TWI749550B - Test platform and test system for testing interface compatibility - Google Patents

Test platform and test system for testing interface compatibility Download PDF

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TWI749550B
TWI749550B TW109115500A TW109115500A TWI749550B TW I749550 B TWI749550 B TW I749550B TW 109115500 A TW109115500 A TW 109115500A TW 109115500 A TW109115500 A TW 109115500A TW I749550 B TWI749550 B TW I749550B
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test
port
transmission port
connection terminal
coupled
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TW109115500A
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Chinese (zh)
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TW202143045A (en
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張桂山
周士杰
易春陽
劉彬
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技嘉科技股份有限公司
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Abstract

A platform including a first base, a second base, a cable and a mechanical arm is provided. The first base includes a first test port configured to couple to a first input/output port of a device under test (DUT). The second base includes a first peripheral port and a second peripheral port. The first peripheral port is configured to couple to a first peripheral device. The second peripheral port is configured to couple to a second peripheral device. The cable includes a first transmission port, a second transmission port and a connection line coupled between the first and second transmission ports. The mechanical arm is configured to move the first transmission port such that the first transmission port is coupled to the first test port. The mechanical arm is further configured to move the second transmission port such that the second transmission port is coupled to the first or second peripheral port.

Description

接口相容性測試平台及系統 Interface compatibility test platform and system

本發明係有關於一種測試平台,特別是有關於一種具有機械手臂的測試平台。 The invention relates to a test platform, in particular to a test platform with a mechanical arm.

隨著科技的進步,電子裝置的種類及功能愈來愈多。每一電子裝置在出廠前,需經過許多測試,如電子裝置的輸入/輸出埠與不同週邊裝置之間的相容性測試。然而,每一測試動作都需要由人力完成。測試人員需要一直待在測試現場。 With the advancement of technology, there are more and more types and functions of electronic devices. Before leaving the factory, each electronic device needs to go through many tests, such as compatibility tests between the input/output ports of the electronic device and different peripheral devices. However, each test action needs to be completed by manpower. Testers need to stay on the test site all the time.

本發明之一實施例提供一種接口相容性測試平台,包括一第一基座、一第二基座、一纜線以及一機械手臂。第一基座包括一第一測試埠。第一測試埠用以耦接一待測物的一第一輸入/輸出埠。第二基座包括一第一週邊埠以及一第二週邊埠。第一週邊埠用以耦接一第一週邊裝置。第二週邊埠用以耦接一第二週邊裝置。纜線包括一第一傳輸埠、一第二傳輸埠以及一連接線。連接線耦接於 第一傳輸埠及第二傳輸埠之間。機械手臂用以移動第一傳輸埠,使得第一傳輸埠耦接第一測試埠,並移動第二傳輸埠,使得第二傳輸埠耦接第一或第二週邊埠。 An embodiment of the present invention provides an interface compatibility test platform, which includes a first base, a second base, a cable, and a robotic arm. The first base includes a first test port. The first test port is used for coupling to a first input/output port of an object under test. The second base includes a first peripheral port and a second peripheral port. The first peripheral port is used for coupling a first peripheral device. The second peripheral port is used for coupling a second peripheral device. The cable includes a first transmission port, a second transmission port, and a connecting wire. The connection line is coupled to Between the first transmission port and the second transmission port. The robot arm is used for moving the first transmission port so that the first transmission port is coupled to the first test port, and moves the second transmission port so that the second transmission port is coupled to the first or second peripheral port.

本發明之另一實施例提供一種測試系統,包括一第一基座、一第二基座、一纜線、一機械手臂以及一控制電路。第一基座包括一第一測試埠。第一測試埠用以耦接一待測物的一第一輸入/輸出埠。第二基座包括一第一週邊埠以及一第二週邊埠。第一週邊埠用以耦接一第一週邊裝置。第二週邊埠用以耦接一第二週邊裝置。纜線包括一第一傳輸埠、一第二傳輸埠以及一連接線。連接線耦接於第一傳輸埠及第二傳輸埠之間。機械手臂根據一控制信號移動第一傳輸埠,使得第一傳輸埠耦接第一測試埠,並且移動第二傳輸埠,使得第二傳輸埠耦接第一或第二週邊埠。控制電路執行一測試程式,用以產生控制信號。 Another embodiment of the present invention provides a test system including a first base, a second base, a cable, a robot arm, and a control circuit. The first base includes a first test port. The first test port is used for coupling to a first input/output port of an object under test. The second base includes a first peripheral port and a second peripheral port. The first peripheral port is used for coupling a first peripheral device. The second peripheral port is used for coupling a second peripheral device. The cable includes a first transmission port, a second transmission port, and a connecting wire. The connection line is coupled between the first transmission port and the second transmission port. The robotic arm moves the first transmission port according to a control signal, so that the first transmission port is coupled to the first test port, and moves the second transmission port, so that the second transmission port is coupled to the first or second peripheral port. The control circuit executes a test program to generate a control signal.

100:測試系統 100: test system

102:測試平台 102: test platform

104:待測物 104: DUT

110,112,114:週邊裝置 110, 112, 114: Peripheral devices

106,108:輸入/輸出埠 106, 108: input/output port

SC:控制信號 SC: control signal

116:控制機台 116: control machine

CR1~CR6:溝通結果 CR1~CR6: Communicate results

118:顯示面板 118: display panel

120:主機 120: host

122:滑鼠 122: Mouse

124:鍵盤 124: keyboard

202、206:基座 202, 206: pedestal

204:纜線 204: Cable

208:機械手臂 208: Robotic Arm

TP1,TP2:測試埠 TP1, TP2: test port

PP1~PP3:週邊埠 PP1~PP3: Peripheral port

CT11~CT20:連接端 CT11~CT20: connecting terminal

210、214:傳輸埠 210, 214: Transmission port

212:連接線 212: connection line

216,218:轉接頭 216,218: Adapter

224:夾爪 224: Gripper

220,222:開口 220,222: opening

200:控制電路 200: control circuit

300,302,304,306,308,400,402,404:基板 300,302,304,306,308,400,402,404: substrate

310,312,314,316,318,320,322,324,326,328,330,332,406,408,410,412,414,416,528,534:固定孔 310,312,314,316,318,320,322,324,326,328,330,332,406,408,410,412,414,416,528,534: fixed hole

d1~d16:高度 d1~d16: height

502,508:收容空間 502,508: containment space

520:貫孔 520: Through hole

522:溝槽 522: groove

516A,516B:定位板 516A, 516B: positioning plate

518A~518D:彈簧 518A~518D: Spring

524,526,530,532:定位孔 524,526,530,532: positioning hole

536,538:凹槽 536,538: Groove

602,604,606,608:定位柱 602,604,606,608: positioning column

610,612:夾爪 610,612: Gripper

700:畫面 700: Screen

702,704,706,708,710,712,714,718,720,722,724:選項 702,704,706,708,710,712,714,718,720,722,724: options

716:視窗 716: Windows

S801~S813:步驟 S801~S813: steps

511、512、514:構件 511, 512, 514: components

516:定位構件 516: positioning component

518:彈性構件 518: Elastic member

第1圖為本發明之測試系統的示意圖。 Figure 1 is a schematic diagram of the test system of the present invention.

第2圖為本發明之測試平台的方塊示意圖。 Figure 2 is a block diagram of the test platform of the present invention.

第3A圖為本發明之基座的俯視圖。 Figure 3A is a top view of the base of the present invention.

第3B圖為本發明之基板的側視圖。 Figure 3B is a side view of the substrate of the present invention.

第4A圖為本發明之基座的另一實施例。 Figure 4A shows another embodiment of the base of the present invention.

第4B圖為第4A圖的基板的側視圖。 Figure 4B is a side view of the substrate of Figure 4A.

第5A圖為本發明之纜線的側視圖。 Figure 5A is a side view of the cable of the present invention.

第5B圖為本發明之轉接頭的側視圖。 Figure 5B is a side view of the adapter of the present invention.

第5C圖為本發明之轉接頭的俯視圖。 Figure 5C is a top view of the adapter of the present invention.

第6圖為本發明之機械手臂的示意圖。 Figure 6 is a schematic diagram of the robotic arm of the present invention.

第7圖為本發明之測試軟體的主界面。 Figure 7 is the main interface of the test software of the present invention.

第8圖為本發明的主機的控制方法示意圖。 Figure 8 is a schematic diagram of the host control method of the present invention.

為讓本發明之目的、特徵和優點能更明顯易懂,下文特舉出實施例,並配合所附圖式,做詳細之說明。本發明說明書提供不同的實施例來說明本發明不同實施方式的技術特徵。其中,實施例中的各元件之配置係為說明之用,並非用以限制本發明。另外,實施例中圖式標號之部分重覆,係為了簡化說明,並非意指不同實施例之間的關聯性。 In order to make the purpose, features and advantages of the present invention more comprehensible, the following specific examples are given in conjunction with the accompanying drawings for detailed descriptions. The specification of the present invention provides different examples to illustrate the technical features of different embodiments of the present invention. Among them, the configuration of each element in the embodiment is for illustrative purposes, and is not intended to limit the present invention. In addition, part of the repetition of the symbols of the drawings in the embodiments is for simplifying the description, and does not imply the relevance between different embodiments.

第1圖為本發明之測試系統的示意圖。如圖所示,測試系統100包括一測試平台102、一待測物104以及週邊裝置110、112及114。待測物104耦接測試平台102,並具有輸入/輸出埠106及108。本發明並不限定輸入/輸出埠106及108的種類。在一可能實施例中,輸入/輸出埠106及108係為相同種類的輸入/輸出埠,如USB埠。在另一實施例中,輸入/輸出埠106的種類不同於輸入/輸出埠108的種類。舉例而言,輸入/輸出埠106係為一USB埠,輸入/輸出埠108係為一影 像輸入埠,如視訊圖形陣列(Video Graphics Array;VGA)埠、顯示埠(DisplayPort;DP)、高畫質多媒體介面(High Definition Multimedia Interface;HDMI)或數碼視頻介面(Digital Visual Interface;DVI)埠。在其它實施例中,待測物104具有更少或更多的輸入/輸出埠。另外,本發明不限定待測物104的種類。在一可能實施例中,待測物104係為一主機板(motherboard)。 Figure 1 is a schematic diagram of the test system of the present invention. As shown in the figure, the test system 100 includes a test platform 102, a test object 104, and peripheral devices 110, 112, and 114. The DUT 104 is coupled to the test platform 102 and has input/output ports 106 and 108. The invention does not limit the types of the input/output ports 106 and 108. In a possible embodiment, the input/output ports 106 and 108 are the same type of input/output ports, such as USB ports. In another embodiment, the type of the input/output port 106 is different from the type of the input/output port 108. For example, the input/output port 106 is a USB port, and the input/output port 108 is a shadow Like input ports, such as Video Graphics Array (VGA) port, DisplayPort (DP), High Definition Multimedia Interface (HDMI) or Digital Visual Interface (DVI) port . In other embodiments, the DUT 104 has fewer or more input/output ports. In addition, the present invention does not limit the type of the object 104 to be tested. In a possible embodiment, the test object 104 is a motherboard.

