CN113608092A - Double-pulse test system - Google Patents
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Abstract
The invention provides a double-pulse test system, which is applied to the technical field of automatic test and comprises: the method comprises the steps that two circulation structures are adopted for interaction in testing, the two circulation structures are interconnected through a state machine system, the first circulation structure can be used for interacting with a user to obtain input data required by testing, the second circulation structure can be used for interacting with testing equipment to control the testing equipment to test a tested piece, obtain testing data returned by the testing equipment, and conduct real-time monitoring according to the testing data. The control core of the double-pulse test system is formed based on the state machine system and the two circulating structures, so that the interaction in the test is very convenient, the manual participation degree is reduced, the intelligent identification and control of the automatic test are improved, and a large amount of accurate and reliable basic data can be provided for the subsequent optimization design.
Description
Technical Field
The invention relates to the technical field of automatic testing, in particular to a double-pulse testing system.
Background
With the rapid development of the new energy automobile industry, a motor driver (electric drive for short) which is one of the core components in the new energy automobile draws more and more attention, the requirement on the reliability of the motor driver is extremely high, and the working conditions of the motor are very complex in the actual use scenes of the electric automobile, such as frequent acceleration, braking and the like.
In the existing scheme, a double-pulse test method can be generally adopted to dynamically test a power module in an electric drive, and a large number of double-pulse tests can be carried out on the electric drive in an automobile scene to acquire data of the electric drive in the automobile scene under different working conditions so as to provide basic data required by optimal design.
However, in the existing double-pulse testing scheme, for example, a manual testing method, such as a semi-automatic testing scheme, needs a lot of manual intervention, such as adjusting pulse width, recording data, and determining correctness and the like, when a lot of double-pulse tests are performed, time and labor are wasted, the needs of a lot of double-pulse tests may not be met, and the basic data provided by manual intervention is difficult to cover various working conditions, and accurate and reliable data cannot be provided for subsequent optimization processing.
Based on this, a new testing scheme is needed.
Disclosure of Invention
In view of this, embodiments of the present disclosure provide a double-pulse test system, which can perform a full-automatic test after a basic electrical circuit is inspected, so as to provide accurate and reliable test data under a large number of working conditions.
The embodiment of the specification provides the following technical scheme:
an embodiment of the present specification provides a double pulse test system, including: the system comprises a first circulation structure, a second circulation structure, a state machine system and a plurality of test devices, wherein the state machine system comprises a queue and a state machine; the first loop structure is used for receiving control operation of a user on a test, generating a first test state according to a preset first test strategy and the control operation, and storing the first test state in the queue; the second loop structure is used for generating an execution instruction corresponding to a test action according to a preset second test strategy according to the control of the state machine, sending the execution instruction to the plurality of test devices, receiving test data returned by the plurality of test devices, generating a second test state according to the test data according to the second test strategy, and storing the second test state in the queue; the state machine is used for carrying out state conversion according to a preset state strategy and the test states in the queue so as to control the first circulating structure to interact with the user and control the second circulating structure to interact with the plurality of test devices; and the test equipment tests the piece to be tested according to the execution instruction and returns test data to the second circulating structure.
Compared with the prior art, the beneficial effects that can be achieved by the at least one technical scheme adopted by the embodiment of the specification at least comprise:
based on a control core formed by a state machine system and two cycle structures, a convenient and reliable test means can be provided for an application background which needs to perform a large amount of automatic tests (such as a double-pulse test of a power device), not only can more convenient interactive functions be provided, such as interactive functions of friendly parameter input, test display, test equipment control and the like be provided, the test process is more in line with the use habits of testers, the artificial problems of the operators can be avoided, but also unnecessary adjustment to the test equipment can be saved, such as adjustment of an oscilloscope, for example, DoE (design of experience) reconstruction is performed for testing, such as monitoring the working condition of the device in a SoA (Safe Operation Area), such as frequently establishing a folder, for example, processing a data packet, the test time can be shortened, the test efficiency can be improved, and by setting the test working condition in the cycle structure, the automatic test is realized, the test accuracy is improved, and the monitoring and safety protection functions in the test process are provided.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a schematic diagram of a test circuit of a power device in an embodiment of the present disclosure;
FIG. 2 is a schematic diagram of a monitoring waveform of a power device in an embodiment of the present disclosure;
FIG. 3 is a schematic structural diagram of a double-pulse test system provided in an embodiment of the present disclosure;
FIG. 4 is a block diagram of a state machine in a double-pulse test system according to an embodiment of the present disclosure;
FIG. 5 is a schematic structural diagram of a double-pulse test system provided in an embodiment of the present disclosure;
FIG. 6 is a schematic structural diagram of an automated test in a double-pulse test system according to an embodiment of the present disclosure;
FIG. 7 is a flow chart illustrating automated testing in a double-pulse testing system according to an embodiment of the present disclosure;
FIG. 8 is a flow chart illustrating system checking before automated testing in a double-pulse testing system according to an embodiment of the present disclosure;
fig. 9 is a flowchart of single-point testing in a double-pulse testing system according to an embodiment of the present disclosure.
Detailed Description
The embodiments of the present application will be described in detail below with reference to the accompanying drawings.
The following description of the embodiments of the present application is provided by way of specific examples, and other advantages and effects of the present application will be readily apparent to those skilled in the art from the disclosure herein. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. The present application is capable of other and different embodiments and its several details are capable of modifications and/or changes in various respects, all without departing from the spirit of the present application. It is to be noted that the features in the following embodiments and examples may be combined with each other without conflict. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It is noted that various aspects of the embodiments are described below within the scope of the appended claims. It should be apparent that the aspects described herein may be embodied in a wide variety of forms and that any specific structure and/or function described herein is merely illustrative. Based on the present application, one skilled in the art should appreciate that one aspect described herein may be implemented independently of any other aspects and that two or more of these aspects may be combined in various ways. For example, an apparatus may be implemented and/or a method practiced using any number and aspects set forth herein. Additionally, such an apparatus may be implemented and/or such a method may be practiced using other structure and/or functionality in addition to one or more of the aspects set forth herein.
