CN107870271A - Automated testing method and device - Google Patents
Automated testing method and device Download PDFInfo
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- CN107870271A CN107870271A CN201610958329.8A CN201610958329A CN107870271A CN 107870271 A CN107870271 A CN 107870271A CN 201610958329 A CN201610958329 A CN 201610958329A CN 107870271 A CN107870271 A CN 107870271A
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The present invention relates to a kind of automated testing method and device.This method includes：Obtain test program；According to the test program, calculating simulation control instruction；The simulation control instruction is sent to equipment under test, so that the equipment under test responds, and forms response data；Obtain the response data；The response data and preset reference data are contrasted, draw test result；Export the test result.A kind of automatic test device.The automatic test device is used to be connected with equipment under test, and the automatic test device includes：Main control module, energy supply control module and external interface module.Above-mentioned automated testing method and device, by introducing a kind of brand-new ATE and method of testing, the situations such as the embedded product testing time is long, efficiency is low, error rate is high, artificial handling difference can effectively be improved, meanwhile it can effectively reduce human cost, testing cost and the construction cycle by a relatively large margin.
Description
Technical field
The present invention relates to the technical field of embedded product performance test, more particularly to a kind of automated testing method and
Device.
Background technology
With the development of science and technology and social economy, scientific and technological progress active influence the economy of society and changes people
Life style.What most of existing electronic product was developed based on embedded system, embedded system includes following features：
Miniaturization, close coupling, specificity etc., therefore embedded system is being combined so that the same PC of measuring technology of both software, hardware
Software is also different.
At present, the test of embedded system is typically completed by artificial, is largely artificial manual test, i.e., by anti-
Device power, power-off, button, plug USB, the plug operation such as SD card are carried out again, and carry out manual test embedded product can
By property.But the drawbacks of manual test is also obvious：Time-consuming, efficiency is low, error rate is high, artificial handling difference.
The content of the invention
Based on this, it is necessary to for the technical problem that manual test drawback is larger, there is provided a kind of automated testing method and
Device.
One technical scheme is：A kind of automated testing method.This method includes：Obtain test program；According to the test
Program, calculating simulation control instruction；The simulation control instruction is sent to equipment under test, so that the equipment under test makes sound
Should, and form response data；Obtain the response data of the equipment under test；By the response data and preset reference data
Contrasted, draw test result；Export the test result.
In one of the embodiments, the acquisition test program, including：The test journey is obtained from terminal
Sequence.
In one of the embodiments, the simulation control instruction includes upper electric control instruction and/or interface plug control
Instruction.
In one of the embodiments, it is described according to the test program, calculating simulation control instruction, including：Judge institute
State whether test program includes pre-set control programs；Refer to if so, then calculating the simulation control according to the pre-set control programs
Order；Wherein, the pre-set control programs include upper electric control program and/or interface plug program, the simulation control instruction bag
Include electric control instruction and/or interface plug control instruction.
In one of the embodiments, it is described to be contrasted the response data and preset reference data, draw test
As a result, including：Judge the response data whether in the preset reference data area；If so, then generation malfunction coefficient refers to
Order, draws abnormality test result；If it is not, then generating normal idsplay order, proper testing result is drawn；Wherein, the test knot
Fruit includes the abnormality test result or the proper testing result.
Another technical scheme is：A kind of automatic test device.The automatic test device is used to be connected with equipment under test,
The automatic test device includes：Main control module, energy supply control module and external interface module, the main control module respectively with
The energy supply control module and external interface module connection；The energy supply control module is used to connect with the equipment under test
Connect, to be powered to the equipment under test；The external interface module is used to be connected with computer, to obtain test program；It is described
Main control module is used for according to the test program, calculating simulation control instruction；The external interface module is additionally operable to set with tested
Standby connection, the simulation control instruction is sent to the equipment under test, so that the equipment under test responds, and formed
Response data；The main control module is additionally operable to obtain the number of responses of the equipment under test by the external interface module
According to the main control module is additionally operable to be contrasted the response data and preset reference data, draws test result；The master
Control module is additionally operable to export the test result.
