CN112161705A - Power retest method and system for pulse laser - Google Patents
Power retest method and system for pulse laser Download PDFInfo
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- CN112161705A CN112161705A CN202010948231.0A CN202010948231A CN112161705A CN 112161705 A CN112161705 A CN 112161705A CN 202010948231 A CN202010948231 A CN 202010948231A CN 112161705 A CN112161705 A CN 112161705A
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- 238000013102 re-test Methods 0.000 title claims abstract description 61
- 238000000034 method Methods 0.000 title claims abstract description 36
- 238000012360 testing method Methods 0.000 claims abstract description 225
- 239000000463 material Substances 0.000 claims description 7
- 238000004590 computer program Methods 0.000 claims description 6
- 238000013101 initial test Methods 0.000 claims description 6
- 238000004891 communication Methods 0.000 description 6
- 230000032683 aging Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 3
- 239000013307 optical fiber Substances 0.000 description 3
- 230000007547 defect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4238—Pulsed light
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
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- Semiconductor Lasers (AREA)
Abstract
The embodiment of the invention provides a power retest method and a power retest system for a pulse laser, wherein the method comprises the following steps: obtaining the model information of a pulse laser to be tested; determining a plurality of corresponding test frequencies and test powers of the pulse laser to be tested according to the model information, and obtaining a plurality of test parameter combinations according to the plurality of corresponding test frequencies and test powers; and testing the pulse laser to be tested according to the plurality of test parameter combinations and a preset sequence to obtain power retest data. According to the embodiment of the invention, the model of the pulse laser is automatically identified, and the power fed by the pulse laser is retested in sequence based on a combination mode of various frequencies and powers, so that the retesting accuracy and the retesting efficiency are improved.
Description
Technical Field
The invention relates to the technical field of pulse lasers, in particular to a power retest method and a power retest system for a pulse laser.
Background
The aging method of the pulse laser is that under the condition of a certain temperature, the laser is driven by a repeated pulse current with a certain amplitude and a certain duty ratio, and the reduction of the output light power of the laser after aging of a certain pulse number is tested.
After the pulse laser aging (full load continuous light emission for 60-120 hours) is finished, power retest is required, and the current method mainly comprises the following steps: the operator checks whether the optical power value at this time is within ± 3W of the value before aging by manually setting the model in a state of a combination of the lowest frequency and the highest power according to different laser models. If the power is within +/-3W of the requirement, adjusting the mechanical potentiometer to the value before aging. If the deviation is not within +/-3W, the defect is directly judged and rework is needed.
However, the existing method needs a whole-course manual test, test data is recorded in a manual mode, authenticity of the data cannot be judged, and in addition, the manual mode test only adopts a combination of power and frequency, namely a combination of lowest frequency and highest power, and the use condition of a client site cannot be simulated, so that the accuracy of the power retest data of the existing pulse laser is low. Therefore, a power retest method and system for a pulsed laser is needed to solve the above problems.
Disclosure of Invention
Aiming at the problems in the prior art, the embodiment of the invention provides a power retest method and a power retest system for a pulse laser.
In a first aspect, an embodiment of the present invention provides a power retest method for a pulse laser, including:
obtaining the model information of a pulse laser to be tested;
determining a plurality of corresponding test frequencies and test powers of the pulse laser to be tested according to the model information, and obtaining a plurality of test parameter combinations according to the plurality of corresponding test frequencies and test powers;
and testing the pulse laser to be tested according to the plurality of test parameter combinations and a preset sequence to obtain power retest data.
Further, the plurality of corresponding test frequencies and test powers comprises: the method comprises the following steps of firstly, presetting a test frequency, presetting a second test frequency, presetting a first test power and presetting a second test power;
wherein the first preset test frequency is less than the second preset test frequency; the first preset test power is smaller than the second preset test power.
Further, obtaining a plurality of test parameter combinations according to the test frequency and the test power includes:
obtaining a first test parameter according to the first preset test frequency and the first preset test power;
obtaining a second test parameter according to the first preset test frequency and the second preset test power;
obtaining a third test parameter according to the second preset test frequency and the second preset test power;
and obtaining the plurality of test parameter combinations according to the first test parameter, the second test parameter and the third test parameter.
Further, the step of testing the pulse laser to be tested according to the combination of the plurality of test parameters and a preset sequence to obtain power retest data includes:
carrying out initial test on the pulse laser to be tested through the first test parameter, and carrying out secondary test on the pulse laser to be tested through the second test parameter if the initial test is passed;
and if the second test is passed, performing a third test on the pulse laser to be tested according to the third test parameter, and if the third test is passed, obtaining power retest data of the pulse laser to be tested.
