CN206132930U - Test auxiliary assembly , try on clothes from dynamic testing and put - Google Patents
Test auxiliary assembly , try on clothes from dynamic testing and put Download PDFInfo
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- CN206132930U CN206132930U CN201621103603.5U CN201621103603U CN206132930U CN 206132930 U CN206132930 U CN 206132930U CN 201621103603 U CN201621103603 U CN 201621103603U CN 206132930 U CN206132930 U CN 206132930U
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- test
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Abstract
The utility model provides a test auxiliary assembly, try on clothes from dynamic testing and put, the test auxiliary assembly include: the centralized control board for the receipt derives from the test instruction of treater output, and deciphers this test instruction and issue it, include in the test instruction the circuit parameter of the need test that the treater had been selected reaches the instruction transmission route that the treater had set up, at least a set of many draw -in grooves keysets, with the centralized control board is connected, is used for the transfer the test instruction, at least a set of can bayonet controlled switch group board, insert respectively many draw -in grooves keysets with on the last at least test circuit point of circuit under test, in order to insert the test instruction starts test auxiliary assembly, the test the circuit parameter that test circuit is ordered. The utility model discloses completion circuit parameter testing that can be automatic, continuous, quick, processing ease, and acquire the circuit parameter of circuit board accurately need not to increase auxiliary circuit when more having time limits's circuit parameter testing.
Description
Technical field
This utility model belongs to circuit board manufacturing area, is related to a kind of auxiliary equipment, more particularly to a kind of test auxiliary
Equipment, automatic test approach and device.
Background technology
Integrated circuit (IntegratedCircuit, IC) is a kind of microelectronic device, by using certain technique,
The elements such as transistor, diode, resistance, electric capacity and the inductance wanted needed for one circuit and wiring are interconnected, are made
On a fritter or a few fritter semiconductor wafers or dielectric substrate, it is then encapsulated in a shell, becomes with required circuit
The microstructure of function.When carrying out parametric test circuit to electronic product, usually electricity is carried out to the integrated circuit of electronic product
Road parameter testing.When carrying out parametric test circuit to integrated circuit, need each functional pin of integrated circuit by integrated
Adapter plate for circuit is connected to test device.And digital multimeter is exactly instrument indispensable when carrying out circuit test.With numeral
When circuit tester is tested, the gear and mobile red and black table rod of digital table need to be repeatedly manually selected to the test point for needing test.Work as skill
When art reason needs continuously quickly to test, manual working is just difficult to complete.For example, when needing to some circuit parameters on circuit board
When being tested, with digital table, one by one parameter is tested.Gear and the table rod position of digital table need to be repeatedly adjusted, and
Visually read record.When changing a piece of circuit board, said process is repeated.It is cumbersome, and easily error, and for there is the time to limit
The parameter testing of system needs Design assistant circuit.
Therefore, a kind of test accessory, automatic testing equipment how are provided, to solve prior art to integrated circuit
When plate carries out continuous quickly parametric test circuit, manual working is difficult to complete, cumbersome, easily the defect such as error, it is real
Become practitioner in the art's technical problem urgently to be resolved hurrily.
Utility model content
The shortcoming of prior art in view of the above, the purpose of this utility model be provide a kind of test accessory,
Automatic testing equipment, for solving prior art in when continuous quickly parametric test circuit is carried out to surface-mounted integrated circuit, handss
Action industry is difficult to complete, cumbersome, easily the problem of error.
For achieving the above object and other related purposes, on the one hand this utility model provides a kind of test accessory, with
Circuit under test connects, and the test accessory includes：Center panel, refers to for receiving the test for coming from processor output
Make, and understand test instruction and issued；The test instruction includes the circuit of the need test that the processor has been selected
The instruction transmission path that parameter and the processor have been arranged；The many draw-in groove pinboards of least one set, connect with the center panel
Connect, for test instruction described in transfer；Least one set insertable controlled switch group plate, inserts respectively many draw-in groove pinboards
On an at least test circuit point in the circuit under test, to access the test instruction, start the test accessory, survey
Try the circuit parameter of the test circuit point.
In an embodiment of the present utility model, connected by serial line interface between the center panel and the processor
Connect.
