CN100589780C - Reflection type artificial crystal optical aberration hartmann measuring apparatus - Google Patents
Reflection type artificial crystal optical aberration hartmann measuring apparatus Download PDFInfo
- Publication number
- CN100589780C CN100589780C CN200710304513A CN200710304513A CN100589780C CN 100589780 C CN100589780 C CN 100589780C CN 200710304513 A CN200710304513 A CN 200710304513A CN 200710304513 A CN200710304513 A CN 200710304513A CN 100589780 C CN100589780 C CN 100589780C
- Authority
- CN
- China
- Prior art keywords
- artificial crystal
- reflection type
- light
- spherical reflector
- measuring apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000004075 alteration Effects 0.000 title claims abstract description 48
- 230000003287 optical effect Effects 0.000 title claims abstract description 25
- 239000013078 crystal Substances 0.000 title claims abstract description 21
- 230000011218 segmentation Effects 0.000 claims abstract description 19
- 238000001914 filtration Methods 0.000 claims description 16
- 238000003384 imaging method Methods 0.000 claims description 16
- 239000004065 semiconductor Substances 0.000 claims 1
- 238000001514 detection method Methods 0.000 abstract description 14
- 238000012545 processing Methods 0.000 abstract description 5
- 238000003491 array Methods 0.000 abstract 1
- 230000005540 biological transmission Effects 0.000 abstract 1
- 238000002054 transplantation Methods 0.000 abstract 1
- 238000005259 measurement Methods 0.000 description 11
- 238000012937 correction Methods 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000011160 research Methods 0.000 description 3
- 238000005070 sampling Methods 0.000 description 3
- 208000014733 refractive error Diseases 0.000 description 2
- 208000002177 Cataract Diseases 0.000 description 1
- 206010010071 Coma Diseases 0.000 description 1
- 208000029091 Refraction disease Diseases 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 230000004430 ametropia Effects 0.000 description 1
- 201000009310 astigmatism Diseases 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Images
Landscapes
- Eye Examination Apparatus (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
A reflection type artificial crystal aberration Hartmann instrument mainly comprises a light source, a beam matching system, a standard spherical reflector, a aperture segmentation element, a photoelectric detector and a computer, wherein, a Hartmann wave-front sensor is composed of the aperture segmentation element and the photoelectric detector. Lights emitted by the light source are collimatedto be emitted in parallel. The parallel lights pass through an artificial crystal to be measured by a reflector and a spectroscope in sequence. Transmission light waves arrive at the standard spherical reflector which is axially adjusted to lead to the coincidence of the back focus of the artificial crystal to be measured and the spherical center of the standard spherical reflector. Reflected light waves return along an original optical path, pass through the artificial crystal to be measured again, then pass through the spectroscope and the beam matching system in sequence and are segmented and sampled by the aperture segmentation element, and then are focused on the photoelectric detector to form light spot arrays. The acquired light sport data is sent to the computer to be processed, soas to obtain the aberration of the artificial crystal to be measured. The reflection type artificial crystal aberration Hartmann instrument has the advantage of simple and stable structure, which isa convenient, fast and reliable detection tool for the ophthalmology clinical artificial crystal transplantation and processing and the detection of artificial crystals for personalized human eye aberrations correcting.
Description
Technical field
The present invention relates to a kind of reflection type artificial crystal optical aberration hartmann measuring apparatus, the special equipment when it is clinical ophthalmology transplanting artificial intraocular lenses also is the crystalline a kind of high precision apparatus of the productive manpower simultaneously.
Background technology
At present, the artificial intraocular lenses has been widely used in the optical correction behind height ametropia and the cataract operation, but mostly can only correct human eye low order aberration such as out of focus, astigmatism etc.The research surface, not only there is low order aberration in the opthalmic optics system, also there are higher order aberratons such as coma, spherical aberration etc., correcting human eye low order and higher order aberratons simultaneously can obtain better visual quality and improve (" VisualPerformance after correcting the monochromatic and chromatic aberrations of the eye ", Geun-YoungYoon and David R.Williams, J.Opt.Soc.Am.A/Vol.19, No.2/February).Therefore, the artificial intraocular lenses of single rectification human eye low order aberration can not satisfy the demand of people to the human eye correction of refractive errors, and the artificial intraocular lenses that can correct the human eye higher order aberratons becomes new research focus and developing tendency in future.The basis of realizing this goal is human eye correction for higher order aberrations artificial intraocular lenses's making, and artificial intraocular lenses's detection is the basis that makes.
