CN205643625U - Mainboard testing component - Google Patents
Mainboard testing component Download PDFInfo
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- CN205643625U CN205643625U CN201620268014.6U CN201620268014U CN205643625U CN 205643625 U CN205643625 U CN 205643625U CN 201620268014 U CN201620268014 U CN 201620268014U CN 205643625 U CN205643625 U CN 205643625U
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- Prior art keywords
- mainboard
- holding wire
- test
- measured
- test suite
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Abstract
The utility model relates to the field of electronic technology, a mainboard testing component is disclosed. The utility model is used for test the performance of the cassette of mainboard that awaits measuring, mainboard testing component contains: keysets, master control equipment, multifunctional instrument and be used for installing the simulation card in the cassette, the keysets contains first switching portion, the one end of first switching portion is connected in multifunctional instrument, and the other end is connected in the simulation card, master control equipment connects in multifunctional instrument, master control equipment still is used for being connected to the mainboard that awaits measuring. The utility model discloses make the test of the performance of cassette become simple relatively, convenient, efficient and the commonality is strong.
Description
Technical field
This utility model relates to electronic technology field, particularly to a kind of mainboard test suite.
Background technology
At present, in 2.3.4G mobile terminal, by installing SIM (Subscriber Identity Module
Client identification module) realize communication function；SIM is connected by SIM card holder and motherboard circuit, wherein,
SIM card holder is welded or is assemblied on mainboard, is used for fixing SIM and providing SIM and other circuit
Between circuit connect, if the connection between SIM card holder and mainboard is broken down, then mobile eventually
End will appear from communication failure, so the performance of SIM card holder will be entered before mobile device is dispatched from the factory by producer
Go strict test to guarantee quality.
SIM is connected by signal with mainboard, and one signal interruption of any of which all can cause SIM
Afunction, but the existing test to SIM card holder Yu mainboard connection state, do not have special substantially
Test suite, but by manually SIM card holder being carried out performance test；That is, SIM is inserted SIM
After in deck, the baseband chip of detection SIM and mobile device whether can proper communication, if can
Proper communication then shows to be connected between SIM card holder with mainboard well；If can not proper communication, then need
Artificial test each signal pin one by one finds out non-working port, then carries out perfect performance.
But, simV pin, simRST pin and the simGND in the SIM card holder having in reality
In pin with the presence of one or more pins connect specific fault time (such as surface oxidation, greasy dirt, depression etc.
The contact resistance caused increases), it is also possible that be capable of the positive normal open of SIM and baseband chip
Letter, but this fault constantly can deteriorate along with the use of product, and ultimately resulting in cannot normal read data；
So the test to the performance of deck takes manual testing's accuracy rate the highest.It addition, manual testing is not only
Cost is high, and testing efficiency is low.
Utility model content
The purpose of this utility model is to provide a kind of mainboard test suite so that the test of the performance of deck
Becoming relatively easy, convenient, efficiency is high, highly versatile.
For solving above-mentioned technical problem, embodiment of the present utility model provides a kind of mainboard test group
Part, for testing the performance of the deck of mainboard to be measured；Mainboard test suite comprises: keyset, master control set
Standby, multifunction instrument and for the analog card being arranged in deck；Keyset comprises the first switching part；
One end of first switching part is connected to multifunction instrument, and the other end is connected to analog card；Main control device connects
In multifunction instrument；Main control device is additionally operable to be connected to mainboard to be measured.
This utility model embodiment in terms of existing technologies, by arranging analog card, keyset etc.
Structural member, whole test suite simple in construction, make the test of the performance of deck also become relatively easy, side
Just, highly versatile, dispatches from the factory in test large batch of, utilizes this professional test assembly, reduce people
Power cost, improves testing efficiency.
It addition, analog card comprises card body and the flexible circuit board extended out by card body；Card body
It is connected to the first switching part by flexible circuit board.
It addition, the first switching part comprises the first holding wire and at least one secondary signal line；First holding wire
One end is connected to the card earth terminal of analog card, and the other end is connected to a Data Detection of multifunction instrument
End；One end of secondary signal line is connected to the data signal end of analog card, and the other end is connected to multi-functional instrument
Another Data Detection end of table.
It addition, keyset also comprises at least one pair of earth resistance；Resistance to earth is connected to the two of secondary signal line
Between end；Resistance to earth is set at secondary signal line two ends so that measurement result is more accurate.
It addition, keyset also comprises the second switching part；Second switching part includes at least the 3rd holding wire；The
One end of three holding wires is connected to the instrument earth polar of multifunction instrument, and the other end is used for being connected to mainboard to be measured
Mainboard earth terminal.
