CN103869260A - Power supply test system and method - Google Patents
Power supply test system and method Download PDFInfo
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- CN103869260A CN103869260A CN201210537089.6A CN201210537089A CN103869260A CN 103869260 A CN103869260 A CN 103869260A CN 201210537089 A CN201210537089 A CN 201210537089A CN 103869260 A CN103869260 A CN 103869260A
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Abstract
The invention discloses a power supply test system, which comprises a high-low temperature test box, a program-controlled power supply, a program-controlled load, a channel control card and a data acquisition device, wherein the high-low temperature test box, the program-controlled power supply, the program-controlled load, the channel control card and the data acquisition device are connected with test control equipment via communication interfaces. The invention also discloses a power supply test method. According to the system and the method, mass screening test can be carried out on communication power supplies in a simulated limit working environment, the quality and reliability of communication power supplies leaving the factory can be improved, and a single program-controlled power supply and a single program-controlled load can be used for carrying out screening test on a plurality of communication power supplies.
Description
Technical field
The present invention relates to field tests, relate in particular to a kind of power detecting system and method.
Background technology
Communication power supply is the heart of communication system, reliable and stable communication power supply, it is the key that guarantees communication system security, reliability service, once communication power supply breaks down, can cause the power failure of communication power supply to communication facilities, communication facilities just cannot move, and then causes telecommunication circuit interruption, communication system paralysis, thereby causes great economic and social benefit loss.
At present, in order to guarantee the quality of communication power supply, before communication power supply dispatches from the factory, all need it to carry out functional test and burn-in test.General of the functional test of communication power supply is carried out at normal temperatures; Burn-in test is also that a kind of hot environment of emulation is tested.By functional test and burn-in test, communication power supply is screened, filter out underproof communication power supply, guarantee the quality of the communication power supply dispatching from the factory as far as possible.But these test conditions do not reach the working limit condition of communication power supply, when later stage communication power supply approaches working limit condition in actual applications, still likely break down, and occur quality problems.Communication power supply manufacturer is generally in the time testing communication power supply at present, and every communication power supply to be measured all needs to connect a set of load conventionally, and device resource utilization factor is low.
Summary of the invention
In view of this, fundamental purpose of the present invention is to provide a kind of power detecting system and method, can, under the maximal work environment of simulation, carry out batch filler test to communication power supply, to improve the q&r of the communication power supply dispatching from the factory, and improve device resource utilization factor.
For achieving the above object, technical scheme of the present invention is achieved in that
The invention provides a kind of power detecting system, this test macro comprises high-low temperature test chamber, programmable power supply, program control load, channel control card and data acquisition unit, and described high-low temperature test chamber, described programmable power supply, described program control load, described channel control card, described data acquisition unit are all connected by communication interface with test opertaing device; Wherein,
Described high-low temperature test chamber, for providing humiture environment according to the test parameter of setting for tested power supply;
Described programmable power supply, for providing voltage according to the test parameter of setting for tested power supply;
Described program control load, for providing dynamic load according to the tested power supply of test parameter of setting;
Described channel control card, for being connected program control load timesharing one by one successively with tested power supply;
Described data acquisition unit, for gathering the response of the tested power supply being connected with program control load, and is uploaded to test opertaing device by Information Monitoring.
In such scheme, described system also comprises: working plate and card extender,
Described working plate is connected by cable with described card extender, and described working plate is connected with programmable power supply by cable;
Described card extender is connected with program control load by cable, and is subject to described channel control card control;
Described channel control card, specifically for the tested power supply with working plate, program control load timesharing access being connected with card extender by card extender.
In such scheme, described test parameter is inputted setting by testing opertaing device according to user.
In such scheme, described data acquisition unit specifically for:
The response of the tested power supply being connected with program control load from card extender collection.
In such scheme, described system also comprises test opertaing device, for: Information Monitoring and setting value that data acquisition unit is uploaded compare, and automatically determine whether and meet the demands, and automatically generate test report.
The present invention also provides a kind of power supply test method, and in applied power source test macro, this method of testing comprises:
High-low temperature test chamber, programmable power supply, program control load provide humiture environment, voltage and dynamic load according to the test parameter of setting for tested power supply respectively;
Channel control card is connected the program control load timesharing that load is provided for tested power supply successively one by one with tested power supply;
The response of the data acquisition unit pair tested power supply being connected with program control load gathers, and Information Monitoring is uploaded to test opertaing device.
