CN105629180A - Test method, test device and controller - Google Patents
Test method, test device and controller Download PDFInfo
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- CN105629180A CN105629180A CN201410631062.2A CN201410631062A CN105629180A CN 105629180 A CN105629180 A CN 105629180A CN 201410631062 A CN201410631062 A CN 201410631062A CN 105629180 A CN105629180 A CN 105629180A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
Abstract
The embodiment of the present invention provides a test method, a test device and a controller. The test method comprises an obtaining step in which the controller selects a test instance from at least one unexecuted test instance of a preset test item and obtains the test configuration parameters of the test instance, and the method also comprises the steps that the controller sends the test environment parameters to a configuration device, so that the configuration device can provide a first operation environment to a first device according to the test environment parameters; when the first device operates in the first operation environment, the controller sends a test data query instruction to a test instrument; the controller receives the test data; the controller fills an identifier of the test instance and the test data in the corresponding positions in a test report template, and marks the test instance as an executed test instance, and goes back to the obtaining step. According to the embodiment of the present invention, the test efficiency of a power supply device can be improved.
Description
Technical field
The present embodiments relate to testing and control field, particularly relate to a kind of method of testing, device and controller.
Background technology
The Primary Component of Switching Power Supply should comprise following kind but be not limited to following content: input rectifying bridge, main switch, output rectifier tube, output continued flow tube, clamper tube, accessory power supply switching tube, accessory power supply output commutation diode, the ripple current of big electrochemical capacitor and voltage etc.
Electric stress test event is as shown below:
A) device stress wave when product normal operation;
B) device stress wave when the upper and lower electricity of product input; (various power on-off modes)
C) device stress wave when output of products load current step;
D) device is at output of products short-circuit protection and the stress wave after removing;
E) device stress wave when output of products overcurrent protection;
F) device waveform before product input undervoltage and overvoltage protection and when recovering after protection;
G) device waveform when output of products overvoltage protection;
According to People's Republic of China's GJB " GJB/Z35-93 components and parts derating criteria ", stress is defined as: affect the electricity of component failure rate, heat, machinery even load. The load of electricity aspect therein, is the electric stress referred here to.
As the key components in Switching Power Supply product, the electric stress parameter of device is an important test index, the performance of direct correlation product and quality, and conventional test methodologies is as follows:
1. test resource is selected arbitrarily, and different choice of members instruments will result in the inconsistent of test result due to the difference in performance;
2. input/output test environment is manually set one by one by instrument and equipment panel button, oscillograph is set and triggers environment, manual operation input switch or instrument knob repeatedly, trigger related stress waveform, repeatedly adjust triggering level and trigger waveform searching test maximum, (if all can not record triggering waveform every time, then maximum waveform possibly once occurred in this process cannot be reappeared), record last waveform;
3. change instrument test parameter, switch to next test environment, repeat above step, complete a test event;
4. change instrument test parameter, repeat above step, complete all test events;
5. data and oscillogram are inserted the relevant position in test report document by the above-mentioned test waveform of manual sorting and data one by one.
By above step it can be seen that so inevitably bring following problem:
1. repeated labor ratio is high. Owing to test target requires to obtain maximum (randomly generating) as far as possible, in order to reach this target, need to repeat tens even tens times for individual devices such as switching on and shutting down action, and whole Switching Power Supply is had tens Primary Components, the operation repeated, it is necessary to engaged test personnel substantial amounts of time;
2. test the process of data and record loaded down with trivial details. The packet produced in test process is containing oscillogram and text, numerical value, and the appearance of maximum is unexpected random appearance, for manually recorded and preservation waveform mode, it is necessary to the workload costed a lot of money;
3. instrumentation is complicated. Different test events need instrument and equipment sets corresponding test condition such as voltage, electric current and measures gear, oscillograph bandwidth, triggering level, sampling configuration etc. Needing regular switching, the operation of any mistake in test process, all will affect accuracy and the validity of test result, this is significantly high to technical quality and the skill requirement of tester.
Summary of the invention
The purpose of the embodiment of the present invention is to provide a kind of method of testing, device and controller, to realize the automatization of power supply apparatus test, improves the testing efficiency of power supply apparatus.
