CN108093118A - The test method of device, test device and computer readable storage medium on mainboard - Google Patents
The test method of device, test device and computer readable storage medium on mainboard Download PDFInfo
- Publication number
- CN108093118A CN108093118A CN201711181570.5A CN201711181570A CN108093118A CN 108093118 A CN108093118 A CN 108093118A CN 201711181570 A CN201711181570 A CN 201711181570A CN 108093118 A CN108093118 A CN 108093118A
- Authority
- CN
- China
- Prior art keywords
- mainboard
- test
- feedback signal
- predetermined
- receiving
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 156
- 238000010998 test method Methods 0.000 title claims abstract description 38
- 230000002159 abnormal effect Effects 0.000 claims abstract description 45
- 238000004891 communication Methods 0.000 claims abstract description 23
- 238000001514 detection method Methods 0.000 claims description 49
- 238000000034 method Methods 0.000 claims description 31
- 230000005856 abnormality Effects 0.000 claims description 12
- 238000004590 computer program Methods 0.000 claims description 6
- 238000010586 diagram Methods 0.000 description 13
- 230000005540 biological transmission Effects 0.000 description 8
- 230000006870 function Effects 0.000 description 8
- 230000008569 process Effects 0.000 description 6
- 239000000463 material Substances 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 241000208340 Araliaceae Species 0.000 description 1
- 235000005035 Panax pseudoginseng ssp. pseudoginseng Nutrition 0.000 description 1
- 235000003140 Panax quinquefolius Nutrition 0.000 description 1
- 241000209140 Triticum Species 0.000 description 1
- 235000021307 Triticum Nutrition 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 235000008434 ginseng Nutrition 0.000 description 1
- 210000003128 head Anatomy 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 210000003733 optic disk Anatomy 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M1/00—Substation equipment, e.g. for use by subscribers
- H04M1/24—Arrangements for testing
Landscapes
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses a kind of test methods of device on mainboard.Test method includes：In mainboard after the power is turned on, test command is sent to mainboard by test device；Detect whether that receiving mainboard is directed to the feedback signal that test command is sent；It whether there is with the device detected when receiving feedback signal on mainboard abnormal.The test method of device on the mainboard of embodiment of the present invention, when receiving the feedback signal that mainboard is sent for test command, the abnormal conditions of the device on mainboard are detected again, so, there can be exception to avoid the device being mistaken for the communication failure between mainboard and test device on mainboard, improve the accuracy of testing result.In addition, the invention also discloses a kind of test device and computer readable storage mediums.
Description
Technical field
The present invention relates to cell phone mainboard testing field, test method, the test device of device on more particularly to a kind of mainboard
And computer readable storage medium.
Background technology
With the development of science and technology, mobile phone has come into the various aspects such as the communication, amusement, life of people.Mainboard conduct
The important component of mobile phone dramatically affects the quality of mobile phone overall performance.Usually, mobile phone all can before dispatching from the factory
Carry out the test job of device on mainboard.Current test mode is：It is sent and ordered to mobile phone by communication interface, then postponed
A period of time is detected the electric current for flowing through mainboard, to judge the device on mainboard with the presence or absence of abnormal.This test mode
Easily there is erroneous judgement, accuracy is not high.
The content of the invention
Embodiment of the present invention provides test method, test device and the computer-readable storage medium of device on a kind of mainboard
Matter.
The test method of device on the mainboard of embodiment of the present invention, including：
In the mainboard after the power is turned on, test command is sent to the mainboard by test device；
Detect whether that receiving the mainboard is directed to the feedback signal that the test command is sent；With
The device on the mainboard is detected when receiving the feedback signal with the presence or absence of abnormal.
The test device of embodiment of the present invention, including：
Sending module, the sending module are used in the mainboard after the power is turned on, send to the mainboard by test device
Test command；
First detection module, the first detection module are ordered for detecting whether receiving the mainboard for the test
Make the feedback signal sent；With
Second detection module, second detection module are used to detect the mainboard when receiving the feedback signal
Device with the presence or absence of abnormal.
The test device of embodiment of the present invention, including：
One or more processors；
Memory；And
One or more programs wherein one or more of programs are stored in the memory, and are configured
It is performed by one or more of processors, described program includes performing the finger of the test method of device on the mainboard
Order.
The computer readable storage medium of embodiment of the present invention, including the computer journey being used in combination with test device
Sequence, the computer program can be executed by processor to complete the test method of device on the mainboard.
The test method of device, test device and computer readable storage medium on the mainboard of embodiment of the present invention,
When receiving the feedback signal that mainboard is sent for test command, then the abnormal conditions of the device on mainboard are detected, in this way, can be with
The device being mistaken for the communication failure between mainboard and test device on mainboard is avoided to exist abnormal, improve testing result
Accuracy.
The additional aspect and advantage of embodiment of the present invention will be set forth in part in the description, partly will be from following
Become apparent in description or recognized by the practice of the present invention.
Description of the drawings
The above-mentioned and/or additional aspect and advantage of the present invention can be from reference to description of the accompanying drawings below to embodiment
It will be apparent and be readily appreciated that, wherein：
Fig. 1 is the flow diagram of the test method of device on the mainboard of embodiment of the present invention；
Fig. 2 is the module diagram of the test device of embodiment of the present invention；
Fig. 3 is the test device of embodiment of the present invention and the connection diagram of mainboard；
Fig. 4 is the flow diagram of the test method of device on the mainboard of embodiment of the present invention；
Fig. 5 is the module diagram of the test device of embodiment of the present invention；
Fig. 6 is the flow diagram of the test method of device on the mainboard of embodiment of the present invention；
Fig. 7 is the module diagram of the test device of embodiment of the present invention；
Fig. 8 is the flow diagram of the test method of device on the mainboard of embodiment of the present invention；
Fig. 9 is the module diagram of the second detection module of embodiment of the present invention test device；
Figure 10 is the flow diagram of the test method of device on the mainboard of embodiment of the present invention；
Figure 11 is the flow diagram of the test method of device on the mainboard of embodiment of the present invention；
Figure 12 is the module diagram of the test device of embodiment of the present invention；
Figure 13 is the test device of embodiment of the present invention and the connection diagram of computer readable storage medium；
Main element and symbol description：
Test device 10, sending module 11, first detection module 12, the second detection module 13, detection unit 131, judgement
Unit 132, determination unit 133, judgment module 15, determining module 16, reminding module 17, processor 18, memory 19, computer
Readable storage medium storing program for executing 20, mainboard 30, device 32.