It addition, the second switching part also comprises the 4th holding wire；One end of 4th holding wire is connected to multi-functional
The positive source of instrument, the other end is for being connected to survey the motherboard power supply end of mainboard.
It addition, mainboard test suite also comprises: for carrying the load bearing seat and movably of mainboard to be measured
It is arranged at the test needle plate of load bearing seat；Test needle plate comprises two test probes；Two test probes are respectively
It is connected to the 3rd holding wire and the 4th holding wire；Wherein, one end of the 3rd holding wire and the 4th holding wire is divided
Mainboard earth terminal and the motherboard power supply end of mainboard to be measured it is not connected to by two test probes.By carrying
Seat and the combination of test needle plate, facilitate mainboard to be measured and the connection of the second switching part, improve automatization
Degree, improves testing efficiency.
It addition, keyset also comprises switch；Switch is connected between the 3rd holding wire and the first holding wire；
Switch is also attached to main control device.Keyset arranges switch, when fault occurs in card ground connection end, makes clamping
Ground end is connected with mainboard earth terminal by switch, it is ensured that the data signal end of analog card can continue to pass through
Multifunctional meter is accurately measured.
It addition, deck is client identification module SIM card holder or flash memory T deck.This practicality
Novel both decks all can be done performance test, highly versatile.
It addition, main control device comprises general-purpose serial bus USB connectivity port, main control device passes through USB
Connectivity port is connected to mainboard to be measured.By USB interface, facilitate main control device to mainboard to be measured
Control.
Accompanying drawing explanation
Fig. 1 is the mainboard test suite schematic diagram according to the first embodiment；
Fig. 2 is the mainboard test suite schematic diagram according to the second embodiment.
Detailed description of the invention
For making the purpose of this utility model, technical scheme and advantage clearer, below in conjunction with accompanying drawing pair
Each embodiment of the present utility model is explained in detail.But, those of ordinary skill in the art can
To understand, in each embodiment of this utility model, in order to make reader be more fully understood that, the application proposes
Many ins and outs.But, even if there is no these ins and outs and kind based on following embodiment
Plant and change and modifications, it is also possible to realize the application each claim technical scheme required for protection.
First embodiment of the present utility model relates to a kind of mainboard test suite, is used for testing mainboard to be measured
The performance of deck；In present embodiment, with SIM, (Subscriber Identity Module client identifies
Module) illustrate as a example by deck, deck can also be for the deck of flash memory T card, so this enforcement
This is not intended to be limited in any by mode；As it is shown in figure 1, mainboard test suite comprises: keyset 4, master control
Equipment 5, multifunction instrument 6 and for the analog card 2 that is arranged in deck.
In present embodiment, analog card 2 is the analog card of SMT card, analog card 2 comprise card body with
And the flexible circuit board 3 extended out by card body.Card body and real SIM size, thickness,
The aspect such as shape, signal end is completely the same.That one end extended out by card body of flexible circuit board 3
Be close to card body, in order to in the deck that card body is together installed to mainboard 1 to be measured；Flexible circuit
The other end of plate 3 is connected to keyset 4.Wherein, each signal lead in flexible circuit board 3 is the most right
Should be in each signal end in card body.
In present embodiment, keyset comprises the first switching part, and one end of the first switching part is connected to soft
Circuit board 3；The other end is connected to multifunction instrument 6.Specifically, the first switching part comprises the first letter
Number line L1 and at least one secondary signal line L2；One end of first holding wire L1 is connected to analog card 2
Card earth terminal GND1, the other end is connected to a data test side D1 of multifunction instrument 6.Second
One end of holding wire L2 is connected to data signal end S1 of analog card 2, and the other end is connected to multi-functional instrument
Another Data Detection end D2 of table 6.Wherein, the number of secondary signal line L2 and the number of analog card 2
Consistent according to signal end port number.Such as, in present embodiment, SIM (analog card 2) has four
Data signal end, therefore the number of secondary signal line L2 is four.
It is also preferred that the left keyset 4 also comprises at least one pair of earth resistance (not shown)；Resistance to earth is connected to
Between the two ends of secondary signal line L2.Concrete, the number of resistance to earth is with secondary signal line L2's
Number is consistent, i.e. connecting between the two ends of each secondary signal line L2 has a resistance to earth.Separately
Outward, the earth impedance of the resistance value data signal end each with true SIM respectively of this resistance to earth is set
Unanimously so that measurement result is more accurate.
