CN107884695A - A kind of test accessory, automatic test approach and device - Google Patents
A kind of test accessory, automatic test approach and device Download PDFInfo
- Publication number
- CN107884695A CN107884695A CN201610875301.8A CN201610875301A CN107884695A CN 107884695 A CN107884695 A CN 107884695A CN 201610875301 A CN201610875301 A CN 201610875301A CN 107884695 A CN107884695 A CN 107884695A
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- 238000012360 testing method Methods 0.000 title claims abstract description 253
- 238000013459 approach Methods 0.000 title claims abstract description 16
- 238000012546 transfer Methods 0.000 claims abstract description 23
- 230000005540 biological transmission Effects 0.000 claims abstract description 15
- 210000003739 neck Anatomy 0.000 claims description 36
- 238000004891 communication Methods 0.000 claims description 5
- 230000005611 electricity Effects 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 claims description 4
- 230000000694 effects Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 206010015150 Erythema Diseases 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 238000010187 selection method Methods 0.000 description 1
- 230000011664 signaling Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The present invention provides a kind of test accessory, automatic test approach and device, and the test accessory includes：Center control panel, the test instruction of processor output is come from for receiving, and is understood test instruction and issued；The test instruction includes the instruction transmission path that the circuit parameter for the need test that the processor has selected and the processor have been set；At least one set of more neck pinboards, are connected with the center control panel, for testing instruction described in transfer；At least one set of insertable controlled switch group plate, insert respectively in more neck pinboards and the circuit under test at least on a test circuit point, instructed with accessing the test, start the test accessory, test the circuit parameter of the test circuit point.The present invention can automatically, it is continuous, quickly finish parametric test circuit, operation is easy, and accurately acquires the circuit parameter of circuit board, more need not increase auxiliary circuit in the parametric test circuit of having time limitation.
Description
Technical field
The invention belongs to circuit board manufacturing area, is related to a kind of auxiliary equipment, more particularly to a kind of test accessory,
Automatic test approach and device.
Background technology
Integrated circuit (IntegratedCircuit, IC) is a kind of microelectronic device, by using certain technique,
The elements such as transistor, diode, resistance, electric capacity and inductance required in one circuit and wiring are interconnected, made
On a fritter or a few fritter semiconductor wafers or dielectric substrate, it is then encapsulated in a shell, turns into required circuit
The microstructure of function.When carrying out parametric test circuit to electronic product, electricity usually is carried out to the integrated circuit of electronic product
Road parameter testing., it is necessary to each functional pin of integrated circuit be passed through integrated when carrying out parametric test circuit to integrated circuit
Adapter plate for circuit is connected to test device.And digital multimeter is exactly instrument indispensable when carrying out circuit test.With numeral
When universal meter is tested, the test point that the gear of digital table and mobile red-black table rod are tested to needs need to be manually selected repeatedly.Work as skill
When art reason needs continuously quick test, manual working is just difficult to complete.For example, working as needs to some circuit parameters on circuit board
When being tested, with digital table, parameter is tested one by one.Gear and the table rod position of digital table need to be adjusted repeatedly, and
Visually read record.When changing a piece of circuit board, said process is repeated.It is cumbersome, and easily error, and limited for having time
The parameter testing of system needs Design assistant circuit.
Therefore, a kind of test accessory, automatic test approach and device how are provided, to solve prior art to collection
When carrying out continuous quick parametric test circuit into circuit board, manual working is difficult to complete, is cumbersome, and easily error etc. lacks
Fall into, it is real to have turned into practitioner in the art's technical problem urgently to be resolved hurrily.
The content of the invention
In view of the above the shortcomings that prior art, it is an object of the invention to provide a kind of test accessory, automatically
Method of testing and device, for solving in the prior art when carrying out continuous quick parametric test circuit to surface-mounted integrated circuit,
Manual working is difficult to complete, is cumbersome, the problem of easily error.