In one of the embodiments, the automatic test device also includes display module, the display module and institute
Main control module connection is stated, for test result described in display output.
In one of the embodiments, the display module has LED display and/or LCD display.
In one of the embodiments, the automatic test device also includes key-press module, the key-press module and institute
Main control module connection is stated, for inputting key information to the main control module, to carry out button simulation control to the equipment under test
System.
In one of the embodiments, the external interface module have USB interface, SD card interface, TF card interface and/or
Common serial ports.
Above-mentioned automated testing method and device, effectively improve that the embedded product testing time is long, efficiency is low, mistake
The situations such as high, the artificial handling difference of rate, meanwhile, it can effectively reduce human cost, testing cost and exploitation week by a relatively large margin
Phase.
Brief description of the drawings
Fig. 1 is the application environment schematic diagram of automated testing method in an embodiment；
Fig. 2 is the step schematic diagram of automated testing method in an embodiment；
Fig. 3 is the module diagram of automatic test device in an embodiment；
Fig. 4 is the application environment schematic diagram of automatic test device in an embodiment；
Fig. 5 is the module diagram of automatic test device in another embodiment；
Fig. 6 is the testing procedure schematic diagram of automatic test device in an embodiment.
Embodiment
In order to facilitate the understanding of the purposes, features and advantages of the present invention, below in conjunction with the accompanying drawings to the present invention
Embodiment be described in detail.Many details are elaborated in the following description in order to fully understand this hair
It is bright.But the invention can be embodied in many other ways as described herein, those skilled in the art can be not
Similar improvement is done in the case of running counter to intension of the present invention, therefore the present invention is not limited by following public specific embodiment.
Referring to Fig. 1, it is the application environment schematic diagram of automated testing method in an embodiment.The application environment
Including PC end main frames, automatic test device and equipment under test.Testing scheme is transferred to automatic test device by PC end main frames
Place.For example, the testing scheme is a set of test software programs, depending on the product type of equipment under test.For example, equipment under test
It is a set of embedded speech toy, then test man, by corresponding test program, downloads according to the embedded voice toy of this set
To at automatic test device.
Automatic test device can carry out test interaction with equipment under test.For example, quilt is carried out at automatic test device
The simulation control operation of measurement equipment, equipment under test can make corresponding response after being operated, and form response data and go forward side by side line number
According to feedback, i.e. equipment under test feeds back to response data at automatic test device, automatic test device by response data with
Reference data is contrasted, and evaluates test result.
Referring to Fig. 2, it is the step schematic diagram of automated testing method 20 in an embodiment.For example, automation
Method of testing 20 is applied to the application environment described in Fig. 1.The automated testing method 20 includes：
Step S201：Obtain test program.
Specifically, test program refers to software program, the test program is used to control corresponding equipment under test, is set by tested
Depending on standby product type.That is, test program is the manual control equipment under test of means simulation for mechanical software
Operating process, to reach the purpose of automatic test.For example, program language can be C language, C Plus Plus, assembler language etc..
For example, it is that downloaded obtains that the process for obtaining test program, which uses the PC end main frames from outside, i.e., from calculating
Machine terminal obtains the test program.That is, PC end main frames are developed in advance is programmed with the test program, automatic test
Device finds the test program, and download to certainly by the PC end main frames outside connection from the storage address of the PC end main frames
In dynamicization test device.
It is appreciated that the test program can be developed or programmed in multiple terminal type, and it is not only limited to computer.
For example, the terminal type for developing or programming the test program includes server, network cloud storage device, mobile terminal and/or can worn
Wear equipment etc..
Step S202：According to the test program, calculating simulation control instruction.