It should be noted that the drawings provided in the following embodiments are only for illustrating the basic idea of the present application, and the drawings only show the components related to the present application rather than the number, shape and size of the components in actual implementation, and the type, amount and ratio of the components in actual implementation may be changed arbitrarily, and the layout of the components may be more complicated.
In addition, in the following description, specific details are provided to facilitate a thorough understanding of the examples. However, it will be understood by those skilled in the art that the aspects may be practiced without these specific details. The terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, features described as being defined as "first," "second," etc., may explicitly or implicitly include one or more of the features. In the description of the present invention, "a plurality" means two or more unless otherwise specified.
In the existing solution, fig. 1 is a schematic circuit diagram of a double-pulse test performed on an IGBT, in which a lower tube in an IGBT half-bridge module is used as a device to be tested, that is, a negative voltage (for example, -8V) is applied to a gate of an upper tube, so that the upper tube is always in an off state. At this time, a double-pulse test signal (such as a signal Vge in the figure) can be provided to the lower tube, so that the on and off of the device under test (i.e. the lower tube) can be controlled, and the dynamic characteristic test of the lower tube can be completed. Correspondingly, fig. 2 is a schematic diagram of waveforms of voltage and current monitored during a switching process in a double-pulse test, in which a first pulse-off process is used to analyze a turn-off characteristic parameter and a second pulse-on process is used to analyze a turn-on characteristic parameter in an obtained test waveform.
Moreover, although the existing testing scheme is semi-automated, a lot of manual work is still required to participate in the testing work, such as monitoring parameters of specific testing voltage, current and the like of the device under test, so as to prevent the device from being damaged in the testing process, such as monitoring the waveform under test, and consuming energy, such as only providing a pulse control signal for testing, and failing to automatically identify and process problems possibly encountered in the testing process. Therefore, the existing scheme can only carry out a small amount of working condition tests, various possible complex working conditions are difficult to cover, time and labor are consumed when a large amount of working condition tests are carried out, and the tests are still difficult to provide accurate and reliable data.
Therefore, how to effectively and reliably carry out automatic testing on power devices under various working conditions becomes a problem to be solved urgently in the development of the new energy automobile industry.
Based on this, after the inventor has carried out research and analysis on a power device, working conditions, the existing double-pulse test system and the like, a new double-pulse test system is provided: as shown in fig. 3, a control core part (shown by a dashed line frame in the figure) of the double-pulse test system is established by using two loop structures, where the first loop structure is used to control operation reading of a user, the second loop structure is used to generate an execution instruction of a test action, and the loop structures are interconnected (i.e., communicated) by a state machine system, at this time, the loop structures can place each state required in a test into a queue of the state machine system according to an operation of the user, an execution condition of a test device, and the like, and the state machine in the state machine system executes state conversion according to the queue, so that the loop structures complete test control. Of course, the test equipment completes the test of the device under test (i.e. DUT) under the control of each execution instruction, and the description is not repeated here.
In an implementation, for example, when a double pulse test is performed on a power device (e.g., an electrically driven IGBT) in a new energy automobile, the state machine may be as shown in fig. 4, that is, the state machine may include the following states:
initilize (initialization): as shown in the state S2, performing initialization operations of device and device state quantities, such as obtaining data of system variables, hardware initialization instructions, and the like required by parameter initialization, device initialization, and the like;
IDLE: as shown in state S1, system state is waited and read, such as state query while waiting for user instruction, entering other states according to each instruction;
GenerateDoE (loading): as shown in state S3, according to data input by the user, such as device information, test conditions, etc., a storage path and a test list are created, such as creating an automatic test storage folder, such as generating a parameter list, etc.;
CalculatePara (parameter generation): as shown in state S4, test parameters are loaded and calculated, such as reading test conditions from a test list, calculating pulse parameters, etc.;
apply Setting: as shown in state S5, setting and checking parameters of the test, such as parameters of the double-pulse signal, temperature, power supply, etc., is applied, such as parameters corresponding to each pulse are assigned to corresponding execution devices, such as a pulse generator, a temperature control device, a power supply device, etc.;
fire Pulse (wave): as shown in the state S6, the control execution device sends out a double pulse wave (i.e., send out a wave), and obtains (e.g., reads back) an oscilloscope waveform and its parameters, and determines the correct and incorrect states;
RecordData (data storage): as shown in the state S7, storing test data, updating the test progress state, and the like, for example, storing the test data, for example, if there are tasks in the test list that are not completed, returning to the state S4 to continue to execute the test of the next test condition;
stop (Stop): as shown in state S8, the operation is stopped, all connections are disconnected, and the system stops testing;
temp Control (temperature Control): in the state S9, temperature control is performed.
It should be noted that, it can be determined whether the above states are needed according to the actual application requirements, for example, when temperature control is not needed, the state machine may not include the state S9; the dashed arrows in the figure may be used as state transitions in manual control flows, and may also be used as state transitions according to actual automation test requirements, and are not limited herein.
In implementation, through the state conversion, the double-circulation structure can correspondingly adjust the voltage of the direct-current bus according to the working voltage, the working current, the temperature condition and the gate resistance required in the test of the power device, adjust the first pulse time, use the heating/refrigerating equipment, change the gate drive resistance and the like, realize the adjustment of the working condition and acquire the required test data in the working condition test.