It addition, keyset 4 also comprises power switching line L0, one end of power switching line L0 is used for connecting
To 1 motherboard power supply end V0 of mainboard to be measured, the other end is connected with voltage source.In the present embodiment,
The other end of power switching line is connected to the positive source V1 of multifunction instrument 6.That is, multifunction instrument
6 substantially comprise power module and detection module.When tested, power module is used for as mainboard 1 to be measured
Power supply, detection module is for detecting with each data signal end the card earth terminal GND1 of analog card 2.
So, when mainboard 1 to be measured is tested, facilitate main control device 5 that it is carried out overall control.
It should be noted that in the present embodiment, the number of multiple Data Detection ends that multifunction instrument 6 comprises
Mesh disclosure satisfy that the sum of the first holding wire L1 and secondary signal line L2, and the most each Data Detection end is respectively
It is connected to each signal line end of keyset 4 first switching part, therefore present embodiment uses merit more than
Instrument 6 can realize the test to SIM deck；But, at the deck of test other types card
Performance when, if the number of the Data Detection end of multifunction instrument 6 less than the first holding wire L1 with
The sum of secondary signal line L2, then can combine realization test by multiple multifunction instruments 6；Or
Person, it is also possible to many holding wires in keyset 4 are shared multifunction instrument by the switching of additional switch
Each signal line end is measured in one data test side of 6.
In present embodiment, the control end I/O (I/O for example, usb connecting port) of main control device 5 is even
It is connected to the control end I/O of multifunction instrument 6；And main control device 5 comprises usb connecting port, master control
Equipment 5 is connected to mainboard 1 to be measured by usb connecting port；Certainly can also with other communication modes,
Here the communication mode between main control device 5 and mainboard to be measured 1 is not done any restriction, can be as required
Arrange voluntarily.
This utility model in terms of existing technologies, by arranging the simulation consistent with true SIM
Card 2, utilizes keyset 4 that multifunction instrument 6 connects analog card 2 and mainboard 1 to be measured, and utilizes master
Control equipment 5 controls multifunction instrument 6 and mainboard 1 to be measured, whole test suite simple in construction, utilization side
Just, dispatch from the factory in test large batch of, utilize this professional test assembly, reduce human cost, carry
High testing efficiency.
Second embodiment of the present utility model relates to a kind of mainboard test suite.Second embodiment is
Make improvements on the basis of one embodiment, mainly the improvement is that: as in figure 2 it is shown, in this practicality
In the second novel embodiment, keyset 4 also comprises the second switching part, switch K.
Second switching part comprises the 3rd holding wire L3, and one end of the 3rd holding wire L3 is connected to multi-functional instrument
The instrument earth polar GND2 of table 6, the other end is connected to the mainboard earth terminal GND0 of mainboard 1 to be measured.Open
Close K to be connected between the 3rd holding wire L3 and the first holding wire L1, it is also preferred that the left switch K is also connected with
In main control device 5 to be controlled by main control device 5.
In present embodiment, the second switching part also comprises the 4th holding wire；In substantial, this enforcement
The power switching line L0 that the 4th holding wire in mode is in the first embodiment；That is, power supply is turned
Wiring L0 is incorporated in the second switching part；That is, one end of power switching line L0 (the i.e. the 4th holding wire)
For being connected to the motherboard power supply end V0 of mainboard 1 to be measured, the other end is used for being connected to multifunction instrument 6
Positive source V1.
In present embodiment, mainboard test suite also comprises load bearing seat and test needle plate (not shown)；Hold
Carrying seat to be used for carrying mainboard 1 to be measured, test needle plate is movably arranged at load bearing seat and comprises for contacting
The test probe of motherboard power supply end V0 and the test probe for contacting mainboard earth terminal GND0.That is,
During test, as long as test needle plate is moved to predeterminated position, can make two test probes respectively with master
Plate earthing end GND0, motherboard power supply end V0 contact；So that the instrument ground of multifunction instrument 6
Pole GND2, positive source V1 are respectively by the 3rd holding wire L3 of the second switching part, power switching line
The mainboard earth terminal GND0 of L0 (the i.e. the 4th holding wire) and mainboard 1 to be measured, motherboard power supply end V0 phase
Connect.Therefore, by the combination of load bearing seat Yu test needle plate, facilitate mainboard 1 to be measured and keyset 4
Connection, improve automaticity, improve testing efficiency.