In order to achieve the above objects and other related objects, one aspect of the present invention provides a kind of test accessory, and to be measured
Circuit connects, and the test accessory includes：Center control panel, the test instruction of processor output is come from for receiving,
And understand test instruction and issued；The test instruction includes the circuit parameter for the need test that the processor has selected
And the instruction transmission path that the processor has been set；At least one set of more neck pinboards, are connected with the center control panel, use
Instructed in being tested described in transfer；At least one set of insertable controlled switch group plate, more neck pinboards and institute are inserted respectively
At least test circuit point in circuit under test is stated, is instructed with accessing the test, is started the test accessory, test institute
State the circuit parameter of test circuit point.
In one embodiment of the invention, connected between the center control panel and the processor by serial line interface.
In one embodiment of the invention, the center control panel uses singlechip chip.
In one embodiment of the invention, more neck pinboards include：Twin wire universal serial bus transfer chip, is used for
Test instruction data signal and clock signal will be changed into the test instruction, and amplified；Multiple necks, it is integrated in described
On twin wire universal serial bus transfer chip, for transmitting test instruction data signal and clock signal after transfer.
In one embodiment of the invention, the insertable controlled switch group plate includes：Twin wire serial bus port
Extended chip, with the 2-wire serial interface mode be inserted on more neck pinboards, refer to for receiving the test after the transfer
Make data-signal and clock signal；Relay group, it is connected with twin wire serial bus port extended chip, for according to the survey
Try instruction data signal, clock signal and instruct electronic switch in relay corresponding to transmission path promotion to act, surveyed with inserting
Try circuit point.
In one embodiment of the invention, the quantity of the insertable controlled switch group plate is by the circuit under test
The quantity of test circuit point determines；And several twin wire universal serial bus ends are provided with the insertable controlled switch group plate
Mouthful.
Another aspect of the present invention provides a kind of automatic testing equipment, applied to circuit under test, has in the circuit under test
Some test circuit points, the automatic testing equipment include：Tester, for testing test circuit point in the circuit under test
Circuit parameter；Processor, it is connected with the tester, for exporting test instruction；And be connected with the processor, it is described
Test accessory；After the test accessory starts, the processor passes through described in test accessory reading
The circuit parameter of test circuit point.
In one embodiment of the invention, the tester is the digital multimeter with Serial Communication Function；The number
Red the table rod and Hei Biao rods of word universal meter are inserted into more neck pinboards respectively.
In one embodiment of the invention, frequency, transistor and the metal-oxide-semiconductor that the circuit parameter includes test circuit point are special
Property.
Another aspect of the invention provides a kind of automatic test approach, applied to circuit under test, has in the circuit under test
Some test circuit points, the automatic test approach comprise the following steps：Test instruction is received, and understands the test and instructs it
Issue；The circuit parameter for the need test that the test instruction includes having selected and the instruction transmission path set；Transfer institute
State test instruction；Instructed according to the test after transfer, test the circuit parameter of the test circuit point
As described above, test accessory, automatic test approach and the device of the present invention, have the advantages that：
Test accessory, automatic test approach and device of the present invention by test accessory can automatically,
Continuously, parametric test circuit is quickly finished, operation is easy, and accurately acquires the circuit parameter of circuit board, more sometimes
Between limit parametric test circuit when need not increase auxiliary circuit.
Brief description of the drawings
Fig. 1 is shown as structural representation of the test accessory of the present invention in an embodiment.
Fig. 2 is shown as structure of the insertable controlled switch group plate in an embodiment in the test accessory of the present invention
Schematic diagram.
Fig. 3 is shown as structural representation of the automatic testing equipment of the present invention in an embodiment.
Fig. 4 is shown as schematic flow sheet of the self testing method of the present invention in an embodiment.