By improving the double-pulse test system, namely constructing the control core of the double-pulse test system by adopting two cycle structures, more elegant user interaction can be provided, such as more friendly interactive functions of parameter input, test state display and the like are provided, the use habit of a tester is better met, the human problems of the operator can be avoided, unnecessary adjustment of test equipment is saved, such as adjustment of an oscilloscope, for example, DoE (design of experience) reconstruction is performed for testing, such as monitoring the working condition of a device in SoA (Safe Operation Area), such as frequent establishment of folders, such as processing of data packets, the test time can be shortened, the test efficiency can be improved, and by setting the test condition in the circulation structure, the automatic test is realized, the test accuracy is improved, and the monitoring and safety protection functions in the test process are provided.
The technical solutions provided by the embodiments of the present application are described below with reference to the accompanying drawings.
The present embodiment provides a double pulse test system, as shown in fig. 5, the double pulse test system 100 may include: a control system 110 and a test apparatus 120, wherein the control system 110 may comprise a first loop structure 1101, a second loop structure 1102 and a state machine system 1103, the state machine system 1103 comprising a queue (not shown) and a state machine (not shown).
In implementation, the first loop structure 1101 interacts with a user under the control of the state machine, and may be configured to receive a control operation of the user on a test, such as starting the test, stopping the test, checking test data, and the like, generate a first test state according to a preset first test policy according to the control operation, and store the first test state in the queue.
The second loop structure 1102 interacts with the test equipment 120 under the control of the state machine, and is configured to generate an execution instruction corresponding to a test action according to a preset second test policy according to the control of the state machine, send the execution instruction to the plurality of test equipment 120, receive test data returned by the plurality of test equipment 120, generate a second test state according to the test data according to the second test policy, and store the second test state in the queue.
The state machine implements interconnection between the first loop structure and the second loop structure, and may be configured to perform state transition according to a preset state policy and according to the test states in the queue, so as to control the first loop structure 1101 to interact with the user, and control the second loop structure 1102 to interact with the plurality of test devices 120;
and the test equipment 120 tests the to-be-tested piece according to the execution instruction and returns test data to the second cycle structure.
It should be noted that the preset strategies such as the first test strategy, the second test strategy, and the state strategy may be preset and adjusted according to actual test requirements.
In practice, the first test measurement may be a strategy for conducting a test according to the test condition.
For example, in the dynamic parameter test for the power device, each set of test conditions may be a combination of resistance, voltage and current, for example, each condition may be a combination of "(resistance value, voltage value, current value)", such as (1 Ω, 200V, 100A), (1 Ω, 200V, 200A), (1 Ω, 200V, 300A), etc., such as (1 Ω, 300V, 100A), (1 Ω, 300V, 200A), (1 Ω, 300V, 300A), etc., such as (2 Ω, 200V, 100A), (2 Ω, 200V, 200A), (2 Ω, 200V, 300A), etc., which are not listed here.
In an embodiment, the combinations "(resistance, voltage, current) of the test conditions may be sorted from small to large, for example, in the foregoing example, the resistance and the voltage are set as a set of values, and then sorted according to the current magnitudes in the set of values, such as (1 Ω, 200V, 100A), (1 Ω, 200V, 200A), (1 Ω, 200V, 300A), and similarly, the next set of resistance and voltage values are also sorted according to the current magnitudes, such as (2 Ω, 200V, 100A), (2 Ω, 200V, 200A), (2 Ω, 200V, 300A). At this time, the first test strategy may be a strategy of performing a division test according to the magnitude of the current, and the specific strategy may be a strategy of starting a test from a small current, or may be a strategy of sequentially increasing the current step by step according to a preset step to perform a test, and a strategy of switching to a next test condition when a test fails to meet a requirement. For example, under the condition of the test condition (1 Ω 200V 300A), if it is found that the test has not met the requirements, the test conditions with the same resistance and voltage and the current greater than 300A may be ignored, for example, (1 Ω, 200V, 400A), (1 Ω, 200V, 500A) and other conditions may be ignored, and then the next test condition is entered, for example, (1 Ω, 300V, 100A) is entered for the next test.
Through the first test strategy, not only can automatic test be carried out orderly and efficiently, but also the test process can be ensured to be in the SoA, and the test safety is ensured.
In implementation, the second test policy may be a policy between test actions and instructions, such as an action of test start, and may correspond to an instruction related to start generation, such as an instruction of system power on, an instruction of initialization, an instruction of entering a test state, and the like, which is not limited herein.
In implementation, the state policy may be a policy including which states and state transitions are included in the state machine, and is not limited herein.
It should be noted that the first loop structure and the second loop structure may refer to a loop control process for interaction during testing, for example, the first loop structure may be an interface structure for interacting with a user, so as to perform friendly interaction with the user through the interface structure (e.g., an interactive interface such as an input device and a display device), for example, the second loop structure may be a communication structure (e.g., a connection structure, a communication protocol, etc.) connected to the testing device, and is not limited herein.
Based on the control idea formed by the state machine system and the two cycle structures, that is, the test requirement of the user can be set through the first cycle structure, and the control and monitoring of the test data can be performed in real time through the second cycle structure, such a test scheme can not only provide more convenient and faster interactive functions, such as friendly interactive functions of parameter input, test display, test equipment control and the like, the test process better conforms to the use habit of the tester, can avoid the artificial problem of the operator, but also can save unnecessary adjustment to the test equipment, such as adjusting an oscilloscope, such as reconstructing a doe (design of experience) to perform the test, such as monitoring the working condition of the device in a Safe Operation Area (SoA), such as frequently establishing a folder, such as processing a data packet, shortening the test time and improving the test efficiency, and the test working condition is set in the circulating structure, so that automatic test is realized, the test accuracy is improved, and the monitoring and safety protection functions in the test process are provided.