In test process, when detecting, malunion between card earth terminal GND1 and mainboard to be measured 1 is normal
In the case of, main control device 5 controls switch K Guan Bi, by the first holding wire L1 and the 3rd holding wire L3
Connection, to realize the connection of card earth terminal GND1 and mainboard earth terminal GND0.Thus, it is ensured that
The data signal end of analog card 2 can continue to accurately be measured by multifunction instrument 6.
It will be understood by those skilled in the art that the respective embodiments described above be realize of the present utility model
Specific embodiment, and in actual applications, can to it, various changes can be made in the form and details, and
Without departing from spirit and scope of the present utility model.
Claims (10)
1. a mainboard test suite, it is characterised in that for testing the performance of the deck of mainboard to be measured；
Described mainboard test suite comprises: keyset, main control device, multifunction instrument and be used for being arranged on institute
State the analog card in deck；
Described keyset comprises the first switching part；One end of described first switching part is connected to described multi-functional
Instrument, the other end is connected to described analog card；
Described main control device is connected to described multifunction instrument；Described main control device is additionally operable to be connected to described
Mainboard to be measured.
Mainboard test suite the most according to claim 1, it is characterised in that described analog card bag
Containing card body and the flexible circuit board that extended out by described card body；
Described card body is connected to described first switching part by described flexible circuit board.
Mainboard test suite the most according to claim 1, it is characterised in that described first switching
Portion comprises the first holding wire and at least one secondary signal line；
One end of described first holding wire is connected to the card earth terminal of described analog card, and the other end is connected to institute
State a data test side of multifunction instrument；
One end of described secondary signal line is connected to the data signal end of described analog card, and the other end is connected to
Another Data Detection end of described multifunction instrument.
Mainboard test suite the most according to claim 3, it is characterised in that described keyset is also
Comprise at least one pair of earth resistance；Described resistance to earth is connected between the two ends of described secondary signal line.
Mainboard test suite the most according to claim 1, it is characterised in that described keyset is also
Comprise the second switching part；Described second switching part includes at least the 3rd holding wire；
One end of described 3rd holding wire is connected to the instrument earth polar of described multifunction instrument, and the other end is used for
It is connected to the mainboard earth terminal of described mainboard to be measured.
Mainboard test suite the most according to claim 5, it is characterised in that described second switching
Portion also comprises the 4th holding wire；
One end of described 4th holding wire is connected to the positive source of described multifunction instrument, and the other end is used for
It is connected to the motherboard power supply end of described mainboard to be measured.
Mainboard test suite the most according to claim 6, it is characterised in that described mainboard is tested
Assembly also comprises: for carrying the load bearing seat of described mainboard to be measured and being movably arranged at described carrying
The test needle plate of seat；
Described test needle plate comprises two test probes；Said two test probe is connected to described the
Three holding wires and described 4th holding wire；
Wherein, described 3rd holding wire is tested by said two respectively with one end of described 4th holding wire
Probe is connected to the described mainboard earth terminal of described mainboard to be measured and described motherboard power supply end.
Mainboard test suite the most according to claim 5, it is characterised in that described keyset is also
Comprise switch；Described switch is connected between described 3rd holding wire and described first holding wire；Described open
Pass is also attached to described main control device.
Mainboard test suite the most according to claim 1, it is characterised in that described deck is visitor
Family identification module SIM card holder or flash memory T deck.
Mainboard test suite the most according to claim 1, it is characterised in that described main control device
Comprising general-purpose serial bus USB connectivity port, described main control device is by described usb connecting port even
It is connected to described mainboard to be measured.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620268014.6U CN205643625U (en) | 2016-03-31 | 2016-03-31 | Mainboard testing component |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620268014.6U CN205643625U (en) | 2016-03-31 | 2016-03-31 | Mainboard testing component |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205643625U true CN205643625U (en) | 2016-10-12 |
Family
ID=57066052
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620268014.6U Expired - Fee Related CN205643625U (en) | 2016-03-31 | 2016-03-31 | Mainboard testing component |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205643625U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108093118A (en) * | 2017-11-23 | 2018-05-29 | 广东欧珀移动通信有限公司 | The test method of device, test device and computer readable storage medium on mainboard |
-
2016
- 2016-03-31 CN CN201620268014.6U patent/CN205643625U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108093118A (en) * | 2017-11-23 | 2018-05-29 | 广东欧珀移动通信有限公司 | The test method of device, test device and computer readable storage medium on mainboard |
| CN108093118B (en) * | 2017-11-23 | 2020-05-08 | Oppo广东移动通信有限公司 | Method and device for testing devices on mainboard and computer readable storage medium |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20161012 Termination date: 20200331 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |