CN113608091A - Double-pulse test protection method and device - Google Patents
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Abstract
The invention provides a double-pulse test protection method and a double-pulse test protection device, which are applied to the technical field of automatic test, wherein the double-pulse test protection method comprises the following steps: acquiring a first combined working condition under a first test working condition; generating a first test state corresponding to the first combined working condition; carrying out double-pulse wave emission test on the power device according to the first test state; collecting a plurality of monitoring parameters of a power device; judging whether the monitoring parameters deviate from safety thresholds corresponding to a safe working area; if so, switching the first test working condition to a second test working condition so as to continuously carry out double-pulse test on the power device; if not, acquiring a second combined working condition under the first test working condition so as to continuously carry out the double-pulse test on the power device. By acquiring and monitoring various monitoring parameters in real time according to the test working condition and the safety threshold, the power device can be automatically tested under a large number of working conditions, and the power device can be ensured to work in a safe working area during testing.
Description
Technical Field
The invention relates to the technical field of automatic testing, in particular to a double-pulse testing protection method and device.
Background
The power module of a motor driver (short for electric drive) as one of the core components in a new energy automobile has a very high reliability requirement, and in the actual use scene of the electric automobile, such as frequent acceleration, braking, etc., the working condition of the power module is very complex. Therefore, a large number of condition tests for power devices used for electric drive are required.
However, in the conventional dynamic test scheme for power devices, for example, a double-pulse test scheme is adopted, in order to prevent the power device to be tested from being damaged during the test, for example, the operating condition of the device exceeds a safe region, a tester with a lot of experience in the test usually monitors real-time test data, for example, waveform data of an oscilloscope, and determines whether the monitored data may cause the device to exceed the safe operating range of the device under the current test condition or even under the next test condition based on experience.
Therefore, the possibility of testing a large number of working conditions of the power device is severely restricted by a testing mode of manual monitoring, the various working conditions of the power device cannot be fully tested, and the tester cannot ensure that the power device is still safely in a safe working area in various complicated testing working conditions depending on experience.
Therefore, a new scheme for accurately and timely testing and protecting the power device to be tested in the double-pulse automatic test is needed.
Disclosure of Invention
In view of this, embodiments of the present disclosure provide a method and an apparatus for dipulse test protection, which can perform dipulse automatic tests on a power device under a large number of operating conditions, and can ensure that the power device operates in a safe operating area, thereby preventing the power device from being outside the safe operating area during the test.
The embodiment of the specification provides the following technical scheme:
an embodiment of the present specification provides a double-pulse test protection method, including:
acquiring a first combined working condition under a first test working condition, wherein each test working condition comprises a plurality of combined working conditions, each combined working condition is a combination formed by a resistance value, a voltage value and a current value, and the combined working conditions are sequenced from small to large according to the current so that each test working condition starts to test from the combined working condition with the small current value;
generating a first test state corresponding to the first combined working condition;
carrying out double-pulse wave emission test on the power device according to the first test state;
collecting a plurality of monitoring parameters of a power device;
judging whether the monitoring parameters deviate from safety thresholds corresponding to a safe working area;
if so, switching the first test working condition to a second test working condition so as to continuously carry out double-pulse test on the power device;
if not, acquiring a second combined working condition under the first test working condition so as to continuously carry out the double-pulse test on the power device.
The embodiment of this specification also provides a dipulse test protection device, including:
the acquisition module is used for acquiring a first combined working condition under a first test working condition, wherein each test working condition comprises a plurality of combined working conditions, each combined working condition is a combination formed by a resistance value, a voltage value and a current value, and the combined working conditions are sequenced from small to large according to the current so that each test working condition starts to test from the combined working condition with the small current value;
the generating module generates a first test state corresponding to the first combined working condition;
the wave transmitting module is used for carrying out double-pulse wave transmitting test on the power device according to the first test state;
the acquisition module acquires a plurality of monitoring parameters of the power device through the oscilloscope according to a preset acquisition strategy;
the judging module is used for judging whether the monitoring parameters deviate from the safety threshold corresponding to the safe working area;
and the switching module is used for switching the first test working condition to a second test working condition when the judgment module determines that the monitoring parameter deviates from the safety threshold corresponding to the safe working area so as to continue the double-pulse test on the power device, and if not, calling the acquisition module to acquire a second combination working condition under the first test working condition so as to continue the double-pulse test on the power device.
