioning in true
The center of suction pen；After the completion of positioning, directly-drive servo main motor rotates a lattice, and chip enters 3D detection system 8 and completes device
The pin Defect Detection of part；After the completion of 3D detection, directly-drive servo main motor rotates a lattice, when testing integrated circuit is non-defective unit,
Integrated circuit packaging is completed into braid system 9, when testing integrated circuit is defective products, directly-drive servo main motor rotation one
Lattice, bad chip enter discharge system 10, complete the collection in bulk of IC chip.
Not doing the part illustrated in above instructions is the prior art, or has both been able to achieve by the prior art.
Claims (3)
1. a kind of IC chip test, printing, sorting unit, including sorting test platform and turret system, the capstan head
System is set to the central part of sorting test platform, including turntable and fixed station, which is characterized in that encloses on the sorting test platform
Around fixed station, circumferentially direction is successively arranged automatical feeding system, angle detecting system, correction for direction system, test macro, beats
Print system, Mark detection system, positioning system, 3D detection system, braid system, discharge system and flash system, the fixation
Circumferentially direction is evenly distributed with several independent press mechanisms on platform, the independent press mechanism respectively with automatical feeding system,
Angle detecting system, correction for direction system, test macro, print system, Mark detection system, positioning system, 3D detection system,
Braid system, discharge system and flash system correspond；The turntable is set to the top of fixed station, by directly-drive servo main motor
Driving rotation, turntable are equipped with and the independent one-to-one vacuum WAND of press mechanism；The driving of directly-drive servo main motor turns
Platform one lattice of every rotation, turntable drive independent press mechanism to turn to the top of another system above a system, independent
Press mechanism drives vacuum WAND to push absorption chip.
2. IC chip test as described in claim 1, printing, sorting unit, which is characterized in that the print system
Pass through cam including guided mode rack, overturning guided mode, cam link mechanism, servo motor and laser printer, the overturning guided mode
Link mechanism may be reversed set on one end of guided mode rack, and servo motor is set to the other end of guided mode rack, and servo motor driving is convex
Connecting rod mechanism movement is taken turns, connecting rod drives overturning guided mode overturning；Laser printer be set to guided mode rack side, laser head with turn over
Mould of transduceing is corresponding.
3. IC chip test as claimed in claim 2, printing, sorting unit, which is characterized in that the overturning guided mode
It is equipped with vacuum warehouse, the vacuum warehouse is connected with vacuum system, for adsorbing the chip being located on overturning guided mode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821966255.3U CN209406886U (en) | 2018-11-27 | 2018-11-27 | A kind of IC chip test, printing, sorting unit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821966255.3U CN209406886U (en) | 2018-11-27 | 2018-11-27 | A kind of IC chip test, printing, sorting unit |
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| Publication Number | Publication Date |
|---|---|
| CN209406886U true CN209406886U (en) | 2019-09-20 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201821966255.3U Active CN209406886U (en) | 2018-11-27 | 2018-11-27 | A kind of IC chip test, printing, sorting unit |
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| CN (1) | CN209406886U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111359910A (en) * | 2020-03-17 | 2020-07-03 | 苏州日月新半导体有限公司 | Integrated circuit product testing method |
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2018
- 2018-11-27 CN CN201821966255.3U patent/CN209406886U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111359910A (en) * | 2020-03-17 | 2020-07-03 | 苏州日月新半导体有限公司 | Integrated circuit product testing method |
| CN111359910B (en) * | 2020-03-17 | 2022-03-29 | 苏州日月新半导体有限公司 | Integrated circuit product testing method |
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Effective date of registration: 20231027 Address after: E09, No. 35 Yougu Industrial Park, Xibei Town, Xishan District, Wuxi City, Jiangsu Province, 214194 Patentee after: WUXI WEKAY TECHNOLOGY CO.,LTD. Address before: 214153 No. 1 Qian Lotus Road, Huishan District, Jiangsu, Wuxi Patentee before: JIANGSU VOCATIONAL College OF INFORMATION TECHNOLOGY |