In implementation, as shown in fig. 6, the automated double-pulse testing system may adopt a software testing platform, a hardware testing platform and a testing device to jointly form a framework of the whole double-pulse testing system.
The software testing platform can be used for data communication interaction with a user, testing equipment, a hardware testing platform and the like, such as receiving testing operation of the user, controlling a state machine, generating a pulse and driving resistance setting instruction, generating a testing temperature setting instruction, generating an oscilloscope setting instruction, generating a high-voltage setting instruction, acquiring testing data of the testing equipment (such as an oscilloscope) and the like. In implementation, the software testing platform may use LabVIEW (a program development environment of a virtual instrument) as a core, and construct a control core for testing, such as a state machine, a connection with a testing device, a connection with a hardware testing platform, and the like.
The hardware test platform may be a hardware platform for testing a device under test, for example, a gate driving circuit, a capacitor bank, an air-core load inductor, a DUT (device under test, also referred to as a device under test) module, and the like in the test schematic block diagram shown in fig. 1 are included, and form a core circuit system of the hardware test platform (as shown in the dashed-line frame portion in the figure). In implementation, the hardware test platform can receive control of the software test platform to perform automatic test, and obtain data input provided by the test equipment, such as pulse parameters provided by the digital controller, resistance values in test conditions, and the like, such as temperature setting and control information provided by the heating and cooling device, for example, test voltage Vdc provided by the high-voltage direct-current power supply, such as high voltage, large current, and the like, and also provide monitoring data for the test equipment, such as test voltage, current, and the like, for example, data provided by the oscilloscope.
The test equipment may be equipment used in a test, such as a high voltage dc power supply providing a test voltage, an oscilloscope acquiring test data, a heating and cooling device for temperature control, a digital controller providing a digital control signal, and the like. In practice, the oscilloscope may be a high-precision oscilloscope, the dc power supply may be a high-voltage and high-current dc power supply, the digital controller may be a standard board, such as an NI (national instruments limited) board, and the heating and cooling device may be a temperature control device, which is not listed here.
In some embodiments, the state machine of the automated double-pulse test system may include several states: the system comprises an initialization state, an idle state, a loading state, a test parameter generation state, an application setting state, a wave sending test state, a data storage state, a system stop state and a temperature control state.
It should be noted that the state machine may be the state machine shown in fig. 4 in the foregoing description, and the description of the state machine is not repeated here. Of course, the states of the state machine and the conversion relationship between the states can be designed, adjusted, etc. according to the requirements of the actual test situation, and are only described as an example here.
In some embodiments, a control core of the double-pulse test system is formed based on the state machine and the first and second loop structures, and full-automatic test and monitoring can be supported.
As shown in fig. 7, the process of performing the automated test based on the double pulse test system may be as follows: based on the control of the state machine, the working condition to be tested, such as the working condition to be tested filled by a user, is obtained through the first circulating structure, the control of the testing equipment is automatically tested through the second circulating structure, such as the starting of testing, testing control, recording of testing data and the like, the testing is waited to be completed, such as no problem exists in the testing process, all the working conditions to be tested can be automatically executed, such as the testing condition of the working condition is automatically adjusted in the testing process, the working condition after the testing adjustment is carried out, such as errors exist in the waveform monitored in the testing process, the testing can be stopped, and the like.
In implementation, the double-pulse test system for automatic test under various working conditions can be constructed as follows:
when the control operation includes the control operation of the automated test, the state machine enters the loading state (as the aforementioned state S3), so that the first loop structure receives the information and the test condition of the dut input by the user, and establishes a storage path and a test list, where the test list is used to store the information and the test condition of the dut;
after the first loop structure establishes the storage path and the test list, the state machine enters the test parameter generation state (as in the aforementioned state S4), so that the state machine controls the second loop structure to generate the test parameters according to the test list;
after the second loop structure generates the test parameters, the state machine enters the application setting state (as the aforementioned state S5), so that the state machine controls the second loop structure to transmit the test parameters to the corresponding test device;
after the second loop structure transmits the test parameters to the corresponding test equipment, the state machine enters the wave-sending test state (as in the state S6), so that the state machine controls the second loop structure to transmit a plurality of execution instructions corresponding to the wave-sending test to the corresponding test equipment, the test equipment receiving the execution instructions tests the piece to be tested, and returns test data to the second loop structure;
when the second loop structure obtains the test data, the state machine enters the data saving state (as the aforementioned state S7), so that the state machine controls the second loop structure to save the test data.
In some embodiments, a control core of the double-pulse test system is formed based on the state machine and the first and second loop structures, so that a user can conveniently perform state check before performing formal test.
For example, for testing of the power module, as shown in fig. 8, the state machine may first enter the device initialization state (as in the aforementioned state S2) to check the device; then, obtaining information required by the test through a first cycle structure, such as test module parameter information, test system information, system protection information and the like filled by a user; then, safety inspection of the test is carried out through a second circulation structure, if a low-voltage wave-generating test can be carried out firstly, whether the gate drive is normal or not is judged, and a high-voltage test is started when the gate is normal so as to judge whether the safety chain is normal or not; when the safety chain is determined to be normal, the first circulating structure is controlled by the state machine to obtain a test condition corresponding to a test working condition, the second circulating structure is controlled by the state machine to perform preliminary tests before formal tests, such as application setting development (such as application setting by using default test parameters), wave generation tests (such as pulse generation), waveform checking, forward and reverse adjustment of a current probe and the like, and when the preliminary tests are abnormal, the formal tests are performed until the automatic tests are finished.