In such scheme, described channel control card is connected program control load timesharing successively one by one with tested power supply, comprising:
Channel control card is connected program control load timesharing access with working plate by card extender corresponding tested power supply with card extender.
In such scheme, before test, described method also comprises: input setting test parameter according to user.
In such scheme, the described response collection to the tested power supply being connected with program control load is:
The response of the tested power supply that data acquisition unit is connected with program control load from card extender collection.
In such scheme, described by Information Monitoring be uploaded to test opertaing device after, described method also comprises:
Information Monitoring and setting value that test opertaing device is uploaded data acquisition unit compare, and automatically determine whether and meet the demands, and automatically generate test report.
Test macro provided by the present invention and method can be carried out automatic batch screening to communication power supply under the maximal work ambient conditions of simulation, farthest detect underproof communication power supply, have improved the q&r of the communication power supply dispatching from the factory.In test macro of the present invention, only just can carry out automatic screening test to many communication power supplies with single cover programmable power supply and program control load, improve the utilization factor of device resource, also save equipment cost simultaneously.
Accompanying drawing explanation
Fig. 1 is the structure composition schematic diagram of power detecting system of the present invention;
Fig. 2 is the realization flow schematic diagram of power supply test method of the present invention;
Fig. 3 is that the present invention realizes the communication power supply schematic diagram of filler test in batches;
Fig. 4 is the test realization flow schematic diagram that the embodiment of the present invention is screened communication power supply in batches;
Fig. 5 is the operation interface schematic diagram of the test opertaing device of the embodiment of the present invention.
Embodiment
Below in conjunction with drawings and the specific embodiments, the present invention is further described in more detail.
In the present invention, for convenience of describing, tested power supply described below all refers to tested communication power supply.
Fig. 1 is the structural representation of power detecting system of the present invention, as shown in Figure 1, described power detecting system comprises high-low temperature test chamber 1, programmable power supply 2, program control load 3, data acquisition unit 4, channel control card 5 and test opertaing device 8, and described high-low temperature test chamber 1, described programmable power supply 2, described program control load 3, described data acquisition unit 4, described channel control card 5 all with test opertaing device 8 and be connected by communication interface; Wherein,
Described high-low temperature test chamber 1, for providing humiture environment according to the test parameter of setting for tested power supply 9;
Described programmable power supply 2, for providing voltage according to the test parameter of setting for tested power supply 9;
Described program control load 3, for providing dynamic load according to the tested power supply 9 of test parameter of setting;
Described channel control card 5, for being connected program control load 3 one by one successively with tested power supply 9;
Described data acquisition unit 4, for the response of the tested power supply 9 being connected with program control load 3 is gathered, and is uploaded to test opertaing device 8 by Information Monitoring.
Here, high-low temperature test chamber 1 has communication interface to be connected with test opertaing device 8, can make the humiture environment of the high-low temperature test chamber 1 internal simulation limit by the programmed control in test opertaing device 8; Programmable power supply 2, program control load 3 also have communication interface to be connected with test opertaing device 8, can make programmable power supply 2, program control load 3 simulate the electric stress environment of the limit by the programmed control in test opertaing device 8.
Concrete, described power detecting system also comprises working plate 6 and card extender 7, and described working plate 6 is connected by cable with card extender 7, and described working plate 6 is connected with programmable power supply 2 by cable, and programmable power supply 2 is inputted for tested power supply 9 provides required voltage; Described card extender 7 is connected with program control load 3 by cable, and controlled by channel control card 5; Wherein,
Described working plate 6, for the tested power supply 9 being connected with working plate 6 is connected with card extender 7 one by one, this connection is only and the physical connection of card extender 7 whether conducting is realized according to the control of channel control card 5 by card extender 7;
Described card extender 7, for according to the control of the channel control card 5 corresponding tested power supply 9 that conducting is connected with working plate 6 one by one successively;
Described channel control card 5, specifically for the corresponding tested power supply 9 with working plate 6, program control load 3 timesharing accesses being connected with card extender 7 by card extender 7.
