TWI780910B - Testing tool - Google Patents

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TWI780910B
TWI780910B TW110134410A TW110134410A TWI780910B TW I780910 B TWI780910 B TW I780910B TW 110134410 A TW110134410 A TW 110134410A TW 110134410 A TW110134410 A TW 110134410A TW I780910 B TWI780910 B TW I780910B
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interface
voltage
terminal
coupled
power supply
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TW110134410A
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TW202314274A (en
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王裕華
陳柏全
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英業達股份有限公司
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Abstract

A testing tool includes a first interface, a second interface, a bridging unit, a third interface, a power supply unit, a fourth interface and a power switch. The first interface is used to access a first signal. The second interface is used to access a second signal corresponding to the first signal and/or output a second voltage. The bridging unit is used to bridge the first interface and the second interface. The third interface is used to receive a first voltage. The power supply unit is used to output the second voltage according to the first voltage. The fourth interface is used to output the second voltage. The power switch is used to output the second voltage to the second interface and/or the fourth interface.

Description

測試治具 Test Fixture

本發明關於一種測試治具，尤指一種可透過預定介面耦接於待測裝置以改善測試時之便利性的測試治具。 The present invention relates to a test fixture, especially a test fixture that can be coupled to a device under test through a predetermined interface to improve the convenience of testing.

目前於測試裝置(例如主機板)時，可將測試治具耦接於電腦及待測裝置之間，以存取相關訊號及執行相關的控制。 Currently, when testing a device (such as a motherboard), a test fixture can be coupled between a computer and the device under test to access related signals and execute related controls.

常見的情況為，電腦之作業系統(例如Windows 10系統)以EIA RS-232(又稱為RS-232)之介面標準的驅動程式，透過通用序列匯流排(Universal Serial Bus，USB)2.0轉到RS232-DB9接頭以耦接到測試治具，再將RS232轉為通用非同步收發傳輸器(Universal Asynchronous Receiver/Transmitter，簡稱UART)之通訊協定，以與待測裝置溝通。此外，待測裝置之電源供應，則另以外部之電源供應器提供。 A common situation is that the operating system of the computer (such as Windows 10 system) uses the driver program of the EIA RS-232 (also known as RS-232) interface standard to transfer to the The RS232-DB9 connector is used to couple to the test fixture, and then converts the RS232 to a Universal Asynchronous Receiver/Transmitter (UART) communication protocol to communicate with the device under test. In addition, the power supply of the device under test is provided by an external power supply.

上述解法已觀察到下述多種缺失。目前新設計的資訊類產品，例如電腦或伺服器，其對外的通訊大多採用較新的高速傳輸介面，例如通用序列匯流排，RS232-DB9接頭已逐漸以新介面取代，因此測試治具之RS232-DB9接頭已很難與近期新設計的資訊類產品(即，待測裝置)相連。上述測試治具之傳輸介面僅具有一組UART收發介面，導致測試治具與待測裝置之溝通的彈性極低。此外，常須額外準備電源供應器以供電給待測裝置，造成高度不便，而頻繁插拔電源接頭，也常導致電路板之毀損。此外，USB 2.0介面及RS-232介面之間，也常發生驅動程式的問題。 The above solutions have observed various deficiencies described below. At present, newly designed information products, such as computers or servers, mostly use relatively new high-speed transmission interfaces for external communication, such as universal serial buses, and RS232-DB9 connectors have gradually been replaced by new interfaces. Therefore, the RS232 - It is difficult for the DB9 connector to connect with recently newly designed information products (ie, the device under test). The transmission interface of the above-mentioned test fixture only has a set of UART transceiver interfaces, resulting in extremely low flexibility in communication between the test fixture and the device under test. In addition, it is often necessary to prepare an additional power supply to supply power to the device under test, causing high inconvenience, and frequent plugging and unplugging of the power connector often leads to damage to the circuit board. In addition, driver problems often occur between the USB 2.0 interface and the RS-232 interface.

