CN207753012U - Antistatic pinboard for system in package - Google Patents

Abstract

The utility model is related to a kind of antistatic pinboards for system in package, including：Si substrates (101)；At least two areas TSV (102) are set in the Si substrates (101)；At least two isolated areas (103) are set in the Si substrates (101) and between the areas TSV (102) described in each two；Diode (104) is set on the isolated area (103)；Interconnection line (105) is connected in series the first end face and the diode (104) of the areas TSV (102).TSV pinboards provided by the utility model are used as ESD protection device by processing diode on TSV pinboards, it solves the problems, such as that the IC system grade encapsulation antistatic effect based on TSV techniques is weak, enhances the antistatic effect of IC system grade encapsulation.

Description

Antistatic pinboard for system in package

Technical field

The utility model category semiconductor integrated circuit technology field, more particularly to a kind of antistatic for system in package Pinboard.

Background technology

With being constantly progressive for microelectric technique, only relies on and integrate more devices on one chip to improve chip Performance can no longer meet actual demand.Therefore, stack chip package technology is increasingly becoming the mainstream of technology development.Stacked core Piece encapsulation technology is under the premise of not changing package body sizes, and the vertical direction in the same packaging body is stacked multiple chips Encapsulation technology.Wherein, silicon hole (Through-Silicon Via, abbreviation TSV) pinboard is to realize that chip interconnects up and down Connecting plate can not only reduce the length of interconnection line, but also can reduce the power consumption of circuit.

Inside semicon industry, with the raising of integrated circuit integrated level and the reduction of device feature size, integrate Potentiality damage caused by static discharge (Electro-Static Discharge, abbreviation ESD) has become more next in circuit It is more apparent.According to relevant report, nearly 35% failure is caused by ESD in the failure of integrated circuit fields, therefore chip Inside is all designed with esd protection structure to improve the reliability of device.

Pinboard typically refers to the functional layer of interconnection and pin redistribution between chip and package substrate.Pinboard can be with Intensive I/O leads are redistributed, the high density interconnection of multi-chip is realized, it is macro with grade to become nanometer-grade IC Electric signal connects one of most effective means between seeing the world.When realizing that multifunction chip is integrated using pinboard, not same core The antistatic effect of piece is different, and the weak chip of antistatic effect influences whether the anti-quiet of whole system after encapsulation when three-dimensional stacked Electric energy power, therefore it is urgently to be resolved hurrily as semicon industry how to improve the antistatic effect of the system in package based on TSV techniques The problem of.

Utility model content

In order to improve the antistatic effect of the system in package based on TSV techniques, the utility model provides one kind and is used for The antistatic pinboard of system in package；The technical problems to be solved in the utility model is achieved through the following technical solutions：

The embodiments of the present invention provide a kind of antistatic pinboard for system in package, including：

Si substrates 101；

At least two areas TSV 102 are set in the Si substrates 101, and the material in the areas TSV 102 is polysilicon；

At least two isolated areas 103 are set in the Si substrates 101 and between the areas TSV 102 described in each two；

Diode 104 is set on the isolated area 103；

Interconnection line 105 is connected in series the first end face and the diode 104 in the areas TSV 102；

Copper bump 107 is set in the second end face in the areas TSV 102；

Insulating layer 108 is set to 101 upper and lower surface of Si substrates.

Compared with prior art, the utility model has the advantages that：

1, TSV pinboards provided by the utility model are increased by the way that ESD protection device diode is arranged on TSV pinboards The strong antistatic effect of laminate packaging chip；

2, the utility model, using the higher heat-sinking capability of pinboard, is improved by the way that diode is arranged on TSV pinboards High current handling capacity in device work.

Description of the drawings

It is required in being described below to embodiment in order to illustrate more clearly of the technical solution of the utility model embodiment The attached drawing used is briefly described, it should be apparent that, the accompanying drawings in the following description is only some implementations of the utility model Example, for those of ordinary skill in the art, without creative efforts, can also obtain according to these attached drawings Obtain other attached drawings.

Fig. 1 is that a kind of antistatic adapter plate structure for system in package that the utility model embodiment provides is illustrated Figure；

Fig. 2 is a kind of preparation method for antistatic pinboard for system in package that the utility model embodiment provides Flow chart；

Fig. 3 a- Fig. 3 h are the antistatic pinboard that the another kind that the utility model embodiment provides is used for system in package Preparation method flow chart.

Specific implementation mode

Further detailed description, but the embodiment party of the utility model are done to the utility model with reference to specific embodiment Formula is without being limited thereto.

Embodiment one

Fig. 1 is referred to, Fig. 1 is a kind of antistatic pinboard for system in package that the utility model embodiment provides Structural schematic diagram, including：

Si substrates 101；

At least two areas TSV 102, are set in Si substrates 101；

At least two isolated areas 103 are set in Si substrates 101 and between the areas each two TSV 102；

Diode 104 is set on isolated area 103；

Interconnection line 105, first end face and diode 104 to the areas TSV 102 are connected in series.

Specifically, further include passivation layer 106, be set on Si substrates 101, for the areas TSV 102 and diode 104 And it is isolated between diode 104.

Preferably, the material in the areas TSV 102 is polysilicon, and the doping concentration of polysilicon is 2 × 10²¹cm^-3, impurity For phosphorus.

Preferably, the Si substrates 101 up and down of the areas TSV 102.

Specifically, it is provided with tungsten plug between the first end face in the areas TSV 102 and diode 104 and interconnection line 105.

Further, tungsten plug and copper bump 107 are provided in the second end face in the areas TSV 102.

Further, further include the insulating layer 108 for being set to 101 both side surface of Si substrates.

Specifically, isolated area 103 is used for and the insulating layer 108 of 101 upper and lower surface of Si substrates forms closed area of isolation With isolating diode 104.

Preferably, the depth in the areas TSV is 40~80 μm.

Preferably, the depth of isolated area is 400~500nm.

TSV pinboards provided in this embodiment are enhanced system-level by the way that transverse diode is arranged on TSV pinboards The antistatic effect of encapsulation, the weak chip of antistatic effect influences whether whole system after encapsulating when solving system in package The problem of antistatic effect；Meanwhile the present embodiment provides the isolated area being arranged around the diode of TSV pinboards up and down, With smaller leakage current and parasitic capacitance.

Embodiment two

Fig. 2 is please referred to, Fig. 2 is a kind of antistatic pinboard for system in package that the utility model embodiment provides Preparation method flow chart, the present embodiment on the basis of the above embodiments, to the preparation side of the TSV pinboards of the utility model Method is described in detail as follows.Specifically, include the following steps：

S201, Si substrates are chosen；

S202, multiple TSV are prepared on a si substrate using etching technics；

S203, depositing polysilicon material is filled TSV to form the areas TSV on a si substrate；

Multiple isolated areas are prepared on S204, the Si substrates between the areas TSV；

S205, the diode that transversary is prepared in isolated area；

S206, using electroplating technology, surface prepares copper interconnecting line on a si substrate；

S207, using chemically mechanical polishing (Chemical Mechanical Polishing, abbreviation CMP) technique, to Si Substrate is thinned, until leaking out TSV；

S208, copper bump is formed to complete the preparation of TSV pinboards using electric plating method in Si substrates lower surface.

Wherein, the reason of choosing Si substrates is that the thermodynamic property of Si is identical as chip, using Si materials as switching Plate can reduce the bending of chip and die stress caused by the difference and residual stress of coefficient of thermal expansion to the full extent. The crystal orientation of Si substrates can be (100), (110) or (111), in addition, the doping type of substrate can be N-type, or P Type.

Preferably, S202 may include steps of：

S2021, using photoetching process, by gluing, photoetching, development and etc. complete TSV etched features；

S2022, using deep reaction ion etching method (Deep Reactive Ion Etching, abbreviation DRIE) technique, It etches Si substrates and forms TSV.

Wherein, the quantity of TSV is that the depth of at least two, TSV is less than the thickness of Si substrates；

Further, S203 may include steps of：

S2031, thermal oxide TSV make TSV inner walls form oxide layer；

S2032, the oxide layer of TSV inner walls is etched to complete the planarizing of TSV inner walls using wet-etching technology.