Center panel adopts singlechip chip described in an embodiment of the present utility model.
In an embodiment of the present utility model, many draw-in groove pinboards include：Twin wire universal serial bus transfer chip,
For test instruction data signal and clock signal will to be changed in the test instruction, and amplified；Multiple draw-in grooves, are integrated in
On the twin wire universal serial bus transfer chip, for transmitting transfer after test instruction data signal and clock signal.
Insertable controlled switch group plate includes described in an embodiment of the present utility model：Twin wire universal serial bus end
Mouthful extended chip, with the 2-wire serial interface mode be inserted on many draw-in groove pinboards, for receiving the transfer after test
Instruction data signal and clock signal；Relay group, is connected, for according to described with twin wire serial bus port extended chip
Test instruction data signal, clock signal and instruction transmission path promote electrical switch action in corresponding relay, to insert
Test circuit point.
In an embodiment of the present utility model, the quantity of the insertable controlled switch group plate is by the circuit under test
On test circuit point quantity determine；And it is total to be provided with several twin wire serials on the insertable controlled switch group plate
Line end mouth.
On the other hand this utility model provides a kind of automatic testing equipment, circuit under test is applied to, in the circuit under test
With some test circuit points, the automatic testing equipment includes：Tester, for testing test circuit in the circuit under test
The circuit parameter of point；Processor, is connected with the tester, for output test instruction；And be connected with the processor, institute
The test accessory stated；After the test accessory starts, the processor is read by the test accessory
The circuit parameter of the test circuit point.
Tester is the digital multimeter with Serial Communication Function described in an embodiment of the present utility model；It is described
The red table rod of digital multimeter and Hei Biao rods are inserted into respectively many draw-in groove pinboards.
In an embodiment of the present utility model, the resistance of the circuit parameter including test circuit point, electric current, voltage,
Inductance, frequency, transistor and/or metal-oxide-semiconductor characteristic.
As described above, test accessory of the present utility model, automatic test approach and device, with following beneficial effect
Really：
Test accessory described in the utility model, automatic testing equipment can automatically, even by test accessory
Continue, quickly finish parametric test circuit, processing ease, and accurately acquire the circuit parameter of circuit board, more having the time
Auxiliary circuit need not be increased during the parametric test circuit of restriction.
Description of the drawings
Fig. 1 is shown as structural representation of the test accessory of the present utility model in an embodiment.
Fig. 2 is shown as in test accessory of the present utility model insertable controlled switch group plate in an embodiment
Structural representation.
Fig. 3 is shown as structural representation of the automatic testing equipment of the present utility model in an embodiment.
Component label instructions
1 test accessory
11 center panels
Draw-in groove pinboard more than 12
13 insertable controlled switch group plates
Draw-in groove pinboard more than 121 first
Draw-in groove pinboard more than 122 second
131 first insertable controlled switch group plates
132 second insertable controlled switch group plates
2 circuit under test
3 automatic testing equipments
31 testers
32 processors
311 red table rods
312 black table rods
313 serial ports
Specific embodiment
Hereinafter embodiment of the present utility model is illustrated by particular specific embodiment, those skilled in the art can be by this
Content disclosed by description understands easily other advantages of the present utility model and effect.
Refer to Fig. 1 to Fig. 3.It should be clear that structure, ratio, size depicted in this specification institute accompanying drawings etc., only to
Coordinate the content disclosed in description, so that those skilled in the art understands and reads, be not limited to this utility model
Enforceable qualificationss, therefore do not have technical essential meaning, the modification of any structure, the change of proportionate relationship or size
Adjustment, in the effect for not affecting this utility model can be generated and under the purpose to be reached, all should still fall in this utility model
In the range of disclosed technology contents are obtained and can covered.Meanwhile, in this specification it is cited as " on ", D score, " left side ",
The term on " right side ", " centre " and " one " etc., is merely convenient to understanding for narration, and it is enforceable to be not used to restriction this utility model
Scope, being altered or modified for its relativeness is enforceable when this utility model is also considered as under without essence change technology contents
Category.
