CN102609339A - Embedded main board testing device - Google Patents
Embedded main board testing device Download PDFInfo
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- CN102609339A CN102609339A CN2011100213199A CN201110021319A CN102609339A CN 102609339 A CN102609339 A CN 102609339A CN 2011100213199 A CN2011100213199 A CN 2011100213199A CN 201110021319 A CN201110021319 A CN 201110021319A CN 102609339 A CN102609339 A CN 102609339A
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Abstract
An embedded main board testing device is used for testing functions of a main board to be tested and comprises an embedded processor, a data exchange module, a multi-circuit control module, a loop testing module and a relay. The data exchange module is used for transmitting testing instructions and data between the embedded main board testing device and the main board to be tested; the multi-circuit control module is used for controlling a plurality of external devices to assist in testing the main board to be tested; the loop testing module is used for feeding back data transmitted by various interfaces to be tested of the main board to be tested to detect whether the interfaces to be tested are normal or not; and the relay is used for controlling on and off of the main board to be tested. The embedded main board testing device can be used for testing a plurality of functions of the main board, and is small in size.
Description
Technical field
The present invention relates to a kind of mainboard test device, relate in particular to a kind of embedded main board proving installation.
Background technology
The mainboard of electronic equipments such as computing machine all will carry out functional test to mainboard in shipment as last after accomplish producing.For example the various port of mainboard is carried out functional test.At present, when on producing line, carrying out the mainboard test, generally be to adopt main frame to combine different testing apparatuss that the function of the different function units of mainboard is tested.In when test, generally be the function that a worker station can only testing host, cause the wasting of resources of Test Host.Simultaneously, the volume of existing testing apparatus is generally bigger, takes up room and be not easy to carry.
Summary of the invention
In view of this, be necessary to provide a kind of a plurality of functional tests of the mainboard to be measured of accomplishing electronic equipment and embedded main board proving installation with smaller size smaller.
A kind of embedded main board proving installation is used for mainboard to be measured is carried out functional test, and said embedded main board proving installation comprises:
Flush bonding processor;
Data exchange module; Be electrically connected to this flush bonding processor; Be used to realize carrying out between this embedded main board proving installation and the mainboard to be measured the transmission of test instruction and data, this data exchange module comprises the serial communication unit of realizing serial communication and/or the network communication unit of realizing network service;
The multichannel control module is electrically connected to said flush bonding processor, and said multichannel control module is used for a plurality of external units are controlled, with the auxiliary test that realizes mainboard to be measured;
The go-and-return test module is electrically connected to said mainboard to be measured, and said go-and-return test module provides feedback to the data of the interface transmission various to be measured of said mainboard to be measured, and whether function is normal to detect said interface to be measured; And
Relay is electrically connected to said flush bonding processor, and said relay is used to control the power-on and power-off of said mainboard to be measured.
Described embedded main board proving installation is used as the major control element through adopting flush bonding processor, for the central processing unit that common computing machine adopts, has advantages such as volume is little, low in energy consumption; Simultaneously, be integrated in said flush bonding processor, make said embedded main board proving installation can accomplish a plurality of functional tests of mainboard and have smaller volume through data exchange module, multichannel control module, loop detection module and relay etc.
Description of drawings
Fig. 1 is the functional block diagram of the embedded main board proving installation of preferred embodiments of the present invention.
The main element symbol description
Embedded main board proving installation 100
Flush bonding processor 10
Network interface card interface 233
USB go-and-return test interface 41
Parallel port go-and-return test interface 42
Serial ports go-and-return test interface 43
The Audio Loop drive test tries mouthfuls 44
Switch 51
Embodiment
See also Fig. 1, embedded main board proving installation 100 of the present invention is used for a plurality of functional modules of the mainboard to be measured 200 of electronic equipments such as computing machine are carried out functional test.The embedded main board proving installation 100 of preferred embodiments of the present invention comprises flush bonding processor 10, data exchange module 20, multichannel control module 30, loop detection module 40, relay 50, display module 60 and power module 70.Said power module 70 can provide the supply voltages of the required multiple different sizes of said embedded main board proving installation 100.