When tested power supply 9 quantity are when more, multiple working plates 6 can be set, the tested power supply 9 in coupling part respectively, and multiple card extenders 7 can be set, coupling part working plate 6 respectively.
Here, the load cable between working plate 6 and card extender 7 is multichannel working plate and connects, and channel control card 5 is by the relay switch of card extender 7, the corresponding tested power supply 9 that program control load 3 timesharing accesses are connected with card extender 7.
Concrete, when described power detecting system test, tested power supply 9 is placed in high-low temperature test chamber 1, and described tested power supply 9 is connected with working plate 6 by cable.
Concrete, described test parameter is inputted setting by testing opertaing device according to user.
Concrete, described data acquisition unit 4 specifically for:
Gather the response of the tested power supply 9 being connected with program control load 3 from card extender 7.
Here, card extender 7 has the sampling cable of input, outputting measurement value to be connected with data acquisition unit 4.Described response is voltage, the electric current equivalence of the input and output of tested power supply 9.
Concrete, described test opertaing device 8 also compares for Information Monitoring and setting value that data acquisition unit 4 is uploaded, automatically determines whether and meets the demands, and automatically generate test report.
Here, the tested power supply 9 of Jiang Duotai is placed in high-low temperature test chamber 1, and the input line of tested power supply 9, output line are connected with power input line and load line on working plate 6.Input line on all working plates 6 is connected with programmable power supply 2; Load line on all working plates 6 is connected on card extender 7, and card extender 7 has the sampling cable of input, outputting measurement value to be connected with data acquisition unit 4, is connected with program control load 3 and only export a road load on card extender 7.Control the relay on card extender 7 by channel control card 5, whenever guarantee can only have the output of a power supply to be measured to be connected with program control load 3.Channel control card 5 is connected with test opertaing device 8 by communication interface, issue passage switching command by the program controling module in test opertaing device 8 to channel control card 5, and channel control card 5 is connected with card extender 7 with working plate 6, can drive the switch motion of relay or the metal-oxide-semiconductor of card extender 7 according to command request, realize program control load 3 is switched from different tested power supply 9 and is connected.
Fig. 2 is the realization flow schematic diagram of power supply test method of the present invention, and this method of testing is applied in the power detecting system described in Fig. 1, and as shown in Figure 2, the method comprises the following steps:
Step 201: set test parameter;
Concrete, according to user's input, test opertaing device is set test parameter;
Step 202: power detecting system is according to the test parameter setup test environment of setting;
Concrete, high-low temperature test chamber, programmable power supply, program control load provide humiture environment, voltage and dynamic load according to the test parameter of setting for tested power supply respectively;
Step 203: start to test and generate test report.
Concrete, before test, tested power supply is placed in high-low temperature test chamber, and described tested power supply is connected with working plate by cable.
Concrete, channel control card is connected the program control load timesharing that load is provided for tested power supply successively one by one with tested power supply;
The response of the data acquisition unit pair tested power supply being connected with program control load gathers, and Information Monitoring is uploaded to test opertaing device.
Concrete, described channel control card is connected program control load timesharing successively one by one with tested power supply, comprising:
Channel control card is connected program control load timesharing access with working plate by card extender corresponding tested power supply with card extender.
Concrete, the described response collection to the tested power supply being connected with program control load is:
The response of the tested power supply that data acquisition unit is connected with program control load from card extender collection.
Concrete, described Information Monitoring is uploaded to after test opertaing device, Information Monitoring and setting value that test opertaing device is uploaded data acquisition unit compare, and automatically determine whether and meet the demands, and automatically generate test report.
Fig. 3 is that the present invention completes the communication power supply schematic diagram of filler test in batches, and power detecting system of the present invention is by adopting automatic testing software to complete the automatic test to communication power supply, and the principle of its test as shown in Figure 3.Mxm. and the minimum of environment temperature in high-low temperature test chamber, mxm. and the minimum of the voltage (being input voltage) that programmable power supply provides, the maximal value of the load that program control load provides and minimum value, and every cycle period, all independent control after setting, N platform communication power supply to be measured is tested in turn, can guarantee to make every communication power supply to travel through whole combined situation of several maximum conditions through several circulations, find by test whether tested communication power supply can break down in maximal work situation.