Specifically, simulation control instruction refers to the instruction for simulating manual test control equipment under test.For example, closing with switch
It is combined into example to illustrate, the mode of traditional manually opened switch is to make the action of closure switch to switch, and what is switched closes
Conjunction is exactly that the mode of user when needing testing and control manually closes the switch；Simulation control instruction aiming at opening manually
The defects of opening mode, the mode controlled using signal realize the closure of switch；For example, by sending close command to switch, open
Pass closes the switch after receiving close command, so as to realize the conducting of switch ends electrical appliance or parts.To sum up, simulation control
The instruction of manual test control equipment under test is just simulated in instruction, to realize the simulation test of automation.
Carry substantial amounts of information in test program, the equipment under test of heterogeneous, the information phase carried in test program
It is different.That is, different codes is had according to different test purpose and test-types in the information carried in test program,
Therefore, to reach the purpose of simulation manual test, for different test purposes, the test mesh is calculated by corresponding test code
Corresponding simulation control instruction.For example, the simulation control instruction instructs including upper electric control.For example, the simulation control
Instruction includes interface plug control instruction.For example, the simulation control instruction includes upper electric control instruction and interface plug control
Instruction.
For example, the test purpose for simulating equipment under test break-make electrical testing, finds upper automatically controlled from the test program
The program of system, so as to calculate the simulation control instruction of power on/off frequency, i.e., upper electric control instruction；And for example, it is tested for simulating
The test purpose of device keys test, finds the program by key control, so as to calculate keying frequency from the test program
With the simulation control instruction of key value；And for example, for the test purpose of simulation equipment under test plug-in card test, from the test journey
The program of plug card control is found in sequence, calculates the simulation control instruction of the plug frequency of all kinds plug-in card, i.e. interface
Plug control instruction.
In one of the embodiments, it is described according to the test program, calculating simulation control instruction, including：Judge institute
State whether test program includes pre-set control programs；Refer to if so, then calculating the simulation control according to the pre-set control programs
Order；Wherein, the pre-set control programs include upper electric control program and/or interface plug program, the simulation control instruction bag
Include electric control instruction and/or interface plug control instruction.
Step S203：The simulation control instruction is sent to equipment under test, so that the equipment under test responds, and
Form response data.
Specifically, need to be sent to equipment under test after simulation control instruction generation, after being received by equipment under test, according to the mould
Intend control instruction operation to perform.Understand, equipment under test can produce execution data in the process for performing the simulation control instruction, also
It is to say, equipment under test can make corresponding response, and response data corresponding to formation in the process for performing the simulation control instruction.
For example, response data refers to equipment under test caused data during the simulation control instruction is performed, such as
The data include performing execution time, execution journal and execution speed used in the simulation control instruction etc..
For example, automatic test device sends the simulation control instruction to equipment under test, the equipment under test is made
Response, and form response data；And for example, automatic test device is sent the simulation control instruction to quilt by external interface
Measurement equipment；And for example, automatic test device is by controlling the upper electricity of power module control control equipment under test and powering off.
Step S204：Obtain the response data.
Specifically, equipment under test could be made that corresponding response after performing simulation control instruction, while produce response data.Example
Such as, response data caused by equipment under test is transmitted to automation and surveyed by equipment under test by the external interface of automatic test device
Trial assembly is put, so that automatic test device obtains the response data.For example, equipment under test uses serial ports with automatic test device
The connected mode of communication is attached.For example, the connected mode of serial communication includes：Parallel, serial or other modes.For example,
Equipment under test and automatic test device wireless connection, so that automatic test device is wirelessly from equipment under test end
Obtain the response data.
Step S205：The response data and preset reference data are contrasted, draw test result.