Said flush bonding processor 10 is electrically connected to said data exchange module 20, multichannel control module 30, relay 50 and display module 60 respectively, so that above-mentioned each functional module is controlled.In this preferred embodiments, said flush bonding processor 10 is ARM (Advanced RISC Machines) processor.Said flush bonding processor 10 comprises internal integrated circuit (Inter-Integrated Circuit, I2C) interface 11 and Serial Peripheral Interface (SPI) (Serial Peripheral Interface, SPI) 13.The device that has the I2C interface on said I2C interface 11 and the mainboard 200 to be measured is connected, with the data through I2C protocol transmission I2C form.The device that has the SPI interface on said SPI interface 13 and the mainboard 200 to be measured is connected, with the data through SPI protocol transmission SPI form.
Said data exchange module 20 is used to realize carrying out between this embedded main board proving installation 100 and the mainboard to be measured 200 transmission of test instruction and data.This data exchange module 20 comprises serial communication unit 21 and network communication unit 23.Said serial communication unit 21 for universal asynchronous reception/dispensing device of being electrically connected to said flush bonding processor 10 (Universal Asynchronous Receiver/Transmitter, UART).Said serial communication unit 21 is used to realize the serial data communication between said embedded main board proving installation 100 and the mainboard to be measured 200.Said network communication unit 23 is used to realize communicate through LAN between this embedded main board proving installation 100 and the mainboard to be measured 200.This network communication unit 23 comprises network card chip 231 that is electrically connected to flush bonding processor 10 and the network interface card interface 233 that is connected to this network card chip 231.In this preferred embodiments, said network card chip 231 is DM9000; Said network interface card interface 233 is the RJ-45 interface.
Said multichannel control module 30 is used to realize that 10 pairs of a plurality of external units of said flush bonding processor control, with the auxiliary test that realizes mainboard 200 to be measured.For example, said flush bonding processor 10 anchor clamps, cylinder moving etc. that can control the power-on and power-off of mainboard 200 to be measured and drive the said mainboard 200 to be measured in location through said multichannel control module 30.Said multichannel control module 30 can be CPLD (Complex Programmable Logic Device, CPLD) chip or integrated digital input and output (Data Input Output, DIO) integrated circuit board.For example; When said multichannel control module 30 was the CPLD chip, said CPLD chip itself had a plurality of DIO pins, when a plurality of controlled external unit; Said a plurality of controlled external unit electrically connects with said a plurality of DIO pins respectively mutually; Said flush bonding processor 10 can be through sending controling instruction to this CPLD chip, and the level of controlling on these a plurality of DIO pins just changes, thereby realizes the control to a plurality of controlled external units respectively.
Said loop detection module 40 is used for the various interfaces such as U SB interface, parallel port, serial ports and COBBAIF of said mainboard 200 to be measured are tested.When the various interface of said mainboard 200 to be measured was tested, the data that the interface various to be measured of 40 pairs of said mainboards 200 to be measured of said loop detection module sends provided feedback, and whether function is normal to detect said interface to be measured.Said loop detection module 40 comprises that USB go-and-return test interface 41, parallel port go-and-return test interface 42, serial ports go-and-return test interface 43 and Audio Loop drive test try mouthfuls 44.Said USB go-and-return test interface 41, parallel port go-and-return test interface 42, serial ports go-and-return test interface 43 and Audio Loop drive test try mouthfuls 44 respectively with the corresponding connection of USB interface, serial ports, parallel port and COBBAIF of said mainboard 200 to be measured.
When the USB interface of mainboard 200 to be measured is tested; Said flush bonding processor 10 at first sends test instruction to said mainboard 200 to be measured through the UART or the network interface card interface 233 of said data exchange module 20; 200 of said mainboards to be measured send one group of test data to said USB go-and-return test interface 41 through its detected USB interface; Said USB go-and-return test interface 41 returns the detected USB interface of one group of data to said mainboard 200 to be measured immediately; Said mainboard to be measured 200 can be judged this detected USB interface, and whether function is normal, simultaneously test result is returned to said flush bonding processor 10 through data exchange module 20.So, this loop detection module 40 can replace the USB device that adopts in the existing test mode through using USB go-and-return test interface 41, like USB flash disk etc. the detected USB interface of mainboard 200 to be measured is tested.In addition, identical to the test process and the test philosophy of serial ports, parallel port and the COBBAIF of said mainboard 200 to be measured with the test process and the principle of said detected USB interface, repeat no more at this.