Specific embodiment
Embodiments of the present invention are described below in detail, the example of the embodiment is shown in the drawings, wherein, it is identical
Or similar label represents same or similar element or has the function of same or like element from beginning to end.Below by ginseng
The embodiment for examining attached drawing description is exemplary, and is only used for explaining embodiments of the present invention, and it is not intended that this hair
The limitation of bright embodiment.
In the description of embodiments of the present invention, it is to be understood that term " " center ", " longitudinal direction ", " transverse direction ", " length
Degree ", " width ", " thickness ", " on ", " under ", "front", "rear", "left", "right", " vertical ", " level ", " top ", " bottom ", " interior ",
The orientation or position relationship of the instructions such as " outer ", " clockwise ", " counterclockwise " are based on orientation shown in the drawings or position relationship, only
It is that embodiments of the present invention and the device or element that simplify description rather than instruction or hint meaning are necessary for ease of description
With specific orientation, with specific azimuth configuration and operation, therefore it is not intended that limitation to embodiments of the present invention.
In addition, term " first ", " second " are only used for description purpose, and it is not intended that instruction or hint relative importance or implicit
Indicate the quantity of indicated technical characteristic." first " is defined as a result, the feature of " second " can be expressed or impliedly wrap
Include one or more feature.In the description of embodiments of the present invention, " multiple " are meant that two or two
More than, unless otherwise specifically defined.
, it is necessary to illustrate in the description of embodiments of the present invention, unless otherwise clearly defined and limited, term
" installation ", " connection ", " connection " should be interpreted broadly, for example, it may be being fixedly connected or being detachably connected or one
It connects body；Can be mechanically connected or be electrically connected or can mutually communicate；Can be directly connected to, can also lead to
It crosses intermediary to be indirectly connected with, can be the interaction relationship of connection inside two elements or two elements.For ability
For the those of ordinary skill in domain, it can understand that above-mentioned term in embodiments of the present invention specific contains as the case may be
Justice.
In embodiments of the present invention, unless otherwise clearly defined and limited, fisrt feature second feature it
" on " or it " under " can be contacted directly including the first and second features, it is not directly to connect that can also include the first and second features
It touches but passes through the other characterisation contact between them.Moreover, fisrt feature second feature " on ", " top " and " on
Face " includes fisrt feature directly over second feature and oblique upper or to be merely representative of fisrt feature level height special higher than second
Sign.Fisrt feature second feature " under ", " lower section " and " below " include fisrt feature immediately below second feature and obliquely downward
Side is merely representative of fisrt feature level height less than second feature.
Following disclosure provides many different embodiments or example is used for realizing embodiments of the present invention not
Same structure.In order to simplify the disclosure of embodiments of the present invention, hereinafter the component and setting of specific examples are described.When
So, they are merely examples, and is not intended to limit the present invention.In addition, embodiments of the present invention can be in different examples
Repeat reference numerals and/or reference letter in son, this repetition are for purposes of simplicity and clarity, itself not indicate to be begged for
By the relation between various embodiments and/or setting.In addition, the various specific techniques that embodiments of the present invention provide
With the example of material, but those of ordinary skill in the art may realize that the application of other techniques and/or making for other materials
With.
Also referring to Fig. 1 to Fig. 3, the test method of device 32 includes on the mainboard 30 of embodiment of the present invention：
S11：In mainboard 30 after the power is turned on, test command is sent to mainboard 30 by test device 10；
S12：Detect whether that receiving mainboard 30 is directed to the feedback signal that test command is sent；With
S13：The device 32 on mainboard 30 is detected when receiving feedback signal with the presence or absence of abnormal.
Fig. 2 and Fig. 3 are referred to, the test device 10 of embodiment of the present invention includes sending module 11, first detection module
12 and second detection module 13.The test method of device 32 can be by embodiment of the present invention on the mainboard 30 of embodiment of the present invention
Test device 10 realize.For example, sending module 11 can be used for performing the method in S11, first detection module 12 can be used for holding
Method in row S12, the second detection module 13 can be used for performing the method in S13.
In other words, sending module 11 can be used in mainboard 30 after the power is turned on, and test command is sent to mainboard 30.First inspection
Module 12 is surveyed to can be used for detecting whether that receiving mainboard 30 is directed to the feedback signal that test command is sent.Second detection module 13
It can be used for detecting the device 32 on mainboard 30 when receiving feedback signal with the presence or absence of abnormal.