週邊裝置110、112及114耦接測試平台102。本發明並不限定週邊裝置110、112及114的種類。在一可能實施例中,週邊裝置110、112及114均為USB週邊裝置。本發明並不限定測試系統100的週邊裝置的數量。在其它實施例中,測試系統100具有更少或更多的週邊裝置。舉例而言,週邊裝置110、112及114之至少一者可能是一堅石加密狗(dongle)、一快閃卡(flash disk)、一電競鍵盤、一電競滑鼠、一硬碟、一光碟機、一USB 2.0集線器(hub)、一USB 3.0集線器、一無線攝影鏡頭、一有線攝影鏡頭、一網路卡(LAN card)、一掃描器(scanner)、一音響、一喇叭、一藍芽裝置、一電流計或是一充電器。 The peripheral devices 110, 112 and 114 are coupled to the test platform 102. The present invention does not limit the types of peripheral devices 110, 112, and 114. In one possible embodiment, the peripheral devices 110, 112, and 114 are all USB peripheral devices. The present invention does not limit the number of peripheral devices of the test system 100. In other embodiments, the test system 100 has fewer or more peripheral devices. For example, at least one of the peripheral devices 110, 112, and 114 may be a dongle, a flash disk, an gaming keyboard, an gaming mouse, a hard disk, and a Optical disc drive, a USB 2.0 hub, a USB 3.0 hub, a wireless camera lens, a wired camera lens, a network card (LAN card), a scanner (scanner), a stereo, a speaker, a blue Bud device, a galvanometer or a charger.

測試平台102用以測試待測物104的接口與不同週邊裝置之間的相容性。在本實施例中,測試平台102耦接於待測物104、週邊裝置110、112及114之間,並根據控制信號SC,將輸入/輸出埠106及108之一者與週邊裝置110、112及114之一者電性連接在一起。在一可能實施例中,測試平台102將輸入/輸出埠106依序電性連接邊裝置110、112及114,再將輸入/輸出埠108依序電性連接邊裝置110、112及114。 The test platform 102 is used to test the compatibility between the interface of the DUT 104 and different peripheral devices. In this embodiment, the test platform 102 is coupled between the object under test 104 and the peripheral devices 110, 112, and 114, and according to the control signal SC, connects one of the input/output ports 106 and 108 to the peripheral devices 110, 112 And 114 are electrically connected together. In one possible embodiment, the test platform 102 electrically connects the input/output ports 106 to the edge devices 110, 112, and 114 in sequence, and then connects the input/output ports 108 to the edge devices 110, 112, and 114 in sequence.

在其它實施例中,測試系統100更包括一控制機台116。每當測試平台102電性連接一特定輸入/輸出埠與一特定週邊裝置時,待測物104透過該特定輸入/輸出埠,與該特定週邊裝置溝通,用以產生一溝通結果。在一可能實施例中,當待測物104根據不同的週邊裝置,進行不同的動作。舉例而言,當週邊裝置係為一充電器時,待測物104對一電池充電。在此例中,待測物104將充電電流作為一溝通結果。在其它實施例中,週邊裝置係為一音響。當音響播放音樂時,待測物104可能利用一麥克風對播放的音頻文件進行收音,並將音頻文件轉換成文字,用以進行識別。在此例中,待測物104將識別結果作為一溝通結果。 In other embodiments, the test system 100 further includes a control machine 116. Whenever the test platform 102 is electrically connected to a specific input/output port and a specific peripheral device, the object under test 104 communicates with the specific peripheral device through the specific input/output port to generate a communication result. In a possible embodiment, when the object 104 to be tested performs different actions according to different peripheral devices. For example, when the peripheral device is a charger, the DUT 104 charges a battery. In this example, the DUT 104 uses the charging current as a communication result. In other embodiments, the peripheral device is a speaker. When the speaker plays music, the DUT 104 may use a microphone to pick up the played audio file, and convert the audio file into text for recognition. In this example, the test object 104 uses the recognition result as a communication result.

控制機台116根據待測物104所產生的不同溝通結果,產生不同的測試結果。測試人員根據該等測試結果,便可得知待測物104是否相容於不同週邊裝置。舉例而言,假設週邊裝置110係為一儲存裝置(如隨身碟)、週邊裝置112係為一電競鍵盤、週邊裝置114係為一攝影鏡頭。當測試平台102根據控制信號SC,電性連接輸入/輸出埠106與週邊裝置110時,待測物104可能寫入一特定資料至週邊裝置110中,再讀取一特定位址的資料,用以產生一第一讀取資料。在此例中,待測物104將第一讀取資料作為一溝通結果CR1。控制機台116根據溝通結果CR1,比較特定資料與第一讀取資料,用以產生一第一測試結果。當測試平台102根據控制信號SC,電性連接輸入/輸出埠106與週邊裝置112時,待測物104可能讀取週邊裝置112的供應商識別碼(vendor identification number;VID)以及產品識別碼(product identification number;PID),用以產生一第一檢測結果。在此例中, 待測物104將第一檢測結果作為一溝通結果CR2。控制機台116將溝通結果CR2作為一第二測試結果。當測試平台102根據控制信號SC,電性連接輸入/輸出埠106與週邊裝置114時,待測物104可能啟動週邊裝置114,用以進行拍攝操作。此時,週邊裝置114可能拍攝一識別圖片,並提供一第一輸出影像予待測物104。在此例中,待測物104將該第一輸出影像作為一溝通結果CR3。控制機台116接收溝通結果CR3,用以判斷該第一輸出影像是否具有一特定數字,並根據判斷結果產生一第三測試結果。在一可能實施例中,控制機台116將第一至第三測試結果上傳至一網頁伺服器(Web server)。在此例中,測試人員根據網頁伺服器所記錄的第一至第三測試結果,便可得知待測物104是否可透過輸入/輸出埠106正常地控制週邊裝置110、112及114。 The control machine 116 generates different test results according to the different communication results generated by the test object 104. According to the test results, the tester can know whether the DUT 104 is compatible with different peripheral devices. For example, suppose that the peripheral device 110 is a storage device (such as a flash drive), the peripheral device 112 is a gaming keyboard, and the peripheral device 114 is a camera lens. When the test platform 102 is electrically connected to the input/output port 106 and the peripheral device 110 according to the control signal SC, the DUT 104 may write a specific data to the peripheral device 110, and then read the data of a specific address, using To generate a first read data. In this example, the test object 104 uses the first read data as a communication result CR1. The control machine 116 compares the specific data with the first read data according to the communication result CR1 to generate a first test result. When the test platform 102 is electrically connected to the input/output port 106 and the peripheral device 112 according to the control signal SC, the DUT 104 may read the vendor identification number (VID) and the product identification code ( product identification number; PID), used to generate a first detection result. In this example, The test object 104 uses the first detection result as a communication result CR2. The control machine 116 uses the communication result CR2 as a second test result. When the test platform 102 is electrically connected to the input/output port 106 and the peripheral device 114 according to the control signal SC, the test object 104 may activate the peripheral device 114 for shooting operations. At this time, the peripheral device 114 may take a recognition picture and provide a first output image to the object 104 under test. In this example, the test object 104 uses the first output image as a communication result CR3. The control machine 116 receives the communication result CR3 to determine whether the first output image has a specific number, and generates a third test result according to the determination result. In a possible embodiment, the control machine 116 uploads the first to third test results to a web server. In this example, the tester can know whether the DUT 104 can normally control the peripheral devices 110, 112, and 114 through the input/output port 106 according to the first to third test results recorded by the web server.

在其它實施例中,當測試平台102根據控制信號SC,電性連接輸入/輸出埠108與週邊裝置110時,待測物104可能再次寫入特定資料至週邊裝置110中,再讀取一特定位址的資料,用以產生第二讀取資料。在此例中,待測物104將第二讀取資料作為一溝通結果CR4。控制機台116接收溝通結果CR4,用以判斷第二讀取資料是否等於特定資料,並產生一第四測試結果。當測試平台102根據控制信號SC,電性連接輸入/輸出埠108與週邊裝置112時,待測物104讀取週邊裝置112的供應商識別碼(VID)以及產品識別碼(PID),用以產生一第二檢測結果。在此例中,待測物104將第二檢測結果作為一溝通結果CR5。控制機台116將溝通結果CR5作為一第五測試結果。當測試平台102根據控制信號SC,電性連接輸入/輸出埠106與週邊裝置114時,待測物104可能啟動週邊裝置114,用以進行拍攝操作。此時, 週邊裝置114可能拍攝一識別圖片,並提供一第二輸出影像予待測物104。在此例中,待測物104將該第二輸出影像作為一溝通結果CR6。控制機台116接收溝通結果CR6,用以判斷該第二輸出影像是否具有一特定數字,並根據判斷結果產生一第六測試結果。控制機台116將第四至第六測試結果上傳至網頁伺服器。使用者根據第四至第六測試結果,便可得知待測物104是否可透過輸入/輸出埠108正常地控制週邊裝置110、112及114。 In other embodiments, when the test platform 102 is electrically connected to the input/output port 108 and the peripheral device 110 according to the control signal SC, the DUT 104 may write specific data to the peripheral device 110 again, and then read a specific The data of the address is used to generate the second read data. In this example, the test object 104 uses the second read data as a communication result CR4. The control machine 116 receives the communication result CR4 to determine whether the second read data is equal to the specific data, and generates a fourth test result. When the test platform 102 is electrically connected to the input/output port 108 and the peripheral device 112 according to the control signal SC, the DUT 104 reads the vendor identification code (VID) and product identification code (PID) of the peripheral device 112 for A second test result is generated. In this example, the test object 104 uses the second detection result as a communication result CR5. The control machine 116 uses the communication result CR5 as a fifth test result. When the test platform 102 is electrically connected to the input/output port 106 and the peripheral device 114 according to the control signal SC, the test object 104 may activate the peripheral device 114 for shooting operations. at this time, The peripheral device 114 may take an identification picture and provide a second output image to the object 104 under test. In this example, the test object 104 uses the second output image as a communication result CR6. The control machine 116 receives the communication result CR6 to determine whether the second output image has a specific number, and generates a sixth test result according to the determination result. The control machine 116 uploads the fourth to sixth test results to the web server. According to the fourth to sixth test results, the user can know whether the DUT 104 can normally control the peripheral devices 110, 112, and 114 through the input/output port 108.

本發明並不限定控制機台116的架構。只要能夠接收待測物104的溝通結果CR1~CR6的電路架構,均可作為控制機台116。在其它實施例中,控制信號SC係由控制機台116所產生。在此例中,控制機台116包括一顯示面板118、一主機120、一滑鼠122以及一鍵盤124。 The present invention does not limit the structure of the control machine 116. As long as the circuit structure of CR1 to CR6 can receive the communication results of the DUT 104, it can be used as the control machine 116. In other embodiments, the control signal SC is generated by the control machine 116. In this example, the control machine 116 includes a display panel 118, a host 120, a mouse 122, and a keyboard 124.