Embodiment one
The present embodiment provides a kind of test accessory, is connected with circuit under test, and the test accessory includes：
Center panel, instructs under it for receiving the test instruction for coming from processor output, and understanding the test
Send out；The test instruction includes the finger that the circuit parameter and the processor of the need test that the processor has been selected have been arranged
Make transmission path；
The many draw-in groove pinboards of least one set, are connected with the center panel, for test instruction described in transfer；
Least one set insertable controlled switch group plate, inserts respectively in many draw-in groove pinboards and the circuit under test
On an at least test circuit point, to access the test instruction, start the test accessory, test the test circuit point
Circuit parameter.
The test accessory provided the present embodiment below with reference to diagram is described in detail.Fig. 1 is referred to, is shown
It is shown as structural representation of the test accessory in an embodiment.The test accessory 1 is used for subtest device and place
Reason device completes the test of circuit parameter.In the present embodiment, the tester is the digital multimeter with Serial Communication Function.
The processor is PC.The test accessory 1 include many draw-in groove pinboards 12 of center panel 11, least one set and
Least one set insertable controlled switch group plate 13.The quantity of the insertable controlled switch group plate 13 is by the circuit under test
On the quantity of test circuit point determine that test circuit point enormous amount even in circuit under test arranges multigroup insertable and receives
Control switches set plate 13 inserts many draw-in groove pinboards 12.For example, there are 10 test circuit points in the circuit under test.By this enforcement
The red table rod and Hei Biao rods of digital multimeter are connected to the two ends of test circuit point to test by the test accessory 1 described in example
The circuit parameter of the test circuit.
As shown in figure 1, in the present embodiment, the test accessory 1 includes draw-in groove pinboard 12 more than a group and one group
Insertable controlled switch group plate 13.Because test circuit point at least has two-end-point, therefore, in the present embodiment many draw-in grooves turn
Fishplate bar 12 includes the pinboard of draw-in groove more than first 121 and the pinboard of draw-in groove more than second 122, and insertable controlled switch group plate 13 includes
Insert the first insertable controlled switch group plate 131 and the insertion draw-in groove more than second of the pinboard of draw-in groove more than first 121
Second insertable controlled switch group plate 132 of pinboard 122.
The center panel 11 that serial line interface is connected between a processor is used to receive the survey for coming from processor output
Instruction is tried, and understands test instruction to be issued.The test instruction includes the need test that the processor has been selected
The instruction transmission path that circuit parameter and the processor have been arranged.In the present embodiment, the processor adopts preset selection
Method choice needs the circuit parameter of test, for example, it is desired to the circuit parameter of test is resistance.In the present embodiment, in described
Heart panel 11 adopts single-chip microcomputer, and is provided with two groups of I2C communication interfaces.
The pinboard of draw-in groove more than first 121 and the pinboard of draw-in groove more than second 122 connect respectively with the center panel 11
Connect.In the present embodiment, in the pinboard of draw-in groove more than first 121 and the twin wire universal serial bus of the pinboard of draw-in groove more than second 122
Core piece and multiple draw-in grooves.Wherein, the twin wire universal serial bus transfer chip is used to that test will to be changed in the test instruction
Instruction data signal SDA and clock signal SCL, and the test instruction data signal SDA of transfer and clock signal SCL is amplified.
The multiple draw-in grooves being integrated on the twin wire universal serial bus transfer chip are used to transmit the test instruction data signal after transfer
And clock signal.In the present embodiment, the draw-in groove is additionally operable to transmit power supply signal, i.e. VCC, and ground signalling, i.e. GND.