Such as, be mxm. and input voltage be mxm. in the situation that in environment temperature, N platform communication power supply to be tested by platform, every communication power supply is all gone through load shock test process under this kind of environment.The like, be that minimum and input voltage are be mxm. in the situation that in environment temperature, be that mxm. and input voltage are be minimum in the situation that in environment temperature, be that minimum and input voltage are be minimum in the situation that in environment temperature, under these several environment, every communication power supply all will be gone through the test of load shock, to find by test whether tested communication power supply can break down in maximal work situation better.
Fig. 4 is the test realization flow schematic diagram that the embodiment of the present invention is screened communication power supply in batches, as shown in Figure 4, comprises the following steps:
Step 401: input setting test parameter according to user, then enter step 402;
Concrete, described test parameter comprises: mxm. and the minimum of the input voltage that programmable power supply provides for tested power supply, mxm. and the minimum of the temperature that high-low temperature test chamber provides for tested power supply, maximal value and the minimum value of the dynamic load that program control load provides for tested power supply, and input voltage cycling time, environment temperature cycling time, load cycle time, total testing time etc., above test parameter is by user by the operation interface input of test opertaing device, and test opertaing device is inputted to set according to user.
Here, can be according to the difference of the model of tested communication power supply, manual modification is set test parameter or is imported the testing standard of described tested communication power supply.
Step 402: start and start testing button, then enter step 403;
Concrete, tester, by the operation interface of test opertaing device, clicks and starts testing button.
Step 403: high-low temperature test chamber, programmable power supply, program control load are started working according to the test parameter of setting, and be respectively tested power supply temperature environment, input voltage and dynamic load are provided;
Here, described temperature environment, input voltage, loading condition all can constantly be adjusted according to the test parameter of setting, and make every tested communication power supply travel through the combination of various limit condition of operations as shown in Figure 3.
Step 404: the relay of controlling the card extender of N road (starting from N=1) is connected, and the tested power supply of N platform is carried out to load shock test, then enters step 405;
Here, the relay in the card extender of described control N road is connected, even if also program control load is connected with the tested power supply of N platform.
Concrete, channel control card, by controlling the relay switch action of card extender, is connected different tested power supplys with program control load, so that realize testing by platform communication power supply.
Step 405: record test data also judges that whether tested power supply is qualified, if qualified, enters step 406, otherwise, step 407 entered;
Concrete, the response of the tested power supply that data acquisition unit is connected with program control load from card extender collection is also uploaded to test opertaing device by Information Monitoring.
Concrete, Information Monitoring is uploaded to after test opertaing device, and Information Monitoring and setting value that test opertaing device is uploaded data acquisition unit compare, and automatically judge that whether tested power supply is qualified.Here if judge that tested power supply test is qualified, can drive the pilot lamp on the operation interface of testing opertaing device to show green.
Concrete, the test result of all tested power supplys can show by the pilot lamp on the operation interface of test opertaing device, such as: with green representing that tested power work is normal, yellow represents that tested power supply has fault to occur and the number of times that breaks down is less than three times, redness and represents that tested power supply has fault to occur and the number of times that breaks down is that three times or three above, black represent not place tested power supply, the color of described pilot lamp can be set voluntarily by designer.
Step 406: control N road relay and disconnect, then enter step 408;
Step 407: report to the police and export and export failure message, and then enter step 406;
Concrete, on the operation interface of test opertaing device, pilot lamp shows the malfunction of tested power supply, so that remind this tested power supply of tester to have fault to occur, and by the failure message Write fault information list of tested power supply, and show in the failure message list of operation interface.
Step 408: judge whether the total testing time of setting, if so, enter step 410, otherwise, enter step 409;
Step 409: N is composed to new value, then enter step 404;
Here, describedly N is composed to new value be: judge whether N is maximal value, if not, N is added to 1, otherwise N is made as to 1 again; Also from N=1, by platform, tested power supply is carried out to loop test successively.
Step 410: preserve test report, test finishes.