在本實施例中,顯示面板118用以呈現一畫面。該畫面具有許多選項,供使用者選擇。在此例中,使用者可透過滑鼠122及/或鍵盤124點選顯示面板118所呈現的選項。主機120再根據使用者所點選的選項,產生控制信號SC。測試平台102根據控制信號SC,電性連接輸入/輸出埠106及108之一者以及週邊裝置110、112及114之一者。舉例而言,當使用者想要檢測待測物104是否可透過輸入/輸出埠106與週邊裝置110溝通時,使用者點選顯示面板118所呈現的選項,用以命令測試平台102電性連接輸入/輸出埠106與週邊裝置110。 In this embodiment, the display panel 118 is used to present a picture. This screen has many options for users to choose. In this example, the user can click on the options presented on the display panel 118 through the mouse 122 and/or the keyboard 124. The host 120 then generates a control signal SC according to the option selected by the user. The test platform 102 is electrically connected to one of the input/output ports 106 and 108 and one of the peripheral devices 110, 112, and 114 according to the control signal SC. For example, when the user wants to detect whether the test object 104 can communicate with the peripheral device 110 through the input/output port 106, the user clicks on the option presented on the display panel 118 to command the test platform 102 to electrically connect The input/output port 106 and the peripheral device 110.

在其它實施例中,顯示面板118呈現待測物104與週邊裝置的溝通結果CR1~CR6。使用者根據顯示面板118所呈現的資訊,得知待測物104是否正常運作。本發明並不限定顯示面板118之種類。 在一可能實施例中,顯示面板118係為一觸控面板。在此例中,使用者可利用手指,直接點選顯示面板118所呈現的選項。在其它實施例中,使用者可能利用其它輸入介面(如觸控筆),點選顯示面板118所呈現的選項。 In other embodiments, the display panel 118 displays the communication results CR1 to CR6 between the object 104 and the peripheral devices. The user knows whether the object under test 104 is operating normally according to the information presented on the display panel 118. The invention does not limit the type of the display panel 118. In a possible embodiment, the display panel 118 is a touch panel. In this example, the user can directly click on the options presented on the display panel 118 with a finger. In other embodiments, the user may use other input interfaces (such as a stylus) to click on the options presented on the display panel 118.

第2圖為本發明之測試平台的方塊示意圖。如圖所示,測試平台102包括基座202、204、一纜線204以及一機械手臂208。基座202包括測試埠TP1及TP2。測試埠TP1具有連接端CT11及CT13。連接端CT11用以耦接待測物的輸入/輸出埠(如106)。連接端CT13用以耦接纜線204。測試埠TP2具有連接端CT12及CT14。連接端CT12用以耦接待測物的輸入/輸出埠(如108)。連接端CT14用以耦接纜線204。在一可能實施例中,連接端CT11與CT12係耦接同一待測物的不同輸入/輸出埠。在另一可能實施例中,連接端CT11與CT12係耦接不同待測物。舉例而言,連接端CT11可能耦接一第一主機板,而連接端CT12可能耦接一第二主機板。本發明並不限定基座202的測試埠數量。在其它實施例中,基座202具有更少或更多的測試埠。 Figure 2 is a block diagram of the test platform of the present invention. As shown in the figure, the test platform 102 includes bases 202 and 204, a cable 204, and a robotic arm 208. The base 202 includes test ports TP1 and TP2. The test port TP1 has connection terminals CT11 and CT13. The connection terminal CT11 is used to couple the input/output port (such as 106) for receiving the test object. The connecting terminal CT13 is used for coupling to the cable 204. The test port TP2 has connection terminals CT12 and CT14. The connection terminal CT12 is used to couple the input/output port (such as 108) for receiving the test object. The connecting terminal CT14 is used for coupling with the cable 204. In a possible embodiment, the connection terminals CT11 and CT12 are coupled to different input/output ports of the same DUT. In another possible embodiment, the connecting terminals CT11 and CT12 are coupled to different DUTs. For example, the connecting terminal CT11 may be coupled to a first motherboard, and the connecting terminal CT12 may be coupled to a second motherboard. The present invention does not limit the number of test ports of the base 202. In other embodiments, the base 202 has fewer or more test ports.

基座206包括週邊埠PP1~PP3。週邊埠PP1包括連接端CT15及CT18。連接端CT15用以耦接纜線204。連接端CT18用以耦接一週邊裝置(如110)。週邊埠PP2包括連接端CT16及CT19。連接端CT16用以耦接纜線204。連接端CT19用以耦接一週邊裝置(如112)。週邊埠PP3包括連接端CT17及CT20。連接端CT17用以耦接纜線204。連接端CT20用以耦接一週邊裝置(如114)。本發明並不限定基座206的週邊埠數量。在其它實施例中,基座206具有更少或更多的週邊埠。 The base 206 includes peripheral ports PP1~PP3. The peripheral port PP1 includes connecting terminals CT15 and CT18. The connecting terminal CT15 is used for coupling to the cable 204. The connecting terminal CT18 is used to couple to a peripheral device (such as 110). The peripheral port PP2 includes connecting terminals CT16 and CT19. The connecting terminal CT16 is used for coupling to the cable 204. The connecting terminal CT19 is used to couple to a peripheral device (such as 112). The peripheral port PP3 includes connecting terminals CT17 and CT20. The connecting terminal CT17 is used for coupling to the cable 204. The connecting terminal CT20 is used to couple to a peripheral device (such as 114). The present invention does not limit the number of peripheral ports of the base 206. In other embodiments, the base 206 has fewer or more peripheral ports.

纜線204包括傳輸埠210、214以及一連接線212。傳輸埠210用以耦接連接端CT13或CT14。傳輸埠214用以耦接連接端CT18、CT19或CT20。連接線212耦接於傳輸埠210與214之間。本發明並不限定傳輸埠210及214的種類。在一可能實施例中,傳輸埠210匹配於測試埠TP1及TP2,傳輸埠214匹配於週邊埠PP1~PP3。在一些實施例中,傳輸埠210及214均為USB連接埠。 The cable 204 includes transmission ports 210 and 214 and a connection line 212. The transmission port 210 is used for coupling to the connection terminal CT13 or CT14. The transmission port 214 is used to couple the connection terminals CT18, CT19 or CT20. The connection line 212 is coupled between the transmission ports 210 and 214. The invention does not limit the types of the transmission ports 210 and 214. In a possible embodiment, the transmission port 210 is matched to the test ports TP1 and TP2, and the transmission port 214 is matched to the peripheral ports PP1 to PP3. In some embodiments, the transmission ports 210 and 214 are both USB ports.

機械手臂208根據控制信號SC移動傳輸埠210,使得傳輸埠210耦接連接端CT13或CT14。此外,機械手臂208也根據控制信號SC移動傳輸埠214,使得傳輸埠214耦接連接端CT15~CT17之一者。本發明並不限定機械手臂208如何移動傳輸埠210及214。在一可能實施例中,機械手臂208具有一夾爪224。夾爪224直接抓取並移動傳輸埠210及214。 The robotic arm 208 moves the transmission port 210 according to the control signal SC, so that the transmission port 210 is coupled to the connection terminal CT13 or CT14. In addition, the robotic arm 208 also moves the transmission port 214 according to the control signal SC, so that the transmission port 214 is coupled to one of the connection terminals CT15 to CT17. The invention does not limit how the robotic arm 208 moves the transmission ports 210 and 214. In a possible embodiment, the robotic arm 208 has a clamping jaw 224. The gripper 224 directly grabs and moves the transmission ports 210 and 214.

在其它實施例中,測試平台102更包括轉接頭216及218。轉接頭216安裝在纜線204的一端,用以固定傳輸埠210。轉接頭218安裝在纜線204的另一端,用以固定轉接頭216。在此例中,夾爪224抓取並移動轉接頭216,使得傳輸埠210耦接連接端CT13或CT14。同樣地,夾爪224抓取並移動轉接頭218,使得傳輸埠214耦接連接端CT15、CT16或CT17。 In other embodiments, the test platform 102 further includes adapters 216 and 218. The adapter 216 is installed at one end of the cable 204 to fix the transmission port 210. The adapter 218 is installed at the other end of the cable 204 to fix the adapter 216. In this example, the clamping jaw 224 grabs and moves the adapter 216 so that the transmission port 210 is coupled to the connection terminal CT13 or CT14. Similarly, the clamping jaw 224 grabs and moves the adapter 218 so that the transmission port 214 is coupled to the connection terminal CT15, CT16, or CT17.

在本實施例中,轉接頭216具有一開口220,用以露出傳輸埠210。此外,轉接頭216具有一收容空間,用以容納傳輸埠210及連接線212。同樣地,轉接頭218具有一開口222,用以露出傳輸埠214。此外,轉接頭218具有一收容空間,用以容納傳輸埠214及連接線212。 In this embodiment, the adapter 216 has an opening 220 for exposing the transmission port 210. In addition, the adapter 216 has a accommodating space for accommodating the transmission port 210 and the connection line 212. Similarly, the adapter 218 has an opening 222 for exposing the transmission port 214. In addition, the adapter 218 has a accommodating space for accommodating the transmission port 214 and the connection line 212.

在其它實施例中,轉接頭216及218具有一磁性構件(未顯示)。在此例中,機械手臂208也具有一磁性構件(未顯示),用以取代夾爪224。當機械手臂208接近轉接頭216時,機械手臂208的磁性構件吸取轉接頭216的磁性構件。因此,轉接頭216(連同傳輸埠210)隨著機械手臂208而移動。同樣地,當機械手臂208接近轉接頭218時,機械手臂208的磁性構件吸取轉接頭218的磁性構件。因此,轉接頭218(連同傳輸埠214)隨著機械手臂208而移動。 In other embodiments, the adapters 216 and 218 have a magnetic member (not shown). In this example, the robotic arm 208 also has a magnetic member (not shown) to replace the clamping jaw 224. When the robot arm 208 approaches the adapter 216, the magnetic member of the robot arm 208 absorbs the magnetic member of the adapter 216. Therefore, the adapter 216 (together with the transmission port 210) moves with the robot 208. Similarly, when the robot arm 208 approaches the adapter 218, the magnetic member of the robot arm 208 absorbs the magnetic member of the adapter 218. Therefore, the adapter 218 (together with the transmission port 214) moves with the robot 208.

在本實施例中,控制信號SC係由一控制電路200所產生。在此例中,控制電路200執行一測試程式,用以產生控制信號SC。在其它實施例中,控制電路200係位於第1圖的主機120之中。 In this embodiment, the control signal SC is generated by a control circuit 200. In this example, the control circuit 200 executes a test program to generate the control signal SC. In other embodiments, the control circuit 200 is located in the host 120 in FIG. 1.

第3A圖為本發明之基座的俯視圖。由於基座202與206的架構相同,故第3A圖僅顯示基座202的架構。在本實施例中,基座202包括基板300、302、304、306、308及測試埠TP1、TP2。 Figure 3A is a top view of the base of the present invention. Since the structures of the bases 202 and 206 are the same, FIG. 3A only shows the structure of the base 202. In this embodiment, the base 202 includes substrates 300, 302, 304, 306, 308 and test ports TP1, TP2.