Specifically, mobile phone can all test device 32 on mainboard 30 before dispatching from the factory.Current test mode is：Pass through
Communication interface sends to mobile phone and orders, and then delay is for a period of time detected the electric current for flowing through mainboard, to judge on mainboard
Device with the presence or absence of abnormal.There are following defects for this test mode：On the one hand, order is sent due to only existing to mobile phone
Whether process, the process of the feedback signal sent without detecting mobile phone can not judge mobile phone into corresponding pattern, if mobile phone
There are communication failure between test device, then there is exception, cause to detect in the device that this failure can be mistaken on mainboard
As a result accuracy is not high；On the other hand, the time of delay is changeless, and different mobile phones responds the time of the order
There is certain difference, therefore a more suitable time delay can not be set.The test method of embodiment of the present invention is in master
Plate 30 after the power is turned on, first passes through test device 10 and sends test command to mainboard 30, then detects whether to receive mainboard 30 for survey
The feedback signal that examination order is sent, and when receiving the feedback signal, detect the abnormal conditions of the device 32 on mainboard 30.Such as
This, on the one hand, can to avoid due between mainboard 30 and test device 10 communication failure cause mainboard 30 do not receive test dress
It puts the test command of 10 transmissions, and/or test device 10 does not receive the feedback signal of the transmission of mainboard 30, and by mainboard 30 with surveying
The device 32 that the communication failure that trial assembly is put between 10 is mistaken on mainboard 30 exists abnormal；On the other hand, due to test device 10
It is just to be tested after feedback signal is received, meets all mobile phones without seeking a suitable time delay to ensure
Mobile phone comes into test and prepares.The test method of embodiment of the present invention can improve the accuracy of testing result.
In some embodiments, test command is for so that mainboard 30 enters test pattern.When test device 10 receives
When being directed to the feedback signal that test command is sent to mainboard 30, show that mainboard 30 comes into test pattern；When test device 10
When not receiving the feedback signal that mainboard 30 is sent for test command, show that mainboard 30 is introduced into test pattern.
In some embodiments, detect whether that receiving mainboard 30 is directed to the feedback signal of test command transmission (i.e.
S12) can include：It detects whether to receive the signal of the transmission of mainboard 30 and identifies that the classification of the signal is to judge the signal
The no feedback signal that test command transmission is directed to for mainboard 30.
In some embodiments, the device 32 on mainboard 30 is detected when receiving feedback signal with the presence or absence of abnormal
(i.e. S13) can include：The circuit parameter (for example, electric current, voltage etc.) of mainboard 30 is detected to judge the device 32 on mainboard 30
With the presence or absence of exception.
Referring to Fig. 3, in some embodiments, the device 32 on mainboard 30 can include loud speaker, microphone, camera shooting
Head, display screen, keyboard etc..Device 32 on mainboard 30 is connected by circuit with mainboard 30.The test side of embodiment of the present invention
Method can connect each device 32 on mainboard 30 when device 32 on detecting mainboard 30 is with the presence or absence of exception with mainboard 30 successively
It connects, then judges the device 32 on mainboard 30 with the presence or absence of abnormal one by one.For example, it can first carry out the test of microphone：It will be main
Plate 30 is connected to detect with microphone microphone with the presence or absence of abnormal.After being detected to microphone, mainboard 30 and wheat are disconnected
The connection of gram wind, then carry out the test of camera：Mainboard 30 is connected with camera, to detect camera with the presence or absence of abnormal.
After being detected to camera, the connection of mainboard 30 and camera is disconnected, then carries out the test of the next item down.In this way, it examines one by one
The device 32 on mainboard 30 is surveyed with the presence or absence of abnormal.The test method of embodiment of the present invention can be controlled by tester and tested
Device 10 realizes the detection to device 32 on mainboard 30, can also be realized by 10 automatic running of test device on mainboard 30
The detection of device 32.
Referring to Fig. 4, in some embodiments, test method further includes：
S15：When not receiving feedback signal, judge whether the number for sending test command is greater than or equal to predetermined time
Number；
S16：When the number for sending test command is greater than or equal to pre-determined number, determine mainboard 30 and test device 10 it
Between communication abnormality；With
When the number for sending test command is less than pre-determined number, S11 is returned.
Referring to Fig. 5, in some embodiments, test device 10 further includes judgment module 15 and determining module 16.Sentence
Disconnected module 15 can be used for performing the method in S15, and determining module 16 can be used for performing the method in S16.
In other words, judgment module 15 can be used for when not receiving feedback signal, judge to send time of test command
Whether number is greater than or equal to pre-determined number.Determining module 16 can be used for being greater than or equal in the number for sending test command predetermined
During number, communication abnormality between mainboard 30 and test device 10 is determined.Sending module 11 can be also used for sending test command
Number be less than pre-determined number when, to mainboard 30 send test command.
Below using pre-determined number to illustrate twice.Specifically, in mainboard 30 after the power is turned on, test device 10 is to mainboard 30
Test command is sent for the first time, then detects whether that receiving mainboard 30 is directed to the feedback signal that test device 10 is sent, if surveying
Trial assembly puts 10 and does not receive feedback signal, then judges whether the number for sending test command is more than pre-determined number (2 times), due to only
1 test command is had sent to mainboard 30, then is unsatisfactory for the condition more than pre-determined number, then test device 10 is again to mainboard 30
Test command is sent, and detects whether that receiving mainboard 30 is directed to the feedback signal that test device 10 is sent.If at this point, test dress
It puts 10 and does not receive feedback signal still, then judge whether the number for sending test command is more than pre-determined number (2 times), due to
Warp-wise mainboard 30 has sent 2 test commands, meets the condition equal to pre-determined number, it is determined that for mainboard 30 and test device 10
Between communication abnormality；If test device 10 receives feedback signal, start to detect the device 32 on mainboard 30 with the presence or absence of different
Often (i.e. S13).In this way, the reasonable setting of pre-determined number, both will not excessively the duration of extended testing system method and influence efficiency, also can
Prevent the process of the process, and/or the reception feedback signal of test device 10 that receive test command in mainboard 30 from error occur.When
So, in other embodiments, pre-determined number or three times, four times, five it is inferior repeatedly (be greater than or equal to twice).