For solving above-mentioned technical problem, the embodiment of the present invention provides scheme as follows:
The embodiment of the present invention provides a kind of method of testing, for testing the device of the first equipment, described first equipment is connected with the configuration equipment of the running environment of described first equipment and the test instrunment of described device respectively, described configuration equipment and described test instrunment are connected with controller respectively, and described method of testing includes:
Obtaining step, described controller selects a test case from least one unenforced test case of default test event, and obtains the test configurations parameter of described test case, and described test configurations parameter includes test environment parameter and instrument test parameter;
First forwarding step, described controller sends described test environment parameter to described configuration equipment so that described configuration equipment according to described test environment parameter, can provide the first running environment to described first equipment;
Second forwarding step, described controller is when described first equipment runs under described first running environment, test data query instruction is sent to described test instrunment, described device can be tested by described test instrunment according to described test data query instruction, obtain test data, and described test data are reported described controller;
Receiving step, described controller receives described test data;
Filling in step, mark and the described test data of described test case are filled up to the relevant position in test report template by described controller, and described test case is labeled as executed test case, return described obtaining step.
Preferably, fill in step described in specifically include:
Described controller judges whether whole test cases of described default test event have all been tested, and obtains judged result;
When whole test cases that described judged result shows described default test event have not all been tested, the mark of described test case and described test data are filled up to the relevant position in test report template, and described test case is labeled as executed test case, return described obtaining step.
Preferably, also include:
When whole test cases that described judged result shows described default test event have all been tested, whole described test data are analyzed by described controller, obtain the test result of described default test event, and described test result is filled up to the relevant position in test report template;
Described controller will fill in described test report template after described test result and exports as the test report of described default test event.
Preferably, described configuration equipment includes programmable power supply and electronic load, described test environment parameter includes power supply parameter and load parameter, described controller sends described test environment parameter to described configuration equipment, make described configuration equipment according to described test environment parameter, the first running environment can be provided to specifically include to described first equipment:
Described controller sends described power supply parameter to described programmable power supply so that described configuration equipment according to described power supply parameter, can provide the signal of telecommunication corresponding with described power supply parameter to described first equipment;
Described controller sends described load parameter to described electronic load so that described electronic load according to described load parameter, can provide the load corresponding with described load parameter to described first equipment.
Preferably, described power supply parameter includes input voltage amplitude and/or type, and described load parameter includes load.
The embodiment of the present invention also provides for a kind of test device, for testing the device of the first equipment, described first equipment is connected with the configuration equipment of the running environment of described first equipment and the test instrunment of described device respectively, described configuration equipment and described test instrunment are connected with controller respectively, and described test device includes:
Acquisition module, from at least one unenforced test case of default test event, a test case is selected for described controller, and obtaining the test configurations parameter of described test case, described test configurations parameter includes test environment parameter and instrument test parameter;
First sending module, sends described test environment parameter for described controller to described configuration equipment so that described configuration equipment according to described test environment parameter, can provide the first running environment to described first equipment;
Second sending module, for described controller when described first equipment runs under described first running environment, test data query instruction is sent to described test instrunment, described device can be tested by described test instrunment according to described test data query instruction, obtain test data, and described test data are reported described controller;
Receiver module, receives described test data for described controller;
Fill in module, for described controller, the mark of described test case is filled up to the relevant position in test report template with described test data, and described test case is labeled as executed test case, return described obtaining step.
Preferably, fill in module described in specifically include:
Judging unit, judges for described controller whether whole test cases of described default test event have all been tested, and obtains judged result;
Return unit, during for showing that when described judged result whole test cases of described default test event have not all been tested, the mark of described test case and described test data are filled up to the relevant position in test report template, and described test case is labeled as executed test case, return described obtaining step.
Preferably, also include:
Analytic unit, during for showing that when described judged result whole test cases of described default test event have all been tested, whole described test data are analyzed by described controller, obtain the test result of described default test event, and described test result is filled up to the relevant position in test report template;
Output module, will fill in described test report template after described test result for described controller and exports as the test report of described default test event.
Preferably, described configuration equipment includes programmable power supply and electronic load, and described test environment parameter includes power supply parameter and load parameter, and described first sending module specifically includes:
First provides unit, sends described power supply parameter for described controller to described programmable power supply so that described configuration equipment according to described power supply parameter, can provide the signal of telecommunication corresponding with described power supply parameter to described first equipment;
Second provides unit, sends described load parameter for described controller to described electronic load so that described electronic load according to described load parameter, can provide the load corresponding with described load parameter to described first equipment.
Preferably, described power supply parameter includes input voltage amplitude and/or type, and described load parameter includes load.