實施例提供一種測試治具，包含一第一介面、一第二介面、一橋接單元、一第三介面、一供電單元、一第四介面及一電源切換器。該第一介面用以存取一第一訊號。該第二介面用以存取對應於該第一訊號之一第二訊號及/或輸出一第二電壓。該橋接單元耦接於該第一介面及該第二介面之間，用以橋接該第一介面及該第二介面。該第三介面用以接收一第一電壓。該供電單元用以根據該第一電壓輸出該第二電壓，該供電單元包含一第一端及一第二端，其中該第一端耦接於該第三介面，用以接收該第一電壓，且該第二端用以輸出該第二電壓。該第四介面用以輸出該第二電壓。該電源切換器用以輸出該第二電壓至該第二介面及/或該第四介面，該電源切換器包含一第一端、一第二端及一第三端，其中該第一端耦接於該供電單元之該第二端，用以接收該第二電壓，該第二端耦接於該第二介面，且該第三端耦接於該第四介面。該電源切換器之該第一端選擇性地電連接於該電源切換器之該第二端及/或該第三端。 The embodiment provides a test fixture, which includes a first interface, a second interface, a bridge unit, a third interface, a power supply unit, a fourth interface and a power switch. The first interface is used for accessing a first signal. The second interface is used for accessing a second signal corresponding to the first signal and/or outputting a second voltage. The bridging unit is coupled between the first interface and the second interface for bridging the first interface and the second interface. The third interface is used for receiving a first voltage. The power supply unit is used to output the second voltage according to the first voltage, the power supply unit includes a first terminal and a second terminal, wherein the first terminal is coupled to the third interface for receiving the first voltage , and the second end is used to output the second voltage. The fourth interface is used for outputting the second voltage. The power switch is used to output the second voltage to the second interface and/or the fourth interface, the power switch includes a first terminal, a second terminal and a third terminal, wherein the first terminal is coupled to The second end of the power supply unit is used to receive the second voltage, the second end is coupled to the second interface, and the third end is coupled to the fourth interface. The first end of the power switch is selectively electrically connected to the second end and/or the third end of the power switch.

101:測試治具 101: Test fixture

102:第一介面 102: The first interface

103:第三介面 103: The third interface

104:第二介面 104: The second interface

105:第四介面 105: The fourth interface

106:橋接單元 106: Bridge unit

107:供電控制器 107: Power supply controller

108:電源轉換器 108:Power converter

109:電源切換器 109:Power switcher

110:供電單元 110: Power supply unit

180:控制裝置 180: Control device

190:電源裝置 190: Power supply unit

199:待測裝置 199: Device under test

PH1,PH2,PH3:路徑 PH1,PH2,PH3: path

S1:第一訊號 S1: The first signal

S2:第二訊號 S2: Second signal

V1:第一電壓 V1: first voltage

V2:第二電壓 V2: second voltage

V3:第三電壓 V3: the third voltage

A1至A12,B1至B12:編號 A1 to A12, B1 to B12: number

第1圖為實施例中，測試治具之示意圖。 Figure 1 is a schematic diagram of the test fixture in the embodiment.

第2圖為另一實施例中，第1圖之測試治具之示意圖。 Fig. 2 is a schematic diagram of the test fixture in Fig. 1 in another embodiment.

第3圖為第2圖之測試治具耦接於控制裝置、電源裝置及待測裝置的示意圖。 FIG. 3 is a schematic diagram of the test fixture in FIG. 2 coupled to the control device, the power supply device, and the device under test.

第4圖為另一實施例中，第2圖之測試治具耦接於控制裝置、電源裝置及待測裝置的示意圖。 Fig. 4 is another embodiment, a schematic diagram of the test fixture in Fig. 2 coupled to the control device, the power supply device and the device under test.

第5圖為實施例中，客製化的USB類型C介面的接腳分配示意圖。 FIG. 5 is a schematic diagram of the pin allocation of the customized USB Type-C interface in the embodiment.

為了處理上述本領域之諸多難題，實施例可提供測試治具，以作為解決方案。第1圖為實施例中，測試治具101之示意圖。測試治具101可包含第一介面102、第二介面104、橋接單元106、第三介面103、供電單元110、第四介面105及電源切換器109。 In order to deal with the above problems in the art, the embodiment can provide a test fixture as a solution. FIG. 1 is a schematic diagram of a test fixture 101 in an embodiment. The test fixture 101 may include a first interface 102 , a second interface 104 , a bridge unit 106 , a third interface 103 , a power supply unit 110 , a fourth interface 105 and a power switch 109 .