Referring to Fig. 6, in some embodiments, test method further includes：
S17：When the number for sending test command is greater than or equal to pre-determined number, prompt mainboard 30 and test device 10 it
Between communication abnormality.
Referring to Fig. 7, in some embodiments, test device 10 further includes reminding module 17.Reminding module 17 can be used
In performing the method in S17.
In other words, reminding module 17 can be used for when the number for sending test command is greater than or equal to pre-determined number,
Prompt communication abnormality between mainboard 30 and test device 10.
Specifically, reminding module 17 can be buzzer, LED light etc..When the number for sending test command is more than predetermined time
When counting and not receiving the feedback signal of the transmission of mainboard 30 yet, in the same of definite communication abnormality between mainboard 30 and test device 10
When, reminding module 17 prompts communication abnormality between tester's mainboard 30 and test device 10 that (buzzer warning or LED light flicker
Deng).The mainboard 30 of embodiment of the present invention can be connected with test device 10 by modes such as communication interface, USB lines, here not
It is restricted.Therefore, tester can further detect mainboard 30 and test after finding that reminding module 17 prompts communication abnormality
Connection between device 10 is with the presence or absence of problem, to obtain corresponding solution.
Referring to Fig. 8, in some embodiments, whether the device 32 when receiving feedback signal on detection mainboard 30
Include in the presence of abnormal (i.e. S13)：
S131：When receiving feedback signal, the current value for flowing through mainboard 30 is obtained after the predetermined time；
S132：Judge current value whether in predetermined current range；
S133：When current value is located in predetermined current range, determine that the device 32 on mainboard 30 is normal；With
S134：When current value exceeds predetermined current range, it is abnormal to determine that the device 32 on mainboard 30 exists.
Referring to Fig. 9, in some embodiments, the second detection module 13 includes detection unit 131, judging unit 132
With determination unit 133.Detection unit 131 can be used for performing the method in S131, and judging unit 132 can be used for performing in S132
Method, determination unit 133 can be used for performing the method in S133 and S134.
In other words, detection unit 131 can be used for when receiving feedback signal, is obtained after the predetermined time and flows through master
The current value of plate 30.Specifically, flowing through the current value of mainboard 30 can be detected by galvanometer or by that can detect electric current again
The universal meter detection of voltage can be detected, then detection unit 131 obtains the current value from galvanometer or universal meter.Judging unit
Whether 132 can be used for judging current value in predetermined current range.Determination unit 133 can be used for：It is located in current value pre-
When in the range of constant current, determine that the device 32 on mainboard 30 is normal；With when current value exceeds predetermined current range, mainboard is determined
Device 32 on 30 exists abnormal.
In some embodiments, predetermined current range is [I1, I2].It flows through the current value of mainboard 30 assuming that getting and is
I0 as I1≤I0≤I2, determines that the device 32 on mainboard 30 is normal.As I0 ＜ I1 or I0 ＞ I2, determine on mainboard 30
Device 32 exists abnormal.Further, as I0 ＜ I1, there may be open circuits for the device 32 for determining on mainboard 30；As I0 ＞ I2
When, the device 32 on mainboard 30 is determined there may be electric leakage or is opened a way.
Referring to Fig. 10, in some embodiments, the device 32 detected when receiving feedback signal on mainboard 30 is
It is no to include in the presence of abnormal (i.e. S13)：
S135：When receiving feedback signal, the voltage value at 30 both ends of mainboard is obtained after the predetermined time；
S136：Judge voltage value whether in predetermined voltage range；
S137：When voltage value is located in predetermined voltage range, determine that the device 32 on mainboard 30 is normal；With
S138：When voltage value exceeds predetermined voltage range, it is abnormal to determine that the device 32 on mainboard 30 exists.
Referring to Fig. 9, in some embodiments, the second detection module 13 includes detection unit 131, judging unit
132 and determination unit 133.Detection unit 131 can be used for performing the method in S135, and judging unit 132 can be used for performing S136
In method, determination unit 133 can be used for perform S137 and S138 in method.
In other words, detection unit 131 can be used for when receiving feedback signal, and mainboard 30 is obtained after the predetermined time
The voltage value at both ends.Specifically, the voltage value at 30 both ends of mainboard can be detected by potentiometer or by that can detect electric current again
The universal meter detection of voltage can be detected, then detection unit 131 obtains the voltage value from potentiometer or universal meter.Judging unit
Whether 132 can be used for judging voltage value in predetermined voltage range.Determination unit 133 can be used for：It is located in voltage value pre-
When in the range of constant voltage, determine that the device 32 on mainboard 30 is normal；With when voltage value exceeds predetermined voltage range, mainboard is determined
Device 32 on 30 exists abnormal.
In some embodiments, predetermined voltage range is [U1, U2].Assuming that the voltage value for getting 30 both ends of mainboard is
U0 as U1≤U0≤U2, determines that the device 32 on mainboard 30 is normal.As U0 ＜ U1 or U0 ＞ U2, determine on mainboard 30
Device 32 exists abnormal.Further, as U0 ＜ U1, there may be short circuits for the device 32 for determining on mainboard 30；As U0 ＞ U2
When, determining device 32 on mainboard 30, there may be open circuit or short circuits.
1 is please referred to Fig.1, in some embodiments, the device 32 detected when receiving feedback signal on mainboard 30 is
It is no to include in the presence of abnormal (i.e. S13)：
S139：When receiving feedback signal, obtained after the predetermined time and flow through 30 liang of the current value of mainboard 30 and mainboard
The voltage value at end；
S140：Judge current value whether in predetermined current range and whether voltage value is in predetermined voltage range；
S141：When current value is located in predetermined current range and voltage value is located in predetermined voltage range, mainboard is determined
Device 32 on 30 is normal；With
S142：When current value exceeds predetermined voltage range beyond predetermined current range or voltage value, determine on mainboard 30
Device 32 exist it is abnormal.
Referring to Fig. 9, in some embodiments, the second detection module 13 includes detection unit 131, judging unit
132 and determination unit 133.Detection unit 131 can be used for performing the method in S139, and judging unit 132 can be used for performing S140
In method, determination unit 133 can be used for perform S141 and S142 in method.
In other words, detection unit 131 can be used for when receiving feedback signal, is obtained after the predetermined time and flows through master
The voltage value at 30 both ends of current value and mainboard of plate 30.Specifically, the voltage at 30 both ends of current value and mainboard of mainboard 30 is flowed through
Value can be detected or by that can detect electric current but also detect the universal meter of voltage by including detecting the galvanometer of electric current
The composition element of potentiometer with detecting voltage detects, and then detection unit 131 obtains the electricity from universal meter or the composition element
Flow valuve and the voltage value.Judging unit 132 can be used for judging current value whether in predetermined current range and voltage value whether
In predetermined voltage range.Determination unit 133 can be used for：It is located in current value in predetermined current range and voltage value is located in advance
When in the range of constant voltage, determine that the device 32 on mainboard 30 is normal；Surpass in current value beyond predetermined current range or voltage value
When going out predetermined voltage range, it is abnormal to determine that the device 32 on mainboard 30 exists.
In some embodiments, predetermined current range is [I1, I2], and predetermined voltage range is [U1, U2].Assuming that it obtains
To the current value of mainboard 30 is flowed through for I0, get the voltage value at 30 both ends of mainboard as U0, when I1≤I0≤I2 and U1≤U0≤
During U2, determine that the device 32 on mainboard 30 is normal.As I0 ＜ I1 or I0 ＞ I2 or U0 ＜ U1 or U0 ＞ U2, mainboard is determined
Device 32 on 30 exists abnormal.Further, as I0 ＜ I1, there may be open circuits for the device 32 for determining on mainboard 30；When
During I0 ＞ I2, the device 32 on mainboard 30 is determined there may be electric leakage or is opened a way；As U0 ＜ U1, the device on mainboard 30 is determined
32 there may be short circuits；As U0 ＞ U2, determining device 32 on mainboard 30, there may be open circuit or short circuits.Certainly, as I0 ＜
During I1 or I0 ＞ I2 or U0 ＜ U1 or U0 ＞ U2, the type that device 32 is abnormal on mainboard 30 can also be determined by tester.
In some embodiments, the predetermined time can be 2~3 seconds.In this way, test device 10 is flowing through the electricity of mainboard 30
After stream is stablized or after the voltage stabilization at 30 both ends of mainboard, the device 32 on mainboard 30 is just detected with the presence or absence of abnormal, detection knot
Fruit is more accurate.
In the above-described embodiment, sending module 11 can be communication element, and each detection module, judgment module determine mould
Block, detection unit, judging unit, determination unit can be processor 18 (shown in Figure 13), reminding module 17 can be buzzer,
LED light etc..
Fig. 3 and Figure 12 are referred to, the test device 10 of embodiment of the present invention includes one or more processors 18, storage
Device 19 and one or more programs.Wherein, one or more programs are stored in memory 19, and are configured by one
Or multiple processors 18 perform.Program includes the test method of device 32 on the mainboard 30 for performing any of the above-described embodiment
Instruction.
For example, program may include the instruction for performing the test method of device 32 on following mainboard 30：
S11：In mainboard 30 after the power is turned on, test command is sent to mainboard 30 by test device 10；
S12：Detect whether that receiving mainboard 30 is directed to the feedback signal that test command is sent；With
S13：The device 32 on mainboard 30 is detected when receiving feedback signal with the presence or absence of abnormal.
The test device 10 of embodiment of the present invention is receiving feedback signal of the mainboard 30 for test command transmission
When, then detect the abnormal conditions of the device 32 on mainboard 30, in this way, can to avoid will be between mainboard 30 and test device 10 it is logical
There is exception in the device 32 that news failure is mistaken on mainboard 30, improve the accuracy of testing result.
Fig. 3 and Figure 13 are referred to, the computer readable storage medium 20 of embodiment of the present invention includes and test device 10
The computer program of combined use.Computer program can be performed to complete the mainboard 30 of any of the above-described embodiment by processor 18
The test method of upper device 32.
For example, computer program can be performed to complete the test method of device 32 on following mainboard 30 by processor 18：
S11：In mainboard 30 after the power is turned on, test command is sent to mainboard 30 by test device 10；
S12：Detect whether that receiving mainboard 30 is directed to the feedback signal that test command is sent；With
S13：The device 32 on mainboard 30 is detected when receiving feedback signal with the presence or absence of abnormal.
It is pointed out that computer readable storage medium 20 can be the storage medium being built in test device 10,
It can also be plugged on test device 10 storage medium with can plugging.
The computer readable storage medium 20 of embodiment of the present invention is receiving what mainboard 30 was sent for test command
During feedback signal, then the abnormal conditions of the device 32 on mainboard 30 are detected, in this way, can be to avoid by mainboard 30 and test device 10
Between communication failure be mistaken for device 32 on mainboard 30 and exist abnormal, improve the accuracy of testing result.
In the description of this specification, reference term " embodiment ", " some embodiments ", " schematically implementation
The description of mode ", " example ", " specific example " or " some examples " etc. means the tool with reference to the embodiment or example description
Body characteristics, structure, material or feature are contained at least one embodiment or example of the present invention.In the present specification,
Schematic expression of the above terms is not necessarily referring to identical embodiment or example.Moreover, the specific features of description, knot
Structure, material or feature can in an appropriate manner combine in any one or more embodiments or example.
Any process described otherwise above or method description are construed as in flow chart or herein, represent to include
Module, segment or the portion of the code of the executable instruction of one or more the step of being used to implement specific logical function or process
Point, and the scope of the preferred embodiment of the present invention includes other realization, wherein can not press shown or discuss suitable
Sequence, including according to involved function by it is basic simultaneously in the way of or in the opposite order, carry out perform function, this should be of the invention
Embodiment person of ordinary skill in the field understood.
Expression or logic and/or step described otherwise above herein in flow charts, for example, being considered use
In the order list for the executable instruction for realizing logic function, may be embodied in any computer-readable medium, for
Instruction execution system, device or equipment (such as computer based system, including the system of processing module or other can be from instruction
Execution system, device or equipment instruction fetch and the system executed instruction) use or combine these instruction execution systems, device or
Equipment and use.For the purpose of this specification, " computer-readable medium " can be it is any can include, store, communicating, propagating or
Transmission program uses for instruction execution system, device or equipment or with reference to these instruction execution systems, device or equipment
Device.The more specific example (non-exhaustive list) of computer-readable medium includes following：With one or more wiring
Electrical connection section (IPM current foldback circuits), portable computer diskette box (magnetic device), random access memory (RAM) are read-only to deposit
Reservoir (ROM), erasable edit read-only storage (EPROM or flash memory), fiber device and portable optic disk are only
Read memory (CDROM).In addition, computer-readable medium can even is that the paper that can print described program on it or other conjunctions
Suitable medium, because can be for example by carrying out optical scanner to paper or other media, then into edlin, interpretation or if necessary
It is handled electronically to obtain described program with other suitable methods, be then stored in computer storage.
It should be appreciated that each several part of embodiments of the present invention can be with hardware, software, firmware or combination thereof come real
It is existing.In the above-described embodiment, multiple steps or method can use storage in memory and by suitable instruction execution system
The software or firmware of execution is realized.If for example, being realized with hardware in another embodiment, ability can be used
Any one of following technology well known to domain or their combination are realized：With for data-signal realization logic function
The discrete logic of logic gates has the application-specific integrated circuit of suitable combinational logic gate circuit, programmable gate array
(PGA), field programmable gate array (FPGA) etc..
Those skilled in the art are appreciated that realize all or part of step that above-described embodiment method carries
Suddenly it is that relevant hardware can be instructed to complete by program, the program can be stored in a kind of computer-readable storage medium
In matter, the program upon execution, one or a combination set of the step of including embodiment of the method.
In addition, each functional unit in various embodiments of the present invention can be integrated in a processing module, also may be used
To be that unit is individually physically present, can also two or more units be integrated in a module.It is above-mentioned integrated
The form that hardware had both may be employed in module is realized, can also be realized in the form of software function module.The integrated module
If it is realized in the form of software function module and is independent production marketing or in use, a calculating can also be stored in
In machine read/write memory medium.
Storage medium mentioned above can be read-only memory, disk or CD etc..
Although embodiments of the present invention have been shown and described above, it is to be understood that the above embodiment is
Illustratively, it is impossible to be interpreted as limitation of the present invention, those of ordinary skill in the art within the scope of the invention can be right
Above-mentioned implementation implementation is changed, changes, replacing and modification.
Claims (14)
1. the test method of device on a kind of mainboard, which is characterized in that the test method includes：
In the mainboard after the power is turned on, test command is sent to the mainboard by test device；
Detect whether that receiving the mainboard is directed to the feedback signal that the test command is sent；With
The device on the mainboard is detected when receiving the feedback signal with the presence or absence of abnormal.
2. test method according to claim 1, which is characterized in that the test method further includes：
When not receiving the feedback signal, judge whether the number for sending the test command is greater than or equal to predetermined time
Number；
When the number for sending the test command is greater than or equal to the pre-determined number, determine that the mainboard is filled with the test
Communication abnormality between putting；With
When the number for sending the test command is less than the pre-determined number, return it is described by test device to the mainboard
The step of sending test command.
3. test method according to claim 2, which is characterized in that the test method further includes：
When the number for sending the test command is greater than or equal to the pre-determined number, the mainboard is prompted to be filled with the test
Communication abnormality between putting.
4. test method according to claim 1, which is characterized in that described that institute is detected when receiving the feedback signal
The device stated on mainboard includes with the presence or absence of abnormal step：
When receiving the feedback signal, the current value for flowing through the mainboard is obtained after the predetermined time；
Judge the current value whether in predetermined current range；
When the current value is located in the predetermined current range, determine that the device on the mainboard is normal；With
When the current value exceeds the predetermined current range, it is abnormal to determine that the device on the mainboard exists.
5. test method according to claim 1, which is characterized in that described that institute is detected when receiving the feedback signal
The device stated on mainboard includes with the presence or absence of abnormal step：
When receiving the feedback signal, the voltage value at the mainboard both ends is obtained after the predetermined time；
Judge the voltage value whether in predetermined voltage range；
When the voltage value is located in the predetermined voltage range, determine that the device on the mainboard is normal；With
When the voltage value exceeds the predetermined voltage range, it is abnormal to determine that the device on the mainboard exists.
6. test method according to claim 1, which is characterized in that described that institute is detected when receiving the feedback signal
The device stated on mainboard includes with the presence or absence of abnormal step：
When receiving the feedback signal, obtained after the predetermined time and flow through the current value of the mainboard and the mainboard both ends
Voltage value；
Judge the current value whether in predetermined current range and whether the voltage value is in predetermined voltage range；
When the current value is located in the predetermined current range and the voltage value is located in the predetermined voltage range, really
Device on the fixed mainboard is normal；With
When the current value exceeds the predetermined voltage range beyond the predetermined current range or the voltage value, institute is determined
There is exception in the device stated on mainboard.