Component label instructions
1 test accessory
11 center control panels
Neck pinboard more than 12
13 insertable controlled switch group plates
Neck pinboard more than 121 first
Neck pinboard more than 122 second
131 first insertable controlled switch group plates
132 second insertable controlled switch group plates
2 circuit under test
3 automatic testing equipments
31 testers
32 processors
311 red table rods
312 black table rods
313 serial ports
S1~S4 steps
Embodiment
Embodiments of the present invention are illustrated by particular specific embodiment below, those skilled in the art can be by this explanation
Content disclosed by book understands other advantages and effect of the present invention easily.
Fig. 1 is referred to Fig. 4.It should be clear that structure, ratio, size depicted in this specification institute accompanying drawings etc., only to
Coordinate the content disclosed in specification, so that those skilled in the art understands and reads, being not limited to the present invention can be real
The qualifications applied, therefore do not have technical essential meaning, the tune of the modification of any structure, the change of proportionate relationship or size
It is whole, in the case where not influenceing the effect of present invention can be generated and the purpose that can reach, all should still fall in disclosed skill
Art content is obtained in the range of covering.Meanwhile in this specification it is cited as " on ", " under ", "left", "right", " centre " and
The term of " one " etc., understanding for narration is merely convenient to, and is not used to limit the enforceable scope of the present invention, its relativeness
It is altered or modified, in the case where changing technology contents without essence, when being also considered as the enforceable category of the present invention.
Embodiment one
The present embodiment provides a kind of test accessory, is connected with circuit under test, the test accessory includes：
Center control panel, the test instruction of processor output is come from for receiving, and understands test instruction by under it
Hair；The test instruction includes the finger that the circuit parameter for the need test that the processor has selected and the processor have been set
Make transmission path；
At least one set of more neck pinboards, are connected with the center control panel, for testing instruction described in transfer；
At least one set of insertable controlled switch group plate, is inserted in more neck pinboards and the circuit under test respectively
At least on a test circuit point, instructed with accessing the test, start the test accessory, test the test circuit point
Circuit parameter.
The test accessory provided below with reference to diagram the present embodiment is described in detail.It is referring to Fig. 1, aobvious
It is shown as structural representation of the test accessory in an embodiment.The test accessory 1 is used for subtest device and place
Manage the test that device completes circuit parameter.In the present embodiment, the tester is the digital multimeter with Serial Communication Function.
The processor is PC.The test accessory 1 include center control panel 11, at least one set of more neck pinboards 12 and
At least one set of insertable controlled switch group plate 13.The quantity of the insertable controlled switch group plate 13 is by the circuit under test
On test circuit point quantity determine, test circuit point enormous amount even in circuit under test, set multigroup insertable by
Control switches set plate 13 inserts more neck pinboards 12.For example, there are 10 test circuit points in the circuit under test.By this implementation
Red the table rod and Hei Biao rods of digital multimeter are connected to the both ends of test circuit point to test by the test accessory 1 described in example
The circuit parameter of the test circuit.The resistance of the circuit parameter including test circuit point, electric current and, voltage, inductance, frequency,
Transistor and/or metal-oxide-semiconductor characteristic etc..
As shown in figure 1, in the present embodiment, the test accessory 1 includes neck pinboard 12 more than one group and one group
Insertable controlled switch group plate 13.Because test circuit point at least has two-end-point, therefore, more necks turn in the present embodiment
Fishplate bar 12 includes the pinboard of neck more than first 121 and the pinboard of neck more than second 122, and insertable controlled switch group plate 13 includes
Insert the first insertable controlled switch group plate 131 of the pinboard of neck more than first 121 and insert the neck more than second
Second insertable controlled switch group plate 132 of pinboard 122.
The center control panel 11 that serial line interface is connected between a processor is used to receive the survey for coming from processor output
Examination instruction, and understand test instruction and issued.The test instruction includes the need test that the processor has selected
The instruction transmission path that circuit parameter and the processor have been set.In the present embodiment, the processor uses preset selection
Method choice needs the circuit parameter tested, for example, it is desired to which the circuit parameter of test is resistance.In the present embodiment, in described
Heart control panel 11 uses single-chip microcomputer, and is provided with two groups of I2C communication interfaces.