第一介面102可用以存取第一訊號S1。第二介面104可用以存取對應於第一訊號S1之第二訊號S2及/或輸出第二電壓V2。橋接單元106可耦接於第一介面102及第二介面104之間，用以橋接第一介面102及第二介面104。第三介面103可用以接收第一電壓V1。供電單元110可用以根據第一電壓V1輸出第二電壓V2。供電單元110可包含第一端及第二端，其中第一端可耦接於第三介面103以接收第一電壓V1，且第二端可輸出第二電壓V2。第四介面105可用以輸出第二電壓V2。電源切換器109可用以輸出第二電壓V2至第二介面104及/或第四介面105。電源切換器109包含第一端、第二端及第三端，其中第一端可耦接於供電單元110之第二端以接收第二電壓V2，第二端可耦接於第二介面104，且第三端可耦接於第四介面105。電源切換器109之第一端可選擇性地電連接於電源切換器109之第二端及/或第三端。根據實施例，電源切換器109可為機械式切換器或電子式切換器。 The first interface 102 can be used to access the first signal S1. The second interface 104 can be used to access the second signal S2 corresponding to the first signal S1 and/or output the second voltage V2. The bridge unit 106 can be coupled between the first interface 102 and the second interface 104 for bridging the first interface 102 and the second interface 104 . The third interface 103 can be used to receive the first voltage V1. The power supply unit 110 is configured to output the second voltage V2 according to the first voltage V1. The power supply unit 110 may include a first terminal and a second terminal, wherein the first terminal may be coupled to the third interface 103 to receive the first voltage V1, and the second terminal may output the second voltage V2. The fourth interface 105 can be used to output the second voltage V2. The power switch 109 can be used to output the second voltage V2 to the second interface 104 and/or the fourth interface 105 . The power switch 109 includes a first terminal, a second terminal and a third terminal, wherein the first terminal can be coupled to the second terminal of the power supply unit 110 to receive the second voltage V2, and the second terminal can be coupled to the second interface 104 , and the third end can be coupled to the fourth interface 105 . The first terminal of the power switch 109 can be selectively electrically connected to the second terminal and/or the third terminal of the power switch 109 . According to an embodiment, the power switch 109 may be a mechanical switch or an electronic switch.

第2圖為另一實施例中，第1圖之測試治具101之示意圖。如第2圖所示，供電單元110可包含供電控制器107及電源轉換器108。供電控制器107可用以將第一電壓V1轉換為第三電壓V3，供電控制器107可包含第一端及第二端，其中第一端可耦接於供電單元110之第一端，且第二端可用以輸出第三電壓V3。電源轉換器108可用以將第三電壓V3轉換為第二電壓V2，電源轉換器108可包含第一端及第二端，其中第一端可耦接於供電控制器107之第二端，且第二端可耦 接於供電單元110之第二端以輸出第二電壓V2。 FIG. 2 is a schematic diagram of the test fixture 101 in FIG. 1 in another embodiment. As shown in FIG. 2 , the power supply unit 110 may include a power supply controller 107 and a power converter 108 . The power supply controller 107 can be used to convert the first voltage V1 into a third voltage V3. The power supply controller 107 can include a first terminal and a second terminal, wherein the first terminal can be coupled to the first terminal of the power supply unit 110, and the second terminal can be coupled to the first terminal of the power supply unit 110. The two terminals can be used to output the third voltage V3. The power converter 108 can be used to convert the third voltage V3 into the second voltage V2, the power converter 108 can include a first terminal and a second terminal, wherein the first terminal can be coupled to the second terminal of the power supply controller 107, and The second end can be coupled Connected to the second end of the power supply unit 110 to output the second voltage V2.

根據實施例，供電控制器107可支援通用序列匯流排(USB)之供電控制，其提供的電壓值、功率值、電流值，以及電源方向可受控制。根據實施例，電源轉換器108可包含降壓變換器(buck chopper)。電源轉換器108可調整輸出的電壓及電流，以及可選擇性地進行濾波及降低電壓之鏈波。 According to an embodiment, the power supply controller 107 can support USB power supply control, and the voltage value, power value, current value, and power direction provided by it can be controlled. According to an embodiment, the power converter 108 may include a buck chopper. The power converter 108 can adjust the output voltage and current, and can optionally filter and reduce the voltage chain wave.