Specifically, response data caused by equipment under test needs the execution feelings by may know that simulation control instruction to Bizet
Condition.Preset reference data are equipped with for example, being preset in automatic test device；For example, user will be default beforehand through input unit
In reference data input automatic test device, stored by automatic test device.After response data is got, this is preset
Supplemental characteristic is contrasted with the preset reference data.It should be noted that to improve to specific efficiency, the class of preset reference data
Type is identical with the type of response data.For example, the mode that response data is contrasted with preset reference data is：Judge the sound
Data are answered whether in the preset reference data area；If so, then generating malfunction coefficient instruction, abnormality test result is drawn；
If it is not, then generating normal idsplay order, proper testing result is drawn；Wherein, the test result includes the abnormality test knot
Fruit or the proper testing result.
It is above-mentioned judge the response data whether in the preset reference data area step, it can be understood as, such as
For the function of fruit simulation test not in setting category, equipment under test can form a kind of abnormal data, feed back to automatic test dress
Place is put, abnormal data and reference data are analyzed automatic test device, and in display failure code.If simulation
For the function of test in setting category, equipment under test can form a kind of normal data, feed back at automatic test device, and
Reminded at automatic test device and pass through test.
Step S206：Export the test result.
Specifically, automatic test device after test result is drawn, it is necessary to export the test result to user feedback, with
User is set to understand the test case of equipment under test in time.It is appreciated that the mode for exporting the test result have it is a variety of, such as
There are the modes such as voice, word, vibrations.Relatively straightforward mode is the display output by way of display, so that user can be with
The test case of equipment under test is understood by word, code etc..For example, when equipment under test has test failure, failure generation is shown
Code；And for example, when equipment under test test is normal, display reminds word by test etc..It is appreciated that a certain functional test passes through
Afterwards, test man can carry out the next item down functional test, can also carry out next product function test, can also terminate to test.
Above-mentioned automated testing method, the automatic test of software and combination of hardware is changed into by traditional manual test, can
Effectively improve the situations such as the embedded product testing time is long, efficiency is low, error rate is high, artificial handling difference, meanwhile, can be effective
Human cost, testing cost and the construction cycle of ground reduction by a relatively large margin.
Referring to Fig. 3, it is the module diagram of automatic test device in an embodiment, for example, the automation
Test device is controlled using above-mentioned automated testing method.For example, automatic test device includes：Main control module 310, power supply control
Molding block 320 and external interface module 330, main control module 310 respectively with energy supply control module 320 and external interface module 330
Connection.
For example, main control module is also referred to as central processing unit, that is, MCU (Microcontroller Unit；Micro-control unit),
For processing data and obtain a result.For example, energy supply control module includes power supply and its control module.Power supply is used for master control mould
Block and equipment under test power supply.The control module of the power supply is controlled to be connected with main control module and power supply, with the finger according to main control module
Order controls the power supply and outside connection or shut-off.For example, external interface module is used for reception and the hair for realizing program or data
Send, it has multiple interfaces pattern, for example, external interface module includes：The interfaces such as SD card pattern, TF card mode, serial ports pattern
Pattern.
Also referring to Fig. 3 and Fig. 4, for example, energy supply control module 320 is used to be connected with equipment under test 420, with to tested
Equipment is powered.External interface module 330 is used to be connected with computer 410, to obtain test program.Main control module 310 is used for root
According to test program, calculating simulation control instruction.External interface module 330 is additionally operable to be connected with equipment under test 420, and simulation is controlled
System instruction is sent to equipment under test 420, so that equipment under test 420 responds, and forms response data.Main control module 310 is also
For obtaining response data by external interface module 330, main control module 310 is additionally operable to response data and preset reference data
Contrasted, draw test result.Main control module 310 is additionally operable to output test result.
Above-mentioned automatic test device, by introducing a kind of brand-new ATE, changed by traditional manual test
It is changed into the automatic test of software and combination of hardware, can effectively improves that the embedded product testing time is long, efficiency is low, error rate
The situations such as high, artificial handling difference, meanwhile, it can effectively reduce human cost, testing cost and the construction cycle by a relatively large margin.