Compared with the prior art, the beneficial effects that can be achieved by the at least one technical scheme adopted by the embodiment of the specification at least comprise:
various monitoring parameters in the double-pulse test of the power device are collected and monitored in real time through the test working condition and the safety threshold value, so that the power device can be automatically tested under a large number of working conditions, the power device in electric drive is ensured to be fully tested, and when judging that the monitoring parameters of the power device may deviate from the SoA (Safe operating Area), stopping the subsequent combination working conditions in the current testing working conditions in time to avoid using the combination working conditions to cause the power device to work outside the SoA, and switching to the next testing working condition in time to maintain the double-pulse automatic test of the power device depending on the combination working conditions in the testing working conditions as the sequenced testing conditions, the power device can be ensured to work in a safe working area all the time, the safety of the power device in the test is ensured, and the probability of failure of the power device in the double-pulse test and the test cost are effectively reduced.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a schematic diagram of a test circuit for a power device in a double-pulse test protection scheme provided by an embodiment of the present disclosure;
FIG. 2 is a schematic structural diagram of a double-pulse test protection scheme provided in an embodiment of the present disclosure;
FIG. 3 is a flow chart of a double-pulse test protection method provided by an embodiment of the present disclosure;
FIG. 4 is a schematic diagram illustrating monitoring parameters in a double-pulse test protection method according to an embodiment of the present disclosure;
FIG. 5 is a flow chart of a double-pulse test protection method provided by an embodiment of the present disclosure;
fig. 6 is a schematic structural diagram of a double-pulse test protection device according to an embodiment of the present disclosure.
Detailed Description
The embodiments of the present application will be described in detail below with reference to the accompanying drawings.
The following description of the embodiments of the present application is provided by way of specific examples, and other advantages and effects of the present application will be readily apparent to those skilled in the art from the disclosure herein. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. The present application is capable of other and different embodiments and its several details are capable of modifications and/or changes in various respects, all without departing from the spirit of the present application. It is to be noted that the features in the following embodiments and examples may be combined with each other without conflict. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It is noted that various aspects of the embodiments are described below within the scope of the appended claims. It should be apparent that the aspects described herein may be embodied in a wide variety of forms and that any specific structure and/or function described herein is merely illustrative. Based on the present application, one skilled in the art should appreciate that one aspect described herein may be implemented independently of any other aspects and that two or more of these aspects may be combined in various ways. For example, an apparatus may be implemented and/or a method practiced using any number and aspects set forth herein. Additionally, such an apparatus may be implemented and/or such a method may be practiced using other structure and/or functionality in addition to one or more of the aspects set forth herein.
It should be noted that the drawings provided in the following embodiments are only for illustrating the basic idea of the present application, and the drawings only show the components related to the present application rather than the number, shape and size of the components in actual implementation, and the type, amount and ratio of the components in actual implementation may be changed arbitrarily, and the layout of the components may be more complicated.
In addition, in the following description, specific details are provided to facilitate a thorough understanding of the examples. However, it will be understood by those skilled in the art that the aspects may be practiced without these specific details. The terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, features described as being defined as "first," "second," etc., may explicitly or implicitly include one or more of the features. In the description of the present invention, "a plurality" means two or more unless otherwise specified.
In the prior art, fig. 1 is a schematic circuit diagram of a double-pulse test performed on an IGBT (Insulated Gate Bipolar Transistor), in which a lower tube in an IGBT half-bridge module is used as a device to be tested, that is, a negative voltage (for example, -8V) is applied to a Gate of an upper tube, so that the upper tube is always in an off state. At this time, a double-pulse test signal (such as a signal Vge in the figure) can be provided to the lower tube, so that the on and off of the device under test (i.e. the lower tube) can be controlled, and the dynamic characteristic test of the lower tube can be completed.
In the current double-pulse test scheme, a tester with abundant test experience monitors the dynamic characteristic parameters of the power device to prevent the working state of the power device from exceeding the SoA (Safe operating Area).