根據實施例，於第2圖中，第三電壓V3可實質上高於第二電壓V2。例如，第三電壓V3可為20伏特，且第二電壓V2可為12伏特。根據實施例，於第1圖及第2圖中，第一電壓V1可實質上等於第二電壓V2。例如，第一電壓V1及第二電壓V2可為12伏特。 According to an embodiment, in FIG. 2 , the third voltage V3 may be substantially higher than the second voltage V2. For example, the third voltage V3 may be 20 volts, and the second voltage V2 may be 12 volts. According to an embodiment, in FIG. 1 and FIG. 2 , the first voltage V1 may be substantially equal to the second voltage V2. For example, the first voltage V1 and the second voltage V2 may be 12 volts.

根據實施例，第一介面102可為第一客製化USB類型C(USB type-C)介面，第二介面104可為第二客製化USB類型C介面，第三介面103可為標準USB類型C介面，第四介面105可為直流電源插座(DC jack)，例如同軸連接器。根據實施例，依照需求，第一介面102及第二介面104可客製化以具有相同之接腳分配(pin-out)，也可客製化為具有相異之接腳分配。 According to an embodiment, the first interface 102 can be a first customized USB Type-C (USB type-C) interface, the second interface 104 can be a second customized USB Type-C interface, and the third interface 103 can be a standard USB Type C interface, the fourth interface 105 can be a DC power jack (DC jack), such as a coaxial connector. According to an embodiment, according to requirements, the first interface 102 and the second interface 104 can be customized to have the same pin-out, or can be customized to have different pin-out.

第3圖為第2圖之測試治具101耦接於控制裝置180、電源裝置190及待測裝置199的示意圖。如第3圖所示，第一介面102可耦接於控制裝置180，第三介面103可耦接於電源裝置190。控制裝置180可例如為用以執行控制及分析的電腦(例如桌上型電腦、筆記型電腦、平板電腦或專用的控制器)。電源裝置190可為支援耦接於USB類型C介面的適配器、電池或移動電源(power bank)。第二介面104可用以耦接至待測裝置199，以使用第二訊號S2測試待測裝置199之至少一預定介面。待測裝置199之受測試的至少一預定介面可包含積體電路間(Inter-Integrated Circuit，I2C)介面、UART介面及序列周邊介面(Serial Peripheral Interface Bus，SPI)之至少一者。 FIG. 3 is a schematic diagram of the test fixture 101 in FIG. 2 coupled to the control device 180 , the power supply device 190 and the device under test 199 . As shown in FIG. 3 , the first interface 102 can be coupled to the control device 180 , and the third interface 103 can be coupled to the power supply device 190 . The control device 180 can be, for example, a computer (such as a desktop computer, a notebook computer, a tablet computer or a dedicated controller) for performing control and analysis. The power supply device 190 can be an adapter, a battery, or a power bank that supports coupling to a USB Type-C interface. The second interface 104 can be coupled to the device under test 199 to test at least one predetermined interface of the device under test 199 using the second signal S2. The at least one predetermined interface to be tested of the device under test 199 may include at least one of an Inter-Integrated Circuit (I 2 C) interface, a UART interface, and a Serial Peripheral Interface Bus (SPI).

舉例而言，待測裝置199可為主機板，於研發期間，可將測試治具101 耦接於待測裝置199以進行供電及訊號收發，從而方便地進行除錯及分析。待研發完成，要進入量產時，可將相關的USB類型C之接口及相關線路拆除或封蓋。由於USB類型C介面可支援供電、可存取訊號、易於插拔且逐漸高度普及，故可減少上述的本領域難題。由於執行完除錯及分析後，相關接口可拆除，故並不會過度提高成本。 For example, the device under test 199 can be a motherboard, and during the research and development period, the test fixture 101 can be It is coupled to the device under test 199 for power supply and signal sending and receiving, so as to facilitate debugging and analysis. After the R&D is completed and mass production is to be started, the relevant USB Type-C interface and related circuits can be removed or sealed. Since the USB Type-C interface can support power supply, can access signals, is easy to plug and unplug, and is becoming highly popular, it can reduce the above-mentioned problems in this field. Since the relevant interface can be removed after the debugging and analysis are performed, the cost will not be increased excessively.