Referring to Fig. 5, it is the module diagram of automatic test device in another embodiment, for the ease of output
Test result, in one of the embodiments, automatic test device also include display module 510, display module 510 and master control
Module 310 connects, for display output test result.In this way, data message or object information that main control module will can treat,
Such as the information for pass through or it is non-by, be pushed to display module, tester i.e. user fed back information to by display module,
So as to output test result.
In one of the embodiments, display module has LED display.Display module has LCD display.Show mould
Block has LED display and LCD display.
For analogue key testing, as shown in figure 5, in one of the embodiments, automatic test device also includes pressing
Key module 520, key-press module 520 are connected with main control module 310, for inputting key information to main control module 310, with to tested
Equipment carries out button simulation control.In this way, automatic test device is according to the keying frequency and key value Cao Zuoanjian set
Module, key-press module can carry out simulation control equipment under test by main control module, and main control module receives the letter that key-press module is sent
Breath, and equipment under test is pushed to by external interface module, so as to realize the analogue key testing on equipment under test.
Plug is simulated on equipment under test to realize, in one of the embodiments, external interface module 330 has USB
Interface, SD card interface, TF card interface and/or common serial ports, in this way, automatic test device is according to the interface plug-in card set
Plug frequency, may be implemented in and plugging condition is simulated on equipment under test.
To realize upper electricity and power failure test to equipment under test, for example, energy supply control module includes relay.For example, root
According to the power on/off frequency set, MCU main control modules realize the upper of equipment under test by the power supply of relay driving equipment under test
The test of electricity and power-off running status.Meanwhile the selection of main control module controllable power and its external out-put supply of control module
Property, for example, the control includes：Whether display module is supplied electricity to；Whether equipment under test is supplied electricity to；Whether itself i.e. master control is supplied electricity to
Module.
Plan as a whole control to realize, for example, the operation program of main control module can be downloaded to obtain from PC end main frames, i.e., by external
Interface module obtains test program.Main control module is calculating power supply and its power on/off frequency of control module according to test program
Rate, the keying frequency of key-press module and key value, the plug frequency of all kinds plug-in card of external interface module etc..So have
Effect ground improves the situations such as the embedded product testing time is long, efficiency is low, error rate is high, artificial handling difference, meanwhile, can be effectively
Human cost, testing cost and the construction cycle of reduction by a relatively large margin.
Referring to Fig. 6, it is the testing procedure schematic diagram of automatic test device in an embodiment.For ease of understanding
The test philosophy of automatic test device, below in conjunction with Fig. 5 and Fig. 6, test philosophy and function to automatic test device are made
Further illustrate.
First, after test starts, equipment under test is attached with automatic test device by external interface module.Example
Such as, using the connected mode of serial ports.For example, the connected mode of serial ports includes：Parallel, serial or other modes.Access is tested to be set
It is that computer goes out to recall corresponding test program in PC end main frames, and download in automatic test device after standby.
Then, after test program has been downloaded, i.e., automatic test device is after downloaded test program is complete, automatic
Change at test device, carry out power supply and energy supply control module is controlled according to test program；Or for equipment under test carry out by
Key simulation control.For example, manipulated at key-press module, and the state of Real Time Observation equipment under test.
Then, when equipment under test responds, if the function of simulation test is not being set in category, equipment under test can be formed
A kind of abnormal data, feeds back at automatic test device, and automatic test device carries out abnormal data and reference data pair
Failure code is shown than analysis, and in display module.
Secondly, when equipment under test responds, if the function of simulation test is being set in category, equipment under test can form one
Kind normal data, feeds back at automatic test device, and is reminded in display module by test, i.e., display module, which is shown, quotes
Pass through.
Finally, if faulty, test man feeds back to developer, exploit person according to the fault message of display module report
After member makes corresponding adjustment, then carry out same functional test.If fault-free, in a certain functional test by rear, test man
The next item down functional test can be carried out, can also carry out next product function test, can also terminate to test.