The power device applied to the electric drive of the new energy automobile has high reliability requirement, and a large amount of tests on the power device under various use conditions of the electric automobile are required. Therefore, the test scheme for monitoring the SoA by a tester, that is, the protection scheme of the power device for monitoring the SoA by a tester during testing, cannot test a large number of working conditions of the power device, and is easy to cause the power device to possibly work outside the SoA during testing, thereby causing the failure of the power device during testing.
Based on this, after the inventor carries out research and analysis on the power device, the working condition, the existing test system and the like, the protection scheme of the power device in the double-pulse test is provided: as shown in fig. 2, in the automatic test of the power device shown in fig. 1 by using double pulses, the double pulses can be automatically tested by combining the test condition with the safety threshold corresponding to the preset safety working area of the power device, the power device is automatically tested by acquiring in real time during the test and automatically monitoring and judging the monitoring parameters, when the monitoring parameters under the current test condition deviate from the corresponding safety threshold, the next test condition is timely switched, the power device is stopped from being continuously tested by using the subsequent double pulse test state under the current test condition, and the power device is prevented from working outside the SoA to cause failure of the power device.
Each test working condition comprises a plurality of combined working conditions, each combined working condition is a test value combination formed by a resistance value, a voltage value and a current value, and the combined working conditions are sequenced from small to large according to the current values in one test working condition.
The monitoring parameters of the power device in the double-pulse test are collected and monitored in real time, and when the monitoring parameters of the power device are judged to possibly deviate from the SoA, the subsequent combination working conditions in the current test working condition are stopped in time, the power device is prevented from working outside the SoA due to the use of the combination working conditions, and in addition, the power device can be continuously and automatically tested by switching to the next test working condition in time in view of the sequenced test conditions of the combination working conditions in the test working condition, so that the power device can be automatically tested under a large number of working conditions.
The technical solutions provided by the embodiments of the present application are described below with reference to the accompanying drawings.
As shown in fig. 3, embodiments of the present disclosure provide a double pulse test protection method, which may include:
step S202, a first combined working condition under a first test working condition is obtained.
In implementation, each test condition may include a plurality of combination conditions, and the combination conditions are combinations of resistance values, voltage values, and current values.
For example, in the double pulse test for the power device, each test condition may be a combination of test conditions composed of a resistor, a voltage and a current, for example, each test condition may be expressed as a combination of "(resistance value, voltage value, current value)", such as (1 Ω, 200V, 100A), (1 Ω, 200V, 200A), (1 Ω, 200V, 300A), etc., such as (1 Ω, 300V, 100A), (1 Ω, 300V, 200A), (1 Ω, 300V, 300A), etc., such as (2 Ω, 200V, 100A), (2 Ω, 200V, 200A), (2 Ω, 200V, 300A), etc., which are not listed here.
In an embodiment, the combinations "(resistance, voltage, current) of the test conditions may be sorted from small to large, for example, in the foregoing example, the resistance and the voltage are set as a set of values, and then sorted according to the current magnitudes in the set of values, such as (1 Ω, 200V, 100A), (1 Ω, 200V, 200A), (1 Ω, 200V, 300A), and similarly, the next set of resistance and voltage values are also sorted according to the current magnitudes, such as (2 Ω, 200V, 100A), (2 Ω, 200V, 200A), (2 Ω, 200V, 300A).
In an implementation, the sorted combinations, that is, the conditions with the same resistance value and voltage value but different current values, may be used as a plurality of combinations under the same test condition, for example, (1 Ω, 200V, 100A), (1 Ω, 200V, 200A), (1 Ω, 200V, 300A) and the like are used as one test condition, and (1 Ω, 300V, 100A), (1 Ω, 300V, 200A), (1 Ω, 300V, 300A) and the like are used as another test condition, which is not listed here.
After the currents are sequenced from small to large, each test working condition adopted in the double-pulse test can be started from the combined working condition of a small current value, the test process that the current is gradually increased in each test is ensured, and the power device can be protected to work in a safe working area in the test.
And step S204, generating a first test state corresponding to the first combined working condition.