如第3圖所示，其中第一介面102、橋接單元106及第二介面104形成的路徑PH1可為測試相關路徑。第三介面103、供電單元110、電源切換器109及第二介面104形成的路徑PH2，及第三介面103、供電單元110、電源切換器109及第四介面105形成的路徑PH3，可為供電相關路徑。 As shown in FIG. 3 , the path PH1 formed by the first interface 102 , the bridge unit 106 and the second interface 104 may be a test-related path. The path PH2 formed by the third interface 103, the power supply unit 110, the power switch 109 and the second interface 104, and the path PH3 formed by the third interface 103, the power supply unit 110, the power switch 109 and the fourth interface 105 can be used for power supply relative paths.

如第3圖所示，若待測裝置199具有USB類型C的存取介面，且可使用該介面來收發訊號及接收電力，則可將待測裝置199耦接於第二介面104，以存取訊號及接發電力，從而進行除錯及分析。 As shown in FIG. 3, if the device under test 199 has a USB Type-C access interface and can use this interface to send and receive signals and receive power, then the device under test 199 can be coupled to the second interface 104 to store Take signals and send and receive power for debugging and analysis.

第4圖為另一實施例中，第2圖之測試治具101耦接於控制裝置180、電源裝置190及待測裝置199的示意圖。舉例而言，若待測裝置199具有USB類型C的訊號存取介面，但仍須透過直流電源插座供電，則可如第4圖所示，將待測裝置199之訊號存取介面耦接於第二介面104，且將待測裝置199之電源介面耦接於第四介面105，以存取訊號及接發電力，從而進行除錯及分析。 FIG. 4 is a schematic diagram of the test fixture 101 in FIG. 2 coupled to the control device 180 , the power supply device 190 and the device under test 199 in another embodiment. For example, if the device under test 199 has a USB type-C signal access interface, but still needs to be powered through a DC power outlet, then as shown in FIG. 4, the signal access interface of the device under test 199 can be coupled to The second interface 104, and the power interface of the device under test 199 is coupled to the fourth interface 105 to access signals and send and receive power for debugging and analysis.

第5圖為實施例中，客製化的USB類型C介面的接腳分配示意圖。舉例來說，第1圖至第4圖之第一介面102及第二介面104之接腳分配可如第5圖所示。第5圖僅為舉例，實務上仍可根據需求，調整接腳分配。如第5圖所示，舉例而言，客製化的USB類型C介面之一側的接腳之編號可為A1至A12，另一側的接腳之編號可為B1至B12。如第5圖所示，相關的接腳可例如包含地端接腳(GND)、發送資料接腳(TXD)、接收資料接腳(RXD)、電源接腳(VBUS)、時脈接腳(SCK)、資料輸出接腳(SO)、資料輸入接腳(SI)、晶片選擇接腳(CS)、 時脈接腳(SCL)、序列資料接腳(SDA)等，以支援SPI介面、I2C介面及UART介面。第5圖中，舉例而言，第A11接腳註記為SDA1，且第B11接腳註記為SDA2，其皆為序列資料接腳(SDA)，尾碼數字係用以區隔，其他接腳的註記方式同此理，故不贅述。 FIG. 5 is a schematic diagram of the pin allocation of the customized USB Type-C interface in the embodiment. For example, the pin allocation of the first interface 102 and the second interface 104 in FIGS. 1 to 4 can be as shown in FIG. 5 . Figure 5 is just an example. In practice, the pin allocation can still be adjusted according to the needs. As shown in FIG. 5 , for example, the pins on one side of the customized USB Type-C interface can be numbered from A1 to A12, and the pins on the other side can be numbered from B1 to B12. As shown in FIG. 5, the relevant pins may include, for example, a ground terminal pin (GND), a transmit data pin (TXD), a receive data pin (RXD), a power supply pin (VBUS), a clock pin ( SCK), data output pin (SO), data input pin (SI), chip select pin (CS), clock pin (SCL), serial data pin (SDA), etc., to support SPI interface, I 2 C interface and UART interface. In Figure 5, for example, the A11 pin is marked as SDA1, and the B11 pin is marked as SDA2, both of which are serial data pins (SDA), and the suffix numbers are used to distinguish, and the other pins The notation method is the same as this, so it will not be repeated.