The pinboard of neck more than first 121 and the pinboard of neck more than second 122 connect with the center control panel 11 respectively
Connect.In the present embodiment, in the pinboard of neck more than first 121 and the pinboard of neck more than second 122 the twin wire universal serial bus
Core piece and multiple necks.Wherein, the twin wire universal serial bus transfer chip is used to that test will to be changed into the test instruction
Instruction data signal SDA and clock signal SCL, and the test instruction data signal SDA of transfer and clock signal SCL is amplified.
The multiple necks being integrated on the twin wire universal serial bus transfer chip are used to transmit the test instruction data signal after transfer
And clock signal.In the present embodiment, the neck is additionally operable to transmit power supply signal, i.e. VCC, and ground signalling, i.e. GND.
Referring to Fig. 2, it is shown as structural representation of the insertable controlled switch group plate in an embodiment.Such as Fig. 2 institutes
Show, the first insertable controlled switch group plate 131 includes twin wire serial bus port extended chip 133 and relay group
134.Similarly, the second insertable controlled switch group plate 132 also include twin wire serial bus port extended chip and after
Electrical equipment group.
Wherein, serial interface mode is inserted in more necks turn to the twin wire serial bus port extended chip with the 2-wire
On fishplate bar, the twin wire serial bus port extended chip be used to receiving the test instruction data signal after the transfer and when
Sequential signal.In the present embodiment, several twin wire serial bus ports are provided with the insertable controlled switch group plate,
For example, the twin wire serial bus port of 1-10 sequence numbers is provided with the first insertable controlled switch group plate 131, second
The twin wire serial bus port of 11-20 sequence numbers is also equipped with insertable controlled switch group plate 132, for example, the processing
The instruction transmission path that device has been set is red neck pinboard 121- the first insertable controlled switch group plates of table rod more than-the first
One end of 5 relays of twin wire serial bus port-the of the 5th sequence number on 131-test circuit point, black table rod more than-the second block
Twin wire serial bus port-test of the 19th sequence number on groove pinboard 122- the second insertable controlled switch groups plate 132
The other end of circuit point.The relay group being connected with twin wire serial bus port extended chip is used to be instructed according to the test
Data-signal, clock signal and instruction transmission path promote corresponding in relay electronic switch act, by red table rod and black
Test circuit point in table rod insertion circuit under test 2.
Test accessory described in the present embodiment can automatically, it is continuous, quickly finish parametric test circuit, operation is held
Easily, and the circuit parameter of circuit board is accurately acquired, more in the parametric test circuit of having time limitation without increasing auxiliary
Circuit.
Embodiment two
The present embodiment provides a kind of automatic testing equipment 3, referring to Fig. 3, being shown as automatic testing equipment in an embodiment
In structural representation.As shown in figure 3, the automatic testing equipment 3 is applied to circuit under test 2, have in the circuit under test 2
Some test circuit points.With continued reference to Fig. 3, the automatic testing equipment 3 includes：Tester 31, processor 32 and test auxiliary
Equipment 1.
The tester 31 is used for the circuit parameter tested in the circuit under test.In the present embodiment, the tester
31 be for the digital multimeter with Serial Communication Function.As shown in figure 3, the digital multimeter 31 includes red table rod 311, black
Table rod 312, serial ports 313.Red the table rod 311 and Hei Biao rods 312 of the digital multimeter are inserted into described test auxiliary respectively
More neck pinboards 12 described in equipment 1, i.e., red table rod 311 insert the pinboard of neck more than first 121, and black table rod 312 inserts
The pinboard of neck more than second 122.