In some embodiments, a control core of the double-pulse test system is formed based on the state machine, the first cycle structure and the second cycle structure, so that it is very convenient to automatically identify a test state and perform an intelligent adjustment test by monitoring a waveform in the test in real time in an automatic test, for example, after waveform parameters are read, intelligent operations such as protection, test condition deletion, test parameter adjustment and the like can be performed on the double-pulse test system, and manual access in the test is reduced.
In implementation, the double-pulse test system for determining whether the test data is correct or incorrect may be constructed as follows:
the test equipment can comprise an oscilloscope, the test data comprises waveform data returned by the oscilloscope, and the second cycle structure judges the error state of the waveform data.
It should be noted that the error state may refer to whether the waveform is normal, and if the waveform is normal, whether the parameter is within a normal range, etc.
In some embodiments, a control core of the double-pulse test system is formed based on the state machine and the first and second loop structures, so that the test state can be intelligently identified and correspondingly processed in the judgment of the correct and wrong states of the real-time waveform monitoring.
In implementation, the double-pulse test system for intelligent automatic test based on the correct and wrong states of the test data can be constructed as follows:
when the second cycle structure judges that the waveform of the waveform data has errors, the second cycle structure stops automatic testing, and the state machine enters an idle state;
and when the second circulating structure judges that the waveform of the waveform data is normal but deviates from a preset waveform threshold, the second circulating structure adjusts the test parameters according to a preset parameter adjustment strategy to generate new test parameters to continue the automatic test.
It should be noted that the parameter adjustment strategy may be preset, adjusted, and the like according to an actual test scenario, for example, the parameter adjustment strategy may be that when the peak voltage of the test waveform parameter exceeds the protection threshold of the tested device, the corresponding large current under the test condition is not tested any more, for example, the test points with the rest larger currents under the resistance voltage condition may be deleted, and the test is adjusted to start from the minimum current of the next set of test conditions.
In some embodiments, a control core of the double-pulse test system is formed based on the state machine and the first and second loop structures, which is very convenient for a user to perform automatic tests, that is, test conditions in the test list are automatically tested one by one.
In implementation, the double-pulse test system for one-by-one working condition automatic test can be constructed as follows:
after the second cycle structure stores the test data, the state machine controls the second cycle structure to judge whether the test list completes the test task, if not, the state machine enters the test parameter generation state, so that the state machine controls the second cycle structure to continue the automatic test of the next test working condition according to the test parameter generated by the test list, and a large amount of tests are carried out on various working conditions.
In some embodiments, a control core of the double-pulse test system is formed based on the state machine and the first and second loop structures, so that a user can conveniently perform single-point test on a tested piece.
As shown in fig. 9, the flow of the single point test may include: obtaining test working condition, carrying out application setting according to the working condition, carrying out wave-sending test (namely sending out test pulse), and selectively storing the monitored waveform according to test data.
In implementation, a double pulse test system for single point testing may be constructed as follows:
when the control operation comprises a control operation of a single-working-condition test, the state machine enters the test parameter generation state, so that the state machine controls the first circulation structure to read the input test condition and controls the second circulation structure to generate the test parameter according to the test condition;
after the second loop structure generates the test parameters, the state machine enters the application setting state so that the state machine can control the second loop structure to transmit the test parameters to corresponding test equipment;
after the second cycle structure transmits the test parameters to the corresponding test equipment, the state machine enters the wave-sending test state, so that the state machine controls the second cycle structure to transmit a plurality of execution instructions corresponding to the wave-sending test to the corresponding test equipment, the test equipment receiving the execution instructions tests the piece to be tested, and test data are returned to the second cycle structure;
and when the second loop structure obtains the test data, the state machine enters the data storage state so that the state machine can control the second loop structure to store the test data.
In some embodiments, a control core of the double-pulse test system is formed based on the state machine and the first and second loop structures, so that a user can conveniently stop the test.
In practice, the double pulse test system for stopping the test may be constructed as follows:
when the control operation includes a control operation of stopping the test, the state machine enters a system stop state (as the aforementioned state S8), so that the state machine controls the second loop structure to stop the test of the device under test by the test equipment.
It should be noted that, in the automated test, it can also be automatically and intelligently determined whether to stop the test according to the test data. For example, in the normal range of the set test parameters, if an error occurs, the automatic test mode is stopped and exited, for example, the automatic test mode can be read by a set status indicator lamp according to the running state of the device, and when an error is determined, the automatic test mode can be stopped and exited, and the like.
In some embodiments, a control core of the double-pulse test system is formed based on the state machine and the first and second loop structures, so that a user can conveniently perform a test operation of temperature control according to test requirements.
In practice, a double pulse test system for performing temperature tests may be constructed as follows:
when the control operation comprises a temperature control operation, the state machine enters a temperature control state, so that the state machine controls the second circulation structure to perform at least one of the following controls: generating temperature information, starting temperature control, checking the temperature information, updating the temperature information and stopping the temperature control.
It should be noted that, the temperature control may refer to integrating a function of performing temperature control into a state machine without separately operating a testing device for performing temperature control, for example, the aforementioned state S9 is only a state function of controlling start and stop of the device, and the condition and control of a specific temperature may be distributed in each specific state by a control system composed of the state machine, the first loop structure and the second loop structure, for example, the temperature control information and condition obtained by the aforementioned state S3, for example, the corresponding temperature control information generated by the aforementioned state S4, for example, the application setting of temperature control completed by the aforementioned state S5, for example, the temperature control completed by the state S6, for example, the corresponding test data obtained by the state S7, and the like.