Said relay 50 is used to control the power-on and power-off of said mainboard to be measured 200.Said relay 50 comprises switch 51 and is electrically connected to the coil 53 of flush bonding processor 10.Said switch 51 1 ends are electrically connected to power module 70, and the other end is electrically connected to the power input of said mainboard to be measured 200.When 100 pairs of said mainboards 200 to be measured of this embedded main board proving installation were tested, said flush bonding processor 10 these coils 53 of control powered on and make these switch 51 closures, and this moment, this power module 70 be that said mainboard to be measured 200 is supplied power.After accomplishing test, said flush bonding processor 10 control 53 times electricity of this coil also make this switch 51 break off, and this moment, this power module 70 promptly stopped to be said mainboard 200 power supplies to be measured.
Said display module 60 comprises LCD 61 and display driver chip 63.In this preferred embodiments, said LCD 61 is the character mode lcd display.Said LCD 61 is electrically connected to said flush bonding processor 10 through said display driver chip 63.Said LCD 61 is used to show information such as test mode.Said display driver chip 63 is used to strengthen drive current and the drive signal that inputs to this LCD 61, so that this LCD 61 obtains good display.
Described embedded main board proving installation 100 is used as the major control element through adopting flush bonding processor 10, for the central processing unit that common computing machine adopts, has advantages such as volume is little, low in energy consumption; Simultaneously; Be integrated in said flush bonding processor 10 through data exchange module 20, multichannel control module 30, loop detection module 40 and display module 60 etc., make said embedded main board proving installation 100 can accomplish a plurality of functional tests of mainboard and have smaller volume.
Claims (8)
1. an embedded main board proving installation is used for mainboard to be measured is carried out functional test, it is characterized in that, said embedded main board proving installation comprises:
Flush bonding processor;
Data exchange module; Be electrically connected to this flush bonding processor; Be used to realize carrying out between this embedded main board proving installation and the mainboard to be measured the transmission of test instruction and data, this data exchange module comprises the serial communication unit of realizing serial communication and/or the network communication unit of realizing network service;
The multichannel control module is electrically connected to said flush bonding processor, and said multichannel control module is used for a plurality of external units are controlled, with the auxiliary test that realizes mainboard to be measured;
The go-and-return test module is electrically connected to said mainboard to be measured, and said go-and-return test module provides feedback to the data of the interface transmission various to be measured of said mainboard to be measured, and whether function is normal to detect said interface to be measured; And
Relay is electrically connected to said flush bonding processor, and said relay is used to control the power-on and power-off of said mainboard to be measured.
2. embedded main board proving installation as claimed in claim 1; It is characterized in that: said flush bonding processor comprises I2C interface and SPI interface; The device that has the I2C interface on said I2C interface and the mainboard to be measured is connected, to test through I2C protocol transmission data; The device that has the SPI interface on said SPI interface and the mainboard to be measured is connected, to test through SPI protocol transmission data.
3. embedded main board proving installation as claimed in claim 1; It is characterized in that: said multichannel control module is the CPLD chip; This CPLD electrically connects with said external unit respectively through its DIO pin mutually; To this CPLD chip, the level of controlling on these a plurality of DIO pins just changes said flush bonding processor, thereby realizes the control to a plurality of controlled external units respectively through sending controling instruction.
4. embedded main board proving installation as claimed in claim 1 is characterized in that: said multichannel control module is integrated DIO integrated circuit board.