測試埠TP1貫穿基板308、302及300。基板308固定於基板302之上。在本實施例中,基板308具有固定孔310、312、314以及316。當四螺絲(未顯示)分別扣入固定孔310、312、314及316時,便可將基板308固定於基板302之上。在其它實施例中,基板308具有更多或更少的固定孔。在本實施例中,固定孔310、312、314及316位於基板308的四個角落,但並非用以限制本發明。在其它實施例中,固定孔310、312、314及316可能位於基板308的其它位置。 The test port TP1 penetrates through the substrates 308, 302, and 300. The substrate 308 is fixed on the substrate 302. In this embodiment, the substrate 308 has fixing holes 310, 312, 314, and 316. When the four screws (not shown) are respectively screwed into the fixing holes 310, 312, 314, and 316, the substrate 308 can be fixed on the substrate 302. In other embodiments, the substrate 308 has more or fewer fixing holes. In this embodiment, the fixing holes 310, 312, 314, and 316 are located at the four corners of the substrate 308, but they are not used to limit the present invention. In other embodiments, the fixing holes 310, 312, 314, and 316 may be located in other positions of the substrate 308.

基板302固定於基板300之上。在本實施例中,基板302具有固定孔318以及320。當兩螺絲(未顯示)分別扣入固定孔318及320時,便可將基板302固定於基板300之上。在其它實施例中,基板302 具有更多或更少的固定孔。在本實施例中,固定孔318及320位於基板302的兩側,但並非用以限制本發明。在另一實施例中,固定孔318及320可能位於基板302的其它位置。 The substrate 302 is fixed on the substrate 300. In this embodiment, the substrate 302 has fixing holes 318 and 320. When two screws (not shown) are respectively screwed into the fixing holes 318 and 320, the substrate 302 can be fixed on the substrate 300. In other embodiments, the substrate 302 There are more or fewer fixing holes. In this embodiment, the fixing holes 318 and 320 are located on both sides of the substrate 302, but they are not used to limit the present invention. In another embodiment, the fixing holes 318 and 320 may be located in other positions of the substrate 302.

測試埠TP2貫穿基板306、304及300。基板306固定於基板304之上。在本實施例中,基板306具有固定孔322、324、326以及328。當四螺絲(未顯示)分別扣入固定孔322、324、326以及328時,便可將基板306固定於基板304之上。在其它實施例中,基板306具有更多或更少的固定孔。在本實施例中,固定孔322、324、326以及328位於基板306的四個角落,但並非用以限制本發明。在另一實施例中,固定孔322、324、326以及328可能位於基板306的其它位置。 The test port TP2 penetrates through the substrates 306, 304, and 300. The substrate 306 is fixed on the substrate 304. In this embodiment, the substrate 306 has fixing holes 322, 324, 326, and 328. When four screws (not shown) are respectively screwed into the fixing holes 322, 324, 326, and 328, the substrate 306 can be fixed on the substrate 304. In other embodiments, the substrate 306 has more or fewer fixing holes. In this embodiment, the fixing holes 322, 324, 326, and 328 are located at the four corners of the substrate 306, but they are not used to limit the present invention. In another embodiment, the fixing holes 322, 324, 326 and 328 may be located in other positions of the substrate 306.

基板304固定於基板300之上。在本實施例中,基板304具有固定孔330以及332。當兩螺絲(未顯示)分別扣入固定孔330以及332時,便可將基板304固定於基板300之上。在其它實施例中,基板304具有更多或更少的固定孔。在本實施例中,固定孔330以及332位於基板304的兩側,但並非用以限制本發明。在另一實施例中,固定孔330以及332可能位於基板304的其它位置。 The substrate 304 is fixed on the substrate 300. In this embodiment, the substrate 304 has fixing holes 330 and 332. When two screws (not shown) are respectively screwed into the fixing holes 330 and 332, the substrate 304 can be fixed on the substrate 300. In other embodiments, the substrate 304 has more or fewer fixing holes. In this embodiment, the fixing holes 330 and 332 are located on both sides of the substrate 304, but they are not used to limit the present invention. In another embodiment, the fixing holes 330 and 332 may be located in other positions of the substrate 304.

以測試埠TP1為例,當測試埠TP1發生故障時,使用者鬆開固定孔310、312、314及316的螺絲,便可將基板308從基板302上缷下。使用者可能拔除基板308上的故障測試埠,再將正常的測試埠先安裝在基板308之中,再將具有正常測試埠的基板308重新固定於基板302之上。 Taking the test port TP1 as an example, when the test port TP1 fails, the user loosens the screws of the fixing holes 310, 312, 314, and 316, and the substrate 308 can be unwound from the substrate 302. The user may remove the faulty test port on the substrate 308, and then install the normal test port in the substrate 308 first, and then fix the substrate 308 with the normal test port on the substrate 302 again.

第3B圖為基板202的側視圖。由於測試埠TP1與TP2的特性相似,故以測試埠TP2為例。如圖所示,測試埠TP2貫穿基板306、 304及300。基板306具有一上表面以及一下表面。基板306的上表面相對於基板306的下表面。測試埠TP2的連接端CT14由基板306的上表面露出。基板306的下表面接觸基板304的上表面。基板304更具有一下表面。基板304的下表面相對於基板304的上表面。基板304的下表面接觸基板300的上表面。基板300更具有一下表面。基板300的下表面相對於基板300的上表面。在本實施例中,測試埠TP2的連接端CT12由基板300的下表面露出,用以連接一待測物的輸入/輸出埠。 FIG. 3B is a side view of the substrate 202. Since the test port TP1 and TP2 have similar characteristics, take the test port TP2 as an example. As shown in the figure, the test port TP2 penetrates the substrate 306, 304 and 300. The substrate 306 has an upper surface and a lower surface. The upper surface of the substrate 306 is opposite to the lower surface of the substrate 306. The connection terminal CT14 of the test port TP2 is exposed from the upper surface of the substrate 306. The lower surface of the substrate 306 contacts the upper surface of the substrate 304. The substrate 304 further has a lower surface. The lower surface of the substrate 304 is opposite to the upper surface of the substrate 304. The lower surface of the substrate 304 contacts the upper surface of the substrate 300. The substrate 300 further has a lower surface. The lower surface of the substrate 300 is opposite to the upper surface of the substrate 300. In this embodiment, the connection terminal CT12 of the test port TP2 is exposed from the bottom surface of the substrate 300 and is used to connect to an input/output port of an object under test.

在本實施例中,基板300的高度d1約為8毫米(millimeter;以下簡稱mm),基板304的高度d2以及基板306的高度d3約為15mm。另外,測試埠TP1與TP2所露出的高度d4約為15mm。在本實施例中,高度d1~d4與機械手臂的力度有關。 In this embodiment, the height d1 of the substrate 300 is approximately 8 millimeters (millimeter; hereinafter referred to as mm), and the height d2 of the substrate 304 and the height d3 of the substrate 306 are approximately 15 mm. In addition, the exposed height d4 of the test ports TP1 and TP2 is approximately 15 mm. In this embodiment, the heights d1 to d4 are related to the strength of the robotic arm.

第4A圖為本發明之基座202的另一實施例。如圖所示,基座202包括基板400、402、404及測試埠TP1、TP2。測試埠TP1與TP2貫穿基板404、402、400。基板404固定於基板402之上。在本實施例中,基板404具有固定孔406、408、410及412。當四螺絲(未顯示)分別扣入固定孔406、408、410及412時,便可將基板404固定於基板402之上。在其它實施例中,基板404具有更多或更少的固定孔。在本實施例中,固定孔406、408、410及412位於基板404的四個角落,但並非用以限制本發明。在其它實施例中,固定孔406、408、410及412可能位於基板404的其它位置。 Figure 4A shows another embodiment of the base 202 of the present invention. As shown in the figure, the base 202 includes substrates 400, 402, 404 and test ports TP1, TP2. The test ports TP1 and TP2 penetrate through the substrates 404, 402, and 400. The substrate 404 is fixed on the substrate 402. In this embodiment, the substrate 404 has fixing holes 406, 408, 410, and 412. When four screws (not shown) are respectively screwed into the fixing holes 406, 408, 410, and 412, the substrate 404 can be fixed on the substrate 402. In other embodiments, the substrate 404 has more or fewer fixing holes. In this embodiment, the fixing holes 406, 408, 410, and 412 are located at the four corners of the substrate 404, but they are not used to limit the present invention. In other embodiments, the fixing holes 406, 408, 410 and 412 may be located at other positions of the substrate 404.

基板402固定於基板400之上。在本實施例中,基板402具有固定孔414以及416。當兩螺絲(未顯示)分別扣入固定孔414以及416時,便可將基板402固定於基板400之上。在其它實施例中,基板 402具有更多或更少的固定孔。在本實施例中,固定孔414以及416位於基板42的兩側,但並非用以限制本發明。在另一實施例中,固定孔414以及416可能位於基板402的其它位置。 The substrate 402 is fixed on the substrate 400. In this embodiment, the substrate 402 has fixing holes 414 and 416. When two screws (not shown) are respectively screwed into the fixing holes 414 and 416, the substrate 402 can be fixed on the substrate 400. In other embodiments, the substrate 402 has more or fewer fixing holes. In this embodiment, the fixing holes 414 and 416 are located on both sides of the substrate 42, but they are not used to limit the present invention. In another embodiment, the fixing holes 414 and 416 may be located in other positions of the substrate 402.

第4B圖為第4圖的基板202的側視圖。在本實施例中,測試埠TP1及TP2貫穿基板400、402及404。基板404具有一上表面以及一下表面。基板404的上表面相對於基板404的下表面。測試埠TP1及TP2的連接端CT13及CT14由基板404的上表面露出。基板404的下表面接觸基板402的上表面。基板402更具有一下表面。基板402的下表面相對於基板402的上表面。基板402的下表面接觸基板400的上表面。基板400更具有一下表面。基板400的下表面相對於基板400的上表面。在本實施例中,測試埠TP1及TP2的連接端CT11及CT12由基板400的下表面露出,用以連接一待測物的輸入/輸出埠。 FIG. 4B is a side view of the substrate 202 in FIG. 4. In this embodiment, the test ports TP1 and TP2 penetrate through the substrates 400, 402, and 404. The substrate 404 has an upper surface and a lower surface. The upper surface of the substrate 404 is opposite to the lower surface of the substrate 404. The connection ends CT13 and CT14 of the test ports TP1 and TP2 are exposed from the upper surface of the substrate 404. The lower surface of the substrate 404 contacts the upper surface of the substrate 402. The substrate 402 further has a lower surface. The lower surface of the substrate 402 is opposite to the upper surface of the substrate 402. The lower surface of the substrate 402 contacts the upper surface of the substrate 400. The substrate 400 further has a lower surface. The lower surface of the substrate 400 is opposite to the upper surface of the substrate 400. In this embodiment, the connection terminals CT11 and CT12 of the test ports TP1 and TP2 are exposed from the bottom surface of the substrate 400 and are used to connect to an input/output port of an object under test.

在本實施例中,基板400的高度d5約為8mm,基板402的高度d6以及基板404的高度d7約為15mm。另外,測試埠TP1與TP2所露出的高度d8約為15mm。在一可能實施例中,高度d5~d8與機械手臂的力度有關。 In this embodiment, the height d5 of the substrate 400 is approximately 8 mm, the height d6 of the substrate 402 and the height d7 of the substrate 404 are approximately 15 mm. In addition, the exposed height d8 of the test ports TP1 and TP2 is approximately 15 mm. In a possible embodiment, the heights d5 to d8 are related to the strength of the robotic arm.