Fig. 2 is referred to, structural representation of the insertable controlled switch group plate in an embodiment is shown as.Such as Fig. 2 institutes
Show, the first insertable controlled switch group plate 131 includes twin wire serial bus port extended chip 133 and relay group
134.In the same manner, the second insertable controlled switch group plate 132 also include twin wire serial bus port extended chip and after
Electrical equipment group.Wherein, with the 2-wire serial interface mode is inserted in many draw-in grooves turn to the twin wire serial bus port extended chip
On fishplate bar, the twin wire serial bus port extended chip be used for receive the test instruction data signal after the transfer and when
Sequential signal.In the present embodiment, several twin wire serial bus ports are provided with the insertable controlled switch group plate,
For example, it is provided with the twin wire serial bus port of 1-10 sequence numbers on the first insertable controlled switch group plate 131, second
The twin wire serial bus port of 11-20 sequence numbers, for example, the process are also equipped with insertable controlled switch group plate 132
The instruction transmission path that device has been arranged is draw-in groove pinboard 121- the first insertable controlled switch group plates of red table rod more than-the first
One end of 5 relays of twin wire serial bus port-the of the 5th sequence number on 131-test circuit point, black table rod more than-the second blocks
Twin wire serial bus port-the test of the 19th sequence number on groove pinboard 122- the second insertable controlled switch groups plate 132
The other end of circuit point.The relay group being connected with twin wire serial bus port extended chip is used for according to the test instruction
Data signal, clock signal and instruction transmission path promote electrical switch action in corresponding relay, by red table rod and black
Test circuit point in table rod insertion circuit under test 2.
Test accessory described in the present embodiment can automatically, it is continuous, quickly finish parametric test circuit, operation is held
Easily, and the circuit parameter of circuit board is accurately acquired, without the need for increasing auxiliary more when there is the parametric test circuit of time restriction
Circuit.
Embodiment two
The present embodiment provides a kind of automatic testing equipment 3, refers to Fig. 3, is shown as automatic testing equipment in an embodiment
In structural representation.As shown in figure 3, the automatic testing equipment 3 is applied to circuit under test 2, have in the circuit under test 2
Some test circuit points.With continued reference to Fig. 3, the automatic testing equipment 3 includes：Tester 31, processor 32 and test auxiliary
Equipment 1.
The tester 31 is used for the circuit parameter tested in the circuit under test.In the present embodiment, the tester
31 is the digital multimeter with Serial Communication Function.As shown in figure 3, the digital multimeter 31 includes red table rod 311, black
Table rod 312, serial ports 313.The red table rod 311 of the digital multimeter and Hei Biao rods 312 are inserted into respectively described test auxiliary
Many draw-in groove pinboards 12 described in equipment 1, i.e., red table rod 311 inserts the pinboard of draw-in groove more than first 121, and black table rod 312 is inserted
The pinboard of draw-in groove more than second 122.
The processor 32 is connected with the tester by serial line interface.In the present embodiment, the processor 32 exists
Before test, test circuit point is preset, select the circuit parameter that need to be tested, and transmission path is set, and by the need for having selected
The instruction transmission path that the circuit parameter of test and the processor have been arranged is packaged into test instruction, to export to the test
Auxiliary equipment 1；After the test accessory starts, the processor 32 is read described by the test accessory 1
The circuit parameter of test circuit point in circuit under test.In the present embodiment, the processor 32 adopts PC.
Described test accessory 2 is connected with the processor 32, and the test accessory 2 is used for subtest device
31 and processor 32 complete the test of circuit parameter.The test accessory 1 is as described by embodiment one, herein not
Repeat again.
In sum, test accessory described in the utility model, automatic testing equipment can by test accessory
With it is automatic, continuous, quickly finish parametric test circuit, processing ease, and accurately acquire the circuit parameter of circuit board, more
Auxiliary circuit need not be increased when there is the parametric test circuit of time restriction.So, this utility model effectively overcomes existing skill
Various shortcoming in art and have high industrial utilization.
Above-described embodiment only illustrative principle of the present utility model and its effect are new not for this practicality is limited
Type.Any person skilled in the art all can be carried out under without prejudice to spirit and the scope of the present utility model to above-described embodiment
Modifications and changes.Therefore, such as those of ordinary skill in the art without departing from the essence disclosed in this utility model
All equivalent modifications completed under god and technological thought or change, should be covered by claim of the present utility model.
Claims (9)
1. a kind of test accessory, it is characterised in that be connected with circuit under test, the test accessory includes：
Center panel, is issued for receiving the test instruction for coming from processor output, and understanding the test instruction；Institute
The instruction that stating test instruction includes that the circuit parameter and the processor of the need test that the processor has been selected have been arranged is passed
Defeated path；
The many draw-in groove pinboards of least one set, are connected with the center panel, for test instruction described in transfer；
Least one set insertable controlled switch group plate, inserts respectively in many draw-in groove pinboards and the circuit under test at least
On 1 test circuit point, to access the test instruction, start the test accessory, test the electricity of the test circuit point
LUSHEN number.