The processor 32 is connected with the tester by serial line interface.In the present embodiment, the processor 32 exists
Before test, test circuit point is preset, selects the circuit parameter that need to be tested, and transmission path is set, and the need that will have been selected
The instruction transmission path that the circuit parameter of test and the processor have been set is packaged into test instruction, with output to the test
Auxiliary equipment 1；After the test accessory starts, the processor 32 is read described by the test accessory 1
The circuit parameter of test circuit point in circuit under test.In the present embodiment, the processor 32 uses PC.
Described test accessory 2 is connected with the processor 32, and the test accessory 2 is used for subtest device
31 and processor 32 complete circuit parameter test.The test accessory 1 is as described by embodiment one, herein not
Repeat again.
Automatic testing equipment described in the present embodiment by test accessory can automatically, it is continuous, quickly finish electricity
Road parameter testing, operation is easy, and accurately acquires the circuit parameter of circuit board, is more surveyed in the circuit parameter of having time limitation
Auxiliary circuit need not be increased during examination.
Embodiment three
The present embodiment provides a kind of automatic test approach, and the automatic test approach is applied to circuit under test, described to be measured
There are some test circuit points on circuit.The automatic test approach by the automatic testing equipment 3 described in embodiment two come
Operation.The automatic testing equipment includes：Tester, processor and test accessory.
Referring to Fig. 4, it is shown as schematic flow sheet of the automatic test approach in an embodiment.As shown in figure 4, it is described from
Dynamic method of testing comprises the following steps：
S1, the output writer instruction.In the present embodiment, the processor before testing, presets survey
Circuit point is tried, selects the circuit parameter that need to be tested, and transmission path is set, and the circuit parameter that the need selected are tested and institute
State the instruction transmission path that processor has been set and be packaged into test instruction, with output to the test accessory.The test
Instruction includes the instruction transmission path that the circuit parameter for the need test that the processor has selected and the processor have been set.
S2, the test accessory receive test instruction, and understand test instruction and issued, test described in transfer
Instruction；Instructed according to the test after transfer, make the tester test the circuit parameter of the test circuit point.
S3, the processor read the survey after test accessory starts, by the test accessory
The circuit parameter of circuit point is tried, and the circuit parameter of the test circuit read point is recorded.
In summary, test accessory of the present invention, automatic test approach and device pass through test accessory
Can automatically, it is continuous, quickly finish parametric test circuit, operation is easy, and accurately acquires the circuit parameter of circuit board,
More auxiliary circuit need not be increased in the parametric test circuit of having time limitation.So the present invention effectively overcomes prior art
In various shortcoming and have high industrial utilization.
The above-described embodiments merely illustrate the principles and effects of the present invention, not for the limitation present invention.It is any ripe
Know the personage of this technology all can carry out modifications and changes under the spirit and scope without prejudice to the present invention to above-described embodiment.Cause
This, those of ordinary skill in the art is complete without departing from disclosed spirit and institute under technological thought such as
Into all equivalent modifications or change, should by the present invention claim be covered.
Claims (10)
1. a kind of test accessory, it is characterised in that be connected with circuit under test, the test accessory includes：
Center control panel, the test instruction of processor output is come from for receiving, and is understood test instruction and issued；Institute
Stating test instruction includes the instruction biography that the circuit parameter for the need test that the processor has selected and the processor have been set
Defeated path；
At least one set of more neck pinboards, are connected with the center control panel, for testing instruction described in transfer；
At least one set of insertable controlled switch group plate, is inserted in more neck pinboards and the circuit under test extremely respectively
A few test circuit point, instructed with accessing the test, start the test accessory, test the electricity of the test circuit point
Road parameter.
2. test accessory according to claim 1, it is characterised in that：The center control panel and the processor it
Between connected by serial line interface.
3. test accessory according to claim 2, it is characterised in that：The center control panel uses monolithic movement
Piece.