第5A圖為本發明之纜線204的側視圖。如圖所示,轉接頭216設置於纜線204的一端,用以固定傳輸埠210。在本實施例中,轉接頭216具有一收容空間502以及一開口220。收容空間502用以容納傳輸埠210以及連接線212。開口220用以露出傳輸埠210。另外,轉接頭218設置於纜線204的一端,用以固定傳輸埠214。在本實施例中,轉接頭218具有一收容空間508以及一開口222。收容空間508用以容納傳輸埠214以及連接線212。開口222用以露出傳輸埠214。 Figure 5A is a side view of the cable 204 of the present invention. As shown in the figure, the adapter 216 is disposed at one end of the cable 204 for fixing the transmission port 210. In this embodiment, the adapter 216 has a receiving space 502 and an opening 220. The accommodating space 502 is used for accommodating the transmission port 210 and the connection line 212. The opening 220 is used to expose the transmission port 210. In addition, the adapter 218 is disposed at one end of the cable 204 to fix the transmission port 214. In this embodiment, the adapter 218 has a receiving space 508 and an opening 222. The accommodating space 508 is used for accommodating the transmission port 214 and the connection line 212. The opening 222 is used to expose the transmission port 214.

第5B圖為本發明之轉接頭的側視圖。由於轉接頭216及218的架構相同,故第5B圖僅顯示轉接頭216。如圖所示,轉接頭216包括構件511、512、514、一定位構件516以及一彈性構件518。傳輸埠210由構件511的下表面露出。構件511的上表面接觸構件512。在此例中,一貫孔520貫穿構件511及512。貫孔520的一開口作為開口220,用以露出傳輸埠210。構件514具有一溝槽522。在此例中,連接線212由構件514的側面進入溝槽522,並由構件514的下表面露出,並延伸進入貫孔520。 Figure 5B is a side view of the adapter of the present invention. Since the adapters 216 and 218 have the same structure, only the adapter 216 is shown in FIG. 5B. As shown in the figure, the adapter 216 includes members 511, 512, 514, a positioning member 516 and an elastic member 518. The transmission port 210 is exposed from the lower surface of the member 511. The upper surface of the member 511 contacts the member 512. In this example, a through hole 520 penetrates through the members 511 and 512. An opening of the through hole 520 serves as an opening 220 for exposing the transmission port 210. The member 514 has a groove 522. In this example, the connecting wire 212 enters the groove 522 from the side surface of the member 514, is exposed from the lower surface of the member 514, and extends into the through hole 520.

定位構件516固定於構件514的上表面。在本實施例中,定位構件516具有定位板516A及516B。定位板516A固定於構件514的一側,定位板516B固定於構件514的另一側。彈性構件518具有緩衝及避震功能,並設置於構件512及514之間。在本實施例中,彈性構件518包括彈簧518A~518D,用以減緩機械手臂施加於轉接頭216的力道。 The positioning member 516 is fixed to the upper surface of the member 514. In this embodiment, the positioning member 516 has positioning plates 516A and 516B. The positioning plate 516A is fixed to one side of the member 514, and the positioning plate 516B is fixed to the other side of the member 514. The elastic member 518 has buffering and shock-absorbing functions, and is disposed between the members 512 and 514. In this embodiment, the elastic member 518 includes springs 518A to 518D to slow down the force applied by the robot arm to the adapter 216.

在一可能實施例中,傳輸埠210露出的高度d11約為10mm。此外,構件511的高度d12、構件512的高度d13以及構件514的高度d14約為10mm。另外,定位板516A的高度d15及定位板516B的高度d16約為6mm。 In a possible embodiment, the exposed height d11 of the transmission port 210 is about 10 mm. In addition, the height d12 of the member 511, the height d13 of the member 512, and the height d14 of the member 514 are approximately 10 mm. In addition, the height d15 of the positioning plate 516A and the height d16 of the positioning plate 516B are approximately 6 mm.

第5C圖為轉接頭216的俯視圖。如圖所示,定位板516A包括定位孔524、526以及一固定孔528,定位板516B包括定位孔530、532以及一固定孔534。定位孔524、526、530及532用以供機械手臂對準用。當機械手臂的四定位柱分別插入定位孔524、526、530 及532時,表示機械手臂已對轉接頭216。因此,機械手臂抓取轉接頭216。 FIG. 5C is a top view of the adapter 216. As shown in the figure, the positioning plate 516A includes positioning holes 524 and 526 and a fixing hole 528, and the positioning plate 516B includes positioning holes 530 and 532 and a fixing hole 534. The positioning holes 524, 526, 530, and 532 are used for aligning the robot arm. When the four positioning posts of the robotic arm are inserted into the positioning holes 524, 526, 530 At 532, it means that the robot arm has aligned the adapter 216. Therefore, the robot arm grabs the adapter 216.

固定孔528及534用以固定定位板516A。當兩螺絲(未顯示)分別扣入固定孔528及534時,便可將定位板516A固定在構件514之上。在本實施例中,固定孔528位於定位孔524及526之間,並且固定孔534位於定位孔530及532之間,但並非用以限制本發明。另外,本發明並不限定固定孔的數量。以定位板516A為例,定位板516A可能具有更多的固定孔。本發明亦不限定定位孔的數量。以定位板516A為例,定位板516A可能具有更少或更多的定位孔。 The fixing holes 528 and 534 are used to fix the positioning plate 516A. When two screws (not shown) are respectively screwed into the fixing holes 528 and 534, the positioning plate 516A can be fixed on the member 514. In this embodiment, the fixing hole 528 is located between the positioning holes 524 and 526, and the fixing hole 534 is located between the positioning holes 530 and 532, but it is not intended to limit the present invention. In addition, the present invention does not limit the number of fixing holes. Taking the positioning plate 516A as an example, the positioning plate 516A may have more fixing holes. The invention also does not limit the number of positioning holes. Taking the positioning plate 516A as an example, the positioning plate 516A may have fewer or more positioning holes.

在一些實施例中,構件514更包括凹槽536及538。在此例中,機械手臂的夾爪係扣入凹槽536及538,用以抓取轉接頭216。在其它實施例中,當機械手臂係以磁力吸取轉接頭216時,則可省略凹槽536及538。 In some embodiments, the member 514 further includes grooves 536 and 538. In this example, the jaws of the robotic arm are snapped into the grooves 536 and 538 to grab the adapter 216. In other embodiments, when the robot arm is magnetically sucking the adapter 216, the grooves 536 and 538 can be omitted.

第6圖為本發明之機械手臂的示意圖。如圖所示,機械手臂208包括定位柱602、604、606及608以及夾爪610、612。請配合第5C圖,當定位柱602、604、606及608插入定位孔524、526、530及532時,夾爪610及612便可準確地夾取轉接頭216。在一可能實施例中,夾爪610及612係為可拆缷式。測試人員可根據不同的轉接頭,安裝不同的夾爪於機械手臂208中。在本實施例中,定位柱602、604、606及608構成一定位構件。 Figure 6 is a schematic diagram of the robotic arm of the present invention. As shown in the figure, the robotic arm 208 includes positioning posts 602, 604, 606, and 608 and clamping jaws 610, 612. Please refer to Figure 5C. When the positioning posts 602, 604, 606, and 608 are inserted into the positioning holes 524, 526, 530, and 532, the clamping jaws 610 and 612 can accurately clamp the adapter 216. In a possible embodiment, the clamping jaws 610 and 612 are detachable. The tester can install different clamping jaws in the robotic arm 208 according to different adapters. In this embodiment, the positioning posts 602, 604, 606, and 608 constitute a positioning member.

第7圖為本發明之測試軟體的主界面。當使用者開啟測試軟體時,顯示面板(如第1圖的118)呈現畫面700。畫面700具有許多 選項,供使用者選擇。在此例中,主機120根據使用者所選擇的選項,設定一測試程式裡的相對應參數,並執行測試程式。 Figure 7 is the main interface of the test software of the present invention. When the user starts the test software, the display panel (such as 118 in FIG. 1) displays a screen 700. The screen 700 has many Options for users to choose. In this example, the host 120 sets corresponding parameters in a test program according to the options selected by the user, and executes the test program.

請搭配第1圖,當使用者點選選項702及706時,表示使用者想要測試待測物104是否可透過輸入/輸出埠106正常地與週邊裝置110溝通。因此,主機120透過控制信號SC,命令測試平台102電性連接輸入/輸出埠106與週邊裝置110。此時,待測物104根據週邊裝置110所提供的資訊而動作。在一可能實施例中,主機120監控待測物104的動作,用以產生一測試結果,並將測試結果呈現於視窗716中。 Please match with Figure 1. When the user clicks on the options 702 and 706, it means that the user wants to test whether the DUT 104 can communicate with the peripheral device 110 through the input/output port 106 normally. Therefore, the host 120 instructs the test platform 102 to electrically connect the input/output port 106 and the peripheral device 110 through the control signal SC. At this time, the object under test 104 acts according to the information provided by the peripheral device 110. In a possible embodiment, the host 120 monitors the action of the object under test 104 to generate a test result and present the test result in the window 716.

在其它實施例中,當使用者點選選項702、708及710時,表示使用者想要測試待測物104是否可透過輸入/輸出埠106正常地與週邊裝置112及114溝通。因此,主機120命令測試平台102先電性連接輸入/輸出埠106與週邊裝置112,並監控待測物104的動作,用以產生一第一測試結果,並呈現第一測試結果於視窗716中。接著,主機120再命令測試平台102電性連接輸入/輸出埠106與週邊裝置114。此時,主機120再次監控待測物104的動作,用以產生一第二測試結果,並呈現第二測試結果於視窗716中。在其它實施例中,主機120將每一測試結果上傳至網頁伺服器。因此,測試人員不必一直待在待測物旁,便可遠端即時監控測試結果,提高工作效率。 In other embodiments, when the user clicks on the options 702, 708, and 710, it means that the user wants to test whether the DUT 104 can normally communicate with the peripheral devices 112 and 114 through the input/output port 106. Therefore, the host 120 instructs the test platform 102 to first electrically connect the input/output port 106 and the peripheral device 112, and monitor the action of the DUT 104 to generate a first test result, and present the first test result in the window 716 . Then, the host 120 instructs the test platform 102 to electrically connect the input/output port 106 and the peripheral device 114. At this time, the host 120 monitors the action of the object under test 104 again to generate a second test result, and present the second test result in the window 716. In other embodiments, the host 120 uploads each test result to the web server. Therefore, the tester does not have to stay by the object to be tested all the time, and can remotely monitor the test results in real time and improve work efficiency.

在一可能實施例中,當測試平台102電性連接輸入/輸出埠106失敗時,視窗716呈現一失敗訊息。在此例中,測試人員按下選項712,用以暫停測試平台102的動作。當測試人員排除故障時,再點選選項714,命令測試平台102繼續動作。 In one possible embodiment, when the test platform 102 fails to electrically connect to the input/output port 106, the window 716 displays a failure message. In this example, the tester presses option 712 to suspend the operation of the test platform 102. When the tester removes the fault, he then clicks option 714 to instruct the test platform 102 to continue its action.

在其它實施例中,使用者透過選項718、720、722及724,控制測試平台102裡的機械手臂,用以排除測試平台102的故障。舉例而言,當測試平台102的機械手臂發生對位誤差時,機械手臂可能無法對準轉接頭,因而無法移動轉接頭。在此例中,使用者點選選項718。因此,主機120執行一初始化程式,用以命令機械手臂回到一初始位置。在一些實施例中,當使用者點選選項720時,主機120命令機械手臂停止動作。當使用者點選選項722時,主機120命令機械手臂暫停動作。當使用者點選選項724時,主機120命令機械手臂恢復動作。 In other embodiments, the user controls the robot arm in the test platform 102 through the options 718, 720, 722, and 724 to troubleshoot the test platform 102. For example, when an alignment error occurs in the robot arm of the test platform 102, the robot arm may not be able to align the adaptor, and therefore cannot move the adaptor. In this example, the user clicks option 718. Therefore, the host 120 executes an initialization program to command the robot arm to return to an initial position. In some embodiments, when the user clicks the option 720, the host 120 commands the robotic arm to stop. When the user clicks the option 722, the host 120 commands the mechanical arm to pause. When the user clicks the option 724, the host 120 commands the mechanical arm to resume movement.

第8圖為本發明的主機的控制方法示意圖。請配合本案第2圖,首先,主機120的控制電路200設定參數m及n等於1(步驟S801)。接著,控制電路200根據參數m,命令機械手臂208移動傳輸埠210(步驟S802)。在本實施例中,由於參數m=1,故控制電路200要求機械手臂208將傳輸埠210插入測試埠TP1的連接端CT13。 Figure 8 is a schematic diagram of the host control method of the present invention. Please cooperate with Figure 2 of this case. First, the control circuit 200 of the host 120 sets the parameters m and n to be equal to 1 (step S801). Next, the control circuit 200 commands the robotic arm 208 to move the transmission port 210 according to the parameter m (step S802). In this embodiment, since the parameter m=1, the control circuit 200 requests the robotic arm 208 to insert the transmission port 210 into the connection terminal CT13 of the test port TP1.

接著,控制電路200判斷傳輸埠210是否插入連接端CT13(步驟S803)。在一可能實施例中,控制電路200係根據連接端CT13的一第一特定接腳的位準,判斷傳輸埠210是否插入連接端CT13。舉例而言,當連接端CT13的第一特定接腳的位準不等於一第一預設值時,表示傳輸埠210未插入連接端CT13。因此,控制電路200命令機械手臂208暫停動作(步驟S804)。 Next, the control circuit 200 determines whether the transmission port 210 is inserted into the connection terminal CT13 (step S803). In a possible embodiment, the control circuit 200 determines whether the transmission port 210 is inserted into the connection terminal CT13 according to the level of a first specific pin of the connection terminal CT13. For example, when the level of the first specific pin of the connection terminal CT13 is not equal to a first preset value, it means that the transmission port 210 is not inserted into the connection terminal CT13. Therefore, the control circuit 200 instructs the robot arm 208 to suspend the operation (step S804).

當連接端CT13的第一特定接腳的位準等於第一預設值時,表示傳輸埠210插入連接端CT13。因此,控制電路200根據參數n,命令機械手臂208移動傳輸埠214(步驟S805)。在本實施例中,由於參 數n=1,故控制電路200命令機械手臂208將傳輸埠214插入週邊埠PP1的連接端CT15。 When the level of the first specific pin of the connection terminal CT13 is equal to the first preset value, it means that the transmission port 210 is inserted into the connection terminal CT13. Therefore, the control circuit 200 commands the robotic arm 208 to move the transmission port 214 according to the parameter n (step S805). In this embodiment, due to the The number n=1, so the control circuit 200 commands the robotic arm 208 to insert the transmission port 214 into the connection terminal CT15 of the peripheral port PP1.

接著,控制電路200判斷傳輸埠214是否插入連接端CT15(步驟S806)。在一可能實施例中,控制電路200係根據連接端CT13的一第二特定接腳的位準,判斷傳輸埠214是否插入連接端CT15。舉例而言,當連接端CT13的第二特定接腳不等於一第二預設值時,表示傳輸埠214未插入連接端CT15。因此,控制電路200暫停機械手臂208的動作(步驟S807)。 Next, the control circuit 200 determines whether the transmission port 214 is inserted into the connection terminal CT15 (step S806). In a possible embodiment, the control circuit 200 determines whether the transmission port 214 is inserted into the connection terminal CT15 according to the level of a second specific pin of the connection terminal CT13. For example, when the second specific pin of the connection terminal CT13 is not equal to a second preset value, it means that the transmission port 214 is not inserted into the connection terminal CT15. Therefore, the control circuit 200 suspends the operation of the robot arm 208 (step S807).

當連接端CT13的第二特定接腳等於第二預設值時,表示傳輸埠214插入連接端CT15。因此,控制電路200監控待測物104的動作,用以產生一第一測試結果(步驟S808)。接著,控制電路200判斷參數n是否達一第一臨界值(步驟S809)。在一可能實施例中,第一臨界值與週邊裝置的數量有關。在本實施例中,由於測試平台102耦接三個週邊裝置,故第一臨界值為數值3。在其它實施例中,如果測試系統平台102耦接十七個週邊裝置,則第一臨界值為數值17。 When the second specific pin of the connection terminal CT13 is equal to the second preset value, it means that the transmission port 214 is inserted into the connection terminal CT15. Therefore, the control circuit 200 monitors the action of the test object 104 to generate a first test result (step S808). Next, the control circuit 200 determines whether the parameter n reaches a first critical value (step S809). In a possible embodiment, the first threshold is related to the number of peripheral devices. In this embodiment, since the test platform 102 is coupled to three peripheral devices, the first threshold value is 3. In other embodiments, if the test system platform 102 is coupled to seventeen peripheral devices, the first threshold value is 17.

由於參數n=1,未達第一臨界值(如3),故控制電路200設定參數n=2(步驟S810),並回到步驟S805,再次根據參數n,命令機械手臂208移動傳輸埠214。在此例中,由於參數n=2,故機械手臂208將傳輸埠214插入連接端CT16。接著,控制電路200判斷傳輸埠214是否插入連接端CT16(步驟S806)。當傳輸埠214未插入連接端CT16時,控制電路200暫停測試動作(步驟S807)。 Since the parameter n=1 does not reach the first critical value (such as 3), the control circuit 200 sets the parameter n=2 (step S810), and returns to step S805, again according to the parameter n, commands the robotic arm 208 to move the transmission port 214 . In this example, since the parameter n=2, the robot arm 208 inserts the transmission port 214 into the connection terminal CT16. Next, the control circuit 200 determines whether the transmission port 214 is inserted into the connection terminal CT16 (step S806). When the transmission port 214 is not inserted into the connection terminal CT16, the control circuit 200 suspends the test operation (step S807).

當傳輸埠214插入連接端CT16時,控制電路200監控待測物104的動作,用以產生一第二測試結果(步驟S808)。接著,控制 電路200判斷參數n是否達第一臨界值(步驟S809)。此時,由於參數n=2,未達第一臨界值(如3),故控制電路200設定參數n=3(步驟S810),並回到步驟S805,命令機械手臂208將傳輸埠214插入連接端CT17。控制電路200判斷傳輸埠214是否插入連接端CT17(步驟S806)。當傳輸埠214未插入連接端CT17時,控制電路200暫停測試動作(步驟S807)。 When the transmission port 214 is inserted into the connection terminal CT16, the control circuit 200 monitors the action of the DUT 104 to generate a second test result (step S808). Next, control The circuit 200 determines whether the parameter n reaches the first critical value (step S809). At this time, since the parameter n=2 does not reach the first critical value (such as 3), the control circuit 200 sets the parameter n=3 (step S810), and returns to step S805 to instruct the robotic arm 208 to insert the transmission port 214 into the connection Terminal CT17. The control circuit 200 determines whether the transmission port 214 is inserted into the connection terminal CT17 (step S806). When the transmission port 214 is not inserted into the connection terminal CT17, the control circuit 200 suspends the test operation (step S807).

當傳輸埠214插入連接端CT17時,控制電路200監控待測物104的動作,用以產生一第三測試結果(步驟S808)。接著,控制電路200判斷參數n是否達第一臨界值(步驟S809)。此時,由於參數n=3,已達第一臨界值,故控制電路200判斷參數m是否達一第二臨界值(步驟S811)。在本實施例中,第二臨界值與待測物104欲測試的輸入/輸出埠的數量有關。由於待測物104具有兩輪入/輸出埠,故第二臨界值為2。在此例中,由於參數m=1,未達第二臨界值,故控制電路200設定參數m=2,並設定參數n=1,再回到步驟S802。 When the transmission port 214 is inserted into the connection terminal CT17, the control circuit 200 monitors the action of the DUT 104 to generate a third test result (step S808). Next, the control circuit 200 determines whether the parameter n reaches the first critical value (step S809). At this time, since the parameter n=3 and the first critical value has been reached, the control circuit 200 determines whether the parameter m has reached a second critical value (step S811). In this embodiment, the second threshold is related to the number of input/output ports to be tested by the DUT 104. Since the DUT 104 has two rounds of input/output ports, the second threshold value is 2. In this example, since the parameter m=1 and the second critical value is not reached, the control circuit 200 sets the parameter m=2 and sets the parameter n=1, and then returns to step S802.

由於參數m=2,故控制電路200命令機械手臂208移動傳輸埠210,用以將傳輸埠210插入連接端CT14(步驟S802)。控制電路200判斷傳輸埠210是否插入連接端CT14(步驟S803)。當傳輸埠210未插入連接端CT14時,控制電路200暫停測試動作(步驟S804)。 Since the parameter m=2, the control circuit 200 commands the robotic arm 208 to move the transmission port 210 to insert the transmission port 210 into the connection terminal CT14 (step S802). The control circuit 200 determines whether the transmission port 210 is inserted into the connection terminal CT14 (step S803). When the transmission port 210 is not inserted into the connection terminal CT14, the control circuit 200 suspends the test operation (step S804).

當傳輸埠210插入連接端CT14時,控制電路200根據參數n,命令機械手臂208移動傳輸埠214。此時,由於參數n=1,故機械手臂208將傳輸埠214插入連接端CT15。接著,控制電路200判斷傳 輸埠214是否插入連接端CT15(步驟S806)。當傳輸埠214未插入連接端CT15時,控制電路200暫停測試動作(步驟S807)。 When the transmission port 210 is inserted into the connection terminal CT14, the control circuit 200 instructs the robotic arm 208 to move the transmission port 214 according to the parameter n. At this time, since the parameter n=1, the robot arm 208 inserts the transmission port 214 into the connection terminal CT15. Next, the control circuit 200 determines the transmission Whether the input port 214 is inserted into the connection terminal CT15 (step S806). When the transmission port 214 is not inserted into the connection terminal CT15, the control circuit 200 suspends the test operation (step S807).