Because human eye correction for higher order aberrations artificial intraocular lenses not only corrects the human eye low order aberration, also to correct the human eye higher order aberratons simultaneously, simple focal power detects the detection requirement that can not satisfy the correction for higher order aberrations artificial intraocular lenses, need comprehensively and objectively measure each rank aberration of artificial intraocular lenses (low order and high-order).At present, human eye correction for higher order aberrations artificial intraocular lenses still is a kind of artificial intraocular lenses of novelty, supporting technology is also among active research, the present invention proposes to adopt Hartmann's Wavefront detecting technology to realize artificial intraocular lenses's aberration measurement, it not only can measure artificial intraocular lenses's low order aberration, can also measure artificial intraocular lenses's higher order aberratons.
Hartmann wave front sensor is a kind of simple in structure, stable Wavefront sensor, and it is cut apart sampling with incident beam and focuses on the photodetector, by PHASE DISTRIBUTION before the date processing acquisition incident light wave.At present, Hartmann wave front sensor mainly contains based on microlens array (" application of Hartmann wave front sensor ", Jiang Wenhan, bright great, Yang Ze equality, quantum electronics newspaper, 15 volumes, 2 phase 228-235 pages or leaves, 1998) and based on microprism array (" Hartmann-Shack Wavefront Sensor Based on aMicro-Grating Array ", Haiying Wang, Haifeng Duan, Changtao Wang, Yudong Zhang, SPIE, Vol.6018,2005) two kinds of forms.Hartmann's Wavefront detecting technology has been widely used in numerous areas such as human eye aberration measurement, beam quality diagnosis, optical element detection.But Hartmann wave front sensor is applied to artificial intraocular lenses's aberration measurement and still belongs to blank, and the present invention proposes at this situation just.
Summary of the invention
Technology provided by the present invention is dealt with problems and is: overcome the deficiencies in the prior art, provide a kind of versatility good, can carry out the reflection type artificial crystal optical aberration hartmann measuring apparatus of aberration measurement to any dioptric artificial intraocular lenses, for the clinical ophthalmology artificial intraocular lenses transplants and artificial intraocular lenses's processing and detection etc. are provided convenience, quick and reliable detection.
Technical solution of the present invention is: reflection type artificial crystal optical aberration hartmann measuring apparatus, mainly comprise: light source, light beam filtering system, Beam matching system, standard spherical reflector, aperture segmentation element, photodetector and computer, wherein aperture segmentation element, photodetector constitute Hartmann wave front sensor; The light that sends by light source outgoing after the filtering of light beam filtering system and collimation are directional light, this directional light passes artificial intraocular lenses to be measured through reflecting mirror and spectroscope successively, transmitted light wave arrives the standard spherical reflector, axial adjustment standard spherical reflector, artificial intraocular lenses's to be measured back focus is overlapped with the centre of sphere of standard spherical reflector, reflecting light returns along original optical path and passes artificial intraocular lenses to be measured once more, successively after spectroscope and Beam matching system, sampled and focus on by the aperture segmentation element divisions and form spot array on the photodetector, photodetector is sent the hot spot data of gathering into computer, and machine is handled the aberration that obtains artificial intraocular lenses to be measured as calculated.
Described standard spherical reflector can be the standard concave spherical reflector, also can be the protruding spherical reflector of standard.
Described aperture segmentation element is a microlens array, or microprism array; When the aperture segmentation element was microlens array, photoelectric detector was positioned on the microlens array focal plane; When being microprism array, also be added with fourier transform lens or imaging len in the microprism array back, fourier transform lens or imaging len are near microprism array, and photoelectric detector is positioned on the focal plane of fourier transform lens or imaging len.
Described light beam filtering system is made of pin hole and collimating mirror, and light beam is parallel light emergence through pin hole filtering by the collimating mirror collimation.
Described photodetector both can be the imaging camera, also can be the position sensor array.