The beneficial effects of the invention are as follows：, can be effectively by introducing a kind of brand-new ATE and method of testing
Improve the situations such as the embedded product testing time is long, efficiency is low, error rate is high, artificial handling difference, meanwhile, can effectively it reduce
Human cost, testing cost and construction cycle by a relatively large margin.
Each technical characteristic of embodiment described above can be combined arbitrarily, to make description succinct, not to above-mentioned reality
Apply all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, the scope that this specification is recorded all is considered to be.
Embodiment described above only expresses the several embodiments of the present invention, and its description is more specific and detailed, but simultaneously
Can not therefore it be construed as limiting the scope of the patent.It should be pointed out that come for one of ordinary skill in the art
Say, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to the protection of the present invention
Scope.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.
Claims (10)
1. a kind of automated testing method, including：
Obtain test program；
According to the test program, calculating simulation control instruction；
The simulation control instruction is sent to equipment under test, so that the equipment under test responds, and forms response data；
Obtain the response data of the equipment under test；
The response data and preset reference data are contrasted, draw test result；
Export the test result.
2. automated testing method according to claim 1, it is characterised in that the acquisition test program, including：From meter
Calculation machine terminal obtains the test program.
3. automated testing method according to claim 1, it is characterised in that the simulation control instruction includes upper automatically controlled
System instruction and/or interface plug control instruction.
4. automated testing method according to claim 1, it is characterised in that it is described according to the test program, calculate
Control instruction is simulated, including：
Judge whether the test program includes pre-set control programs；
If so, then calculate the simulation control instruction according to the pre-set control programs；Wherein,
The pre-set control programs include upper electric control program and/or interface plug program, and the simulation control instruction includes upper
Electric control instruction and/or interface plug control instruction.
5. automated testing method according to claim 1, it is characterised in that described by the response data and default ginseng
Examine data to be contrasted, draw test result, including：
Judge the response data whether in the preset reference data area；
If so, then generating malfunction coefficient instruction, abnormality test result is drawn；
If it is not, then generating normal idsplay order, proper testing result is drawn；Wherein, the test result includes the abnormal survey
Test result or the proper testing result.
6. a kind of automatic test device, the automatic test device is used to be connected with equipment under test, it is characterised in that it is described oneself
Dynamicization test device includes：Main control module, energy supply control module and external interface module, the main control module respectively with the electricity
Source control module and external interface module connection；
The energy supply control module is used to be connected with the equipment under test, to be powered to the equipment under test；
The external interface module is used to be connected with computer, to obtain test program；
The main control module is used for according to the test program, calculating simulation control instruction；
The external interface module is additionally operable to be connected with equipment under test, and the simulation control instruction is sent to described be tested and set
It is standby, so that the equipment under test responds, and form response data；
The main control module is additionally operable to obtain the response data of the equipment under test by the external interface module,
The main control module is additionally operable to be contrasted the response data and preset reference data, draws test result；
The main control module is additionally operable to export the test result.
7. automatic test device according to claim 6, it is characterised in that the automatic test device also includes aobvious
Show module, the display module is connected with the main control module, for test result described in display output.
8. automatic test device according to claim 7, it is characterised in that the display module has LED display
And/or LCD display.
9. automatic test device according to claim 6, it is characterised in that the automatic test device also includes pressing
Key module, the key-press module are connected with the main control module, for inputting key information to the main control module, with to described
Equipment under test carries out button simulation control.
10. automatic test device according to claim 6, it is characterised in that there is the external interface module USB to connect
Mouth, SD card interface, TF card interface and/or common serial ports.
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| CN114531383A (en) * | 2022-03-17 | 2022-05-24 | 深圳市三旺通信股份有限公司 | Abnormity detection method, device and equipment for railway vehicle-mounted switch and storage medium |
| CN114531383B (en) * | 2022-03-17 | 2024-05-03 | 深圳市三旺通信股份有限公司 | Method, device, equipment and storage medium for detecting abnormality of railway vehicle-mounted switch |
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