7. a kind of test device, which is characterized in that including：
Sending module, the sending module are used in the mainboard after the power is turned on, and test command is sent to the mainboard；
First detection module, the first detection module are sent out for detecting whether receiving the mainboard for the test command
The feedback signal sent；With
Second detection module, second detection module are used to detect the device on the mainboard when receiving the feedback signal
Part is with the presence or absence of abnormal.
8. test device according to claim 7, which is characterized in that the test device further includes：
Judgment module, the judgment module are used for when not receiving the feedback signal, judge to send the test command
Whether number is greater than or equal to pre-determined number；With
Determining module, the determining module are used to be greater than or equal to the pre-determined number in the number for sending the test command
When, determine communication abnormality between the mainboard and the test device；
The sending module is additionally operable to, when the number for sending the test command is less than the pre-determined number, send out to the mainboard
Send the test command.
9. test device according to claim 8, which is characterized in that the test device further includes：
Reminding module, the reminding module are used to be greater than or equal to the pre-determined number in the number for sending the test command
When, prompt communication abnormality between the mainboard and the test device.
10. test device according to claim 7, which is characterized in that second detection module includes：
Detection unit, the detection unit are used for when receiving the feedback signal, are obtained after the predetermined time described in flowing through
The current value of mainboard；
Whether judging unit, the judging unit are used to judge the current value in predetermined current range；With
Determination unit, the determination unit are used for：
When the current value is located in the predetermined current range, determine that the device on the mainboard is normal；
When the current value exceeds the predetermined current range, it is abnormal to determine that the device on the mainboard exists.
11. test device according to claim 7, which is characterized in that second detection module includes：
Detection unit, the detection unit are used for when receiving the feedback signal, and the mainboard is obtained after the predetermined time
The voltage value at both ends；
Whether judging unit, the judging unit are used to judge the voltage value in predetermined voltage range；With
Determination unit, the determination unit are used for：
When the voltage value is located in the predetermined voltage range, determine that the device on the mainboard is normal；
When the voltage value exceeds the predetermined voltage range, it is abnormal to determine that the device on the mainboard exists.
12. test device according to claim 7, which is characterized in that second detection module includes：
Detection unit, the detection unit are used for when receiving the feedback signal, are obtained after the predetermined time described in flowing through
The current value of mainboard and the voltage value at the mainboard both ends；
Judging unit, whether the judging unit is for judging the current value in predetermined current range and the voltage value is
It is no in predetermined voltage range；With
Determination unit, the determination unit are used for：
When the current value is located in the predetermined current range and the voltage value is located in the predetermined voltage range, really
Device on the fixed mainboard is normal；
When the current value exceeds the predetermined voltage range beyond the predetermined current range or the voltage value, institute is determined
There is exception in the device stated on mainboard.
13. a kind of test device, which is characterized in that including：
One or more processors；
Memory；And
One or more programs wherein one or more of programs are stored in the memory, and are configured by institute
One or more processors execution is stated, described program includes the device on the mainboard described in perform claim requirement 1-6 any one
The instruction of the test method of part.
14. a kind of computer readable storage medium, which is characterized in that including the computer program being used in combination with test device,
The computer program can be executed by processor to complete the test side of device on the mainboard described in claim 1-6 any one
Method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711181570.5A CN108093118B (en) | 2017-11-23 | 2017-11-23 | Method and device for testing devices on mainboard and computer readable storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711181570.5A CN108093118B (en) | 2017-11-23 | 2017-11-23 | Method and device for testing devices on mainboard and computer readable storage medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108093118A true CN108093118A (en) | 2018-05-29 |
| CN108093118B CN108093118B (en) | 2020-05-08 |
Family
ID=62173045
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711181570.5A Expired - Fee Related CN108093118B (en) | 2017-11-23 | 2017-11-23 | Method and device for testing devices on mainboard and computer readable storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108093118B (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109947621A (en) * | 2019-03-15 | 2019-06-28 | 西安易朴通讯技术有限公司 | A kind of method and device of server test |
| CN110377477A (en) * | 2019-07-19 | 2019-10-25 | 华勤通讯技术有限公司 | A kind of electronic equipment, functional module group, the mainboard of electronic equipment, detection method |
| CN113115265A (en) * | 2021-04-09 | 2021-07-13 | 电子科技大学 | Method for testing time slot coding of field intensity of base station of maglev train vehicle-ground communication system |
| CN114245284A (en) * | 2021-12-10 | 2022-03-25 | 深圳市精泰达科技有限公司 | Microphone performance detection method and system |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101788945A (en) * | 2010-02-04 | 2010-07-28 | 电子科技大学 | Diagnostic test system and method for electronic system with multiple circuit boards or multiple modules |
| CN102609339A (en) * | 2011-01-19 | 2012-07-25 | 鸿富锦精密工业（深圳）有限公司 | Embedded main board testing device |