In some embodiments, a control core of the double-pulse test system is formed based on the state machine and the first and second loop structures, so that a user can conveniently perform a test operation of a short circuit test according to test requirements.
In practice, a double pulse test system for performing short circuit tests may be constructed as follows:
when the control operation comprises a control operation of a short-circuit test, the state machine enters an application setting state, so that the state machine controls the second circulating structure to transmit test parameters corresponding to the short-circuit test to corresponding test equipment;
after the second cycle structure transmits the test parameters to the corresponding test equipment, the state machine enters the wave-sending test state, so that the state machine controls the second cycle structure to transmit a plurality of execution instructions corresponding to the wave-sending test to the corresponding test equipment, the test equipment receiving the execution instructions tests the short-circuit working condition of the piece to be tested, and test data are returned to the second cycle structure;
and when the second loop structure obtains the test data, the state machine enters the data storage state so that the state machine can control the second loop structure to store the test data.
In some embodiments, a control core of the double-pulse test system is formed based on the state machine, the first cycle structure and the second cycle structure, so that a user can conveniently perform automatic test operation on a power module (or a power device) in a new energy automobile under a complex working condition according to test requirements, and a large amount of basic data required by subsequent optimization design of the power module under the complex working condition is obtained through automatic test.
In implementation, the double-pulse test system for automatically testing the power device can be constructed as follows:
the device to be tested comprises a first power device, at this time, the first test strategy may comprise a strategy of applying a preset test condition to the first power device, and the test condition may comprise a plurality of combination conditions, where the combination conditions may be a combination of a resistance value, a voltage value, and a current value, for example, the combination conditions may be expressed as "(resistance value, voltage value, current value)", such as (1 Ω, 200V, 100A), (1 Ω, 200V, 200A), (1 Ω, 300V, 100A), (1 Ω, 300V, 200A), (2 Ω, 200V, 100A), (2 Ω, 200V, 200A), and the like;
generating a first test state according to the control operation according to a preset first test strategy, wherein the method comprises the following steps:
the plurality of combined conditions are sorted according to the current from small to large, and a first test state corresponding to the combined conditions is generated, for example, the combinations "(resistance value, voltage value, current value)" of the test conditions may be sorted according to the current from small to large, in the foregoing example, the resistance and the voltage are first set as a group of values, and then sorted according to the current magnitude in the group of values, such as (1 Ω, 200V, 100A), (1 Ω, 200V, 200A), (1 Ω, 200V, 300A), and similarly, the next group of resistance and voltage values are also sorted according to the current magnitude, such as (2 Ω, 200V, 100A), (2 Ω, 200V, 200A), (2 Ω, 200V, 300A).
Further, the power device may be monitored and protected in real time, that is, when the second loop structure determines that the test data exceeds a preset protection threshold, the state machine controls the first loop structure to delete a test condition (i.e., a target combination condition) that may cause the power device to be in an unsafe area, where the target combination condition may include: the combination working condition (marked as a first combination working condition) corresponding to the current test data; and the resistance value and the voltage value are respectively the same as those of the first combined working condition, but the current value is larger than that of the first combined working condition (marked as a second combined working condition). By deleting the test working conditions which may cause the power device not to be in the safe region, the hidden danger risks caused by the use of the test working conditions in the subsequent test on the safety, the reliability and the like of the power device are avoided.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments can be referred to each other, and each embodiment focuses on the differences from the other embodiments.
In this specification, various embodiments may be entirely hardware embodiments, entirely software embodiments, or embodiments combining software and hardware implementations.
The above description is only for the specific embodiments of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered within the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (12)
1. A double pulse test system, comprising: the system comprises a first circulation structure, a second circulation structure, a state machine system and a plurality of test devices, wherein the state machine system comprises a queue and a state machine;
the first loop structure is used for receiving control operation of a user on a test, generating a first test state according to a preset first test strategy and the control operation, and storing the first test state in the queue;
the second loop structure is used for generating an execution instruction corresponding to a test action according to a preset second test strategy according to the control of the state machine, sending the execution instruction to the plurality of test devices, receiving test data returned by the plurality of test devices, generating a second test state according to the test data according to the second test strategy, and storing the second test state in the queue;
the state machine is used for carrying out state conversion according to a preset state strategy and the test states in the queue so as to control the first circulating structure to interact with the user and control the second circulating structure to interact with the plurality of test devices;
and the test equipment tests the piece to be tested according to the execution instruction and returns test data to the second circulating structure.
2. The double-pulse test system of claim 1, wherein the state machine comprises the following states: the system comprises an initialization state, an idle state, a loading state, a test parameter generation state, an application setting state, a wave sending test state, a data storage state, a system stop state and a temperature control state.
3. The dipulse test system of claim 2, wherein when said control operation comprises a control operation of an automated test, said state machine enters said load state, such that said first loop structure receives user-entered information and test conditions of the dut, creates a storage path and a test list for storing said information and test conditions of the dut;
after the first circulation structure establishes a storage path and a test list, the state machine enters the test parameter generation state, so that the state machine controls the second circulation structure to generate test parameters according to the test list;
after the second loop structure generates the test parameters, the state machine enters the application setting state so that the state machine can control the second loop structure to transmit the test parameters to corresponding test equipment;
after the second cycle structure transmits the test parameters to the corresponding test equipment, the state machine enters the wave-sending test state, so that the state machine controls the second cycle structure to transmit a plurality of execution instructions corresponding to the wave-sending test to the corresponding test equipment, the test equipment receiving the execution instructions tests the piece to be tested, and test data are returned to the second cycle structure;
and when the second loop structure obtains the test data, the state machine enters the data storage state so that the state machine can control the second loop structure to store the test data.