The present invention's advantage compared with prior art is:
(1) the present invention adopts Hartmann wave front sensor to measure the artificial intraocular lenses, detecting light beam passes artificial intraocular lenses to be measured for twice, by move forward and backward reflecting mirror or stationary mirror along optical axis direction, moving forward and backward remainder along optical axis direction can realize artificial intraocular lenses's diopter is compensated easily, out of focus that will be bigger is separated measurement with all the other aberrations, reduce of the requirement of artificial intraocular lenses's aberration measurement to Hartmann's dynamic range, the instrument versatility is good, can carry out aberration measurement to any dioptric artificial intraocular lenses, for the clinical ophthalmology artificial intraocular lenses transplants and artificial intraocular lenses's processing and detection etc. are provided convenience, quick and reliable detection.
(2) of the present inventionly move forward and backward reflecting mirror or remainder compensates artificial intraocular lenses's diopter along optical axis direction, compensation dosage equals artificial intraocular lenses's focal power size, therefore can obtain the dioptric size of crystal when obtaining the comprehensive aberration of artificial intraocular lenses, versatility is good.
(3) the present invention is by measuring the position skew of Hartmann sensor hot spot, by restoring algorithm reconstruct wave front aberration, with respect to interferometer aberration detection method, the present invention is low to environmental requirement, realize that easily small-bore (about intraocular lens optic district 5mm) complicated higher order aberratons detects, and has simple in structure and stable advantage.
Description of drawings
Fig. 1 is the artificial intraocular lenses's aberration measurement schematic diagram that the present invention is based on the lenticule Hartmann;
Fig. 2 among the present invention based on the Hartmann wave front sensor structure and the operation principle sketch map of microlens array;
Fig. 3 is the artificial intraocular lenses's aberration measurement schematic diagram that the present invention is based on the microprism Hartmann;
Fig. 4 among the present invention based on the Hartmann wave front sensor structure and the operation principle sketch map of microprism array.
The specific embodiment
As shown in Figure 1, for the aperture segmentation element among the present invention is artificial intraocular lenses's aberration measurement schematic diagram of microlens array, it comprises light source 1, light beam filtering system, Beam matching system 8, standard spherical reflector 5, aperture segmentation element, be microlens array 91, photodetector 92 and computer 10, wherein aperture segmentation element 91 and photodetector 92 constitute Hartmann wave front sensor, the light beam filtering system is made of pin hole 2 and collimating mirror 3, the Beam matching telescope that Beam matching system 8 is made of the lens or the reflecting mirror of two different focal.The light that sends by light source 1, through pin hole 2 filtering, by collimating mirror 3 collimations is parallel light emergence, through reflecting mirror 4, spectroscope 7 passes artificial intraocular lenses 6 to be measured, transmitted light wave arrives standard spherical reflector 5, axial adjustment standard spherical reflector 5, artificial intraocular lenses's back focus to be measured is overlapped with the centre of sphere of standard spherical reflector, reflecting light returns along original optical path and passes artificial intraocular lenses 6 to be measured once more, after spectroscope 7 and Beam matching system 8, cut apart sampling by microlens array 91 and focus on the photodetector 92 and form spot array, photodetector 92 is sent the hot spot data of gathering into computer 10, and machine 10 is handled the aberration that obtains artificial intraocular lenses to be measured as calculated.
As shown in Figure 2, mainly be made up of microlens array 91 and photoelectric detector 92 based on the Hartmann wave front sensor of microlens array, wherein photoelectric detector 92 is positioned on microlens array 91 focal planes.
Operation principle based on the Hartmann wave front sensor of microlens array is: incident beam forms a spot array on its focal plane behind microlens array 91, the overall optical beam orifice is evenly cut apart.The spot array of preserving standard flat ripple incident generation is as nominal data.When having the wavefront incident of certain aberration, the local wavefront on each lenticule tilts to cause that the facula position on the microlens array focal plane is offset.
The hot spot signal that photoelectric detector 92 receives can be handled by computer 10, adopts centroid algorithm: the position (x that is 1. calculated hot spot by formula
i, y
i), the corrugated control information of detection full aperture:
In the formula, m=1～M, n=1～N are that sub-aperture is mapped to pixel region corresponding on the photoelectric detector 92, I
NmBe (n, the m) signal received of individual pixel-by-pixel basis, x on the photoelectric detector 92
Nm, y
NmBe respectively (n, m) the x coordinate of individual pixel and y coordinate.
2. calculate the wavefront slope g of incident wavefront again according to formula
Xi, g
Yi:
In the formula, (x
0, y
0) demarcate the spot center reference position that Hartmann sensor obtains for the standard flat ripple; During Hartmann sensor probing wave front-distortion, spot center is displaced to (x
i, y
i), finish the detection of Hartmann wave front sensor to signal.
As shown in Figure 3, for the aperture segmentation element among the present invention be artificial intraocular lenses's aberration measurement schematic diagram of microprism array.It comprises light source 1, light beam filtering system, Beam matching system 8, standard spherical reflector 5, aperture segmentation element, be microprism array 91 ', fourier transform lens or imaging len 93, photodetector 92 and computer 10, wherein aperture segmentation element 91 ', fourier transform lens or imaging len 93 and photodetector 92 constitute Hartmann wave front sensor, the light beam filtering system is made of pin hole 2 and collimating mirror 3, the Beam matching telescope that Beam matching system 8 is made of the lens or the reflecting mirror of two different focal.The light that sends by light source 1, through pin hole 2 filtering, by collimating mirror 3 collimations is parallel light emergence, through reflecting mirror 4, spectroscope 7 passes artificial intraocular lenses 6 to be measured, transmitted light wave arrives standard spherical reflector 5, axial adjustment standard spherical reflector 5, artificial intraocular lenses's back focus to be measured is overlapped with the centre of sphere of standard spherical reflector, reflecting light returns along original optical path and passes artificial intraocular lenses 6 to be measured once more, after spectroscope 7 and Beam matching system 8, by microprism array 91 ', fourier transform lens or imaging len 93 backs are cut apart sampling and focused on the photodetector 92 forms spot array, gather the hot spot data and send into computer 10, the treated aberration that obtains artificial intraocular lenses to be measured.
As shown in Figure 4, Hartmann wave front sensor based on microprism array mainly is made up of microprism array 91 ', fourier transform lens 93 and the photoelectric detector 92 of sawtooth shaped phase optical grating construction, wherein fourier transform lens 93 is near microprism array 91 ', and photoelectric detector 92 is positioned on the focal plane of fourier transform lens 93.
Operation principle based on the Hartmann wave front sensor of microprism array is: incident beam is behind microprism array 91 ', the light beam in each sub-aperture has produced the respective phase variation respectively, by being close to fourier transform lens or imaging len 93 imagings thereafter, survey its light distribution by the photoelectric detector 92 that is positioned on fourier transform lens or imaging len 93 focal planes, this light distribution is comprising the phase information that two-dimentional sawtooth shaped phase grating array is produced, the phase place that each sub-aperture produced changes different, thereby on fourier transform lens or imaging len 93 focal planes, forming a spot array, the overall optical beam orifice is evenly cut apart.The spot array that the incident of standard flat ripple produces will be saved and be used as nominal data.When having the wavefront incident of certain aberration, each local dip plane wave produces new additive phase to two-dimentional sawtooth shaped phase grating in its sub-aperture, and this phase place changes in the facula position skew that will be reflected to fourier transform lens or imaging len 93 focal planes.
The hot spot signal that photoelectric detector 92 receives can be handled by computer 10, and processing mode is identical with foregoing Hartmann wave front sensor based on microlens array.Adopt centroid algorithm: the position (x that 1. calculates hot spot by formula
i, y
i), the corrugated control information of detection full aperture:
In the formula, m=1～M, n=1～N are that sub-aperture is mapped to pixel region corresponding on the photoelectric detector 92, I
NmBe (n, the m) signal received of individual pixel-by-pixel basis, x on the photoelectric detector 92
Nm, y
NmBe respectively (n, m) the x coordinate of individual pixel and y coordinate.
2. calculate the wavefront slope g of incident wavefront again according to formula
Xi, g
Yi:
In the formula, (x
0, y
0) demarcate the spot center reference position that Hartmann sensor obtains for the standard flat ripple; During Hartmann sensor probing wave front-distortion, spot center is displaced to (x
i, y
i), finish the detection of Hartmann wave front sensor to signal.
Claims (7)
1, reflection type artificial crystal optical aberration hartmann measuring apparatus, it is characterized in that mainly comprising: light source, light beam filtering system, Beam matching system, standard spherical reflector, aperture segmentation element, photodetector and computer, wherein aperture segmentation element, photodetector constitute Hartmann wave front sensor; The light that sends by light source outgoing after the filtering of light beam filtering system and collimation are directional light, this directional light passes artificial intraocular lenses to be measured through reflecting mirror and spectroscope successively, transmitted light wave arrives the standard spherical reflector, axial adjustment standard spherical reflector, artificial intraocular lenses's to be measured back focus is overlapped with the centre of sphere of standard spherical reflector, reflecting light returns along original optical path and passes artificial intraocular lenses to be measured once more, successively after spectroscope and Beam matching system, sampled and focus on by the aperture segmentation element divisions and form spot array on the photodetector, photodetector is sent the hot spot data of gathering into computer, and machine is handled the aberration that obtains artificial intraocular lenses to be measured as calculated.
2, reflection type artificial crystal optical aberration hartmann measuring apparatus according to claim 1 is characterized in that: described standard spherical reflector is the standard concave spherical reflector, or the protruding spherical reflector of standard.
3, reflection type artificial crystal optical aberration hartmann measuring apparatus according to claim 1 is characterized in that: described aperture segmentation element is a microlens array, or microprism array; When the aperture segmentation element was microlens array, photoelectric detector was positioned on the microlens array focal plane; When being microprism array, also be added with fourier transform lens or imaging len in the microprism array back, fourier transform lens or imaging len are near microprism array, and photoelectric detector is positioned on the focal plane of fourier transform lens or imaging len.
4, reflection type artificial crystal optical aberration hartmann measuring apparatus according to claim 1 is characterized in that: described photodetector is the imaging camera, or the position sensor array.
5, reflection type artificial crystal optical aberration hartmann measuring apparatus according to claim 1 is characterized in that: described light beam filtering system is made of pin hole and collimating mirror, and light beam is parallel light emergence through pin hole filtering by the collimating mirror collimation.
6, reflection type artificial crystal optical aberration hartmann measuring apparatus according to claim 1 is characterized in that: described Beam matching system is made of the lens or the reflecting mirror of two different focal.
7, reflection type artificial crystal optical aberration hartmann measuring apparatus according to claim 1 is characterized in that: described light source is laser instrument or superradiance semiconductor device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200710304513A CN100589780C (en) | 2007-12-28 | 2007-12-28 | Reflection type artificial crystal optical aberration hartmann measuring apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200710304513A CN100589780C (en) | 2007-12-28 | 2007-12-28 | Reflection type artificial crystal optical aberration hartmann measuring apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101278867A CN101278867A (en) | 2008-10-08 |
| CN100589780C true CN100589780C (en) | 2010-02-17 |
Family
ID=40011662
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200710304513A Expired - Fee Related CN100589780C (en) | 2007-12-28 | 2007-12-28 | Reflection type artificial crystal optical aberration hartmann measuring apparatus |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100589780C (en) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101694414B (en) * | 2009-10-20 | 2011-06-29 | 中国科学院光电技术研究所 | Annulus splicing detection system based on Hartmann sensor |
| CN102008289A (en) * | 2010-12-08 | 2011-04-13 | 苏州六六宏医疗器械有限公司 | Aberration compensation fundus microscope based on automatic optimization algorithm |
| CN102564731A (en) * | 2010-12-16 | 2012-07-11 | 中国科学院西安光学精密机械研究所 | Device for measuring focal length and wavefront distortion of lens |
| CN103376076A (en) * | 2012-04-23 | 2013-10-30 | 鸿富锦精密工业（深圳）有限公司 | Three-dimensional probe compensation and space error measuring system and method |
| CN104236856B (en) * | 2014-09-10 | 2017-01-18 | 中国科学院上海光学精密机械研究所 | Wave aberration detection device of objective lens imaging system and system error correction method of wave aberration detection device |
| CN107525654B (en) * | 2017-08-23 | 2024-06-11 | 重庆连芯智能科技研究院有限公司 | Imaging system aberration detection method and device |
| CN108037594B (en) * | 2018-01-02 | 2020-05-22 | 北京全欧光学检测仪器有限公司 | Assembly method and device of full-field lens |
| CN109029288B (en) * | 2018-07-25 | 2020-10-16 | 中国科学院光电技术研究所 | Reflective large-gradient aspheric surface and free-form surface detection device and method based on DMD wave-front sensing technology |
| CN108776005A (en) * | 2018-09-05 | 2018-11-09 | 武汉华工激光工程有限责任公司 | A kind of optical element aberration detecting and system |
| FR3104258B1 (en) * | 2019-12-06 | 2021-12-31 | Saint Gobain | METHOD FOR MEASURING THE OPTICAL QUALITY OF A GIVEN ZONE OF GLAZING, ASSOCIATED MEASURING DEVICE |
| CN112790895B (en) * | 2020-12-28 | 2022-12-27 | 上海美沃精密仪器股份有限公司 | Artificial crystal compensation correction system and method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1601231A (en) * | 2003-09-28 | 2005-03-30 | 中国科学院光电技术研究所 | Hartmann wave front sensor of aberration of human eyes based on microprism array |
| US20050219461A1 (en) * | 2004-03-30 | 2005-10-06 | Kabushiki Kaisha Topcon | Opthalmological apparatus |
| CN1951340A (en) * | 2005-10-17 | 2007-04-25 | 南开大学 | Artificial crystal design based on personalized human's eye model |
-
2007
- 2007-12-28 CN CN200710304513A patent/CN100589780C/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1601231A (en) * | 2003-09-28 | 2005-03-30 | 中国科学院光电技术研究所 | Hartmann wave front sensor of aberration of human eyes based on microprism array |
| US20050219461A1 (en) * | 2004-03-30 | 2005-10-06 | Kabushiki Kaisha Topcon | Opthalmological apparatus |
| CN1951340A (en) * | 2005-10-17 | 2007-04-25 | 南开大学 | Artificial crystal design based on personalized human's eye model |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101278867A (en) | 2008-10-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN100589780C (en) | Reflection type artificial crystal optical aberration hartmann measuring apparatus | |
| CN100586406C (en) | Transmission type artificial crystal optical aberration hartmann measuring apparatus | |
| CN100573080C (en) | Utilize light-splitting device to realize the Hartmann wave front sensor and the detection method thereof of alignment function | |
| CN101766472B (en) | Liquid crystal adaptive retinal imaging optical system for aberration correction with self-regulating visibility | |
| CN103070665B (en) | Self-adapted sweep frequency optical coherence tomography imaging system based on double wave-front correctors | |
| CN102038487B (en) | Adaptive optics apparatus that corrects aberration of examination object and image taking apparatus | |
| CN204165736U (en) | A kind of wave aberration high precision measuring device for object lens imaging system | |
| CN101266194B (en) | High precision image quality detection system for optical eye lens | |
| CN104236856A (en) | Wave aberration detection device of objective lens imaging system and system error correction method of wave aberration detection device | |
| CN104783755A (en) | Self-adaptive optical retina imaging device and method | |
| CN101248981A (en) | Visual optics analysis system based on wave-front abberration | |
| CN101276056A (en) | High precision split joint sub lens relative tilt error photo-electric detection system | |
| JP2005312974A (en) | Optical wavefront detection system and its detection method and also refraction aberration measurement system for eye and its measuring method | |
| CN103054550B (en) | Line scanning confocal ophthalmoscope system on basis of adaptive optics | |
| CN102879110B (en) | Adaptive optical system based on modulation and modulation-free combined pyramid wave-front sensor | |
| CN104142129A (en) | Off-axis three-mirror aspheric system convex aspheric secondary mirror surface shape splicing detection method | |
| CN102429638B (en) | Retina shaking correcting device and method on basis of image correlation | |
| CN103431837B (en) | Human eye axial chromatic aberration and transverse chromatic aberration measurement device based on Hartmann sensor and method thereof | |
| CN102973241B (en) | Laser diffracted ray scanning confocal ophthalmoscope system based on adaptive optics | |
| CN1971232B (en) | Hartmann wavefront sensor with active alignment function and detection method therefor | |
| CN100562723C (en) | The positive-branch confocal unstable resonator in-cavity aberration detection system | |
| US8009280B1 (en) | Wavefront characterization and correction | |
| CN108955904B (en) | Multifunctional wavefront detection device considering point-surface target | |
| CN102499634B (en) | Living human eye retina dynamic imaging device with image stabilizing function and method | |
| CN100450431C (en) | Microprism array based human eye aberration and cornea face form measuring system of Sharck-Hartmann wavefront sensor |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100217 Termination date: 20141228 |
|
| EXPY | Termination of patent right or utility model |