The embodiment of the present invention also provides for a kind of controller including test noted above device.
From the above it can be seen that the embodiment of the present invention at least has the advantages that
The example to be tested of test event is able to automatic execution, it is achieved that the automatization of power supply apparatus test, improves the testing efficiency of power supply apparatus.
Accompanying drawing explanation
Fig. 1 represents the flow chart of steps of a kind of method of testing that the embodiment of the present invention provides;
Fig. 2 represents the system hardware Organization Chart of the better embodiment of the embodiment of the present invention;
Fig. 3 represents the system software architecture diagram of the better embodiment of the embodiment of the present invention;
Fig. 4 represents the example realizing calling OfficeAxtiveX control on Labview platform, and this illustrative functions is a newly-built office document, and other more OfficeAxtiveX control functionality all can realize by this way of example;
Fig. 5 represents that Labview platform calls VISA function, it is achieved under send instructions and control Tyke oscilloscope measurement and read the program example of data, the communication of other external resources all can refer to this example;
Fig. 6 represents the Labview man machine interface schematic diagram of the better embodiment of the embodiment of the present invention;
Fig. 7 represents a kind of structured flowchart testing device that the embodiment of the present invention provides.
Detailed description of the invention
For making the purpose of the embodiment of the present invention, technical scheme and advantage clearly, below in conjunction with the accompanying drawings and the specific embodiments the embodiment of the present invention is described in detail.
Fig. 1 represents the flow chart of steps of a kind of method of testing that the embodiment of the present invention provides, and with reference to Fig. 1, the embodiment of the present invention provides a kind of method of testing, for testing the device of the first equipment, comprises the steps:
Step 101, obtaining step, described controller selects a test case from least one unenforced test case of default test event, and obtains the test configurations parameter of described test case, and described test configurations parameter includes test environment parameter and instrument test parameter;
Step 102, the first forwarding step, described controller sends described test environment parameter to described configuration equipment so that described configuration equipment according to described test environment parameter, can provide the first running environment to described first equipment;
Step 103, second forwarding step, described controller is when described first equipment runs under described first running environment, test data query instruction is sent to described test instrunment, described device can be tested by described test instrunment according to described test data query instruction, obtain test data, and described test data are reported described controller;
Step 104, receiving step, described controller receives described test data;
Step 105, fills in step, and mark and the described test data of described test case are filled up to the relevant position in test report template by described controller, and described test case is labeled as executed test case, return described obtaining step.
Described first equipment is connected with the configuration equipment of the running environment of described first equipment and the test instrunment of described device respectively, and described configuration equipment and described test instrunment are connected with controller respectively.
Visible, by the way, the example to be tested of test event is able to automatic execution, it is achieved that the automatization of power supply apparatus test, improves the testing efficiency of power supply apparatus.
Wherein, described first equipment is such as: electricity conversion equipment, such as Switching Power Supply.
Described default test event is such as: electric stress test event.
Described test instrunment is such as: oscillograph.
Described controller is such as: computer.
Described instrument test parameter is such as: measure gear, oscillograph bandwidth, triggering level, sampling configuration etc.
In the embodiment of the present invention, described in fill in step and specifically comprise the steps that
Described controller judges whether whole test cases of described default test event have all been tested, and obtains judged result;
When whole test cases that described judged result shows described default test event have not all been tested, the mark of described test case and described test data are filled up to the relevant position in test report template, and described test case is labeled as executed test case, return described obtaining step.
Further, may also include that
When whole test cases that described judged result shows described default test event have all been tested, whole described test data are analyzed by described controller, obtain the test result of described default test event, and described test result is filled up to the relevant position in test report template;
Described controller will fill in described test report template after described test result and exports as the test report of described default test event.
In the embodiment of the present invention, it is possible to have:
Described configuration equipment includes programmable power supply and electronic load, described test environment parameter includes power supply parameter and load parameter, described controller sends described test environment parameter to described configuration equipment, make described configuration equipment according to described test environment parameter, the first running environment can be provided to specifically include to described first equipment:
Described controller sends described power supply parameter to described programmable power supply so that described configuration equipment according to described power supply parameter, can provide the signal of telecommunication corresponding with described power supply parameter to described first equipment;
Described controller sends described load parameter to described electronic load so that described electronic load according to described load parameter, can provide the load corresponding with described load parameter to described first equipment.
