CN209310928U - A kind of Wavefront sensor - Google Patents
A kind of Wavefront sensor Download PDFInfo
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- CN209310928U CN209310928U CN201920033899.5U CN201920033899U CN209310928U CN 209310928 U CN209310928 U CN 209310928U CN 201920033899 U CN201920033899 U CN 201920033899U CN 209310928 U CN209310928 U CN 209310928U
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- polarizing film
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Abstract
The utility model discloses a kind of Wavefront sensors, it include: the first polarizing film being sequentially placed, half wave plate, calcite crystal, quarter-wave plate, the second polarizing film and array photodetectors, and the optical surface of above-mentioned device is vertical with direction of beam propagation.The sensor structure is simple, and required optical element is few, in conjunction with the crystal growth and cutting technique of current maturation, the potentiality with mass production.Meanwhile the Wavefront sensor eliminates the limitation of wavefront division sampling element lens array, has reached Pixel-level wave front restoration precision, therefore can be realized the wave front restoration of superelevation spatial frequency.Importantly, breaking the mindset for promoting wave front restoration precision all the time, the super resolution algorithm for pursuing the arrangement of high density sub-aperture and complexity is no longer needed to, is had a very important significance in wavefront sensing art.
Description
Technical field
The utility model relates to optical information measurements and quantum Technology of Precision Measurement field more particularly to a kind of wavefront to pass
Sensor.
Background technique
Wavefront sensing technique is a contemporary optics measuring technique, passes through sampling, the modulation to far field beams intensity distribution
With detection, realizes that the reconstruct of Wave-front phase is restored, be widely used in wavefront correction, astronomical observation, medical imaging, laser technology
Equal fields.Typical Wavefront sensor includes shearing interferometer, curvature wavefront sensor and Hartmann wave front sensor.These are passed
Sensor has different characteristics and performance, suitable for different applications.The wherein Hartmann wave front sensor efficiency of light energy utilization
It is high, anti-noise ability is strong, it is succinct efficiently, can real-time measurement, have become common one of Wavefront sensor.
Typical Hartmann wave front sensor may refer to Chinese patent application prospectus (application number
98112210.8, publication number CN1245904) disclosed in a kind of optical wave-front sensor, it is by lens array by incident wavefront
Before being divided into multiple wavelets for regarding oblique incidence as, and an array photodetection is placed on the focal plane of lens array
Device, array photodetector generally use ccd detector or cmos detector, by detecting the offset of each focus,
The tilt quantity for measuring each sub-aperture wavefront reconstructs wavefront to be measured by restoring to the fitting before each wavelet.
However there are the inherent technological difficulties of following two points for Hartmann's wavefront sensing technique: (1) measurement accuracy and dynamic
Contradiction between state range.High-precision wavefront sensing needs are sufficiently sampled, which needs intensive sub-aperture to divide,
This will lead to sub-aperture area and becomes smaller, so that Wavefront sensor dynamic range becomes smaller.Therefore, it is past to promote wavefront measurement precision
Past is to sacrifice dynamic range as cost.(2) limitation of the spatial resolution of Hartmann wave front sensor.Hartmann sensor
Measurement accuracy relies primarily on sub-aperture density, but sub-aperture number can not infinitely increase, and each sub-aperture needs certain picture after all
Usually it is imaged.Therefore, from conventional detection analysis of strategies, Hartmann wave front sensor is difficult to reach the spatial resolution of Pixel-level.
Promoted Hartmann wave front sensor measurement accuracy have become a research hotspot, at present scheme often through increase device,
Algorithm complexity improves wave front restoration precision as far as possible, but can not break through this and basic limit.
Utility model content
The purpose of the utility model is to provide a kind of Wavefront sensors, get rid of the sub-aperture density limitation of lens array,
Wavefront measurement precision improvement is set to have arrived Pixel-level level.
The purpose of this utility model is achieved through the following technical solutions:
A kind of Wavefront sensor, comprising: the first polarizing film, half wave plate, the calcite crystal, four points being sequentially placed
One of wave plate, the second polarizing film and array photodetectors be sequentially placed, and the optical surface of above-mentioned device and beam propagation side
To vertical.
Sensor structure is simple it can be seen from above-mentioned technical solution provided by the utility model, and required optical element is few,
In conjunction with the crystal growth and cutting technique of current maturation, the potentiality with mass production.Meanwhile the Wavefront sensor eliminates
The limitation of wavefront division sampling element lens array has reached Pixel-level wave front restoration precision, therefore can be realized superelevation space
The wave front restoration of frequency.Importantly, breaking the mindset for promoting wave front restoration precision all the time, no longer need to pursue high
The super resolution algorithm of the arrangement of density sub-aperture and complexity, has a very important significance in wavefront sensing art.