2. test accessory according to claim 1, it is characterised in that：The center panel and the processor it
Between by serial line interface connect.
3. test accessory according to claim 2, it is characterised in that：The center panel adopts monolithic movement
Piece.
4. test accessory according to claim 1, it is characterised in that：Many draw-in groove pinboards include：
Twin wire universal serial bus transfer chip, for test instruction data signal and sequential letter being changed in the test instruction
Number, and amplified；
Multiple draw-in grooves, are integrated on the twin wire universal serial bus transfer chip, for transmitting transfer after test director data
Signal and clock signal.
5. test accessory according to claim 1, it is characterised in that：The insertable controlled switch group plate bag
Include：
Twin wire serial bus port extended chip, with the 2-wire serial interface mode be inserted on many draw-in groove pinboards, be used for
Receive test instruction data signal and clock signal after the transfer；
Relay group, is connected with twin wire serial bus port extended chip, for according to it is described test instruction data signal, when
Sequential signal and instruction transmission path promote electrical switch action in corresponding relay, to insert test circuit point.
6. test accessory according to claim 1, it is characterised in that：The number of the insertable controlled switch group plate
Amount is determined by the quantity of the test circuit point in the circuit under test；And if being provided with the insertable controlled switch group plate
Dry twin wire serial bus port.
7. a kind of automatic testing equipment, it is characterised in that be applied to circuit under test, has some test electricity in the circuit under test
Waypoint, the automatic testing equipment includes：
Tester, for testing the circuit parameter of test circuit point in the circuit under test；
Processor, is connected with the tester, for output test instruction；
And be connected with the processor, the test accessory as any one of claim 1-6；
After the test accessory starts, the processor reads the test circuit point by the test accessory
Circuit parameter.
8. automatic testing equipment according to claim 7, it is characterised in that：The tester is with Serial Communication Function
Digital multimeter；The red table rod of the digital multimeter and Hei Biao rods are inserted into respectively many draw-in groove pinboards.
9. automatic testing equipment according to claim 8, it is characterised in that：The circuit parameter includes test circuit point
Resistance, electric current and, voltage, inductance, frequency, transistor and/or metal-oxide-semiconductor characteristic.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621103603.5U CN206132930U (en) | 2016-09-30 | 2016-09-30 | Test auxiliary assembly , try on clothes from dynamic testing and put |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621103603.5U CN206132930U (en) | 2016-09-30 | 2016-09-30 | Test auxiliary assembly , try on clothes from dynamic testing and put |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206132930U true CN206132930U (en) | 2017-04-26 |
Family
ID=58571978
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621103603.5U Active CN206132930U (en) | 2016-09-30 | 2016-09-30 | Test auxiliary assembly , try on clothes from dynamic testing and put |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206132930U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107462835A (en) * | 2017-08-21 | 2017-12-12 | 安徽中家智康科技有限公司 | A kind of card insert type one controls the test device of more frequency-changeable compressors |
| CN107526024A (en) * | 2017-08-17 | 2017-12-29 | 上海华岭集成电路技术股份有限公司 | One kind detection interface simplifies conversion equipment |
| CN107884695A (en) * | 2016-09-30 | 2018-04-06 | 达丰(上海)电脑有限公司 | A kind of test accessory, automatic test approach and device |
-
2016
- 2016-09-30 CN CN201621103603.5U patent/CN206132930U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107884695A (en) * | 2016-09-30 | 2018-04-06 | 达丰(上海)电脑有限公司 | A kind of test accessory, automatic test approach and device |
| CN107526024A (en) * | 2017-08-17 | 2017-12-29 | 上海华岭集成电路技术股份有限公司 | One kind detection interface simplifies conversion equipment |
| CN107526024B (en) * | 2017-08-17 | 2020-07-31 | 上海华岭集成电路技术股份有限公司 | Detection interface simplification conversion device |
| CN107462835A (en) * | 2017-08-21 | 2017-12-12 | 安徽中家智康科技有限公司 | A kind of card insert type one controls the test device of more frequency-changeable compressors |
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