Wherein, described power supply parameter can include input voltage amplitude and/or type, and described load parameter can include load.
For the embodiment of the present invention being set forth clearly clear, provide below the better embodiment of the embodiment of the present invention.
This better embodiment provides a kind of switching power source device electric stress method of testing and device. First equipment described in this better embodiment is Switching Power Supply. This better embodiment aims to solve the problem that the problems referred to above;
First purpose for this this better embodiment is in that to propose a kind of power supply product Primary Component electric stress method of testing, traditional manual test flow process is converted into automatization's mode and realizes;
Second purpose of this better embodiment is in that to propose a kind of power supply product Primary Component electric stress test device;
To achieve the above object, the scheme of this better embodiment mainly has three parts (control centre, communication bus, external resource), realizes in such a way:
First, control centre is connected by communication bus with external resource;
The test software providing a kind of Software Development Platform (such as Labview, VB, VC, C# etc.) to develop, comprises instrument controlling module, document creation module, human-computer interface module;
The parameter that test is needed and test event write man machine interface, or import human-computer interface module in document mode, then pass through start button and start test, test Instrumental controls module coordination and controls external resource offer test environment and obtain test data, and the test data of acquisition by certain format record and are saved in Office document by document creation module;
Described instrument controlling module, such as Fig. 5, adopt VISA (VirtualInstrumentSoftwareArchitecture, referred to as " Visa ", i.e. Virture Instrumentation Software Architecture) mode that programs, instrument and equipment is controlled so that traditional-handwork operation and eye-observation obtain the mode of data, are converted into program control operation mode by SCPI (StandardCommandsforProgrammableInstruments) instruction;
Described document creation module, such as Fig. 4, employing ActiveX mode calls MicrosoftOffice control, realize automatically generating of test report, and data and oscillogram are automatically inserted into the function of document, whole process is program control on backstage to be completed, and replaces the operation of artificial mouse-keyboard with this;
Described human-computer interface module, such as Fig. 5 example, employing Labview graphic programming mode so that program is able to receive that the test parameter document that user has editted or the parameter filled in online, and gives user by manipulation power such as the beginning of program, stoppings;
Manual test process is converted into programme by the above mode by this better embodiment, has saving manpower, reduces use threshold, promotes the beneficial effect of testing efficiency.
This better embodiment is by the following technical solutions:
Test software, control centre, communication bus and external resource are provided, connect each several part by Fig. 2 successively;
Described test software is based on labview (or other programmed environments such as VB, VC, C# etc.) the power supply product electric stress test program developed, and comprises man machine interface, instrument controlling, data processing function;
Described control centre, it is possible to adopt various types of individual or industrial computer equipment;
Described communication bus, can adopt the common communication modes such as PXI, VXI, GPIB, RS232, RS485/422, USB, Ethernet;
Described external resource includes oscillograph, voltage probe, current probe, electronic load, ac/dc source able to programme, power supply product to be measured etc.;
By described ac/dc source able to programme, described power supply to be measured is supplied the voltage signal of different amplitude so that it is can normally powering on, design parameter must be determined according to the performance indications of described power supply to be measured;
Thering is provided load current in various degree by described electronic load to described power supply to be measured so that it is the loading condition of simulation true environment, design parameter must be determined according to the performance indications of described power supply to be measured;
It is connected to the respective pins of described power supply product Primary Component by described oscillograph and probe, gathers voltage and current waveform and data;
By described communication bus, control centre is connected with described ac/dc source able to programme, electronic load, oscillograph;
Issue control instruction to described instrument and equipment by described test software by communication bus, correct test environment is set, perform test action, obtain test data, process and preserve test result.
Beneficial effect
This better embodiment advantage is as follows:
1, human resources is saved. For individual devices, instrument and device pin only need to be connected and fill in test parameter by operator, and program is run after only without human attendance;
2, testing efficiency is promoted. Described test software controls instrument and equipment in the way of sending instruction and obtains preservation data, its speed be manual manipulation mode incomparable;
3, improving test accuracy, the standardized testing process of software definition, the instrument of specialty ensure that measuring accuracy. Relative to manual test process, this better embodiment will can improve test accuracy to a certain extent;
4, test process is reliable. Eliminate the uncertain factor that manual operation brings, reduce the probability of error and mistake, improve the reliability of test environment;
5, use threshold low. User of service need not possess power supply and the test experience of specialty, need not understand the operation of various test instrunment. Have only to the computation that meeting is most basic.
Specifically, below in conjunction with accompanying drawing, the Switching Power Supply Primary Component electric stress method of testing of the present invention is described in detail below.
It realizes process:
As shown in Figure 2, first building test environment, this test environment includes control centre, communication bus, electronic load, AC/DC power supply able to programme, oscillograph and voltage, current probe, communication cable. Wherein with communication bus, control centre is sequentially connected with external resource (electronic load, oscillograph, AC/DC source able to programme), enables the hardware that said external resource is set up in communication with control centre to be connected;
Described electric current and voltage probe are connected with the correlative measurement pilot of switching device on power supply to be measured so that the waveform of switching device can be caught by oscillograph;
Described AC/DC source able to programme being connected to the input of power supply to be measured, powers to power supply to be measured, specifically chosen exchange input or direct current input to be determined according to power supply input type to be measured;
With described electronic load, the outfan of power supply to be measured is accessed terminal be connected, enable electrical load devices to provide the load current needed in test to power supply to be measured;
Open test software, the project of selection needs test, and set test parameter and the specification index (specifications according to determinand) of determinand, such as input voltage range, output loading scope etc.;
Testing results program, described test software can issue control instruction according to test parameter, arranging each instrument and equipment to the test environment required by communication bus, and instrument and equipment measurement data is returned to program, test data and waveform comparison, process are drawn test result by program again;
Described test program, call the newly-built blank office document of ActiveX control, automatically write test environment parameter and generate reporting format, test result above and oscillogram are inserted into appointment position, generate test report, also test data can be uploaded to data base if necessary;
Its software architecture is as it is shown on figure 3, integrate instrument controlling module, document creation module, human-computer interface module by Software Development Platform; Wherein, instrument controlling module includes VISA, SCPI instruction and programmable instrument submodule, document creation module includes ActiveX and MicrosoftWord object model submodule, and human-computer interface module includes state machine/event structure, visual programming and man-machine interaction submodule;
Such as Fig. 5, described instrument controlling module hardware layer is made up of communication bus, and upper strata adopts VISA programming mode, uses SCPI instruction to set up communication with described each instrument and is connected, it is achieved transmission control command also returns the function testing data;
Described document creation module uses AxtiveX technology, call Microsoft's Office control, by newly-built for document (such as accompanying drawing 4), write text, insert pictures, set up form, to arrange the function such as form, preservation programme-controlled, the process of manual creation report file is realized with stored program control system;
Described human-computer interface module, uses Software Development Platform, sets up Man Machine Interface, such as Fig. 6, test parameter passes to software and responds the operation of user.
In beginning and the end of test, test software carries out inspection and the homing action of external resource respectively by sending instruction;
Some key point in test process, test program needs power supply to be measured is carried out power on, to guarantee that power supply to be measured does not damage because of test process, and notes abnormalities in time and feeds back to user.
Fig. 7 represents a kind of structured flowchart testing device that the embodiment of the present invention provides, and with reference to Fig. 7, the embodiment of the present invention also provides for a kind of test device, and for testing the device of the first equipment, described test device includes:
Acquisition module 701, from at least one unenforced test case of default test event, a test case is selected for described controller, and obtaining the test configurations parameter of described test case, described test configurations parameter includes test environment parameter and instrument test parameter;
First sending module 702, sends described test environment parameter for described controller to described configuration equipment so that described configuration equipment according to described test environment parameter, can provide the first running environment to described first equipment;
Second sending module 703, for described controller when described first equipment runs under described first running environment, test data query instruction is sent to described test instrunment, described device can be tested by described test instrunment according to described test data query instruction, obtain test data, and described test data are reported described controller;
Receiver module 704, receives described test data for described controller;
Fill in module 705, for described controller, the mark of described test case is filled up to the relevant position in test report template with described test data, and described test case is labeled as executed test case, return described obtaining step.
Described first equipment is connected with the configuration equipment of the running environment of described first equipment and the test instrunment of described device respectively, and described configuration equipment and described test instrunment are connected with controller respectively.
Visible, by the way, the example to be tested of test event is able to automatic execution, it is achieved that the automatization of power supply apparatus test, improves the testing efficiency of power supply apparatus.
Wherein, fill in module 705 described in specifically to comprise the steps that
Judging unit, judges for described controller whether whole test cases of described default test event have all been tested, and obtains judged result;
Return unit, during for showing that when described judged result whole test cases of described default test event have not all been tested, the mark of described test case and described test data are filled up to the relevant position in test report template, and described test case is labeled as executed test case, return described obtaining step.
Further, may also include that
Analytic unit, during for showing that when described judged result whole test cases of described default test event have all been tested, whole described test data are analyzed by described controller, obtain the test result of described default test event, and described test result is filled up to the relevant position in test report template;
Output module, will fill in described test report template after described test result for described controller and exports as the test report of described default test event.
In the embodiment of the present invention, described configuration equipment can include programmable power supply and electronic load, and described test environment parameter includes power supply parameter and load parameter, and described first sending module specifically comprises the steps that
First provides unit, sends described power supply parameter for described controller to described programmable power supply so that described configuration equipment according to described power supply parameter, can provide the signal of telecommunication corresponding with described power supply parameter to described first equipment;
Second provides unit, sends described load parameter for described controller to described electronic load so that described electronic load according to described load parameter, can provide the load corresponding with described load parameter to described first equipment.
Wherein, described power supply parameter can include input voltage amplitude and/or type, and described load parameter can include load.
The embodiment of the present invention also provides for a kind of controller, and described controller includes test noted above device.
The above is only the embodiment of the embodiment of the present invention; should be understood that; for those skilled in the art; under the premise without departing from embodiment of the present invention principle; can also making some improvements and modifications, these improvements and modifications also should be regarded as the protection domain of the embodiment of the present invention.
Claims (11)
1. a method of testing, for testing the device of the first equipment, it is characterized in that, described first equipment is connected with the configuration equipment of the running environment of described first equipment and the test instrunment of described device respectively, described configuration equipment and described test instrunment are connected with controller respectively, and described method of testing includes:
Obtaining step, described controller selects a test case from least one unenforced test case of default test event, and obtains the test configurations parameter of described test case, and described test configurations parameter includes test environment parameter and instrument test parameter;
First forwarding step, described controller sends described test environment parameter to described configuration equipment so that described configuration equipment according to described test environment parameter, can provide the first running environment to described first equipment;
Second forwarding step, described controller is when described first equipment runs under described first running environment, test data query instruction is sent to described test instrunment, described device can be tested by described test instrunment according to described test data query instruction, obtain test data, and described test data are reported described controller;
Receiving step, described controller receives described test data;
Filling in step, mark and the described test data of described test case are filled up to the relevant position in test report template by described controller, and described test case is labeled as executed test case, return described obtaining step.
2. method of testing according to claim 1, it is characterised in that described in fill in step and specifically include:
Described controller judges whether whole test cases of described default test event have all been tested, and obtains judged result;
When whole test cases that described judged result shows described default test event have not all been tested, the mark of described test case and described test data are filled up to the relevant position in test report template, and described test case is labeled as executed test case, return described obtaining step.
3. method of testing according to claim 2, it is characterised in that also include:
When whole test cases that described judged result shows described default test event have all been tested, whole described test data are analyzed by described controller, obtain the test result of described default test event, and described test result is filled up to the relevant position in test report template;
Described controller will fill in described test report template after described test result and exports as the test report of described default test event.
4. method of testing according to claim 1, it is characterized in that, described configuration equipment includes programmable power supply and electronic load, described test environment parameter includes power supply parameter and load parameter, described controller sends described test environment parameter to described configuration equipment, make described configuration equipment according to described test environment parameter, the first running environment can be provided to specifically include to described first equipment:
Described controller sends described power supply parameter to described programmable power supply so that described configuration equipment according to described power supply parameter, can provide the signal of telecommunication corresponding with described power supply parameter to described first equipment;
Described controller sends described load parameter to described electronic load so that described electronic load according to described load parameter, can provide the load corresponding with described load parameter to described first equipment.
5. method of testing according to claim 4, it is characterised in that described power supply parameter includes input voltage amplitude and/or type, and described load parameter includes load.
6. a test device, for testing the device of the first equipment, it is characterized in that, described first equipment is connected with the configuration equipment of the running environment of described first equipment and the test instrunment of described device respectively, described configuration equipment and described test instrunment are connected with controller respectively, and described test device includes:
Acquisition module, from at least one unenforced test case of default test event, a test case is selected for described controller, and obtaining the test configurations parameter of described test case, described test configurations parameter includes test environment parameter and instrument test parameter;
First sending module, sends described test environment parameter for described controller to described configuration equipment so that described configuration equipment according to described test environment parameter, can provide the first running environment to described first equipment;
Second sending module, for described controller when described first equipment runs under described first running environment, test data query instruction is sent to described test instrunment, described device can be tested by described test instrunment according to described test data query instruction, obtain test data, and described test data are reported described controller;
Receiver module, receives described test data for described controller;
Fill in module, for described controller, the mark of described test case is filled up to the relevant position in test report template with described test data, and described test case is labeled as executed test case, return described obtaining step.