當傳輸埠214插入連接端CT15時,控制電路200監控待測物104的動作,用以產生一第四測試結果(步驟S808)。接著,控制電路200判斷參數n是否達第一臨界值(步驟S809)。此時,由於參數n=1,未達第一臨界值(如3),故控制電路200設定參數n=2(步驟S810),並回到步驟S805,命令機械手臂208將傳輸埠214插入連接端CT16。控制電路200判斷傳輸埠214是否插入連接端CT16(步驟S806)。當傳輸埠214未插入連接端CT16時,控制電路200暫停測試動作(步驟S807)。 When the transmission port 214 is inserted into the connection terminal CT15, the control circuit 200 monitors the action of the DUT 104 to generate a fourth test result (step S808). Next, the control circuit 200 determines whether the parameter n reaches the first critical value (step S809). At this time, since the parameter n=1, the first critical value (for example, 3) is not reached, the control circuit 200 sets the parameter n=2 (step S810), and returns to step S805 to instruct the robotic arm 208 to insert the transmission port 214 into the connection Terminal CT16. The control circuit 200 determines whether the transmission port 214 is inserted into the connection terminal CT16 (step S806). When the transmission port 214 is not inserted into the connection terminal CT16, the control circuit 200 suspends the test operation (step S807).

當傳輸埠214插入連接端CT16時,控制電路200監控待測物104的動作,用以產生一第五測試結果(步驟S808)。接著,控制電路200判斷參數n是否達第一臨界值(步驟S809)。此時,由於參數n=2,未達第一臨界值(如3),故控制電路200設定參數n=3(步驟S810),並回到步驟S805,命令機械手臂208將傳輸埠214插入連接端CT17。控制電路200判斷傳輸埠214是否插入連接端CT17(步驟S806)。當傳輸埠214未插入連接端CT17時,控制電路200暫停測試動作(步驟S807)。 When the transmission port 214 is inserted into the connection terminal CT16, the control circuit 200 monitors the action of the DUT 104 to generate a fifth test result (step S808). Next, the control circuit 200 determines whether the parameter n reaches the first critical value (step S809). At this time, since the parameter n=2 does not reach the first critical value (such as 3), the control circuit 200 sets the parameter n=3 (step S810), and returns to step S805 to instruct the robotic arm 208 to insert the transmission port 214 into the connection Terminal CT17. The control circuit 200 determines whether the transmission port 214 is inserted into the connection terminal CT17 (step S806). When the transmission port 214 is not inserted into the connection terminal CT17, the control circuit 200 suspends the test operation (step S807).

當傳輸埠214插入連接端CT17時,控制電路200監控待測物104的動作,用以產生一第六測試結果(步驟S808)。接著,控制電路200判斷參數n是否達第一臨界值(步驟S809)。此時,由於參數n=3,已達第一臨界值,故控制電路200判斷參數m是否達一第二臨界 值(步驟S811)。此時,由於參數m=2,已達第二臨界值,故控制電路200結束測試程序(步驟S813)。 When the transmission port 214 is inserted into the connection terminal CT17, the control circuit 200 monitors the action of the DUT 104 to generate a sixth test result (step S808). Next, the control circuit 200 determines whether the parameter n reaches the first critical value (step S809). At this time, since the parameter n=3 has reached the first critical value, the control circuit 200 determines whether the parameter m reaches a second critical value. Value (step S811). At this time, since the parameter m=2 has reached the second critical value, the control circuit 200 ends the test procedure (step S813).

在其它實施例中,控制電路200將第一至第六測試結果上傳至網頁伺服器。測試人員不必一直在現場就可即時監控待測物104的動作。在一些實施例中,當測試人員開啟一測試應用程式,並點選”測試結果查詢”選項時,便可連接到網頁伺服器,查詢所有待測物的測試結果。在此例中,網頁伺服器會顯示具體的報錯內容,輔助測試人員分析。 In other embodiments, the control circuit 200 uploads the first to sixth test results to the web server. The tester can monitor the movement of the object under test 104 in real time without having to be on site all the time. In some embodiments, when a tester opens a test application and clicks the "test result query" option, the tester can connect to the web server to query the test results of all DUTs. In this example, the web server will display the specific error content to assist the tester in the analysis.

在本實施例中,步驟S801係將參數m及n設定成數值1,但並非用以限制本發明。在其它實施例中,控制電路200係根據第7圖的畫面700中,被點選的選項設定參數m及n。舉例而言,當使用者點選選項702時,控制電路200設定參數m=1。此時,控制電路200可能設定第二臨界值為數值1。當使用者點選選項704時,控制電路200設定參數m=2。在此例中,控制電路200可能設定第二臨界值為數值2。在一些實例中,當使用者點選了選項702及704時,控制電路200設定參數m=1,並將第二臨界值設定為數值2。 In this embodiment, step S801 is to set the parameters m and n to a value of 1, but it is not used to limit the present invention. In other embodiments, the control circuit 200 sets the parameters m and n according to the selected option on the screen 700 in FIG. 7. For example, when the user clicks the option 702, the control circuit 200 sets the parameter m=1. At this time, the control circuit 200 may set the second threshold value to be 1. When the user clicks the option 704, the control circuit 200 sets the parameter m=2. In this example, the control circuit 200 may set the second threshold to be a value of 2. In some examples, when the user selects the options 702 and 704, the control circuit 200 sets the parameter m=1, and sets the second threshold to the value 2.

此外,當使用者點選選項706時,控制電路200設定參數n=1。在此例中,控制電路200可能設定第一臨界值為數值1。當使用者點選選項708時,控制電路200設定參數n=2。在此例中,控制電路200可能設定第一臨界值為數值2。當使用者點選選項710時,控制電路200設定參數n=3。在此例中,控制電路200可能設定第一臨界值 為數值3。在其它實施例中,當使用者點選了選項706、708及710時,控制電路200設定參數n=1,並將第一臨界值設定為數值3。 In addition, when the user clicks the option 706, the control circuit 200 sets the parameter n=1. In this example, the control circuit 200 may set the first threshold value to be 1. When the user clicks the option 708, the control circuit 200 sets the parameter n=2. In this example, the control circuit 200 may set the first threshold to be a value of 2. When the user clicks the option 710, the control circuit 200 sets the parameter n=3. In this example, the control circuit 200 may set the first threshold The value is 3. In other embodiments, when the user clicks on the options 706, 708, and 710, the control circuit 200 sets the parameter n=1, and sets the first threshold to the value 3.

在一可能實施例中,步驟S801更初始化機械手臂208,用以命令機械手臂208回到一初始位置。在另一可能實施例中,步驟S801讀取待測物104的信息,如待測物104的BIOS版本及型號。在其它實施例中,步驟S801記錄測試時間。 In a possible embodiment, step S801 further initializes the robotic arm 208 to command the robotic arm 208 to return to an initial position. In another possible embodiment, step S801 reads the information of the test object 104, such as the BIOS version and model of the test object 104. In other embodiments, step S801 records the test time.

本發明之控制方法,或特定型態或其部份,可以以程式碼的型態存在。程式碼可儲存於實體媒體,如軟碟、光碟片、硬碟、或是任何其他機器可讀取(如電腦可讀取)儲存媒體,亦或不限於外在形式之電腦程式產品,其中,當程式碼被機器,如電腦載入且執行時,此機器變成用以參與本發明之控制電路。程式碼也可透過一些傳送媒體,如電線或電纜、光纖、或是任何傳輸型態進行傳送,其中,當程式碼被機器,如電腦接收、載入且執行時,此機器變成用以參與本發明之測試平台或系統。 The control method of the present invention, or a specific type or part thereof, can exist in the form of code. The code can be stored in physical media, such as floppy disks, CDs, hard disks, or any other machine-readable (such as computer-readable) storage media, or not limited to external forms of computer program products. Among them, When the program code is loaded and executed by a machine, such as a computer, the machine becomes used to participate in the control circuit of the present invention. The code can also be transmitted through some transmission media, such as wire or cable, optical fiber, or any transmission type. When the code is received, loaded and executed by a machine, such as a computer, the machine becomes used to participate in this Invented test platform or system.

除非另作定義,在此所有詞彙(包含技術與科學詞彙)均屬本發明所屬技術領域中具有通常知識者之一般理解。此外,除非明白表示,詞彙於一般字典中之定義應解釋為與其相關技術領域之文章中意義一致,而不應解釋為理想狀態或過分正式之語態。 Unless otherwise defined, all vocabulary (including technical and scientific vocabulary) herein belong to the general understanding of persons with ordinary knowledge in the technical field of the present invention. In addition, unless expressly stated, the definition of a word in a general dictionary should be interpreted as consistent with the meaning in an article in its related technical field, and should not be interpreted as an ideal state or an overly formal voice.

雖然本發明已以較佳實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾。舉例來說,本發明實施例 所述之系統、裝置或是方法可以硬體、軟體或硬體以及軟體的組合的實體實施例加以實現。因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。 Although the present invention has been disclosed as above in the preferred embodiment, it is not intended to limit the present invention. Anyone with ordinary knowledge in the relevant technical field can make some changes and modifications without departing from the spirit and scope of the present invention. . For example, the embodiment of the present invention The system, device or method described can be implemented in a physical embodiment of hardware, software, or a combination of hardware and software. Therefore, the scope of protection of the present invention shall be subject to the scope of the attached patent application.

102:測試平台 102: test platform

SC:控制信號 SC: control signal

120:主機 120: host

202、206:基座 202, 206: pedestal

204:纜線 204: Cable

208:機械手臂 208: Robotic Arm

TP1,TP2:測試埠 TP1, TP2: test port

PP1~PP3:週邊埠 PP1~PP3: Peripheral port

CT11~CT20:連接端 CT11~CT20: connecting terminal

210、214:傳輸埠 210, 214: Transmission port

212:連接線 212: connection line

216,218:轉接頭 216,218: Adapter

224:夾爪 224: Gripper

220,222:開口 220,222: opening

200:控制電路 200: control circuit

Claims (20)

一種接口相容性測試平台,包括:一第一基座,包括一第一測試埠,其中該第一測試埠包括一第一連接端以及一第二連接端,該第一連接端用以耦接一待測物的一第一輸入/輸出埠;一第二基座,包括一第一週邊埠以及一第二週邊埠,其中該第一週邊埠包括一第三連接端以及一第四連接端,該第三連接端用以耦接一第一週邊裝置,該第二週邊埠包括一第五連接端以及一第六連接端,該第五連接端用以耦接一第二週邊裝置;一纜線,包括一第一傳輸埠、一第二傳輸埠以及一連接線,該連接線耦接於該第一傳輸埠及該第二傳輸埠之間;以及一機械手臂,用以移動該第一傳輸埠,使得該第一傳輸埠耦接該第二連接端,並移動該第二傳輸埠,使得該第二傳輸埠耦接該第四或第六連接端。 An interface compatibility test platform includes: a first base including a first test port, wherein the first test port includes a first connection end and a second connection end, and the first connection end is used for coupling A first input/output port connected to an object under test; a second base including a first peripheral port and a second peripheral port, wherein the first peripheral port includes a third connection end and a fourth connection End, the third connecting end is used for coupling to a first peripheral device, the second peripheral port includes a fifth connecting end and a sixth connecting end, and the fifth connecting end is used for coupling a second peripheral device; A cable including a first transmission port, a second transmission port, and a connection line, the connection line is coupled between the first transmission port and the second transmission port; and a robot arm for moving the The first transmission port enables the first transmission port to be coupled to the second connection end, and moves the second transmission port so that the second transmission port is coupled to the fourth or sixth connection end. 如請求項1之接口相容性測試平台,其中該第一基座更包括一第二測試埠,該第二測試埠包括一第七連接端以及一第八連接端,該第七連接端用以耦接該待測物的一第二輸入/輸出埠,該機械手臂移動該第一傳輸埠,使得該第一傳輸埠耦接該第八連接端。 For example, the interface compatibility test platform of claim 1, wherein the first base further includes a second test port, the second test port includes a seventh connection terminal and an eighth connection terminal, and the seventh connection terminal is used for In order to couple to a second input/output port of the object under test, the robotic arm moves the first transmission port so that the first transmission port is coupled to the eighth connection terminal. 如請求項1之接口相容性測試平台,其中該第一及第二傳輸埠均為USB連接埠。 For example, the interface compatibility test platform of claim 1, wherein the first and second transmission ports are both USB ports. 如請求項1之接口相容性測試平台,該纜線更包括: 一第一轉接頭,具有一第一收容空間,用以容納該連接線,其中該第一收容空間具有一第一開口,用以露出該第一傳輸埠;以及一第二轉接頭,具有一第二收容空間,用以容納該連接線,其中該第二收容空間具有一第二開口,用以露出該第二傳輸埠。 Such as the interface compatibility test platform of claim 1, the cable further includes: A first adapter having a first accommodating space for accommodating the connection line, wherein the first accommodating space has a first opening for exposing the first transmission port; and a second adapter, There is a second accommodating space for accommodating the connecting line, wherein the second accommodating space has a second opening for exposing the second transmission port. 如請求項4之接口相容性測試平台,其中該第一轉接頭更包括一第一定位構件,該機械手臂具有一第二定位構件以及一夾爪,當該第二定位構件對準該第一定位構件時,該夾爪夾取該第一轉接頭,使得該第一傳輸埠耦接該第二連接端。 Such as the interface compatibility test platform of claim 4, wherein the first adapter further includes a first positioning member, the robot arm has a second positioning member and a clamping jaw, and when the second positioning member is aligned with the When the first positioning member is used, the clamping jaw clamps the first adapter so that the first transmission port is coupled to the second connection end. 如請求項5之接口相容性測試平台,其中該第一定位構件具有複數定位孔,該第二定位構件具有複數定位柱,當該等定位柱插入該等定位孔時,該夾爪夾取該第一轉接頭。 For example, the interface compatibility test platform of claim 5, wherein the first positioning member has a plurality of positioning holes, and the second positioning member has a plurality of positioning posts. When the positioning posts are inserted into the positioning holes, the clamping jaws The first adapter. 如請求項5之接口相容性測試平台,其中該第一轉接頭包括:一第一構件,具有一貫孔,該貫孔貫穿該第一構件,其中該貫孔的一開口作為該第一開口;一第二構件,具有一溝槽,該連接線設置於該溝槽及該貫孔之中;以及一彈性構件,設置於該第一及第二構件之間,其中該第一定位構件固定於該第二構件上。 For example, the interface compatibility test platform of claim 5, wherein the first adapter includes: a first member having a through hole, the through hole penetrates the first member, and an opening of the through hole serves as the first Opening; a second member with a groove, the connecting line is arranged in the groove and the through hole; and an elastic member arranged between the first and second members, wherein the first positioning member Fixed on the second member. 一種測試系統,包括:一測試平台,包括: 一第一基座,包括一第一測試埠,其中該第一測試埠包括一第一連接端以及一第二連接端,該第一連接端用以耦接一待測物的一第一輸入/輸出埠;一第二基座,包括一第一週邊埠以及一第二週邊埠,其中該第一週邊埠包括一第三連接端以及一第四連接端,該第三連接端用以耦接一第一週邊裝置,該第二週邊埠包括一第五連接端以及一第六連接端,該第五連接端用以耦接一第二週邊裝置;一纜線,包括一第一傳輸埠、一第二傳輸埠以及一連接線,該連接線耦接於該第一傳輸埠及該第二傳輸埠之間;以及一機械手臂,根據一控制信號移動該第一及第二傳輸埠,使得該第一傳輸埠耦接該第二連接端,並且該第二傳輸埠耦接該第四或第六連接端;以及一控制電路,執行一測試程式,用以產生該控制信號。 A test system, including: a test platform, including: A first base includes a first test port, wherein the first test port includes a first connection end and a second connection end, and the first connection end is used for coupling to a first input of an object under test / Output port; a second base, including a first peripheral port and a second peripheral port, wherein the first peripheral port includes a third connection end and a fourth connection end, the third connection end is used for coupling Connected to a first peripheral device, the second peripheral port includes a fifth connecting end and a sixth connecting end, the fifth connecting end is used to couple to a second peripheral device; a cable including a first transmission port , A second transmission port and a connection line, the connection line is coupled between the first transmission port and the second transmission port; and a robot arm moves the first and second transmission ports according to a control signal, The first transmission port is coupled to the second connection terminal, and the second transmission port is coupled to the fourth or sixth connection terminal; and a control circuit executes a test program to generate the control signal. 如請求項8之測試系統,更包括:一顯示面板,用以呈現一畫面,該畫面具有複數選項,用以供使用者點選;以及一主機,根據被點選的選項,設定該測試程式裡的至少一參數。 For example, the test system of request 8 further includes: a display panel for presenting a screen with multiple options for the user to click; and a host to set the test program according to the selected option At least one parameter in. 如請求項9之測試系統,其中該畫面具有一初始化選項,當使用者點選該初始化選項時,該主機命令該控制電路執行一初始化程式,用以命令該機械手臂回到一初始位置。 For example, in the test system of request 9, the screen has an initialization option. When the user clicks the initialization option, the host instructs the control circuit to execute an initialization program to command the robotic arm to return to an initial position. 如請求項9之測試系統,其中當該第一傳輸埠耦接該第二連接端,並且該第二傳輸埠耦接該第四連接端時,該待測物根據該第一週邊裝置所提供的資訊而動作,該主機根據該待測物的動作,產生一第一測試結果,該顯示面板顯示該第一測試結果。 Such as the test system of claim 9, wherein when the first transmission port is coupled to the second connection terminal, and the second transmission port is coupled to the fourth connection terminal, the DUT is provided according to the first peripheral device The host generates a first test result according to the action of the object under test, and the display panel displays the first test result. 如請求項11之測試系統,其中當該第一傳輸埠耦接該第二連接端,並且該第二傳輸埠耦接該第六連接端時,該待測物根據該第二週邊裝置所提供的資訊而動作,該主機根據該待測物的動作,產生一第二測試結果,該顯示面板顯示該第二測試結果。 Such as the test system of claim 11, wherein when the first transmission port is coupled to the second connection terminal, and the second transmission port is coupled to the sixth connection terminal, the DUT is provided by the second peripheral device The host generates a second test result according to the action of the object under test, and the display panel displays the second test result. 如請求項12之測試系統,其中該主機上傳該第一及第二測試結果至一Web伺服器。 For example, the test system of request item 12, wherein the host uploads the first and second test results to a web server. 如請求項11之測試系統,其中當該第一傳輸埠耦接該第二連接端失敗時,該顯示面板呈現一失敗訊息,並且該控制電路透過該控制信號命令該機械手臂停止動作。 For example, in the test system of claim 11, when the first transmission port fails to be coupled to the second connection terminal, the display panel presents a failure message, and the control circuit commands the mechanical arm to stop operating through the control signal. 如請求項8之測試系統,其中該第一基座更包括一第二測試埠,該第二測試埠包括一第七連接端以及一第八連接端,該第七連接端用以耦接該待測物的一第二輸入/輸出埠,該機械手臂移動該第一傳輸埠,使得該第一傳輸埠耦接該第八連接端。 For example, the test system of claim 8, wherein the first base further includes a second test port, the second test port includes a seventh connection terminal and an eighth connection terminal, and the seventh connection terminal is used for coupling to the For a second input/output port of the object under test, the robotic arm moves the first transmission port so that the first transmission port is coupled to the eighth connection terminal. 如請求項8之測試系統,其中該第一及第二傳輸埠均為USB連接埠。 Such as the test system of claim 8, wherein the first and second transmission ports are both USB ports. 如請求項8之測試系統,該纜線更包括: 一第一轉接頭,具有一第一收容空間,用以容納該連接線,其中該第一收容空間具有一第一開口,用以露出該第一傳輸埠;以及一第二轉接頭,具有一第二收容空間,用以容納該連接線,其中該第二收容空間具有一第二開口,用以露出該第二傳輸埠。 Such as the test system of claim 8, the cable further includes: A first adapter having a first accommodating space for accommodating the connection line, wherein the first accommodating space has a first opening for exposing the first transmission port; and a second adapter, There is a second accommodating space for accommodating the connecting line, wherein the second accommodating space has a second opening for exposing the second transmission port. 如請求項17之測試系統,其中該第一轉接頭更包括一第一定位構件,該機械手臂具有一第二定位構件以及一夾爪,當該第二定位構件對準該第一定位構件時,該夾爪夾取該第一轉接頭,使得該第一傳輸埠耦接該第二連接端。 Such as the test system of claim 17, wherein the first adapter further includes a first positioning member, the robotic arm has a second positioning member and a clamping jaw, when the second positioning member is aligned with the first positioning member At this time, the clamping jaw clamps the first adapter so that the first transmission port is coupled to the second connection end. 如請求項18之測試系統,其中該第一定位構件具有複數定位孔,該第二定位構件具有複數定位柱,當該等定位柱插入該等定位孔時,該夾爪夾取該第一轉接頭。 Such as the test system of claim 18, wherein the first positioning member has a plurality of positioning holes, and the second positioning member has a plurality of positioning posts. When the positioning posts are inserted into the positioning holes, the clamping jaws grip the first rotation Connector. 如請求項18之測試系統,其中該第一轉接頭包括一第一構件,具有一貫孔,該貫孔貫穿該第一構件,其中該貫孔的一開口作為該第一開口;一第二構件,具有一溝槽,該連接線設置於該溝槽及該貫孔之中;以及一彈性構件,設置於該第一及第二構件之間,其中該第一定位構件固定於該第二構件上。 Such as the test system of claim 18, wherein the first adapter includes a first member having a through hole, the through hole penetrates the first member, and an opening of the through hole serves as the first opening; a second The member has a groove, and the connecting line is arranged in the groove and the through hole; and an elastic member is arranged between the first and second members, wherein the first positioning member is fixed to the second Component on.
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CN102609339A (en) * 2011-01-19 2012-07-25 鸿富锦精密工业(深圳)有限公司 Embedded main board testing device
TWI566131B (en) * 2014-09-29 2017-01-11 Ying Zhang Mouse test equipment and its test method
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Publication number Priority date Publication date Assignee Title
CN102609339A (en) * 2011-01-19 2012-07-25 鸿富锦精密工业(深圳)有限公司 Embedded main board testing device
TWI566131B (en) * 2014-09-29 2017-01-11 Ying Zhang Mouse test equipment and its test method
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CN110851310A (en) * 2019-11-06 2020-02-28 深圳市展祥通信科技有限公司 Electronic equipment testing method and device

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