4. The dipulse test system of claim 3, wherein the test equipment comprises an oscilloscope, the test data comprises waveform data returned by the oscilloscope, and the second loop structure makes a positive error status determination on the waveform data.
5. The dipulse test system of claim 4, wherein when the second loop structure determines that the waveform of the waveform data has an error, the second loop structure stops automatic testing, and the state machine enters an idle state;
and when the second circulating structure judges that the waveform of the waveform data is normal but deviates from a preset waveform threshold, the second circulating structure adjusts the test parameters according to a preset parameter adjustment strategy to generate new test parameters to continue the automatic test.
6. The dipulse test system of claim 3, wherein after said second loop structure saves said test data, said state machine controls said second loop structure to determine whether said test list has completed a test task, if not, said state machine enters said test parameter generation state, so that said state machine controls said second loop structure to continue an automated test of a next test condition according to said test list generated test parameters.
7. The double-pulse test system of claim 2, wherein when the control operation comprises a control operation of a single-condition test, the state machine enters the test parameter generation state, such that the state machine controls the first loop structure to read input test conditions and controls the second loop structure to generate test parameters according to the test conditions;
after the second loop structure generates the test parameters, the state machine enters the application setting state so that the state machine can control the second loop structure to transmit the test parameters to corresponding test equipment;
after the second cycle structure transmits the test parameters to the corresponding test equipment, the state machine enters the wave-sending test state, so that the state machine controls the second cycle structure to transmit a plurality of execution instructions corresponding to the wave-sending test to the corresponding test equipment, the test equipment receiving the execution instructions tests the piece to be tested, and test data are returned to the second cycle structure;
and when the second loop structure obtains the test data, the state machine enters the data storage state so that the state machine can control the second loop structure to store the test data.
8. The double-pulse test system of claim 2, wherein when the control operation comprises a control operation to stop testing, the state machine enters a system stop state, such that the state machine controls the second loop structure to stop testing of the device under test by the test equipment.
9. The double-pulse test system of claim 2, wherein when the control operation comprises a temperature-controlled control operation, the state machine enters a temperature-controlled state such that the state machine controls the second loop structure to at least one of: generating temperature information, starting temperature control, checking the temperature information, updating the temperature information and stopping the temperature control.
10. The dipulse test system of claim 2, wherein when said control operation comprises a control operation of a short circuit test, said state machine enters an application setup state, such that said state machine controls said second loop structure to transmit test parameters corresponding to the short circuit test to corresponding test equipment;
after the second cycle structure transmits the test parameters to the corresponding test equipment, the state machine enters the wave-sending test state, so that the state machine controls the second cycle structure to transmit a plurality of execution instructions corresponding to the wave-sending test to the corresponding test equipment, the test equipment receiving the execution instructions tests the short-circuit working condition of the piece to be tested, and test data are returned to the second cycle structure;
and when the second loop structure obtains the test data, the state machine enters the data storage state so that the state machine can control the second loop structure to store the test data.
11. The double-pulse test system of claim 1, wherein the device under test comprises a first power device, the first test strategy comprises a strategy of applying a preset test condition to the first power device, the test condition comprises a plurality of combined conditions, and the combined conditions are a combination of a resistance value, a voltage value and a current value;
generating a first test state according to the control operation according to a preset first test strategy, wherein the method comprises the following steps:
and sequencing the plurality of combined working conditions in a mode that the current is from small to large, and generating a first test state corresponding to each combined working condition.
12. The dipulse test system of claim 11, wherein when the second loop structure determines that the test data exceeds a predetermined protection threshold, the state machine controls the first loop structure to remove a target combination condition, the target combination condition comprises a first combination condition and a second combination condition, the first combination condition comprises a combination condition corresponding to the current test data, and the second combination condition comprises a combination condition in which a resistance value and a voltage value are respectively the same as a resistance value and a voltage value in the first combination condition, but a current value is greater than a current value in the first combination condition.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113608091A (en) * | 2021-06-28 | 2021-11-05 | 臻驱科技（上海）有限公司 | Double-pulse test protection method and device |