Detailed description of the invention
It, below will be to required in embodiment description in order to illustrate more clearly of the technical solution of the utility model embodiment
The attached drawing used is briefly described, it should be apparent that, the accompanying drawings in the following description is only some implementations of the utility model
Example, for those of ordinary skill in the art, without creative efforts, can also be according to these attached drawings
Obtain other accompanying drawings.
Fig. 1 is a kind of composed structure schematic diagram of Wavefront sensor provided by the embodiment of the utility model；
Fig. 2 is the laser beam wavefront schematic diagram that system needs to measure；
The aberration order schematic diagram that Fig. 3 needs the laser beam wavefront measured to include by system；
Fig. 4 is the wavefront schematic diagram restored using the Wavefront sensor based on the weak measurement of two-dimentional quantum；
Fig. 5 is the wavefront and wavefront residual error schematic diagram to be measured restored using the utility model.
Specific embodiment
Below with reference to the attached drawing in the utility model embodiment, the technical scheme in the embodiment of the utility model is carried out clear
Chu is fully described by, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole realities
Apply example.Based on the embodiments of the present invention, those of ordinary skill in the art are obtained without making creative work
The every other embodiment obtained, belongs to the protection scope of the utility model.
The utility model embodiment provides a kind of Wavefront sensor, as shown in Figure 1, its specifically include that the first polarizing film 1,
Half wave plate 2, calcite crystal 3, quarter-wave plate 4, the second polarizing film 5 and array photodetectors 6, above-mentioned optics
Device is sequentially connected, and optical surface is vertical with direction of beam propagation.
Simultaneously:
First polarizing film optical axis is in the horizontal direction；
The half wave plate optical axis and vertical direction angle are 22.5 °；
The calcite crystal optical axis is located in perpendicular or is located in horizontal plane, and with direction of beam propagation angle
It is 42 °；
The quarter-wave plate optical axis and vertical direction angle are 45 °；
Second polarizing film optical axis is in the horizontal direction；
The array photodetectors are CCD camera, CMOS camera or ICCD camera.
The above are the main composed structures of Wavefront sensor, do detailed introduction below for its working principle, are worth note
Meaning, the introduction of following working principles are only easy to understand above-mentioned Wavefront sensor.
As Fig. 2 indicates that the laser beam wavefront of parked, Fig. 3 indicate aberration possessed by laser beam wavefront shown in Fig. 2
Zernike coefficient.
To measure the laser beam wavefront that Fig. 2 is provided, laser beam wavefront is preselected using the Wavefront sensor
It selects, weak measurement and rear selection, the slope information of testing laser Beam Wave-Front is obtained, in conjunction with Hartmann's wavefront control algorithm reflex
Former laser beam wavefront.Detailed introduction is done below for preselected, weak measurement and rear selection three phases.
1, preselected
Carried out using the first polarizing film and half wave plate preselected: incident laser by optical axis in the horizontal direction the
Horizontal linear polarization light H is modulated to after a piece of polarizing film, the half wave for being 22.5 ° using optical axis and vertical direction angle
Piece, incident laser become linearly polarized lightIncident laser initial state preparation is completed, is indicated are as follows: | Ψ >=|
ψ>path| D >, wherein | ψ >pathIt is expressed as testing laser space complex amplitude, | V > expression polarizes vertically.
2, weak measurement
Weak measurement is carried out using calcite crystal, is divided into following two processes:
First process: it is located at the calcite crystal for being 42 ° with direction of beam propagation angle in horizontal plane, laser light by optical axis
Son interacts with crystal, and photon state develops are as follows:
Wherein,Indicate measurement pointer,Indicating photon momentum, g indicates stiffness of coupling,Indicate Planck
Constant, i indicate that imaginary number unit, t indicate the time of developing, and symbol ≡ expression is equal to,Indicate linear polarization.
Second process: rotation calcite crystal make its optical axis be located at perpendicular it is interior and with direction of beam propagation angle
42 °, laser photon is made to interact with crystal.
In the utility model embodiment, weak measurement can be carried out using the calcite crystal of specific cutting angle, to get rid of
Limitation of the microlens array to wave front restoration resolution ratio reduces dependence and demand to high-precision lenses array.
3, rear selection.