Further, the first preset test frequency is the lowest frequency of the pulse laser to be tested, and the second preset test frequency is the highest frequency of the pulse laser to be tested.
Further, the first preset test power is obtained by the second preset test power and a preset threshold, and the second preset test frequency is the highest power of the pulse laser to be tested.
Further, the obtaining of the model information of the pulse laser to be tested includes:
acquiring a bill of material code of the laser to be tested;
and acquiring corresponding model information according to the bill of material code.
In a second aspect, an embodiment of the present invention provides a video output mode switching apparatus, including:
the model acquisition module is used for acquiring the model information of the pulse laser to be tested;
the test parameter combination module is used for determining a plurality of corresponding test frequencies and test powers of the pulse laser to be tested according to the model information and obtaining a plurality of test parameter combinations according to the plurality of corresponding test frequencies and test powers;
and the power retest module is used for testing the pulse laser to be tested according to the plurality of test parameter combinations and a preset sequence to obtain power retest data.
In a third aspect, an embodiment of the present invention provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor implements the steps of the method provided in the first aspect when executing the program.
In a fourth aspect, an embodiment of the present invention provides a non-transitory computer readable storage medium, on which a computer program is stored, which when executed by a processor, implements the steps of the method as provided in the first aspect.
According to the power retest method and system for the pulse laser, provided by the embodiment of the invention, the model of the pulse laser is automatically identified, and the power fed by the pulse laser is sequentially retested on the basis of a combination mode of various frequencies and powers, so that the retest accuracy and the retest efficiency are improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and those skilled in the art can also obtain other drawings according to the drawings without creative efforts.
Fig. 1 is a schematic flow chart of a power retest method for a pulse laser according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a power retest system for a pulsed laser according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of an electronic device according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In addition, the manual mode test only adopts a combination of power and frequency, namely the combination of lowest frequency and highest power, and can not simulate the use condition of a client site, so that the accuracy of the power retest data of the existing pulse laser is low; moreover, some false alarm conditions of the repair machine cannot be directly tested. Under the condition that the power of the aged seed source cannot be accurately known, if the power of the seed source is too low, the optical fiber is easy to burn under the conditions of low frequency and high power.
Fig. 1 is a schematic flow chart of a power retest method for a pulse laser according to an embodiment of the present invention, and as shown in fig. 1, an embodiment of the present invention provides a power retest method for a pulse laser, including:
In the embodiment of the invention, the model of the pulse laser can be automatically identified through a corresponding software control instrument, such as a marking board card, and the model information and corresponding test data are automatically recorded in a database.
And 102, determining a plurality of corresponding test frequencies and test powers of the pulse laser to be tested according to the model information, and obtaining a plurality of test parameter combinations according to the plurality of corresponding test frequencies and test powers.
In the embodiment of the invention, compared with the existing single power and frequency combination, the parameter combination of the power retest is expanded into a plurality of groups of test parameter combinations, so that the actual use scene is better simulated, and the power retest is carried out on the pulse laser.
And 103, testing the pulse laser to be tested according to the plurality of test parameter combinations and a preset sequence to obtain power retest data.
In the embodiment of the invention, the pulse laser is tested step by step according to the sequence in the test parameter combination, and after the test of the previous test parameter in the test parameter combination passes, the subsequent test parameters are used for continuously testing the pulse laser, so that the power retest of the pulse laser is carried out through a plurality of groups of test parameters, and the power retest data of the pulse laser is obtained.
According to the power retest method for the pulse laser, provided by the embodiment of the invention, the model of the pulse laser is automatically identified, and the power fed by the pulse laser is sequentially retested on the basis of a combination mode of various frequencies and powers, so that the retest accuracy and the retest efficiency are improved.
On the basis of the above embodiment, the plurality of corresponding test frequencies and test powers include: the method comprises the following steps of firstly, presetting a test frequency, presetting a second test frequency, presetting a first test power and presetting a second test power;
wherein the first preset test frequency is less than the second preset test frequency; the first preset test power is smaller than the second preset test power.
On the basis of the above embodiment, preferably, the first preset test frequency is the lowest frequency of the pulse laser to be tested, and the second preset test frequency is the highest frequency of the pulse laser to be tested.
On the basis of the above embodiment, the first preset test power is obtained by the second preset test power and a preset threshold, and the second preset test frequency is the highest power of the pulse laser to be tested.
On the basis of the above embodiment, obtaining a plurality of test parameter combinations according to the test frequency and the test power includes:
obtaining a first test parameter according to the first preset test frequency and the first preset test power;
obtaining a second test parameter according to the first preset test frequency and the second preset test power;
obtaining a third test parameter according to the second preset test frequency and the second preset test power;
and obtaining the plurality of test parameter combinations according to the first test parameter, the second test parameter and the third test parameter.
On the basis of the above embodiment, the testing the pulse laser to be tested according to the plurality of test parameter combinations and the preset sequence to obtain power retest data includes:
carrying out initial test on the pulse laser to be tested through the first test parameter, and carrying out secondary test on the pulse laser to be tested through the second test parameter if the initial test is passed;
and if the second test is passed, performing a third test on the pulse laser to be tested according to the third test parameter, and if the third test is passed, obtaining power retest data of the pulse laser to be tested.
In the embodiment of the present invention, by explaining power retest of a specific type of pulse laser, first, the lowest frequency (in the embodiment of the present invention, the lowest frequency of the pulse laser is 20KHZ) and the highest frequency of the pulse laser are determined; then, determining a plurality of test parameter combinations according to the lowest frequency and the highest frequency, and performing retest sequence arrangement on the test parameter combinations according to a preset retest condition, thereby obtaining a first test parameter, namely the combination of the lowest frequency and 10% of the highest power; a second test parameter, i.e. the combination of lowest frequency and highest power; the third test parameter, i.e. the combination of the highest frequency and the highest frequency.
Further, according to a retest sequence, firstly, testing the pulse laser through a first test parameter, under the combination, the measured power is close to the power of the seed source of the optical fiber tester, if the measured power is larger than the lowest seed source power of the type, the next step of testing can be carried out, because when the seed source power is too low, the PA current is forcibly increased, the optical fiber can be burnt, and if the test is not passed, the subsequent testing is stopped. After the last group of test parameters passes the test, testing the pulse laser by using a second test parameter, namely the combination of the lowest frequency and the highest power of the model, wherein the combination is a commonly used setting parameter; and if the test is not passed, stopping the subsequent test. And finally, after the test of the second test parameter is passed, using a third test parameter, wherein the combination is the limit parameter of the laser, and if the power of the laser is stable and the alarm is not given, the performance of the laser is good. The testing conditions are more detailed by sequentially testing a plurality of groups of layer parameters, and the actual using conditions of a customer are simulated when the pulse laser leaves a factory, so that machines repaired from the customer are reduced. If the batches are bad, the batches are found before the factory shipment, and the time cost is reduced.
On the basis of the above embodiment, the obtaining of the model information of the pulse laser to be tested includes:
acquiring a bill of material code of the laser to be tested;
and acquiring corresponding model information according to the bill of material code.
In the embodiment of the invention, by scanning the label on the shell of the pulse laser, the label is converted into the model information through the configuration file according to the scanned Bill of Material (BOM) code, so that the corresponding test parameter configuration file is called according to the model information to start automatic test, an operator is not required to check the model of the laser, different test parameter combinations are set on the instrument, parameter setting errors are avoided, and the test accuracy is improved.
Fig. 2 is a schematic structural diagram of a power retest system for a pulse laser according to an embodiment of the present invention, and as shown in fig. 2, an embodiment of the present invention provides a power retest system for a pulse laser, including: the device comprises a model acquisition module 201, a test parameter combination module 202 and a power retest module 203, wherein the model acquisition module 201 is used for acquiring model information of a pulse laser to be tested; the test parameter combination module 202 is configured to determine multiple corresponding test frequencies and test powers of the pulse laser to be tested according to the model information, and obtain multiple test parameter combinations according to the multiple corresponding test frequencies and test powers; the power retest module 203 is configured to test the pulse laser to be tested according to the plurality of test parameter combinations and according to a preset sequence, so as to obtain power retest data.
According to the power retest system for the pulse laser, provided by the embodiment of the invention, the model of the pulse laser is automatically identified, and the power fed by the pulse laser is sequentially retested on the basis of a combination mode of various frequencies and powers, so that the retest accuracy and the retest efficiency are improved.
The system provided by the embodiment of the present invention is used for executing the above method embodiments, and for details of the process and the details, reference is made to the above embodiments, which are not described herein again.
Fig. 3 is a schematic structural diagram of an electronic device according to an embodiment of the present invention, and referring to fig. 3, the electronic device may include: a processor (processor)301, a communication Interface (communication Interface)302, a memory (memory)303 and a communication bus 304, wherein the processor 301, the communication Interface 302 and the memory 303 complete communication with each other through the communication bus 304. Processor 301 may call logic instructions in memory 303 to perform the following method: obtaining the model information of a pulse laser to be tested; determining a plurality of corresponding test frequencies and test powers of the pulse laser to be tested according to the model information, and obtaining a plurality of test parameter combinations according to the plurality of corresponding test frequencies and test powers; and testing the pulse laser to be tested according to the plurality of test parameter combinations and a preset sequence to obtain power retest data.