Citations (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN200972500Y (en) * | 2006-11-30 | 2007-11-07 | 浙江大学 | Integral automatic integrated tester |
| CN101915894A (en) * | 2010-07-22 | 2010-12-15 | 北京交通大学 | Method for testing real-time finite-sate machine in digital logic device |
| US20110276189A1 (en) * | 2009-12-23 | 2011-11-10 | China Electric Power Research Institute | Control and Protection System of Converter Valve Operation Test Equipment |
| CN102819463A (en) * | 2012-08-17 | 2012-12-12 | 西安远征智能软件有限公司 | Automatic testing system of comprehensive protection device |
| CN103391225A (en) * | 2013-07-26 | 2013-11-13 | 大连飞创信息技术有限公司 | Parallel automated testing system for test case in futures and security industry |
| US20130340083A1 (en) * | 2012-06-19 | 2013-12-19 | Lucian Petrica | Methods, systems, and computer readable media for automatically generating a fuzzer that implements functional and fuzz testing and testing a network device using the fuzzer |
| CN103487678A (en) * | 2013-09-09 | 2014-01-01 | 南京南瑞继保电气有限公司 | Portable power module test system and test method |
| US20140115394A1 (en) * | 2012-10-19 | 2014-04-24 | Spirent Communications | Finite state machine method for test case generation and execution of communication protocols |
| CN104239217A (en) * | 2014-10-14 | 2014-12-24 | 北京全路通信信号研究设计院有限公司 | Method and system for testing railway signal software |
| CN104407977A (en) * | 2014-12-08 | 2015-03-11 | 北京航空航天大学 | Model detection based automatic joint debugging test method for staged task system |
| CN105510792A (en) * | 2015-12-08 | 2016-04-20 | 同济大学 | Current transformer IGBT power module field double-pulse testing system and method |
| CN105629180A (en) * | 2014-11-11 | 2016-06-01 | 中兴通讯股份有限公司 | Test method, test device and controller |
| CN106291310A (en) * | 2016-10-12 | 2017-01-04 | 天津大学 | A kind of method of testing utilizing double-pulsed technology test IGBT dynamic switching characteristic and device |
| US9684579B1 (en) * | 2014-12-05 | 2017-06-20 | Amazon Technologies, Inc. | Test device selection using multi-pass scoring |
| CN108737213A (en) * | 2018-05-22 | 2018-11-02 | 中国电子科技集团公司第四十研究所 | A kind of parallel big handling capacity Permeation Test System of height based on FPGA and method |
| CN109581177A (en) * | 2018-12-14 | 2019-04-05 | 天津瑞能电气有限公司 | IGBT power module dipulse automatically testing platform and its test method |
| CN109696612A (en) * | 2017-10-19 | 2019-04-30 | 株洲中车时代电气股份有限公司 | The dipulse test macro and test method of automobile IGBT module |
| CN111984536A (en) * | 2020-08-17 | 2020-11-24 | 四川爱创科技有限公司 | Equipment automation test system |
| CN112327126A (en) * | 2020-10-28 | 2021-02-05 | 广州汽车集团股份有限公司 | IGBT module performance test system and method |
-
2021
- 2021-06-28 CN CN202110717003.7A patent/CN113608092B/en active Active
Patent Citations (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN200972500Y (en) * | 2006-11-30 | 2007-11-07 | 浙江大学 | Integral automatic integrated tester |
| US20110276189A1 (en) * | 2009-12-23 | 2011-11-10 | China Electric Power Research Institute | Control and Protection System of Converter Valve Operation Test Equipment |
| CN101915894A (en) * | 2010-07-22 | 2010-12-15 | 北京交通大学 | Method for testing real-time finite-sate machine in digital logic device |
| US20130340083A1 (en) * | 2012-06-19 | 2013-12-19 | Lucian Petrica | Methods, systems, and computer readable media for automatically generating a fuzzer that implements functional and fuzz testing and testing a network device using the fuzzer |
| CN102819463A (en) * | 2012-08-17 | 2012-12-12 | 西安远征智能软件有限公司 | Automatic testing system of comprehensive protection device |
| US20140115394A1 (en) * | 2012-10-19 | 2014-04-24 | Spirent Communications | Finite state machine method for test case generation and execution of communication protocols |
| CN103391225A (en) * | 2013-07-26 | 2013-11-13 | 大连飞创信息技术有限公司 | Parallel automated testing system for test case in futures and security industry |
| CN103487678A (en) * | 2013-09-09 | 2014-01-01 | 南京南瑞继保电气有限公司 | Portable power module test system and test method |
| CN104239217A (en) * | 2014-10-14 | 2014-12-24 | 北京全路通信信号研究设计院有限公司 | Method and system for testing railway signal software |
| CN105629180A (en) * | 2014-11-11 | 2016-06-01 | 中兴通讯股份有限公司 | Test method, test device and controller |
| US9684579B1 (en) * | 2014-12-05 | 2017-06-20 | Amazon Technologies, Inc. | Test device selection using multi-pass scoring |
| CN104407977A (en) * | 2014-12-08 | 2015-03-11 | 北京航空航天大学 | Model detection based automatic joint debugging test method for staged task system |
| CN105510792A (en) * | 2015-12-08 | 2016-04-20 | 同济大学 | Current transformer IGBT power module field double-pulse testing system and method |
| CN106291310A (en) * | 2016-10-12 | 2017-01-04 | 天津大学 | A kind of method of testing utilizing double-pulsed technology test IGBT dynamic switching characteristic and device |
| CN109696612A (en) * | 2017-10-19 | 2019-04-30 | 株洲中车时代电气股份有限公司 | The dipulse test macro and test method of automobile IGBT module |
| CN108737213A (en) * | 2018-05-22 | 2018-11-02 | 中国电子科技集团公司第四十研究所 | A kind of parallel big handling capacity Permeation Test System of height based on FPGA and method |
| CN109581177A (en) * | 2018-12-14 | 2019-04-05 | 天津瑞能电气有限公司 | IGBT power module dipulse automatically testing platform and its test method |
| CN111984536A (en) * | 2020-08-17 | 2020-11-24 | 四川爱创科技有限公司 | Equipment automation test system |
| CN112327126A (en) * | 2020-10-28 | 2021-02-05 | 广州汽车集团股份有限公司 | IGBT module performance test system and method |
Non-Patent Citations (2)
| Title |
|---|
| 任娜;郭锴;: "基于有限状态机的人机交互界面软件设计方法", 中国新技术新产品, no. 03, 10 February 2011 (2011-02-10) * |
| 吕镇邦;沈新刚;邹会荣;施伯乐;: "交互式维护系统中有限状态机的设计与实现", 计算机应用与软件, no. 05, 12 May 2020 (2020-05-12) * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113608091A (en) * | 2021-06-28 | 2021-11-05 | 臻驱科技（上海）有限公司 | Double-pulse test protection method and device |
| CN113608091B (en) * | 2021-06-28 | 2024-08-30 | 臻驱科技（上海）有限公司 | Double-pulse test protection method and device |
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