根據實施例，第二介面104可為耦接於待測裝置199之雙面可插介面。舉例而言，將待測裝置199透過傳輸線耦接於第二介面104，USB類型C插頭之插入方向不受限制。由於第一介面102及第二介面104之接腳分配為客製化，若USB插頭耦接於母座時與預設的方向相反，後續於處理訊號時可另行處理，例如可另行處理記錄檔(log)即可進行除錯及分析。 According to an embodiment, the second interface 104 may be a double-sided pluggable interface coupled to the device under test 199 . For example, the device under test 199 is coupled to the second interface 104 through the transmission line, and the insertion direction of the USB Type-C plug is not limited. Since the pin allocation of the first interface 102 and the second interface 104 is customized, if the USB plug is coupled to the female socket in the opposite direction from the default direction, it can be processed separately when processing the signal, for example, the record file can be processed separately (log) can be debugged and analyzed.

總上，使用實施例提供之測試治具101，可改善測試治具與待測裝置之溝通的彈性，不須額外準備電源供應器以供電給待測裝置，也提供了多種供電路徑，故可改善便利度。此外，可避免頻繁插拔電源接頭，導致之電路板毀損，還可避免介面之間的驅動程式問題。測試治具101可測試當前多數的待測裝置，採用USB類型C之介面，因接腳間距(pin pitch)下降，故可進一步節省空間，例如可比傳統的排針(pin header)連接器體積更小。因此，可有效處理本領域面臨之諸多難題。 In general, the use of the test fixture 101 provided by the embodiment can improve the flexibility of communication between the test fixture and the device under test. It is not necessary to prepare an additional power supply to supply power to the device under test, and it also provides a variety of power supply paths, so it can be Improve convenience. In addition, it can avoid frequent plugging and unplugging of the power connector, causing damage to the circuit board, and avoid driver problems between interfaces. The test fixture 101 can test most of the current devices under test. It adopts the USB Type-C interface. Because the pin pitch is reduced, it can further save space. For example, it can be smaller than the traditional pin header connector. small. Therefore, many difficult problems faced in this field can be effectively dealt with.

在本發明的一實施例中，在新伺服器的研發過程中，新伺服器的主機板必須進行多項測試，有時候需不斷地重複進行，確認所有測試項目皆為正常能達到產品出貨之規格及品質。因此，利用本發明之測試治具可方便地測試伺服器的主機板，增進伺服器的可靠度，使通過測試之伺服器更適合用於人工智慧(Artificial Intelligence，簡稱AI)運算、邊緣運算(Edge Computing)，或可當作5G伺服器、雲端伺服器或車聯網伺服器使用。 以上所述僅為本發明之較佳實施例，凡依本發明申請專利範圍所做之均等變化 與修飾，皆應屬本發明之涵蓋範圍。 In one embodiment of the present invention, during the research and development process of the new server, the motherboard of the new server must undergo multiple tests, and sometimes it needs to be repeated continuously to confirm that all test items are normal and can reach the product shipment. Specifications and quality. Therefore, the main board of the server can be easily tested by using the test fixture of the present invention, the reliability of the server is improved, and the server that passes the test is more suitable for artificial intelligence (Artificial Intelligence, referred to as AI) computing, edge computing ( Edge Computing), or it can be used as a 5G server, cloud server or Internet of Vehicles server. The above is only a preferred embodiment of the present invention, and all equivalent changes made according to the patent scope of the present invention All modifications and modifications shall fall within the scope of the present invention.

101:測試治具 101: Test fixture

102:第一介面 102: The first interface

103:第三介面 103: The third interface

104:第二介面 104: The second interface

105:第四介面 105: The fourth interface

106:橋接單元 106: Bridge unit

109:電源切換器 109:Power switcher

110:供電單元 110: Power supply unit

S1:第一訊號 S1: The first signal

S2:第二訊號 S2: Second signal

V1:第一電壓 V1: first voltage

V2:第二電壓 V2: second voltage

Claims (10)