| CN103167080A (en) * | 2013-02-04 | 2013-06-19 | 北京大友迅捷科技有限公司 | System and method of testing functions of main board of mobile phone |
| CN103428265A (en) * | 2013-06-28 | 2013-12-04 | 赛龙通信技术（深圳）有限公司 | Manufacturing execution system (MES) control method and system |
| CN104267683A (en) * | 2014-09-16 | 2015-01-07 | 深圳市佳晨科技有限公司 | Product quality test start control system and product quality test start control method |
| CN104569781A (en) * | 2013-10-14 | 2015-04-29 | 鸿富锦精密电子(天津)有限公司 | Mainboard test device and test method |
| US20150115987A1 (en) * | 2013-10-31 | 2015-04-30 | Cellco Partnership D/B/A Verizon Wireless | Apparatus and method for testing portable devices |
| CN205039895U (en) * | 2015-09-22 | 2016-02-17 | 蒲彩贵 | Mobile phone motherboard testing arrangement |
| CN205643625U (en) * | 2016-03-31 | 2016-10-12 | 上海与德通讯技术有限公司 | Mainboard testing component |
| EP3166287A1 (en) * | 2015-11-04 | 2017-05-10 | ADTRAN GmbH | Method and device for testing in a dsl environment |
| CN206282264U (en) * | 2016-08-31 | 2017-06-27 | 郑州众智科技股份有限公司 | The system for detecting multifunctional testing plate |
-
2017
- 2017-11-23 CN CN201711181570.5A patent/CN108093118B/en not_active Expired - Fee Related
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101788945A (en) * | 2010-02-04 | 2010-07-28 | 电子科技大学 | Diagnostic test system and method for electronic system with multiple circuit boards or multiple modules |
| CN102609339A (en) * | 2011-01-19 | 2012-07-25 | 鸿富锦精密工业（深圳）有限公司 | Embedded main board testing device |
| CN103167080A (en) * | 2013-02-04 | 2013-06-19 | 北京大友迅捷科技有限公司 | System and method of testing functions of main board of mobile phone |
| CN103428265A (en) * | 2013-06-28 | 2013-12-04 | 赛龙通信技术（深圳）有限公司 | Manufacturing execution system (MES) control method and system |
| CN104569781A (en) * | 2013-10-14 | 2015-04-29 | 鸿富锦精密电子(天津)有限公司 | Mainboard test device and test method |
| US20150115987A1 (en) * | 2013-10-31 | 2015-04-30 | Cellco Partnership D/B/A Verizon Wireless | Apparatus and method for testing portable devices |
| CN104267683A (en) * | 2014-09-16 | 2015-01-07 | 深圳市佳晨科技有限公司 | Product quality test start control system and product quality test start control method |
| CN205039895U (en) * | 2015-09-22 | 2016-02-17 | 蒲彩贵 | Mobile phone motherboard testing arrangement |
| EP3166287A1 (en) * | 2015-11-04 | 2017-05-10 | ADTRAN GmbH | Method and device for testing in a dsl environment |
| CN205643625U (en) * | 2016-03-31 | 2016-10-12 | 上海与德通讯技术有限公司 | Mainboard testing component |
| CN206282264U (en) * | 2016-08-31 | 2017-06-27 | 郑州众智科技股份有限公司 | The system for detecting multifunctional testing plate |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109947621A (en) * | 2019-03-15 | 2019-06-28 | 西安易朴通讯技术有限公司 | A kind of method and device of server test |
| CN109947621B (en) * | 2019-03-15 | 2022-09-09 | 西安易朴通讯技术有限公司 | Server testing method and device |
| CN110377477A (en) * | 2019-07-19 | 2019-10-25 | 华勤通讯技术有限公司 | A kind of electronic equipment, functional module group, the mainboard of electronic equipment, detection method |
| CN113115265A (en) * | 2021-04-09 | 2021-07-13 | 电子科技大学 | Method for testing time slot coding of field intensity of base station of maglev train vehicle-ground communication system |
| CN114245284A (en) * | 2021-12-10 | 2022-03-25 | 深圳市精泰达科技有限公司 | Microphone performance detection method and system |
| CN114245284B (en) * | 2021-12-10 | 2024-02-27 | 深圳市精泰达科技有限公司 | Microphone performance detection method and system |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108093118B (en) | 2020-05-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN108093118A (en) | The test method of device, test device and computer readable storage medium on mainboard | |
| CN108037444B (en) | GNSS PCBA automatic test system and application method thereof | |
| CN106547668B (en) | Computer system fault alarming method, apparatus and system | |
| CN109142445B (en) | Enameled wire defect online detection method and detection device, computer device and computer readable storage medium | |
| CN106407059A (en) | Server node testing system and method | |
| CN107704986A (en) | The management method and system of Good Laboratory control | |
| CN109726058A (en) | Detection method, device and computer equipment | |
| CN111751143A (en) | Intelligent lock testing system, method, device and storage medium | |
| CN102236086B (en) | Method and device for inspecting electric energy meter | |
| CN104569673A (en) | Test circuit, method and device | |
| CN118348383A (en) | Test equipment and system for mobile phone motherboard | |
| CN109116835A (en) | A kind of feature card test method peculiar to vessel and device | |
| CN111505531B (en) | Board card test system | |
| CN111983422A (en) | Automatic identification adapter for ATE automatic test system and identification method thereof | |
| CN218240380U (en) | Battery internal resistance instrument point inspection device | |
| RU2430406C2 (en) | Automated system for diagnosing digital devices | |
| CN116008787A (en) | DUT anomaly identification method, device and equipment for device under test | |
| CN113824611B (en) | Consumption flow test method, device and equipment of wireless communication module and storage medium | |
| CN110967615B (en) | Circuit board fault diagnosis device and method | |
| CN105868063A (en) | Method, system and apparatus for writing functional detection result and mobile terminal | |
| CN112255367A (en) | Chemical instrument detection system and method | |
| CN110198548A (en) | A kind of LORA module test method | |
| CN109683039A (en) | Off-line test method and system for electronic product | |
| CN112946529B (en) | Control line checking method, system and medium based on detection module | |
| CN116577551B (en) | SSD power consumption testing method and system and electronic equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information |
Address after: Changan town in Guangdong province Dongguan 523860 usha Beach Road No. 18 Applicant after: GUANGDONG OPPO MOBILE TELECOMMUNICATIONS Corp.,Ltd. Address before: Changan town in Guangdong province Dongguan 523860 usha Beach Road No. 18 Applicant before: GUANGDONG OPPO MOBILE TELECOMMUNICATIONS Corp.,Ltd. |
|
| CB02 | Change of applicant information | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20200508 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |