TWI750509B - Automatic test method for reliability and functionality of electronic device - Google Patents

Abstract

An automatic test method for reliability and functionality of electronic device is provided to deploy an robotic arm to perform reliability test on a tested component. In the meantime, the test host can directly access the generic log files generated by the tested electronic device without the need of using a third-party test utility on the tested electronic device. Analysis is carried out by the test host using the log files to determine whether each test round generates functional result to the tested component so that data of the functionality can be collected.

Description

Reliability and functional automation testing method of electronic equipment

The present invention relates to an automatic testing method, in particular to a reliability and functional automatic testing method of electronic equipment.

When the existing electronic devices such as servers, notebook computers, desktop computers, mobile phones and other electronic devices are automatically tested after production and assembly, traditional mechanical arms are usually used or the corresponding test connectors are clamped by the mechanical arms. Reliability or durability testing. During the test, the mechanical arm is driven by the pneumatic device to move back and forth or up and down to push, press buttons, switches, or drive the test connector to repeatedly plug and unplug the input and output ports of the electronic device.

However, the existing testing institutions can only perform reliability (or durability) tests on the tested objects, and after repeated physical plugging and unplugging, button pressing, and switch switching, functional tests are still required to check Whether its function is normal, it can be judged whether it has passed the aforementioned reliability test. Although the physical insertion and removal, button pressing, switch switching, etc. in the reliability test can be completed automatically by the machine, the current physical testing device cannot cover the functional testing, such as: whether the data is transmitted correctly, the power signal Whether the supply is normal... etc., it is necessary to manually operate and inspect to determine whether the functions of electronic components and connecting ports are operating normally.

In order to solve the above problems, the present invention provides an automatic testing method for reliability and functionality of electronic equipment.

According to an embodiment of the present invention, an automated testing method for reliability and functionality of an electronic device includes the steps of: establishing a connection between a test host and an electronic device under test; the test host reading a data generated by the electronic device The content of a first log record; the test host controls a test fixture to perform a test action on a tested element of the electronic device; in the test action state, the test host reads a first log generated by the electronic device two log records and compare the first log record and the second log record; and determine whether the functionality of the test action is normal according to the comparison result of the first log record and the second log record. Performing the test action on the tested element and releasing the test action is to perform a reliability test on the tested element, and according to the comparison result between the first log record and the second log record, it is judged whether the function of the test action is normal or not. The device under test is functionally tested.

According to an embodiment of the present invention, the automated testing method further includes the step of: the testing host initializes the testing fixture.

According to an embodiment of the present invention, the automated testing method further includes the step of: the testing host sets parameters related to the electronic device according to the electronic device.

According to an embodiment of the present invention, the first log record and the second log record are native log records of the electronic device.

According to an embodiment of the present invention, reading the content of the first log record by the test host includes steps: the test host sends a flag to the electronic device; and the electronic device executes a command according to the flag to generate the first log Log and pass back to the test host. Wherein the flag contains the information of detecting the device under test.

According to an embodiment of the present invention, the test host reading the content of the second log record includes steps: the test host transmits a flag to the electronic device; and the electronic device executes a command according to the flag to generate the second log Log and pass back to the test host. Wherein the flag includes the information of the tested element detected in the test action state.

According to an embodiment of the present invention, performing a reliability test on the device under test includes performing the test action for the device under test a plurality of times and releasing the test action, and performing a functional test on the device under test includes recording the test multiple times. action and the result of a functional abnormality in the removal of this test action.

According to an embodiment of the present invention, establishing a connection between the test host and the electronic device includes at least one of the following: establishing a shared network storage device accessible to the test host and the electronic device, directly connecting with a wired connection The test host and the electronic device are connected to the test host and the electronic device by a wireless network.

According to an embodiment of the present invention, the test fixture is a robotic arm, the tested element is a button or a switch, and the test action is performed by pressing or switching the tested element with the test fixture.

According to an embodiment of the present invention, the test fixture is a robot arm and a test connector, the component under test is a connection port of the electronic device, and the test operation is performed by inserting the test fixture into the component under test.