一種測試治具，包含：一第一介面，用以存取一第一訊號；一第二介面，用以存取對應於該第一訊號之一第二訊號及/或輸出一第二電壓；一橋接單元，耦接於該第一介面及該第二介面之間，用以橋接該第一介面及該第二介面；一第三介面，用以接收一第一電壓；一供電單元，用以根據該第一電壓輸出該第二電壓，包含一第一端，耦接於該第三介面，用以接收該第一電壓，及一第二端，用以輸出該第二電壓；一第四介面，用以輸出該第二電壓；及一電源切換器，用以輸出該第二電壓至該第二介面及/或該第四介面，包含一第一端，耦接於該供電單元之該第二端，用以接收該第二電壓，一第二端，耦接於該第二介面，及一第三端，耦接於該第四介面，其中該電源切換器之該第一端選擇性地電連接於該電源切換器之該第二端及/或該第三端。 A test fixture, comprising: a first interface for accessing a first signal; a second interface for accessing a second signal corresponding to the first signal and/or outputting a second voltage; A bridge unit, coupled between the first interface and the second interface, for bridging the first interface and the second interface; a third interface, for receiving a first voltage; a power supply unit for to output the second voltage according to the first voltage, including a first terminal coupled to the third interface for receiving the first voltage, and a second terminal for outputting the second voltage; Four interfaces, used to output the second voltage; and a power switch, used to output the second voltage to the second interface and/or the fourth interface, including a first terminal coupled to the power supply unit The second terminal is used to receive the second voltage, a second terminal is coupled to the second interface, and a third terminal is coupled to the fourth interface, wherein the first terminal of the power switch selectively electrically connected to the second end and/or the third end of the power switch. 如請求項1之測試治具，其中該供電單元另包含：一供電控制器，用以將該第一電壓轉換為一第三電壓，包含一第一端耦接於該供電單元之該第一端，及一第二端用以輸出該第三電壓；及一電源轉換器，用以將該第三電壓轉換為該第二電壓，包含一第一端耦接於該供電控制器之該第二端，及一第二端，耦接於該供電單元之該第二端，用以輸出該第二電壓。 The test fixture according to claim 1, wherein the power supply unit further includes: a power supply controller for converting the first voltage into a third voltage, including a first terminal coupled to the first power supply unit terminal, and a second terminal for outputting the third voltage; and a power converter for converting the third voltage into the second voltage, including a first terminal coupled to the first terminal of the power supply controller Two terminals and a second terminal are coupled to the second terminal of the power supply unit for outputting the second voltage. 如請求項2所述的測試治具，其中該第三電壓實質上高於該第二電壓。 The test fixture as claimed in claim 2, wherein the third voltage is substantially higher than the second voltage. 如請求項2所述的測試治具，其中該電源轉換器為一降壓變換器。 The test fixture as claimed in claim 2, wherein the power converter is a step-down converter. 如請求項1所述的測試治具，其中該第一電壓實質上等於該第二電壓。 The test fixture as claimed in claim 1, wherein the first voltage is substantially equal to the second voltage. 如請求項1所述的測試治具，其中該第四介面為一直流電源插座。 The test fixture as claimed in claim 1, wherein the fourth interface is a DC power socket. 如請求項1所述的測試治具，其中該電源切換器為一機械式切換器或一電子式切換器。 The test fixture as claimed in claim 1, wherein the power switch is a mechanical switch or an electronic switch. 如請求項1所述的測試治具，其中該第一介面為一第一客製化USB類型C介面，該第二介面為一第二客製化USB類型C介面，且該第三介面為一標準USB類型C介面。 The test fixture as described in claim 1, wherein the first interface is a first customized USB Type-C interface, the second interface is a second customized USB Type-C interface, and the third interface is A standard USB Type-C interface. 如請求項8所述的測試治具，其中該第二介面係用以耦接至一待測裝置，以使用該第二訊號測試該待測裝置之至少一預定介面，該至少一預定介面包含一I2C介面、一UART介面及一SPI介面之至少一者。 The test fixture as described in claim 8, wherein the second interface is used to be coupled to a device under test, so as to use the second signal to test at least one predetermined interface of the device under test, and the at least one predetermined interface includes At least one of an I 2 C interface, a UART interface and an SPI interface. 如請求項8所述的測試治具，其中該第二介面係耦接於一待測裝置之一雙面可插介面。 The test fixture according to claim 8, wherein the second interface is coupled to a double-sided pluggable interface of a device under test.
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