In addition, the logic instructions in the memory 303 may be implemented in the form of software functional units and stored in a computer readable storage medium when the logic instructions are sold or used as independent products. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
In another aspect, an embodiment of the present invention further provides a non-transitory computer-readable storage medium, on which a computer program is stored, where the computer program is implemented to, when executed by a processor, perform the power retest method for a pulsed laser provided in the foregoing embodiments, for example, including: obtaining the model information of a pulse laser to be tested; determining a plurality of corresponding test frequencies and test powers of the pulse laser to be tested according to the model information, and obtaining a plurality of test parameter combinations according to the plurality of corresponding test frequencies and test powers; and testing the pulse laser to be tested according to the plurality of test parameter combinations and a preset sequence to obtain power retest data.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. A method for power retest of a pulsed laser, comprising:
obtaining the model information of a pulse laser to be tested;
determining a plurality of corresponding test frequencies and test powers of the pulse laser to be tested according to the model information, and obtaining a plurality of test parameter combinations according to the plurality of corresponding test frequencies and test powers;
and testing the pulse laser to be tested according to the plurality of test parameter combinations and a preset sequence to obtain power retest data.
2. The method of claim 1, wherein the plurality of corresponding test frequencies and test powers comprise: the method comprises the following steps of firstly, presetting a test frequency, presetting a second test frequency, presetting a first test power and presetting a second test power;
wherein the first preset test frequency is less than the second preset test frequency; the first preset test power is smaller than the second preset test power.
3. The method of claim 2, wherein obtaining a plurality of test parameter combinations according to the plurality of corresponding test frequencies and test powers comprises:
obtaining a first test parameter according to the first preset test frequency and the first preset test power;
obtaining a second test parameter according to the first preset test frequency and the second preset test power;
obtaining a third test parameter according to the second preset test frequency and the second preset test power;
and obtaining the plurality of test parameter combinations according to the first test parameter, the second test parameter and the third test parameter.
4. The power retest method for the pulse laser according to claim 3, wherein said testing the pulse laser to be tested according to the plurality of test parameter combinations in a preset order to obtain the power retest data comprises:
carrying out initial test on the pulse laser to be tested through the first test parameter, and carrying out secondary test on the pulse laser to be tested through the second test parameter if the initial test is passed;
and if the second test is passed, performing a third test on the pulse laser to be tested according to the third test parameter, and if the third test is passed, obtaining power retest data of the pulse laser to be tested.
5. The method of claim 3, wherein the first predetermined testing frequency is the lowest frequency of the pulse laser to be tested, and the second predetermined testing frequency is the highest frequency of the pulse laser to be tested.
6. The power retest method for a pulsed laser according to claim 3, wherein said first predetermined test power is obtained from said second predetermined test power and a predetermined threshold, and said second predetermined test frequency is the highest power of said pulsed laser to be tested.
7. The power retest method for a pulse laser according to claim 1, wherein said obtaining model information of the pulse laser to be tested comprises:
acquiring a bill of material code of the laser to be tested;
and acquiring corresponding model information according to the bill of material code.
8. A power retest system for a pulsed laser, comprising:
the model acquisition module is used for acquiring the model information of the pulse laser to be tested;
the test parameter combination module is used for determining a plurality of corresponding test frequencies and test powers of the pulse laser to be tested according to the model information and obtaining a plurality of test parameter combinations according to the plurality of corresponding test frequencies and test powers;
and the power retest module is used for testing the pulse laser to be tested according to the plurality of test parameter combinations and a preset sequence to obtain power retest data.
9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor when executing the program performs the steps of the method for retesting power of a pulsed laser according to any of claims 1 to 7.
10. A non-transitory computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method for retesting power of a pulsed laser according to any one of claims 1 to 7.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113608091A (en) * | 2021-06-28 | 2021-11-05 | 臻驱科技（上海）有限公司 | Double-pulse test protection method and device |
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| US5475235A (en) * | 1993-08-09 | 1995-12-12 | Wyatt Technoloy Corporation | Control of laser light power output for use in light scattering instruments by inducing mode hopping and averaging result |
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| CN113608091A (en) * | 2021-06-28 | 2021-11-05 | 臻驱科技（上海）有限公司 | Double-pulse test protection method and device |
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