The reliability and functional automation testing method for electronic equipment disclosed in the embodiments of the present invention is not only used for automatic testing of electronic equipment such as servers, notebook computers, desktop computers, mobile phones, etc. In addition to the reliability test of the connecting ports, I/O interfaces, and switches of the electronic equipment, the test host can directly read the native log records generated by the electronic equipment under test to determine each component without the need to install additional test tools. / Whether the port generates valid functional information when connected/actuated to test the functionality of the port, button or switch. Using this automated process to replace a large number of manual functional tests can significantly reduce the cost and time spent on manual testing, and provide a more complete record of abnormal functional states for reliability testing for subsequent analysis and improvement.

10: Test the host

100: Method

110~200: Steps

20: Electronics

30: Test fixture

40: Wireless Access Station

FIG. 1 is a flow chart of an embodiment of a method for automatic testing of reliability and functionality of electronic equipment according to the present invention.

FIG. 2 to FIG. 5 are schematic diagrams of an embodiment of a connection type between a test host, an electronic device, and a test fixture in the present invention.

Certain terms are used in the specification and subsequent claims to refer to particular elements. It should be understood by those of ordinary skill in the art that manufacturers may refer to the same element by different nouns. The scope of this specification and subsequent applications does not take the difference in name as a way to distinguish elements, but takes the difference in function of the elements as a criterion for distinguishing. The reference to "comprising" throughout the specification and subsequent claims is an open-ended term and should be interpreted as "comprising" But not limited to". Furthermore, the term "coupled" or "connected" herein includes any direct and indirect electrical or structural means of connection. Therefore, if a first device is described as being coupled/connected to a second device, it means that the first device can be directly electrically/structurally connected to the second device, or indirectly electrically/structurally connected through other devices or connecting means to the second device.

Please refer to FIG. 1 . FIG. 1 is a flowchart of an embodiment of an automated testing method for reliability and functionality of an electronic device according to the present invention. The reliability and functionality automated testing method 100 of electronic equipment includes the following steps: Step 110: Initialize a test fixture by a test host; Step 120: Establish a connection between the test host and an electronic device under test Step 130: The test host sets the parameters related to the electronic device; Step 140: The test host reads the content of a first log record generated by the electronic device; Step 150: The test host controls the test fixture to A tested element of the electronic device performs a test action; Step 160: The test host reads the content of a second log record generated by the electronic device; Step 170: The test host compares the first log record with the first log record Two log records, and according to the comparison result of the first log record and the second log record to determine whether the functionality of the test action is normal; Step 180: cancel the test action; Step 190: cancel the test action and record the test The functionality of the action is abnormal; Step 200: Recording multiple test actions and releasing the functionality in the test action is abnormal usual results.

Please refer to FIG. 2 to FIG. 5 together. FIG. 2 to FIG. 5 are schematic diagrams of an embodiment of the connection type between the test host, the electronic device and the test fixture in the present invention. The connection between the test host 10, the electronic device 20 and the test fixture 30 can be established in a wired or wireless manner. For example, in Figure 2, the test host 10, the electronic device 20 under test, and the test fixture 30 are connected by wireless The access station 40 (wireless access point, AP) establishes a connection with each other, and the wireless access station 40 is additionally connected to a shared network access device or the wireless access station 40 has a built-in shared network access device as a storage point for data. In the embodiment of FIG. 3 , the test host 10 establishes a connection with the electronic device 20 under test and the test fixture 30 through direct wireless communication (eg, a wifi wireless network interface). In the embodiment of FIG. 4, the test host 10 and the electronic device 20 under test establish a connection through the wireless access station 40, and the test host 10 uses a physical USB interface (or other feasible physical transmission interface) to communicate with the test fixture 30 connections. In the embodiment shown in FIG. 5 , a physical network cable (NIC cable) can also be directly established between the test host 10 and the electronic device 20 under test.