It is selected after being carried out using quarter-wave plate, the second polarizing film and array photodetectors:
First process corresponding to weak measurement: base is projected to right-handed rotation respectivelyAnd left-handed rotation
Project baseIt projects, the optical axis and vertical direction angle for respectively corresponding quarter-wave plate are -45 °
With+45 °, to receive light beam light distribution in array photodetectorsWithThus light intensity and the direction y laser are calculated
Beam Wave-Front slope kyRelationship:Wherein, ζ indicates the stiffness of coupling of calcite crystal；
Second process corresponding to weak measurement: identical principle is used, light beam is received in array photodetectors
Light distributionWithThus light intensity and the direction x laser beam wavefront slope k are calculatedxRelationship:
Entire measuring phases can use following steps to describe:
Step 1: it is brilliant that testing laser Beam Wave-Front successively passes through first polarizing film, half wave plate, calcite
Body (it is 42 ° that optical axis, which is located in horizontal plane with direction of beam propagation angle), (optical axis and vertical direction angle are quarter-wave plate
+ 45 °), second polarizing film in array photodetectors detect light beam light distribution
Step 2: on the basis of step 1, rotating the quarter-wave plate around optical propagation direction makes its optical axis and vertical
Angular separation is -45 °, and array photodetectors detect light beam light distribution
Step 3: on the basis of step 2, rotating the calcite crystal around optical propagation direction is located at its optical axis vertically
It is 42 ° in plane and with direction of beam propagation angle, array photodetectors detect light beam light distribution
Step 4: on the basis of step 3, rotating the quarter-wave plate around optical propagation direction makes its optical axis and vertical
Angular separation is+45 °, and array photodetectors detect light beam light distribution
Step 5: the light beam light distribution detected using array photodetectors measured by step 1-4 calculates wave to be measured
Preceding slope distribution are as follows:
Step 6: being distributed using wavefront slope obtained in step 5, in conjunction with traditional Hartmann's wavefront control algorithm, such as area
Domain method, type method reconstruct wavefront to be measured.
Fig. 4 is the laser beam wavefront restored using above-mentioned Wavefront sensor, and Fig. 5 indicates to restore wavefront and wavefront to be measured is residual
Difference.It can be seen that restore wavefront with it is almost completely the same before output wave, difference is very small, illustrates that the utility model is provided
Above-mentioned Wavefront sensor effectively detect wavefront error, wave front restoration is realized, in addition, the wavefront slope sampled is Pixel-level
, therefore wave front restoration can achieve Pixel-level spatial resolution.
Above-mentioned Wavefront sensor recovery provided by the embodiment of the utility model mainly has following excellent relative to traditional scheme
Point: wavefront sensor device structure provided by the utility model is simple, and required optical element is few, and the crystal in conjunction with current maturation is raw
Long and cutting technique, the potentiality with mass production.Meanwhile step needed for measuring is simple and has continued to use traditional Hartmann
Wavefront control algorithm has the characteristics that the used time is short, high-efficient.In addition, the Wavefront sensor based on the weak measurement of two-dimentional quantum is eliminated
The limitation of wavefront division sampling element lens array, has reached Pixel-level wave front restoration precision, therefore can be realized superaltitude
Between frequency wave front restoration.The utility model breaks the mindset for promoting wave front restoration precision all the time, no longer needs to pursue
The super resolution algorithm of the arrangement of high density sub-aperture and complexity, has a very important significance in wavefront sensing art.
The preferable specific embodiment of the above, only the utility model, but the protection scope of the utility model is not
It is confined to this, anyone skilled in the art can readily occur in the technical scope that the utility model discloses
Change or replacement, should be covered within the scope of the utility model.Therefore, the protection scope of the utility model should
Subject to the scope of protection of the claims.
Claims (2)
1. a kind of Wavefront sensor characterized by comprising the first polarizing film, the half wave plate, calcite being sequentially placed
Crystal, quarter-wave plate, the second polarizing film and array photodetectors are sequentially placed, and the optical surface and light of above-mentioned device
The beam direction of propagation is vertical.
2. a kind of Wavefront sensor according to claim 1, which is characterized in that
The first polarizing film optical axis is in the horizontal direction；
The half wave plate optical axis and vertical direction angle are 22.5 °；
The calcite crystal optical axis is located in perpendicular or is located in horizontal plane, and is with direction of beam propagation angle
42°
The quarter-wave plate optical axis and vertical direction angle are 45 °；
The second polarizing film optical axis is in the horizontal direction；
The array photodetectors are CCD camera, CMOS camera or ICCD camera.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920033899.5U CN209310928U (en) | 2019-01-09 | 2019-01-09 | A kind of Wavefront sensor |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920033899.5U CN209310928U (en) | 2019-01-09 | 2019-01-09 | A kind of Wavefront sensor |
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| Publication Number | Publication Date |
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| CN209310928U true CN209310928U (en) | 2019-08-27 |
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| CN201920033899.5U Active CN209310928U (en) | 2019-01-09 | 2019-01-09 | A kind of Wavefront sensor |
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2019
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