4. test accessory according to claim 1, it is characterised in that：More neck pinboards include：
Twin wire universal serial bus transfer chip, for test instruction data signal and sequential letter will to be changed into the test instruction
Number, and amplified；
Multiple necks, it is integrated on the twin wire universal serial bus transfer chip, for transmitting the test director data after transfer
Signal and clock signal.
5. test accessory according to claim 1, it is characterised in that：The insertable controlled switch group plate bag
Include：
Twin wire serial bus port extended chip, with the 2-wire serial interface mode be inserted on more neck pinboards, be used for
Receive test instruction data signal and clock signal after the transfer；
Relay group, be connected with twin wire serial bus port extended chip, for according to it is described test instruction data signal, when
Electronic switch acts in relay corresponding to sequential signal and instruction transmission path promotion, to insert test circuit point.
6. test accessory according to claim 1, it is characterised in that：The number of the insertable controlled switch group plate
Amount is determined by the quantity of the test circuit point in the circuit under test；And if it is provided with the insertable controlled switch group plate
Dry twin wire serial bus port.
7. a kind of automatic testing equipment, it is characterised in that there are some test electricity applied to circuit under test, in the circuit under test
Waypoint, the automatic testing equipment include：
Tester, for testing the circuit parameter of test circuit point in the circuit under test；
Processor, it is connected with the tester, for exporting test instruction；
And be connected with the processor, such as the test accessory any one of claim 1-6；
After the test accessory starts, the processor reads the test circuit point by the test accessory
Circuit parameter.
8. automatic testing equipment according to claim 7, it is characterised in that：The tester is with Serial Communication Function
Digital multimeter；Red the table rod and Hei Biao rods of the digital multimeter are inserted into more neck pinboards respectively.
9. automatic testing equipment according to claim 8, it is characterised in that：The circuit parameter includes test circuit point
Resistance, electric current, voltage, inductance, frequency, transistor and/or metal-oxide-semiconductor characteristic.
A kind of 10. automatic test approach, it is characterised in that：Applied to circuit under test, there are some tests in the circuit under test
Circuit point, the automatic test approach comprise the following steps：
Test instruction is received, and understands test instruction and is issued；The test instruction includes the need test selected
Circuit parameter and the instruction transmission path set；
Instruction is tested described in transfer；
Instructed according to the test after transfer, test the circuit parameter of the test circuit point.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610875301.8A CN107884695A (en) | 2016-09-30 | 2016-09-30 | A kind of test accessory, automatic test approach and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610875301.8A CN107884695A (en) | 2016-09-30 | 2016-09-30 | A kind of test accessory, automatic test approach and device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107884695A true CN107884695A (en) | 2018-04-06 |
Family
ID=61769230
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610875301.8A Pending CN107884695A (en) | 2016-09-30 | 2016-09-30 | A kind of test accessory, automatic test approach and device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107884695A (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101435841A (en) * | 2007-11-16 | 2009-05-20 | 鸿富锦精密工业（深圳）有限公司 | Test system and method |
| CN102970086A (en) * | 2012-11-26 | 2013-03-13 | 惠州Tcl移动通信有限公司 | Device, system and method for switching testing signal channel |
| CN206132930U (en) * | 2016-09-30 | 2017-04-26 | 达丰(上海)电脑有限公司 | Test auxiliary assembly , try on clothes from dynamic testing and put |
-
2016
- 2016-09-30 CN CN201610875301.8A patent/CN107884695A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101435841A (en) * | 2007-11-16 | 2009-05-20 | 鸿富锦精密工业（深圳）有限公司 | Test system and method |
| CN102970086A (en) * | 2012-11-26 | 2013-03-13 | 惠州Tcl移动通信有限公司 | Device, system and method for switching testing signal channel |
| CN206132930U (en) * | 2016-09-30 | 2017-04-26 | 达丰(上海)电脑有限公司 | Test auxiliary assembly , try on clothes from dynamic testing and put |
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