According to the flow of FIG. 1, in the method 100 of the present invention, the test host 10 firstly initializes the test fixture 30 (step 110), and the test host 10 and the test fixture 30 (robot or mechanical arm clamp test connector) is wired or wireless, and the test host 10 initializes the test fixture 30, such as over-power start, setting the parameters of the test fixture 30, setting the test type, test stroke, etc., so that the test The tool 30 can perform every test action required by the test host 10 , such as plugging and unplugging the input and output ports, pressing buttons, switching switches, and the like. Next, in step 120, a connection is established between the test host 10 and the electronic device 20 under test. As mentioned above, after the electronic device 20 is connected to the test host 10 through a wireless network interface or a physical network cable, the required data can be transmitted between the test host 10 and the electronic device 20 . After the connection is established in step 120, then in step 130, the test host 10 can The connected electronic device 20 and each tested element in the electronic device 20 are set with relevant tested parameters, for example, the test host 10 itself sets the type, physical size, module, etc. of the tested element, etc., and step 110 In contrast, step 110 is to initialize and set the test fixture 30 , while step 130 is equivalent to performing relevant initialization and parameter settings on a component under test in the electronic device 20 to be tested, so that the test host 10 can obtain the And analyze the log content related to the component under test.

After the above-mentioned setting of the test environment is completed, the test host 10 starts to perform reliability and functional tests of the device under test. In step 140 , the test host 10 attempts to read the log records of the electronic device 20 , and by instructing the electronic device 20 , the built-in commands of the operating system (OS) of the electronic device 20 actively generate the test log records. In one embodiment, the test host 10 transmits a flag for detecting the information of the device under test to the electronic device 20, and when the electronic device 20 receives the flag, the electronic device 20 returns a confirmation signal of receiving the flag and according to the flag The target executes a command by its own operating system to generate and return a first log record, which is read by the test host 10 through the connection established in step 120 . Specifically, if the test host 10 does not receive the confirmation signal returned by the electronic device 20, it continues to send a flag to the electronic device 20 (repeat step 140). The first log record generated by the electronic device 20 at least includes a state record of the electronic device 20 related to the component under test when the connector is not activated/unconnected/connected or a specific state, that is, the test in step 150 has not been performed state before the action.

Next, in step 150 , the test host 10 controls the test fixture 30 to perform a test operation on the component under test of the electronic device 20 . In one embodiment, the test fixture 30 can be a robotic arm, and has a test head by 3D printing or mechanical manufacturing, and the tested element is one of the buttons, switches, power buttons, and volume control buttons of the electronic device 20. .. etc., the test action is to press the button or switch the position of the switch with the mechanical arm, and the test host 10 controls the test fixture 30 with software to automatically complete the above test action. In another embodiment, when the component under test is one of the connection ports of the electronic device 20, the test fixture 30 The robot arm additionally clamps the corresponding test connector, and the test action is that the robot arm drives the test connector to insert into the connection port.

In the state where the test operation is performed in the above step 150 , in the next step 160 , the test host 10 reads the log records of the electronic device 20 again, and is built into the operating system (OS) of the electronic device 20 by issuing an instruction to the electronic device 20 . Directives actively generate log records for tests. The test host 10 also transmits a flag for detecting the information of the device under test to the electronic device 20. When the electronic device 20 receives the flag, the electronic device 20 returns a confirmation signal of receiving the flag and operates its own operation according to the flag. The system executes a command to generate and return a second log record, which is read by the test host 10 through the connection established in step 120 . At this time, if the function of the device under test is normal, the state of the device under test can be changed in response to the test action, so the second log record generated by the electronic device 20 at least includes the electronic device 20 and the device under test. A state record when a component is activated/opened/connected to a connector or another specific state.

In particular, since the test method of the present invention does not install an external test program in the electronic device 20 under test, when the test host 10 controls the test fixture 30 to test the electronic device 20, the read The first log record and the second log record are both records generated by the existing control commands and operations of the operating system of the electronic device 20 . In other words, the first log record and the second log record are native log records of the electronic device 20 . Next, in step 170, the test host 10 compares the log content related to the state of the device under test in the original first log record and the second log record, and judges accordingly when the test action is executed, the Is the functionality normal. If the function is normal, step 180 is executed to directly cancel the test action, that is, cancel pressing the button, switch the switch position to the original position, or drive the test connector to be pulled out from the connection port. If the function is abnormal, step 190 is executed to cancel the test action, and at the same time, the functionality of the test action is recorded as abnormal.