5. embedded main board proving installation as claimed in claim 1 is characterized in that: said loop detection module comprises try one or more in the mouth of USB go-and-return test interface, parallel port go-and-return test interface, serial ports go-and-return test interface and Audio Loop drive test; Said USB go-and-return test interface, parallel port go-and-return test interface, serial ports go-and-return test interface and Audio Loop drive test try mouth respectively with the corresponding connection of USB interface, serial ports, parallel port and COBBAIF of said mainboard to be measured.
6. embedded main board proving installation as claimed in claim 1 is characterized in that: said embedded main board proving installation also comprises power module, and said power module provides the supply voltage of the required multiple different sizes of said embedded main board proving installation.
7. embedded main board proving installation as claimed in claim 6 is characterized in that: said relay comprises switch and coil, and said switch one end is electrically connected to said power module, and the other end is electrically connected to the power input of said mainboard to be measured; This coil of said flush bonding processor control powers on or electricity and make this switch respective closed or disconnection down, so that this power module is said main board power supply to be measured or stops power supply.
8. embedded main board proving installation as claimed in claim 1; It is characterized in that: said embedded main board proving installation also comprises LCD and display driver chip, and said LCD is electrically connected to said flush bonding processor through said display driver chip; Said display driver chip is used to strengthen drive current and the drive signal that inputs to this LCD.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011100213199A CN102609339A (en) | 2011-01-19 | 2011-01-19 | Embedded main board testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011100213199A CN102609339A (en) | 2011-01-19 | 2011-01-19 | Embedded main board testing device |
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|---|---|
| CN102609339A true CN102609339A (en) | 2012-07-25 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2011100213199A Pending CN102609339A (en) | 2011-01-19 | 2011-01-19 | Embedded main board testing device |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104502832A (en) * | 2014-12-31 | 2015-04-08 | 福建实达电脑设备有限公司 | Automatic tester and testing method based on hand-held POS machine mainboard |
| CN105892445A (en) * | 2016-04-05 | 2016-08-24 | 珠海格力电器股份有限公司 | Mainboard function test system and method |
| CN106201804A (en) * | 2016-07-28 | 2016-12-07 | 浪潮电子信息产业股份有限公司 | The device of a kind of measuring and calculation mainboard, method and system |
| CN108093118A (en) * | 2017-11-23 | 2018-05-29 | 广东欧珀移动通信有限公司 | The test method of device, test device and computer readable storage medium on mainboard |
| CN109710473A (en) * | 2018-12-19 | 2019-05-03 | 四川虹美智能科技有限公司 | A kind of SOC board measuring method, apparatus and system |
| TWI749550B (en) * | 2020-05-11 | 2021-12-11 | 技嘉科技股份有限公司 | Test platform and test system for testing interface compatibility |
-
2011
- 2011-01-19 CN CN2011100213199A patent/CN102609339A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104502832A (en) * | 2014-12-31 | 2015-04-08 | 福建实达电脑设备有限公司 | Automatic tester and testing method based on hand-held POS machine mainboard |
| CN104502832B (en) * | 2014-12-31 | 2017-09-15 | 福建实达电脑设备有限公司 | Based on handheld POS machine mainboard auto testing instrument and method of testing |
| CN105892445A (en) * | 2016-04-05 | 2016-08-24 | 珠海格力电器股份有限公司 | Mainboard function test system and method |
| CN106201804A (en) * | 2016-07-28 | 2016-12-07 | 浪潮电子信息产业股份有限公司 | The device of a kind of measuring and calculation mainboard, method and system |
| CN108093118A (en) * | 2017-11-23 | 2018-05-29 | 广东欧珀移动通信有限公司 | The test method of device, test device and computer readable storage medium on mainboard |
| CN108093118B (en) * | 2017-11-23 | 2020-05-08 | Oppo广东移动通信有限公司 | Method and device for testing devices on mainboard and computer readable storage medium |
| CN109710473A (en) * | 2018-12-19 | 2019-05-03 | 四川虹美智能科技有限公司 | A kind of SOC board measuring method, apparatus and system |
| TWI749550B (en) * | 2020-05-11 | 2021-12-11 | 技嘉科技股份有限公司 | Test platform and test system for testing interface compatibility |
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Application publication date: 20120725 |