S2033, using photoetching process, by gluing, photoetching, development and etc. complete TSV and fill figure

S2034, using chemical vapor deposition (Chemical Vapor Deposition, abbreviation CVD) technique, deposit is more Crystal silicon material is filled TSV, while being passed through impurity gas and carrying out doping in situ, realizes the activation in situ of doped chemical, shape At the highly doped areas polysilicon TSV.

Wherein, wherein can prevent the protrusion of TSV side walls from forming electric field concentrated area by the planarizing of TSV inner walls；It is logical The areas Guo TSV carry out highly doped polysilicon filling, can form Impurity Distribution uniformly and the conductive material of high-dopant concentration, Be conducive to reduce the resistance of TSV.

Preferably, S204 may include：

S2041, using CVD techniques, deposit SiO on a si substrate₂Layer and Si₃N₄Layer；

S2042, using photoetching process, by gluing, photoetching, development, the Si substrates between the areas TSV complete ditch Slot isolated area figure；

S2043, isolated groove is formed using dry etch process；

S2044, CVD techniques, deposit SiO are utilized₂Isolated groove is filled, isolated area is formed.

Preferably, S205 includes：

S2051, using photoetching process, by gluing, photoetching, development and etc. diode component ditch is formed in isolated area Slot；

S2052, using CVD techniques, the depositing polysilicon material in diode component groove；

S2053, photoetching P⁺Active area carries out P using band glue ion implantation technology⁺Injection removes photoresist, forms two poles The anode of pipe；

S2054, photoetching N⁺Active area carries out N using band glue ion implantation technology⁺Injection removes photoresist, forms two poles The cathode of pipe；

S2055, high annealing, activator impurity are carried out；

S2056, using pecvd process, deposit SiO in substrate surface₂；

S2057, substrate surface is planarized using CMP process.

Wherein, by preparing transverse diode in isolated area, Impurity Distribution can be formed uniformly and high-dopant concentration Diode anode and cathode form the precipitous PN junction of Impurity Distribution, further improve the performance of Anti-static device.

Preferably, S206 may include steps of：

S2061, sputtering or CVD techniques, on a si substrate surface formation laying and barrier layer, and utilization CVD works are utilized The first end in the areas Yi TSV and the anode and cathode of diode form tungsten plug；

S2062, deposition insulating layer, photoetching copper-connection figure deposit copper using electrochemical plating process for copper, pass through chemical machinery Grinding technics removes extra copper, forms the copper interconnecting line that the first end in the areas TSV is concatenated with diode.

Further, when preparing copper interconnecting line, using metal interconnecting wires around spiral and make it have inductance Characteristic to be more particularly for the electrostatic protection of RF IC.

Preferably, S207 may include steps of：

S2071, Si substrate top surfaces and auxiliary wafer bonding are passed through into auxiliary using high molecular material as middle layer Disk supports Si substrate top surfaces；

S2072, Si substrates lower surface is thinned using mechanical grinding reduction process, is slightly larger than TSV depths until reducing to The thickness of degree；

S2073, smooth, the second end until exposing the areas TSV is carried out to Si substrates lower surface using CMP process.

Preferably, S208 may include steps of：

S2081, laying and barrier layer are formed in Si substrates lower surface using sputtering or CVD techniques, is existed using CVD techniques The second end in the areas TSV forms tungsten plug；

S2082, deposition insulating layer, the second end photoetching copper bump figure in the areas TSV are deposited using electrochemical plating process for copper Copper removes extra copper by chemical mechanical milling tech, and the second end in the areas TSV forms copper bump.

S2083, the auxiliary disk being bonded temporarily is removed using the technique of heated mechanical.

The preparation method of TSV pinboards provided in this embodiment, it is mutually compatible with prior art, be conducive to industrialization；Using The diode component of transversary, parasitic capacitance is small, is influenced on RF IC small.

Embodiment three

The present embodiment on the basis of the above embodiments, to specific in the preparation method of the TSV pinboards of the utility model Parameter citing is described as follows.Specifically, please refer to Fig. 3 a- Fig. 3 h, Fig. 3 a- Fig. 3 h be the utility model embodiment provide it is another Preparation method flow chart of the kind for the antistatic pinboard of system in package.

S301, Si substrates 301 are chosen, as shown in Figure 3a；

Preferably, the doping concentration of Si substrates is 10¹⁴~10¹⁷cm^-3, thickness is 150~250 μm.

S302, as shown in Figure 3b；It prepares three TSV302 on a si substrate using etching technics, may include walking as follows Suddenly：

S3021, at a temperature of 1050 DEG C~1100 DEG C, utilize thermal oxidation technology on a si substrate surface grow one layer The SiO of 800nm~1000nm₂Layer；

S3022, using photoetching process, by gluing, photoetching, development and etc. complete TSV etched features；

S3023, Si substrates are etched using DRIE techniques, forms the TSV that depth is 40~80 μm；

S3024, using CMP process, remove the SiO on Si substrates₂, substrate surface is planarized.

S303, as shown in Figure 3c；Depositing polysilicon material is filled TSV to form the areas TSV on a si substrate, specifically may be used To include the following steps：

S3031,1050 DEG C~1100 DEG C at a temperature of, it is 200nm~300nm that thermal oxide TSV inner walls, which form thickness, Oxide layer；

S3032, using wet-etching technology, etch the oxide layer of TSV inner walls to complete the flat of TSV and isolated groove inner wall Integralization.To prevent the protrusion of TSV side walls from forming electric field concentrated area；

S3033, using photoetching process, by gluing, photoetching, development and etc. complete TSV and fill figure；

S3034, at a temperature of 600 DEG C~620 DEG C, TSV is filled using CVD technique depositing polysilicon materials, It is passed through impurity gas simultaneously and carries out doping in situ, and realizes the activation in situ of doped chemical, forms highly doped polysilicon filling. Impurity Distribution can be formed when being filled to TSV so uniformly and the conductive material of high-dopant concentration is filled, is conducive to reduce TSV Resistance.Polysilicon doping concentration preferably 2 × 10²¹cm^-3, the preferred phosphorus of impurity；

S3035, using CMP process, substrate surface is planarized.

S304, as shown in Figure 3d；Two isolated areas 303 are prepared on Si substrates between the areas Liang Ge TSV respectively, specifically may be used To include the following steps：

S3041, using CVD techniques, on a si substrate continuously growth materials at two layers, first layer can be thickness be 20~ The SiO of 50nm₂Layer, the second layer can be the Si that thickness is 30~60nm₃N₄Layer；

S3042, using photoetching process, by gluing, photoetching, development, on the Si substrates between the areas Liang Ge TSV It is respectively formed shallow channel isolation area figure；

S3043, using wet-etching technology, etch Si₃N₄Layer forms isolated area figure, then uses dry etching, is formed The shallow trench of deep 400~500nm；

S3044, using CVD techniques, at a temperature of 750 DEG C, deposit SiO₂Material fills up groove；

S3045, substrate surface is planarized using CMP process.

S305, as shown in Figure 3 e；The diode 304 that transversary is prepared in isolated area, can specifically include following step Suddenly：

S3051, using photoetching process, diode component figure is formed in isolated area by techniques such as gluing, photoetching, developments Shape；

S3052, using LPCVD techniques, at a temperature of 600 DEG C~950 DEG C, selective epitaxial growth polysilicon, simultaneously It is passed through impurity gas and carries out doping in situ, and realize the activation in situ of doped chemical, form N^-The polysilicon of doping is filled.Doping A concentration of 5 × 10¹⁴cm^-3, the preferred phosphorus of impurity；

S3053, photoetching P⁺Active area carries out P using band glue ion implantation technology⁺Injection removes photoresist, forms two poles The anode of pipe.Doping concentration is 5 × 10¹⁸cm^-3, impurity is boron；

S3054, photoetching N⁺Active area carries out N using band glue ion implantation technology⁺Injection removes photoresist, forms two poles The cathode of pipe.Doping concentration preferably 5 × 10¹⁸cm^-3, the preferred phosphorus of impurity；

S3055, by substrate at a temperature of 950~1100 DEG C, anneal 15~120s, carry out impurity activation；

S3056, using pecvd process, deposit SiO in substrate surface₂；

S3057, substrate surface is planarized using CMP process.

S306, as illustrated in figure 3f；Using electroplating technology, surface forms copper interconnecting line 305 on a si substrate, can specifically wrap Include following steps：

S3061, plasma enhanced chemical vapor deposition (Plasma Enhanced Chemical Vapor are utilized Deposition, PECVD) technique, deposit SiO in substrate surface₂Layer；

S3062, pass through gluing, light using photoetching process in the first end in the areas TSV and the anode and cathode of diode The techniques such as quarter, development complete contact hole graph；

S3063, using CVD techniques, in the first end in the areas TSV and anode and cathode deposit Ti films, the TiN film of diode With tungsten to form tungsten plug；

S3064, substrate surface is planarized using CMP process.

S3065, deposit SiO₂Insulating layer, photoetching copper-connection figure deposit copper, passing through using the method for Cu electroplating The method for learning mechanical lapping removes extra copper, and the first end for forming the areas TSV concatenates copper interconnecting line with diode；

S3066, substrate surface is planarized using CMP process.

S3067, using pecvd process, deposit SiO in substrate surface₂Layer；

S307, as shown in figure 3g；Si substrates are thinned using CMP process, the areas TSV is leaked out, specifically may be used To include the following steps：

S3071, Si substrate top surfaces and auxiliary wafer bonding are passed through into auxiliary using high molecular material as middle layer Being thinned for Si substrates is completed in the support of disk；

S3072, Si substrates lower surface is thinned using mechanical grinding reduction process, is slightly larger than the areas TSV until reducing to The thickness of depth, preferably greater than 10 μm of TSV depth；

S3073, Si substrates lower surface is carried out using CMP process it is smooth, until exposing TSV areas；

S308, as illustrated in figure 3h；Copper bump 306 is formed using electric plating method in Si substrates lower surface, can specifically be wrapped Include following steps：

S3081, using pecvd process, deposit SiO in substrate lower surface₂Layer；

S3082, the second end in the areas TSV complete contact hole using photoetching process by techniques such as gluing, photoetching, developments Figure；

S3083, using CVD techniques, the areas TSV second end face deposit Ti films, TiN film and tungsten to form tungsten plug；

S3084, substrate surface is planarized using CMP process；

S3085, deposit SiO₂Insulating layer, the second end photoetching copper bump figure in the areas TSV, utilizes electrochemical plating process for copper Copper is deposited, extra copper is removed by chemical mechanical milling tech, etches SiO₂Layer, the second end in the areas TSV form copper bump；

S3086, the auxiliary disk being bonded temporarily is removed using the method for heated mechanical.

The preparation method of TSV pinboards provided in this embodiment, using diode component periphery by SiO₂Insulating layer surrounds Technique, the parasitic capacitance between active area and substrate can be effectively reduced.The utility model is on the basis of considering technological feasibility The holes TSV by optimal design-aside certain length and the doping concentration using given range, and consider that the electric current of device passes through energy Power reduces parasitic capacitance and resistance, and the inductance introduced using the holes TSV carries out a degree of tune to the parasitic capacitance of device It is humorous, the working range of esd protection circuit is expanded while raising system in package anti-ESD abilities.

It, cannot the above content is specific preferred embodiment further detailed description of the utility model is combined Assert that the specific implementation of the utility model is confined to these explanations.For example, the multiple isolated areas referred in the utility model are only Only it is to be illustrated according to device architecture sectional view provided by the utility model, wherein multiple isolated areas can also be some The first part and second part that the sectional view of such as ring bodies is shown in entirety, for the utility model technical field For those of ordinary skill, these explanations are should not be limited to, without departing from the concept of the premise utility, can also be made Several simple deduction or replace, all shall be regarded as belonging to the scope of protection of the utility model.

Claims (1)

1. a kind of antistatic pinboard for system in package, which is characterized in that including：

Si substrates (101)；

At least two areas TSV (102) are set in the Si substrates (101), and the material in the areas TSV (102) is polycrystalline Silicon；

At least two isolated areas (103), be set in the Si substrates (101) and positioned at the areas TSV (102) described in each two it Between；

Diode (104) is set on the isolated area (103)；

Interconnection line (105) is connected in series the first end face and the diode (104) of the areas TSV (102)；

Copper bump (107) is set in the second end face of the areas TSV (102)；

Insulating layer (108) is set to Si substrates (101) upper and lower surface.