In the method of the present invention, the execution test action in step 150 and the release test action in the subsequent steps 180 and 190 are physical reliability tests for the component under test, and the first test obtained in each test action The comparison result of the first log record and the second log record can determine whether the functionality of the test action is normal to perform the functional test. Regardless of whether the function is normal (step 180 ) or the function is abnormal (step 190 ), steps 150 to 180 (or 190 ) are repeated before the predetermined number of tests is reached. In order to perform a plurality of test actions and release test actions on the tested element, the reliability test of the present invention represents a series of physical tests, while the functional test is a series of physical tests. Whether its function produces an exception in a test. Finally, after the predetermined number of tests are satisfied, in step 200, the results of the multiple test records having functional abnormality are recorded and a report is generated, which can be used for subsequent backup or related analysis.

The reliability and functional automation testing method for electronic equipment disclosed in the embodiments of the present invention is not only used for automatic testing of electronic equipment such as servers, notebook computers, desktop computers, mobile phones, etc. In addition to the reliability test of the connection ports, I/O interfaces, and switches of the electronic equipment, there is no need to install a test tool program, so that the performance of the electronic equipment under test is close to the user's experience. The native log records generated by the electronic device under test are used to determine whether each component/port is connected/actuated, whether valid functional information is generated, so as to test whether the function of the port, button or switch is normal.

The above descriptions are only preferred embodiments of the present invention, and all equivalent changes and modifications made according to the scope of the patent application of the present invention shall fall within the scope of the present invention.

100: Method

110~200: Steps

Claims (9)

An automatic testing method for reliability and functionality of electronic equipment, comprising the steps of: establishing a connection between a test host and an electronic device under test; the test host reading a first log record generated by the electronic device content; the test host controls a test fixture to perform a test action on a tested element of the electronic device; in the test action state, the test host reads a second log record generated by the electronic device and compares the the first log record and the second log record; and according to the comparison result of the first log record and the second log record to determine whether the function of the test action is normal; wherein the test action is performed on the tested element and the release of the test action is performed. The test action is to perform a reliability test on the tested element, and according to the comparison result of the first log record and the second log record, judging whether the function of the test action is normal is to perform a functional test on the tested element; wherein the Reading the content of the first log record by the test host includes steps: the test host sends a flag to the electronic device; and the electronic device executes a command according to the flag to generate the first log record and return it to the tester a host; wherein the flag contains a message for detecting the device under test. The method according to claim 1, further comprising the step of: the test host initializes the test fixture. The method according to claim 1, further comprising the step of: the test host sets parameters related to the electronic device according to the electronic device. The method of claim 1, wherein the first log record and the second log record are native log records of the electronic device. The method of claim 1, wherein the test host reads the content of the second log record comprising the steps of: the test host transmits another flag to the electronic device; and the electronic device executes another flag according to the other flag A command to generate the second log record and send it back to the test host; wherein the other flag includes the information of the device under test detected in the test action state. The method of claim 1, wherein performing the reliability test on the device under test comprises performing the test action on the device under test a plurality of times and releasing the test action, and performing the functional test on the device under test comprises recording the plurality of times This test action and the result of removing the functional abnormality in this test action. The method of claim 1, wherein establishing a connection between the test host and the electronic device comprises at least one of the following: establishing a shared network storage device accessible to the test host and the electronic device, using a wired The connection directly connects the test host and the electronic device, and connects the test host and the electronic device through a wireless network. The method of claim 1, wherein the test fixture is a robotic arm, the tested element is a button or a switch, and the test action is to press or switch the tested element with the test fixture. The method of claim 1, wherein the test fixture is a robotic arm and a test connection The device under test is the connection port of the electronic device, and the test device is inserted into the device under test in the test action.

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