7. test device according to claim 6, it is characterised in that described in fill in module and specifically include:
Judging unit, judges for described controller whether whole test cases of described default test event have all been tested, and obtains judged result;
Return unit, during for showing that when described judged result whole test cases of described default test event have not all been tested, the mark of described test case and described test data are filled up to the relevant position in test report template, and described test case is labeled as executed test case, return described obtaining step.
8. test device according to claim 7, it is characterised in that also include:
Analytic unit, during for showing that when described judged result whole test cases of described default test event have all been tested, whole described test data are analyzed by described controller, obtain the test result of described default test event, and described test result is filled up to the relevant position in test report template;
Output module, exports as the test report of described default test event for will fill in described test report template after described test result.
9. test device according to claim 6, it is characterised in that described configuration equipment includes programmable power supply and electronic load, described test environment parameter includes power supply parameter and load parameter, and described first sending module specifically includes:
First provides unit, sends described power supply parameter for described controller to described programmable power supply so that described configuration equipment according to described power supply parameter, can provide the signal of telecommunication corresponding with described power supply parameter to described first equipment;
Second provides unit, sends described load parameter for described controller to described electronic load so that described electronic load according to described load parameter, can provide the load corresponding with described load parameter to described first equipment.
10. test device according to claim 9, it is characterised in that described power supply parameter includes input voltage amplitude and/or type, and described load parameter includes load.
11. a controller, it is characterised in that include the test device as according to any one of claim 6 to 10.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
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| PCT/CN2015/076314 WO2016074429A1 (en) | 2014-11-11 | 2015-04-10 | Test method, controller, and test system |
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| CN106339223A (en) * | 2016-08-23 | 2017-01-18 | 浪潮(北京)电子信息产业有限公司 | Oscillogram storing method of oscilloscope, device, system and terminal |
| CN106371420A (en) * | 2016-08-15 | 2017-02-01 | 上海科世达-华阳汽车电器有限公司 | Vehicle's electronic control unit testing method and system |
| CN106841708A (en) * | 2017-04-11 | 2017-06-13 | 工业和信息化部电信研究院 | A kind of method of testing of quick charger, test fixture and system |
| CN107992428A (en) * | 2018-01-03 | 2018-05-04 | 成都能通科技有限公司 | The automatic test platform that a kind of Python is realized |
| CN108169613A (en) * | 2018-01-12 | 2018-06-15 | 日本电产理德机器装置(浙江)有限公司 | Electrical detection device |
| CN109520760A (en) * | 2018-11-06 | 2019-03-26 | 格力电器（武汉）有限公司 | Test method, system and PLC controller |
| CN110375961A (en) * | 2019-07-29 | 2019-10-25 | 武汉电信器件有限公司 | A kind of automatic test approach of optical module and the Auto-Test System of optical module |
| CN111308974A (en) * | 2020-02-27 | 2020-06-19 | 杭州和利时自动化有限公司 | Method, system and equipment for controlling DCS simulation system |
| CN113295953A (en) * | 2021-05-31 | 2021-08-24 | 合肥联宝信息技术有限公司 | Overvoltage protection test system and method |
| CN113608092A (en) * | 2021-06-28 | 2021-11-05 | 臻驱科技（上海）有限公司 | Double-pulse test system |
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| CN106646273A (en) * | 2017-02-22 | 2017-05-10 | 郑州云海信息技术有限公司 | Switching power supply performance test method, system and device |
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| CN106841708A (en) * | 2017-04-11 | 2017-06-13 | 工业和信息化部电信研究院 | A kind of method of testing of quick charger, test fixture and system |
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| CN110375961A (en) * | 2019-07-29 | 2019-10-25 | 武汉电信器件有限公司 | A kind of automatic test approach of optical module and the Auto-Test System of optical module |
| CN111308974A (en) * | 2020-02-27 | 2020-06-19 | 杭州和利时自动化有限公司 | Method, system and equipment for controlling DCS simulation system |
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