After the specific working condition (i.e., the first combined working condition) is obtained, the dipulse testing system may generate a corresponding dipulse testing state according to the specific working condition, for example, a pulse parameter under the working condition, a jump to a wave-sending preparation state, and the like, so as to perform dipulse testing according to the first testing state.
And S206, carrying out double-pulse wave emission test on the power device according to the first test state.
In practice, the double-pulse test system can control the relevant executing equipment to emit double-pulse waves (namely, wave emission), so as to carry out double-pulse test on the power device.
And S208, collecting a plurality of monitoring parameters of the power device.
In an implementation, the monitoring parameter may be a performance index parameter that may cause the operating state of the power device to exceed the SoA during the double pulse test. As shown in fig. 4, the monitored parameter may be driving voltage, pulse voltage, current, etc.
Such as the drive voltage of the power device. Although the driving voltage is provided by a circuit with reliable performance, such as-8V/15V, and the like, the possibility of voltage value error is low, once the driving voltage value of the device is exceeded, the power device is damaged. Therefore, the driving voltage needs to be collected and monitored in real time, and the power device fault caused by the driving power supply is avoided.
For example, important indexes in dynamic characteristic parameters of the power device, such as voltage, current, and their rise time, fall time, peak value, etc., may be acquired by an acquisition device, such as an oscilloscope, which may acquire waveform data in real time, and such as a digital acquisition board card, which may acquire monitoring data in real time.
For example, a diode reverse recovery voltage. Similar to the IGBT, the diode also has a safe operating area, and in order to prevent the device from being damaged due to the fact that the back voltage borne by the diode exceeds the tolerance range, real-time monitoring of the reverse recovery voltage parameter of the diode is needed.
In the implementation, according to a preset monitoring and acquisition strategy, monitoring parameters can be acquired by using related equipment, for example, a high-precision oscilloscope is used for acquiring dynamic characteristic parameters such as voltage waveform and current waveform on a power device, and the monitoring parameters can be acquired by using corresponding equipment according to actual application requirements, which is not limited herein.
Step S210, determining whether the monitoring parameter deviates from a safety threshold corresponding to a safe working area, if the monitoring parameter deviates from the safety threshold corresponding to the safe working area, executing step S212, otherwise executing step S214.
In implementation, the safety threshold can be preset and adjusted according to the empirical value at the beginning of the test, and has a certain safety margin with the tolerance value of the power device, so that whether the monitoring parameter in the double-pulse test deviates from the safety threshold can be acquired and monitored in real time, the power device can be ensured to be always within the SoA in the double-pulse test, and the working state of the power device is prevented from exceeding the SoA.
And S212, switching the first test working condition to a second test working condition so as to continuously carry out the double-pulse test on the power device.
For example, under the condition of the test condition (1 Ω, 200V, 200A), the test is found to be not satisfactory, and the next test condition can be entered for continuing the test, such as (1 Ω, 300V, 100A).
And S214, acquiring a second combined working condition under the first test working condition so as to continuously perform double-pulse test on the power device.
For example, under the condition of the test condition (1 Ω, 200V, 300A), the test still meets the requirement, and the next combination condition in the same set of test conditions may be entered for continuing the test, such as entering (1 Ω, 200V, 400A) for continuing the test.
In implementation, under each test working condition, the current is gradually increased to carry out double-pulse test, and when the test cannot meet the requirement, the next test working condition is timely switched to until all working conditions that the power device can work in the SoA are tested.
According to the steps S202 to S214, the test is performed in sequence from the combined condition of the small current through the test condition, and the related monitoring parameters of the power device are monitored in real time by using the preset safety threshold in the test, so that not only can the power device be in the safe working area (namely, the SoA) in the double-pulse test of each condition be ensured, but also the automatic test of a large number of conditions can be performed on the power device, and the power device can be fully tested under different conditions.
In some embodiments, in the double-pulse test of the power device, large current, high voltage, etc. are involved, and the safety of the test is strictly required, so that the relevant safety requirements on the test link can be collected and monitored as some status information (i.e. a safety link status signal) on the safety test link.
In implementation, before obtaining the first combined working condition under the first test working condition to perform the double-pulse test, the safety chain state signal in the double-pulse test system is read, and whether the double-pulse test is performed or not is judged according to the safety chain state signal.
In practice, the safety chain status signal may refer to relevant process status information for reflecting the safety of the power device test in the double pulse test.
For example, the power-on sequence may cause damage to the power device if it is wrong, and may cause financial loss such as testing instruments and equipment, or even personal injury if it is serious.
For example, whether a power-up condition is present. If the safety relay is used for test control, the test system can be controlled to be safely powered on only by manually operating the switch button when the test cabinet door is reliably closed; and the safety relay can give an ok status signal after being electrified, and the status signal can be read to perform real-time monitoring in the test.
It should be noted that the safety link status signal can be preset and adjusted according to actual test requirements, and this is only described as an example.
In some embodiments, the safety chain state signal may include a state signal for testing whether a cabinet door is closed, and determining whether to perform a double pulse test according to the safety chain state signal may include: and when the safety chain state signal is a state signal that the test cabinet door is not closed, forbidding electrification to carry out double-pulse test.
In some embodiments, the related safety link signals in the test can be collected and monitored in real time, so that the automatic test can be performed under the control of good safety link state signals in the double-pulse test, and the safety of property and personnel such as power devices, instruments, equipment and the like in the test can be protected.
For example, the safety chain state signal corresponding to the test cabinet door in the foregoing embodiment may be monitored in real time to determine whether the test cabinet door is safely closed, reliably closed, and the like, so as to determine whether the power-on test condition is met.
In some embodiments, in a normal test condition of the power device, the related monitoring parameters usually fluctuate within a relatively fixed range, and when the deviation from the normal value is large, the working state of the power device may be out of the SoA, and then real-time collection and monitoring can be performed according to different monitoring parameters.
For example, when the monitoring parameter includes a driving voltage for turning on/off the power device, determining whether the monitoring parameter deviates from a safety threshold corresponding to a safe operating region may include: and judging whether the driving voltage exceeds the maximum driving voltage corresponding to the safe working area.
For example, when the monitored parameter includes a peak voltage value in a dynamic characteristic test of the power device, determining whether the monitored parameter deviates from a safety threshold corresponding to a safe operating region may include: and judging that the peak voltage value exceeds the maximum withstand voltage value of the device corresponding to the safe working area.
For example, when the monitored parameter includes a peak current value in a dynamic characteristic test of the power device, determining whether the monitored parameter deviates from a safety threshold corresponding to a safe operating region may include: and judging whether the peak current value exceeds a maximum working current value corresponding to a safe working area.
For example, when the monitoring parameter includes a diode reverse recovery voltage value in a dynamic characteristic test of the power device, determining whether the monitoring parameter deviates from a safety threshold corresponding to a safe operating region may include: and judging whether the reverse recovery voltage value of the diode exceeds the maximum reverse recovery voltage value corresponding to the safe working area.
For example, when the monitoring parameter includes a rising edge time of a driving pulse signal in a dynamic characteristic test of the power device, determining whether the monitoring parameter deviates from a safety threshold corresponding to a safe operating region includes: and judging whether the rising edge time exceeds the range of the rising edge time corresponding to the safe working area.
For example, when the monitoring parameter includes a falling edge time of the driving pulse signal in the dynamic characteristic test of the power device, determining whether the monitoring parameter deviates from a safety threshold corresponding to a safe operating region may include: and judging whether the falling edge time exceeds the edge falling time range corresponding to the safe working area.
It should be noted that, the specific collection and determination criteria of the monitoring parameters may be threshold presetting, determination logic setting, and the like according to practical applications, and are not limited specifically here.
In some embodiments, the process of the double pulse test may be controlled and adjusted according to real-time monitoring conditions.
In implementation, after the monitoring parameter is judged to deviate from the safety threshold corresponding to the safe working area, the combination working condition used by the current test and the subsequent combination working condition which belongs to the same test working condition with the combination working condition and has a current value larger than the combination working condition can be deleted, so that the working state of the power device is prevented from being out of the SoA due to the combination working condition used in the subsequent test.
Specifically, for example, in the combined working condition test under the first test working condition, the combined working condition to be deleted may be used as the target combined working condition, that is, the target combined working condition includes the current first combined working condition under the first test working condition and other combined working conditions located after the current first combined working condition, where the other combined working conditions include combined working conditions in which the resistance value and the voltage value are respectively the same as the resistance value and the voltage value in the current first combined working condition, but the current value is greater than the current value of the current first combined working condition.
For example, the currently tested combination condition is (1 Ω, 200V, 300A), and the test conditions with the same resistance and voltage and the current greater than 300A may be ignored, such as (1 Ω, 200V, 400A), (1 Ω, 200V, 500A), and the like.
In some embodiments, a safety threshold corresponding to a safe working area of the power device may be obtained in the double pulse test, so that the safety threshold may be automatically adjusted through the test, that is, the new safety threshold is used as the safety threshold in the new test, so that the safety threshold is closer to the safety value of the power device itself.
In implementation, after it is determined that the monitored parameter deviates from the safety threshold corresponding to the safe working area, a deviation value of the monitored parameter deviating from the safety threshold corresponding to the safe working area is calculated, and then it is determined whether the deviation value is greater than a preset deviation threshold.
When the deviation value is larger than the preset deviation threshold value, the working condition used in the current test is indicated to possibly cause the working state of the power device to exceed the SoA, then the double-pulse test can be stopped in time, and/or safety prompt information is output, so that the test safety of the power device in the test is ensured.
In real time, if a test error which causes the working state of the power device to exceed the SoA occurs, the running state of the equipment can be conveniently read by testing personnel through output modes such as state information, indicator lights and the like, and the equipment can report the error or even quit the automatic test state.
It should be noted that the deviation threshold here may be a deviation value preset according to experience, or may be a deviation value after updating and adjusting according to the test data, and the updating and adjusting of the deviation threshold may refer to the updating and adjusting of the safety threshold and is not expanded any more; also, a certain safety margin, such as 5%, 10%, etc., is left for the tolerable maximum value of the power device away from the threshold, but the safety margin may also be preset or adjusted according to the test result, and is not expanded here.
And when the deviation value is not larger than the preset deviation threshold value, recording the deviation value so as to acquire new data such as a safety threshold value, a deviation threshold value, a safety margin and the like according to the recorded data.
It should be noted that the records may establish a related database, and are not limited herein.
In some embodiments, a new safety threshold, deviation threshold, safety margin, etc. may be obtained according to several recorded data (such as the deviation value mentioned above), so that these data are closer to the characteristics of the power device itself.
For example, a new target safety threshold may be obtained through statistical analysis, numerical calculation, and the like according to a number of recorded deviation values, such as average calculation, for example, variance calculation, and the like, so as to use the target safety threshold as a safety threshold corresponding to a safe operating area of the power device in a subsequent test.
Similarly, according to a plurality of recorded deviation values, new data such as deviation threshold values, safety margins and the like can be obtained through statistical analysis, numerical calculation and the like.
The data processing method for determining the new safety threshold, deviation threshold, safety margin, and other data according to the recorded data may be selected according to the application, and is not limited specifically here.
In some embodiments, the newly obtained data of the safety threshold, the deviation threshold, the safety margin and the like may be updated to a subsequent double-pulse test of the power device, for example, the target safety threshold may be updated to the double-pulse test to replace the safety threshold used in the original double-pulse test, so that characteristic data closer to the safe operation of the power device itself may be continuously accumulated through a large number of condition tests.
For ease of understanding, an example description is provided below.
As shown in fig. 5, the double-pulse testing system first reads the state of the safety chain in the system (i.e., the safety link state signal shown in any of the foregoing embodiments), and when the states of the safety chain are normal, the subsequent test is started, otherwise, the collection and monitoring of each safety chain state are continued, and of course, part or all of the states of the safety chain can be collected and monitored in real time during the test.
After determining that the states of the safety chains are normal, namely the safety chains have the power-on test condition, the pulse wave emission test is performed by utilizing the contents related to any one of the above embodiments, namely, the working condition acquisition, the wave emission parameter generation, the test state preparation completion and the like.
In the wave-sending test, various monitoring parameters can be acquired in real time, for example, waveform data is read through an oscilloscope, waveform key parameters and the like are measured, for example, parameters such as maximum voltage data of a power device (i.e., a tested device), on/off driving voltage, rising edge/falling edge time of driving pulse, maximum reverse recovery voltage of a diode and the like are measured, and the monitoring parameters are judged in real time, namely whether the parameters are normal or not is judged, for example, whether the parameters deviate from a safety threshold corresponding to a safe working area or not is judged.
When the abnormity occurs, the fault is reported in time, the test is stopped, the safety circuit action control is carried out, and the next test working condition can be switched to, and even the test is finished.
When the abnormality does not occur, whether the test is finished or not can be judged, namely, the test working condition of the element and the combined working condition under the test working condition are traversed, and the test of the next working condition is continued if all the tests are not finished.
Based on the same inventive concept, the embodiments of the present specification further provide a double-pulse test protection device corresponding to the foregoing packaging method.
As shown in fig. 6, a double-pulse test protection apparatus provided in an embodiment of the present disclosure may include: the obtaining module 501 obtains a first combined working condition under a first test working condition, where each test working condition includes a plurality of combined working conditions, the combined working condition is a combination of a resistance value, a voltage value, and a current value, and the plurality of combined working conditions are sorted in a current from small to large manner, so that each test working condition starts to test from the combined working condition of the small current value; a generating module 503, configured to generate a first test state corresponding to the first combined operating condition; the wave-sending module 505 is used for carrying out double-pulse wave-sending test on the power device according to the first test state; the acquisition module 507 acquires a plurality of monitoring parameters of the power device through an oscilloscope according to a preset acquisition strategy; a determining module 509, configured to determine whether the monitoring parameter deviates from a safety threshold corresponding to a safe working area; and the switching module 511 is used for switching the first test working condition to a second test working condition when the judging module determines that the monitoring parameter deviates from the safety threshold corresponding to the safe working area, so as to continue the double-pulse test on the power device, and if not, calling the acquiring module to acquire the second combination working condition under the first test working condition, so as to continue the double-pulse test on the power device.
It should be noted that, the foregoing modules may be implemented by referring to an embodiment of any one of the foregoing methods, and a description thereof is omitted here.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments can be referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, for the product embodiments described later, since they correspond to the method, the description is simple, and the relevant points can be referred to the partial description of the method embodiments.
In this specification, various embodiments may be entirely hardware embodiments, entirely software embodiments, or embodiments combining software and hardware implementations.
The above description is only for the specific embodiments of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered within the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A double-pulse test protection method is characterized by comprising the following steps:
acquiring a first combined working condition under a first test working condition, wherein each test working condition comprises a plurality of combined working conditions, each combined working condition is a combination formed by a resistance value, a voltage value and a current value, and the combined working conditions are sequenced from small to large according to the current so that each test working condition starts to test from the combined working condition with the small current value;
generating a first test state corresponding to the first combined working condition;
carrying out double-pulse wave emission test on the power device according to the first test state;
collecting a plurality of monitoring parameters of a power device;
judging whether the monitoring parameters deviate from safety thresholds corresponding to a safe working area;
if so, switching the first test working condition to a second test working condition so as to continuously carry out double-pulse test on the power device;
if not, acquiring a second combined working condition under the first test working condition so as to continuously carry out the double-pulse test on the power device.
2. The dipulse test protection method of claim 1, wherein before obtaining the first combined condition under the first test condition for dipulse testing, the dipulse test protection method further comprises:
reading a safety chain state signal in the double-pulse test system;
and judging whether to perform a double-pulse test according to the safety chain state signal.
3. The double-pulse test protection method according to claim 2, wherein the safety chain state signal comprises a state signal for testing whether a cabinet door is closed;
judging whether to carry out a double-pulse test according to the safety chain state signal, and the method comprises the following steps: and when the safety chain state signal is a state signal that the test cabinet door is not closed, forbidding electrification to carry out double-pulse test.
4. The double pulse test protection method of claim 3, further comprising: and monitoring the safety chain state signal corresponding to the test cabinet door in real time.
5. The double-pulse test protection method according to claim 1, wherein the monitoring parameter includes a driving voltage for turning on/off the power device;
judging whether the monitoring parameters deviate from safety threshold values corresponding to a safe working area, including: judging whether the driving voltage exceeds the maximum driving voltage corresponding to a safe working area or not;
and/or the monitoring parameter comprises a spike voltage value in a dynamic characteristic test of the power device;
judging whether the monitoring parameters deviate from safety threshold values corresponding to a safe working area, including: judging that the peak voltage value exceeds the maximum withstand voltage value of the device corresponding to the safe working area;
and/or the monitoring parameter comprises a peak current value in a dynamic characteristic test of the power device;
judging whether the monitoring parameters deviate from safety threshold values corresponding to a safe working area, including: judging whether the peak current value exceeds a maximum working current value corresponding to a safe working area or not;
and/or the monitoring parameter comprises a diode reverse recovery voltage value in a dynamic characteristic test of the power device;
judging whether the monitoring parameters deviate from safety threshold values corresponding to a safe working area, including: judging whether the reverse recovery voltage value of the diode exceeds the maximum reverse recovery voltage value corresponding to the safe working area or not;
and/or the monitoring parameter comprises the rising edge time of a driving pulse signal in the dynamic characteristic test of the power device;
judging whether the monitoring parameters deviate from safety threshold values corresponding to a safe working area, including: judging whether the rising edge time exceeds an edge rising time range corresponding to a safe working area or not;
and/or, the monitoring parameter comprises the falling edge time of the driving pulse signal in the dynamic characteristic test of the power device;
judging whether the monitoring parameters deviate from safety threshold values corresponding to a safe working area, including: and judging whether the falling edge time exceeds the edge falling time range corresponding to the safe working area.
6. The dipulse test protection method of claim 1, wherein after determining that the monitored parameter deviates from a safety threshold corresponding to a safe working area, the dipulse test protection method further comprises:
deleting a target combination working condition, wherein the target combination working condition comprises a current first combination working condition under the first test working condition and other combination working conditions positioned behind the current first combination working condition, and the other combination working conditions comprise combination working conditions that the resistance value and the voltage value are respectively the same as the resistance value and the voltage value in the current first combination working condition, but the current value is larger than the current value of the current first combination working condition.
7. The dipulse test protection method according to any one of claims 1-6, wherein after determining that the monitored parameter deviates from a safety threshold corresponding to a safe working area, the dipulse test protection method further comprises:
calculating a deviation value of the monitoring parameter from a safety threshold corresponding to a safe working area;
judging whether the deviation value is larger than a preset deviation threshold value or not;
if so, stopping the double-pulse test and/or outputting safety prompt information;
if not, recording the deviation value.
8. The double pulse test protection method of claim 7, further comprising:
and acquiring a target safety threshold according to the recorded deviation values, wherein the target safety threshold is a safety threshold corresponding to a safe working area of the power device.
9. The double pulse test protection method of claim 8, further comprising:
and updating the target safety threshold value into the double-pulse test to replace the safety threshold value used in the original double-pulse test.
10. A double-pulse test protection device, comprising:
the acquisition module is used for acquiring a first combined working condition under a first test working condition, wherein each test working condition comprises a plurality of combined working conditions, each combined working condition is a combination formed by a resistance value, a voltage value and a current value, and the combined working conditions are sequenced from small to large according to the current so that each test working condition starts to test from the combined working condition with the small current value;
the generating module generates a first test state corresponding to the first combined working condition;
the wave transmitting module is used for carrying out double-pulse wave transmitting test on the power device according to the first test state;
the acquisition module acquires a plurality of monitoring parameters of the power device through the oscilloscope according to a preset acquisition strategy;
the judging module is used for judging whether the monitoring parameters deviate from the safety threshold corresponding to the safe working area;
and the switching module is used for switching the first test working condition to a second test working condition when the judgment module determines that the monitoring parameter deviates from the safety threshold corresponding to the safe working area so as to continue the double-pulse test on the power device, and if not, calling the acquisition module to acquire a second combination working condition under the first test working condition so as to continue the double-pulse test on the power device.
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