Fig. 5 is the operation interface schematic diagram of the test opertaing device of the embodiment of the present invention, as shown in Figure 5, on this operation interface, be provided with setting parameter button, start testing button, stop testing button and button is checked in report, tester can, by the input equipment such as clicking the mouse, operate described operation interface; Can see every measured value of the position of current tested power supply, tested power supply and temperature value and the humidity value of current test environment from the center-left side position of described operation interface, wherein, described measured value comprises: input voltage value, input current value, 1 road output voltage values, 1 road output current value, 2 road output voltage values, 2 road output current values, the temperature value of current environment and the humidity value of current environment; The test result of all tested power supplys can represent by pilot lamp, wherein, the embodiment of the present invention with green representing that tested power work is normal, yellow represents that tested power supply has fault to occur and the number of times that breaks down is less than three times, redness and represents that tested power supply has fault to occur and the number of times that breaks down is that three times or three above, black represent not place tested power supply.Here, the color of described pilot lamp can be set voluntarily by designer.
The specifying information of all tested power supplys that break down can be found from failure message table, the temperature value of the date that in failure message table, the tested power supply of meeting demonstration breaks down, the time of breaking down, position, current environment and humidity value, input voltage value, input current value, 1 road output voltage values, 1 road output current value, 2 road output voltage values, 2 road output current values etc.
The above, be only preferred embodiment of the present invention, is not intended to limit protection scope of the present invention.
Claims (10)
1. a power detecting system, it is characterized in that, described test macro comprises high-low temperature test chamber, programmable power supply, program control load, channel control card and data acquisition unit, and described high-low temperature test chamber, described programmable power supply, described program control load, described channel control card, described data acquisition unit are all connected by communication interface with test opertaing device; Wherein,
Described high-low temperature test chamber, for providing humiture environment according to the test parameter of setting for tested power supply;
Described programmable power supply, for providing voltage according to the test parameter of setting for tested power supply;
Described program control load, for providing dynamic load according to the tested power supply of test parameter of setting;
Described channel control card, for being connected program control load timesharing one by one successively with tested power supply;
Described data acquisition unit, for gathering the response of the tested power supply being connected with program control load, and is uploaded to test opertaing device by Information Monitoring.
2. power detecting system according to claim 1, is characterized in that, described system also comprises: working plate and card extender,
Described working plate is connected by cable with described card extender, and described working plate is connected with programmable power supply by cable;
Described card extender is connected with program control load by cable, and is subject to described channel control card control;
Described channel control card, specifically for the tested power supply with working plate, program control load timesharing access being connected with card extender by card extender.
3. power detecting system according to claim 1, is characterized in that, described test parameter is inputted setting by testing opertaing device according to user.
4. power detecting system according to claim 2, is characterized in that, described data acquisition unit specifically for:
The response of the tested power supply being connected with program control load from card extender collection.
5. the power detecting system described in 1 as requested, is characterized in that, described system also comprises test opertaing device, for: Information Monitoring and setting value that data acquisition unit is uploaded compare, and automatically determine whether and meet the demands, and automatically generate test report.
6. a power supply test method, in applied power source test macro, is characterized in that, described method of testing comprises:
High-low temperature test chamber, programmable power supply, program control load provide humiture environment, voltage and dynamic load according to the test parameter of setting for tested power supply respectively;
Channel control card is connected the program control load timesharing that load is provided for tested power supply successively one by one with tested power supply;
The response of the data acquisition unit pair tested power supply being connected with program control load gathers, and Information Monitoring is uploaded to test opertaing device.
7. power supply test method according to claim 6, is characterized in that, described channel control card is connected program control load timesharing successively one by one with tested power supply, comprising:
Channel control card is connected program control load timesharing access with working plate by card extender corresponding tested power supply with card extender.
8. power supply test method according to claim 6, is characterized in that, before test, the method also comprises: input setting test parameter according to user.
9. power supply test method according to claim 6, is characterized in that, the described response collection to the tested power supply being connected with program control load is:
The response of the tested power supply that data acquisition unit is connected with program control load from card extender collection.
10. the power supply test method described in 6 as requested, is characterized in that, described Information Monitoring is uploaded to after test opertaing device, and the method also comprises:
Information Monitoring and setting value that test opertaing device is uploaded data acquisition unit compare, and automatically determine whether and meet the demands, and automatically generate test report.
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